Impact type fault interpretable detection method for ship key equipment based on wavelet scattering and time-frequency feature enhancement
By improving wavelet scattering transform and time-frequency feature enhancement techniques, and combining complex Morlet wavelets and optimized filter banks to process vibration signals of key ship equipment, an interpretable fault detection model is constructed. This solves the problems of weak generalization ability and uninterpretable diagnostic results in existing technologies, and achieves high-precision, interference-resistant fault detection.
Patent Information
- Application Number
- CN202610054473.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-01-15
- Publication Date
- 2026-04-24
AI Technical Summary
Existing methods for detecting impact-type faults in critical ship equipment have weak generalization ability, uninterpretable diagnostic results, and poor anti-interference ability, making it difficult to effectively identify fault characteristics in complex environments.
An improved wavelet scattering transform and time-frequency feature enhancement technique are employed, combined with complex Morlet wavelets and optimized filter banks to process vibration signals. An interpretable fault detection model is generated through a VGG16 network and class activation mapping (CAM), enabling visualization of fault features and high-precision diagnosis.
It enhances the anti-interference and generalization capabilities of detection, provides interpretable diagnostic results, improves the accuracy and reliability of fault detection for critical ship equipment, and adapts to different ships and operating conditions.