Flip-chip LED chip testing machine and method
By introducing an anti-escape sealing module and an overall locking module into the flip-chip LED chip testing machine, the problem of insufficient sealing was solved, the accuracy and reliability of thermal shock testing were achieved, the uniform heating and cooling of the chip was ensured, and the testing accuracy was improved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIANGNENG HUALEI OPTOELECTRONICS
- Filing Date
- 2026-04-27
- Publication Date
- 2026-06-12
AI Technical Summary
Existing flip-chip LED chip testing machines have poor sealing during thermal shock testing, causing heat and cold air to permeate between the hot and cold chambers, affecting the accuracy of the test results.
It adopts an anti-escape sealing module and an overall locking module. Through the structural design of sealing plates, uprights and L-shaped frames, it can temporarily seal the heating and cooling space to prevent hot and cold air from penetrating each other. The design of airbags and elastic airbags ensures the sealing effect.
It significantly improves the heat transfer effect of flip-chip LEDs, ensures the accuracy and reliability of test results, reduces energy consumption, and improves detection accuracy.
Smart Images

Figure CN122193883A_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of LED chip testing equipment technology, and in particular to a flip-chip LED chip testing machine and method. Background Technology
[0002] LED chip thermal shock testing assesses the mechanical and electrical reliability of chips under thermal expansion and contraction by rapidly switching between extreme temperature differences, such as -40℃ to 125℃. It aims to accelerate the screening of potential defects and verify the thermal compatibility of materials. Common failure modes include chip cracking, gold wire breakage, die bonding layer delamination, and dead LEDs. This is a key verification method to ensure the long-term stable operation of LEDs in harsh environments.
[0003] Existing flip-chip LED chip testing machines require multiple switching of the chip between the hot and cold chambers during thermal shock testing. The chip holder moves between the hot and cold chambers, causing heat and cold air to permeate each other. This results in the temperature of some parts of the holder not reaching the effective testing temperature for the chip, which greatly affects the accuracy of the test results. Summary of the Invention
[0004] This invention discloses a flip-chip LED chip testing machine and method, aiming to solve the technical problem of poor sealing performance of existing flip-chip LED chip testing machines when performing thermal shock tests on chips.
[0005] This invention discloses a flip-chip LED chip testing machine, comprising a testing chamber with a top cover movably connected to its upper side. Both the testing chamber and the top cover are secured with the same locking bolt. A base is fixedly connected to the bottom of the testing chamber. A slot is formed on the upper side of the base, and a rotating motor is fixedly connected to the inner wall of the bottom of the slot. A rotating shaft is positioned above the rotating motor, and multiple trays evenly distributed in a circle are fixedly connected to the outside of the rotating shaft. An anti-escape sealing module is provided on the outside of the trays. The testing chamber is equipped with a compressor and two heating units. The test chamber is equidistantly distributed in a circle, and the inner wall of the test chamber is fixedly connected with an insulation lining. An overall locking module is set at the bottom of the test chamber. The anti-escape sealing module includes multiple uprights and L-shaped frames equidistantly distributed in a circle. The opposite sides of the uprights and L-shaped frames are slidably connected. The opposite sides of the uprights and rotating shafts are fixedly connected. The uprights and L-shaped frames are located between adjacent trays, and the same sealing plate is set on the uprights and L-shaped frames on the same side. Hollow grooves are set on the sealing plates, and hollow plates are fixedly connected to the inner walls of the hollow grooves.
[0006] In a preferred embodiment, multiple symmetrical interlocking strips are fixedly connected to the exterior of each of the plurality of enclosed plates. Two symmetrical mating grooves are formed on the exterior of each hollow groove. A reserved groove is formed on the side of the upright opposite to the L-shaped frame. Receiving grooves are formed on the inner walls of both sides of the reserved grooves. Airbags are fixedly connected to the inner walls of each receiving groove. U-shaped adhesive strips are fixedly connected to the side of each of the plurality of airbags away from the receiving grooves. The exterior of each enclosed plate is inserted into the inner wall of the reserved groove on the same side. The inner wall of each U-shaped adhesive strip is fitted into the exterior of the interlocking strip on the same side. A slot is formed on the bottom inner wall of each reserved groove, and the bottom inner wall of the slot is fixedly connected to the... Each of the L-shaped frames is connected to an elastic airbag (first type). Each elastic airbag has two symmetrical air guide tubes on its exterior, with the end of each tube furthest from the first airbag connected to the same side of the first airbag. Rectangular grooves are formed on the exterior of each L-shaped frame. The inner walls of these grooves are inserted into the exterior of a closed plate on the same side. Side plate grooves are formed on the inner walls of both sides of the rectangular grooves. Second airbags are fixedly connected to the inner walls of these side plate grooves. A protruding strip is fixedly connected to the side of each second airbag furthest from the side plate groove. The exterior of the protruding strip is slidably connected to the inner wall of the side plate groove on the same side, and the exterior of the protruding strip is fitted into the inner wall of a mating groove on the same side. The bottom inner walls of each of the rectangular grooves are... There are two symmetrical circular grooves. The bottom inner walls of each groove are fixedly connected to an elastic airbag. Two symmetrical air supply pipes are provided on the outside of each elastic airbag. The end of each air supply pipe away from the elastic airbag is connected to the airbag on the same side. The upper side of each elastic airbag is in contact with the bottom of the sealing plate. Two symmetrical pressure sensors are fixedly connected to the bottom inner walls of each rectangular groove. The upper side of the test chamber has multiple rectangular openings equidistantly distributed around the circumference. The inner walls of each rectangular opening are slidably connected to the outside of the sealing plate on the same side. Shallow grooves are formed on the inner walls of each rectangular opening, and sealing rings are fixedly connected to the inner walls of each shallow groove. The enclosure is slidably connected to the outside of the sealing plate, and an outer frame is slidably connected to the outside of the sealing plate. The bottom of the outer frame is fixedly connected to the upper side of the test box. A lead screw is movably connected to the upper side of the sealing plate. Two symmetrical guide rods are fixedly connected to the upper side of the sealing plate. The guide rods and the lead screw are provided with the same fixing frame. The bottom of the fixing frame is fixedly connected to the upper side of the outer frame. A gear ring is provided to the outside of the lead screw. The bottom of the gear ring is slidably connected to the upper side of the fixing frame. A drive motor is fixedly connected to the upper side of the fixing frame. The output end of the drive motor is connected to a transmission gear through a coupling. The transmission gear meshes with the gear ring.
[0007] In a preferred embodiment, the overall locking module includes a fixed sleeve. The bottom inner walls of the test chamber and the insulation liner have the same circular opening. The inner walls of both circular openings are movably connected to the outside of the fixed sleeve. The output end of the rotating motor is connected to the bottom of the fixed sleeve via a coupling. A positioning sleeve is fixedly connected to the inner wall of the fixed sleeve. The inner wall of the positioning sleeve has multiple circumferentially equidistant grooves. The outside of the rotating shaft is inserted into the inner walls of the grooves. A rubber pad is fixedly connected to the upper side of the fixed sleeve. An outer edge plate is fixedly connected to the outside of the rotating shaft, and the bottom of the outer edge plate is in contact with the upper side of the rubber pad. A spring is fixedly connected to the bottom inner wall of the fixed sleeve, and a pad is fixedly connected to the end of the spring near the rotating shaft. The upper side of the plate and pad contacts the bottom of the rotating shaft. A rotating frame is movably connected to the outside of the fixed sleeve. Two curved blocks distributed equidistantly in a circle are fixedly connected to the inner wall of the rotating frame. Two symmetrical insertion ports are opened on the rotating shaft. Locking blocks are slidably connected to the inner wall of each insertion port. A connecting groove is opened at the bottom of each locking block. A bottom end frame is slidably connected to the inner wall of each connecting groove. The outside of each bottom end frame is fixedly connected to the outside of the rotating shaft. A second spring is fixedly connected to the inner wall of each connecting groove. The end of the second spring away from the connecting groove is fixedly connected to the outside of the bottom end frame on the same side. An annular groove is opened on the outside of the rotating shaft. The inner wall of each annular groove is engaged with the outside of the locking block. The outside of each curved block contacts the outside of the locking block on the same side.
[0008] A method for testing flip-chip LEDs, using a flip-chip LED testing machine as described above, includes the following steps: Step 1: Loosen the locking bolts, open the top cover, and place the LED chip to be tested on the tray; Step 2: Place the tray into the test chamber and use the overall locking module to lock the shaft connected to the tray; Step 3: Close the top cover, tighten the locking bolts, and use the anti-escape sealing module to seal the area corresponding to the compressor and heating unit; Step 4: Start the compressor and heating unit to heat and cool the trays in the affected area. After a period of time, use the anti-escape sealing module again to release the seal, start the rotating motor, and rotate the shaft clockwise to swap the positions of the trays in the heated and cooled areas. Use the anti-escape sealing module again to seal the trays, start the compressor and heating unit, and repeat the above steps. Then, start the rotating motor again to rotate the shaft counterclockwise to swap the heated and cooled areas. Repeat this process multiple times.
[0009] As can be seen from the above, the flip-chip LED testing machine provided by the present invention can temporarily seal the heating and cooling spaces in the device when performing thermal shock testing on flip-chip LEDs. This prevents hot and cold air from penetrating each other due to the interconnection of the internal space of the device, thus preventing the flip-chip LEDs in the penetration area from receiving sufficient heating or cooling and affecting the test results. This significantly improves the heat exchange and cooling effect of the flip-chip LEDs, ensuring the accuracy and reliability of the test results. Attached Figure Description
[0010] Figure 1 This is a schematic diagram of the overall structure of a flip-chip LED chip testing machine proposed in this invention; Figure 2 This is a cross-sectional view of a flip-chip testing machine proposed in this invention. Figure 3 This is a schematic diagram of the L-shaped frame structure of a flip-chip LED chip testing machine proposed in this invention; Figure 4 This is a schematic diagram of the reserved slot structure of a flip-chip LED chip testing machine proposed in this invention; Figure 5 This is a schematic diagram of the rectangular groove structure of a flip-chip LED chip testing machine proposed in this invention; Figure 6 This is a schematic diagram of the external frame structure of a flip-chip LED chip testing machine proposed in this invention; Figure 7 This is a schematic diagram of the fixing sleeve structure of a flip-chip LED chip testing machine proposed in this invention; Figure 8 This is a schematic diagram of the rotating frame structure of a flip-chip LED chip testing machine proposed in this invention.
[0011] In the diagram: 1. Test box; 2. Top cover; 3. Locking bolt; 4. Base; 5. Rotating motor; 6. Rotating shaft; 7. Tray; 8. Anti-escape sealing module; 801. Upright pole; 802. L-shaped frame; 803. Rectangular groove; 804. Reserved groove; 805. Pressure sensor; 806. Sealing plate; 807. Hollow groove; 808. Hollow plate; 809. Fitting strip; 810. Docking groove; 811. Receiving groove; 812. Airbag one; 813. U-shaped adhesive strip; 814. Elastic airbag one; 815. Side plate groove; 816. Airbag two; 817. Protruding strip; 818. Elastic airbag two 819. Sealing ring; 820. Lead screw; 821. Fixing bracket; 822. Guide rod; 823. Gear ring; 824. Drive motor; 825. Transmission gear; 826. Outer frame; 9. Overall locking module; 901. Fixing sleeve; 902. Rubber pad; 903. Outer edge plate; 904. Annular groove; 905. Positioning sleeve; 906. Groove; 907. Rotating frame; 908. Spring one; 909. Pad plate; 910. Locking block; 911. Bottom frame; 912. Spring two; 913. Curved block; 10. Compressor; 11. Heating unit; 12. Insulation lining. Detailed Implementation
[0012] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.
[0013] The flip-chip LED chip testing machine disclosed in this invention is mainly applied to scenarios where existing flip-chip LED chip testing machines have poor sealing performance when performing thermal shock tests on chips.
[0014] Reference Figures 1-8A flip-chip LED chip testing machine includes a testing chamber 1. A top cover 2 is rotatably connected to the upper side of the testing chamber 1 via bearings. The testing chamber 1 and the top cover 2 are fitted with the same locking bolt 3. A base 4 is bolted to the bottom of the testing chamber 1. A slot is formed on the upper side of the base 4. A rotating motor 5 is bolted to the inner wall of the bottom of the slot. A rotating shaft 6 is positioned above the rotating motor 5. Multiple trays 7, evenly distributed in a circle, are bolted to the outside of the rotating shaft 6. An anti-escape sealing module 8 is installed on the outside of the trays 7. A compressor 10 and two heating units 11 are arranged evenly in a circle on the testing chamber 1. The wall is connected to the insulation lining 12 by bolts. The test chamber 1 is provided with an overall locking module 9. The anti-escape sealing module 8 includes multiple uprights 801 and L-shaped frames 802 distributed circumferentially. The opposite sides of the uprights 801 and L-shaped frames 802 are slidably connected. The opposite sides of the uprights 801 and the rotating shaft 6 are connected by bolts. The uprights 801 and L-shaped frames 802 are located between adjacent trays 7. The same sealing plate 806 is provided on the uprights 801 and L-shaped frames 802 on the same side. The sealing plate 806 is provided with hollow grooves 807. The inner wall of the hollow grooves 807 is connected with hollow plates 808 by bolts.
[0015] Specifically, the device utilizes an anti-escape sealing module 8 to temporarily seal the heating and cooling spaces within the device during thermal shock testing of flip-chip LEDs. This prevents hot and cold air from permeating each other due to the interconnectedness of the internal space, thus preventing the flip-chip LEDs in the permeated areas from receiving sufficient heating or cooling and affecting the test results. This significantly improves the heat exchange and cooling effect of the flip-chip LEDs, ensuring the accuracy and reliability of the test results.
[0016] Reference Figure 3 , Figure 4 , Figure 5 and Figure 6In a preferred embodiment, the exterior of each of the multiple enclosed plates 806 is bolted with multiple symmetrical interlocking strips 809. The exterior of each hollow groove 807 has two symmetrical mating grooves 810. A reserved groove 804 is provided on the side of the upright 801 opposite to the L-shaped frame 802. Receiving grooves 811 are provided on the inner walls of both sides of the reserved groove 804. Airbags 812 are bolted to the inner walls of the receiving grooves 811. U-shaped rubber strips 813 are bolted to the side of each airbag 812 away from the receiving grooves 811. The exterior of each enclosed plate 806 is inserted into the inner wall of the reserved groove 804 on the same side. The inner walls of the U-shaped adhesive strips 813 are all fitted with the outer walls of the mating strips 809 on the same side, and the bottom inner walls of the reserved grooves 804 are all provided with slots. The bottom inner walls of the slots are all connected to elastic airbags 814 by bolts. The outer walls of the elastic airbags 814 are provided with two symmetrical air guide tubes. The ends of the air guide tubes away from the elastic airbags 814 are all connected to the airbags 812 on the same side. The outer walls of the multiple L-shaped frames 802 are all provided with rectangular grooves 803. The inner walls of the rectangular grooves 803 are all inserted into the outer walls of the closing plates 806 on the same side. The inner walls of the rectangular grooves 803 on both sides are provided with side plate grooves 815. The inner walls of the side plate grooves 815 are all connected by bolts. Airbag 816 is bolted to the side of airbag 816 away from the side plate groove 815. Each side of airbag 816 is bolted to a protruding strip 817. The outer side of each protruding strip 817 is slidably connected to the inner wall of the side plate groove 815 on the same side, and the outer side of each protruding strip 817 is fitted into the inner wall of the mating groove 810 on the same side. Two symmetrical circular grooves are formed on the bottom inner wall of each of the multiple rectangular grooves 803. Elastic airbag 818 is bolted to the bottom inner wall of each circular groove. Two symmetrical air supply pipes are provided on the outer side of each elastic airbag 818. The end of each air supply pipe away from the elastic airbag 818 is connected to airbag 816 on the same side. The upper side of 18 is in contact with the bottom of the sealing plate 806. The bottom inner wall of the rectangular groove 803 is connected to two symmetrical pressure sensors 805 by bolts. The upper side of the test box 1 has multiple rectangular openings that are equidistantly distributed in a circle. The inner wall of each rectangular opening is slidably connected to the outside of the sealing plate 806 on the same side. The inner wall of each rectangular opening has a shallow groove. The inner wall of each shallow groove is connected to a sealing ring 819 by bolts. The inner wall of each sealing ring 819 is slidably connected to the outside of the sealing plate 806. The outer frame 826 is slidably connected to the outside of the sealing plate 806. The bottom of each outer frame 826 is connected to the upper side of the test box 1 by bolts.A lead screw 820 is rotatably connected to the upper side of the sealing plate 806 via a bearing. Two symmetrical guide rods 822 are bolted to the upper side of the sealing plate 806. The guide rods 822 and the lead screw 820 are connected to the same fixing frame 821. The bottom of the fixing frame 821 is bolted to the upper side of the outer frame 826. A gear ring 823 is mounted on the outside of the lead screw 820. The bottom of the gear ring 823 is rotatably connected to the upper side of the fixing frame 821 via a bearing. A drive motor 824 is bolted to the upper side of the fixing frame 821. The output end of the drive motor 824 is connected to a transmission gear 825 via a coupling. The transmission gear 825 meshes with the gear ring 823.
[0017] In specific application scenarios, the anti-escape sealing module 8 is mainly used in the anti-escape sealing stage of the anti-escape sealing process. Specifically, the anti-escape sealing module 8 utilizes the sealing plate 806, uprights 801, L-shaped frame 802, and hollow plate 808 to isolate the spaces corresponding to the compressor 10 and heating unit 11, thereby reducing the temperature exchange between hot and cold air during the test. The internal vacuum of the hollow plate 808 effectively reduces heat conduction efficiency, ensuring the test environment meets requirements and reducing energy consumption. The interlocking strip 809 further enhances the protection. Airbag 812, U-shaped adhesive strip 813, elastic airbag 814, elastic airbag 818, airbag 816, protrusion 817, and docking groove 810 can automatically seal the contact surface with the sealing plate 806 after the sealing plate 806 is inserted into the upright 801 and L-shaped frame 802. This significantly reduces the mutual penetration of hot and cold air, ensuring that the LED chips in the upper edge area of the tray 7 near the sealing plate 806 are not affected by the penetrating hot or cold air, ensuring that the chips can be heated or cooled evenly, and improving the accuracy of detection.
[0018] Reference Figure 7 and Figure 8In a preferred embodiment, the overall locking module 9 includes a fixed sleeve 901. The bottom inner walls of the test chamber 1 and the insulation liner 12 have the same circular opening. The inner walls of the two circular openings are rotatably connected to the outside of the fixed sleeve 901 via bearings. The output end of the rotating motor 5 is connected to the bottom of the fixed sleeve 901 via a coupling. A positioning sleeve 905 is bolted to the inner wall of the fixed sleeve 901. The inner wall of the positioning sleeve 905 has multiple circumferentially equidistant grooves 906. The outside of the rotating shaft 6 is inserted into the inner wall of the grooves 906. A rubber pad 902 is bolted to the upper side of the fixed sleeve 901. An outer edge plate 903 is bolted to the outside of the rotating shaft 6. The bottom of the outer edge plate 903 is in contact with the upper side of the rubber pad 902. A spring 908 is bolted to the bottom inner wall of the fixed sleeve 901. A pad is bolted to the end of the spring 908 near the rotating shaft 6. The upper side of plate 909 and pad 909 are in contact with the bottom of rotating shaft 6. The outside of fixed sleeve 901 is rotatably connected to rotating frame 907 via bearing. The inner wall of rotating frame 907 is connected by bolts to two circumferentially distributed curved blocks 913. Two symmetrical insertion ports are opened on rotating shaft 6. Locking blocks 910 are slidably connected to the inner wall of each insertion port. A connecting groove is opened at the bottom of each locking block 910. A bottom end frame 911 is slidably connected to the inner wall of each connecting groove. The outside of the bottom end frame 911 is bolted to the outside of rotating shaft 6. A second spring 912 is bolted to the inner wall of each connecting groove. The end of the second spring 912 away from the connecting groove is bolted to the outside of the bottom end frame 911 on the same side. An annular groove 904 is opened on the outside of rotating shaft 6. The inner wall of the annular groove 904 is engaged with the outside of locking block 910. The outside of curved block 913 is in contact with the outside of locking block 910 on the same side.
[0019] In specific application scenarios, the overall locking module 9 is mainly used in the overall locking process. Specifically, the overall locking module 9 utilizes the positioning sleeve 905, the slot 906, and the locking block 910 to ensure that the rotating shaft 6, after being inserted into the device, rotates synchronously with the fixed sleeve 901. This significantly reduces the angular deviation caused by the rotation of the rotating shaft 6 and the rotating motor 5, ensuring the accuracy of the rotation angle of the tray 7 on the rotating shaft 6. This ensures the smooth descent of the closing plate 806, preventing the closing plate 806 from getting stuck and improving the operational reliability of the device. The curved block 913, locking block 910, spring 912, and rotating frame 907 enable the device to install and lock the rotating shaft 6 and the tray 7, ensuring the accurate position of the rotating shaft 6 in the test chamber 1, reducing the height error between the rotating shaft 6 and the top cover 2, ensuring that the bottom of the top cover 2 can fully fit with the rotating shaft 6, reducing gaps, preventing the leakage of hot and cold air during testing, and promoting the smooth progress of the test.
[0020] A method for testing flip-chip LEDs, using a flip-chip LED testing machine as described above, includes the following steps: Step 1: Loosen the locking bolt 3, open the top cover 2, and place the LED chip to be tested on the tray 7; Step 2: Place the tray 7 into the test chamber 1. Use the overall locking module 9 to lock the rotating shaft 6 connected to the tray 7. (After loading the chip onto the tray 7 on the rotating shaft 6 and inserting the rotating shaft 6 connected to the tray 7 into the groove 906 on the positioning sleeve 905, the outer edge plate 903 can fully fit with the rubber pad 902. Press down on the rotating shaft 6 so that the rotating shaft 6 overcomes the elastic force of the groove 906 and pushes the pad 909 to continue to descend. Rotate the rotating frame 907. The curved block 913 on the rotating frame 907 rotates with it. Its narrow edge first contacts the edge of the locking block 910. As the rotating frame 907 continues to rotate, the narrow edge gradually widens, thereby pushing the locking block 910 to overcome the tension of the spring 912 and move into the rotating shaft 6 until it is inserted into the annular groove 904. At this time, stop rotating the curved block 913 so that the locking block 910 keeps locking the rotating shaft 6.) Step 3: Close the top cover 2, tighten the locking bolts 3, and use the anti-escape sealing module 8 to seal the corresponding areas of the compressor 10 and heating unit 11. (After placing the tray 7 into the test chamber 1 and closing the top cover 2, start the drive motor 824. The drive motor 824 drives the gear ring 823 meshing with the transmission gear 825 to rotate, thereby causing the lead screw 820 to descend on the fixed frame 821, pushing the sealing plate 806 from the outer frame 826 into the test chamber 1, so that the sealing plate 806 is inserted into the rectangular slot 803 and the reserved slot 804. During this process, the bottom of the sealing plate 806 will compress the elastic airbag 1 814 and the elastic airbag 2 818, causing the elastic airbag 1 814 and the elastic airbag 2 818 to...) 818 delivers its internal air to airbag 812 and airbag 816, causing them to gradually inflate. This pushes the U-shaped rubber strip 813 to engage with the fitting strip 809, sealing the side of the sealing plate 806. The protruding strip 817 is then inserted into the mating groove 810, sealing the bottom of the sealing plate 806. The sealing ring 819 seals the top of the sealing plate 806. After the pressure sensor 805 detects that the pressure of the sealing plate 806 on the bottom of the rectangular groove 803 has reached a preset value, the drive motor 824 is turned off, and the sealing plate 806 stops descending. After completing a single heating and cooling test, the steps are reversed to retract the sealing plate 806. Step 4: Start the compressor 10 and heating unit 11 to heat and cool the affected tray 7. After a period of time, use the anti-escape sealing module 8 again to release the seal, start the rotating motor 5, and the rotating motor 5 drives the rotating shaft 6 to rotate clockwise to swap the positions of the heated and cooled trays 7. Use the anti-escape sealing module 8 again to seal, and start the compressor 10 and heating unit 11. After completion, repeat the above operation, start the rotating motor 5 again to drive the rotating shaft 6 to rotate counterclockwise to swap the heated and cooled areas, and repeat multiple times.
[0021] The above description is only a preferred embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any equivalent substitutions or modifications made by those skilled in the art within the scope of the technology disclosed in the present invention, based on the technical solution and inventive concept of the present invention, should be covered within the scope of protection of the present invention.
Claims
1. A flip-chip LED chip testing machine, comprising a testing chamber (1), characterized in that, The test chamber (1) is movably connected to a top cover (2). The test chamber (1) and the top cover (2) are provided with the same locking bolt (3). The bottom of the test chamber (1) is fixedly connected to a base (4). The upper side of the base (4) is provided with a slot. The bottom inner wall of the slot is fixedly connected to a rotating motor (5). A rotating shaft (6) is provided above the rotating motor (5). Multiple trays (7) are fixedly connected to the outside of the rotating shaft (6) in a circumferentially equidistant manner. An anti-escape sealing module (8) is provided on the outside of the trays (7). The test chamber (1) is provided with a compressor (10) and two heating units (11) in a circumferentially equidistant manner. The inner wall of the test chamber (1) is fixedly connected to a heat insulation lining (10). 2) An overall locking module (9) is provided below the test box (1). The anti-escape sealing module (8) includes multiple uprights (801) and L-shaped frames (802) distributed circumferentially. The uprights (801) and L-shaped frames (802) are slidably connected on opposite sides. The uprights (801) and the opposite side of the rotating shaft (6) are fixedly connected. The uprights (801) and L-shaped frames (802) are located between adjacent trays (7). The same sealing plate (806) is provided on the uprights (801) and L-shaped frames (802) on the same side. The sealing plate (806) is provided with hollow grooves (807). Hollow plates (808) are fixedly connected to the inner walls of the hollow grooves (807).
2. The flip-chip LED chip testing machine according to claim 1, characterized in that, Multiple symmetrical interlocking strips (809) are fixedly connected to the outside of the multiple closed plates (806). Two symmetrical docking slots (810) are opened on the outside of the hollow groove (807). A reserved slot (804) is opened on the side of the upright (801) opposite to the L-shaped frame (802). A receiving slot (811) is opened on both sides of the inner wall of the reserved slot (804). An airbag (812) is fixedly connected to the inner wall of the receiving slot (811).
3. The flip-chip LED chip testing machine according to claim 2, characterized in that, Each of the multiple airbags (812) is fixedly connected to a U-shaped rubber strip (813) on the side away from the receiving groove (811). The outer side of the sealing plate (806) is inserted into the inner wall of the reserved groove (804) on the same side. The inner wall of the U-shaped rubber strip (813) is fitted into the outer side of the fitting strip (809) on the same side. The bottom inner wall of the reserved groove (804) is provided with a slot. The bottom inner wall of the slot is fixedly connected to an elastic airbag (814). The outer side of the elastic airbag (814) is provided with two symmetrical air guide tubes. The end of the air guide tube away from the elastic airbag (814) is connected to the airbag (812) on the same side.
4. The flip-chip LED chip testing machine according to claim 3, characterized in that, The exterior of each of the L-shaped frames (802) is provided with a rectangular groove (803). The inner wall of the rectangular groove (803) is inserted into the exterior of the closed plate (806) on the same side. The inner walls of both sides of the rectangular groove (803) are provided with side plate grooves (815). The inner wall of the side plate groove (815) is fixedly connected with an airbag (816). The side of the airbag (816) away from the side plate groove (815) is fixedly connected with a protrusion (817). The exterior of the protrusion (817) is slidably connected to the inner wall of the side plate groove (815) on the same side, and the exterior of the protrusion (817) is fitted into the inner wall of the docking groove (810) on the same side.
5. A flip-chip LED chip testing machine according to claim 4, characterized in that, The bottom inner wall of each of the rectangular grooves (803) has two symmetrical circular grooves. The bottom inner wall of each circular groove is fixedly connected to an elastic airbag (818). The outer side of each elastic airbag (818) is provided with two symmetrical air supply pipes. The end of each air supply pipe away from the elastic airbag (818) is connected to the airbag (816) on the same side. The upper side of each elastic airbag (818) is in contact with the bottom of the sealing plate (806). The bottom inner wall of each rectangular groove (803) is fixedly connected to two symmetrical pressure sensors (805).
6. The flip-chip LED chip testing machine according to claim 5, characterized in that, The test box (1) has multiple rectangular openings that are equidistantly distributed around the circumference on its upper side. The inner walls of the rectangular openings are slidably connected to the outer side of the sealing plate (806) on the same side. The inner walls of the rectangular openings are all provided with shallow grooves. The inner walls of the shallow grooves are all fixedly connected with sealing rings (819). The inner walls of the sealing rings (819) are all slidably connected to the outer side of the sealing plate (806). The outer side of the sealing plate (806) is slidably connected with an outer frame (826). The bottom of the outer frame (826) is fixedly connected to the upper side of the test box (1).
7. A flip-chip LED chip testing machine according to claim 6, characterized in that, A lead screw (820) is movably connected to the upper side of the sealing plate (806). Two symmetrical guide rods (822) are fixedly connected to the upper side of the sealing plate (806). The guide rods (822) and the lead screw (820) are provided with the same fixed frame (821). The bottom of the fixed frame (821) is fixedly connected to the upper side of the outer frame (826). A gear ring (823) is provided to the outside of the lead screw (820). The bottom of the gear ring (823) is movably connected to the upper side of the fixed frame (821). A drive motor (824) is fixedly connected to the upper side of the fixed frame (821). The output end of the drive motor (824) is connected to a transmission gear (825) through a coupling. The transmission gear (825) meshes with the gear ring (823).
8. A flip-chip LED chip testing machine according to claim 7, characterized in that, The overall locking module (9) includes a fixed sleeve (901). The bottom inner walls of the test box (1) and the insulation liner (12) are provided with the same circular opening. The inner walls of the two circular openings are movably connected to the outside of the fixed sleeve (901). The output end of the rotating motor (5) is connected to the bottom of the fixed sleeve (901) through a coupling. The inner wall of the fixed sleeve (901) is fixedly connected to a positioning sleeve (905). The inner wall of the positioning sleeve (905) is provided with multiple circumferentially distributed grooves (906). The outside of the rotating shaft (6) is inserted into the inner wall of the grooves (906). The upper side of the fixed sleeve (901) is fixedly connected to a rubber pad (902). The outside of the rotating shaft (6) is fixedly connected to an outer edge plate (903). The bottom of the outer edge plate (903) is attached to the upper side of the rubber pad (902).
9. A flip-chip LED chip testing machine according to claim 8, characterized in that, A spring (908) is fixedly connected to the bottom inner wall of the fixed sleeve (901). A pad (909) is fixedly connected to the end of the spring (908) near the rotating shaft (6). The upper side of the pad (909) contacts the bottom of the rotating shaft (6). A rotating frame (907) is movably connected to the outside of the fixed sleeve (901). Two curved blocks (913) distributed equidistantly in a circle are fixedly connected to the inner wall of the rotating frame (907). Two symmetrical insertion ports are opened on the rotating shaft (6). Locking blocks (910) are slidably connected to the inner walls of the insertion ports. Each of the bottoms is provided with a connecting groove, and the inner wall of the connecting groove is slidably connected with a bottom end frame (911). The outer side of the bottom end frame (911) is fixedly connected to the outer side of the rotating shaft (6). The inner wall of the connecting groove is fixedly connected with a second spring (912). The end of the second spring (912) away from the connecting groove is fixedly connected to the outer side of the bottom end frame (911) on the same side. The outer side of the rotating shaft (6) is provided with an annular groove (904). The inner wall of the annular groove (904) is engaged with the outer side of the locking block (910). The outer side of the curved block (913) is in contact with the outer side of the locking block (910) on the same side.
10. A method for testing flip-chip LEDs, using a flip-chip LED testing machine as described in claim 9, characterized in that, Includes the following steps: Step 1: Loosen the locking bolt (3), open the top cover (2), and place the LED chip to be tested on the tray (7); Step 2: Place the tray (7) into the test box (1) and use the overall locking module (9) to lock the shaft (6) connected to the tray (7); Step 3: Close the top cover (2), tighten the locking bolts (3), and use the anti-escape sealing module (8) to seal the corresponding areas of the compressor (10) and heating unit (11); Step 4: Start the compressor (10) and heating unit (11) to heat and cool the tray (7) in the affected area. After a period of time, use the anti-escape sealing module (8) again to release the seal, start the rotating motor (5), and the rotating motor (5) drives the rotating shaft (6) to rotate clockwise to swap the positions of the heated and cooled trays (7). Use the anti-escape sealing module (8) again to seal, start the compressor (10) and heating unit (11). After completion, follow the above operation to start the rotating motor (5) again to drive the rotating shaft (6) to rotate counterclockwise to swap the heated and cooled areas. Repeat this process multiple times.