Electron beam focusing method of micro-channel plate, micro-channel plate and image intensifier
By setting an insulating dielectric layer and a modulation electrode outside the output electrode of the microchannel plate, an electric field is formed to focus the electron beam, which solves the electron beam spot expansion effect, improves the spatial resolution and electronic gain of the image intensifier, and ensures the stability of the image intensifier.
Patent Information
- Application Number
- CN202510720262.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-05-30
- Publication Date
- 2025-09-09
AI Technical Summary
Existing microchannel plates are prone to electron beam spot expansion, resulting in a decrease in the spatial resolution of the image intensifier, and are prone to discharge at high operating voltages, affecting stability.
An insulating dielectric layer and a modulation electrode are set outside the output electrode of the microchannel plate. By applying different working voltages to form an electric field, the insulating dielectric layer and the modulation electrode are used to form a miniature electric lens to focus the electron beam emitted by each microchannel individually and reduce the degree of beam spot dispersion.
The spatial resolution and electronic gain of the image intensifier are improved, while the discharge phenomenon between electrodes under high operating voltage is avoided, ensuring the stability and reliability of the image intensifier.