Dose verification method, apparatus, storage medium, and electronic device

Abstract

This specification discloses a dose verification method, apparatus, storage medium, and electronic device, relating to the field of radiotherapy technology. It can acquire target distance, equipment distance, detector convolution kernel, CT correction factor, detector dose data, and irradiation distances at multiple dose accumulation points. Based on the dose data at each coordinate point and the detector scattering convolution kernel, the initial deposited dose corresponding to each target point is determined. Then, based on the equipment distance, target distance, and the initial deposited dose at each coordinate point, the output beam intensity of the radiation device is determined. Based on the output beam intensity, initial deposited dose, equipment distance, CT correction factor, and irradiation distances at multiple dose accumulation points, the dose distribution at each dose accumulation point is determined. Finally, the dose distribution is compared and verified with the planned dose distribution. It is evident that the dose verification process considers the influence of various factors such as radiation device performance and detector position, thus improving the accuracy of dose verification.

Description

Technical Field

[0001] This specification relates to the field of radiotherapy technology, and in particular to a dose verification method, apparatus, storage medium, and electronic device. Background Technology

[0002] With the rapid development of radiotherapy technology, dynamic radiotherapy methods such as intensity-modulated radiation therapy (IMRT) and volumetric modulated arc therapy (VMAT) are widely used in clinical treatment. These techniques, through dynamic adjustment of multi-leaf collimators and head rotation, create a complex and highly gradient three-dimensional dose distribution within the patient's body, ensuring sufficient therapeutic dose to the tumor target area while maximizing the protection of surrounding normal tissues. However, this also places high demands on the precision of treatment planning; ensuring the accurate implementation of the planned dose distribution during actual treatment is a crucial foundation for precision radiotherapy.

[0003] Dosage validation involves measuring the dose distribution generated by the radiotherapy machine before treatment and comparing the actual measured dose distribution with the theoretical dose distribution calculated by the Treatment Planning System (TPS). This is not only a crucial step in the quality control of precision radiotherapy but also an important means of ensuring the safety and effectiveness of treatment.

[0004] However, factors such as the performance of the radiation equipment and the location of the detector can all affect dose verification. Summary of the Invention

[0005] This specification provides a dosage verification method and apparatus to at least partially solve the aforementioned problems existing in the prior art.

[0006] The following technical solution is adopted in this specification: This specification provides a dosage verification method, including: The system acquires target distance, device distance, detector convolution kernel, CT correction coefficient, detector dose data, and irradiation distance at multiple dose accumulation points; the target distance represents the distance between the radiation source of the radiation device emitting the radiation beam and the detector; the irradiation distance represents the distance between the target irradiation position and the radiation source; the device distance represents the distance between the head of the radiation device and the radiation source; the radiation beam penetrates the phantom and irradiates the detector; Based on the dose data of each coordinate point and the detector scattering convolution kernel, the initial deposition dose corresponding to each target point is determined; The beam intensity of the X-ray device is determined based on the device distance, the target distance, and the initial deposition dose at each coordinate point. The dose distribution at each dose accumulation point is determined based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points. The dose distribution was compared and verified with the planned dose distribution.

[0007] Preferably, determining the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector convolution kernel includes: Based on the dose data at each coordinate point and the detector convolution kernel, the initial deposition dose corresponding to each target point is determined using the following formula: in, Distance to target; The initial deposition dose is given at coordinate point (i, j); The detector convolution kernel; The dose data is for coordinate point (i, j).

[0008] Preferably, determining the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point includes: Based on the device distance, the target distance, and the initial deposition dose at each coordinate point, the beam intensity of the X-ray device is determined using the following formula: in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; The target distance is denoted as .

[0009] Preferably, the method further includes: Obtain the phantom linear attenuation parameters, phantom ray hardening parameters, and phantom thickness parameters; The step of determining the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point includes: Based on the phantom linear attenuation parameter, the phantom ray hardening parameter, and the phantom thickness parameter, the phantom correction coefficient is determined using the following formula: in, The correction factor for the phantom; The linear attenuation parameter of the phantom; The parameters for the radiation hardening of the phantom; The thickness parameter of the mold body; Based on the device distance, the target distance, the phantom correction coefficient, and the initial deposition dose at each coordinate point, the beam intensity of the X-ray device is determined using the following formula; in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; The target distance; This is the correction coefficient for the phantom.

[0010] Preferably, the method further includes: Based on the patient's CT data, obtain the patient's linear attenuation parameters, patient's radiation hardening parameters, and radiation hardening correction parameters; Based on the patient's linear attenuation parameters, patient's radiation-straining parameters, and radiation-straining correction parameters, the CT correction factor is determined using the following formula: in, The linear decay parameter for the patient; The radiation sclerosis parameters for the patient; The parameter is the radiation hardening correction parameter.

[0011] Preferably, determining the dose distribution at each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the plurality of dose accumulation points includes: The simulated dose deposition at each dose accumulation point is determined based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points. The dose distribution at each dose accumulation point is determined based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel.

[0012] Preferably, determining the simulated dose deposition at each dose accumulation point based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the plurality of dose accumulation points includes: Based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points, the simulated dose deposition at each dose accumulation point is determined using the following formula: in, The simulated dose deposition corresponding to the ray beam irradiating the coordinate point (i, j); The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The irradiation distance; For device distance.

[0013] Preferably, determining the dose distribution at each dose accumulation point based on the dose deposition at each dose accumulation point and a preset patient scattering convolution kernel includes: Based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel, the dose distribution at each dose accumulation point is determined using the following formula: in, The dose distribution at the dose accumulation point corresponding to the ray beam irradiating the coordinate point (i, j); The patient's scattering convolution kernel.

[0014] Preferably, the step of comparing and verifying the dose distribution with the planned dose distribution includes: Three-dimensional gamma analysis was performed on the dose distribution and the planned dose distribution to determine the three-dimensional gamma pass rate; The rationality of the planned dose distribution is verified based on the three-dimensional gamma pass rate.

[0015] On the other hand, this specification provides a dose verification device, including: The acquisition unit is used to acquire target distance, device distance, detector convolution kernel, CT correction coefficient, dose data of each coordinate point in the target plane, and irradiation distance of multiple dose accumulation points; the target plane is perpendicular to the X-ray beam; the target distance represents the distance between the X-ray source of the X-ray device emitting the X-ray beam and the detector; the irradiation distance represents the distance between the target irradiation position and the X-ray source; the device distance represents the distance between the X-ray device head and the X-ray source; the X-ray beam penetrates the phantom and irradiates the detector; The processing unit is used to determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector scattering convolution kernel; A calculation unit is used to determine the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point; The determining unit is configured to determine the dose distribution of each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points; The verification unit is used to compare and verify the dose distribution with the planned dose distribution.

[0016] On the other hand, the computer-readable storage medium provided in this specification stores a computer program that, when executed by a processor, implements the dose verification method provided in the above aspect.

[0017] On the other hand, this specification provides an electronic device including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the dose verification method provided in the above aspect.

[0018] On the other hand, this specification provides a computer program product in which instructions, when executed by a processor of an electronic device, cause the electronic device to implement the dose verification method provided in the above-mentioned aspect.

[0019] The above-mentioned technical solutions adopted in this specification can achieve the following beneficial effects: The dose verification method provided in this specification allows for the acquisition of target distance, device distance, detector convolution kernel, CT correction factor, detector dose data, and irradiation distances at multiple dose accumulation points. Based on the dose data at each coordinate point and the detector scattering convolution kernel, the initial deposited dose corresponding to each target point is determined. Then, based on the device distance, target distance, and initial deposited dose at each coordinate point, the output beam intensity of the radiation device is determined. Next, based on the output beam intensity, initial deposited dose, device distance, CT correction factor, and irradiation distances at the multiple dose accumulation points, the dose distribution at each dose accumulation point is determined. Finally, this dose distribution is compared and verified with the planned dose distribution.

[0020] As can be seen from the above methods, the influence of various factors such as the performance of the radiation equipment and the location of the detector is taken into account when conducting metrological verification, which improves the accuracy of dose verification. Attached Figure Description

[0021] The accompanying drawings, which are included to provide a further understanding of this specification and form part of this specification, illustrate exemplary embodiments and are used to explain this specification, but do not constitute an undue limitation thereof. In the drawings: Figure 1 A schematic flowchart of a dose verification method provided in one embodiment of this specification; Figure 2A schematic diagram of the structure of a dose verification device provided in one embodiment of this specification; Figure 3 This is a schematic diagram of the structure of an electronic device provided as an embodiment of this specification. Detailed Implementation

[0022] To make the objectives, technical solutions, and advantages of this specification clearer, the technical solutions of this specification will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this specification, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments in this specification without creative effort are within the scope of protection of this application.

[0023] In the description of this invention, it should be noted that the term "or" is generally used to include the meaning of "and / or" unless otherwise expressly stated in the content.

[0024] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. Furthermore, in the description of this application, the terms "first," "second," etc., are used only for distinguishing descriptions and should not be construed as indicating or implying relative importance.

[0025] Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0026] The technical solutions provided in the various embodiments of this specification are described in detail below with reference to the accompanying drawings.

[0027] Figure 1 A schematic flowchart of a dose verification method provided in one embodiment of this specification is shown below. Figure 1 As shown, the dose verification method specifically includes the following steps: S100: Acquires target distance, device distance, detector convolution kernel, CT correction coefficient, dose data for each coordinate point in the target plane, and irradiation distance for multiple dose accumulation points.

[0028] In this specification, the dosage verification method may be performed by an electronic device, such as a computer, server, or other similar device; this specification does not limit this.

[0029] Preferably, before performing dose verification, the computer can preferentially acquire target distance, device distance, detector convolution kernel, CT correction coefficient, detector dose data, and irradiation distance of multiple dose accumulation points.

[0030] Preferably, the target distance characterizes the distance between the radiation source of the radiation device emitting the radiation beam and the detector.

[0031] Preferably, the beam of light can be X-ray, gamma (α) rays, beta (γ) rays, etc., but this specification does not impose any restrictions.

[0032] Preferably, the irradiation distance characterizes the distance between the target irradiation location and the radiation source. The target irradiation location is the location of the patient's lesion. It is important to emphasize that this method is only an evaluation and verification method and does not involve an actual treatment process. The target irradiation location is merely simulated or estimated, and there will be no actual patient present.

[0033] Preferably, the distance of the device represents the distance between the head of the radiation device and the radiation source. Those skilled in the art will understand that the radiation source is typically located inside the radiation device, while the head is the structure that outputs the radiation beam.

[0034] Preferably, the ray beam penetrates the phantom and then irradiates the detector.

[0035] The above method enabled the acquisition of all initial parameters and measured data required for subsequent dose verification calculations. This lays the foundation for accurately estimating the actual beam intensity of the equipment and calculating the final dose distribution, and is a prerequisite for ensuring the accuracy of the entire verification method.

[0036] S102: Determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector scattering convolution kernel.

[0037] Preferably, after acquiring the above data, the electronic device can determine the dose distribution at each dose accumulation point.

[0038] Preferably, the dose accumulation point is a plurality of points included in the target irradiation location.

[0039] As described in the background section, the performance of the radiation equipment can affect the results of metrological verification. Furthermore, during operation, the radiation parameters input by the user may differ from the actual parameters of the radiation beam output by the equipment. Therefore, in this specification, the electronic device can first determine the initial deposition dose of the radioactive material in the radiation beam at the detector, and then infer the beam intensity at the head of the radiation equipment.

[0040] Preferably, the electronic device can determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector convolution kernel using the following formula: in, Distance to target; The initial deposition dose is given at coordinate point (i, j); This is the convolution kernel of the detector; The dose data is for coordinate point (i, j).

[0041] The above method corrects the dose data measured by the detector by eliminating the influence of internal scattering through deconvolution. The result is a purer and more accurate initial deposited dose, providing crucial data for the next step of accurately estimating the beam intensity from the back-conversion device.

[0042] S104: Determine the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point.

[0043] Preferably, the electronic device can determine the beam intensity of the radiation device based on the device distance, the target distance, and the initial deposition dose at each coordinate point using the following formula: in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; This is the distance to the target.

[0044] Furthermore, even with or without a phantom, the phantom's performance still affects the inverse estimation of the beam intensity. Therefore, if the presence of a phantom is confirmed, the electronic device can preferentially obtain the phantom's linear attenuation parameters, radiation hardening parameters, and thickness parameters based on the phantom. Then, the electronic device can determine the phantom correction coefficient using the following formula based on the phantom's linear attenuation parameters, radiation hardening parameters, and thickness parameters: in, This is the correction factor for the phantom; This is the linear decay parameter of the phantom; These are the ray hardening parameters for the phantom; This refers to the thickness parameter of the mold body.

[0045] Finally, the electronic device can determine the beam intensity of the radiation device using the following formula, based on the device distance, the target distance, the phantom correction factor, and the initial deposition dose at each coordinate point; in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; This is the distance to the target. This is the correction factor for the model.

[0046] This step aims to reverse-engineer the actual output beam intensity at the radiation source (i.e., at the device head) based on the corrected dose at the detector. The result is a more accurate set of device parameters, independent of the device's theoretical settings, providing a precise source input for subsequent accurate calculations of the simulated dose distribution.

[0047] S106: Determine the dose distribution of each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction coefficient, and the irradiation distance of the multiple dose accumulation points.

[0048] Preferably, the electronic device can determine the dose distribution at each dose accumulation point after determining the output beam intensity. Specifically, the electronic device can preferentially determine the simulated dose deposition at each dose accumulation point using the following formula, based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points: in, The simulated dose deposition corresponding to the ray beam irradiating the coordinate point (i, j); The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The irradiation distance; For device distance.

[0049] Then, the electronic device can determine the dose distribution at each dose accumulation point based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel, using the following formula: in, The dose distribution at the dose accumulation point corresponding to the ray beam irradiating the coordinate point (i, j); This is the scattering convolution kernel for the patient.

[0050] Furthermore, when determining the CT correction factor, this electronic device can prioritize obtaining the patient's linear attenuation parameter, radiation hardening parameter, and radiation hardening correction parameter based on the patient's CT data. Then, based on the patient's linear attenuation parameter, radiation hardening parameter, and radiation hardening correction parameter, the CT correction factor is determined using the following formula: in, The linear decay parameter for this patient; The radiation sclerosis parameters for this patient; This is the correction parameter for the ray hardening.

[0051] Preferably, this step aims to simulate the dose deposition process after the radiation passes through the patient's body using the actual beam intensity determined in the previous steps, taking into account the scattering effect within the tissue. The ultimate goal is to calculate the three-dimensional dose distribution at each point within the target area, providing data for verification and comparison with the planned dose.

[0052] S108: Compare and verify the dose distribution with the planned dose distribution.

[0053] Preferably, the electronic device can compare and verify the dose distribution at each dose accumulation point with the planned dose distribution to determine whether there is a difference between the current irradiation intensity and the planned dose distribution, thereby determining whether the irradiation intensity needs to be corrected.

[0054] based on Figure 1 The dose verification method shown involves an electronic device that acquires target distance, device distance, detector convolution kernel, CT correction factor, detector dose data, and irradiation distances at multiple dose accumulation points. Based on the dose data at each coordinate point and the detector scattering convolution kernel, the initial deposited dose corresponding to each target point is determined. Then, based on the device distance, target distance, and initial deposited dose at each coordinate point, the output beam intensity of the radiation device is determined. Next, based on the output beam intensity, initial deposited dose, device distance, CT correction factor, and irradiation distances at the multiple dose accumulation points, the dose distribution at each dose accumulation point is determined. Finally, this dose distribution is compared and verified with the planned dose distribution.

[0055] As can be seen from the above method, this electronic device takes into account the influence of various factors such as the performance of the radiation equipment and the position of the detector when performing metrological verification, thereby improving the accuracy of dose verification.

[0056] Preferably, in step S108, the electronic device can perform three-dimensional gamma analysis on the dose distribution and the planned dose distribution to determine the three-dimensional gamma pass rate. Then, based on the three-dimensional gamma pass rate, the rationality of the planned dose distribution is verified.

[0057] Preferably, the electronic device is equipped with a graphics processing unit (GPU), which can perform some steps of the above-described method.

[0058] More preferably, the deconvolution / convolution operation of the scattering convolution kernel in the aforementioned steps can be performed by the GPU of the electronic device.

[0059] Preferably, the determination of the phantom correction coefficient in the aforementioned steps can be performed by the GPU of the electronic device.

[0060] Preferably, this step is the endpoint of the entire dose validation process, aiming to directly compare the dose distribution calculated in the preceding steps by simulating the real physical process with the theoretical dose distribution of the treatment planning system (TPS). Its effect is to ultimately assess the accuracy and clinical feasibility of the treatment plan, for example, by calculating gamma pass rate to quantify the degree of consistency between the two, providing crucial quality control evidence to ensure the safety and effectiveness of radiotherapy.

[0061] It should be noted that all actions involving the acquisition of signals, information, or data in this application are carried out in compliance with the relevant data protection laws and policies of the country where the application is located, and with the authorization granted by the owner of the relevant device.

[0062] The above describes one or more embodiments of the dose verification method provided in this specification. Based on the same idea, this specification also provides a corresponding dose verification device, such as... Figure 2 As shown.

[0063] Figure 2 A schematic diagram of the structure of a dose verification device provided in one embodiment of this specification is shown below. Figure 2 As shown, the dose verification device specifically includes: The acquisition unit 200 is used to acquire target distance, device distance, detector convolution kernel, CT correction coefficient, dose data of each coordinate point in the target plane, and irradiation distance of multiple dose accumulation points; the target plane is perpendicular to the X-ray beam; the target distance represents the distance between the X-ray source of the X-ray device emitting the X-ray beam and the detector; the irradiation distance represents the distance between the target irradiation position and the X-ray source; the device distance represents the distance between the X-ray device head and the X-ray source; the X-ray beam irradiates the detector after penetrating the phantom; Processing unit 202 is used to determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector scattering convolution kernel; The calculation unit 204 is used to determine the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point; The determining unit 206 is used to determine the dose distribution of each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points; The verification unit 208 is used to compare and verify the dose distribution with the planned dose distribution.

[0064] Preferably, the processing unit 202 is further configured to determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector convolution kernel, using the following formula: in, Distance to target; The initial deposition dose is given at coordinate point (i, j); The detector convolution kernel; The dose data is for coordinate point (i, j).

[0065] Preferably, the calculation unit 204 is further configured to determine the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point using the following formula: in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; The target distance is denoted as .

[0066] Preferably, the calculation unit 204 is further configured to obtain the phantom linear attenuation parameter, the phantom ray hardening parameter, and the phantom thickness parameter; and to determine the phantom correction coefficient based on the phantom linear attenuation parameter, the phantom ray hardening parameter, and the phantom thickness parameter using the following formula: in, The correction factor for the phantom; The linear attenuation parameter of the phantom; The parameters for the radiation hardening of the phantom; The phantom thickness parameter is used; based on the device distance, the target distance, the phantom correction coefficient, and the initial deposition dose at each coordinate point, the beam intensity of the X-ray device is determined using the following formula; in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; The target distance; This is the correction coefficient for the phantom.

[0067] Preferably, the determining unit 206 is further configured to obtain the patient's linear attenuation parameter, the patient's radiation-hardening parameter, and the radiation-hardening correction parameter based on the patient's CT data; and to determine the CT correction coefficient based on the patient's linear attenuation parameter, the patient's radiation-hardening parameter, and the radiation-hardening correction parameter using the following formula: in, The linear decay parameter for the patient; The radiation sclerosis parameters for the patient; The parameter is the radiation hardening correction parameter.

[0068] Preferably, the determining unit 206 is further configured to determine the simulated dose deposition of each dose accumulation point based on the output beam intensity, the CT correction coefficient, the device distance, and the irradiation distance of the plurality of dose accumulation points; and to determine the dose distribution of each dose accumulation point based on the dose deposition of each dose accumulation point and a preset patient scattering convolution kernel.

[0069] Preferably, the determining unit 206 is further configured to determine the simulated dose deposition at each dose accumulation point based on the output beam intensity, the CT correction coefficient, the device distance, and the irradiation distance of the plurality of dose accumulation points, using the following formula: in, The simulated dose deposition corresponding to the ray beam irradiating the coordinate point (i, j); The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The irradiation distance; For device distance.

[0070] Preferably, the determining unit 206 is further configured to determine the dose distribution at each dose accumulation point based on the dose deposition at each dose accumulation point and a preset patient scattering convolution kernel, using the following formula: in, The dose distribution at the dose accumulation point corresponding to the ray beam irradiating the coordinate point (i, j); The patient's scattering convolution kernel.

[0071] Preferably, the verification unit 208 is further configured to perform three-dimensional gamma analysis on the dose distribution and the planned dose distribution to determine the three-dimensional gamma pass rate; and to verify the rationality of the planned dose distribution based on the three-dimensional gamma pass rate.

[0072] This specification also provides a computer-readable storage medium storing a computer program that can be used to execute the above-described... Figure 1 The provided dose verification method.

[0073] This specification also provides a computer program product in which instructions, when executed by the processor of an electronic device, cause the electronic device to perform the above-described functions. Figure 1 The provided dose verification method.

[0074] This specification also provides an electronic device, Figure 3 This is a schematic diagram of the structure of an electronic device provided as an embodiment of this specification. Figure 3 As shown, at the hardware level, this electronic device includes a processor, internal bus, network interface, memory, and non-volatile memory, and may also include other hardware required for business operations. The processor reads the corresponding computer program from the non-volatile memory into memory and then runs it to achieve the above. Figure 1 The dosage verification method described above. Of course, in addition to software implementation, this specification does not exclude other implementation methods, such as logic devices or a combination of hardware and software, etc. That is to say, the execution subject of the following processing flow is not limited to each logic unit, but can also be hardware or logic devices.

[0075] This specification also provides a dosage verification system.

[0076] Preferably, the dose verification system includes electronic equipment, detectors, radiation equipment, and a support.

[0077] Preferably, the electronic device is Figure 3 The provided electronic equipment is used to perform Figure 1 The provided dose verification method.

[0078] Preferably, the bracket is a fixed bracket.

[0079] Preferably, the detector is directly connected to the fixed bracket, and the fixed bracket is directly connected to the head of the X-ray equipment, so that when the head rotates, the detector can be driven to rotate through the fixed bracket.

[0080] Preferably, the detector is directly connected to the fixed bracket, the fixed bracket is directly connected to the lower half of the radiation device, and the connection between the fixed bracket and the radiation device is located on the rotation axis of the radiation device, so that when the machine head rotates based on the rotation axis, the fixed bracket and the detector can rotate accordingly.

[0081] Preferably, the support is a rotating support. The detector is fixedly connected to the rotating support, which is equipped with a first attitude sensor, and the X-ray device's head is equipped with a second attitude sensor. The rotating support is equipped with a rotating motor. The rotating motor can drive the rotating support to rotate. The controller is also communicatively connected to the first attitude sensor, the second attitude sensor, and the rotating motor. The controller is also used to send commands to the rotating motor based on data from the first and second attitude sensors, instructing the rotating motor to rotate, so that when the X-ray device rotates, the rotating support can drive the detector to rotate synchronously with the X-ray device, ensuring that the detector's acquisition surface is always perpendicular to the X-ray beam emitted by the X-ray device.

[0082] In the 1990s, improvements to a technology could be clearly distinguished as either hardware improvements (e.g., improvements to the circuit structure of diodes, transistors, switches, etc.) or software improvements (improvements to the methodology). However, with technological advancements, many methodological improvements today can be considered direct improvements to the hardware circuit structure. Designers almost always obtain the corresponding hardware circuit structure by programming the improved methodology into the hardware circuit. Therefore, it cannot be said that a methodological improvement cannot be implemented using hardware physical modules. For example, a Programmable Logic Device (PLD) (such as a Field Programmable Gate Array (FPGA)) is such an integrated circuit whose logic function is determined by the user programming the device. Designers can program and "integrate" a digital system onto a PLD themselves, without needing chip manufacturers to design and manufacture dedicated integrated circuit chips. Furthermore, nowadays, instead of manually manufacturing integrated circuit chips, this programming is mostly implemented using "logic compiler" software. Similar to the software compiler used in program development, the original code before compilation must also be written in a specific programming language, called a Hardware Description Language (HDL). There are many HDLs, such as ABEL (Advanced Boolean Expression Language), AHDL (Altera Hardware Description Language), Confluence, CUPL (Cornell University Programming Language), HDCal, JHDL (Java Hardware Description Language), Lava, Lola, MyHDL, PALASM, and RHDL (Ruby Hardware Description Language). Currently, the most commonly used are VHDL (Very-High-Speed ​​Integrated Circuit Hardware Description Language) and Verilog. Those skilled in the art should also understand that by simply performing some logic programming on the method flow using one of these hardware description languages ​​and programming it into an integrated circuit, the hardware circuit implementing the logical method flow can be easily obtained.

[0083] The controller can be implemented in any suitable manner. For example, it can take the form of a microprocessor or processor and a computer-readable medium storing computer-readable program code (e.g., software or firmware) executable by the (micro)processor, logic gates, switches, application-specific integrated circuits (ASICs), programmable logic controllers, and embedded microcontrollers. Examples of controllers include, but are not limited to, the following microcontrollers: ARC 625D, Atmel AT91SAM, Microchip PIC18F26K20, and Silicon Labs C8051F320. A memory controller can also be implemented as part of the control logic of the memory. Those skilled in the art will also recognize that, in addition to implementing the controller in purely computer-readable program code form, the same functionality can be achieved by logically programming the method steps to make the controller take the form of logic gates, switches, application-specific integrated circuits, programmable logic controllers, and embedded microcontrollers. Therefore, such a controller can be considered a hardware component, and the means included therein for implementing various functions can also be considered as structures within the hardware component. Alternatively, the means for implementing various functions can be considered as both software modules implementing the method and structures within the hardware component.

[0084] The systems, devices, modules, or units described in the above embodiments can be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a computer. Specifically, a computer can be, for example, a personal computer, laptop computer, cellular phone, camera phone, smartphone, personal digital assistant, media player, navigation device, email device, game console, tablet computer, wearable device, or any combination of these devices.

[0085] For ease of description, the above devices are described in terms of function, divided into various units. Of course, in implementing this specification, the functions of each unit can be implemented in one or more software and / or hardware components.

[0086] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0087] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0088] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0089] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0090] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0091] Memory may include non-persistent storage in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0092] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0093] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0094] Those skilled in the art will understand that the embodiments of this specification can be provided as methods, systems, or computer program products. Therefore, this specification may take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this specification may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0095] This specification can be described in the general context of computer-executable instructions that are executed by a computer, such as program modules. Generally, program modules include routines, programs, objects, components, data structures, etc., that perform a specific task or implement a specific abstract data type. This specification can also be practiced in distributed computing environments, where tasks are performed by remote processing devices connected via a communication network. In distributed computing environments, program modules can reside in local and remote computer storage media, including storage devices.

[0096] The various embodiments in this specification are described in a progressive manner. Similar or identical parts between embodiments can be referred to interchangeably. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions in the method embodiments.

[0097] The above description is merely an embodiment of this specification and is not intended to limit this specification. Various modifications and variations can be made to this specification by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this specification should be included within the scope of the claims of this application.

Claims

1. A dosage verification method, characterized in that, include: The system acquires target distance, device distance, detector convolution kernel, CT correction coefficient, detector dose data, and irradiation distance at multiple dose accumulation points; the target distance represents the distance between the radiation source of the radiation device emitting the radiation beam and the detector; the irradiation distance represents the distance between the target irradiation position and the radiation source; the device distance represents the distance between the head of the radiation device and the radiation source; the radiation beam penetrates the phantom and irradiates the detector; Based on the dose data at each coordinate point and the detector scattering convolution kernel, the initial deposition dose corresponding to each target point is determined; The beam intensity of the X-ray device is determined based on the device distance, the target distance, and the initial deposition dose at each coordinate point. The dose distribution at each dose accumulation point is determined based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points. The dose distribution was compared and verified with the planned dose distribution.

2. The method of claim 1, wherein, The step of determining the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector convolution kernel includes: Based on the dose data at each coordinate point and the detector convolution kernel, the initial deposition dose corresponding to each target point is determined using the following formula: in, Distance to target; The initial deposition dose is given at coordinate point (i, j); The detector convolution kernel; The dose data is for coordinate point (i, j).

3. The method of claim 1, wherein, The step of determining the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point includes: Based on the device distance, the target distance, and the initial deposition dose at each coordinate point, the beam intensity of the X-ray device is determined using the following formula: in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); Let (i, j) be the initial deposition dose at coordinate point (i, j); The distance to the device; The target distance is denoted as .

4. The dosage verification method according to claim 1, characterized in that, The method further includes: Obtain the phantom linear attenuation parameters, phantom ray hardening parameters, and phantom thickness parameters; The step of determining the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point includes: Based on the phantom linear attenuation parameter, the phantom ray hardening parameter, and the phantom thickness parameter, the phantom correction coefficient is determined using the following formula: in, The correction factor for the phantom; The linear attenuation parameter of the phantom; The parameters for the radiation hardening of the phantom; The thickness parameter of the mold body; Based on the device distance, the target distance, the phantom correction coefficient, and the initial deposition dose at each coordinate point, the beam intensity of the X-ray device is determined using the following formula; in, The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The initial deposition dose is given at coordinate point (i, j); The distance to the device; The target distance; The correction coefficient for the phantom is given.

5. The dosage verification method according to claim 1, characterized in that, The method further includes: Based on the patient's CT data, obtain the patient's linear attenuation parameters, patient's radiation hardening parameters, and radiation hardening correction parameters; Based on the patient's linear attenuation parameters, patient's radiation-straining parameters, and radiation-straining correction parameters, the CT correction factor is determined using the following formula: in, The linear decay parameter for the patient; The radiation sclerosis parameters for the patient; The parameter is the radiation hardening correction parameter.

6. The method of dose verification of claim 5, wherein, The step of determining the dose distribution at each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points includes: The simulated dose deposition at each dose accumulation point is determined based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points. The dose distribution at each dose accumulation point is determined based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel.

7. The dosage verification method according to claim 6, characterized in that, The step of determining the simulated dose deposition at each dose accumulation point based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points includes: Based on the output beam intensity, the CT correction factor, the device distance, and the irradiation distance of the multiple dose accumulation points, the simulated dose deposition at each dose accumulation point is determined using the following formula: in, The simulated dose deposition corresponding to the ray beam irradiating the coordinate point (i, j); The output beam intensity at the head of the ray beam illuminating the coordinate point (i, j); The irradiation distance; For device distance.

8. The method of dose verification of claim 7, wherein, The step of determining the dose distribution at each dose accumulation point based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel includes: Based on the dose deposition at each dose accumulation point and the preset patient scattering convolution kernel, the dose distribution at each dose accumulation point is determined using the following formula: in, The dose distribution at the dose accumulation point corresponding to the ray beam irradiating the coordinate point (i, j); The patient's scattering convolution kernel.

9. The dosage verification method according to any one of claims 1-8, characterized in that, The step of comparing and verifying the dose distribution with the planned dose distribution includes: Three-dimensional gamma analysis was performed on the dose distribution and the planned dose distribution to determine the three-dimensional gamma pass rate; The rationality of the planned dose distribution is verified based on the three-dimensional gamma pass rate.

10. A dosage verification device, characterized in that, include: The acquisition unit is used to acquire target distance, device distance, detector convolution kernel, CT correction coefficient, dose data of each coordinate point in the target plane, and irradiation distance of multiple dose accumulation points; the target plane is perpendicular to the X-ray beam; the target distance represents the distance between the X-ray source of the X-ray device emitting the X-ray beam and the detector; the irradiation distance represents the distance between the target irradiation position and the X-ray source; the device distance represents the distance between the X-ray device head and the X-ray source; the X-ray beam penetrates the phantom and irradiates the detector; The processing unit is used to determine the initial deposition dose corresponding to each target point based on the dose data of each coordinate point and the detector scattering convolution kernel; A calculation unit is used to determine the beam intensity of the X-ray device based on the device distance, the target distance, and the initial deposition dose at each coordinate point; The determining unit is configured to determine the dose distribution of each dose accumulation point based on the output beam intensity, the initial deposition dose, the device distance, the CT correction factor, and the irradiation distance of the multiple dose accumulation points; The verification unit is used to compare and verify the dose distribution with the planned dose distribution.

11. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the method described in any one of claims 1-9.

12. An electronic device comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the method described in any one of claims 1-9.

13. A dosage verification system, characterized in that, The dose verification system includes a detector, a radiation device, a support, and the electronic device as described in claim 12; The bracket is fixedly connected to the detector and to the radiation equipment or treatment bed. The bracket can actively or passively follow the rotation of the head of the radiation equipment, so that the collection surface of the detector is perpendicular to the radiation beam emitted by the head.

14. A computer program product, characterized in that, When the instructions in the computer program product are executed by the processor of the electronic device, the electronic device causes the electronic device to perform the method as described in any one of claims 1-9.

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