Material testing system utilizing data import workflow progression
By using a data import device in the material testing system to automatically import data and advance the workflow, the problems of manual entry errors and switching inconvenience are solved, and a more efficient and accurate material testing process is achieved.
Patent Information
- Application Number
- CN202380094836.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Priority Date
- 2023-11-20
- Filing Date
- 2023-11-27
- Publication Date
- 2025-09-19
AI Technical Summary
In existing material testing systems, manual entry of information is prone to data entry errors and operators need to switch back and forth between a data import device and a separate input device, resulting in inconvenient workflow and wasted time.
A data import device is used to automatically import data and advance the material testing workflow. The processing circuit system of the computing device controls the operation of the material testing machine, including the camera, label reader and measuring device, automatically fills in the input fields and advances the workflow status, reducing manual data entry errors and the number of switching times.
Improves data entry accuracy and workflow efficiency, reduces the number of times operators switch between different devices, and reduces the risk of data entry errors.
Smart Images

Figure CN120677371A_ABST
Abstract
Description
[0001] CROSS-REFERENCE TO RELATED APPLICATIONS This application claims priority to and the benefit of U.S. Provisional Patent Application No. 63 / 435,606, filed on December 28, 2022, entitled “Material Testing Systems with Data Importation Workflow Progression,” the entire contents of which are incorporated herein by reference. Technical Field
[0002] The present disclosure relates generally to materials testing systems and, more particularly, to materials testing systems utilizing data import workflow advancements. Background Art
[0003] Materials testing machines are used to test various material specimen properties (e.g., tensile / compressive strength). The specific method for performing the test (also known as a test method) can vary depending on the material specimen. A computing device communicating with the materials testing machine can guide the user through a workflow to set up, execute, and analyze the results of each test method.
[0004] By comparing such a system with the present disclosure as set forth in the remainder of this application with reference to the accompanying drawings, the limitations and disadvantages of conventional and traditional methods will become clear to those skilled in the art. Summary of the Invention
[0005] The present disclosure is directed to a materials testing system utilizing a data import workflow progression, substantially as illustrated in and / or as described with reference to at least one of the accompanying drawings and as more fully set forth in the claims.
[0006] These and other advantages, aspects and novel features of the present disclosure, as well as details of illustrated examples thereof, will be more fully understood from the following description and drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0007] Figure 1 An example materials testing system according to aspects of the present disclosure is shown.
[0008] Figure 2 According to various aspects of the present disclosure Figure 1 Block diagram of a materials testing system.
[0009] Figure 3 is a flow chart illustrating an example state progression of a materials testing workflow according to aspects of the present disclosure.
[0010] Figure 4is a flow chart illustrating example operations of a workflow progression process in accordance with aspects of the present disclosure.
[0011] Figures 5a to 5c Shows various aspects of the present disclosure. Figure 3 Examples of the different states of the graphical user interface associated with the materials testing workflow.
[0012] The drawings are not necessarily drawn to scale. Where appropriate, the same or similar reference numbers are used throughout the drawings to refer to similar or identical elements. For example, reference numbers using letters (e.g., clamp 124a, clamp 124b) refer to instances of the same reference number (e.g., clamp 124) without letters. DETAILED DESCRIPTION
[0013] Materials testing workflows sometimes require operators to enter several pieces of information to set up a test method for execution, analyze the test method's results, and / or report the test method's results. However, manually entering information related to a test method carries the risk of data entry errors and delays. While some systems automatically import information, operators must switch between a data import device (e.g., a tag reader) and a separate input device (e.g., a touchscreen) to select the correct input field, move information to the correct input field, and / or select options to advance the workflow, which can be inconvenient.
[0014] The disclosed example materials testing system uses a data importer to automatically import data and advance (or progress) the state of a materials testing workflow. Automatically importing data helps reduce data entry errors that can occur during manual data entry. Workflow progression reduces the need (and / or time required) for an operator to switch back and forth between the data importer and a separate input device to progress the workflow.
[0015] Some examples of the present disclosure relate to a material testing system, the material testing system comprising: a data import device, the data import device comprising a camera, a label reader, or a measuring device; a material testing machine, the material testing machine comprising: a test sensor, a test actuator, and a test controller, the test controller being configured to control the test actuator; a display screen; and a computing device, the computing device being configured to communicate with the display screen, the material testing machine, and the data import device, the computing device comprising: a processing circuit system, the processing circuit system being configured to: start a material testing workflow, the material testing workflow being configured to guide a user through setting up, executing, or analyzing a test method of the material testing machine, and displaying information related to the material testing workflow on the display screen. a first graphical user interface (GUI) associated with a first state, the first GUI including one or more input fields, in response to receiving final field input data from a data import device when a final input field of the one or more input fields has input focus: populating the final input field with the final field input data and advancing the input focus away from the one or more input fields, and in response to receiving subsequent input data from the data import device after the one or more input fields are populated on a display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from the first state to a second state and displaying a second GUI associated with the second state of the material testing workflow on the display screen.
[0016] In some examples, the processing circuitry of the computing device is further configured to control a controller of the materials testing machine to execute the test method using the final field input data. In some examples, the tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high-frequency tag reader. In some examples, the measuring device includes a digital caliper.
[0017] In some examples, the first GUI further includes instructions for using the data importer to obtain final field input data or subsequent input data. In some examples, the processing circuitry is further configured to verify that the final field input data complies with input criteria, and if the final field input data does not comply with the test criteria, prevent the final input field from being populated, the input focus from being advanced, or the test method from being executed. In some examples, verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier of a fixture that complies with the test configuration of the test method.
[0018] Some examples of the present disclosure relate to a method comprising: initiating, via processing circuitry of a computing device, a material testing workflow configured to guide a user through setting up, executing, or analyzing a test method for a material testing machine in communication with the computing device, the material testing machine comprising a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying, on a display screen in communication with the computing device, a first graphical user interface (GUI) associated with a first state of the material testing workflow, the first GUI comprising one or more input fields; and receiving, at the computing device, a final field in the one or more input fields from a data import device when the final field has input focus. input data, the data import device comprising a camera, a label reader, or a measuring device; in response to receiving final field input data at the computing device from the data import device when a final input field in the one or more input fields has input focus: filling the final input field with the final field input data and advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data at the computing device from the data import device after the one or more input fields are filled in on the display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from the first state to the second state and displaying a second GUI associated with the second state of the material testing workflow on the display screen.
[0019] In some examples, the method further includes controlling, by the processing circuitry of the computing device, a controller of the materials testing machine to execute the testing method using the final field input data. In some examples, the tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high-frequency tag reader. In some examples, the measuring device includes a digital caliper.
[0020] In some examples, the first GUI further includes instructions for using the data importer to obtain final field input data or subsequent input data. In some examples, the method further includes: verifying, by the processing circuitry, that the final field input data complies with input criteria; and preventing the final input field from being populated, the input focus from being advanced, or the test method from being executed if the final field input data does not comply with the test criteria. In some examples, verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier of a fixture that complies with the test configuration of the test method.
[0021] Some examples of the present disclosure relate to a non-transitory computer-readable medium including machine-readable instructions that, when executed by a processor, cause the processor to: initiate a material testing workflow configured to guide a user through setup, execution, or analysis of a test method for a material testing machine, the material testing machine including a test sensor, a test actuator, and a test controller configured to control the test actuator; display a first graphical user interface (GUI) associated with a first state of the material testing workflow on a display screen, the first GUI including one or more input fields; and, when a final field input field in the one or more input fields has input focus, import a data file from a data file. The device receives final field input data, the data import device including a camera, a label reader or a measuring device; in response to receiving the final field input data from the data import device when a final input field in the one or more input fields has input focus: filling the final input field with the final field input data and advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data from the data import device at the computing device after the one or more input fields are filled in on the display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from a first state to a second state, and displaying a second GUI associated with the second state of the material testing workflow on the display screen.
[0022] In some examples, the non-transitory computer-readable medium further includes machine-readable instructions that, when executed by a processor, cause the processor to: control a controller of the materials testing machine to perform a test method using the final field input data. In some examples, the tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high-frequency tag reader, and the measuring device includes a digital caliper. In some examples, the first GUI further includes instructions for using the data import device to obtain the final field input data or subsequent input data.
[0023] In some examples, the non-transitory computer-readable medium further includes machine-readable instructions that, when executed by a processor, cause the processor to: verify that final field input data complies with input criteria; and prevent the final input field from being populated, the input focus from being advanced, or the test method from being executed if the final field input data does not comply with the test criteria. In some examples, verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier of a fixture that complies with the test configuration of the test method.
[0024] Figure 1An example material testing system 100 is shown. As shown, the material testing system 100 includes a material testing machine 102 (also referred to as a universal testing machine), a computing system 104 connected to the material testing machine 102 via a cable 106, and one or more data import devices 108 connected to the computing system 104 via a wire 110. Although shown as physically connected, in some examples, the connections between the computing system 104, the material testing machine 102, and / or the data import devices 108 may be wireless rather than wired.
[0025] exist Figure 1 In the example shown, the material testing machine 102 includes a frame 112. In some examples, the frame 112 provides rigid structural support for the other components of the material testing machine 102. As shown, the frame 112 includes a top plate 114 and a bottom base 116 connected by two columns 118. In some examples, the columns 118 of the frame 112 can accommodate the guide rails and / or drive shaft 212 of the material testing machine 102 (see, for example, FIG. Figure 2 ).
[0026] exist Figure 1 In the example of FIG, the movable linkage 120 extends between the columns 118. In some examples, the movable linkage 120 can be connected to a guide rail and / or drive shaft 212 housed in the columns 118, and / or the movable linkage can be configured to move toward and / or away from the base 116 by (e.g., motorized) actuation of the drive shaft(s) 212. Figure 1 One movable linkage 120 is shown in the example of FIG. 1 , but in some examples, the materials testing machine 102 may have multiple movable linkages 120 and / or other movable components.
[0027] exist Figure 1 In the example of FIG, the fixture 122 is attached to the bottom base 116 of the frame 112 and the movable link 120. As shown, the lower fixture 122a includes a clamp 124a, while the upper fixture 122b includes both a test sensor 126 and a clamp 124b. Figure 1 One test sensor 126 and two fixtures 124 are shown in the example of FIG. 1 , but in some examples, the testing machine 102 may include more or fewer test sensors 126 and / or fixtures 124 .
[0028] exist Figure 1In the example shown, clamp 124 holds a test specimen 128. Although shown as a (e.g., steel) rope, in some examples, test specimen 128 may be some other type of material and / or component. Although shown as rope holders, in some examples, clamp 124a and / or clamp 124b may alternatively or additionally be configured as a bolt holder, a wedge clamp, a side-acting grip, a manual clamp, a roller clamp, a capstan clamp, and / or a syringe holder. In some examples, one or both of the clamps in clamp 124 may be replaced by a pressure plate configured to compress test specimen 128.
[0029] exist Figure 1 In some examples, test sensor 126 is coupled to fixture 124 such that test sensor 126 can measure a force acting on fixture 124 (and / or specimen 128, linkage 120, etc.). In some examples, test sensor 126 can be a load cell. In some examples, test sensor 126 can be some other type of sensor.
[0030] In some examples, the material testing machine 102 can be configured for static mechanical testing. For example, the material testing machine 102 can be configured for compression strength testing, tensile strength testing, shear strength testing, bending strength testing, flexural strength testing, tear strength testing, peel strength testing (e.g., adhesive strength), torsional strength testing, and / or any other compression and / or tension testing. Additionally or alternatively, the material testing machine 102 can be configured to perform dynamic testing.
[0031] In some examples, materials testing machine 102 is configured to interface with computing system 104 to perform a test method. In some examples, computing system 104 can use data imported from data import device(s) 108 to perform the test method and / or analyze the results of the test method. Figure 1 Several examples of data import devices 108 that may be used to import data for executing a test method are shown.
[0032] exist Figure 1 In the example of FIG1 , each data importing device 108 is a device configured to send (and / or import) data to the computing system 104. For example, the data importing device 108 may be a digital caliper 130 (e.g., configured to measure dimensions of the specimen 128, a component of the materials testing machine 102, etc.). As another example, the data importing device 108 may be a camera 132 (e.g., configured to capture an image of the specimen 128, a component of the materials testing machine 102, etc.). In some examples, the data importing device 108 may be a tag reader 134 configured to read data from a tag 136.
[0033] In some examples, the label 136 can be attached to the specimen 128, the packaging of the specimen 128, the coupling 120, the fixture 122 (see, e.g., Figure 2 ) and / or some other component of the materials testing machine 102. In some examples, the tag 136 may store information related to the item to which the tag 136 is attached. In some examples, the tag 136 may be detachable and / or store information other than information related to the item to which the tag 136 is attached.
[0034] In some examples, tag 136 may be a one-dimensional barcode tag 136a, a two-dimensional barcode 136b (e.g., a Quick Response code), a Bluetooth tag 136c (e.g., a tag 136 configured to use short-range ultra-high frequency radio frequencies between 2.402 GHz and 2.480 GHz in the 2.4 GHz Industrial, Scientific, and Medical (ISM) band), a near-field communication (NFC) tag 136d, a radio frequency identification (RFID) tag 136e, and / or some other type of tag 136. In some examples, camera 132 may be configured to read and / or scan one-dimensional barcode tag 136a and / or two-dimensional barcode tag 136b. In some examples, camera 132 may be incorporated into tag reader 134.
[0035] In some examples, the data import device 108 may respond to a user activating a trigger, button, or other captured input 209 of the data import device 108 (see, e.g., Figure 2 ) to capture the data. In some examples, the data may also be sent (and / or imported) to computing system 104 in response to a user activating a capture input 209 of data importer 108 (e.g., after capture). In examples where the captured data is encoded (e.g., in tag 136), data importer 108 may decode the encoded data before sending it to computing system 104, or computing system 104 may decode the encoded data after receiving it.
[0036] Figure 2 is a block diagram of a material testing system 100. Similar to Figure 1 , Figure 2 The example of FIG. 1 shows a computing system 104 connected to a materials testing machine 102 via a cable 106 , and a data import device 108 connected to the computing system 104 via a line 108 . Figure 2 Additional details of materials testing machine 102 and computing system 104 are also shown.
[0037] exist Figure 2In the example of FIG. 1 , computing system 104 includes a computing device 202 and a user interface (UI) 204 interconnected with each other. As shown, UI 204 may include one or more input devices 206 configured to receive input from a user and one or more output devices 208 configured to provide output to the user. In some examples, the one or more input devices 206 may include one or more touch screens, a mouse, a keyboard, buttons, switches, sliders, knobs, microphones, dials, and / or other input devices 206. In some examples, the one or more output devices 208 may include one or more display screens / touch screens, speakers, lights, haptic devices, and / or other output devices 208. In some examples, the output device(s) 208 (e.g., a display screen) of UI 204 may output one or more representations of a material testing workflow 300 configured to guide a user through the setup, execution, and / or analysis of a test method performed by materials testing machine 102.
[0038] The example materials testing machine 102 includes one or more actuators 210 coupled to one or more drive shafts 212. In some examples, the actuators 210 can be used to provide force to and / or induce movement of the drive shafts 212. In some examples, the actuators 210 can include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, relays, and / or switches.
[0039] The drive shaft 212 is further shown connected to the movable linkage 120 such that moving the drive shaft(s) 212 via the actuator(s) 210 will result in movement of the movable linkage 120. Figure 2 In the examples shown, the drive shaft 212 is referred to as the drive shaft 212 , but in some examples, the drive shaft 212 may be some other mechanical device that causes movement of the movable linkage 120 via the actuator(s) 210 .
[0040] The example materials testing machine 102 further includes a controller 214 in electrical communication with the actuator(s) 210. In some examples, the controller 214 may include processing circuitry and / or memory circuitry. In some examples, the controller 214 may be configured to control the materials testing machine 102 based on one or more commands, control inputs, and / or test parameters. In some examples, the controller 214 may be configured to convert the commands, control inputs, and / or test parameters (e.g., received from the computing system 104) into appropriate (e.g., electrical) signals that may be transmitted to the actuator(s) 210, thereby controlling the operation of the materials testing machine 102 (e.g., via the actuator(s) 210). For example, the controller 214 may provide one or more signals that command the supply of more or less power to the actuator(s) 210, thereby increasing or decreasing the applied force.
[0041] exist Figure 2 In some examples, the controller 214 is further in electrical communication with the fixture 122 (e.g., the clamp 124 and the test sensor(s) 126). In some examples, the controller 214 can be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 104) into appropriate (e.g., electrical) signals that can be transmitted to the clamp 124, thereby controlling the operation (e.g., clamping or releasing) of the clamp 124. In some examples, the controller 214 can be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 104) into appropriate (e.g., electrical) signals that can be transmitted to the sensor(s) 126, thereby controlling the operation (e.g., clamping or releasing) of the clamp 124. In some examples, the controller 214 can be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 104) into appropriate (e.g., electrical) signals that can be transmitted to the sensor(s) 126, thereby controlling the operation (e.g., clamping or releasing) of the sensor(s) 126. In some examples, the controller 214 can be configured to convert measurement data received from the sensor(s) 126 and / or transmit the measurement data to the computing system 104.
[0042] The example controller 214 is further in electrical communication with a control panel 216 of the materials testing machine 102. In some examples, the control panel 216 can include one or more input devices (e.g., buttons, switches, sliders, knobs, microphones, dials, and / or other electromechanical input devices). In some examples, an operator can use the control panel 216 to directly control the materials testing machine 102. In some examples, the controller 214 can be configured to convert commands, control inputs, and / or test parameters received via the control panel 216 into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210 and / or the grip(s) 124 to control the materials testing machine 102.
[0043] The controller 214 is also shown in electrical communication with a network interface 218b of the materials testing machine 102. In some examples, the network interface 218b includes hardware, firmware, and / or software for connecting the materials testing machine 102 (e.g., wirelessly and / or via the cable 106) to the computing device 104. In some examples, the controller 214 can receive information (e.g., commands) from the computing device 202 via the network interface 218b and / or send information (e.g., measurement data from the sensor(s) 126) to the computing device 202 via the network interface 218b.
[0044] The example computing device 202 includes a network interface 218a. As shown, one network interface 218a communicates with a network interface 218b of the material testing machine 102 via a cable 106. As shown, the computing device 102 further includes a network interface 218a that communicates with a network 220 (e.g., the Internet). In some examples, the computing device 202 can communicate with other computing systems 104 and / or the material testing machine 102 via the network interface(s) 218a. As shown, the network interface 218b is electrically connected to a common electrical bus 220 of the computing device 202.
[0045] The computing device 202 also includes one or more input / output (I / O) interfaces 222 connected to the common electrical bus 220. In some examples, the one or more I / O interfaces 222 may include one or more Universal Serial Bus (USB) ports, Thunderbolt ports, FireWire (IEEE 1394) ports, and / or any other type of serial and / or parallel data port. In some examples, the one or more I / O interfaces 222 may be configured for wireless (rather than wired) connections. As shown, the I / O interface(s) 222 are connected to the data import device(s) 108 via the line 110.
[0046] Computing device 202 further includes processing circuitry 224 connected to common electrical bus 220. In some examples, processing circuitry 224 may include one or more processors. In some examples, processing circuitry 224 is configured to process information received from UI 204, data import device(s) 108, and / or material testing machine 102. In some examples, processing circuitry 224 is configured to transmit commands and / or test parameters to material testing machine 102 (e.g., via network interface(s) 218a). In some examples, processing circuitry 224 is configured to output information to an operator via UI 204. In some examples, computing device 202 is configured to execute machine-readable instructions stored in memory circuitry 226.
[0047] The example computing device 202 further includes a memory circuit system 226 connected to the common electrical bus 220. As shown, the memory circuit system 226 includes a material testing workflow 300 and a workflow progress process 400. Figure 2 2 is shown as part of memory circuitry 226 in the example, but in some examples, material testing workflow 300 and / or workflow progression process 400 may be implemented using discrete circuitry (eg, of processing circuitry 224 ).
[0048] In some examples, material testing workflow 300 and / or workflow progression process 400 are implemented using non-transitory machine-readable instructions stored in memory circuitry 226. In some examples, processing circuitry 224 is configured to execute the machine-readable instructions of material testing workflow 300 to guide a user through the setup, execution, and analysis of a test method for material testing machine 102. In some examples, computing device 202 is configured to interface with controller 214 of material testing machine 102 to execute the test method during material testing workflow 300.
[0049] In some examples, the UI 204 is configured to display (and / or otherwise output) a graphical user interface (GUI) 500 (see, e.g., Figures 5a to 5c ) one or more display states of the material testing workflow 300. In some examples, the data import device(s) 108 can collect (and / or import) data during (and / or when used by) the material testing workflow 300, thereby reducing the possibility of data entry errors. In some examples, the processing circuit system 224 is configured to execute the machine-readable instructions of the workflow progression process 400 to progress between the states of the material testing workflow 300 (and / or the associated display states of the associated GUI 500) based on input from the data import device(s) 108, thereby reducing the need (and / or the time required) for the operator to switch back and forth between the data import device 108 and the separate input device 206 of the UI 204.
[0050] Figure 3 is a flow chart illustrating example workflow states of the material testing workflow 300. Although a particular order of workflow states is shown, in some examples, the material testing workflow 300 may be customizable such that additional and / or fewer workflow states may be implemented in operation. Additionally, many alternative progressions through the workflow 300 may be possible.
[0051] In some examples, the material testing workflow 300 progresses through various workflow states to guide a user through the setup, execution, and analysis of a test method for the material testing machine 102. In some examples, a particular workflow state can be associated with an output of the UI 204 (e.g., a display state of the GUI 500 showing one or more input fields 506, visual guides 514, sensor measurements, test results, etc.). Although the material testing workflow 300 is sometimes described below as performing certain actions for ease of understanding, it should be understood that one or more of the aforementioned components of the material testing system 100 (e.g., the processing circuitry 224, the UI 204, etc.) can perform actions on behalf of (and / or in accordance with instructions from) the material testing workflow 300.
[0052] exist Figure 3 In the example of FIG5 , the first workflow state is a sample setup state 302 (and / or a plurality of sample setup states 302). FIG5A through FIG5C are examples of display states of the GUI 500 that may be presented via the UI 204 during the sample setup state 302. During the example sample setup state(s) 302, the material testing workflow 300 prompts the operator to provide information regarding a set of specimens 128 for the sample and information regarding a set of test methods to be used to test the specimens 128 for the sample.
[0053] The information prompted to be provided (and / or collected) during the sample(s) setup state 302 may be information applicable to all specimens 128 and test methods, such as the date the test(s) will be run, the date the specimens 128 were manufactured / shipped / packaged, identification information of the operator (e.g., number, name, etc.), identification information of the fixture(s) (e.g., number(s), name(s), etc.), and / or other information relevant to all tests for all specimens 128. In some examples, the information prompted to be provided (and / or collected) during the sample(s) setup state 302 may be imported, for example, by reading (and / or capturing images of) the labels 136 of the packaging specimens attached to the specimens 128, the materials testing machine 102, and / or components of the materials testing machine 102 (e.g., the fixtures 122, the couplers 120, etc.). As another example, the computing device 202 may load information from the memory circuitry 226 or download information over the network 220 based on images captured by the data import device(s) 108 (e.g., images of packaging samples of the coupon 128 , the materials testing machine 102 , and / or components of the materials testing machine 102 ).
[0054] exist Figure 3In the example of FIG, the sample setup state 302 is followed by one or more test specimen and / or test method setup states 304. FIG5A-5C illustrate examples of display states of the GUI 500 that may be presented via the UI 204 during the test specimen(s) and / or test method setup state 304.
[0055] During the test specimen(s) and / or test method setup state 304 , the materials testing workflow 300 prompts the operator to provide (and / or collect) information regarding a particular specimen 128 of the sample and / or information regarding a particular test method to be used to test the particular specimen 128 . For example, the information prompted for (and / or collected) during the test specimen(s) and / or test method setup state 304 may include the date the test is to be run, the date the specimen 128 is manufactured / shipped / packaged, identification information for the specimen 128 (e.g., number, name, description, etc.), identification information for the test (e.g., number, name, description, etc.), pre-test characteristics of the specimen 128 (e.g., measurement value, material type, weight, color, shape, etc.), target parameters for the test (e.g., start / end positions of the clamp(s) 124 / linker 120, distance moved by the linker 120, speed of movement of the linker 120, expected result(s) of the test (e.g., fracture location / type, distance moved before fracture, force applied before fracture, post-test characteristics of the specimen, etc.), time(s) at which the sensor(s) 126 should take measurement(s), etc.), and / or other information relevant to a particular test method and / or a particular specimen.
[0056] In some examples, information prompted for (and / or collected) during the test specimen(s) and / or test method setup state 304 can be imported. For example, the data import device(s) 108 can import information read from tags 136 attached to the specimen 128 (and / or associated packaging), the materials testing machine 102, and / or components of the materials testing machine 102 (e.g., the fixture 122, the coupler 120, etc.). As another example, the data import device(s) 108 can import information about the specimen 128 measured by the digital caliper 130. As another example, the computing device 202 can load information related to the specimen 128 from the memory circuitry 226 or download it via the network 220 based on an image captured by the data import device(s) 108.
[0057] exist Figure 3In the example shown in FIG1 , the test specimen and / or test method setup state 304 is followed by a test method execution state 306 (and / or multiple test method execution states 306). During the test method execution state(s) 306, the computing device 202 communicates with the material testing machine 102 (e.g., via the network interface 218) to execute a test method on the test specimen 128 using the material testing machine 102 based on information received during the test specimen and / or test method setup state 304 and / or the sample setup state 302. For example, the processing circuitry 224 of the computing device 202 may determine one or more parameters and / or commands and / or send the one or more parameters and / or commands to the material testing machine 102, and the controller 214 of the material testing machine 102 may control the actuator(s) 210 of the material testing machine 102 to execute the test method based on the command(s) and / or parameter(s).
[0058] exist Figure 3 In the example shown in FIG, the test method execution state 306 is followed by one or more post-test analysis setup states 308. During the post-test analysis setup state(s) 308, the material testing workflow 300 prompts the operator to provide (and / or collect) information related to the analysis of the test method performed during the test method execution state 306.
[0059] For example, the information prompted for (and / or collected) during the post-test specimen analysis setup state 308 may include post-test characteristics of the specimen 128, actual parameters of the test, actual results of the test, and / or other information related to the test method and / or analysis of the test sample. Figure 3 304 , but in some examples, the post-test specimen analysis setup state 308 may be integrated into the test specimen(s) and / or test method setup state 304 .
[0060] exist Figure 3 In the example of FIG. 3 , one or more post-test specimen analysis setup states 308 are followed by one or more post-test specimen analysis calculation states 310 of the material testing workflow 300 . During the post-test specimen analysis calculation state(s) 310 , the processing circuitry 224 of the computing device 202 may perform one or more calculations based on information collected during the previous post-test specimen analysis setup state(s) 308 . For example, the processing circuitry 224 may estimate the strength, reliability, quality, grade, elasticity, and / or other characteristics of the specimen 128 . As another example, the processing circuitry 224 may infer the structure and / or composition of the specimen 128 . As another example, the processing circuitry may predict the future performance of the specimen 128 .
[0061] exist Figure 3In the example shown, the material testing workflow 300 repeats states 304 through 310 for all test methods and / or test specimens for the test sample (set at state 302). As shown, after state 310, the material testing workflow 300 iterates to the next test method and / or test specimen at state 314 (assuming another test method or test specimen exists) and then returns to state 304. Once states 304 through 310 have been completed for all test methods and / or test specimens for the test sample, the material testing workflow 300 enters one or more reporting states 316, in which the material testing workflow 300 can provide a report on the results of the test sample according to operator specifications.
[0062] Figure 4 is a flow chart depicting example operations of a workflow progression process 400 of computing device 202. In some examples, workflow progression process 400 may allow an operator to automatically import information using data import device(s) 108 (reducing data entry errors). Workflow progression process 400 may also enable an operator to progress from one state of material testing workflow 300 to another using the same data import device(s) 108, thereby reducing the inconvenience (and / or time required) of switching back and forth between data import device(s) 108 and UI 204 of computing system 104. Although workflow progression process 400 is sometimes described below as performing certain actions for ease of understanding, it should be understood that one or more of the aforementioned components of materials testing system 100 (e.g., processing circuitry 224, UI 204, etc.) may perform actions on behalf of (and / or pursuant to instructions from) workflow progression process 400.
[0063] exist Figure 4 In the example of FIG. 4 , the workflow progression process 400 begins at block 402 where a material testing workflow 300 is loaded from the memory circuitry 226 of the computing device 202 (e.g., via the processing circuitry 224). In some examples, an operator can use the UI 204 of the computing system 104 to select an appropriate material testing workflow 300 to load. In some examples, the material testing workflow 300 can be loaded from an external device and / or over the network 220.
[0064] exist Figure 4 In the example of FIG. 4 , after block 402 , the workflow progression process 400 proceeds to block 403 , where the workflow progression process 400 progresses the material testing workflow 300 to its first state (eg, Figure 35A through 5C ). Thereafter, at block 404, the workflow progression process 400 (e.g., via the UI 204) outputs one or more prompts 504 and / or input fields 506 associated with the first state of the materials testing workflow 300. For example, the one or more prompts 504 and / or input fields 506 may be output as part of a display screen and / or a GUI (e.g., one of the GUIs 500 shown in FIG. 5A through FIG. 5C ).
[0065] In some examples, the one or more prompts 504 output at block 404 prompt the user to enter certain information related to the current state of the material testing workflow 300 in the input field(s) 506. In some examples, the workflow progression process 400 additionally focuses on a particular input field 506 of the one or more input fields 506. In some examples, the input field 506 with input focus will be the input field 506 that is populated with data in response to the operator entering data through the UI 204 and / or importing data through the data import device 108. In some examples, guidance 514 can be additionally output that instructs the operator how to use the data import device 108 to enter data (see, e.g., Figure 5c ).
[0066] Figure 5a is an example of a GUI 500 that may be displayed (e.g., via the display screen of UI 204) during the sample setup state 302 of the materials testing workflow 300 (e.g., at block 404). As shown, GUI 500 includes a state identifier 502 that identifies the state of the materials testing workflow 300 to which GUI 500 corresponds. GUI 500 also includes an input prompt 504a that prompts a user to enter information about a test sample into an input field 506a. While input field 506a is shown as being filled with dots as a placeholder until input is received, in some examples, input field 506a may alternatively be blank and / or unpopulated until input is received. As shown, input field 506a is surrounded by a focus highlight 508 to emphasize that input field 506a has input focus.
[0067] exist Figure 4 In the example of FIG, after block 404, the workflow progression process 400 proceeds to block 406, where the workflow progression process 400 checks whether input data has been received from the data import device(s) 108. As previously discussed, the data import device(s) 108 can send (or import) data to the computing device 202 in response to activation of the capture input 209 of the data import device(s) 108. As shown, if no data has been received from the data import device 108, the workflow progression process 400 returns to block 404.
[0068] exist Figure 4 In the example of FIG5 , after block 406, if data is received from the data import device 108, the workflow progression process 400 proceeds to block 408. At block 408, the workflow progression process 400 determines whether the received data meets one or more input criteria associated with the input field 506. In some examples, during setup and / or customization of the material testing workflow 300, one or more input criteria can be associated with the input field 506. In some examples, the one or more criteria can define certain conditions that the input data must meet in order for the input data to be acceptable for populating the input field 506.
[0069] For example, the input field criteria may require that any received data intended for input field 506 be in a specific format (e.g., as a date, a number, an alphanumeric string, a single character, a Boolean value, etc.). As another example, the input field criteria may require that any received data intended for input field 506 be associated with a specific type of fixture 122, sample, or specimen 128. For example, memory circuitry 226 may store (and / or computing device 202 may access via network 220) a data structure that associates certain identifying information with certain types (e.g., classification, category, manufacturer, model, brand, etc.) of fixtures 122, specimens, and / or specimens 128, and workflow progression process 400 may determine whether the fixture 122, specimen, and / or specimen 128 associated with the received data is of a type that meets the input field criteria. As part of the determination at block 408, workflow progression process 400 may convert and / or decode the data received from data import device(s) 108, if necessary.
[0070] exist Figure 4 In the example shown in FIG4 , after block 408, if the received data does not meet one or more input criteria associated with input field 506, workflow progression process 400 proceeds to block 410. At block 410, one or more error notifications (e.g., similar to success notification 512 discussed below) are output (e.g., via UI 204). In some examples, the error notification(s) may inform the operator that the received input does not meet one or more input criteria and / or provide an explanation as to why the input is deficient and / or how the deficiencies can be remedied. As shown, after block 410, workflow progression process 400 returns to block 404.
[0071] exist Figure 4In the example shown in FIG. 4 , after block 408 , if the received data does meet one or more input criteria associated with the input field 506 , the workflow progression process 400 proceeds to block 412 . At block 410 , the input field 506 is populated with the received data. The workflow progression process 400 then determines (at block 414 ) whether there is another input field 506 associated with the current state of the material testing workflow 300 (e.g., one that has not yet been populated). If so, the workflow progression process 400 moves the input focus (and / or focus highlight 508 ) to the next input field at block 416 and then returns to block 404 .
[0072] exist Figure 4 In the example shown in FIG4 , after block 414 , when all input fields are populated, the workflow progression process 400 proceeds to block 418 . At block 418 , the workflow progression process 400 determines whether the input field data for the input field(s) 506 (e.g., all) meets one or more state criteria associated with the current state of the material testing workflow 300 . As with the input criteria of block 408 , in some examples, the state criteria can be associated with the current state of the material testing workflow 300 during setup and / or customization of the material testing workflow 300 . In some examples, the state criteria can define certain conditions that the input data must meet in order for the input data to be acceptable for collection during the current state of the material testing workflow 300 .
[0073] For example, the state criteria may require that the fixture 122 (e.g., identified during the current state) be suitable for use with the identified materials testing machine 102 and / or specimen 128 (e.g., also identified during the current state). As another example, the state criteria may require that the specimen 128 tested using the identified fixture 122 and / or materials testing machine 102 be within certain size and / or weight limits and / or be of an appropriate type. In some examples, a data structure may be used to make this determination (e.g., similar to that discussed above with respect to block 408). As shown, if it is determined that the data does not meet one or more state criteria associated with the current state of the materials testing workflow 300, the workflow progression process 400 proceeds to block 410 after block 418.
[0074] exist Figure 4In the example of FIG5 , after block 418, if it is determined that the data does meet one or more status criteria associated with the current state of the material testing workflow 300, the workflow progression process 400 proceeds to block 420. At block 420, the input focus (and / or focus highlight 508) is moved away from the input field(s) 506 associated with the current state of the material testing workflow 300. In some examples, the input focus (and / or focus highlight 508) is moved to a selectable button, icon, or other element (e.g., of the GUI 500). For example, the input focus (and / or focus highlight 508) can be moved to the arrow element 510 (see, e.g., FIG5 ). Figures 5a to 5c In some examples, the input focus (and / or focus highlight 508) may be removed entirely, such that (e.g., in the GUI 500) no field, element, or other item has input focus (and / or focus highlight 508). In some examples, a success notification 512 may additionally be output to notify the operator that the status criteria check at block 418 was successful (see, e.g., Figure 5b ).
[0075] exist Figure 4 In the example of FIG, after block 420, the workflow progression process 400 proceeds to block 422, where the workflow progression process 400 again checks whether input data has been received from the data import device(s) 108 (e.g., similar to block 406). In some examples, guidance 514 can be output at blocks 420 to 422 (and / or blocks 406 to 408) that instructs the operator on how to use the data import device 108.
[0076] exist Figure 4 In the example shown in FIG. 4 , after block 422, when input data is received from the data import device(s) 108, the workflow progression process 400 proceeds to block 424. In some examples, the actual data received from the data import device(s) 108 at block 422 may be irrelevant and / or discarded. The workflow progression process 400 proceeds to block 424 as soon as some data is received (e.g., indicating activation of the capture input 209). In some examples, data collected during the current state of the material testing workflow 300 (e.g., at block 412) may be saved to the memory circuitry 226 after (or before) proceeding to block 424.
[0077] exist Figure 4In the example shown in FIG. 4 , the workflow progression process 400 checks at block 424 whether there are additional (not yet executed) states in the material testing workflow 300. If not, the workflow progression process 400 ends. If so, the workflow progression process 400 checks (at block 426) whether the next state is an execution state or a calculation state (e.g., the test method execution state 306 or the post-test specimen analysis calculation state 310).
[0078] If the next state is an execute or calculate state, the workflow progression process 400 proceeds to block 428, where the material testing workflow 300 progresses to (and / or executes / calculates) the execute or calculate state. In some examples, data collected during the previous state of the material testing workflow 300 can be used to execute and / or calculate the execute / calculate state(s). If the next state is not an execute or calculate state, the workflow progression process 400 proceeds to block 403 after block 426 (and further to block 403 after block 426), where the workflow progression process 400 iterates to the next state in the material testing workflow 300 and then begins again at block 404.
[0079] Figures 5a to 5c An example of a GUI 500 (e.g., output by the UI 204) is shown that changes displayed content (e.g., its display state) as the associated material testing workflow 300 progresses from one state to the next (e.g., in response to input from the data importer 108). Figure 5a , the GUI 500 includes a state identifier 502 that identifies the state of the material testing workflow 300 (to which the displayed state of the GUI 500 corresponds) as the sample setup state 302. As shown, the GUI 500 includes a prompt 504 (e.g., a prompt that may be shown during block 404 of the workflow progression process 400) directing an operator to enter a sample ID into a sample ID input field 506a. The sample ID input field 506a is also surrounded by a focus highlight 508 that indicates that the sample ID input field 506a has input focus.
[0080] Figure 5b The GUI 500 is shown after data has been entered into the sample ID input field 506a (eg, via import from the data import device(s) 108 at block 412). As shown, Figure 5a The status identifier 502 in Figure 5b, indicating that the display state of the GUI 500 (and / or the state of the material testing workflow 300) has not changed. A success notification 512 is also shown, indicating that the data imported into the sample ID input field 506a has successfully passed the input field standard and / or status standard check (e.g., at blocks 408 and / or 418). However, the focus highlight 508 is no longer shown, indicating that the input focus has moved away from the input field(s) 506 (e.g., at block 420).
[0081] Figure 5c The GUI 500 is shown after additional input has been received (e.g., via import from the data import device(s) 108 at block 422), thereby advancing the material testing workflow 300 (and / or the GUI 500) to a new state. As shown, Figure 5c The GUI 500 in the Figure 5b The GUI 500 shown in FIG5 is significantly different, consistent with the different display state. In addition, different input fields 506 are shown in the GUI 500. As shown, the focus highlight 508 now surrounds the upper fixture input field 506b. Figure 5c The status identifier 502 in the GUI 500 also identifies the Figure 5a to Figure 5b , thereby indicating that the material testing workflow 300 (and / or GUI 500 ) (eg, in response to importing data from the data import device(s) 108 at block 422 ) has progressed to a new state.
[0082] The disclosed material testing system 100 allows an operator to automatically import data into the input fields 506 of the GUI 500 associated with the material testing workflow 300 using the data import device 108. This automatic import helps avoid potential errors during manual entry. Additionally, the material testing system 100 allows an operator to advance the material testing workflow 300 (and / or the GUI 500) from one state to another, thereby reducing the need (and / or the time required) for the operator to switch back and forth between the data import device(s) 108 and a separate input device of the UI 204.
[0083] The present method and / or system can be implemented using hardware, software, or a combination of hardware and software. The present method and / or system can be implemented in a centralized manner in at least one computing system, or in a distributed manner with different elements spread across several interconnected computing systems or cloud systems. Any type of computing system or other device adapted to perform the methods described herein is suitable. A typical combination of hardware and software can be a general-purpose computing system with a program or other code that controls the computing system when loaded and executed so that the computing system performs the methods described herein. Another typical embodiment can include a dedicated integrated circuit or chip. Some embodiments may include a non-transient machine-readable (e.g., computer-readable) medium (e.g., a flash drive, an optical disc, a magnetic storage disk, etc.) having one or more lines of code executable by a machine stored thereon, thereby causing the machine to perform the process as described herein.
[0084] Although the present method and / or system has been described with reference to certain embodiments, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted without departing from the scope of the present method and / or system. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the present disclosure without departing from the scope of the present disclosure. Therefore, the present method and / or system is not intended to be limited to the particular embodiments disclosed, but rather, the present method and / or system is intended to include all embodiments falling within the scope of the appended claims.
[0085] As used herein, "and / or" refers to any one or more of the items connected by "and / or" in a list. As an example, "x and / or y" refers to any element in the three-element set {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y." As another example, "x, y, and / or z" refers to any element in the seven-element set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y, and / or z" means "one or more of x, y, and z."
[0086] As used herein, the terms "eg," and "for example," introduce a list of one or more non-limiting examples, instances, or illustrations.
[0087] As used herein, the terms "coupled," "coupled to," and "coupled with" refer to structural and / or electrical connections, respectively, whether attached, attached, connected, linked, fastened, associated, and / or otherwise secured. As used herein, the term "attach" refers to attaching, linking, connecting, fastening, associated, and / or otherwise securing. As used herein, the term "connect" refers to attaching, attaching, linking, linking, fastening, associated, and / or otherwise securing.
[0088] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that may configure, be executed by, and / or otherwise be associated with the hardware. As used herein, for example, a particular processor and memory may constitute a first "circuit" when executing a first line or more lines of code, and may constitute a second "circuit" when executing a second line or more lines of code. As used herein, a circuitry is "operable" and / or "configured" to perform a function when it includes the necessary hardware and / or code (if necessary) to perform that function, regardless of whether performance of that function is disabled or enabled (e.g., by user-configurable settings, factory adjustments, etc.).
[0089] As used herein, control circuitry may include digital circuitry and / or analog circuitry, discrete circuitry and / or integrated circuitry, microprocessors, DSPs, etc., located on one or more circuit boards forming part or all of a controller and / or software, hardware, and / or firmware for controlling a welding process and / or devices such as a power supply or wire feeder.
[0090] As used herein, the term "processor" refers to a processing device, apparatus, program, circuit, component, system, and subsystem, whether implemented in hardware, software in tangible form, or both, and whether or not programmable. As used herein, the term "processor" includes, but is not limited to, one or more computing devices, hard-wired circuits, signal modification devices and systems, devices and machines for controlling systems, central processing units, programmable devices and systems, field programmable gate arrays, application-specific integrated circuits, systems on chips, systems comprising discrete components and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the foregoing components. The processor may, for example, be any type of general-purpose microprocessor or microcontroller, a digital signal processing (DSP) processor, an application-specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, and the like. The processor may be connected to and / or integrated with a memory device.
[0091] As used herein, the terms "memory" and / or "memory device" refer to computer hardware or circuitry for storing information for use by a processor and / or other digital device. The memory and / or memory device can be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random-access memory (RAM), cache memory, compact disc read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable media, and the like. The memory may include, for example, non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM), first-in-first-out (FIFO) memory, last-in-first-out (LIFO) memory, stack memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash memory card, compact flash memory card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash memory device, subscriber identity module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. The memory may be configured to store code, instructions, applications, software, firmware and / or data and may be external to the processor, internal to the processor, or both.
Claims
1. A material testing system comprising: a data import device, wherein the data import device includes a camera, a tag reader, or a measuring device; A material testing machine, comprising: a test sensor, a test actuator, and a test controller configured to control the test actuator; Display screen; and A computing device configured to communicate with the display screen, the material testing machine, and the data importing device, the computing device comprising: processing circuitry configured to: Initiating a material testing workflow configured to guide a user through the setup, execution, or analysis of a test method for the material testing machine, displaying on the display screen a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI including one or more input fields, In response to receiving final field input data from the data importing device when a final input field among the one or more input fields has input focus: populating the final input field with the final field input data and advancing the input focus away from the one or more input fields, and In response to receiving subsequent input data from the data import device after the one or more input fields are filled in on the display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from the first state to a second state, and displaying a second GUI associated with the second state of the material testing workflow on the display screen.
2. The system of claim 1, wherein: The processing circuitry of the computing device is further configured to control the controller of the materials testing machine to perform the testing method using the final field input data.
3. The system of claim 1, wherein: The tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high radio frequency tag reader.
4. The system of claim 1, wherein: The measuring device includes a digital caliper.
5. The system of claim 1, wherein: The first GUI further includes guidance on how to use the data importing device to obtain the final field input data or the subsequent input data.
6. The system of claim 1, wherein: The processing circuitry is further configured to: Verify that the final field input data meets the input criteria, and If the final field input data does not meet test criteria, then filling of the final input field, advancement of the input focus, or execution of the test method is prevented.
7. The system of claim 6, wherein: Verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier representing a fixture that complies with the test configuration of the test method.
8. A method comprising: initiating, via processing circuitry of a computing device, a materials testing workflow configured to guide a user through setup, execution, or analysis of a testing method for a materials testing machine in communication with the computing device, the materials testing machine including a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying a first graphical user interface (GUI) associated with a first state of the materials testing workflow on a display screen in communication with the computing device, the first GUI including one or more input fields; receiving, at the computing device, final field input data from a data import device when a final field input field of the one or more input fields has input focus, the data import device comprising a camera, a tag reader, or a measuring device; In response to receiving the final field input data at the computing device from the data importing device when the final input field among the one or more input fields has the input focus: populates the final input field with the final field input data, and advancing the input focus away from the one or more input fields; as well as In response to receiving subsequent input data at the computing device from the data importing device after the one or more input fields are populated on the display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from the first state to a second state, and A second GUI associated with the second state of the materials testing workflow is displayed on the display screen.
9. The method of claim 8, further comprising controlling, by the processing circuitry of the computing device, the controller of the materials testing machine to execute the testing method using the final field input data.
10. The method of claim 8, wherein: The tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high radio frequency tag reader.
11. The method of claim 8, wherein: The measuring device includes a digital caliper.
12. The method of claim 8, wherein: The first GUI further includes guidance on how to use the data importing device to obtain the final field input data or the subsequent input data.
13. The method of claim 8, further comprising: verifying, by the processing circuit system, that the final field input data conforms to input criteria; as well as If the final field input data does not meet test criteria, then filling of the final input field, advancement of the input focus, or execution of the test method is prevented.
14. The method of claim 13, wherein: Verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier representing a fixture that complies with the test configuration of the test method.
15. A non-transitory computer-readable medium comprising machine-readable instructions that, when executed by a processor, cause the processor to: initiating a material testing workflow configured to guide a user through setting up, executing, or analyzing a test method for a material testing machine, the material testing machine including a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying a first graphical user interface (GUI) associated with a first state of the materials testing workflow on a display screen, the first GUI including one or more input fields; receiving final field input data from a data import device when a final field input field among the one or more input fields has input focus, the data import device comprising a camera, a tag reader, or a measuring device; In response to receiving the final field input data from the data importing device when the final input field among the one or more input fields has the input focus: populates the final input field with the final field input data, and advancing the input focus away from the one or more input fields; as well as In response to receiving subsequent input data at a computing device from the data importing device after the one or more input fields are populated on the display screen and the input focus has been advanced away from the one or more input fields: advancing the material testing workflow from the first state to a second state, and A second GUI associated with the second state of the materials testing workflow is displayed on the display screen.
16. The non-transitory computer-readable medium of claim 15, further comprising machine-readable instructions that, when executed by the processor, cause the processor to control the controller of the materials testing machine to perform the testing method using the final field input data.
17. The non-transitory computer readable medium of claim 15, wherein: The tag reader comprises a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high radio frequency tag reader, and wherein the measuring device comprises a digital caliper.
18. The non-transitory computer readable medium of claim 15, wherein: The first GUI further includes guidance on how to use the data importing device to obtain the final field input data or the subsequent input data.
19. The non-transitory computer-readable medium of claim 15, further comprising machine-readable instructions that, when executed by a processor, cause the processor to: Verifying that the final field input data complies with input criteria; and If the final field input data does not meet test criteria, then filling of the final input field, advancement of the input focus, or execution of the test method is prevented.
20. The non-transitory computer readable medium of claim 19, wherein: Verifying that the final field input data complies with the input criteria includes verifying that the final field input data is an identifier representing a fixture that complies with the test configuration of the test method.