Automatic single-use device voltage compatibility

Abstract

A system for adapting long-lived capital equipment to changing single-use device data storage technologies includes one or more memory devices storing instructions and one or more processors configured to execute the instructions to perform operations. The system includes a power supply configured to convert AC power to a plurality of DC voltages. A selector is configured to select one of the plurality of DC voltages. A level shifter is configured to receive the selected one of the plurality of DC voltages and transform a single-use device data storage voltage to the selected one of the plurality of DC voltages.

Description

Cross-references to related applications

[0001] This application claims priority to U.S. Provisional Patent Application No. 63 / 610,801, filed December 15, 2023, entitled “AUTOMATIC SINGLE-USE-DEVICEVOLTAGE COMPATIBILITY,” which is incorporated herein by reference in its entirety. Technical Field

[0002] This disclosure relates to a data storage technology for long-life capital equipment systems that adapts to constantly changing single-use devices. Background Technology

[0003] Capital equipment is not consumed during normal business operations and typically has a long service life. Capital equipment systems in the medical field can include control systems, RF generators, imaging systems, diagnostic equipment, monitors, and other systems. During the service life of a capital equipment system, single-use device (SUD) data storage technology can change. Single-use device (SUD) data storage includes EEPROM and other data storage devices.

[0004] One factor that has led to numerous changes in EEPROMs in recent years is the voltage logic level. The standard voltage level used for EEPROM communication has changed over time from 5V to 3.3V, with some devices reducing their voltage to 2.5V or even 1.8V. As older systems designed for 5V logic fail or require upgrades, it can be difficult to find viable alternatives for SUD data storage. At some point, 5V logic will become obsolete, necessitating potential hardware changes to capital equipment systems to allow them to communicate with more modern SUD data storage. There is a need to enable long-life capital equipment systems to easily adapt to evolving SUD data storage technologies. Summary of the Invention

[0005] Example 1 is a system for adapting long-life capital equipment to constantly changing single-use device data storage technology. The system includes a power supply configured to convert AC power into multiple DC voltages. A selector is configured to select one of the multiple DC voltages. The system includes a level shifter configured to receive the selected DC voltage and transform the single-use device data storage voltage into the selected DC voltage.

[0006] Example 2 is a system according to Example 1, wherein the selector is a manual voltage rail selector.

[0007] Example 3 is a system according to Example 1, wherein the selector is a digital switch voltage rail selector, or a digitally controlled voltage rail controlled by a configuration file.

[0008] Example 4 is a system according to Example 3, further comprising: a binary existence feature configured to identify that a single-use device data storage is connected to the system.

[0009] Example 5 is a system according to Example 4, wherein the configuration file controls a digital switch voltage rail selector based on information from a binary presence feature.

[0010] Example 6 is a system according to Example 1, the system comprising: one or more memory devices storing instructions; and one or more processors configured to execute the instructions to perform an operation.

[0011] Example 7 is a system according to Example 6, wherein the operation includes: detecting the presence of a single-use device data storage; selecting a first voltage from a plurality of DC voltages, the first voltage being the lowest voltage among the plurality of DC voltages; and converting the single-use device data storage voltage to the first voltage among the plurality of DC voltages.

[0012] Example 8 is a system according to Example 7, wherein the operation includes: performing a first test message exchange with the detected single-use storage device.

[0013] Example 9 is a system according to Example 8, wherein the operation includes: if the first test message exchange is successful, locking the first voltage of a plurality of DC voltages at the selector.

[0014] Example 10 is a system according to Example 8, wherein the operation includes: if the first test message exchange fails, selecting a second voltage from a plurality of DC voltages, the second voltage being a voltage higher than the first voltage from the plurality of DC voltages; and converting the single-use device data storage voltage to the second voltage from the plurality of DC voltages.

[0015] Example 11 is a system according to Example 10, wherein the operation includes: performing a second test message exchange with the detected single-use storage device.

[0016] Example 12 is a system according to Example 11, wherein the operation includes: if the second test message exchange is successful, locking the second voltage of a plurality of DC voltages at the selector.

[0017] Example 13 is a system according to Example 11, wherein the operation includes: if the second test message exchange is unsuccessful, selecting a third voltage from a plurality of DC voltages, the third voltage being a voltage higher than the second voltage from the plurality of DC voltages; and converting the one-time use device data storage voltage to the third voltage from the plurality of DC voltages.

[0018] Example 14 is a system according to Example 13, wherein the operation includes: performing a third test message exchange with the detected single-use storage device.

[0019] Example 15 is a system according to Example 14, wherein the operation includes: if the third test message exchange is successful, locking the third voltage among a plurality of DC voltages at the selector.

[0020] Example 16 is a system for adapting long-life capital equipment to constantly changing single-use device data storage technology. The system includes one or more memory devices storing instructions; and one or more processors configured to execute the instructions to perform operations. The system includes a power supply configured to convert AC power into a plurality of DC voltages. A selector is configured to select one of the plurality of DC voltages. A level shifter is configured to receive the selected one of the plurality of DC voltages and transform the single-use device data storage voltage into the selected one of the plurality of DC voltages.

[0021] Example 17 is a system according to Example 16, wherein the selector is a manual voltage rail selector.

[0022] Example 18 is a system according to Example 16, wherein the selector is a digital switch voltage rail selector, or a digitally controlled voltage rail controlled by a configuration file.

[0023] Example 19 is a system according to Example 18, further comprising: a binary existence feature configured to identify that a single-use device data storage is connected to the system.

[0024] Example 20 is a system according to Example 19, wherein the configuration file controls a digital switching voltage rail selector based on information from a binary presence feature.

[0025] Example 21 is a system according to Example 16, wherein the operation includes: detecting the presence of a single-use device data storage; selecting a first voltage from a plurality of DC voltages, the first voltage being the lowest voltage among the plurality of DC voltages; and converting the single-use device data storage voltage to the first voltage among the plurality of DC voltages.

[0026] Example 22 is a system according to Example 21, wherein the operation includes: performing a first test message exchange with the detected single-use storage device.

[0027] Example 23 is a system according to Example 22, wherein the operation includes: if the first test message exchange is successful, locking the first voltage of a plurality of DC voltages at the selector.

[0028] Example 24 is a system according to Example 22, wherein the operation includes: if the first test message exchange fails, selecting a second voltage from a plurality of DC voltages, the second voltage being a voltage higher than the first voltage from the plurality of DC voltages; and converting the single-use device data storage voltage to the second voltage from the plurality of DC voltages.

[0029] Example 25 is a system according to Example 24, wherein the operation includes: performing a second test message exchange with the detected single-use storage device.

[0030] Example 26 is a system according to Example 25, wherein the operation includes: if the second test message exchange is successful, locking the second voltage of a plurality of DC voltages at the selector.

[0031] Example 27 is a system according to Example 25, wherein the operation includes: if the second test message exchange is unsuccessful, selecting a third voltage from a plurality of DC voltages, the third voltage being a voltage higher than the second voltage from the plurality of DC voltages; and converting the one-time use device data storage voltage to the third voltage from the plurality of DC voltages.

[0032] Example 28 is a system according to Example 27, wherein the operation includes: performing a third test message exchange with the detected single-use storage device.

[0033] Example 29 is a system according to Example 28, wherein the operation includes: if the third test message exchange is successful, locking the third voltage among a plurality of DC voltages at the selector.

[0034] Example 30 is a system according to Example 28, wherein the operation includes: if the third test message exchange is unsuccessful, selecting a fourth voltage from a plurality of DC voltages, the fourth voltage being a higher voltage than the third voltage from the plurality of DC voltages; and converting the one-time use device data storage voltage to the fourth voltage from the plurality of DC voltages.

[0035] Example 31 is a method for adapting long-life capital equipment to a constantly changing single-use device data storage technology. The method includes: detecting the presence of a single-use device data storage. The method includes: selecting a first voltage from a plurality of DC voltages from a power supply. The method includes: converting the single-use device data storage voltage to the first voltage from the plurality of DC voltages; and performing a first test message exchange with the detected single-use storage device.

[0036] Example 32 is the method according to Example 31, further comprising: if the first test message exchange is successful, locking the first voltage of a plurality of DC voltages at the selector.

[0037] Example 33 is the method according to Example 31, further comprising: if the first test message exchange is unsuccessful, selecting a second voltage from a plurality of DC voltages, the second voltage being a voltage higher than the first voltage from the plurality of DC voltages; converting the single-use device data storage voltage to the second voltage from the plurality of DC voltages; and performing a second test message exchange with the detected single-use storage device.

[0038] Example 34 is the method according to Example 33, further comprising: if the second test message exchange is successful, locking the second voltage of a plurality of DC voltages at the selector.

[0039] Example 35 is the method according to Example 33, further comprising: if the second test message exchange is unsuccessful, selecting a third voltage from a plurality of DC voltages, the third voltage being a voltage higher than the second voltage from the plurality of DC voltages; and converting the one-time use device data storage voltage to the third voltage from the plurality of DC voltages.

[0040] While several embodiments have been disclosed, other embodiments of this disclosure will become apparent to those skilled in the art from the following detailed description, which illustrates and describes illustrative embodiments of this disclosure. Therefore, the drawings and detailed description should be considered illustrative in nature and not restrictive. Attached Figure Description

[0041] Figure 1 This is a schematic representation of a first embodiment of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology according to the present disclosure.

[0042] Figure 2 This is a schematic representation of a second embodiment of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology according to the present disclosure.

[0043] Figure 3This is a schematic representation of a third embodiment of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology according to the present disclosure.

[0044] Figure 4 This is a schematic representation of a fourth embodiment of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology according to the present disclosure.

[0045] Figure 5 This is a schematic representation of a fifth embodiment of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology according to the present disclosure.

[0046] Figure 6 A control system for data storage technology of a single-use device, according to the present disclosure, is shown for adapting long-life capital equipment to constantly changing single-use devices.

[0047] Figure 7 A method for data storage technology of a single-use device for adapting long-life capital equipment to constantly changing single-use devices, according to the present disclosure, is shown.

[0048] While this disclosure is open to various modifications and alternatives, specific embodiments have been shown by way of example in the accompanying drawings and are described in detail below. However, it is not intended to limit this disclosure to the specific embodiments described. Rather, this disclosure is intended to cover all modifications, equivalents, and alternatives that fall within the scope of this disclosure as defined by the appended claims. Detailed Implementation

[0049] For the purpose of facilitating an understanding of the principles of this disclosure, reference is now made to the examples shown in the accompanying drawings, which are described below. The illustrative examples disclosed herein are not intended to be exhaustive, nor are they intended to limit this disclosure to the precise forms disclosed in the following detailed description. Rather, these exemplary embodiments have been chosen and described so that others skilled in the art can utilize their teachings. Using a number (e.g., all) of the features in a given example across all examples does not exceed the scope of this disclosure. Therefore, no single drawing should be construed as having any dependency or requirement associated with any individual component or combination of components shown therein. Furthermore, the various components depicted in a given drawing may be integrated in the example with various components in other components (and / or components not shown) depicted therein, all of which are considered to be within the scope of this disclosure.

[0050] Figures 1 to 5Several embodiments of a system for adapting long-life capital equipment to constantly changing single-use device data storage technology are illustrated. Each embodiment relies on a voltage converter circuit. On one side of the converter, a fixed voltage level, such as a field-programmable gate array (FPGA), is provided at a firmware chip. The other side of the converter is connected to a SUD data storage. A switch is connected to multiple voltage rail inputs. The switch is configured to select one of these multiple voltage rail inputs and feed it to the converter. Figure 1 In this embodiment, the switch is a manual switch. Figure 2 and Figure 4 In this embodiment, the switch is a digitally controlled switch. Figure 3 and Figure 5 In one embodiment, the digitally controlled voltage rail acts as a switch.

[0051] Figure 1 This is a schematic representation of a first embodiment of a system for adapting long-life capital equipment 10 to constantly changing single-use device data storage technology according to the present disclosure. Figure 1 A simple manual variant is shown, which allows a service technician to modify the voltage level used by capital equipment 10 to communicate with the single-use device data storage 14. This variant features a manual voltage rail selector 16 configured to select one of a plurality of voltages generated by power supply 11, which converts AC power into a plurality of DC voltages. The selected voltage is fed into a level shifter 18 to transform the voltage of the single-use device data storage 14 into a voltage level that firmware / software 12 can understand and communicate with.

[0052] exist Figure 1 In the illustrated embodiment, the voltage level selected using the rail selector 16 is determined by manufacturing personnel during the initial manufacturing of capital equipment 10, or by service personnel at a later time, such as during a service call requiring replacement or upgrade of the single-use device data storage 14. This voltage level can be manually changed via service action. This allows service personnel to modify capital equipment 10 to be compatible with the new voltage level required to replace the single-use device data storage 14 procured by the supply chain team. No hardware upgrade to capital equipment 10 is required to make it compatible with the new voltage level.

[0053] Figure 2 This is a schematic representation of a second embodiment of a system for adapting long-life capital equipment 20 to constantly changing single-use device data storage technology according to this disclosure. Figure 1 The embodiments disclosed in the document are different. Figure 2 The embodiments do not require manual switching by manufacturing or service personnel.

[0054] Figure 2 The capital equipment 20 includes a power supply 21 that converts AC power into multiple DC voltages. These multiple DC voltages are provided on multiple voltage rails 25. A digital switch 26 is controlled by firmware / software 22 within the capital equipment 20. The firmware / software 22 communicates with a profile 27 that includes information associated with appropriate voltage levels related to various single-use device data storage 24. The software / firmware 22 updates the position of the digital switch 26 to select the appropriate voltage rail 25 so as to appropriately configure the current voltage level of the SUD 24 based on the profile 27. The digital switch 26 is fed into a level shifter 28 to transform the voltage of the SUD 24 into a voltage level that the firmware / software 22 can understand and communicate with. In some aspects, the software / firmware update can initiate the selection of an appropriate voltage level.

[0055] Figure 3 This is a schematic representation of a third embodiment of a system for adapting long-life capital equipment 20′ to a constantly changing single-use device data storage technology according to the present disclosure. Figure 3 The system and Figure 2 The system is similar, except for the digitally controlled voltage rail 25′.

[0056] Figure 3 The capital device 20' includes a power supply 21' that converts AC power into multiple DC voltages. These multiple DC voltages are supplied to a digitally controlled voltage rail 25'. The digitally controlled voltage rail 25' is controlled by firmware / software 22' within the capital device 20'. The firmware / software 22' communicates with a configuration file 27' that includes information associated with appropriate voltage levels related to various single-use device data storage 24'. The software / firmware 22' updates the digitally controlled voltage rail 25' to appropriately configure the current voltage level of SUD 24' based on the configuration file 27'. The digitally controlled voltage rail 25' is fed into a level shifter 28' to transform the voltage of SUD 24' into a voltage level that the firmware / software 22' can understand and communicate with. In some aspects, the software / firmware update can initiate the selection of an appropriate voltage level.

[0057] Figure 4 This is a schematic representation of a fourth embodiment of a system for adapting long-life capital equipment 30 to a constantly changing single-use device data storage technology according to the present disclosure. Figure 4 Implementation examples and Figure 2The embodiments are similar. However, instead of having a configuration file, the software / firmware 32 includes an algorithm for selecting an appropriate voltage level to allow the software / firmware 32 of the capital device 30 to communicate with the single-use device data storage 34. This variant has a digitally switched voltage rail selector 36 that is fed into a level shifter 38 to transform the voltage of the SUD 34 into a voltage level that the firmware / software 32 can understand. Furthermore, the SUD 34 also has a binary presence feature, allowing the presence detector 37 to determine when the SUD 34 is connected.

[0058] Figure 5 This is a schematic representation of a fifth embodiment of a system for adapting long-life capital equipment 30 to a constantly changing single-use device data storage technology according to the present disclosure. Figure 5 The system and Figure 4 The system is similar, except for the digitally controlled voltage rail 35'. The digitally controlled voltage rail 35' is fed into a level shifter 38' to convert the voltage of SUD 34' into a voltage level that the firmware / software 32' can understand. In addition, SUD 34' also has a binary presence feature, allowing the presence detector 37' to determine when SUD 34' is connected.

[0059] Figure 6 A control system 100 configured to adapt long-life capital equipment to evolving single-use device data storage technologies is illustrated according to one or more embodiments. In some embodiments, system 100 may include one or more computing platforms 102. Computing platforms 102 may be configured to communicate with one or more remote platforms 104 according to a client / server architecture, peer-to-peer architecture, and / or other architectures. Remote platforms 104 may be configured to communicate with other remote platforms via computing platforms 102 and / or according to a client / server architecture, peer-to-peer architecture, and / or other architectures. Users can access system 100 via remote platforms 104.

[0060] The computing platform 102 can be configured by machine-readable instructions 106. Machine-readable instructions 106 may include one or more instruction modules. These instruction modules may include computer program modules. These instruction modules may include one or more of the following: a detection module 108, a selection module 110, a transformation module 112, a test execution module 114, a setting module 116, and / or other instruction modules.

[0061] The detection module 108 is configured to detect the presence of the single-use device data storage. The detection module 108 can interact with a presence detector to determine when the SUD data storage is connected. Alternatively, the detection module 108 selects a neutral voltage level that elicits presence pulses generated by all voltage-level devices in the system. The detection module 108 performs "polling" on the communication bus by generating these pulses until a presence pulse for the SUD data storage is detected.

[0062] Selection module 110 is configured to select one of a plurality of DC voltages from a power supply. Selection module 110 can select one of the plurality of DC voltages to be fed into a level shifter to transform the one-time device data storage voltage into different voltage levels. In some embodiments, selection module 110 may use information from a configuration file to select one of the plurality of DC voltage rails. In other embodiments, selection module 110 may use an algorithm to select one of the plurality of DC voltage rails.

[0063] The conversion module 112 is configured to convert the voltage stored in the single-use device data into a voltage selected by the selection module 110. The conversion module 112 may include a level shifter to convert the voltage stored in the single-use device data into a voltage selected by the selection module 110.

[0064] Test execution module 114 is configured to perform one or more test message exchanges with the single-use device data store. These one or more test message exchanges may include one or more queries, calls, inputs, or other interactions with the single-use device data store. The one or more test message exchanges are executed to identify when the single-use device data store has a voltage that allows interaction and communication with the firmware / software of the capital equipment system.

[0065] The setting module 116 is configured to lock one of a plurality of DC voltages at the selector if the test message exchange performed by the test execution module 114 is successful.

[0066] In some implementations, computing platform 102, remote platform 104, and / or external resource 126 may be operatively linked via one or more electronic communication links. For example, such electronic communication links may be established at least in part via networks such as the Internet and / or other networks. It should be understood that this is not intended to be limiting, and the scope of this disclosure includes implementations in which computing platform 102, remote platform 104, and / or external resource 126 may be operatively linked via some other communication medium.

[0067] A given remote platform 104 may include one or more processors configured to execute a computer program module. This computer program module may be configured to enable an expert or user associated with the given remote platform 104 to interface with system 100 and / or external resource 126, and / or provide other functionalities attributed herein to the remote platform 104. By way of non-limiting example, the given remote platform 104 and / or the given computing platform 102 may include one or more of the following: a server, desktop computer, laptop computer, handheld computer, tablet computing platform, netbook, smartphone, game console, and / or other computing platform.

[0068] External resource 126 may include information sources outside of system 100, external entities that participate with system 100, and / or other resources. In some embodiments, some or all of the functions attributed herein to external resource 126 may be provided by resources included in system 100.

[0069] The computing platform 102 may include an electronic storage device 128, one or more processors 130, and / or other components. The computing platform 102 may include communication lines or ports to enable information exchange with networks and / or other computing platforms. Figure 4 The illustrations of computing platform 102 herein are not intended to be limiting. Computing platform 102 may include multiple hardware, software, and / or firmware components that operate together to provide the functionality attributed to computing platform 102 herein. For example, computing platform 102 may be implemented by a computing platform cloud that operates collectively as computing platform 102.

[0070] Electronic storage device 128 may include a non-transitory storage medium that stores information electronically. The electronic storage medium of electronic storage device 128 may include one or both of the following: a system storage device provided integrally with computing platform 102 (i.e., substantially non-removable), and / or a removable storage device removably connected to computing platform 102 via, for example, a port (e.g., USB port, FireWire port, etc.) or a drive (e.g., disk drive, etc.). Electronic storage device 128 may include one or more of the following: optically readable storage media (e.g., optical disc, etc.), magnetically readable storage media (e.g., magnetic tape, magnetic hard disk drive, floppy disk drive, etc.), charge-based storage media (e.g., EEPROM, RAM, etc.), solid-state storage media (e.g., flash drive, etc.), and / or other electronically readable storage media. Electronic storage device 128 may include one or more virtual storage resources (e.g., cloud storage, virtual private networks, and / or other virtual storage resources). Electronic storage device 128 may store software algorithms, information determined by processor 130, information received from computing platform 102, information received from remote platform 104, and / or other information that enables computing platform 102 to operate as described herein.

[0071] Processor 130 can be configured to provide information processing capabilities within computing platform 102. Therefore, processor 130 may include one or more of the following: a digital processor, an analog processor, digital circuitry designed to process information, analog circuitry designed to process information, a state machine, and / or other mechanisms for electronically processing information. Although processor 130 is in Figure 6 The processor 130 is shown as a single entity, but this is for illustrative purposes only. In some embodiments, the processor 130 may include multiple processing units. These processing units may be physically located within the same device, or the processor 130 may represent the processing functions of multiple devices operating in a coordinated manner. The processor 130 may be configured to execute modules 108, 110, 112, 114, and / or 116, and / or other modules. The processor 130 may be configured to execute modules 108, 110, 112, 114, and / or 116, and / or other modules through software, hardware, firmware, certain combinations of software, hardware, and / or firmware, and / or various other mechanisms for configuring processing capabilities on the processor 130. As used herein, the term "module" may refer to any part or collection of parts that performs the functions belonging to that module. This may include one or more physical processors, processor-readable instructions, circuitry, hardware, storage media, or any other parts during the execution of processor-readable instructions.

[0072] It should be recognized that, although modules 108, 110, 112, 114 and / or 116 are in Figure 6While illustrated as being implemented within a single processing unit, in embodiments where processor 130 includes multiple processing units, one or more of modules 108, 110, 112, 114, and / or 116 may be implemented remotely from other modules. The description below of the functionality provided by the different modules 108, 110, 112, 114, and / or 116 is for illustrative purposes and is not intended to be limiting, as any of modules 108, 110, 112, 114, and / or 116 may provide more or fewer functions than described. For example, one or more of modules 108, 110, 112, 114, and / or 116 may be omitted, and some or all of their functionality may be provided by other modules among modules 108, 110, 112, 114, and / or 116. As another example, processor 130 may be configured to execute one or more additional modules that may perform some or all of the functions belonging to one of modules 108, 110, 112, 114 and / or 116.

[0073] Figure 7 A method 200 for adapting long-life capital equipment to constantly changing single-use device data storage technology, according to one or more embodiments, is illustrated. The operational intent of the method 200 presented below is illustrative. In some embodiments, method 200 may be accomplished using one or more additional operations not described, and / or without one or more of the operations discussed. Furthermore, Figure 4 The order of operations of method 200 shown and described below is not intended to be limiting.

[0074] In some implementations, method 200 may be implemented in one or more processing devices (e.g., digital processors, analog processors, digital circuitry designed to process information, analog circuitry designed to process information, state machines, and / or other mechanisms for electronically processing information), incorporating hardware components or circuit systems. The one or more processing devices may include one or more means for performing some or all of the operations of method 200 in response to instructions electronically stored on an electronic storage medium. The one or more processing devices may include one or more means configured by hardware, firmware, and / or software specifically designed to perform one or more of the operations of method 200.

[0075] Operation 202 may include detecting the presence of a single-use device data store. In some embodiments, the presence detector may determine when the SUD data store is connected to the capital equipment system. Alternatively, a neutral "safe" voltage level capable of triggering a "presence" pulse generated by all voltage-level devices in the system may be "polled" on the communication bus until a presence pulse of the SUD data store is detected. The "safe" voltage level is low enough to ensure that no damage is caused to any connected SUD data store. According to one or more embodiments, operation 202 may be executed by one or more hardware processors configured with machine-readable instructions including modules identical or similar to the detection module 108 in combination with hardware and / or circuitry. Once the presence of the SUD data store is confirmed, the method proceeds to operation 204.

[0076] Operation 204 includes: selecting a first voltage from a plurality of DC voltages from a power supply, and setting a voltage rail to the first voltage. According to one or more embodiments, operation 204 may be performed by one or more hardware processors configured by machine-readable instructions comprising modules identical or similar to the selection module 110, combined with hardware and / or circuitry. In one aspect, the first voltage may be any of the plurality of DC voltages from the power supply. In another aspect, the first voltage may be the highest voltage among the plurality of DC voltages from the power supply. In yet another aspect, the first voltage level may be the lowest voltage among the plurality of DC voltages from the power supply.

[0077] Operation 206 may include converting the voltage stored in the single-use device into a first voltage among a plurality of DC voltages. According to one or more embodiments, operation 206 may be executed by one or more hardware processors configured with machine-readable instructions comprising modules identical or similar to the conversion module 112, combined with hardware and / or circuitry.

[0078] Operation 208 may include performing a test message exchange with the detected single-use device data store. This may include sending a general request to the detected single-use device data store. For example, a known register read request may be sent to the detected single-use device data store. The first test message exchange may include one or more queries, calls, inputs, or other interactions with the single-use device data store. The test message exchange is performed to identify when the single-use device data store has a voltage that allows interaction and communication with the firmware / software of the capital device system. According to one or more embodiments, operation 208 may be executed by one or more hardware processors configured with machine-readable instructions including modules that are the same as or similar to test execution module 114.

[0079] Operation 210 includes determining whether an appropriate response or valid message has been received in response to a test message. If an appropriate response is received, method 200 moves to operation 212, in which the first voltage is locked at the selector. This voltage level is now "locked" until the generator is turned off, or until a specific amount of time has elapsed after the last SUD data storage is disconnected. According to one or more embodiments, operation 210 can be executed by one or more hardware processors configured with machine-readable instructions including modules identical or similar to setup module 116. At this time, communication between the firmware / software of the capital equipment system and the SUD can be performed at operation 214.

[0080] If no appropriate response is received, method 200 proceeds to operation 216, in which operation 216 includes selecting the next voltage from a plurality of DC voltages from the power supply and setting the voltage rail to the next voltage. In some aspects, selecting the next voltage includes increasing the voltage. In some aspects, selecting the next voltage includes decreasing the voltage. In some aspects, selecting the next voltage includes selecting the lowest possible voltage from a plurality of DC voltages. In some aspects, selecting the next voltage includes selecting the highest possible voltage from a plurality of DC voltages. According to one or more embodiments, operation 216 may be executed by one or more hardware processors configured by a combination of machine-readable instructions including modules identical or similar to selection module 110, in conjunction with hardware and / or circuitry.

[0081] At operation 218, it is determined whether the maximum voltage for the system has been exceeded. If the maximum voltage has not been exceeded, method 200 includes converting the single-use device data storage voltage to the next of a plurality of DC voltages. According to one or more embodiments, this can be performed by one or more hardware processors configured by machine-readable instructions comprising modules identical or similar to the conversion module 112 in combination with hardware and / or circuitry. If the maximum voltage has been exceeded, method 200 can restart by setting a “safe” neutral voltage and querying for the presence of the SUD data storage.

[0082] The method returns to operation 208, where a test message exchange is performed with the single-use device data store at the next voltage level. This may include sending a general request to the detected single-use device data store. For example, a known register read request may be sent to the detected single-use device data store. The next test message exchange may include one or more queries, calls, inputs, or other interactions with the single-use device data store. According to one or more embodiments, operation 208 may be performed by one or more hardware processors configured with machine-readable instructions including modules that are the same as or similar to test execution module 114.

[0083] Therefore, method 200 continues until a valid message is received at operation 210, and the current voltage level is locked and set as the operating voltage of the capital equipment system.

[0084] It is well known that, for methods comprising one or more steps, the order listed does not constitute a limitation on the claims unless there is an explicit or implicit statement to the contrary in the specification or the claims themselves. It is also recognized that the methods shown are merely some examples among the many examples disclosed, and certain steps may be added or omitted without departing from the scope of this disclosure. Such steps may include combining apparatus, systems, or methods or components thereof, as well as those well-known, routine, and conventional in the art.

[0085] The connecting lines shown in the various figures included herein are intended to illustrate exemplary functional relationships and / or physical couplings between various elements. It should be noted that many alternative or additional functional relationships or physical connections may exist in a real system. However, benefits, advantages, solutions to problems, and any element that may cause any benefit, advantage, or solution to occur or become more apparent should not be construed as a critical, essential, or fundamental feature or element. Therefore, the scope is not limited to anything other than the appended claims, where references to elements in the singular form are not intended to mean "one and only one" but rather "one or more" unless expressly stated otherwise. Furthermore, where phrases similar to "at least one of A, B, or C" are used in the claims, it is intended that such phrase be interpreted as meaning that: A may be present alone in an embodiment, B may be present alone in an embodiment, C may be present alone in an embodiment, or any combination of elements A, B, or C may be present in a single embodiment; for example, A and B, A and C, B and C, or A and B and C. The terms “coupled,” “coupled,” “connected,” “attached,” and their variations are used to describe arrangements that include two or more components in direct physical contact with each other, as well as arrangements in which two or more components are not in direct contact with each other (e.g., components are “coupled” via at least a third component) but still cooperate or interact with each other.

[0086] In the detailed description herein, references to "an embodiment," "embodiment," "exemplary embodiment," etc., indicate that the described embodiment may include specific features, structures, or characteristics, but each embodiment may not necessarily include specific features, structures, or characteristics. Furthermore, such phrases do not necessarily refer to the same embodiment. Moreover, when specific features, structures, or characteristics are described in connection with embodiments, it should be noted that those skilled in the art, benefiting from this disclosure, can influence these features, structures, or characteristics in conjunction with other embodiments (whether explicitly described or not). Upon reading the description, it will be apparent to those skilled in the art how this disclosure can be implemented in alternative embodiments.

[0087] Various modifications and additions may be made to the exemplary embodiments discussed without departing from the scope of this disclosure. For example, while the embodiments described above relate to specific features, the scope of this disclosure also includes embodiments with different combinations of features and embodiments that do not include all of the described features. Therefore, the scope of this disclosure is intended to cover all such alternatives, modifications, and variations, and all equivalents thereof, as falling within the scope of the claims.

Claims

1. A system for adapting long-life capital equipment to constantly changing single-use device data storage technology, the system comprising: A power source configured to convert AC power into multiple DC voltages; A selector configured to select one of the plurality of DC voltages; as well as A level shifter configured to receive one of the plurality of DC voltages and to convert a one-time device data storage voltage into one of the plurality of DC voltages.

2. The system according to claim 1, wherein, The selector is a manual voltage rail selector.

3. The system according to claim 1, wherein, The selector is a digital switch voltage rail selector, or a digitally controlled voltage rail controlled by a configuration file.

4. The system according to claim 3, further comprising: A binary presence feature, configured to identify that a single-use device data storage is connected to the system.

5. The system according to claim 4, wherein, The configuration file controls the digital switch voltage rail selector based on information from the binary existence feature.

6. The system according to claim 1, further comprising: One or more memory devices, wherein the one or more memory devices store instructions; as well as One or more processors, the one or more processors being configured to execute the instructions to perform an operation.

7. The system according to claim 6, wherein, The operation includes: Detects the presence of data stored in single-use devices; Select a first voltage from the plurality of DC voltages, wherein the first voltage is the lowest voltage among the plurality of DC voltages; and The voltage stored in the disposable device is converted into the first voltage among the plurality of DC voltages.

8. The system according to claim 7, wherein, The operation includes: Perform the first test message exchange with the tested single-use storage device.

9. The system according to claim 8, wherein, The operation includes: If the first test message exchange is successful, then the first voltage among the plurality of DC voltages is locked at the selector.

10. The system according to claim 8, wherein, The operation includes: If the first test message exchange fails, then a second voltage from the plurality of DC voltages is selected, wherein the second voltage is a higher voltage than the first voltage from the plurality of DC voltages; and The voltage stored in the disposable device is converted into a second voltage among the plurality of DC voltages.

11. The system according to claim 10, wherein, The operation includes: Perform a second test message exchange with the tested single-use storage device.

12. The system according to claim 11, wherein, The operation includes: If the second test message exchange is successful, then the second voltage among the plurality of DC voltages is locked at the selector.

13. The system according to claim 11, wherein, The operation includes: If the second test message exchange fails, a third voltage from the plurality of DC voltages is selected, wherein the third voltage is a higher voltage than the second voltage from the plurality of DC voltages; and The voltage stored in the disposable device is converted into a third voltage among the plurality of DC voltages.

14. The system according to claim 13, wherein, The operation includes: Perform a third test message exchange with the tested single-use storage device.

15. The system according to claim 14, wherein, The operation includes: If the third test message exchange is successful, then the third voltage among the plurality of DC voltages is locked at the selector.

16. A system for adapting long-life capital equipment to constantly changing single-use device data storage technology, the system comprising: One or more memory devices, wherein the one or more memory devices store instructions; One or more processors, the one or more processors being configured to execute the instructions to perform an operation; A power source configured to convert AC power into multiple DC voltages; A selector configured to select one of the plurality of DC voltages; as well as A level shifter configured to receive one of the plurality of DC voltages and to convert a one-time device data storage voltage into one of the plurality of DC voltages.

17. The system according to claim 16, wherein, The selector is a manual voltage rail selector.

18. The system according to claim 16, wherein, The selector is a digital switch voltage rail selector, or a digitally controlled voltage rail controlled by a configuration file.

19. The system of claim 18, further comprising: A binary presence feature, configured to identify that a single-use device data storage is connected to the system.

20. The system according to claim 19, wherein, The configuration file controls the digital switch voltage rail selector based on information from the binary existence feature.

21. The system according to claim 16, wherein, The operation includes: Detects the presence of data stored in single-use devices; Select a first voltage from the plurality of DC voltages, wherein the first voltage is the lowest voltage among the plurality of DC voltages; and The voltage stored in the disposable device is converted into the first voltage among the plurality of DC voltages.

22. The system according to claim 21, wherein, The operation includes: Perform the first test message exchange with the tested single-use storage device.

23. The system according to claim 22, wherein, The operation includes: If the first test message exchange is successful, then the first voltage among the plurality of DC voltages is locked at the selector.

24. The system according to claim 22, wherein, The operation includes: If the first test message exchange fails, then a second voltage from the plurality of DC voltages is selected, wherein the second voltage is a higher voltage than the first voltage from the plurality of DC voltages; and The voltage stored in the disposable device is converted into a second voltage among the plurality of DC voltages.

25. The system according to claim 24, wherein, The operation includes: Perform a second test message exchange with the tested single-use storage device.

26. The system according to claim 25, wherein, The operation includes: If the second test message exchange is successful, then the second voltage among the plurality of DC voltages is locked at the selector.

27. The system according to claim 25, wherein, The operation includes: If the second test message exchange fails, a third voltage from the plurality of DC voltages is selected, wherein the third voltage is a higher voltage than the second voltage from the plurality of DC voltages; and The voltage stored in the disposable device is converted into a third voltage among the plurality of DC voltages.

28. The system according to claim 27, wherein, The operation includes: Perform a third test message exchange with the tested single-use storage device.

29. The system according to claim 28, wherein, The operation includes: If the third test message exchange is successful, then the third voltage among the plurality of DC voltages is locked at the selector.

30. The system according to claim 28, wherein, The operation includes: If the third test message exchange fails, a fourth voltage from the plurality of DC voltages is selected, wherein the fourth voltage is a higher voltage than the third voltage from the plurality of DC voltages; and The voltage stored in the disposable device is converted into a fourth voltage among the plurality of DC voltages.

31. A method for adapting long-life capital equipment to constantly changing single-use device data storage technology, the method comprising: Detects the presence of data stored in single-use devices; Select the first voltage from a plurality of DC voltages from the power supply; The voltage stored in the disposable device is converted into a first voltage among the plurality of DC voltages; as well as Perform the first test message exchange with the tested single-use storage device.

32. The method of claim 31, further comprising: If the first test message exchange is successful, the first voltage among the plurality of DC voltages is locked at the selector.

33. The method of claim 31, further comprising: If the first test message exchange fails, then the second voltage among the plurality of DC voltages is selected, wherein the second voltage is a higher voltage than the first voltage among the plurality of DC voltages; The voltage of the single-use device data storage is converted into a second voltage among the plurality of DC voltages; as well as Perform a second test message exchange with the tested single-use storage device.

34. The method of claim 33, further comprising: If the second test message exchange is successful, the second voltage among the plurality of DC voltages is locked at the selector.

35. The method of claim 33, further comprising: If the second test message exchange fails, then a third voltage among the plurality of DC voltages is selected, wherein the third voltage is a higher voltage than the second voltage among the plurality of DC voltages; as well as The voltage stored in the disposable device is converted into a third voltage among the plurality of DC voltages.

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