Test method and device applied to Nand Flash controller cache reading and medium
By setting cache read time standards and constructing multiple test scenarios, the problem that the existing technology is difficult to cover complex application scenarios is solved, and detailed verification and testing of the cache read function of the NAND Flash controller is realized, improving the accuracy and flexibility of the test.
Patent Information
- Application Number
- CN202411850243.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-04-08
- Estimated Expiration
- 2044-12-16
AI Technical Summary
The existing cache read test method is difficult to cover complex practical application scenarios, such as the random read and write concurrency of multi-plan and tests across different luns and pages, and lacks flexibility.
By setting cache read time standards, including single plane and multi-plane read time standards, multiple test scenarios are constructed, such as mixed read and write of the same lun, different lun reads, different plane reads, and different page reads, and the correctness of the cache read function is ensured through result verification.
This method can more accurately test the cache read function of the NAND Flash controller, covers a variety of practical application scenarios, improves the accuracy and flexibility of testing, and ensures data accuracy and performance improvement in cache hits and misses.