Optical interconnection channel TDR low-cost test system

Abstract

The invention discloses an optical interconnection channel TDR low-cost test system and device, and belongs to the technical field of optical communication, and the system comprises a signal generation module which is used for generating a time domain reflectometer test signal required by a test, and the parameters of the test signal can be adjusted according to the characteristics of different optical interconnection channels; a light emission conversion module connected with the signal generation module and used for converting the TDR test signal into an optical signal and injecting the optical signal into a to-be-tested optical interconnection channel; according to the invention, low-cost universal devices are adopted, and accurate measurement of optical interconnection channel performance parameters is realized through optimization design and an advanced algorithm; the system has the advantages of being high in data processing capacity, complete in calibration compensation function and the like, the problems that a traditional system is high in cost, poor in distance measurement accuracy and the like are effectively solved, noise and temperature drift errors can be effectively eliminated by additionally arranging the calibration compensation module, and then the system testing accuracy is improved.

Description

Technical Field

[0001] The present invention belongs to the field of optical communication technology, and more specifically, relates to a low-cost test system for time-domain reflectometry (TDR) of optical interconnection channels. Background Art

[0002] In the test of optical interconnection channels, the time-domain reflectometer (TDR) technology is a commonly used method.

[0003] A low-cost test device, method, and system for TDR of optical interconnection channels were disclosed on February 20, 2024, with the publication number CN117579153A. It includes: a bias current application component for applying a bias current Bias to an optical device through an optical interconnection channel, monitoring the light emission of the laser through an MPD, and adjusting the magnitude of the bias current Bias according to the MPD feedback current at different temperatures to ensure that the laser maintains within a set light emission range and is consistent with the bias current Bias when it operates on the optical module. A test signal application component for transmitting a high-speed test signal to the optical device through the optical interconnection channel and being able to isolate the inflow of the bias current Bias. The present invention can adaptively regulate the magnitude of the bias current Bias and load a high-frequency test signal for TDR testing, making full use of the existing module design scheme and firmware resources, reducing the equipment cost of traditional testing, and at the same time solving the problem that the Bias current is inconsistent with the actual working state during testing.

[0004] However, in the actual operation process of the above system, there are often problems of high cost, and the data processing ability of some systems is insufficient, which easily leads to poor accuracy of characteristic parameters of optical interconnection channels such as distance measurement, and the overall system test accuracy needs to be further improved. Summary of the Invention

[0005] Problems to be Solved

[0006] In view of the problems raised in the existing background art, the present invention provides a low-cost test system for TDR of optical interconnection channels.

[0007] Technical Solution

[0008] To solve the above problems, the present invention adopts the following technical solutions.

[0009] A low-cost test system for TDR of optical interconnection channels includes:

[0010] A signal generation module for generating the time-domain reflectometer test signal required for testing, and the parameters of the test signal can be adjusted according to the characteristics of different optical interconnection channels;

[0011] An optical emission conversion module connected to the signal generation module for converting the TDR test signal into an optical signal and injecting it into the optical interconnection channel to be tested;

[0012] An optical receiving and converting module, which is arranged at the receiving end of the optical interconnection channel, is used to receive the optical signal reflected from the optical interconnection channel and convert it into an electrical signal;

[0013] A signal acquisition and processing module, which is connected to the optical receiving and converting module, is used to acquire the converted electrical signal and process and analyze the acquired signal to obtain the performance parameters of the optical interconnection channel;

[0014] A display and storage module, which is connected to the signal acquisition and processing module, is used to display the processed and analyzed test results and store the relevant test data.

[0015] Preferably, the signal generating module includes:

[0016] A pulse generator module, which is used to generate pulse signals;

[0017] A signal conditioning circuit module, which is connected to the pulse generator module, is used to adjust the amplitude, width and rise time of the pulse signal to meet the test requirements of different optical interconnection channels.

[0018] Further, the optical transmitting and converting module includes:

[0019] An electro-optic modulator module, which is used to load the TDR test signal onto the optical carrier to realize the conversion from electrical signal to optical signal;

[0020] A drive circuit module, which is connected to the electro-optic modulator module, is used to provide appropriate drive voltage and current for the electro-optic modulator module.

[0021] Preferably, the optical receiving and converting module includes:

[0022] A photodetector module, which is used to convert the received optical signal into an electrical signal;

[0023] A preamplifier module, which is connected to the photodetector module, is used to preliminarily amplify the converted electrical signal to improve the signal strength and quality.

[0024] Even further, the signal acquisition and processing module includes:

[0025] A data acquisition card module, which is used to acquire the electrical signal output by the optical receiving and converting module and convert it into a digital signal;

[0026] A processor module, which is connected to the data acquisition card module, is used to process and analyze the acquired digital signal, including time domain reflection analysis, amplitude analysis, delay analysis, to obtain the characteristic parameters of the optical interconnection channel.

[0027] Further, the calibration module is used to calibrate the system before testing to eliminate the influence of system errors and external interferences on the test results.

[0028] Still further, the calibration module includes:

[0029] A standard optical interconnection channel module, serving as a calibration reference;

[0030] A calibration signal generation module, used to generate calibration signals;

[0031] A calibration signal processing module, used to process and analyze the signals collected during the calibration process to determine the calibration coefficients and compensation parameters of the system.

[0032] The display and storage module includes:

[0033] A display screen module, used to display the test results and relevant waveforms in real time;

[0034] A memory module, used to store the test data and analysis results, and the memory module supports local storage and remote transmission of data.

[0035] Even further, the obtained characteristic parameters of the optical interconnection channel include loss, reflection coefficient, and length.

[0036] Even further, it further includes a calibration compensation module, and the calibration compensation module includes a temperature compensation module and a noise compensation module.

[0037] Advantageous Effects

[0038] Compared with the prior art, the advantageous effects of the present invention are as follows:

[0039] (1) The present invention adopts low-cost general devices and realizes accurate measurement of the performance parameters of the optical interconnection channel through optimized design and advanced algorithms; this system has the characteristics of strong data processing ability and perfect calibration compensation function, effectively solving the problems of high cost and poor distance measurement accuracy of traditional systems. At the same time, in the present invention, by adding a calibration compensation module, noise and temperature drift errors can be effectively eliminated, thereby improving the test accuracy of the system. Description of the Drawings

[0040] In order to more clearly illustrate the technical solutions in the embodiments or exemplifications of the present application, the following will briefly introduce the drawings required for use in the embodiments or exemplifications. Obviously, the drawings in the following description are only some embodiments of the present application, and therefore should not be regarded as limiting the scope. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained according to the drawings shown.

[0041] Figure 1This is the system structure diagram of the present invention. Detailed implementation manners

[0042] To make the objectives, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Apparently, the described embodiments are some, but not all, of the embodiments of the present application. Generally, the components of the embodiments of the present application described and illustrated herein can be arranged and designed in various different configurations.

[0043] Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the present application claimed, but merely represents selected embodiments of the present application. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0044] Embodiment

[0045] As Figure 1 shown, a low-cost test system for optical interconnection channel TDR includes:

[0046] Signal generation module:

[0047] The signal generation module is used to generate the time domain reflectometer test signal required for testing. Its specific composition and working process are as follows:

[0048] Pulse generator module: A common integrated pulse generator chip is adopted, such as the MAX3650 chip. This chip can stably generate pulse signals; its working voltage is 3.3V and is triggered by an external clock signal, and can generate pulse signals with a frequency range of 100MHz - 1GHz.

[0049] Signal conditioning circuit module: It consists of an operational amplifier and a resistor-capacitor network; by adjusting the resistance value of the resistor, parameters such as the amplitude, width, and rise time of the pulse signal can be adjusted.

[0050] In specific implementation, when it is necessary to increase the amplitude of the pulse signal, the gain resistor of the operational amplifier can be appropriately increased; if the pulse width needs to be changed, the charge and discharge time constant of the capacitor can be adjusted. In this way, the test requirements of different optical interconnection channels can be met.

[0051] Optical emission conversion module:

[0052] The optical emission conversion module is responsible for converting the TDR test signal into an optical signal and injecting it into the optical interconnection channel to be tested, specifically as follows:

[0053] Electro - optic modulator module: Select a low - cost lithium niobate electro - optic modulator, such as the EO - MZM series modulator; this modulator has a high modulation efficiency and a wide bandwidth, and can efficiently load an electrical signal onto an optical carrier.

[0054] Driver circuit module: Composed of a power amplifier and a bias circuit; for the power amplifier, select the AD8351 chip, which can provide sufficient driving power for the electro - optic modulator to make it work properly; the bias circuit is used to provide a suitable DC bias voltage for the electro - optic modulator to ensure that the modulator operates at the optimal operating point.

[0055] Optical receiving and converting module:

[0056] The optical receiving and converting module is set at the receiving end of the optical interconnection channel, and converts the reflected optical signal into an electrical signal. Its composition and working conditions are as follows:

[0057] Photo - detector module: Use a PIN photo - diode as the photo - detector, such as the S13360 series photo - diodes. This photo - diode has a high response speed and sensitivity, and can quickly and accurately convert the optical signal into an electrical signal.

[0058] Pre - amplifier module: Select a low - noise operational amplifier AD8099 to form a pre - amplifier circuit; this amplifier can preliminarily amplify the converted weak electrical signal, improve the signal strength and quality, and facilitate subsequent acquisition and processing.

[0059] Signal acquisition and processing module:

[0060] The signal acquisition and processing module acquires, processes, and analyzes the converted electrical signal, specifically including:

[0061] Data acquisition card module: Use a high - speed data acquisition card, such as the PXIe - 5162 data acquisition card; this acquisition card has a 12 - bit resolution and a sampling rate of up to 5 GS / s, and can accurately acquire the electrical signal output by the optical receiving and converting module and convert it into a digital signal.

[0062] Processor module: Select a processor with an ARM architecture, such as the STM32H7 series processor; this processor has a high operation speed and rich peripheral interfaces, and can process and analyze the acquired digital signal, including time - domain reflectometry analysis, amplitude analysis, delay analysis, etc., so as to obtain the characteristic parameters of the optical interconnection channel, such as loss, reflection coefficient, length, etc.

[0063] Display and storage module:

[0064] The display and storage module is used to display the test results and store relevant data, specifically as follows:

[0065] Display module: An LCD display is used, which can display the test results and relevant waveforms in real time, facilitating the operation personnel to observe and analyze.

[0066] Memory module: An SD card and an Ethernet interface are used to achieve data storage and transmission; the SD card is used for local storage of test data and analysis results, and the Ethernet interface supports remote data transmission, facilitating further processing and sharing of data.

[0067] Calibration module:

[0068] The calibration module is used to calibrate the system before testing, eliminating the influence of system errors and external interference on the test results. The specific composition and working method are as follows:

[0069] Standard optical interconnection channel module: A standard optical interconnection channel with known characteristic parameters is selected as the calibration reference, and its parameters such as length and loss are accurately measured and calibrated.

[0070] Calibration signal generation module: A circuit structure similar to the signal generation module is adopted to generate specific calibration signals. The parameters of these calibration signals have a certain corresponding relationship with the actual test signals.

[0071] Calibration signal processing module: Processes and analyzes the signals collected during the calibration process, and determines the calibration coefficients and compensation parameters of the system by comparing with the known parameters of the standard optical interconnection channel.

[0072] Calibration compensation module:

[0073] The calibration compensation module includes a temperature compensation module and a noise compensation module:

[0074] Temperature compensation module: A temperature sensor is used to monitor the working temperature of the system in real time, such as the DS18B20 temperature sensor; the parameters of the signal acquisition and processing module are adjusted according to the temperature change to compensate for the influence of temperature on the test results.

[0075] Noise compensation module: Processes the collected signals through digital filtering algorithms, such as the adaptive filtering algorithm; this algorithm can automatically adjust the filtering parameters according to the characteristics of the signals, effectively suppressing the interference of external noise on the test results.

[0076] The present invention adopts low-cost general devices, and realizes the accurate measurement of the performance parameters of the optical interconnection channel through optimized design and advanced algorithms; this system has the characteristics of strong data processing ability and perfect calibration compensation function, effectively solving the problems of high cost and poor distance measurement accuracy of traditional systems. At the same time, in the present invention, by adding a calibration compensation module, the noise and temperature drift errors can be effectively eliminated, thereby improving the test accuracy of the system.

[0077] The above-described embodiments merely represent the preferred embodiments of the present invention. The description is relatively specific and detailed, but it should not be construed as limiting the scope of the patent for the present invention. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications, improvements, and substitutions can be made, and these all fall within the protection scope of the present invention.

Claims

1. A low-cost test system for optical interconnection channel TDR, characterized in that, Including: A signal generation module, which is used to generate time domain reflectometer test signals required for testing, and the parameters of the test signals can be adjusted according to the characteristics of different optical interconnection channels; An optical emission conversion module, connected to the signal generation module, which is used to convert the TDR test signal into an optical signal and inject it into the optical interconnection channel to be tested; An optical reception conversion module, arranged at the receiving end of the optical interconnection channel, which is used to receive the optical signal reflected from the optical interconnection channel and convert it into an electrical signal; A signal acquisition and processing module, connected to the optical reception conversion module, which is used to acquire the converted electrical signal and process and analyze the acquired signal to obtain the performance parameters of the optical interconnection channel; A display and storage module, connected to the signal acquisition and processing module, which is used to display the processed and analyzed test results and store relevant test data.

2. The low-cost test system for optical interconnection channel TDR according to claim 1, characterized in that: The signal generation module includes: A pulse generator module, which is used to generate pulse signals; A signal conditioning circuit module, connected to the pulse generator module, which is used to adjust the amplitude, width and rise time of the pulse signal to meet the test requirements of different optical interconnection channels.

3. The low-cost test system for optical interconnection channel TDR according to claim 1, wherein: The optical emission conversion module includes: An electro-optic modulator module, which is used to load the TDR test signal onto an optical carrier to achieve the conversion from an electrical signal to an optical signal; A drive circuit module, connected to the electro-optic modulator module, which is used to provide appropriate drive voltage and current for the electro-optic modulator module.

4. A low-cost test system for optical interconnection channel TDR according to claim 3, characterized in that: The optical reception conversion module includes: A photodetector module, which is used to convert the received optical signal into an electrical signal; A preamplifier module, connected to the photodetector module, which is used to preliminarily amplify the converted electrical signal to improve the strength and quality of the signal.

5. The low-cost test system for optical interconnection channel TDR according to claim 4, wherein: The signal acquisition and processing module includes: A data acquisition card module, which is used to acquire the electrical signal output by the optical reception conversion module and convert it into a digital signal; A processor module, connected to the data acquisition card module, which is used to process and analyze the acquired digital signal, including time domain reflection analysis, amplitude analysis, delay analysis, to obtain the characteristic parameters of the optical interconnection channel.

6. The low-cost test system for optical interconnection channel TDR according to claim 1, characterized in that: It also includes a calibration module, which is used to calibrate the system before testing to eliminate the influence of system errors and external interference on the test results.

7. The low-cost test system for optical interconnection channel TDR according to claim 6, wherein, The calibration module includes: A standard optical interconnection channel module, serving as a calibration reference; A calibration signal generation module, which is used to generate calibration signals; A calibration signal processing module, which is used to process and analyze the signals acquired during the calibration process to determine the calibration coefficients and compensation parameters of the system.

8. A low-cost test system for optical interconnection channel TDR according to claim 1, characterized in that: The display and storage module includes: A display screen module, which is used to display the test results and relevant waveforms in real time; A memory module, which is used to store the test data and analysis results, and the memory module supports local storage and remote transmission of data.

9. A low-cost test system for optical interconnection channel TDR according to claim 5, characterized in that, The obtained characteristic parameters of the optical interconnection channel include loss, reflection coefficient, and length.

10. A low-cost test system for optical interconnection channel TDR according to claim 7, characterized in that, It also includes a calibration compensation module, and the calibration compensation module includes a temperature compensation module and a noise compensation module.

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