Temperature calibration device capable of tracing to second definition and temperature calibration method
By using a dual-cavity design within a vacuum chamber and synchronous differential measurement technology, and by utilizing the blackbody radiation frequency shift of cold strontium atoms, high-precision temperature calibration was achieved, solving the problem of material-dependent errors in traditional methods and achieving millikelvin-level measurement accuracy.
Patent Information
- Application Number
- CN202511176022.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-21
- Publication Date
- 2025-10-17
AI Technical Summary
Existing temperature calibration methods have too high absolute uncertainty at room temperature, making it difficult to meet the requirements of high-precision metrology. Furthermore, traditional methods rely on material properties, which leads to calibration errors and makes it difficult to achieve continuous temperature calibration.
The system employs a dual-cavity design within a vacuum chamber, consisting of a blackbody radiation reference shielding cavity and a blackbody radiation measurement shielding cavity. Temperature control is achieved using a pulse tube refrigerator and a fourth-order Peltier. Simultaneous differential measurement is performed using cold strontium atoms through a movable optical lattice, enabling precise measurement and calibration of the blackbody radiation frequency shift.
The absolute uncertainty of temperature calibration has been reduced to below 15 mK, traceable to the second definition, overcoming the material-dependent error in traditional methods, and providing high-precision and reliable temperature measurement.