HIRF comprehensive sensitivity test device and test method for radiation and conduction overlapping frequency bands

Abstract

The present application relates to the technical field of aircraft testing, and discloses a radiation and conduction overlapping frequency band HIRF comprehensive sensitivity test device and a test method, the device comprising a reverberation chamber and a test control system, a grounding panel and a support seat are arranged in the reverberation chamber, the support seat is arranged on the grounding panel, a device under test is placed on the upper surface of the support seat, a stirrer is arranged at a corner of the reverberation chamber, and the test control system is in bidirectional communication with a signal generation and processing system, an adaptive delay compensation system, a radiation test system, a conduction test system, an optoelectronic conversion system and a measurement receiver. The present application aligns the arrival time of a radiation field and conduction interference at the device under test through the adaptive delay compensation system, reproduces the electromagnetic energy synchronous coupling effect in the HIRF environment, combines field strength closed-loop control and conduction current monitoring feedback, synchronously applies a radiation field strength and wire bundle injection current that meet standard levels, and realizes verification of the coupling mechanism of radiation-conduction comprehensive sensitivity.

Description

Technical Field

[0001] The present invention relates to the field of aircraft testing, and more particularly to a HIRF comprehensive sensitivity test device and a test method for a radiation and conduction overlapping frequency band. Background Art

[0002] High-intensity radiated fields (HIRF) refer to the electromagnetic environment that civil aircraft may encounter under current flight regulations, caused by radiation from beyond-horizon ship radars, airport surveillance radars, AM and FM radios, and very high-frequency television transmitters. Due to their long duration, wide bandwidth, and strong interference fields, HIRF environments seriously impact aircraft safety and are a rigid requirement for civil aircraft airworthiness.

[0003] The HIRF-LLSC test of a complete civil aircraft mainly targets electromagnetic waves in the 1MHz to 400MHz frequency band. The LLSC test is performed to obtain the normalized transfer function between the low-level radiation field and the cable bundle induced current. Based on the normalized transfer function, the cable bundle induced current in a high-level environment is extrapolated, providing a basis for system-level HIRF conducted sensitivity test evaluation.

[0004] The HIRF-LLSF test for civil aircraft mainly targets the frequency band above 100 MHz. The normalized attenuation function of the aircraft cabin is obtained through local low-level irradiation. The normalized attenuation function is linearly extrapolated according to the external RF environment to obtain the system-level HIRF radiation test field strength requirements for the electronic and electrical systems and equipment in the cabin, providing a basis for the system-level HIRF radiation sensitivity test evaluation.

[0005] In the 100MHz to 400MHz frequency band, the actual coupling mechanism is more complex. HIRF interference to the system exists simultaneously with conducted and radiated interference, and it is unclear which is stronger. In this overlapping frequency band, with wavelengths between 3 meters and 0.75 meters, all equipment cables and structures can become effective receiving antennas. Especially when the cable length approaches one-quarter of the wavelength, resonance is likely to occur, resulting in higher induced currents or voltages.

[0006] Therefore, in the overlapping frequency band of 100MHz to 400MHz, simply conducting independent test evaluations of HIRF radiation and conducted sensitivity will result in errors and the actual HIRF coupling interference effect. In addition, the combined interference effect of HIRF radiation and conducted coupling on airborne equipment / systems is unknown, resulting in potential hazards to aircraft flight safety in HIRF environments. Summary of the Invention

[0007] The present invention provides a device and method for testing HIRF comprehensive sensitivity in the overlapping frequency band of radiation and conduction, which solves the technical problems in the related art of independently testing and evaluating HIRF radiation and conduction sensitivity in the overlapping frequency band of 100MHz to 400MHz, which leads to errors between the actual HIRF coupling interference effect and the unknown comprehensive interference effect of HIRF radiation and conduction coupling on airborne equipment / systems, resulting in potential safety hazards to aircraft flight in HIRF environments.

[0008] The present invention provides a HIRF comprehensive sensitivity test device for overlapping frequency bands of radiation and conduction, comprising a reverberation chamber and a test control system. A grounding plate and a support base are provided in the reverberation chamber, the support base being disposed on the grounding plate, a device under test being placed on the upper surface of the support base, and a stirrer being vertically disposed at a corner of the reverberation chamber. The test control system performs bidirectional communication with various subsystems, including a signal generation and processing system, an adaptive delay compensation system, a radiation test system, a conduction test system, a photoelectric conversion system, and a measurement receiver.

[0009] The signal generation and processing system includes a signal generator, a signal pre-processing unit, and a power amplifier. The signal generator outputs the RF signal to the signal pre-processing unit through a coaxial cable, and the power amplifier amplifies the signal to the required power level before outputting it.

[0010] The adaptive delay compensation system includes a programmable delay device, a channel characteristic measurement unit, a frequency-dependent delay characteristic database, a feedback calibration unit, and a high-precision clock synchronization unit. The programmable delay device is connected to the test control system via a high-speed digital bus. The channel characteristic measurement unit transmits data output by a high-speed oscilloscope and two channels via optical fiber. The frequency-dependent delay characteristic database is deployed on the server of the test control system. The feedback calibration unit exchanges data with the test control system via Ethernet. The high-precision clock synchronization unit provides synchronized clock signals for each subsystem via a dedicated clock cable.

[0011] The radiation test system includes a transmitting antenna and a receiving antenna / field strength sensor. The transmitting antenna is connected to the output of the radiation power amplifier via a coaxial cable to generate an electromagnetic field. The receiving antenna / field strength sensor transmits the field strength data to the photoelectric conversion system via optical fiber.

[0012] The conduction test system includes a current injection probe and a current monitoring probe. The current injection probe is connected to the output end of the conduction power amplifier through a coaxial cable, and the current monitoring probe transmits monitoring data to the photoelectric conversion system through an optical fiber.

[0013] The input of the photoelectric conversion system is to receive the signal of the receiving antenna and current monitoring probe through optical fiber, and the output is to transmit the converted signal to the measurement receiver through coaxial cable; the input of the measurement receiver is to receive the signal after photoelectric conversion by the photoelectric conversion system through coaxial cable, and transmit the analysis result to the test control system through Ethernet.

[0014] Furthermore, the distance between the device under test and the wall of the reverberation chamber is greater than or equal to one-quarter wavelength corresponding to the lowest operating frequency, the distance between the device under test and the grounding plate is greater than or equal to one-quarter wavelength, and the total volume of the device under test and the support base accounts for less than or equal to 8% of the total volume of the reverberation chamber.

[0015] Furthermore, the signal pre-processing unit divides the signal into a radiation channel and a conduction channel through a power divider, and both the radiation channel and the conduction channel are equipped with independent attenuators and filters;

[0016] Power amplifiers include radiation power amplifiers and conduction power amplifiers;

[0017] The radiation channel is connected to the radiation power amplifier, and the conduction channel is connected to the conduction power amplifier.

[0018] Furthermore, the programmable delay device has two control modes: coarse adjustment and fine adjustment. Coarse adjustment adopts a digital delay line structure, and fine adjustment adopts a voltage-controlled analog variable delay unit.

[0019] Furthermore, the current injection probe should be calibrated before testing, supported and fixed in the center of the reverberation chamber.

[0020] Furthermore, a high-speed oscilloscope receives data from the receiving antenna / field strength sensor of the radiation channel and the current monitoring probe of the conduction channel through optical fiber, and is used to collect and analyze the time domain waveforms of the two channels in real time.

[0021] Furthermore, the layout requirements of the current monitoring probe include: the current monitoring probe is 5 cm away from the EUT termination, the current monitoring probe is close to the connector bottom shell, and the distance between the current injection probe and the current monitoring probe is 5 cm.

[0022] Furthermore, the stirrer adopts a Z-shaped metal plate structure and is driven to rotate by a stepper motor.

[0023] The present invention also proposes a method for testing HIRF comprehensive sensitivity in the overlapping frequency band of radiation and conduction, comprising the following steps:

[0024] S1, initialization and delay calibration: inject reference pulse signal, measure the delay difference of radiation / conduction channel, calculate the compensation value and store it in the database, and adjust the radiation channel delay according to the test frequency;

[0025] S2, test arrangement: The device under test is placed on a ground plane, and the receiving antenna / field strength sensor is deployed in the working area of ​​the reverberation chamber, with a distance from the device / support ≥ 0.75m or λ / 4 of the wavelength corresponding to the lowest frequency;

[0026] S3, reverberation chamber field strength calibration: control the radiation power amplifier level, monitor the maximum power during the stirrer rotation cycle through the receiving antenna, and record the calibration data;

[0027] S4, parameter setting: select the cable to be tested, set the starting frequency, signal modulation mode, radiation field strength value, conduction injection current value, and frequency point dwell time;

[0028] S5, comprehensive test operation: start real-time delay compensation, synchronously monitor radiation field strength and conduction current, and record device response;

[0029] S6, frequency and cable switching: After traversing all test frequencies, switch to the next cable and repeat the test until all cables are completed;

[0030] S7, test summary: terminate the test, analyze the data, and generate a complete test report.

[0031] Furthermore, starting real-time delay compensation includes monitoring ambient temperature factors, triggering delay when the temperature changes beyond a preset threshold, adjusting compensation parameters in real time, dynamically inserting calibration pulses in the gaps between test signals, and updating delay compensation parameters.

[0032] The beneficial effects of the present invention are:

[0033] The present invention uses an adaptive delay compensation system to precisely align the arrival times of the radiation field and conducted interference at the equipment under test (EUT), realistically reproducing the synchronous coupling effect of electromagnetic energy in a HIRF environment. Combining closed-loop control of the reverberation chamber field strength with conduction current monitoring feedback, the present invention synchronously applies radiation field strength and harness injection current that meet standard levels in a controlled environment, achieving for the first time the verification of the coupling mechanism of radiation-conduction combined sensitivity, accurately exposing the potential failure modes of the equipment in a real HIRF environment, eliminating assessment deviations caused by sub-item testing, and significantly improving the reliability of aircraft electromagnetic safety margin assessments. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 It is a structural schematic diagram of the HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction of the present invention;

[0035] Figure 2 It is a schematic diagram of the connection of the subsystems in the HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction of the present invention;

[0036] Figure 3It is a schematic diagram of the connection relationship between various modules in the HIRF comprehensive sensitivity testing method for the overlapping frequency band of radiation and conduction of the present invention. DETAILED DESCRIPTION

[0037] The subject matter described herein will now be discussed with reference to exemplary embodiments. It should be understood that these embodiments are discussed solely to enable those skilled in the art to better understand and implement the subject matter described herein, and that the functions and arrangements of the elements discussed may be varied without departing from the scope of this specification. Various examples may omit, substitute, or add various processes or components as needed. In addition, features described with respect to some examples may also be combined in other examples.

[0038] like Figure 1-Figure 3 As shown, the HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction includes:

[0039] Reverberation chamber: It includes a grounding plate and a support base. The support base is set on the grounding plate, and the EUT is placed on the upper surface of the support base. The reverberation chamber is used to provide a test space for electromagnetic shielding and uniform distribution of electromagnetic fields.

[0040] The layout requirements of the reverberation room's working area are as follows:

[0041] The distance between the equipment under test (EUT) and the wall of the reverberation chamber is greater than or equal to one quarter wavelength (λ / 4) corresponding to the lowest operating frequency;

[0042] The distance between the EUT and the ground plane is greater than or equal to one quarter wavelength (λ / 4);

[0043] The total volume of the EUT and the support base accounts for less than or equal to 8% of the total volume of the reverberation chamber;

[0044] The stirrer is set vertically at one corner of the reverberation chamber, adopts a Z-shaped metal plate structure, and is driven to rotate by a stepper motor;

[0045] The test control system communicates bidirectionally with each subsystem via Ethernet;

[0046] The subsystems include signal generation and processing system, adaptive delay compensation system, radiation test system, conduction test system, photoelectric conversion system and measurement receiver;

[0047] Signal generation and processing system: including signal generator, signal pre-processing unit, and power amplifier;

[0048] The signal generator outputs the radio frequency signal to the signal pre-processing unit through the coaxial cable;

[0049] The signal pre-processing unit divides the signal into a radiation channel and a conduction channel through a power divider. Both the radiation channel and the conduction channel are equipped with independent attenuators and filters.

[0050] Radiation channel: This channel is connected to the radiation power amplifier;

[0051] Conduction channel: This channel is connected to the conduction power amplifier;

[0052] The power amplifier amplifies the signal to the required power level and then outputs it. The power amplifier includes a radiation power amplifier and a conduction power amplifier;

[0053] Adaptive delay compensation system: including programmable delay device, channel characteristic measurement unit, frequency-dependent delay characteristic database, feedback calibration unit and high-precision clock synchronization unit;

[0054] The programmable delay device is connected to the test control system through a high-speed digital bus. The programmable delay device has two control modes: coarse adjustment and fine adjustment.

[0055] The coarse adjustment adopts a digital delay line structure; the fine adjustment adopts a voltage-controlled analog variable delay unit;

[0056] The channel characteristic measurement unit transmits the data output by the high-speed oscilloscope and two channels through optical fiber;

[0057] The high-speed oscilloscope receives data from the receiving antenna / field strength sensor of the radiation channel and the current monitoring probe of the conduction channel through optical fiber, and is used to collect and analyze the time domain waveforms of the two channels in real time;

[0058] The frequency-dependent delay characteristics database is deployed on the server of the experimental control system and adopts a multi-level index storage structure;

[0059] The feedback calibration unit exchanges data with the test control system via Ethernet to calibrate the data;

[0060] The high-precision clock synchronization unit provides synchronized clock signals to each subsystem through a dedicated clock cable;

[0061] The radiation test system includes a transmitting antenna and a receiving antenna / field strength sensor;

[0062] The transmitting antenna is connected to the output of the radiating power amplifier via a coaxial cable to generate an electromagnetic field;

[0063] The receiving antenna / field strength sensor transmits the field strength data to the photoelectric conversion system via optical fiber;

[0064] The conduction test system includes a current injection probe and a current monitoring probe;

[0065] The current injection probe is connected to the output of the conduction power amplifier through a coaxial cable to inject the interference signal;

[0066] Specifically, the current injection probe should be calibrated before testing, and the current injection probe should be supported and fixed in the center;

[0067] The current monitoring probe transmits the monitoring data to the photoelectric conversion system via optical fiber;

[0068] The arrangement requirements of the current monitoring probe are as follows: the current monitoring probe should be 5 cm away from the EUT terminal, the current monitoring probe should be close to the bottom shell of the connector, and the distance between the current injection probe and the current monitoring probe should be 5 cm;

[0069] The 5cm distance from the EUT termination refers to the distance from the center of the probe magnetic ring to the EUT cable inlet / connector.

[0070] Close to the connector bottom shell means that the probe body is as close as possible to the metal shell of the cable connector on the EUT shell to capture the interference current closest to the EUT;

[0071] The 5cm spacing between the current injection probe and the current monitoring probe refers to the distance between the centers of the two probe magnetic rings. This distance must be strictly controlled. Too close will cause mutual interference, while too far will reduce the representativeness of the monitoring point. 5cm is a common recommended value. A non-metallic fixture must be used to accurately maintain this spacing.

[0072] The input of the photoelectric conversion system is to receive the signal from the receiving antenna and current monitoring probe through optical fiber, and the output is to transmit the converted signal to the measurement receiver through coaxial cable; the input of the measurement receiver is to receive the signal converted by the photoelectric conversion system through coaxial cable, and transmit the analysis result to the test control system through Ethernet;

[0073] In the 100MHz-400MHz frequency band, the external HIRF environment causes both radiated and conducted coupling interference to system-level devices. If the coupling effects of independent radiated and conducted sensitivity tests differ from those in actual conditions, a comprehensive HIRF sensitivity test is required for the 100MHz-400MHz frequency band.

[0074] The present invention provides a method for testing HIRF comprehensive sensitivity in the overlapping frequency band of radiation and conduction, comprising the following steps:

[0075] S1, system initialization and delay calibration: inject standard reference pulse signals into the radiation channel and the conduction channel; measure the time response characteristics and transmission delay difference of the radiation channel and the conduction channel; calculate the required delay compensation value and store it in the frequency-dependent delay characteristic database; obtain the delay compensation parameter from the frequency-dependent delay characteristic database according to the test frequency; adjust the delay of the signal path of the radiation channel through the programmable delay device;

[0076] The standard reference pulse refers to the injected pulse signal, which should be a fast-edge nanosecond pulse (e.g., rise / fall time ≤ 2ns, pulse width 10ns), with a spectrum covering 100-400MHz and a moderate amplitude (not saturating the power amplifier).

[0077] Measuring response characteristics refers to simultaneously collecting the time domain waveforms of the radiation channel (receiving antenna / field strength sensor output) and the conduction channel (current monitoring probe output) using a high-speed oscilloscope (≥2GHzBW, ≥10GSa / s);

[0078] The measurement needs to be performed at multiple (e.g. 10-20) random stirrer positions to average out the effects of the reverberation room modes;

[0079] Transmission delay difference refers to the cross-correlation analysis of the collected pulse waveforms or the direct measurement of the arrival time difference of the pulse front, and the calculation of the average compensation value / delay compensation value of multiple stirrer positions at each frequency point. The delay compensation value is usually applied to the signal path of the conduction channel (because its path is usually shorter and easier to compensate) and adjusted through a programmable delay device.

[0080] The programmable delay device adjustment specifically refers to: the test control system queries the database to obtain the delay compensation value corresponding to the current test frequency according to the current test frequency;

[0081] Send precise control instructions to the programmable delay devices on the transmission path via a high-speed bus:

[0082] Coarse adjustment (digital delay line): Set the basic delay step (e.g. 10ps step).

[0083] Fine-tuning (analog variable delay): fine-tuning the delay (<1ps resolution) to precisely achieve the target compensation value;

[0084] S2, test arrangement: Place the EUT on the ground plane (test bench), ensuring that the DC bonding resistance does not exceed 250mΩ; place the receiving antenna / field strength sensor in the working area of ​​the reverberation chamber, keeping a distance of 0.75m or the wavelength corresponding to the lowest test frequency from the device under test and the support base. / 4;

[0085] S3, Reverberation Chamber Peak Field Intensity Calibration: Control the level output of the radiant power amplifier; monitor the maximum power of the stirrer within one rotation cycle through the receiving antenna or field intensity sensor; ensure that the power reaches the predetermined value and tends to be stable; record the data to form the field intensity calibration data of the reverberation chamber;

[0086] In a preferred embodiment, the peak field strength calibration of the reverberation chamber can be calculated by the following formula:

[0087] ;

[0088] in, is the maximum field strength in the reverberation room (V / m), The maximum power (W) recorded during one stirrer rotation cycle, is the wavelength corresponding to the test frequency f (m);

[0089] Application of the extrapolation formula: In subsequent tests, when it is necessary to reach the target field strength at this frequency f (V / m), the required target input power (dBm) is calculated as follows:

[0090] The calculation method of the reverberation outdoor test field strength can be carried out using the following formula:

[0091] ;

[0092] in, is the target input power (dBm); is the expected field strength in the reverberation chamber (V / m); is the field strength measured during calibration (V / m); is the input power measured during calibration (dBm);

[0093] S4, select the cable to be tested and set the test parameters: select a cable to be tested; set the test start frequency; determine the test signal modulation mode; set the field strength for the HIRF radiated sensitivity test; set the injection current for the conducted sensitivity test; determine the test frequency dwell time and other parameters;

[0094] Cable selection: Select the cables to be tested based on pre-analysis or risk priority (such as length, exposure level, functional importance). Test one cable at a time and record the cable identification (number / name / type).

[0095] Test frequency: set the starting frequency (such as 100MHz), end frequency (400MHz), step frequency (such as 1MHz, 2MHz or according to standards / requirements), and record the frequency list;

[0096] Modulation style:

[0097] CW (Continuous Wave): Most commonly used, basic test.

[0098] AM (Amplitude Modulation): For example, 80% depth, 1kHz sinusoidal modulation (for simulating airborne radar, etc.). You need to set the modulation depth and frequency.

[0099] PM / FM / Pulse: For basic HIRF, may be required by specific standards.

[0100] HIRF radiation field strength: set according to the standard or specific equipment requirements The target value (V / m) is usually a function of frequency.

[0101] Conduction injection current: Set the target current injected into the cable according to standards or specific equipment requirements (mA / dBμA);

[0102] Dwell Time: The duration of time the signal is applied at each test frequency. This must be long enough to allow the EUT's response (if any) to be observed, while also taking test efficiency into account. Typical values ​​range from a few seconds to tens of seconds. Record the set value.

[0103] EUT monitoring parameters: Identify the EUT response parameters that need to be monitored and recorded in real time (such as communication bit error rate, sensor output, control signal status, video / audio distortion, device restart / downtime, etc.) and their pass / fail criteria. Configure the appropriate monitoring equipment (data acquisition card, protocol analyzer, video surveillance, etc.).

[0104] S5, implement comprehensive sensitivity testing: start real-time delay compensation monitoring, including: monitoring factors such as ambient temperature, triggering delay when temperature changes exceed the preset threshold, adjusting compensation parameters in real time, inserting calibration pulses dynamically in the gaps between test signals, and updating delay compensation parameters;

[0105] Monitor the HIRF radiation field strength in the reverberation chamber through the receiving antenna / field strength sensor; monitor the conducted injection current through the current monitoring probe; observe and record the response data of the system under test; and complete the test at the current test frequency.

[0106] S6, frequency switching: enter the next test frequency; repeat S5 until all test frequencies are completed, complete the current cable test, select the next cable to be tested, and complete all cable tests;

[0107] Switching Cable:

[0108] Carefully remove the current injection probe and current monitoring probe from the non-metallic fixture;

[0109] Select the next cable to be tested;

[0110] Rearrange the probes (position, spacing, direction, fixtures) strictly in accordance with the requirements of S2 and S4, and record photos / diagrams of the new arrangement.

[0111] Repeat S4 (set parameters for the new cable, especially may vary) to S6 until all selected cables are tested.

[0112] S7, Test Summary: Complete the HIRF radiation and conduction comprehensive sensitivity test of the tested system, organize and analyze the test data, and form a complete test report.

[0113] A complete test report should include but not be limited to:

[0114] Test based on standards / specifications;

[0115] Test date, location, personnel, and environmental conditions;

[0116] EUT description (model, serial number, status);

[0117] List of test systems and equipment (model, serial number, calibration status);

[0118] Detailed description and photos / schematics of the test arrangement (EUT, grounding, probe locations);

[0119] Calibration data summary (probe, reverberation chamber field strength calibration);

[0120] Test parameter settings (frequency range / list, modulation, field strength / current target level, dwell time);

[0121] All test data (original data can be attached);

[0122] Key result charts (applied level curve, EUT response curve);

[0123] A clear list of sensitive points and fault descriptions;

[0124] Summary of delay compensation applications.

[0125] The above describes the embodiments of the present invention, but the present invention is not limited to the above specific implementation methods. The above specific implementation methods are merely illustrative and not restrictive. Ordinary technicians in this field can also make many forms under the guidance of the present invention, all of which are protected by the present invention.

Claims

1. HIRF comprehensive sensitivity test device for overlapping frequency bands of radiation and conduction, characterized by: The test system comprises a reverberation chamber and a test control system. The support base in the reverberation chamber is set on a ground plane, and the device under test is placed on the upper surface of the support base. The test control system performs two-way communication with the signal generation and processing system, the adaptive delay compensation system, the radiation test system, the conduction test system, the photoelectric conversion system and the measurement receiver. The signal generator in the signal generation and processing system outputs the radio frequency signal to the signal pre-processing unit through a coaxial cable, and the power amplifier amplifies the signal and outputs it; Adaptive delay compensation system is used to align the arrival time of radiated fields and conducted interference at the device under test; The transmitting antenna in the radiation test system is connected to the output end of the radiation power amplifier through a coaxial cable to generate an electromagnetic field; the receiving antenna / field strength sensor transmits the field strength data to the photoelectric conversion system through optical fiber; the current injection probe in the conduction test system is connected to the output end of the conduction power amplifier through a coaxial cable, and the current monitoring probe transmits the monitoring data to the photoelectric conversion system through optical fiber; the photoelectric conversion system receives the signals from the antenna and current monitoring probe, transmits the converted signals to the measurement receiver, and transmits the analysis results to the test control system through Ethernet.

2. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 1 is characterized in that: The distance between the device under test and the wall of the reverberation chamber is greater than or equal to one-quarter wavelength corresponding to the lowest operating frequency, the distance between the device under test and the grounding plate is greater than or equal to one-quarter wavelength, and the total volume of the device under test and the support base accounts for less than or equal to 8% of the total volume of the reverberation chamber.

3. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 2 is characterized in that: The signal pre-processing unit divides the signal into a radiation channel and a conduction channel through a power divider. Both the radiation channel and the conduction channel are equipped with independent attenuators and filters. Power amplifiers include radiation power amplifiers and conduction power amplifiers; The radiation channel is connected to the radiation power amplifier, and the conduction channel is connected to the conduction power amplifier.

4. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 3 is characterized in that: The adaptive delay compensation system includes a programmable delay device, a channel characteristic measurement unit, a frequency-related delay characteristic database, a feedback calibration unit and a high-precision clock synchronization unit. The programmable delay device is connected to the test control system through a high-speed digital bus. The channel characteristic measurement unit transmits the data output by the high-speed oscilloscope and two channels through optical fiber. The frequency-related delay characteristic database is deployed on the server of the test control system. The feedback calibration unit interacts with the test control system through Ethernet. The high-precision clock synchronization unit provides synchronous clock signals to each subsystem through a dedicated clock cable. The programmable delay device has two control modes: coarse adjustment and fine adjustment. Coarse adjustment adopts a digital delay line structure, and fine adjustment adopts a voltage-controlled analog variable delay unit.

5. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 4 is characterized in that: The current injection probe should be calibrated before testing, supported and fixed in the center of the reverberation chamber.

6. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 5, characterized in that: The high-speed oscilloscope receives data from the receiving antenna / field strength sensor of the radiation channel and the current monitoring probe of the conduction channel through optical fiber, and is used to collect and analyze the time domain waveforms of the two channels in real time.

7. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 6, characterized in that: The layout requirements of the current monitoring probe include: the current monitoring probe is 5 cm away from the EUT termination, the current monitoring probe is close to the connector bottom shell, and the distance between the current injection probe and the current monitoring probe is 5 cm.

8. The HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction according to claim 7 is characterized in that: The stirrer is set vertically at a corner of the reverberation chamber. The stirrer adopts a Z-shaped metal plate structure and is driven to rotate by a stepper motor.

9. A method for testing HIRF comprehensive sensitivity in the overlapping frequency band of radiation and conduction, wherein the method is performed by using the HIRF comprehensive sensitivity test device for the overlapping frequency band of radiation and conduction as described in any one of claims 1 to 8, characterized in that: The following steps are involved: S1, initialization and delay calibration: inject reference pulse signal, measure the delay difference of radiation / conduction channel, calculate the compensation value and store it in the database, and adjust the radiation channel delay according to the test frequency; S2, test arrangement: The device under test is placed on a ground plane, and the receiving antenna / field strength sensor is deployed in the working area of ​​the reverberation chamber, with a distance from the device / support ≥ 0.75m or λ / 4 of the wavelength corresponding to the lowest frequency; S3, reverberation chamber field strength calibration: control the radiation power amplifier level, monitor the maximum power during the stirrer rotation cycle through the receiving antenna, and record the calibration data; S4, parameter setting: select the cable to be tested, set the starting frequency, signal modulation mode, radiation field strength value, conduction injection current value, and frequency point dwell time; S5, comprehensive test operation: start real-time delay compensation, synchronously monitor radiation field strength and conduction current, and record device response; S6, frequency and cable switching: After traversing all test frequencies, switch to the next cable and repeat the test until all cables are completed; S7, test summary: terminate the test, analyze the data, and generate a complete test report.

10. The method for testing HIRF comprehensive sensitivity in the overlapping frequency band of radiation and conduction according to claim 9, characterized in that: Starting real-time delay compensation includes monitoring the ambient temperature factor, triggering the delay when the temperature changes beyond the preset threshold, adjusting the compensation parameters in real time, inserting calibration pulses dynamically in the gaps between test signals, and updating the delay compensation parameters.

Images