Display interface test method, device and electronic equipment

Abstract

This disclosure relates to a display interface testing method, apparatus, and electronic device. The method includes determining the historical test frequency corresponding to each object under test in the target display interface; determining priority indication information corresponding to each object under test based on the historical test frequency; determining a target test object from among the objects under test based on the priority indication information; determining a target test path for the target test object based on the target test object and a preset object architecture diagram, wherein the preset object architecture diagram is a structure diagram with each object under test as a node and the association relationship between each object under test as an edge, and each node includes an object identifier corresponding to the object under test and an associated object identifier of an associated object associated with the corresponding object under test; and testing the target test object based on the target test path. Utilizing embodiments of this disclosure can improve the efficiency and accuracy of display interface testing.

Description

Technical Field

[0001] This disclosure relates to the field of computer technology, and in particular to a method, apparatus and electronic device for testing display interfaces. Background Technology

[0002] In today's rapidly developing smart home appliance market, the display screen serves as a crucial interactive window for refrigeration equipment such as refrigerators and freezers. The stability of its software and the accuracy of its functions directly impact the user experience. The display screen needs to accurately present information such as food storage details, temperature adjustment interfaces, and fault prompts; therefore, comprehensive and efficient testing of its software is essential.

[0003] In existing display interface testing, manual testing, relying on the testers' subjective judgment, can cover complex scenarios to a certain extent. However, limited by manpower and energy allocation, it is prone to test omissions when faced with a large number of functionalities and repetitive testing tasks. Although automated testing can achieve batch testing through script execution and improve testing efficiency, most current automated solutions rely on fixed test paths and preset test cases, and cannot flexibly adjust the test order according to actual operation. They may not pay enough attention to business scenarios with low operation frequency, resulting in low efficiency of manual testing and insufficient attention to low-frequency business scenarios by automated testing programs, leading to problems such as potential issues not being discovered in a timely manner. Summary of the Invention

[0004] This disclosure provides a display interface testing method, apparatus, and electronic device to at least solve the problems of low efficiency in manual testing, fixed automated testing procedures, and inability to adjust the test sequence according to the actual operation frequency in related technologies.

[0005] According to a first aspect of the present disclosure, a method for testing a display interface is provided, comprising: Determine the historical test frequency for each object under test in the target display interface; Based on the historical test frequency, priority indication information is determined for each test object, and the priority indication information is inversely proportional to the historical test frequency. Based on the priority indication information, the target test object is determined from each of the test objects; Based on the target test object and the preset object architecture diagram, the target test path of the target test object is determined. The preset object architecture diagram is a structure diagram with each test object as a node and the relationship between each test object as an edge. The node includes the object identifier of the corresponding test object and the associated object identifier of the associated object associated with the corresponding test object. The target test object is tested based on the target test path.

[0006] According to a second aspect of the present disclosure, a display interface testing apparatus is provided, comprising: The historical test frequency determination module is used to determine the historical test frequency corresponding to each object under test in the target display interface; The priority indication information determination module is used to determine the priority indication information corresponding to each test object based on the historical test frequency, wherein the priority indication information is inversely proportional to the historical test frequency; The target test object determination module is used to determine the target test object from the test objects based on the priority indication information; The target test path determination module is used to determine the target test path of the target test object based on the target test object and the preset object architecture diagram. The preset object architecture diagram is a structure diagram with each test object as a node and the relationship between each test object as an edge. The node includes the object identifier of the corresponding test object and the associated object identifier of the associated object associated with the corresponding test object. The testing module is used to test the target test object based on the target test path.

[0007] According to a third aspect of the present disclosure, an electronic device is provided, comprising: a processor; and a memory for storing processor-executable instructions; wherein the processor is configured to execute the instructions to implement the method as described in any one of the first aspects above.

[0008] According to a fourth aspect of the present disclosure, a computer-readable storage medium is provided such that, when instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to perform the method described in any of the first aspects of the present disclosure. According to a fifth aspect of the present disclosure, a computer program product including instructions is provided that, when run on a computer, causes the computer to perform the method described in any of the first aspects of the present disclosure.

[0009] The technical solutions provided by the embodiments of this disclosure have at least the following beneficial effects: By first determining the historical testing frequency of each test object, and then generating priority indication information based on this, the scientific rigor and accuracy of prioritizing each test object can be effectively improved. Based on this priority indication information, target test objects are then identified from among the test objects, ensuring the accuracy of target test object selection and making it more aligned with actual testing needs. Subsequently, the target test path is precisely located according to the preset object architecture diagram, and testing is finally conducted based on this path. The preset object architecture diagram clearly outlines the relationships between objects, while accurately planning the test path, significantly optimizing the testing process, strengthening testing of low-frequency test objects, enhancing the flexibility, targeting, and efficiency of testing, reducing ineffective testing investment, and improving coverage of complex object-related scenarios while ensuring comprehensive testing, thus helping to discover potential problems more efficiently and accurately.

[0010] It should be understood that the above general description and the following detailed description are exemplary and explanatory only, and are not intended to limit this disclosure. Attached Figure Description

[0011] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this disclosure and, together with the description, serve to explain the principles of this disclosure, and are not intended to unduly limit this disclosure.

[0012] Figure 1 This is a flowchart illustrating a display interface testing method according to an exemplary embodiment; Figure 2 This is a schematic diagram illustrating a process for determining historical test frequency according to an exemplary embodiment; Figure 3 This is a schematic diagram illustrating a process for determining priority indication information corresponding to each object under test, according to an exemplary embodiment. Figure 4 This is a schematic diagram illustrating a process for determining the preset object weights corresponding to each test object according to an exemplary embodiment; Figure 5 This is a schematic diagram illustrating a process for determining the current specific adjustment coefficient corresponding to each test object according to an exemplary embodiment; Figure 6 This is a schematic diagram illustrating a process for determining the current specific adjustment coefficient when the test state deviation data is greater than or equal to a preset deviation threshold, according to an exemplary embodiment. Figure 7 This is a schematic diagram illustrating a process for determining a preset priority threshold according to an exemplary embodiment; Figure 8 This is a schematic diagram illustrating a preset object architecture diagram according to an exemplary embodiment; Figure 9 This is a block diagram of a display interface testing device according to an exemplary embodiment; Figure 10 This is a block diagram illustrating an electronic device for testing a display interface according to an exemplary embodiment. Detailed Implementation

[0013] To enable those skilled in the art to better understand the technical solutions of this disclosure, the technical solutions in the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings.

[0014] It should be noted that the terms "first," "second," etc., used in the specification, claims, and accompanying drawings of this disclosure are used to distinguish similar different contents and are not necessarily used to describe a specific order or sequence. It should be understood that such data can be interchanged where appropriate so that the embodiments of this disclosure described herein can be implemented in orders other than those illustrated or described herein. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with this disclosure. Rather, they are merely examples of apparatuses and methods consistent with some aspects of this disclosure as detailed in the appended claims.

[0015] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for display, data used for analysis, etc.) involved in this disclosure are all information and data authorized by the user or fully authorized by all parties.

[0016] Figure 1 This is a flowchart illustrating a display interface testing method according to an exemplary embodiment, such as... Figure 1 As shown, this display interface testing method is used in electronic devices such as servers and includes the following steps.

[0017] In step S101, the historical test frequency corresponding to each object under test in the target display interface is determined.

[0018] In one specific embodiment, each object under test can be a page or a control. The control is embedded within the page.

[0019] In a specific embodiment, such as Figure 2 As shown, the historical test frequencies corresponding to each test object in the target display interface include: In step S201, the current time and the historical test occurrence time of each historical test of each object under test within the second preset time period are obtained.

[0020] In step S203, based on the preset attenuation intensity coefficient, the current time, and the historical test occurrence time, the target attenuation intensity coefficient corresponding to each historical test of each test object within the second preset time period is determined.

[0021] In a specific embodiment, the aforementioned target attenuation intensity coefficient characterizes the attenuation characteristics of the influence intensity of the historical test on the current historical test by the interval between the occurrence time of the historical test and the current time, reflecting the current value of the historical test event due to time decay.

[0022] In a specific embodiment, determining the target attenuation intensity coefficient for each historical test of each test object within a second preset time period, based on a preset attenuation intensity coefficient, the current time, and the historical test occurrence time, may include: based on the formula Determine the target attenuation intensity coefficient, where, Let λ be the target attenuation intensity coefficient corresponding to the j-th historical test, and λ be the preset attenuation intensity coefficient. For the current time, The time when the historical test occurred corresponds to the j-th historical test.

[0023] In step S205, the historical test frequency is determined based on the target attenuation intensity coefficient.

[0024] In one specific embodiment, determining the historical test frequency based on the target attenuation intensity coefficient may include: based on the formula Determine the historical test frequency, among which, Let J be the target attenuation intensity coefficient corresponding to the j-th historical test. =1 indicates that the object under test i participates in the first... If the test fails, the value is 0; otherwise, it is 0. is the historical test frequency corresponding to the i-th test object.

[0025] For example, the preset attenuation intensity coefficient λ=0.1, and the current time... =January 3, 2025, 10:00 AM. There are currently 3 test subjects: Test Subject 1, Test Subject 2, and Test Subject 3. Test Subject 1 has been tested twice. The first historical test occurred at [time missing]. It was 9:00 AM on January 2nd, the time of the second historical test. It was 14:00 on January 2nd. Subject 2 had one previous test. The time of the previous test was... It was 10:00 AM on January 1st. Subject 3 had three previous tests. The time of the first historical test was... The second historical test occurred at 14:00 on January 1st. It was 15:00 on January 2nd, the time of the third historical test. It was 8:00 AM on January 3rd, arranged in chronological order from oldest to newest. =10:00 AM on January 1st (Subject 2 to be tested). =14:00 on January 1st (Subject 3 to be tested). = 9:00 AM on January 2nd (Test Subject 1). =14:00 on January 2nd (Test Subject 1). =15:00 on January 2nd (Test Subject 3). =8:00 AM on January 3rd (Subject 3). Convert the time difference to hours for calculation. , - =48 hours, γ1=e 0.1×48 =e 4.8 ≈0.0079; for , - =44 hours, γ2=e 0.1×44 =e 4.4 ≈0.0122; for , - =25 hours, γ3=e 0.1×25 =e 2.5 ≈0.0821, for , - =20 hours, γ4=e 0.1×20 =e 2 ≈0.1353, for , - =19 hours, γ5=e 0.1×19 =e 1.9 ≈0.1496, for , - =2 hours, γ6=e 0.1×2 =e 0.2 ≈0.8187.

[0026] but =0.0821+0.1353+0.0079+0.0122+0.1496+0.8187≈1.2058. For test object 1, the historical test frequency is 0.0821+0.1353 / 1.2058≈0.1803; for test object 2, the historical test frequency is 0.0079 / 1.2058≈0.0065; and for test object 3, the historical test frequency is 0.0122+0.1496+0.8187 / 1.2058≈0.8132.

[0027] In the above embodiments, by obtaining the current time and the historical test occurrence time of each historical test of each test object within a second preset time period, the target attenuation intensity coefficient corresponding to each historical test is determined based on the preset attenuation intensity coefficient, the current time, and the historical test occurrence time, thereby determining the historical test frequency. This allows the determination of the historical test frequency to fully consider the timeliness differences of historical tests at different time points, making the impact of recent historical tests more significant and the impact of long-term tests appropriately weakened. It avoids the historical test frequency from being out of touch with actual test requirements due to simple accumulation and statistics, accurately adapts to the test characteristics of the test object in different time periods, and thus improves the timeliness and rationality of the determination of the historical test frequency.

[0028] In step S103, priority indication information corresponding to each test object is determined based on historical test frequencies.

[0029] In one specific embodiment, the priority indication information characterizes the priority of each test object. The priority indication information is inversely proportional to the historical test frequency, that is, the lower the historical test frequency, the higher the priority indication information.

[0030] In a specific embodiment, the above-mentioned determination of the priority indication information corresponding to each test object based on historical test frequency further includes: determining the priority indication information corresponding to each test object based on the formula: priority indication information = preset weight * (1 - historical test frequency).

[0031] In one specific embodiment, the priority indication information determined solely based on historical test frequency directly reflects the indicator that the lower the historical test frequency of the object under test, the higher the corresponding test priority.

[0032] In a specific embodiment, when determining priority indication information, in addition to reflecting the test coverage of the test object based on historical test frequency, the importance of each test object to the business can also be considered. By combining historical test frequency with the importance of each test object to the business, the priority indication information can reflect both the test coverage requirements for low-frequency test objects and the differences in importance at the business level, thus more comprehensively adapting to the comprehensive consideration of test priority in actual scenarios. Figure 3As shown, the priority indication information for each test object determined based on historical test frequency also includes: In step S301, the current specific adjustment coefficient corresponding to each test object is determined.

[0033] In one specific embodiment, the current dedicated adjustment coefficient is used to adjust the importance of the historical test frequency corresponding to each test object for determining the priority indication information and the importance of the preset object weight corresponding to each test object for determining the priority indication information. The preset object weight represents the importance of each test object.

[0034] In a specific embodiment, such as Figure 4 As shown, the preset object weights are updated according to the second preset period, and the preset object weights are determined in the following way: In step S401, when the second update time of the preset object weight is reached, the first historical failure number of each test object in the historical test, the repair time corresponding to each failure, and the critical path coverage of each test object are obtained within the second preset period before the second update time.

[0035] In a specific embodiment, the critical path coverage number is the number of paths traversed by each object under test through a preset critical path, that is, how many preset critical paths traverse each object under test.

[0036] In step S403, based on the first historical number of faults, repair time, the first preset number of people affected by each test object, and the second preset number of people affected by each test object, the fault impact index value corresponding to each test object is determined.

[0037] In one specific embodiment, the fault impact index value characterizes the degree to which a fault occurring in the test object during historical testing affects the testing system. The first preset number of affected users is the number of users affected when each test object fails or malfunctions, and the second preset number of affected users is the number of users affected when all test objects fail or malfunction.

[0038] In a specific embodiment, determining the fault impact index value for each test object based on the first historical fault count, repair time, the first preset number of affected users corresponding to each test object, and the second preset number of affected users corresponding to each test object may include: firstly, summing the first historical fault counts for each test object in historical testing, and using the sum as the total historical fault count within the second preset period before the second update time; secondly, summing the repair time corresponding to each fault for each test object in historical testing, and using the sum as the total repair time within the second preset period before the second update time; and then using the formula: Fault Impact Index Value = + + Determine the fault impact index value corresponding to each object under test.

[0039] In step S405, based on the preset current basic score of each test object under multiple preset dimensions and the preset current dimension weight of each preset dimension, the current dimension importance value of each test object is determined.

[0040] For example, multiple preset dimensions may include at least two dimensions such as business process criticality, user impact scope, economic loss, and compliance and security. The current base score of each test object under each preset dimension can be preset based on the scoring criteria corresponding to that dimension. In practical applications, the scoring criteria corresponding to each preset dimension can be changed, and correspondingly, the current base score of each test object under each preset dimension can be changed accordingly, and the preset current dimension weight corresponding to each preset dimension can also be changed.

[0041] In a specific embodiment, the current dimension importance value reflects the overall importance level of the test object across multiple preset dimensions. For example, the current dimension importance value can be a value in the range of 0-10. Accordingly, determining the current dimension importance value for each test object, based on its respective preset current base score across multiple preset dimensions and its respective preset current dimension weight, can include: based on a formula... Determine the importance value of the current dimension for each object to be tested.

[0042] In step S407, the core characterization data corresponding to each object under test is determined based on the critical path coverage, the preset coverage weight corresponding to the critical path coverage, the preset impact characterization data corresponding to each object under test, the preset impact data weight corresponding to the preset impact characterization data, the preset stability characterization data corresponding to each object under test, and the preset stability weight corresponding to the preset stability characterization data.

[0043] In a specific embodiment, the preset impact characterization data characterizes the degree of impact on the preset business process when each test object fails or malfunctions; the preset stability characterization data measures the vulnerability characteristics of each test object at the level of its own architecture or technical attributes, and is a quantitative indicator of the degree of susceptibility of each test object to damage when facing external influences; the coreness characterization data characterizes the core correlation and stability level of the test object in the test system.

[0044] In a specific embodiment, determining the core characterization data corresponding to each test object based on the critical path coverage, the preset coverage weight corresponding to the critical path coverage, the preset impact characterization data corresponding to each test object, the preset impact data weight corresponding to the preset impact characterization data, the preset stability characterization data corresponding to each test object, and the preset stability weight corresponding to the preset stability characterization data may include: weighting and summing the critical path coverage, the preset impact characterization data, and the preset stability characterization data based on the preset coverage weight, the preset impact data weight, and the preset stability weight to determine the core characterization data corresponding to each test object.

[0045] In step S409, the preset object weight is determined based on the fault impact index value, the preset fault index weight corresponding to the fault impact index value, the current dimension importance value, the preset dimension weight corresponding to the current dimension importance value, the core degree representation data, and the preset core data weight corresponding to the core degree representation data.

[0046] In a specific embodiment, determining the preset object weight based on the fault impact index value, the preset fault index weight corresponding to the fault impact index value, the current dimension importance value, the preset dimension weight corresponding to the current dimension importance value, the core degree representation data, and the preset core data weight corresponding to the core degree representation data may include: performing a weighted summation of the fault impact index value, the current dimension importance value, and the core degree representation data based on the preset fault index weight, the preset dimension weight, and the preset core data weight to determine the preset object weight.

[0047] In the above embodiments, the preset object weights are updated according to a second preset period. When the second update time is reached, the first historical number of failures, the repair time of each failure, and the critical path coverage of each test object within the second preset period are obtained. Combined with the preset number of affected people, the failure impact index value is determined. Based on the preset current basic score of multiple preset dimensions and the corresponding preset current dimension weight, the current dimension importance value is obtained. Then, the critical path coverage, preset impact characterization data, preset stability characterization data and their respective weights are integrated to determine the core characterization data. Finally, the failure impact index value, current dimension importance value, core characterization data and their respective weights are merged to determine the preset object weights. This can comprehensively incorporate the key characteristics of the test object, such as failure impact, multi-dimensional importance, core path correlation, and stability. Through the periodic update mechanism, it adapts to the changes in the state of the test object. By using hierarchical weights to quantify the impact of each dimension on importance, the preset object weights can not only dynamically reflect the actual performance and correlation characteristics of the test object within the second preset period, but also accurately reflect its inherent importance in the overall testing system, thereby improving the timeliness and comprehensiveness of the preset object weight determination.

[0048] In real-world scenarios, the importance of historical test frequency and preset object weights in determining priority indication information is not fixed and may change with adjustments to business objectives, changes in test scenarios, or updates to object attributes. For example, at certain times, more emphasis needs to be placed on completing test coverage (increasing the importance of historical test frequency), while at other times, more emphasis needs to be placed on the business value of core objects (increasing the importance of preset object weights). Therefore, it is necessary to redetermine the current specific adjustment coefficients to ensure that they can continuously and accurately balance the importance of historical test frequency and preset object weights, so that the determination of priority indication information always aligns with the dynamics of the scenario. Therefore, in a specific embodiment, such as... Figure 5 As shown, the current specific adjustment coefficients for each test object are determined as follows: In step S501, the current project progress tag corresponding to each test object is obtained, the number of historical tests of each test object within the first preset time period, the number of second historical failures in the historical tests of each test object within the first preset time period, and the number of historical test paths executed by each test object within the first preset time period.

[0049] In one specific embodiment, the current project progress label identifies the stage status of each object under test within the testing cycle. For example, the current project progress label can be any label such as new feature testing period, fault repair period, and stable operation period.

[0050] In one specific embodiment, the number of historical test paths is the number of test paths that have been executed for each object under test during the historical testing process in the first preset time period.

[0051] In step S503, the historical test failure rate corresponding to each object under test is determined based on the second historical failure count and the historical test count.

[0052] In one specific embodiment, the historical test failure rate is the ratio of the number of defects found during the historical testing of each test object within a first preset time period to the number of historical tests of that test object, which is used to measure the frequency of failures occurring in the historical tests of each test object.

[0053] In a specific embodiment, determining the historical test failure rate of each object under test based on the second historical failure count and the historical test count may include: using the ratio of the second historical failure count to the historical test count as the historical test failure rate of each object under test.

[0054] In step S505, the historical test coverage corresponding to each test object is determined based on the number of historical test paths and the number of preset test paths for each test object.

[0055] In a specific embodiment, the preset number of test paths is the total number of executable test paths for each object under test. The preset number of test paths can be determined based on a preset object architecture diagram. Historical test coverage is the proportion of the number of test paths executed during historical testing of each object under test within a first preset time period to the total number of preset test paths for that object under test, used to measure the completeness and comprehensiveness of test execution for each object under test.

[0056] In a specific embodiment, determining the historical test coverage corresponding to each test object based on the number of historical test paths and the number of preset test paths for each test object may include: using the ratio of the number of historical test paths to the number of preset test paths for each test object as the historical test coverage corresponding to each test object.

[0057] In step S507, based on the current project progress label and the first preset mapping information, the target failure rate weight corresponding to the historical test failure rate and the target coverage weight corresponding to the historical test coverage are determined.

[0058] In a specific embodiment, the first preset mapping information represents the correspondence between different preset project progress labels, the first preset failure rate weight corresponding to the preset test failure rate, and the first preset coverage weight corresponding to the preset test coverage.

[0059] For example, the first preset mapping information can be recorded such that when the current project progress label is the new feature testing period, the first preset failure rate weight can be 0.3 and the first preset coverage weight can be 0.7. When the current project progress label is "fault repair period", the first preset fault rate weight can be 0.9 and the first preset coverage weight can be 0.1; when the current project progress label is "stable operation period", the first preset fault rate weight can be 0.5 and the first preset coverage weight can be 0.5.

[0060] In step S509, the target test status index value corresponding to each test object is determined based on the historical test failure rate, the target failure rate weight, the historical test coverage, and the target coverage weight.

[0061] In a specific embodiment, the target test state index value represents the overall state level of each test object. The target test state index value is inversely proportional to the overall state level. The larger the target test state index value, the worse the overall test state of each test object.

[0062] In a specific embodiment, the above-mentioned determination of the target test status index value corresponding to each test object based on historical test failure rate, target failure rate weight, historical test coverage and target coverage weight may include: determining the target test status index value corresponding to each test object based on the formula: target test status index value = target failure rate weight * historical test failure rate + target coverage weight * (1 - historical test coverage).

[0063] In step S511, based on the preset object weights and target test state index values, the basic specific adjustment coefficients corresponding to each test object are determined.

[0064] In a specific embodiment, determining the basic specific adjustment coefficient corresponding to each test object based on the preset object weights and target test state index values ​​may include: determining the maximum and minimum weights from the preset object weights corresponding to each test object; based on the formula: Standard Weight = Determine the standard weights corresponding to the weights of each preset object; then, based on the formula, establish a specific adjustment coefficient = Determine the basic specific adjustment coefficients for each test object.

[0065] In step S513, the current exclusive adjustment coefficient is determined based on the basic exclusive adjustment coefficient and the second preset mapping information.

[0066] In one specific embodiment, the second preset mapping information represents the correspondence between different basic adjustment coefficient ranges and preset specific adjustment coefficients.

[0067] For example, the above-mentioned second preset mapping information may include: when the basic exclusive adjustment coefficient is in the first preset range, the preset exclusive adjustment coefficient = C1 + K1 * basic exclusive adjustment coefficient; when the basic exclusive adjustment coefficient is in the second preset range, the preset exclusive adjustment coefficient = C2 + K2 * (basic exclusive adjustment coefficient - 0.5). Specifically, the first preset range can be [0, 0.5), the second preset range can be [0.5, 1), C1 is the first preset base, C2 is the second preset base, K1 is the first preset slope, and K2 is the second preset slope.

[0068] Specifically, when the base-specific adjustment coefficient is in the range [0, 0.5), it indicates a weaker need to balance the historical test frequency with the preset object weight (e.g., stable business operations and no significant changes in testing strategies). Therefore, a conservative adjustment strategy with a low base and a gentle slope is used. The first preset base C1 represents the basic adjustment intensity for the "weak adjustment scenario," which needs to ensure a conservative adjustment range and can be located in the range (0, 0.5). The first preset slope K1 represents the amplification rate of the base-specific adjustment coefficient to the preset-specific adjustment coefficient in the "weak adjustment scenario," which needs to be gentle to avoid over-correction and can be located in the range (0, 1).

[0069] When the base-specific adjustment coefficient is in the range [0.5, 1), it indicates a strong need for historical testing frequency and preset object weights (e.g., frequent business iterations, or the need to recalibrate the priority of core objects). Therefore, an aggressive adjustment strategy with a high base and steep slope is used. The second preset base C2 represents the base adjustment intensity for "strong adjustment scenarios," which needs to be higher than C1 for weak scenarios to reflect priority. It can be located in the range (C1, 1), where C2 > C1. The second preset slope K2 represents the amplification rate of the base-specific adjustment coefficient to the preset-specific adjustment coefficient in "strong adjustment scenarios." It needs to be steeper to strengthen the correction. It can be located in the range (K1, 2), where K2 > K1.

[0070] In the above embodiments, by acquiring the current project progress tag, the number of historical tests within the first preset time period, the number of historical failures, and the number of historical test paths for each test object, the historical test failure rate and the historical test coverage based on the number of historical test paths and the preset number of test paths are calculated. Then, based on the current project progress tag and the first preset mapping information recording the weights corresponding to different preset project progress tags, the target failure rate weight and the target coverage weight are determined. Then, by combining the historical test failure rate, historical test coverage, and the above weights, the target test status index value representing the overall status level is obtained. Subsequently, the basic specific adjustment coefficient is determined based on the preset object weight and the target test status index value. Finally, the current specific adjustment coefficient is determined by using the second preset mapping information recording the preset specific adjustment coefficients corresponding to different basic adjustment coefficient intervals. This can comprehensively integrate the test historical performance, project stage characteristics, and its own importance of the test object. The interval mapping mechanism ensures the standardization and adaptability of the conversion from the basic specific adjustment coefficient to the current specific adjustment coefficient, so that the current specific adjustment coefficient reflects both the actual test status and stage requirements of the test object and its inherent importance, thereby improving the comprehensiveness and pertinence of the determination of the current specific adjustment coefficient.

[0071] In practical applications, to maintain the stability and efficiency of the priority indication information determination process, it is not necessary to re-determine the current dedicated adjustment coefficient every time. This avoids rule fluctuations caused by frequent adjustments and ensures that the influence ratio of historical testing frequency and preset object weights remains relatively stable. The current dedicated adjustment coefficient is only determined when the actual test priority determination result deviates significantly from the expected requirements, i.e., when the influence ratio of the two needs to be calibrated to fit the actual scenario. This maintains the consistency of the rules in most cases and allows for adjustments when necessary to ensure that the determination of priority indication information more accurately matches the actual requirements. Therefore, in a specific embodiment, such as... Figure 6 As shown, the above method also includes: In step S601, the historical test status index values ​​of each test object within the first preset time period and the historical object weights of each test object within the first preset time period are obtained.

[0072] In step S603, the basic test status index value corresponding to each test object is determined based on the historical test failure rate, the second preset failure rate weight corresponding to the historical test failure rate, the historical test coverage, and the second preset coverage weight corresponding to the historical test coverage.

[0073] In one specific embodiment, the basic test status index value characterizes the overall basic test status performance of each test object. The basic test status index value is inversely proportional to the overall basic test status performance; the larger the basic test status index value, the worse the overall basic test status performance of each test object.

[0074] In a specific embodiment, the above-mentioned determination of the basic test status index value corresponding to each test object based on the historical test failure rate, the second preset failure rate weight corresponding to the historical test failure rate, the historical test coverage, and the second preset coverage weight corresponding to the historical test coverage may include: determining the basic test status index value corresponding to each test object based on the formula: Basic test status index value = second preset failure rate weight * historical test failure rate + second preset coverage weight * (1 - historical test coverage).

[0075] In step S605, based on the basic test status index value, the preset object weight, the historical object weight, and the historical test status index value, the test status deviation data corresponding to each test object is determined.

[0076] In one specific embodiment, the test state deviation data characterizes the degree of difference between the basic test state index value and the historical test state index value corresponding to each test object.

[0077] In a specific embodiment, determining the test state deviation data corresponding to each test object based on the basic test state index value, preset object weight, historical object weight, and historical test state index value may include: based on the formula: Test state deviation data = - Determine the test state deviation data corresponding to each test object.

[0078] In a specific embodiment, the determination of the current specific adjustment coefficient for each test object includes: In step S607, if the test state deviation data is greater than or equal to the preset deviation threshold, the current exclusive adjustment coefficient is determined.

[0079] In the above embodiments, by obtaining the historical test status index values ​​and historical object weights of each test object within a first preset time period, and combining the historical test defect rate, the corresponding second preset defect rate weight, the historical test coverage, and the corresponding second preset coverage weight, the basic test status index value is calculated. Then, based on the basic test status index value, the preset object weight, the historical object weight, and the historical test status index value, the test status deviation data is determined. When the deviation data is greater than or equal to the preset deviation threshold, the current exclusive adjustment coefficient is determined. This ensures that the determination of the current exclusive adjustment coefficient not only matches the current test defects and coverage performance but also responds to the deviation warnings of historical trends, enhancing its sensitivity and adaptability to changes in test status, avoiding adjustment deviations caused by short-term test status misjudgments, and further improving the accuracy of subsequent priority indication information in dynamically changing scenarios.

[0080] In one specific embodiment, if the test state deviation data is less than a preset deviation threshold, the most recent historical dedicated adjustment coefficient corresponding to each test object is used as the current dedicated adjustment coefficient.

[0081] In step S303, priority indication information is determined based on historical test frequency, current dedicated adjustment coefficient, and preset object weight.

[0082] In a specific embodiment, determining the priority indication information based on historical test frequency, current dedicated adjustment coefficient, and preset object weight may include: determining the priority indication information corresponding to each test object based on the formula: priority indication information = current dedicated adjustment coefficient * (1 - historical test frequency) + (1 - current dedicated adjustment coefficient) * preset object weight.

[0083] In the above embodiments, by first determining the current dedicated adjustment coefficient for each test object, and then determining the priority indication information based on the historical test frequency, the current dedicated adjustment coefficient, and the preset object weight, the current dedicated adjustment coefficient can be used to flexibly balance the impact of historical test conditions and the inherent importance of the object on the priority. This avoids priority deviation caused by relying solely on historical test frequency or preset object weight, so that the priority indication information not only reflects the historical test pattern of the test object, but also conforms to its own importance. By dynamically adjusting the importance ratio, it adapts to the priority evaluation needs in different scenarios, thereby improving the comprehensiveness and flexibility of the priority indication information determination.

[0084] In step S105, the target test object is determined from each test object based on the priority indication information.

[0085] In a specific embodiment, determining the target test object from each test object based on priority indication information includes: Based on priority indication information and preset priority thresholds, the target test object is determined from each object to be tested.

[0086] In a specific embodiment, the above-mentioned determination of the target test object from each test object based on priority indication information and preset priority threshold may include: taking the test object whose priority indication information is greater than the preset priority threshold as the target test object.

[0087] In a specific embodiment, such as Figure 7 As shown, the aforementioned preset priority threshold is updated according to the first preset period, and the preset priority threshold is determined in the following manner: In step S701, when the first update time of the preset priority threshold is reached, the historical priority threshold and the test round number identifier corresponding to the historical priority threshold within the first preset period before the first update time are obtained.

[0088] In one specific embodiment, the test round number identifier is used to identify the test round to which the historical priority threshold belongs.

[0089] In step S703, a preset priority threshold is determined based on the historical priority threshold, the test round number identifier, the preset minimum threshold, and the preset maximum threshold.

[0090] In a specific embodiment, determining the preset priority threshold based on historical priority threshold, test round number identifier, preset minimum threshold, and preset maximum threshold may include: based on the formula: Preset priority threshold = Preset minimum threshold + (Preset maximum threshold - Preset minimum threshold) * (1 - The preset minimum threshold can be 0.5, and the preset maximum threshold can be 0.9.

[0091] In the above embodiments, by determining the target test object from each test object based on priority indication information and a preset priority threshold, and by updating the preset priority threshold according to a first preset period, the selection of the target test object can rely on the test frequency correlation characteristics reflected by the priority indication information, and adapt to the actual changes within the test period through the dynamically updated preset priority threshold. At the same time, the rationality and stability of the preset priority threshold are ensured by the reference and upper and lower limit constraints of historical priority thresholds and test round number identifiers, thereby improving the accuracy of the target test object determination and avoiding the selection deviation caused by the fixed threshold.

[0092] In step S107, the target test path of the target test object is determined based on the target test object and the preset object architecture diagram.

[0093] In a specific embodiment, the preset object architecture diagram is a structure diagram with each object under test as a node and the relationships between the objects under test as edges. Each node includes an object identifier corresponding to the object under test and an associated object identifier of the associated object. Specifically, the associated objects of the object under test include the parent node and child nodes of the object under test. The parent node is the node corresponding to the superior functional unit that directly controls or contains the current object under test, and the child node is the node corresponding to the subordinate functional unit that is directly controlled or triggered by the current object under test.

[0094] In one specific embodiment, the target test path is a complete test path set formed by concatenating the "set of paths from the root node to the intermediate node in the preset object architecture graph" and the "set of paths from the intermediate node to all leaf nodes in the preset object architecture graph" with the corresponding node of the target test object as the intermediate node in the preset object architecture graph. The root node is the unique starting node in the preset object architecture graph and is at the top level, while the leaf nodes are the terminal nodes at the bottom level in the preset object architecture graph.

[0095] Specifically, the target test path can be represented as ,in, This represents the first set of paths from the root node in the preset object architecture diagram to the intermediate node (i.e., the node corresponding to the target test object). This represents the second set of paths from the intermediate node (i.e., the node corresponding to the target test object) to all leaf nodes in the preset object architecture diagram. This represents a path concatenation operation, which involves selecting a path from A and a path from B, and concatenating them into a new path from the root node to a leaf node.

[0096] In a specific embodiment, such as Figure 8 As shown, the preset object architecture diagram includes nodes A, B, C, D, E, F, G, H, I, J, and X. X is the target test object (i.e., an intermediate node), the root node is A, and all leaf nodes are E, J, I, and G. The parent nodes of X include B, C, and D, and the child nodes of X include E, F, and G. The first path set of X is {ABX, ACX, ADX}, the second path set of X is {XE, XFHJ, XFI, XG}, and the target test path of X is T={ABXE, ABXFHJ, ABXFI, ABXG, ACXE, ACXFHJ, ACXFI, ACXG, ADXE, ADXFHJ, ADXFI, ADXG}.

[0097] In a specific embodiment, determining the target test path of the target test object based on the target test object and the preset object architecture diagram may include: taking the node corresponding to the target test object as an intermediate node, using a depth-first search algorithm to traverse the preset object architecture diagram, first traversing backward from the intermediate node to obtain all paths from the root node to the intermediate node in the preset object architecture diagram, forming a first path set; then traversing forward from the intermediate node to all leaf nodes in the preset object architecture diagram, obtaining all paths from the intermediate node to the leaf nodes, forming a second path set; finally, performing a path concatenation operation on each path in the first path set and each path in the second path set to generate a complete path extending from the root node through the intermediate node to the leaf node, and all such paths together constitute the target test path of the target test object.

[0098] In step S109, the target test object is tested based on the target test path.

[0099] Figure 9 This is a block diagram illustrating a display interface testing apparatus according to an exemplary embodiment. (Refer to...) Figure 9 The device includes: The historical test frequency determination module 910 is used to determine the historical test frequency corresponding to each object under test in the target display interface. The priority indication information determination module 920 is used to determine the priority indication information corresponding to each test object based on the historical test frequency. The priority indication information is inversely proportional to the historical test frequency. The target test object determination module 930 is used to determine the target test object from each test object based on priority indication information; The target test path determination module 940 is used to determine the target test path of the target test object based on the target test object and the preset object architecture diagram. The preset object architecture diagram is a structure diagram with each test object as a node and the relationship between each test object as an edge. The node includes the object identifier of the corresponding test object and the associated object identifier of the associated object associated with the corresponding test object. Test module 950 is used to test the target test object based on the target test path.

[0100] In an optional embodiment, the target test object determination module 930 includes: The target test object determination unit is used to determine the target test object from each test object based on priority indication information and preset priority threshold.

[0101] In an optional embodiment, the aforementioned preset priority threshold is updated according to a first preset period, and the preset priority threshold is determined by the following module: The first historical data acquisition module is used to acquire the historical priority threshold and the test round number identifier corresponding to the historical priority threshold within the first preset period before the first update time when the first update time is reached. The preset priority threshold determination module is used to determine the preset priority threshold based on the historical priority threshold, the test round number identifier, the preset minimum threshold, and the preset maximum threshold.

[0102] In an optional embodiment, the priority indication information determination module 920 includes: The current dedicated adjustment coefficient determination unit is used to determine the current dedicated adjustment coefficient corresponding to each test object. The current dedicated adjustment coefficient is used to adjust the importance of the historical test frequency corresponding to each test object to the determination of priority indication information and the importance of the preset object weight corresponding to each test object to the determination of priority indication information. The preset object weight represents the importance of each test object. The priority indication information determination unit is used to determine priority indication information based on historical test frequency, current dedicated adjustment coefficient and preset object weight.

[0103] In an optional embodiment, the preset object weights are updated according to a second preset period, and the preset object weights are determined using the following module: The second historical data acquisition module is used to acquire, within the second preset period before the second update time, the first historical failure number of each test object in the historical test, the repair time corresponding to each failure, and the critical path coverage number of each test object in the historical test within the second preset period before the second update time. The critical path coverage number is the number of paths traversed by each test object by the preset critical path. The fault impact index value determination module is used to determine the fault impact index value for each test object based on the first historical fault count, repair time, the first preset number of affected people for each test object and the second preset number of affected people for each test object. The current dimension importance value determination module is used to determine the current dimension importance value of each test object based on the preset current base score and the preset current dimension weight of each preset dimension for each test object under multiple preset dimensions. The core characterization data determination module is used to determine the core characterization data corresponding to each test object based on the critical path coverage, the preset coverage weight corresponding to the critical path coverage, the preset impact characterization data corresponding to each test object, the preset impact data weight corresponding to the preset impact characterization data, the preset stability characterization data corresponding to each test object, and the preset stability weight corresponding to the preset stability characterization data. The preset object weight determination module is used to determine the preset object weight based on the fault impact index value, the preset fault index weight corresponding to the fault impact index value, the current dimension importance value, the preset dimension weight corresponding to the current dimension importance value, the core degree representation data, and the preset core data weight corresponding to the core degree representation data.

[0104] In an optional embodiment, the aforementioned current dedicated adjustment coefficient determination unit includes: The historical data acquisition subunit is used to acquire the current project progress tag corresponding to each test object, the number of historical tests of each test object within the first preset time period, the number of second historical failures in the historical tests of each test object within the first preset time period, and the number of historical test paths executed by each test object within the first preset time period. The number of historical test paths is the number of test paths executed for each test object during the historical testing process within the first preset time period. The historical test failure rate determination subunit is used to determine the historical test failure rate of each object under test based on the second historical failure count and the historical test count. The historical test coverage determination subunit is used to determine the historical test coverage corresponding to each test object based on the number of historical test paths and the number of preset test paths for each test object. The weight determination subunit is used to determine the target failure rate weight corresponding to the historical test failure rate and the target coverage weight corresponding to the historical test coverage based on the current project progress label and the first preset mapping information. The first preset mapping information represents the correspondence between different preset project progress labels, the first preset failure rate weight corresponding to the preset test failure rate and the first preset coverage weight corresponding to the preset test coverage. The target test status index value determination subunit is used to determine the target test status index value corresponding to each test object based on the historical test failure rate, target failure rate weight, historical test coverage and target coverage weight. The target test status index value represents the comprehensive status level of each test object. The basic-specific adjustment coefficient determination subunit is used to determine the basic-specific adjustment coefficient corresponding to each test object based on the preset object weight and the target test status index value. The first adjustment coefficient determination subunit is used to determine the current specific adjustment coefficient based on the basic specific adjustment coefficient and the second preset mapping information. The second preset mapping information represents the correspondence between different basic adjustment coefficient ranges and preset specific adjustment coefficients.

[0105] In an optional embodiment, the above-described apparatus further includes: The third historical data acquisition module is used to acquire the historical test status index values ​​of each test object within the first preset time period and the historical object weights of each test object within the first preset time period. The basic test status index value determination module is used to determine the basic test status index value corresponding to each test object based on the historical test failure rate, the second preset failure rate weight corresponding to the historical test failure rate, the historical test coverage, and the second preset coverage weight corresponding to the historical test coverage. The test state deviation data determination module is used to determine the test state deviation data corresponding to each test object based on the basic test state index value, preset object weight, historical object weight and historical test state index value. The test state deviation data characterizes the degree of difference between the basic test state index value and the historical test state index value corresponding to each test object. The aforementioned current dedicated adjustment coefficient determination unit includes: The second adjustment coefficient determination subunit is used to determine the current dedicated adjustment coefficient when the test state deviation data is greater than or equal to the preset deviation threshold.

[0106] In an optional embodiment, the historical test frequency determination module 910 includes: The historical test occurrence time acquisition unit is used to acquire the current time and the historical test occurrence time of each historical test of each test object within a second preset time period. The target attenuation intensity coefficient determination unit is used to determine the target attenuation intensity coefficient corresponding to each historical test of each test object within a second preset time period, based on the preset attenuation intensity coefficient, the current time, and the historical test occurrence time. The historical test frequency determination unit is used to determine the historical test frequency based on the target attenuation intensity coefficient.

[0107] Regarding the apparatus in the above embodiments, the specific manner in which each module performs its operation has been described in detail in the embodiments related to the method, and will not be elaborated upon here.

[0108] Figure 10 This is a block diagram illustrating an electronic device for testing a display interface according to an exemplary embodiment. The electronic device may be a server, and its internal structure diagram may be as follows: Figure 10As shown, the electronic device includes a processor, memory, network interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage medium. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a display interface testing method. The display screen can be a liquid crystal display (LCD) or an e-ink display. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad mounted on the device's casing, or an external keyboard, touchpad, or mouse.

[0109] Those skilled in the art will understand that Figure 10 The structure shown is merely a block diagram of a portion of the structure related to the present disclosure and does not constitute a limitation on the electronic device to which the present disclosure is applied. A specific electronic device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements. In an exemplary embodiment, an electronic device is also provided, including: a processor; and a memory for storing processor-executable instructions; wherein the processor is configured to execute the instructions to implement the display interface testing method as described in the embodiments of this disclosure.

[0110] In an exemplary embodiment, a computer-readable storage medium is also provided, wherein when the instructions in the storage medium are executed by a processor of an electronic device, the electronic device is enabled to perform the display interface testing method of the present disclosure embodiments.

[0111] In an exemplary embodiment, a computer program product containing instructions is also provided, which, when run on a computer, causes the computer to perform the display interface testing method of the present disclosure embodiments.

[0112] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. This computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0113] Other embodiments of this disclosure will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art not disclosed herein. The specification and examples are to be considered exemplary only, and the true scope and spirit of this disclosure are indicated by the following claims.

[0114] It should be understood that this disclosure is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this disclosure is limited only by the appended claims.

Claims

1. A method for testing a display interface, characterized in that, The method includes: Determine the historical test frequency for each object under test in the target display interface; Based on the historical test frequency, priority indication information is determined for each test object, and the priority indication information is inversely proportional to the historical test frequency. Based on the priority indication information, the target test object is determined from each of the test objects; Based on the target test object and the preset object architecture diagram, the target test path of the target test object is determined. The preset object architecture diagram is a structure diagram with each test object as a node and the relationship between each test object as an edge. The node includes the object identifier of the corresponding test object and the associated object identifier of the associated object associated with the corresponding test object. The target test object is tested based on the target test path.

2. The method according to claim 1, characterized in that, The step of determining the target test object from each of the test objects based on the priority indication information includes: Based on the priority indication information and the preset priority threshold, the target test object is determined from the test objects.

3. The method according to claim 2, characterized in that, The preset priority threshold is updated according to a first preset period, and the preset priority threshold is determined in the following manner: In the case of reaching the first update time of the preset priority threshold, obtain the historical priority threshold within the first preset period before the first update time and the test round number identifier corresponding to the historical priority threshold. The preset priority threshold is determined based on the historical priority threshold, the test round number identifier, the preset minimum threshold, and the preset maximum threshold.

4. The method according to claim 1, characterized in that, The priority indication information for each test object determined based on the historical test frequency includes: Determine the current dedicated adjustment coefficient corresponding to each test object. The current dedicated adjustment coefficient is used to adjust the importance of the historical test frequency corresponding to each test object in determining the priority indication information and the importance of the preset object weight corresponding to each test object in determining the priority indication information. The preset object weight represents the importance of each test object. The priority indication information is determined based on the historical test frequency, the current dedicated adjustment coefficient, and the preset object weight.

5. The method according to claim 4, characterized in that, The preset object weights are updated according to a second preset period, and the preset object weights are determined in the following manner: When the second update time of the preset object weight is reached, the first historical failure number of each test object in the historical test, the repair time corresponding to each failure, and the critical path coverage number of each test object are obtained in the second preset period before the second update time. The critical path coverage number is the number of paths traversed by the preset critical path for each test object. Based on the first historical number of faults, the repair time, the first preset number of people affected by each test object and the second preset number of people affected by each test object, the fault impact index value corresponding to each test object is determined. Based on the preset current base score of each test object under multiple preset dimensions and the preset current dimension weight of each of the multiple preset dimensions, the current dimension importance value of each test object is determined. Based on the critical path coverage, the preset coverage weight corresponding to the critical path coverage, the preset impact characterization data corresponding to each test object, the preset impact data weight corresponding to the preset impact characterization data, the preset stability characterization data corresponding to each test object, and the preset stability weight corresponding to the preset stability characterization data, the core characterization data corresponding to each test object is determined. The preset object weight is determined based on the fault impact index value, the preset fault index weight corresponding to the fault impact index value, the current dimension importance value, the preset dimension weight corresponding to the current dimension importance value, the core degree representation data, and the preset core data weight corresponding to the core degree representation data.

6. The method according to claim 4, characterized in that, Determining the current specific adjustment coefficient for each test object includes: The current project progress tag corresponding to each test object is obtained, the number of historical tests of each test object within a first preset time period, the number of second historical failures of each test object in historical tests within the first preset time period, and the number of historical test paths executed by each test object within the first preset time period. The number of historical test paths is the number of test paths executed for each test object during the historical testing process within the first preset time period. Based on the second historical failure count and the historical test count, the historical test failure rate corresponding to each object under test is determined; Based on the number of historical test paths and the number of preset test paths for each test object, the historical test coverage corresponding to each test object is determined. Based on the current project progress label and the first preset mapping information, the target failure rate weight corresponding to the historical test failure rate and the target coverage weight corresponding to the historical test coverage are determined. The first preset mapping information represents the correspondence between different preset project progress labels, the first preset failure rate weight corresponding to the preset test failure rate and the first preset coverage weight corresponding to the preset test coverage. Based on the historical test failure rate, the target failure rate weight, the historical test coverage, and the target coverage weight, the target test status index value corresponding to each test object is determined, and the target test status index value characterizes the comprehensive status level of each test object. Based on the preset object weights and the target test state index values, the basic specific adjustment coefficients corresponding to each test object are determined; Based on the basic dedicated adjustment coefficient and the second preset mapping information, the current dedicated adjustment coefficient is determined. The second preset mapping information represents the correspondence between different basic adjustment coefficient ranges and preset dedicated adjustment coefficients.

7. The method according to claim 6, characterized in that, The method further includes: Obtain the historical test status index values ​​of each test object within the first preset time period and the historical object weights of each test object within the first preset time period; Based on the historical test failure rate, the second preset failure rate weight corresponding to the historical test failure rate, the historical test coverage and the second preset coverage weight corresponding to the historical test coverage, the basic test status index value corresponding to each test object is determined. Based on the basic test status index value, the preset object weight, the historical object weight, and the historical test status index value, the test status deviation data corresponding to each test object is determined. The test status deviation data characterizes the degree of difference between the basic test status index value and the historical test status index value corresponding to each test object. Determining the current specific adjustment coefficient for each test object includes: If the test state deviation data is greater than or equal to a preset deviation threshold, the current dedicated adjustment coefficient is determined.

8. The method according to claim 1, characterized in that, The historical test frequencies corresponding to each object under test in the target display interface include: Obtain the current time and the historical test occurrence time of each historical test for each of the objects under test within the second preset time period; Based on the preset attenuation intensity coefficient, the current time, and the historical test occurrence time, the target attenuation intensity coefficient corresponding to each historical test of each test object within the second preset time period is determined. The historical test frequency is determined based on the target attenuation intensity coefficient.

9. A display interface testing device, characterized in that, include: The historical test frequency determination module is used to determine the historical test frequency corresponding to each object under test in the target display interface; The priority indication information determination module is used to determine the priority indication information corresponding to each test object based on the historical test frequency, wherein the priority indication information is inversely proportional to the historical test frequency; The target test object determination module is used to determine the target test object from the test objects based on the priority indication information; The target test path determination module is used to determine the target test path of the target test object based on the target test object and the preset object architecture diagram. The preset object architecture diagram is a structure diagram with each test object as a node and the relationship between each test object as an edge. The node includes the object identifier of the corresponding test object and the associated object identifier of the associated object associated with the corresponding test object. The testing module is used to test the target test object based on the target test path.

10. An electronic device, characterized in that, include: processor; Memory used to store the processor's executable instructions; The processor is configured to execute the instructions to implement the display interface testing method as described in any one of claims 1 to 8.

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