Electric power data analysis method and system for fast temperature change test box

Abstract

The invention relates to the technical field of data processing, in particular to an electric power data analysis method and system for a fast temperature change test box. The method comprises the following steps: acquiring current data in an operation process of a rapid temperature change test box; acquiring the fluctuation consistency of each current in the current data, and if the fluctuation consistency is greater than or equal to a threshold value, rejecting the corresponding current to obtain residual current data; and performing anomaly detection on the residual current data to obtain an abnormal current, and giving an alarm. According to the scheme, the electric power data of the rapid temperature change test box can be accurately analyzed.

Description

Technical Field

[0001] The present invention relates to the field of data processing technology, and more specifically, to a method and system for analyzing power data of a rapid temperature change test chamber. Background Art

[0002] Rapid temperature change test chamber (also called rapid temperature change test chamber) is an environmental testing equipment used to simulate the impact of rapid temperature changes on equipment or materials. It tests the performance stability of equipment or materials under different temperature conditions by rapidly changing the internal temperature. It is mainly used in the fields of electronics, electrical, machinery, automobiles, aerospace, etc., especially in product quality verification and environmental adaptability testing.

[0003] Since the rapid temperature change test chamber needs to adjust the temperature frequently, the power consumption of the equipment also fluctuates. The power data reflects the operating status and energy efficiency of the equipment, and is an important indicator for monitoring equipment performance, evaluating energy efficiency, and diagnosing potential faults. Therefore, through in-depth analysis of power data, abnormal operation of the equipment can be discovered in time, so that effective maintenance and repair measures can be taken to avoid equipment failure or damage.

[0004] In the related technology, for example, the patent application document for an environmental simulation test chamber controller and control method disclosed in publication number CN116165456A realizes real-time monitoring of the operating status of various components of the simulation test chamber, rapid fault location, and rapid protection after a fault occurs by embedding a controller.

[0005] The above scheme compares the collected data with the preset protection threshold value when performing rapid fault location and rapid protection, and based on the comparison result, controls the failure component to stop running and conducts maintenance. However, due to the particularity of the rapid temperature change test chamber (power data changes with temperature), there are normal fluctuations during the operation of the rapid temperature change test chamber. At this time, by directly comparing the collected data with the protection threshold value, it is impossible to accurately analyze the operating status of the rapid temperature change test chamber.

[0006] Therefore, it is particularly important to accurately analyze the power data of the rapid temperature change test chamber to detect whether the subsequent rapid temperature change test chamber is faulty. Summary of the invention

[0007] The purpose of the present invention is to propose a method and system for analyzing power data of a rapid temperature change test chamber, so as to solve the problem in the prior art that it is difficult to accurately analyze the power data of the rapid temperature change test chamber and cannot accurately detect the rapid temperature change test chamber; to this end, the present invention provides solutions in the following two aspects.

[0008] In a first aspect, the present invention provides a method for analyzing power data of a rapid temperature change test chamber, comprising: Obtain current data during the operation of the rapid temperature change test chamber; Obtaining the fluctuation consistency of each current in the current data, and in response to the fluctuation consistency being greater than or equal to a threshold, eliminating the corresponding current to obtain the remaining current data; Perform abnormal detection on the residual current data, obtain abnormal current, and issue an alarm; The fluctuation consistency is the similarity between the fluctuation characteristic vector of the current and the fluctuation characteristic vector of the temperature at the same time; the fluctuation characteristic vector is a two-dimensional vector composed of the change rate and relative prominence of the target data; the target data is any current or any temperature; The relative prominence degree represents the difference change of the target data in the corresponding window; the size of the window is a set length with the target data as the end of the window.

[0009] The above scheme obtains the fluctuation characteristic vectors of each data in the current data and temperature data of the rapid temperature change test box, and calculates the fluctuation consistency of the two fluctuation characteristic vectors, and uses the fluctuation consistency as the fluctuation consistency of the corresponding current to determine whether the corresponding current is virtual abnormal data (these data do not represent the failure or abnormality of the equipment, but are the natural reaction of temperature change), and then eliminates these virtual abnormal data, which can avoid the misjudgment caused by these currents, thereby ensuring the accuracy of data analysis. That is, the present invention can reduce the interference of normal fluctuations on the subsequent abnormal analysis of current data, improve the accuracy of the analysis of power data of the rapid temperature change test box, avoid misjudgment, and reduce equipment maintenance costs.

[0010] Optionally, the fluctuation consistency for: ; In the formula, The current data The fluctuation characteristic vector of the current, is the temperature data corresponding to the current data The temperature fluctuation characteristic vector, is the magnitude of the vector.

[0011] The above scheme provides a method to accurately calculate the consistency of fluctuations.

[0012] Optionally, the fluctuation consistency is the cosine similarity between the fluctuation characteristic vector of the current and the fluctuation characteristic vector of the temperature at the same moment.

[0013] Optionally, when the target data is any current, the relative prominence for: ; In the formula, The current data Current, The current data The maximum value in the current corresponding window, The current data The current corresponds to the minimum value in the window.

[0014] The relative prominence calculated by the above scheme can measure the abnormality of a data point relative to other data points.

[0015] Optionally, when the target data is any current, the relative prominence for: ;in, The current data Current, The current data The current corresponds to the current mean value in the window, and L is the set length of the window.

[0016] Optionally, when the target data is any current, the change rate for: ; The current data Current, The current data A current.

[0017] The above-mentioned change rate can intuitively reflect the dynamic change characteristics of the current.

[0018] Optionally, the abnormality detection on the residual current data adopts a CBLOF algorithm.

[0019] The CBLOF algorithm can accurately detect anomalies in residual current data.

[0020] In a second aspect, a power data analysis system for a rapid temperature change test chamber includes: processor; The memory stores a computer instruction for analyzing the power data of a rapid temperature change test box. When the computer instruction is executed by the processor, the system executes the above-mentioned method for analyzing the power data of a rapid temperature change test box.

[0021] The beneficial effects of the present invention are: The solution of the present invention removes virtual abnormal data before identifying abnormal power data to ensure that real abnormal power data is screened out. The abnormal power data is then identified to timely discover abnormal operation of the equipment, thereby taking effective maintenance and repair measures to avoid equipment failure or damage. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] By reading the following detailed description with reference to the accompanying drawings, the above and other objects, features and advantages of the exemplary embodiments of the present invention will become readily understood. In the accompanying drawings, several embodiments of the present invention are shown in an exemplary and non-limiting manner, and the same or corresponding reference numerals represent the same or corresponding parts, wherein: Figure 1 A flowchart schematically shows a method for analyzing power data of a rapid temperature change test chamber in this embodiment; Figure 2 The structural block diagram of a power data analysis system of a rapid temperature change test box in this embodiment is schematically shown. DETAILED DESCRIPTION

[0023] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0024] The working principle of the rapid temperature change test chamber is to change the temperature inside the chamber through a heating or cooling system. In this process, the temperature change will directly affect the power consumption of the rapid temperature change test chamber. That is, when the rapid temperature change test chamber needs to be heated, the electric heater and other equipment will consume more electricity, resulting in an upward trend in power data.

[0025] The present invention analyzes and processes the power data during the operation of the rapid temperature change test box, thereby detecting the operation status of the rapid temperature change test box.

[0026] Specifically, Figure 1 As shown, a method for analyzing power data of a rapid temperature change test box in this embodiment includes the following steps: Step S1, obtaining current data during the operation of the rapid temperature change test chamber.

[0027] Specifically, in one embodiment, a current sensor is installed outside the rapid temperature change test box to obtain current data when the rapid temperature change test box is running. At this time, the current data is the power supply current of the rapid temperature change test box, and the collection frequency is 1 Hz. Specifically, current data within 10 minutes or 30 minutes can be collected.

[0028] In another embodiment, the current data may also be the collected current data of various components in the rapid temperature change test chamber (such as monitoring compressor, fan, electric heater, etc.).

[0029] It should be noted that the reason for using the current data of the rapid temperature change test chamber as the power data is that the working principle of the rapid temperature change test chamber usually relies on the refrigeration and heating system (such as refrigeration unit, heater, etc.), and the power consumption of these systems will change with the temperature. When the temperature in the test chamber changes sharply, the load and current of the equipment will fluctuate accordingly. Therefore, by detecting the fluctuation of the current, we can preliminarily understand the working status of the rapid temperature change test chamber.

[0030] Of course, as another implementation, the power data may also be voltage data or power data.

[0031] Step S2, obtaining the fluctuation consistency of each current in the current data, and in response to the fluctuation consistency being greater than or equal to a threshold, eliminating the corresponding current to obtain the remaining current data.

[0032] In this embodiment, the process of obtaining the fluctuation consistency is as follows: Step S21, obtaining the change rate and relative prominence of any current in the current data of the rapid temperature change test chamber, and constructing a fluctuation characteristic vector of the corresponding current.

[0033] In one embodiment, the change rate is the degree of change of the current of the rapid temperature change test box at the current moment compared with the current at the previous moment.

[0034] Specifically, the current data of the rapid temperature change test chamber The rate of change of current It is expressed as: ; In the formula, The current data Current, The current data Current. Among them, For the The current is compared to the The greater the change in the current, the The higher the rate of change of the current.

[0035] In this embodiment, the relative prominence of each current in the fast temperature change test chamber current data within the corresponding window is also obtained. Any current is taken as the target data, the window of the target data is a local segment of the collected current data, and the data corresponding to the end of the local segment is the target data.

[0036] In this embodiment, the length of the window is L. Specifically, the value of L may be 11, that is, the window is 1×11. Of course, the size of the window may also be determined according to actual conditions.

[0037] In one embodiment, the relative difference between each current in the rapid temperature change test box and the maximum value and the minimum value in the corresponding window is used as the relative prominence degree of the corresponding current in the current data of the rapid temperature change test box.

[0038] Specifically, the current data The relative prominence of the current It is expressed as: ; In the formula, The current data Current, The current data The maximum value in the current corresponding window, The current data The current corresponds to the minimum value in the window.

[0039] In the formula, For the The comprehensive difference between a current and the maximum and minimum values ​​of the corresponding window, For the The difference between the maximum and minimum values ​​in the current corresponding window; when the comprehensive difference is larger and the difference is smaller, the The higher the relative prominence of the individual currents.

[0040] In another embodiment, the current data The relative prominence of each current can also be expressed as: The relative difference of a current compared to the mean of all currents in the corresponding window.

[0041] Specifically, no. The relative prominence of the current It can also be expressed as: ; in, The current data Current, The current data The current corresponds to the current average value in the window.

[0042] Further, The fluctuation characteristic vector of the current is expressed as: ; In the formula, For the The relative prominence of the current, For the The rate of change of current, For the The fluctuation characteristic vector of the current.

[0043] In this embodiment, the rate of change of the current is used to measure how fast the data changes in a short period of time; in the power data of the rapid temperature change test box, the rate of change can intuitively reflect the dynamic change characteristics of parameters such as power load or current. When the test box is in a state of rapid temperature change, the rate of change of its power data will also increase accordingly. The relative prominence is used to measure the degree of abnormality of a data point relative to other data points; in the power data, some data points may show significant abnormality due to equipment failure, operational errors or external interference. Therefore, in this embodiment, the degree of current fluctuation is comprehensively described based on the rate of change of each current in the current data of the rapid temperature change test box and the relative prominence.

[0044] Step S22, acquiring temperature data corresponding to the current data, and calculating the rate of change and relative prominence of the temperature corresponding to each current, and constructing a temperature fluctuation characteristic vector.

[0045] In this embodiment, the temperature data of the rapid temperature change test box during operation is obtained by a temperature sensor installed inside the rapid temperature change test box, wherein the temperature sensor and the current sensor have the same acquisition frequency. In this embodiment, the acquisition time of the temperature in the temperature data and the current in the current data are the same.

[0046] In one embodiment, The rate of change of temperature It is expressed as: ; In the formula, The temperature data Temperature, The temperature data Temperature.

[0047] In this embodiment, the relative prominence of each temperature in the rapid temperature change test chamber temperature data within the corresponding window is also obtained; the window size is L, and the window is a window with each temperature as the window end and a length of L as the size.

[0048] In one embodiment, the temperature data The relative prominence of the temperature It is expressed as: ; In the formula, The temperature data Temperature, The temperature data The maximum value in the window corresponding to each temperature, The temperature data The temperature corresponds to the minimum value in the window.

[0049] In another embodiment, the temperature data The relative prominence of each temperature can also be expressed as: The relative difference of a temperature compared to the mean of all temperatures in the corresponding window.

[0050] Specifically, no. The relative prominence of the temperature It can also be expressed as: ;in, The temperature data Temperature, The temperature data The temperature corresponds to the mean temperature in the window.

[0051] Further, The fluctuation characteristic vector of a temperature is expressed as: ; In the formula, For the The relative prominence of each temperature, For the The rate of change of temperature, For the The temperature fluctuation eigenvector.

[0052] The reason for introducing the temperature fluctuation characteristic vector is that the rapid temperature change test chamber, as an environmental testing device, will simulate different ambient temperatures, and the temperature change itself may cause a sudden change in power consumption, which may in turn affect the change in current; therefore, if the temperature change in the rapid temperature change test chamber is not considered, these sudden changes may be misjudged as abnormal data. In fact, they are just normal reactions to environmental changes, and the data of the normal reaction is virtual abnormal data. Therefore, further verification is required through the temperature fluctuation characteristic vector.

[0053] Step S23, calculating the fluctuation consistency of the current data of the rapid temperature change test chamber, eliminating the current whose fluctuation consistency is greater than or equal to a threshold, and obtaining the remaining current data.

[0054] In one embodiment, The consistency of the fluctuation of the current and the corresponding temperature It is expressed as: ; For the The fluctuation characteristic vector of the current, For the The temperature fluctuation characteristic vector, is the cosine similarity.

[0055] Among them, The current and the corresponding temperature data The higher the cosine similarity between the temperature fluctuation feature vectors, the higher the consistency between the two.

[0056] In another embodiment, The current and the corresponding temperature data The consistency of temperature fluctuations It can also be expressed as: ; In the formula, The current data The fluctuation characteristic vector of the current, is the temperature data corresponding to the current data The temperature fluctuation characteristic vector, is the magnitude of the vector.

[0057] in, Indicates The current and The smaller the difference, the higher the consistency. 0.1 is the preset hyperparameter to avoid the result being 0.

[0058] In this embodiment, after obtaining the fluctuation consistency of each current in the current data of the rapid temperature change test box, the fluctuation consistency is compared with the threshold value to eliminate virtual abnormal data of the current data of the rapid temperature change test box.

[0059] Specifically, a threshold a is set. When the fluctuation consistency of each current in the current data of the rapid temperature change test box is greater than or equal to the threshold, it can be considered that the current in the current data of the rapid temperature change test box and the temperature in the corresponding temperature data have a high consistency, that is, the fluctuation of the current of the rapid temperature change test box is caused by the external adjustment of the temperature in the test box (due to the sudden change of current data caused by the rapid temperature change test box, the current at this moment has a virtual abnormal performance), and the fluctuation it shows is a normal fluctuation, and the corresponding current belongs to virtual abnormal data; at this time, if this part of the virtual abnormal data is still subjected to abnormality detection, it may lead to misjudgment and waste equipment maintenance resources, so it needs to be eliminated to reduce the interference of subsequent abnormality detection.

[0060] The value of the above threshold a is 0.3, which can of course be determined according to actual conditions.

[0061] By analyzing the fluctuation consistency of each current in the current data of the rapid temperature change test box and the temperature in the corresponding temperature data, it is possible to determine whether each current in the current data of the rapid temperature change test box is virtual abnormal data, and before performing abnormal detection on the current data of the rapid temperature change test box, first eliminate this part of virtual abnormal data and perform abnormal detection on the remaining current data, which can avoid the problem of inaccurate abnormal detection and thus improve the accuracy of abnormal data identification results.

[0062] Step S3, performing abnormal detection on each residual current data, obtaining abnormal current, and issuing an alarm.

[0063] The anomaly detection in this embodiment may adopt the CBLOF algorithm or the LOF algorithm.

[0064] Taking the CBLOF algorithm as an example, the CBLOF algorithm (Cluster-Based Local Outlier Factor) is a method for anomaly detection that combines the ideas of clustering and local outlier factor (LOF). The basic steps of the CBLOF algorithm include data clustering, distinguishing large clusters from small clusters, calculating anomaly scores, and finally determining anomalies based on anomaly scores.

[0065] In this embodiment, the CBLOF algorithm is used to detect abnormalities in the residual current data. When abnormal data is identified, an alarm can be issued to remind relevant staff to perform maintenance. The specific detection process of the CBLOF algorithm is a well-known technology in China and will not be described in detail here.

[0066] For example, when an abnormal current is detected in a component, overcurrent protection needs to be activated, and staff members need to be reminded to conduct inspections and repairs.

[0067] It should be noted that, since the current data of the rapid temperature change test chamber usually has certain aggregation and periodicity, the CBLOF algorithm used in this embodiment can effectively identify abnormal points based on the clustering characteristics of the data, and can also combine the local characteristics and clustering structure of the data to accurately screen out the real abnormal data points.

[0068] Before identifying abnormal data in the current data of the rapid temperature change test box, the solution of the present invention can screen out virtual abnormal data according to the consistency of the current data and temperature data changes when the rapid temperature change test box is running, and then eliminate the virtual abnormal data, that is, eliminate the data with fluctuation characteristics and the fluctuation is synchronized with the temperature fluctuation, so as to avoid the problem of identifying the corresponding data as abnormal data when using the CBLOF algorithm for abnormality detection.

[0069] Since the power data of the rapid temperature change test chamber is usually used to monitor the operating status of the equipment, through the power data analysis method of the rapid temperature change test chamber of the present invention, the source of power fluctuations (whether caused by environmental factors or equipment failure itself) can be judged more intelligently, thereby avoiding unnecessary maintenance operations caused by interference from environmental factors.

[0070] The present invention also provides a power data analysis system for a rapid temperature change test chamber. Figure 2 As shown, the system includes a processor and a memory, wherein the memory stores computer program instructions, and when the computer program instructions are executed by the processor, the power data analysis method of the rapid temperature change test chamber according to the present invention is implemented.

[0071] The system also includes other components familiar to those skilled in the art, such as a communication bus and a communication interface, whose configuration and functions are known in the art and thus will not be described in detail here.

[0072] In the present invention, the aforementioned memory may be any tangible medium containing or storing a program, which may be used by or in combination with an instruction execution system, apparatus or device. For example, a computer-readable storage medium may be any appropriate magnetic storage medium or magneto-optical storage medium, such as a resistive random access memory RRAM (Resistive Random Access Memory), a dynamic random access memory DRAM (Dynamic Random Access Memory), a static random access memory SRAM (Static Random-Access Memory), an enhanced dynamic random access memory EDRAM (Enhanced Dynamic Random Access Memory), a high-bandwidth memory HBM (High-Bandwidth Memory), a hybrid memory cube HMC (Hybrid Memory Cube), etc., or any other medium that can be used to store the required information and can be accessed by an application, a module, or both. Any such computer storage medium may be part of a device or accessible or connectable to a device. Any application or module described in the present invention may be implemented by computer-readable / executable instructions stored or otherwise maintained by such a computer-readable medium.

[0073] In the description of this specification, “plurality” means at least two, such as two, three or more, etc., unless otherwise clearly and specifically defined.

[0074] Although this specification has shown and described a number of embodiments of the present invention, it will be apparent to those skilled in the art that such embodiments are provided by way of example only. Those skilled in the art will conceive of many modifications, changes and alternatives without departing from the ideas and spirit of the present invention. It should be understood that in the practice of the present invention, various alternatives to the embodiments of the present invention described herein may be employed.

Claims

1. A method for analyzing power data of a rapid temperature change test chamber, characterized in that: include: Obtain current data during the operation of the rapid temperature change test chamber; Obtaining the fluctuation consistency of each current in the current data, and in response to the fluctuation consistency being greater than or equal to a threshold, eliminating the corresponding current to obtain the remaining current data; Perform abnormal detection on the residual current data, obtain abnormal current, and issue an alarm; The fluctuation consistency is the similarity between the fluctuation characteristic vector of the current and the fluctuation characteristic vector of the temperature at the same time; the fluctuation characteristic vector is a two-dimensional vector composed of the change rate and relative prominence of the target data; the target data is any current or any temperature; The relative prominence degree represents the difference change of the target data in the corresponding window; the size of the window is a set length with the target data as the end of the window.

2. The power data analysis method of a rapid temperature change test chamber according to claim 1, characterized in that: The fluctuation consistency for: ； In the formula, The current data The fluctuation characteristic vector of the current, is the temperature data corresponding to the current data The temperature fluctuation characteristic vector, is the magnitude of the vector.

3. The power data analysis method of a rapid temperature change test chamber according to claim 1, characterized in that: The fluctuation consistency is the cosine similarity between the fluctuation characteristic vector of the current and the fluctuation characteristic vector of the temperature at the same time.

4. The power data analysis method of a rapid temperature change test chamber according to claim 2 or 3, characterized in that: When the target data is any current, the relative prominence for: ； In the formula, The current data Current, The current data The maximum value in the current corresponding window, The current data The current corresponds to the minimum value in the window.

5. The power data analysis method of a rapid temperature change test chamber according to claim 2 or 3, characterized in that: When the target data is any current, the relative prominence for: ;in, The current data Current, The current data The current corresponds to the current mean value in the window, and L is the set length of the window.

6. The method for analyzing power data of a rapid temperature change test chamber according to claim 1, characterized in that: When the target data is any current, the change rate for: ; The current data Current, The current data A current.

7. The method for analyzing power data of a rapid temperature change test chamber according to claim 1, characterized in that: The abnormality detection on the residual current data adopts the CBLOF algorithm.

8. A power data analysis system for a rapid temperature change test chamber, characterized in that: include: processor; A memory storing computer instructions for power data analysis of a rapid temperature change test chamber. When the computer instructions are executed by the processor, the system executes a power data analysis method for a rapid temperature change test chamber according to any one of claims 1 to 7.

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