Detection probe and detection device
By designing a detection probe structure that is easy to lock and separate, the problems of increased contact resistance and difficulty in replacing damaged probes in high current detection are solved, achieving stable contact and convenient replacement.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- LEENO IND INC
- Filing Date
- 2024-11-20
- Publication Date
- 2026-06-19
AI Technical Summary
In existing detection devices, the contact resistance of the detection probe increases during high-current detection, and it is difficult to replace after damage.
A detection probe was designed, including a pin unit and a terminal unit. The design of the longitudinally extending engagement portion and engagement receiving portion enables easy locking and separation, reduces contact resistance, and facilitates replacement.
It achieves stable contact characteristics under high current detection and allows for easy replacement of the detection probe in case of damage, thus reducing contact resistance.
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Figure CN122249728A_ABST
Abstract
Description
Technical Field
[0001] The invention discloses a detection probe and detection device for high-current detection of the electrical characteristics of an object under test (e.g., a secondary battery). Background Technology
[0002] During manufacturing, secondary batteries undergo charge / discharge testing or electrical characteristic testing based on the contact between their electrode terminals and the detection probes of a testing device. The testing device includes a spring-loaded pin with a tip on one side that contacts the secondary battery's electrode terminals, a receiving tube with one side for housing the spring-loaded pin and the other side for soldering signal lines to printed circuit board (PCB) terminals, and a support block supporting the receiving tube. The spring-loaded pin includes a cylindrical body, a spring inserted into the cylindrical body, and a terminal partially inserted into a first end of the cylindrical body and capable of sliding.
[0003] During testing, the terminal slides inward into the barrel when it contacts the secondary battery electrode terminals. In this situation, current flows from the secondary battery through the terminal, the barrel (i.e., the spring), the receiving tube, and the signal line to the PCB terminal. For the terminal to slide within the barrel, an appropriate gap is required between the outer surface of the terminal and the inner surface of the barrel. This gap is unsuitable for high currents, as it can lead to unstable contact and increased contact resistance.
[0004] To address the issue of increased contact resistance between the terminals and the casing, a testing device using integrated detection probes has been revealed. The integrated detection probe is shaped like a rod, with a tip on one side for contacting the secondary battery and a signal line on the other side for soldering to the PCB terminal. The integrated detection probe is supported on a support block and allows for flexible up-and-down movement. Therefore, the integrated detection probe is suitable for high current applications because the current flows directly from the tip to the signal line. However, when some of the multiple detection probes supported on the support block in the testing device fail when their tips contact the electrode terminals, selectively replacing only the damaged probes from the support block is not straightforward. Summary of the Invention
[0005] Technical issues
[0006] This invention provides an easily replaceable high-current detection probe and detection device.
[0007] Solution to the problem
[0008] According to one disclosed embodiment, a detection probe is provided. The detection probe includes a pin unit and a terminal unit longitudinally connected to the pin unit. One of the pin unit and the terminal unit includes a longitudinally extending extended engagement portion including a plurality of longitudinally formed cut portions that are resiliently deformable in the radial direction, and a radially recessed locking portion. The other of the pin unit and the terminal unit includes an engagement receiving portion including an engagement portion that engages with the locking portion to prevent longitudinal separation of the extended engagement portion, and longitudinally receives the extended engagement portion.
[0009] The joining portion may include an end with a decreasing diameter toward the central axis in the length direction. Therefore, a joining receiving portion that engages with the locking portion of the extended joining portion is easily formed, thereby enabling separation and improving contact characteristics.
[0010] The joining portion may include a hemispherical protrusion formed by a recess, the hemispherical protrusion protruding into the interior of the joining receiving portion. Therefore, a joining portion that engages easily with the locking portion of the extended joining portion is formed.
[0011] The joining portion may include a protruding portion formed by roll forming, which protrudes inward along the circumference of the joining receiving portion. Therefore, it is easy to form a joining portion that engages with the locking portion of the extended joining portion.
[0012] The extended engagement portion may include multiple extended engagement rods that are longitudinally separated by a cut portion. Therefore, it is easy to form an extended engagement portion that is elastically deformable to engage with the engagement portion of the engagement receiving portion, thereby enabling separation and improving contact characteristics.
[0013] According to one disclosed embodiment, a detection device for detecting the electrical characteristics of an object under test is provided. The detection device includes: the aforementioned detection probe; a probe support block that accommodates and supports the detection probe, allowing the detection probe to move elastically and extensibly in the accommodating direction; and a detection circuit board disposed below the probe support block and transmitting signals to the detection probe.
[0014] Advantages of the invention
[0015] According to one embodiment of the present disclosure, the detection probe exhibits excellent impedance characteristics and is easy to replace when damaged because the pin unit with the tip and the terminal unit connected to the signal line are separable but firmly and tightly coupled. Attached Figure Description
[0016] Figure 1 This is a view showing the detection apparatus according to the disclosed first embodiment.
[0017] Figure 2This is a view showing the operating state of the detection device according to the disclosed first embodiment.
[0018] Figure 3 It is a display Figure 1 A three-dimensional view of the detection probe.
[0019] Figure 4 yes Figure 2 The cross-sectional view of the detection probe is shown.
[0020] Figure 5 yes Figure 4 A perspective view of the extended joint portion and the joint receiving portion.
[0021] Figure 6 It is a display Figure 3 An exploded view of the detection probe.
[0022] Figure 7 This is a view showing the detection probe according to the disclosed second embodiment.
[0023] Figure 8 This is a view showing the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed third embodiment.
[0024] Figure 9 This is a view showing the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed fourth embodiment.
[0025] Figure 10 This is a view showing the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed fifth embodiment.
[0026] Figure 11 This is an exploded perspective view of the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed sixth embodiment.
[0027] Figure 12 It is a display Figure 11 The cross-sectional view of the assembled state of the extended joint portion and the joint receiving portion of the detection probe shown.
[0028] Figure 13 This is a view showing the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed seventh embodiment.
[0029] Figure 14 This is a view showing the extended engagement portion and engagement receiving portion of the detection probe according to the disclosed eighth embodiment. Detailed Implementation
[0030] Hereinafter, the detection apparatus 1 according to the disclosed first embodiment will be described in detail with reference to the accompanying drawings.
[0031] Figure 1 This is a view showing the detection device 1 according to the disclosed first embodiment. Figure 2 This is a view showing the operating state of the detection device 1 according to the disclosed first embodiment. Figure 3 It is a display Figure 1 A three-dimensional view of the detection probe 4. Figure 4 yes Figure 2 The cross-sectional view of the detection probe 4 shown. Figure 5 yes Figure 4 A perspective view of the extended joint portion 422 and the joint receiving portion 431. Figure 6 yes Figure 3 An exploded view of the detection probe.
[0032] Reference Figures 1 to 6 The detection device 1 includes a probe support block 2, a detection circuit board 3, and a plurality of detection probes 4 housed and supported in the probe support block 2.
[0033] The probe support block 2 refers to a block shaped like a plate and includes a plurality of first probe holes 21, which are formed through the thickness direction of the probe support block 2 to accommodate and support a plurality of detection probes 4.
[0034] The testing circuit board 3 includes a plurality of second probe holes 31, which are disposed at multiple positions corresponding to the first probe holes 21 and are formed through the testing circuit board 3 in the thickness direction to accommodate and support a plurality of testing probes 4. It also includes pattern lines 32 printed on one surface (i.e., the bottom surface), pad terminals 33 disposed in the pattern lines 32, and flexible signal connection lines 34 connecting the pad terminals 33 and the testing probes 4 and transmitting signals. The testing circuit board 3 can be supported parallel to the probe support block 2 below the probe support block 2 via a connector 35.
[0035] The detection probe 4 is made of conductive material. The detection probe 4 includes a pin unit 41, a terminal unit 42, a connection unit 43, a receiving tube 44, a spring retainer 45, and a spring 46.
[0036] The pin unit 41 includes a pin body 411 shaped like a rod, a pin head 412 disposed at a first end of the pin body 411, and a first coupling end 413 disposed at a second end of the pin body 411 for coupling with the connecting unit 43.
[0037] The pin tip 412 includes at least one tip for contacting the detection terminal 51 of the object to be tested 5, such as a secondary battery.
[0038] The first coupling end 413 is accommodated in the connecting unit 43 and includes a first recessed portion 414 that is recessed in the circumferential direction. The first recessed portion 414 engages with a first protruding portion 435 of the connecting unit 43 (described later).
[0039] Terminal unit 42 is made of conductive material. Terminal unit 42 includes a terminal body 421 shaped like a rod, an extended engagement portion 422 disposed at a first end of the terminal body 421, and a signal line connection terminal 424 disposed at a second end of the terminal body 421.
[0040] Terminal body 421 is slidably inserted into receiving tube 44. Terminal body 421 includes a second recessed portion 425 recessed circumferentially for engaging with a second protruding portion 441 protruding from the inside of receiving tube. The second recessed portion 425 is formed along the longitudinal direction of terminal body 421 and has a predetermined length. The slidable range of terminal body 421 varies according to the length of the second recessed portion 425.
[0041] The extended engagement portion 422 includes a tapered end 422E for easy insertion into the engagement receiving portion 431 of the connecting unit 43, and a locking portion 423 that engages with the engagement portion 434 of the connecting unit 43. The locking portion 423 is recessed circumferentially along the extended engagement portion 422.
[0042] The signal line connection terminal 424 is connected to the second side of the signal connection line 34 by soldering. The first side of the signal connection line 34 is connected to the pad terminal 33 of the detection circuit board 3, but is not limited to soldering.
[0043] The connecting unit 43 is tube-shaped and has a first side coupled to a first coupling end 413 of the pin unit 41, and a second side detachably fixed to an extended engagement portion 422 of the terminal unit 42. The connecting unit 43 includes an engagement receiving portion 431 for receiving the extended engagement portion 422 of the terminal unit 42, and a first protrusion 435 for engaging with a first recess 414 provided in the first coupling end 413 of the pin unit 41.
[0044] like Figure 5 As shown, the engagement receiving portion 431 includes four longitudinally cut slits 432, a skirt 433 formed by the four slits 432, and an engagement portion 434 located at the end of the skirt 433 and decreasing in diameter longitudinally. The opening of the engagement portion 434 through which the extended engagement portion 422 of the terminal unit 42 passes is equal to or smaller than the outer diameter of the locking portion 423 of the terminal unit 42. Therefore, the engagement portion 434 remains in continuous contact with the locking portion 423 of the terminal unit 42, thereby reducing contact resistance.
[0045] Furthermore, when the detection probe 4 is defective, the pin unit 41 can be pulled away from the terminal unit 42, allowing the skirt 433 to elastically deform outward in the radial direction, thereby separating the engaging portion 434 of the connecting unit 43 and the locking portion 423 of the terminal unit 42 from each other. The number of cracks 432 and skirts 433 is not limited to four.
[0046] The receiving tube 44 is fixedly inserted into the first probe hole 21 of the probe support block 2 and / or the second probe hole 31 of the detection circuit board 3. The pin unit 41 has a first side coupled with the connecting unit 43, and the pin unit 41 and the terminal unit 42 are inserted into both ends of the receiving tube 44. In addition, the engaging portion 434 provided in the engaging receiving portion 431 of the connecting unit 43 and the locking portion 423 of the extended engaging portion 422 of the terminal unit 42 engage with each other inside the receiving tube 44.
[0047] The receiving tube 44 includes a second protrusion 441 that protrudes inwardly in the circumferential direction by indentation or rolling. The second protrusion 441 is slidably engaged with the second recess 425 of the terminal unit 42 in the longitudinal direction within a predetermined range.
[0048] The spring retainer 45 includes a tubular retainer body 451 and an expansion flange 452 that expands radially from a first end of the retainer body 451. The retainer body 451 is inserted into the first end of the receiving tube 44, which is inserted into and fixed to the first probe hole 21 of the probe support block 2. The expansion flange 452 has a first side that contacts the first end of the receiving tube 44 and a second side that contacts the first side of the spring 46. The pin body 411 of the pin unit 41 is inserted into the retainer body 451.
[0049] Alternatively, the spring retainer 45 can be omitted. In this case, the spring 46 may be supported on an expansion flange provided in the first end of the contact receiving tube 44.
[0050] Spring 46 is inserted into the pin body 411 and positioned between the pin head 412 and the expansion flange 452 of the spring retainer 45. During testing, when the test object 5 is pressed against the tip, spring 46 is compressed, and when the pressure is released, spring 46 returns to its original position.
[0051] The following describes the operation of probe 4.
[0052] like Figure 2 As shown, when the detection terminal 51 of the object under test 5 is pressed down to perform detection when it contacts the tip provided in the pin head 412 of the pin unit 41, the spring 46 is compressed, and the pin unit 41 and the terminal unit 42 connected by the connecting unit 43 slide downward within the receiving tube 44.
[0053] Then, when the pin head 412 of the pin unit 41 is released from pressure, the spring 46 returns to its original state, and the coupled pin unit 41 and terminal unit 42 slide upward within the receiving tube 44.
[0054] When a specific detection probe is damaged during detection, the engagement portion 434 of the engagement receiving portion 431 and the locking portion 423 of the extension portion 422 are separated from each other by pulling the pin unit 41 upward, so that the skirt 433 of the engagement receiving portion 431 can deform outward in the radial direction. Then, a new pin unit is inserted into the receiving tube 44, so that the engagement receiving portion of the pin unit can be fixed to the extended engagement portion 422 of the terminal unit 42.
[0055] The following will refer to Figure 6 Describe the assembly method of detection probe 4.
[0056] 1) Insert the spring 46 and the spring retainer 45 into the pin body 411 of the pin unit 41 in sequence, and then place the first side of the connecting unit 43 on the first coupling end 413 and fix it.
[0057] 2) The connecting unit 43 of the pin body 411 coupled to the pin unit 41 is inserted through the first side of the receiving tube 44. In this case, a portion of the pin body 411 and the retainer body 451 of the spring retainer 45 are inserted into the receiving tube 44.
[0058] 3) Insert the extended engagement portion 422 of the terminal unit 42 through the second side of the receiving tube 44. In this case, the extended engagement portion 422 is inserted into the engagement receiving portion 431 of the connecting unit 43, so that the locking portion 423 and the engagement portion 434 can be fixed to each other.
[0059] Figure 7 This is a view showing the detection probe 6 according to the second embodiment of this disclosure.
[0060] Reference Figure 7 The detection probe 6 includes a pin unit 61, a terminal unit 62, a receiving tube 64, and a spring 66. The description of the terminal unit 62, the receiving tube 64, and the spring 66 will be omitted below, as they are related to... Figure 4 The terminal unit 42, receiving tube 64 and spring 46 shown are similar.
[0061] The pin unit 61 includes a tube body 611 and a pin head 612.
[0062] The tube body 611 is tubular and includes a receiving portion 611b on its first side.
[0063] as Figure 5The shown engagement receiving portion 431, engagement receiving portion 611b includes four longitudinally cut slits, four skirts 611c formed by the four slits, and engagement portions 611d provided at the end of each skirt 611c, decreasing in diameter longitudinally. The opening formed by the four engagement portions 611d and allowing the extended engagement portion 622 of the terminal unit 62 to pass through may have a diameter equal to or smaller than the outer diameter of the locking portion 623 of the terminal unit 62.
[0064] The pin head 612 includes a head 612a and a third coupling end 612b extending toward the opposite side of the head 612a.
[0065] The head 612a includes at least one tip for contacting the detection terminal 51 of the object to be tested 5 (e.g., a secondary battery).
[0066] The third coupling end 612b can be inserted into and secured, for example, by forced fit into the end of the tube body 611, or by inward deformation of the tube body 611 (by rolling or indentation). The third coupling end 612b may be formed extending into the vicinity of the engagement receiving portion 611b.
[0067] Figure 8 This is a view showing the extended engagement portion 713 and the engagement receiving portion 721 of the detection probe 7 according to the third embodiment of this disclosure.
[0068] Reference Figure 8 The detection probe 7 includes an extended engagement portion 713 provided in the pin unit 71 and an engagement receiving portion 721 provided in the terminal unit 72.
[0069] The extended engagement portion 713 includes a locking portion 714 that engages with the engagement portion 724 of the engagement receiving portion 721. The locking portion 714 is recessed circumferentially along the extended engagement portion 713.
[0070] The engagement receiving portion 721 is cylindrical in shape and houses the extended engagement portion 713 therein. The engagement receiving portion 721 includes four skirts 723, for example formed by four longitudinally cut slits 722, and four engagement portions 724 whose diameter decreases along the ends of the skirts 723.
[0071] Alternatively, the terminal unit can be rod-shaped, such as... Figure 5 The connecting unit shown can be coupled to the terminal unit, and the engagement receiving portion can be disposed in the connecting unit.
[0072] Alternatively, the terminal unit may include a tubular body, and a receiving portion may be formed at a first end of the tubular body.
[0073] Figure 9This is a view showing the extended engagement portion 822 and the engagement receiving portion 831 of the detection probe 8 according to the fourth embodiment of this disclosure.
[0074] Reference Figure 9 The detection probe 8 includes an extended engagement portion 822 provided in the terminal unit 82 and an engagement receiving portion 831 provided in the connecting unit 83. The connecting unit 83 is cylindrical in shape, with a first side coupled to a first end of the pin unit 81. The pin unit 81 and the connecting unit 83 are coupled based on the engagement between a first recessed portion 814 of the pin unit 81 and a first protruding portion 835 of the connecting unit 83.
[0075] The extended engagement portion 822 includes a locking portion 823 that engages with the engagement portion 834 of the engagement receiving portion 831. The locking portion 823 is recessed circumferentially along the extended engagement portion 822.
[0076] The joining receiving portion 831 is cylindrical in shape and houses the extended joining portion 822 therein. The joining receiving portion 831 includes four skirts 833, for example formed by four longitudinally cut slits 832, and four joining portions 834 that project radially inward along the circumference of the skirts 833. The joining portions 834 are formed by roll forming.
[0077] Figure 10 This is a view showing the extended engagement portion 922 and the engagement receiving portion 931 of the detection probe 9 according to the fifth embodiment of this disclosure. The extended engagement portion 922 and the engagement receiving portion 931 of the detection probe 9 are... Figure 9 The description of similar portions between the extended engagement portion 822 and the engagement receiving portion 831 of the detection probe 8 shown will be omitted to avoid repetition.
[0078] Reference Figure 10 The joining receiving portion 931 includes four skirts 933, for example formed by four longitudinally cut slits 932, and four joining portions 934 projecting radially inward from the skirts 933. The joining portions 934 may be formed by indentation or stamping to have hemispherical protrusions.
[0079] Figure 11 This is an exploded perspective view of the extended engagement portion 1022 and the engagement receiving portion 1031 of the detection probe 10 according to the sixth embodiment of this disclosure. Figure 12 It is a display Figure 11 The diagram shows a cross-sectional view of the assembled state of the extended engagement portion 1022 and the engagement receiving portion 1031 of the detection probe 10. The extended engagement portion 1022 and the engagement receiving portion 1031 of the detection probe 10 are... Figure 9The description of similar portions between the extended engagement portion 822 and the engagement receiving portion 831 of the detection probe 8 shown will be omitted to avoid repetition.
[0080] Reference Figure 11 The engagement receiving portion 1031 is cylindrical in shape and houses the extended engagement portion 1022 therein. The engagement receiving portion 1031 includes four resilient rods 1033, for example formed by four longitudinally cut closed slots 1032, four engagement portions 1034 projecting radially inward along the circumferential direction of the resilient rods 1033, and flanges 1036 provided at their ends. The engagement portions 1034 are formed by roll forming.
[0081] Reference Figure 12 By pulling the pin unit 101, the elastic rod 1033 is deformed, and the engaging portion 1034 of the engaging receiving portion 1031 separates from the locking portion 1023 of the extended engaging portion 1022. In this case, the elastic rod 1033 deforms radially outward within the space between the flange 1036 and the connecting unit body 1037.
[0082] Figure 13 This is a view showing the extended engagement portion 1121 and the engagement receiving portion 1131 of the detection probe 11 according to the seventh embodiment of this disclosure.
[0083] Reference Figure 13 The detection probe 11 includes an extended engagement portion 1121 provided in the terminal unit 112 and an engagement receiving portion 1131 provided in the connecting unit 113. The connecting unit 113 is cylindrical in shape, with one side coupled to one end of the pin unit 111. The pin unit 111 and the connecting unit 113 can be coupled based on the engagement between a first recessed portion 1114 of the pin unit 111 and a first protruding portion 1135 of the connecting unit 113.
[0084] The extended engagement portion 1121 includes a locking portion 1124 that engages with the engagement portion 1134 of the engagement receiving portion 1131 to prevent longitudinal separation. The locking portion 1124 is recessed circumferentially along the extended engagement portion 1121.
[0085] The extended joint portion 1121 includes four extended joint rods 1123, which are formed by the cut portion 1122 to extend longitudinally. The extended joint rods 1123 are capable of radial elastic deformation.
[0086] The engagement receiving portion 1131 is cylindrical in shape and accommodates the extended engagement portion 1121 therein. The engagement receiving portion 1131 includes a circular engagement portion 1134 whose diameter decreases towards the longitudinal central axis.
[0087] Figure 14This is a view showing the extended engagement portion 1211 and the engagement receiving portion 1221 of the detection probe 12 according to the eighth embodiment of this disclosure.
[0088] Reference Figure 14 The detection probe 12 includes an extended engagement portion 1211 provided at one end of the pin unit 121, and an engagement receiving portion 1221 provided in the terminal unit 122.
[0089] The extended engagement portion 1211 includes a locking portion 1214 that engages with the engagement portion 1224 of the engagement receiving portion 1221 to prevent longitudinal separation. The locking portion 1214 is recessed circumferentially along the extended engagement portion 1211.
[0090] The extended joint portion 1211 includes four extended joint rods 1213, which are formed by the cut portion 1212 to extend longitudinally. The extended joint rods 1213 are capable of radial elastic deformation.
[0091] The engagement receiving portion 1221 is cylindrical in shape and accommodates the extended engagement portion 1211 therein. The engagement receiving portion 1221 includes a circular engagement portion 1224 whose diameter decreases towards the longitudinal central axis.
[0092] While several embodiments of this disclosure have been described and illustrated above, this disclosure is not limited to the specific embodiments described above. Those skilled in the art can make various modifications to the embodiments without departing from the scope of this disclosure as claimed in the claims, and these modified embodiments should not be understood separately from the technical spirit or vision of this disclosure.
Claims
1. A detection probe, comprising: Pin unit; as well as Terminal unit, longitudinally connected to the pin unit, wherein One of the pin unit and the terminal unit includes an extended engagement portion extending along the longitudinal direction and including a plurality of cut portions and a locking portion. The plurality of cut portions are formed along the longitudinal direction to be resiliently deformable in the radial direction, and the locking portion is recessed in the radial direction. Another of the pin unit and the terminal unit includes a engagement receiving portion, which includes an engagement portion that engages with the locking portion to prevent the extended engagement portion from separating in the longitudinal direction and to receive the extended engagement portion along the longitudinal direction.
2. The detection probe according to claim 1, wherein the engagement portion includes an end whose diameter decreases toward the central axis in the length direction.
3. The detection probe of claim 1, wherein the engagement portion includes a hemispherical protrusion that is shaped by an indentation to protrude toward the inside of the engagement receiving portion.
4. The detection probe of claim 1, wherein the engagement portion includes a protruding portion that is rolled to project inwardly along the circumference of the engagement receiving portion.
5. The detection probe according to claim 1, wherein the extended engagement portion comprises a plurality of extended engagement rods separated in the longitudinal direction by the cut portion.
6. A detection device for detecting the electrical characteristics of an object under test, comprising: The detection probe as described in any one of claims 1 to 5; A probe support block that accommodates and supports the detection probe, enabling the detection probe to move elastically and extensibly in the accommodating direction; as well as A detection circuit board is disposed below the probe support block and transmits signals to the detection probe.