A dynamic on-resistance test circuit and method for a bidirectional power device
By constructing a multi-mode test circuit and utilizing a bidirectional stress module and high-precision detection technology, the problem of dynamic on-resistance testing of bidirectional devices under AC operating conditions was solved, achieving high-precision online measurement and signal extraction, and expanding the applicability of the test platform.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- UNIV OF ELECTRONICS SCI & TECH OF CHINA
- Filing Date
- 2026-03-24
- Publication Date
- 2026-06-12
AI Technical Summary
Existing dynamic on-resistance testing circuits cannot accurately simulate the electrical stress of bidirectional devices under AC operating conditions, and are difficult to accurately distinguish weak on-resistance signals under high voltage, resulting in distorted measurement results.
A multi-mode test circuit is constructed by employing a configurable bidirectional stress module, a filter energy storage module, and a bidirectional high-precision detection module, combined with dual active isolation and Schottky clamping technology, to achieve high-precision online measurement.
It enables high-precision dynamic on-resistance testing under real stress conditions, which can reproduce the voltage stress and current freewheeling process of devices in AC applications, expands the applicability of the test platform, effectively extracts weak signals, and improves the accuracy of measurement.
Smart Images

Figure CN122193848A_ABST