Method, device, storage medium and equipment for testing memory bar of terminal device
By performing read/write tests on a specified partition after the terminal device restarts, the problem of limited memory module testing range is solved, enabling more accurate memory module testing.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- XIAN ZHONGNUO COMM CO LTD
- Filing Date
- 2026-03-17
- Publication Date
- 2026-07-24
AI Technical Summary
In existing technologies, when the terminal device is in the system service application stage, part of the memory module is occupied, which limits the testing scope and affects the testing accuracy.
After the terminal device restarts and initializes successfully, it writes and reads preset test data from the specified partition to perform read and write tests on the memory module and obtains the test results.
The testing scope and accuracy of terminal device memory modules have been improved, enabling testing to be completed before the system enters the service application stage, thus improving the efficiency of classification and processing.
Smart Images
Figure CN122450751A_ABST
Abstract
Description
Technical Field
[0001] This application relates to the technical field of testing memory modules, specifically to a testing method, apparatus, storage medium, and device for a terminal device memory module. Background Technology
[0002] With the continuous advancement and development of technology, the functions of smart terminals are becoming increasingly diverse, which in turn raises the requirements for memory modules in these devices. Currently, the common method for testing terminal device memory modules is to conduct read / write comparison tests or fill tests while the terminal device is in the system service application phase. However, when the terminal device is in the system service application phase, the memory module is already running some applications, meaning that some partitions of the memory module are already occupied by these applications. Once certain partitions are occupied, they cannot be used for read / write comparison tests or fill tests. This situation directly limits the scope of testing the terminal device's memory module and affects the accuracy of the testing. Summary of the Invention
[0003] The purpose of this application is to overcome the shortcomings and deficiencies in the prior art and provide a testing method, apparatus, storage medium and device for terminal device memory modules, which can increase the testing scope of terminal device memory modules and improve the testing accuracy of terminal device memory modules.
[0004] The first aspect of this application provides a method for testing the memory module of a terminal device, including: Write the first preset test data to the specified partition location of the terminal device; After the terminal device restarts and initializes successfully, the stored data at the specified partition location is read; If the first preset test data is read from the specified partition location, a read / write test is performed on the memory module to obtain the test result of the memory module.
[0005] Compared to related technologies, this application writes the first preset test data to a designated partition location of the terminal device; after the terminal device restarts and initializes successfully, it reads the stored data in the designated partition location; if the first preset test data is read from the designated partition location, it performs a read / write test on the memory module to obtain the test result of the memory module. This allows for read / write testing of the memory module before the terminal device's system enters the system service application stage, increasing the scope of testing the terminal device's memory module and improving the accuracy of the terminal device's memory module testing.
[0006] As one implementation, the step of performing a read / write test on the memory module and obtaining the test result of the memory module if the first preset test data is read from the specified partition location includes: The memory module is subjected to a number of read and write tests according to a preset number of tests. The read and write test is as follows: after writing the preset write data into the memory module, the stored data of the memory module is read to obtain the read data. The test results are obtained by comparing the read data and write data from the several read / write tests.
[0007] In this embodiment, the memory module is subjected to read and write tests according to a preset number of tests. By comparing the read data and the written data, the test results of the memory module can be accurately obtained.
[0008] As one implementation, after the step of comparing the read data and write data from the plurality of read / write tests to obtain the test results, the method further includes the following steps: If the test result indicates that the memory module is normal, the second preset test data is written to the specified partition location. If the test result indicates a memory module malfunction, the third preset test data will be written to the specified partition location.
[0009] In this embodiment, by reading the stored data at the specified partition location, it is possible to quickly determine whether the memory module is normal or abnormal, which helps to improve the efficiency of classifying and processing the memory module.
[0010] As one implementation method, the preset number of tests is obtained through the following steps: Obtain a trained test count prediction model; wherein the test count prediction model is trained based on test count training samples, and the test count training samples include information parameters of memory stick samples, usage duration and corresponding test counts; The information parameters and usage duration of the memory module are input into the test count prediction model to obtain the preset test count.
[0011] In this embodiment, the preset number of tests for the memory module is obtained based on the information parameters of the memory module, the usage duration, and the trained test count prediction model. This can effectively control the number of times and the time consumed by reading and writing data to the memory module, thereby improving testing efficiency.
[0012] As one implementation method, the number of tests corresponding to the memory module sample is obtained through the following steps: Based on the initial number of tests, read and write tests were performed on the memory module sample to obtain multiple sample test results. If all the multiple sample test results are normal, the preset basic number of tests will be used as the test number corresponding to the memory stick sample. If there are test results for multiple samples that are abnormal, the test count for the memory module sample is obtained based on the number of tests corresponding to the abnormal test and the preset basic test count.
[0013] In this embodiment, the number of tests for a memory module sample is determined based on whether there are test anomalies in the results of multiple sample tests. This helps to obtain the test number requirements for different memory module samples, so as to accurately construct the correspondence between different information parameters, usage time and test number.
[0014] As one implementation method, the step of obtaining the number of tests corresponding to the memory module sample based on the number of tests corresponding to the test anomaly and the preset basic number of tests includes: Based on the number of tests corresponding to the aforementioned test anomalies, obtain the median number of tests. Based on the number of tests corresponding to test anomalies exceeding the median value, obtain the number correction value. The number of tests corresponding to the memory module sample is obtained based on the median number of tests, the correction value of the number of tests, and the preset basic number of tests.
[0015] In this embodiment, by combining the median number of times corresponding to the test anomalies, the number of times correction, and the preset basic number of tests to obtain the number of tests corresponding to the memory module samples, the number of tests corresponding to the memory module samples with test anomalies can be increased. This allows the test number prediction model to output a larger number of tests when predicting memory modules with the same information parameters and usage time as the memory module samples, thereby improving test accuracy.
[0016] As one implementation, the step of obtaining the test count corresponding to the memory module sample based on the median count, the count correction value, and the preset base test count includes: The first candidate test count is obtained by summing the median count and the corrected count. The second candidate test count is obtained by summing the median of the test counts and the preset base test counts. If the number of first candidate tests is greater than or equal to the number of second candidate tests, the number of first candidate tests is taken as the number of tests corresponding to the memory module sample; if the number of first candidate tests is less than the number of second candidate tests, the number of second candidate tests is taken as the number of tests corresponding to the memory module sample.
[0017] In this embodiment, the sum of the median number of tests and the corrected number of tests is compared with the sum of the median number of tests and the preset base number of tests to obtain a larger number of tests, thereby ensuring that the number of tests corresponding to memory module samples with test anomalies covers more of the number of test anomalies.
[0018] A second aspect of this application provides a testing apparatus for a terminal device memory module, comprising: The first preset test data writing module is used to write the first preset test data to a specified partition location of the terminal device; The specified partition location reading module is used to read the stored data at the specified partition location after the terminal device restarts and initializes successfully; The read / write test execution module is used to perform read / write tests on the memory module if the first preset test data is read from the specified partition location, and obtain the test results of the memory module.
[0019] A third aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the terminal device memory module testing method described above.
[0020] A fourth aspect of this application provides a computer device including a storage device, a processor, and a computer program stored in the storage device and executable by the processor, wherein the processor executes the computer program to implement the steps of the testing method for a terminal device memory module as described above.
[0021] To provide a clearer understanding of this application, the specific embodiments of this application will be described below in conjunction with the accompanying drawings. Attached Figure Description
[0022] Figure 1 This is a flowchart illustrating a testing method for a terminal device memory module according to an embodiment of this application.
[0023] Figure 2 This is a flowchart illustrating the read / write test method for a terminal device memory module according to one embodiment of this application.
[0024] Figure 3 This is a schematic diagram of the module connection of a testing device for a terminal device memory module according to an embodiment of this application.
[0025] 200. Testing device for terminal device memory modules; 201. First preset test data writing module; 202. Specified partition location reading module; 203. Read / write test execution module. Detailed Implementation
[0026] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.
[0027] It should be understood that the described embodiments are merely some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of the embodiments of this application.
[0028] In the following description, when referring to the accompanying drawings, unless otherwise indicated, the same numbers in different drawings represent the same or similar elements. In the description of this application, it should be understood that the terms "first," "second," "third," etc., are used only to distinguish similar objects and are not necessarily used to describe a specific order or sequence, nor should they be construed as indicating or implying relative importance. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances. The singular forms "a," "the," and "the" used in this application and the appended claims are also intended to include the plural forms, unless the context clearly indicates otherwise. The word "if" as used herein can be interpreted as "when," "when," or "in response to determination."
[0029] Furthermore, in the description of this application, unless otherwise stated, "multiple" means two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.
[0030] Please see Figure 1 This is a flowchart of a testing method for a terminal device memory module according to the first embodiment of this application. The method includes: S1: Write the first preset test data to the specified partition location of the terminal device; The terminal device refers to an electronic computing device including a memory module, such as a smartphone, tablet, laptop, or desktop computer. The designated partition location is the partition location used by the terminal device to store data; for example, the designated partition location could be a partition location on the memory module.
[0031] The first preset test data is 0xff.
[0032] S2: After the terminal device restarts and initializes successfully, read the stored data at the specified partition location.
[0033] The first preset test data is written when the terminal device is in the startup state. However, when the terminal device is in the startup state, the memory module's partition resources are occupied by some applications, so these occupied partitions cannot be used for read-write comparison tests. Therefore, it is necessary to read the stored data at the specified partition location immediately after the terminal device restarts and initializes successfully to determine whether the memory module needs to be read-written.
[0034] S3: If the first preset test data is read from the specified partition location, a read / write test is performed on the memory module to obtain the test result of the memory module.
[0035] If the first preset test data is read from the specified partition location, the terminal device can only enter the system service application stage after the memory module has completed read / write tests. Taking an Android system terminal device as an example, upon startup, the Bootloader is first executed to perform hardware initialization, then the Linux kernel is loaded, and then the init process (the first process in user space) is started. The init process is responsible for initializing system services. After the init process initializes the system services, steps S2-S3 of this application are executed to test the memory module. After the test is completed, the device enters the Android system service application stage to start the foreground and background applications in the Android system.
[0036] Compared to related technologies, this application writes the first preset test data to a designated partition location of the terminal device; after the terminal device restarts and initializes successfully, it reads the stored data in the designated partition location; if the first preset test data is read from the designated partition location, it performs a read / write test on the memory module to obtain the test result of the memory module. This allows for read / write testing of the memory module before the terminal device's system enters the system service application stage, increasing the scope of testing the terminal device's memory module and improving the accuracy of the terminal device's memory module testing.
[0037] Please see Figure 2 In one feasible embodiment, step S3: if the first preset test data is read from the specified partition location, performing a read / write test on the memory module to obtain the test result of the memory module includes: S31: Perform several read / write tests on the memory module according to a preset number of tests; the read / write test is as follows: after writing the preset write data into the memory module, read the stored data of the memory module to obtain the read data.
[0038] S32: Compare the read data and write data from the several read / write tests to obtain the test results.
[0039] In this test, the comparison between the read and write data in each read / write test determines the test result. If the read and write data are the same, the test is considered normal; if they are different, the test is considered abnormal. If the number of abnormal test occurrences is greater than or equal to a preset threshold, the test result indicates a memory module malfunction; if the number of abnormal test occurrences is less than the preset threshold, the test result indicates a normal memory module. The threshold is set by the user. Preferably, to improve test accuracy, read / write tests can be performed using several sets of write data, allowing adjacent read / write tests to use different write data to enhance accuracy.
[0040] In this embodiment, the memory module is subjected to read and write tests according to a preset number of tests. By comparing the read data and the written data, the test results of the memory module can be accurately obtained.
[0041] In a feasible embodiment, after step S32: comparing the read data and write data of the plurality of read-write tests to obtain the test results, the method further includes the following steps: S33: If the test result indicates that the memory module is normal, write the second preset test data to the specified partition location.
[0042] The second preset test data is 0x01.
[0043] S34: If the test result indicates that the memory module is faulty, write the third preset test data to the specified partition location.
[0044] The third preset test data is 0x02.
[0045] In this embodiment, by reading the stored data at the specified partition location, it is possible to quickly determine whether the memory module is normal or abnormal, which helps to improve the efficiency of classifying and processing the memory module.
[0046] In one feasible embodiment, the preset number of tests is obtained through the following steps: S311: Obtain the trained test count prediction model; wherein the test count prediction model is trained based on test count training samples, and the test count training samples include information parameters of memory stick samples, usage duration and corresponding test counts.
[0047] Whether a memory module is faulty is related to its information parameters and usage duration. For example, memory modules with poor performance or inferior hardware components are more prone to faults; memory modules with longer usage times are also more likely to malfunction. The trained test count prediction model can extract features from the information parameters, usage duration, and corresponding test counts of memory module samples to obtain the feature relationship between information parameters, usage duration, and corresponding test counts, which can then be used to predict the test count based on information parameters and usage duration.
[0048] S312: Input the information parameters and usage duration of the memory module into the test count prediction model to obtain the preset test count.
[0049] Since the test count training samples include information parameters, usage duration, and corresponding test counts of memory module samples, the trained test count prediction model can extract the feature correspondence between the information parameters, usage duration, and corresponding test counts of memory module samples from the training samples. Therefore, based on the information parameters and usage duration of the memory module, it can output the corresponding preset test counts. This allows for control of the test counts of corresponding memory modules based on different information parameters and usage durations, avoiding the disadvantages of long testing time, high cost, and low efficiency caused by using a uniform test count to test memory modules.
[0050] In this embodiment, the preset number of tests for the memory module is obtained based on the information parameters of the memory module, the usage duration, and the trained test count prediction model. This can effectively control the number of times and the time consumed by reading and writing data to the memory module, thereby improving testing efficiency.
[0051] In a feasible embodiment, the number of tests corresponding to the memory module sample is obtained through the following steps: S3111: Perform read and write tests on the memory module sample based on the initial number of tests to obtain multiple sample test results.
[0052] The initial number of tests is set by the user, for example, it can be set to 300 times, 3000 times, 5000 times, etc.
[0053] S3112: If all the multiple sample test results are normal, the preset basic test number will be used as the test number corresponding to the memory module sample.
[0054] The preset number of basic tests is less than the number of initial tests. The preset number of basic tests can be set to 30, 50, 80, 100, 120, etc.
[0055] When multiple sample tests all result in a normal result, it indicates that the corresponding memory module sample is normal. Therefore, when training the test count prediction model, the test count corresponding to the test count training sample constructed based on the information parameters and usage duration of the memory module sample can be reduced to the preset basic test count.
[0056] S3113: If there are test results of multiple samples with test anomalies, obtain the test number corresponding to the memory module sample based on the test number corresponding to the test anomaly and the preset basic test number.
[0057] If there are test results of multiple samples that are abnormal, it means that the corresponding memory stick sample is abnormal. Therefore, when training the test count prediction model, the test count corresponding to the test count training sample constructed based on the information parameters and usage duration of the memory stick sample needs to be increased by adding the test count corresponding to the test abnormality to the preset basic test count.
[0058] In this embodiment, the number of tests for a memory module sample is determined based on whether there are test anomalies in the results of multiple sample tests. This helps to obtain the test number requirements for different memory module samples, so as to accurately construct the correspondence between different information parameters, usage time and test number.
[0059] In a feasible embodiment, step S3113: obtaining the number of tests corresponding to the memory module sample based on the number of tests corresponding to the test anomaly and the preset basic number of tests, includes: S31131: Obtain the median number of tests based on the number of tests corresponding to the test anomalies; The median number of tests is the median or average number of tests corresponding to test anomalies in the memory module sample. For example, if the number of tests corresponding to test anomalies in the memory module sample is 60, 100, 120, 180, 200, etc., the median number of tests is 120 (median) or 180 (average).
[0060] S31132: Obtain a test correction value based on the test number corresponding to the test anomaly that is greater than the median value of the test number; The number correction value is obtained by the following formula:
[0061] in, This is a correction value for the number of times. The first one that is greater than the median of the stated number The number of tests corresponding to each test exception. The total number of test anomalies that is greater than the median of the stated number. This is the median number of times.
[0062] Taking a median of 120 as an example, the above formula corrects the number of occurrences in the example to 70.
[0063] S31133: Based on the median number of tests, the correction value of the number of tests, and the preset basic number of tests, obtain the number of tests corresponding to the memory module sample.
[0064] In this embodiment, by combining the median number of times corresponding to the test anomalies, the number of times correction, and the preset basic number of tests to obtain the number of tests corresponding to the memory module samples, the number of tests corresponding to the memory module samples with test anomalies can be increased. This allows the test number prediction model to output a larger number of tests when predicting memory modules with the same information parameters and usage time as the memory module samples, thereby improving test accuracy.
[0065] In a feasible embodiment, step S31133: obtaining the test count corresponding to the memory module sample based on the median count, the count correction value, and the preset base test count, includes: S311331: The first candidate test count is obtained based on the sum of the median count and the count correction value; S311332: Based on the sum of the median number of tests and the preset basic number of tests, obtain the second candidate number of tests; S311333: If the number of first candidate tests is greater than or equal to the number of second candidate tests, the number of first candidate tests shall be used as the number of tests corresponding to the memory module sample; if the number of first candidate tests is less than the number of second candidate tests, the number of second candidate tests shall be used as the number of tests corresponding to the memory module sample.
[0066] In this embodiment, the sum of the median number of tests and the corrected number of tests is compared with the sum of the median number of tests and the preset base number of tests to obtain a larger number of tests, thereby ensuring that the number of tests corresponding to memory module samples with test anomalies covers more of the number of test anomalies.
[0067] Please see Figure 3 The second embodiment of this application provides a testing apparatus 200 for a terminal device memory module, comprising: The first preset test data writing module 201 is used to write the first preset test data to a specified partition location of the terminal device; The specified partition location reading module 202 is used to read the stored data of the specified partition location after the terminal device restarts and initializes successfully; The read / write test execution module 203 is used to perform read / write tests on the memory module if the first preset test data is read from the specified partition location, and obtain the test results of the memory module.
[0068] It should be noted that the terminal device memory module testing apparatus 200 provided in the second embodiment of this application is only illustrated by the above-described division of functional modules when executing the terminal device memory module testing method. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the terminal device memory module testing apparatus 200 provided in the second embodiment of this application and the terminal device memory module testing method of the first embodiment of this application belong to the same concept, and its implementation process is detailed in the method embodiment, which will not be repeated here.
[0069] A third aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the terminal device memory module testing method described above.
[0070] A fourth aspect of this application provides a computer device including a storage device, a processor, and a computer program stored in the storage device and executable by the processor, wherein the processor executes the computer program to implement the steps of the testing method for a terminal device memory module as described above.
[0071] The device embodiments described above are merely illustrative. The components described as separate parts may or may not be physically separate, and the components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this application according to actual needs. Those skilled in the art can understand and implement this without any inventive effort.
[0072] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program products. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program product embodied on one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0073] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 The computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function selected in one or more boxes.
[0074] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function selected in one or more boxes.
[0075] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.
[0076] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.
[0077] Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can store information using any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.
[0078] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0079] The above are merely embodiments of this application and are not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.
Claims
1. A method for testing the memory module of a terminal device, characterized in that, include: Write the first preset test data to the specified partition location of the terminal device; After the terminal device restarts and initializes successfully, the stored data at the specified partition location is read; If the first preset test data is read from the specified partition location, a read / write test is performed on the memory module to obtain the test result of the memory module.
2. The testing method for a terminal device memory module according to claim 1, characterized in that, The step of performing a read / write test on the memory module and obtaining the test result of the memory module if the first preset test data is read from the specified partition location includes: The memory module is subjected to a number of read and write tests according to a preset number of tests. The read and write test is as follows: after writing the preset write data into the memory module, the stored data of the memory module is read to obtain the read data. The test results are obtained by comparing the read data and write data from the several read / write tests.
3. The testing method for a terminal device memory module according to claim 2, characterized in that, After the step of comparing the read data and write data from the several read / write tests to obtain the test results, the method further includes the following steps: If the test result indicates that the memory module is normal, the second preset test data is written to the specified partition location. If the test result indicates a memory module malfunction, the third preset test data will be written to the specified partition location.
4. The testing method for a terminal device memory module according to claim 2, characterized in that, The preset number of tests is obtained through the following steps: Obtain a trained test count prediction model; wherein the test count prediction model is trained based on test count training samples, and the test count training samples include information parameters of memory stick samples, usage duration and corresponding test counts; The information parameters and usage duration of the memory module are input into the test count prediction model to obtain the preset test count.
5. The testing method for a terminal device memory module according to claim 4, characterized in that, The number of tests corresponding to the memory module sample was obtained through the following steps: Based on the initial number of tests, read and write tests were performed on the memory module sample to obtain multiple sample test results. If all the multiple sample test results are normal, the preset basic number of tests will be used as the test number corresponding to the memory stick sample. If there are test results for multiple samples that are abnormal, the test count for the memory module sample is obtained based on the number of tests corresponding to the abnormal test and the preset basic test count.
6. The testing method for a terminal device memory module according to claim 5, characterized in that, The step of obtaining the number of tests corresponding to the memory module sample based on the number of tests corresponding to the test anomaly and the preset basic number of tests includes: Based on the number of tests corresponding to the aforementioned test anomalies, obtain the median number of tests. Based on the number of tests corresponding to test anomalies exceeding the median value, obtain the number correction value. The number of tests corresponding to the memory module sample is obtained based on the median number of tests, the correction value of the number of tests, and the preset basic number of tests.
7. The testing method for a terminal device memory module according to claim 6, characterized in that, The step of obtaining the test count corresponding to the memory module sample based on the median count, the count correction value, and the preset base test count includes: The first candidate test count is obtained by summing the median count and the corrected count. The second candidate test count is obtained by summing the median of the test counts and the preset base test counts. If the number of first candidate tests is greater than or equal to the number of second candidate tests, the number of first candidate tests is taken as the number of tests corresponding to the memory module sample; if the number of first candidate tests is less than the number of second candidate tests, the number of second candidate tests is taken as the number of tests corresponding to the memory module sample.
8. A testing device for a terminal device memory module, characterized in that, include: The first preset test data writing module is used to write the first preset test data to a specified partition location of the terminal device; The specified partition location reading module is used to read the stored data at the specified partition location after the terminal device restarts and initializes successfully; The read / write test execution module is used to perform read / write tests on the memory module if the first preset test data is read from the specified partition location, and obtain the test results of the memory module.
9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by the processor, it implements the steps of the testing method for the memory module of a terminal device as described in any one of claims 1 to 7.
10. A computer device, characterized in that: The device includes a storage device, a processor, and a computer program stored in the storage device and executable by the processor, wherein the processor executes the computer program to implement the steps of the testing method for a terminal device memory module as described in any one of claims 1 to 7.