Method and device for spatial resolution verification of a timepix3 detector
By using a pinhole imaging geometric model and multiple noise removal techniques, a spatial resolution verification device and method suitable for the Timepix3 detector were constructed. This solved the problem that existing technologies could not accurately reflect spatial resolution performance under actual working conditions, achieving quantitative verification and improving the reliability of test results.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- HEFEI INSTITUTE OF PHYSICAL SCIENCE CHINESE ACADEMY OF SCIENCES
- Filing Date
- 2026-05-13
- Publication Date
- 2026-06-12
AI Technical Summary
Existing methods cannot accurately reflect the spatial resolution performance of the Timepix3 detector under actual working conditions, and lack quantitative judgment criteria, resulting in poor repeatability and objectivity of test results.
Using a pinhole imaging geometric model, an equivalent strip light source is formed by a grid module and a moving X-ray tube. Combining the centroid method and multiple noise removal techniques, and using a resolution contrast parameter value of less than 0.7 as a quantitative criterion, a spatial resolution verification device and method suitable for the Timepix3 detector are constructed.
This study achieved accurate and quantitative verification of the spatial resolution capability of the Timepix3 detector, overcame the shortcomings of theoretical calculations, improved the accuracy and reliability of test results, and simplified the operation process.
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