A burn-in system for increasing the number of re-inspection stations and a burn-in output automatic acquisition method

Abstract

The application discloses a burn-in system capable of increasing the number of review stations and a burn-in output automatic acquisition method, and belongs to the technical field of burn-in technology in the process of electronic component and device testing and screening. The system comprises a burn-in system host, a burn-in board, a burn-in drive board and an adapter board. The burn-in board is arranged in an oven of the burn-in system host, the burn-in drive board is arranged outside the oven, and the adapter board is connected between the burn-in board and the burn-in drive board. A plurality of burn-in stations are arranged on the burn-in board, and output ends of the burn-in stations are respectively connected with corresponding input channels on the adapter board. A channel expansion circuit is arranged on the adapter board, an output end of the channel expansion circuit is connected with a review channel on the burn-in drive board, and the channel expansion circuit is used for selectively switching output signals of multiple input channels to the same review channel for output.

Description

Technical Field

[0001] This invention belongs to the technical field of aging technology in the sieving process of electronic components, and relates to an aging system that increases the number of re-inspection stations and an automatic acquisition method for aging output. Background Technology

[0002] With the rapid development of the electronics and information industry, the demand for integrated circuits, as core components, is becoming increasingly urgent. The market has placed more stringent demands on the production capacity, efficiency, and reliability of integrated circuit products than ever before, especially for circuits used in high-reliability fields such as aerospace, industrial control, and automotive electronics. Their long-term operational stability and early failure screening are crucial to system safety. Burn-in testing, as a core step in integrated circuit reliability screening, aims to eliminate early component failures through high-temperature environments and electrical stress loading. It is a critical process throughout product quality control, production cost management, and production efficiency improvement. During burn-in, real-time monitoring of output signals is essential for achieving closed-loop control, evaluating circuit status, and ensuring the effectiveness of screening; it is a 100% screening item that must be performed on every circuit. As burn-in processes evolve towards automation and intelligence, higher demands are placed on the real-time performance, comprehensiveness, and accuracy of data acquisition, status monitoring, and process control during burn-in, directly impacting burn-in efficiency and process reliability.

[0003] Currently, the mainstream integrated circuit aging equipment is a 32-channel fully automated high-temperature dynamic aging system. This system has inherent limitations in its design architecture, namely, a maximum of 64 retesting channels per channel. Due to this hardware resource limitation, a single aging board can only support a maximum of 64 test stations under conventional design, and this configuration is only applicable to single-output circuits (i.e., each circuit outputs only one signal). However, for multi-output circuits (with ≥2 output channels per circuit), the number of stations that can be designed on a single board is drastically reduced to ≤32 because each circuit needs to occupy multiple retesting channels. When the circuit under test is a high-density multi-output circuit (e.g., with ≥64 output channels per circuit) or requires simultaneous dynamic monitoring of multiple outputs, the existing aging system's hardware architecture is completely unable to meet the automatic retesting requirements.

[0004] To address the aforementioned issue of insufficient back-inspection resources, the industry's conventional solution is to commission equipment suppliers to custom-develop dedicated aging systems that expand the number of back-inspection channels. However, such customized equipment not only has a long development cycle and high cost, but also lacks versatility and is difficult to adapt to the multi-variety, batch-oriented, and fast-paced research and production tasks. Therefore, under the pressure of existing production capacity, most multi-output circuits cannot actually achieve full-station, full-channel automatic back-inspection during the aging process. In actual production operations, engineers typically only manually measure the output signals point by point using an oscilloscope probe on a test bench during the circuit board mounting and unmounting stages, as an alternative quality confirmation method. This traditional manual measurement method has serious limitations: firstly, the measurement results are highly dependent on the operator's skill level and operating habits, and the risk of human error is high; secondly, manual point-by-point inspection is extremely inefficient, making it difficult to guarantee coverage and real-time effectiveness throughout the aging cycle; thirdly, sampling or point-by-point inspection only at the upper and lower aging nodes is essentially a static inspection, which cannot achieve dynamic status assessment of the entire aging process. If we force all inspection stations to be fully automated, the existing equipment resources will not be able to support it. This will seriously delay the progress of scientific research and production, significantly increase the aging cost per unit circuit, and ultimately make it impossible to achieve the goal of large-scale, low-cost, and high-efficiency aging production. Summary of the Invention

[0005] The purpose of this invention is to solve the technical problem that existing integrated circuit aging systems cannot meet the needs of automatic real-time back inspection of multi-output circuits at all stations and throughout the entire process due to the fixed and limited hardware resources of the back inspection channels, and can only rely on inefficient and unreliable manual inspection. This invention provides an aging system with an increased number of back inspection stations and an automatic acquisition method for aging output.

[0006] To achieve the above objectives, the present invention employs the following technical solution: In a first aspect, the present invention discloses an aging system for increasing the number of re-inspection stations, characterized in that it includes an aging system host, an aging board, an aging drive board, and a converter board. The aging plate is installed inside the oven of the aging system host, the aging drive board is installed outside the oven, and the adapter board is connected between the aging plate and the aging drive board. The aging plate is provided with several aging stations, and the output terminal of each aging station is connected to the corresponding input channel on the adapter board. The adapter board is provided with a channel expansion circuit, and the output terminal of the channel expansion circuit is connected to the feedback channel on the aging drive board. The channel expansion circuit is used to selectively switch the output signals of multiple input channels to the same feedback channel. The aging drive board is communicatively connected to the host computer of the aging system host and is used to feed back the collected output signals to the host computer for status judgment.

[0007] Further improvements are made in the following aspects: One end of the adapter board is provided with a connector adapted to the gold finger interface of the old refining board. The gold fingers of the old refining board are pluggably connected to the adapter board through the connector, and an anti-misinsertion structure is provided between the gold fingers and the connector. The other end of the adapter board is provided with a connector adapted to the interface of the old refining drive board. The adapter board is pluggably connected to the old refining drive board through the connector.

[0008] The channel expansion circuit is an analog switch circuit, which includes at least one analog switch chip. Multiple input, output I and O pins of each analog switch chip are connected one-to-one with the device output terminal of the corresponding aging station. The common input / output terminal of each analog switch chip is connected one-to-one with the corresponding feedback channel on the aging driver board. The address terminal and enable terminal of the analog switch chip are connected to the control signal output terminal of the aging system host.

[0009] The analog switch chip is any one of a 4-channel analog switch, an 8-channel analog switch, or a 16-channel analog switch. The number of channels of each analog switch chip is configured according to the number of output channels of the device under test and the feedback requirements. The analog switch circuit expands the number of feedback channels by cascading multiple analog switch chips.

[0010] The aging system host provides power supply voltage, address control signal, and enable control signal to the analog switch chip on the adapter board through the gold finger interface of the aging board.

[0011] The adapter board is equipped with direction markings, and the connectors at both ends of the adapter board adopt an anti-reverse insertion structure design.

[0012] The aging and refining drive board is equipped with a signal acquisition module. The input end of the signal acquisition module is connected to the output end of the adapter board, and the output end of the signal acquisition module is connected to the host computer of the aging and refining system. The signal acquisition module is used to acquire the output signals of each workstation and transmit them to the host computer. The host computer displays the received output signals on the oscilloscope interface.

[0013] Secondly, this invention discloses an automatic data acquisition method for aging output that increases the number of re-inspection stations, implemented based on the aforementioned aging system that increases the number of re-inspection stations, comprising: The device under test is installed on each aging station of the aging plate, the aging plate is placed in the oven of the aging system host, and the adapter board is connected between the aging plate and the aging drive board. The host of the aging system applies an excitation signal and a high-temperature environment to the device under test, driving the device under test to perform high-temperature dynamic aging. The host of the aging system sends a channel selection control signal to the channel expansion circuit on the adapter board, so that the channel expansion circuit connects the target input channel among its multiple input channels with the corresponding return test channel. The channel expansion circuit transmits the selected aging station output signal to the host computer of the aging system host via the aging driver board; The host computer receives and processes the output signal to perform imaging display and status judgment.

[0014] During the aging process, the host computer outputs different address control signals to the channel expansion circuit in a preset timing sequence, and selects the output channels of each aging station in a round-robin manner to realize real-time, cyclic automatic monitoring and acquisition of the output status of each station of the multi-output device.

[0015] The output signal of the aging station is output to the adapter board via the gold finger interface of the aging board. After being selected by the channel expansion circuit, it is transmitted by the adapter board to the aging driver board. After being acquired by the signal acquisition module on the aging driver board, it is uploaded to the host computer. The host computer compares the output signal with a preset threshold. If the output signal exceeds the preset threshold range, it determines that the aging state of the corresponding device is abnormal.

[0016] Compared with the prior art, the present invention has the following beneficial effects: This invention discloses an aging system that increases the number of re-inspection stations. Through a separate architecture design of the aging board, adapter board, and aging driver board, the aging board is placed inside an oven for high-temperature aging, while the adapter board and channel expansion circuitry are located in a normal-temperature environment outside the oven. This ensures normal aging of the devices under test (DUTs) in a high-temperature environment while preventing the channel expansion circuitry from suffering adverse effects on the stability and lifespan of electronic components caused by the high-temperature oven. Thus, flexible expansion of re-inspection channel resources is achieved while ensuring long-term reliable system operation. Simultaneously, the introduction of channel expansion circuitry on the adapter board allows multiple output signals to time-division multiplex the same re-inspection channel, breaking the rigid constraint of the traditional one-to-one re-inspection architecture on the number of re-inspection channels. This means the number of stations that can be designed on a single aging board is no longer limited by the inherent re-inspection channel limit of the aging system host, significantly improving the station integration of multi-output circuits and the single-batch aging capacity. Furthermore, this invention utilizes an adapter board as an intermediate connection between the aging board and the driver board, eliminating the need for hardware modifications or costly custom development of existing aging system mainframes. It achieves compatibility with existing interfaces of mainstream 32-channel fully automatic high-temperature dynamic aging systems simply through the adapter board's interface adaptation and the modular design of the channel expansion circuit. This significantly reduces equipment upgrade costs and shortens the modification cycle, demonstrating excellent versatility and promotional value. At the operational level, the channel expansion circuit, controlled by the host computer, enables automatic polling and switching control of output signals from each station, replacing the traditional manual point-by-point measurement method relying on oscilloscope probes. This fundamentally eliminates the impact of human error on the test results. Simultaneously, it incorporates the entire aging process into an automated monitoring system, transforming manual inspections previously limited to the upper and lower board nodes into real-time, cyclical, and automatic back-inspections covering the entire aging cycle, effectively ensuring the coverage and effectiveness of process monitoring. Ultimately, this invention effectively reduces the aging production time and labor costs per unit circuit while ensuring aging quality, solves the capacity bottleneck problem of the aging process in mass production tasks, and provides reliable technical support for the high-efficiency, low-cost, and large-scale aging screening of domestically produced components.

[0017] This invention discloses an automatic acquisition method for aging output to increase the number of re-inspection stations. By installing the device under test (DUT) at each station of the aging board, the aging system host applies a unified excitation signal and a high-temperature environment, causing all stations to synchronously enter a high-temperature dynamic aging state, ensuring the consistency and parallelism of aging test conditions. Based on this, the method sends a channel selection control signal to the channel expansion circuit on the adapter board through the aging system host, realizing time-division multiplexing and switching control of multiple input channels. This allows a limited number of re-inspection channels to cover a larger number of aging stations in a round-robin manner, thereby multiplying the number of stations that can be monitored per batch without increasing the hardware resources of the aging system host, significantly improving re-inspection coverage and aging efficiency. Simultaneously, the above method uses a host computer to centrally receive, image, display, and judge the status of the selected output signals, incorporating the output status originally scattered across each station into a unified data processing platform. This allows operators to monitor the aging status of all devices at all stations in real time without manual measurement at each point. This method fundamentally changes the traditional manual inspection mode that relies on oscilloscope probes at the upper and lower aging nodes. It eliminates measurement errors and blind spots introduced by human operation, enabling the output status of each station to be automatically and cyclically collected and recorded according to a preset time sequence throughout the entire aging cycle, effectively ensuring the real-time, comprehensive, and effective process monitoring. Furthermore, this method fully utilizes the existing interfaces and resources of mainstream aging equipment. Functional upgrades can be achieved simply by optimizing the control logic and cooperating with the adapter board channel expansion circuit, without requiring hardware modifications to the aging system host, thus lowering the threshold and cost of implementation. In mass production scenarios, this method can significantly shorten the manual intervention time for a single batch of aging, reducing the time and equipment occupancy costs caused by forced batch aging due to insufficient monitoring capabilities. It effectively alleviates the capacity pressure of the aging process in scientific research and production, providing an efficient, reliable, and economical automated monitoring method for the aging screening of multi-variety, high-volume integrated circuit devices. Attached Figure Description

[0018] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0019] Figure 1 This is a schematic diagram of an analog switch design on an old-fashioned adapter board in an embodiment of the present invention; Figure 2 This is a flowchart of an automatic data acquisition method for increasing the number of refining stations in an embodiment of the present invention. Detailed Implementation

[0020] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0021] Therefore, the following detailed description of the embodiments of the invention provided in the accompanying drawings is not intended to limit the scope of the claimed invention, but merely to illustrate selected embodiments of the invention. All other embodiments obtained by those skilled in the art based on the embodiments of the invention without inventive effort are within the scope of protection of the invention.

[0022] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0023] The present invention will now be described in further detail with reference to the accompanying drawings: See Figure 1 This invention discloses an aging system for increasing the number of re-inspection stations, comprising an aging system host, an aging plate, an aging drive board, and a converter board. The aging plate is disposed inside the oven of the aging system host, the aging drive board is disposed outside the oven, and the converter board connects the aging plate and the aging drive board. The aging plate has a plurality of aging stations, and the output terminal of each aging station is connected to a corresponding input channel on the converter board. The converter board has a channel expansion circuit, the output terminal of which is connected to a re-inspection channel on the aging drive board. The channel expansion circuit is used to selectively switch the output signals of multiple input channels to the same re-inspection channel. The aging drive board is communicatively connected to the host computer of the aging system host and is used to feed back the collected output signals to the host computer for status judgment. The aging and refining drive board is equipped with a signal acquisition module. The input end of the signal acquisition module is connected to the output end of the adapter board, and the output end of the signal acquisition module is connected to the host computer of the aging and refining system. The signal acquisition module is used to acquire the output signals of each workstation and transmit them to the host computer. The host computer displays the received output signals on the oscilloscope interface.

[0024] The adapter board is equipped with direction markings, and the connectors at both ends of the adapter board adopt an anti-reverse insertion structure design. One end of the adapter board is equipped with a connector adapted to the gold finger interface of the aging board. The gold fingers of the aging board are pluggable and detachable to the adapter board through the connector, and an anti-misinsertion structure is provided between the gold fingers and the connector. The other end of the adapter board is equipped with a connector adapted to the interface of the aging drive board. The adapter board is pluggable and detachable to the aging drive board through the connector. The channel expansion circuit is an analog switch circuit, which includes at least one analog switch chip. Multiple input, output I, and O pins of each analog switch chip are connected one-to-one to the device output terminal of the corresponding aging station. The common input / output terminal of each analog switch chip is connected one-to-one to the corresponding feedback channel on the aging drive board. The address terminal and enable terminal of the analog switch chip are connected to the control signal output terminal of the aging system host. The analog switch chip is any one of a 4-channel, 8-channel, or 16-channel analog switch. The number of channels of each analog switch chip is configured according to the number of output channels of the device under test and the feedback requirements. The analog switch circuit expands the number of feedback channels by cascading multiple analog switch chips. The aging system host provides power supply voltage, address control signals, and enable control signals to the analog switch chips on the adapter board through the gold finger interface of the aging board.

[0025] This invention discloses an aging system that increases the number of re-inspection stations. Through a separate architecture design of the aging board, adapter board, and aging driver board, the aging board is placed inside an oven for high-temperature aging, while the adapter board and channel expansion circuitry are located in a normal-temperature environment outside the oven. This ensures normal aging of the devices under test (DUTs) in a high-temperature environment while preventing the channel expansion circuitry from suffering adverse effects on the stability and lifespan of electronic components caused by the high-temperature oven. Thus, flexible expansion of re-inspection channel resources is achieved while ensuring long-term reliable system operation. Simultaneously, the introduction of channel expansion circuitry on the adapter board allows multiple output signals to time-division multiplex the same re-inspection channel, breaking the rigid constraint of the traditional one-to-one re-inspection architecture on the number of re-inspection channels. This means the number of stations that can be designed on a single aging board is no longer limited by the inherent re-inspection channel limit of the aging system host, significantly improving the station integration of multi-output circuits and the single-batch aging capacity. Furthermore, this invention utilizes an adapter board as an intermediate connection between the aging board and the driver board, eliminating the need for hardware modifications or costly custom development of existing aging system mainframes. It achieves compatibility with existing interfaces of mainstream 32-channel fully automatic high-temperature dynamic aging systems simply through the adapter board's interface adaptation and the modular design of the channel expansion circuit. This significantly reduces equipment upgrade costs and shortens the modification cycle, demonstrating excellent versatility and promotional value. At the operational level, the channel expansion circuit, controlled by the host computer, enables automatic polling and switching control of output signals from each station, replacing the traditional manual point-by-point measurement method relying on oscilloscope probes. This fundamentally eliminates the impact of human error on the test results. Simultaneously, it incorporates the entire aging process into an automated monitoring system, transforming manual inspections previously limited to the upper and lower board nodes into real-time, cyclical, and automatic back-inspections covering the entire aging cycle, effectively ensuring the coverage and effectiveness of process monitoring. Ultimately, this invention effectively reduces the aging production time and labor costs per unit circuit while ensuring aging quality, solves the capacity bottleneck problem of the aging process in mass production tasks, and provides reliable technical support for the high-efficiency, low-cost, and large-scale aging screening of domestically produced components.

[0026] See Figure 2 This invention discloses a method for automatically acquiring aging outputs to increase the number of rework stations, comprising: Step 1: Install the device under test on each aging station of the aging plate, place the aging plate in the oven of the aging system host, and connect the adapter board between the aging plate and the aging drive board. Step 2: Apply an excitation signal and a high-temperature environment to the device under test through the host of the aging system to drive the device under test to perform high-temperature dynamic aging; Step 3: The host of the aging system sends a channel selection control signal to the channel expansion circuit on the adapter board, so that the channel expansion circuit connects the target input channel among its multiple input channels with the corresponding return test channel. Step four: The channel expansion circuit transmits the selected aging station output signal to the host computer of the aging system host via the aging driver board. Step 5: The host computer receives and processes the output signal, performing imaging display and status judgment. During the aging process, the host computer sequentially outputs different address control signals to the channel expansion circuit according to a preset timing sequence, selecting the output channels of each aging station in a round-robin manner to achieve real-time, cyclical automatic monitoring and acquisition of the output status of each station of multiple output devices. The output signal of the aging station is output to the adapter board through the gold finger interface of the aging board, and after being selected by the channel expansion circuit, it is transmitted by the adapter board to the aging driver board. After being acquired by the signal acquisition module on the aging driver board, it is uploaded to the host computer. The host computer compares the output signal with a preset threshold. If the output signal exceeds the preset threshold range, the corresponding device is determined to have an abnormal aging status.

[0027] This invention discloses an automatic acquisition method for aging output to increase the number of re-inspection stations. By installing the device under test (DUT) at each station of the aging board, the aging system host applies a unified excitation signal and a high-temperature environment, causing all stations to synchronously enter a high-temperature dynamic aging state, ensuring the consistency and parallelism of aging test conditions. Based on this, the method sends a channel selection control signal to the channel expansion circuit on the adapter board through the aging system host, realizing time-division multiplexing and switching control of multiple input channels. This allows a limited number of re-inspection channels to cover a larger number of aging stations in a round-robin manner, thereby multiplying the number of stations that can be monitored per batch without increasing the hardware resources of the aging system host, significantly improving re-inspection coverage and aging efficiency. Simultaneously, the above method uses a host computer to centrally receive, image, display, and judge the status of the selected output signals, incorporating the output status originally scattered across each station into a unified data processing platform. This allows operators to monitor the aging status of all devices at all stations in real time without manual measurement at each point. This method fundamentally changes the traditional manual inspection mode that relies on oscilloscope probes at the upper and lower aging nodes. It eliminates measurement errors and blind spots introduced by human operation, enabling the output status of each station to be automatically and cyclically collected and recorded according to a preset time sequence throughout the entire aging cycle, effectively ensuring the real-time, comprehensive, and effective process monitoring. Furthermore, this method fully utilizes the existing interfaces and resources of mainstream aging equipment. Functional upgrades can be achieved simply by optimizing the control logic and cooperating with the adapter board channel expansion circuit, without requiring hardware modifications to the aging system host, thus lowering the threshold and cost of implementation. In mass production scenarios, this method can significantly shorten the manual intervention time for a single batch of aging, reducing the time and equipment occupancy costs caused by forced batch aging due to insufficient monitoring capabilities. It effectively alleviates the capacity pressure of the aging process in scientific research and production, providing an efficient, reliable, and economical automated monitoring method for the aging screening of multi-variety, high-volume integrated circuit devices.

[0028] The working principle of this invention is as follows: The aging system for increasing the number of re-inspection stations in this invention includes an integrated circuit high-temperature dynamic aging system, an aging board and circuitry, system input signals, an aging adapter board, an aging driver board, re-inspection system output signals, an oscilloscope, etc. The circuit structure of the automatic acquisition method for aging output is as follows: Figure 2 As shown, it is compatible with existing integrated circuit high-temperature dynamic aging system interfaces, including aging board gold fingers, channel slots, aging adapter boards and aging driver board interfaces, improving equipment utilization.

[0029] The aging plate is placed in the high-temperature oven of the aging system. Its gold finger interface is connected to one end of the aging adapter board, and the other end of the aging adapter board is connected to the interface of the aging drive board. The aging adapter board and the drive board are placed in the ambient temperature environment outside the oven. Multiple aging stations are designed at intervals on the aging plate. The aging output of each station is interconnected with the aging adapter board, the aging plate, and the drive board. The output signal on the gold finger of the aging plate corresponds one-to-one with the output of each aging station.

[0030] The old refining adapter board is connected to the old refining board and the old refining drive board at both ends. The gold fingers and connectors are designed with an anti-misinsertion structure to achieve precise meshing and connection, ensuring data transmission reliability, and are easy to disassemble and replace in case of communication failure.

[0031] The old-fashioned adapter board is designed with analog switch circuitry, such as... Figure 1 As shown, the aging system provides power / ground and input signals to the analog switch, enabling a one-to-one connection between the output signals of each aging station device and the input / output I / O pins of each channel of the analog switch. It also enables a one-to-one connection between the common output / input terminal of the analog switch and the feedback signal on the aging driver board. By controlling the address terminal of the analog switch, a many-to-one feedback characteristic is achieved, where multiple input channels correspond to one output channel. This allows for simultaneous monitoring and switching control of multiple station outputs, ensuring comprehensive coverage of device status monitoring during the aging process.

[0032] The aging system and aging board circuitry apply excitation to the devices on the aging board through power supply, signal source and oven, providing analog or digital input signals, voltage and high temperature environment to drive the devices to perform normal high temperature dynamic aging, while providing input voltage, address terminal and enable terminal to the analog switches on the aging adapter board.

[0033] The analog switch can be flexibly selected (4-channel / 8-channel / 16-channel, etc.) and the number of channels can be expanded according to the output characteristics of the device and the return inspection requirements, effectively increasing the return inspection efficiency and aging capacity, and enabling full-station, full-output return inspection of different types of single / multi-channel output devices during the aging process.

[0034] The aging driver board is equipped with a signal acquisition module that communicates with the aging board. Changes in the output state of the device are transmitted to the signal acquisition module through the gold fingers of the aging board and the adapter board. The output change signal is fed back to the host computer of the aging system. The host computer performs imaging display and data processing on the received output signal. The output signal is displayed on the oscilloscope interface through the feedback system to determine the aging state of the device.

[0035] Compared to the mainstream integrated circuit high-temperature dynamic aging system's re-inspection resources (single-channel output ≤ 64 channels), this invention's automatic aging output acquisition method, based on existing aging resources, solves the problem of insufficient equipment re-inspection resources, effectively improving re-inspection efficiency, while overcoming the limitations of the one-to-one re-inspection structure of the aging system. Specific effects include: (1) In the design of the aging plate, the present invention reuses the return inspection resources to form a multi-to-one return inspection line structure with multiple output signals to one return inspection channel, which greatly improves the return inspection efficiency and ensures the coverage and effectiveness of the aging process monitoring. (2) The present invention adopts a compatible aging and refining adapter board interface, and ensures the reliability of communication transmission and data processing through precise positioning and connection, effectively improving the utilization rate of aging and refining boards and equipment utilization rate, and reducing aging and refining costs; (3) The present invention improves the coverage and efficiency of aging and re-inspection of integrated circuits, improves the reliability of the aging process, and reduces the production time, cost and quality risk of aging. (4) The analog switch and adapter board of the present invention have anti-misinsertion, direction marking and easy replacement design, which play a warning role in actual hardware installation, operation and maintenance, can avoid misoperation problems, and have good stability in use; (5) This invention can improve the aging capacity, solve the problem of opaque output status of some stations during the aging process, and can promptly detect abnormal situations such as performance degradation, failure or poor contact that may occur in the circuit during long-term high-temperature aging.

[0036] (6) Based on the existing high-temperature dynamic aging system of integrated circuits, the present invention can expand the aging back inspection by at least 32 channels to meet the requirement of ≥96 stations, improve the single aging capacity, and increase the number of aging back inspection channels by ≥1.5 times compared with the existing conditions and resources. The efficiency of simultaneous monitoring and switching control of multiple outputs is increased by ≥4 times.

[0037] Verification has shown that this invention has been successfully applied to digital, analog, and voltage regulator products. The waveform, amplitude, and frequency of the extended output remain undistorted, meeting the technical and quality requirements for product screening. It significantly improves re-inspection coverage, effectiveness, aging capacity, and production efficiency, with good process reliability and results. This method can be further applied to aging boards for multi-output devices, significantly improving the re-inspection efficiency of device outputs during the aging process, increasing the utilization rate of aging boards and equipment, and achieving high-volume, low-cost, and high-efficiency aging. It also provides valuable technical guidance for the design and application of other aging re-inspection methods.

[0038] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A refining system for increasing the number of rework stations, characterized in that, This includes the main unit of the aging system, the aging board, the aging driver board, and the adapter board; The aging plate is installed inside the oven of the aging system host, the aging drive board is installed outside the oven, and the adapter board is connected between the aging plate and the aging drive board. The aging plate is provided with several aging stations, and the output terminal of each aging station is connected to the corresponding input channel on the adapter board. The adapter board is provided with a channel expansion circuit, and the output terminal of the channel expansion circuit is connected to the feedback channel on the aging drive board. The channel expansion circuit is used to selectively switch the output signals of multiple input channels to the same feedback channel. The aging drive board is communicatively connected to the host computer of the aging system host and is used to feed back the collected output signals to the host computer for status judgment.

2. The aging system for increasing the number of re-inspection stations according to claim 1, characterized in that, One end of the adapter board is provided with a connector adapted to the gold finger interface of the old refining board. The gold fingers of the old refining board are pluggably connected to the adapter board through the connector, and an anti-misinsertion structure is provided between the gold fingers and the connector. The other end of the adapter board is provided with a connector adapted to the interface of the old refining drive board. The adapter board is pluggably connected to the old refining drive board through the connector.

3. The aging system for increasing the number of re-inspection stations according to claim 1, characterized in that, The channel expansion circuit is an analog switch circuit, which includes at least one analog switch chip. Multiple input, output I and O pins of each analog switch chip are connected one-to-one with the device output terminal of the corresponding aging station. The common input / output terminal of each analog switch chip is connected one-to-one with the corresponding feedback channel on the aging driver board. The address terminal and enable terminal of the analog switch chip are connected to the control signal output terminal of the aging system host.

4. The aging system for increasing the number of re-inspection stations according to claim 3, characterized in that, The analog switch chip is any one of a 4-channel analog switch, an 8-channel analog switch, or a 16-channel analog switch. The number of channels of each analog switch chip is configured according to the number of output channels of the device under test and the feedback requirements. The analog switch circuit expands the number of feedback channels by cascading multiple analog switch chips.

5. The aging system for increasing the number of re-inspection stations according to claim 3, characterized in that, The aging system host provides power supply voltage, address control signal, and enable control signal to the analog switch chip on the adapter board through the gold finger interface of the aging board.

6. The aging system for increasing the number of re-inspection stations according to claim 1, characterized in that, The adapter board is equipped with direction markings, and the connectors at both ends of the adapter board adopt an anti-reverse insertion structure design.

7. The aging system for increasing the number of re-inspection stations according to claim 1, characterized in that, The aging and refining drive board is equipped with a signal acquisition module. The input end of the signal acquisition module is connected to the output end of the adapter board, and the output end of the signal acquisition module is connected to the host computer of the aging and refining system. The signal acquisition module is used to acquire the output signals of each workstation and transmit them to the host computer. The host computer displays the received output signals on the oscilloscope interface.

8. A method for automatically acquiring aging output by increasing the number of re-inspection stations, implemented based on the aging system for increasing the number of re-inspection stations as described in any one of claims 1-7, characterized in that, include: The device under test is installed on each aging station of the aging plate, the aging plate is placed in the oven of the aging system host, and the adapter board is connected between the aging plate and the aging drive board. The host of the aging system applies an excitation signal and a high-temperature environment to the device under test, driving the device under test to perform high-temperature dynamic aging. The host of the aging system sends a channel selection control signal to the channel expansion circuit on the adapter board, so that the channel expansion circuit connects the target input channel among its multiple input channels with the corresponding return test channel. The channel expansion circuit transmits the selected aging station output signal to the host computer of the aging system host via the aging driver board; The host computer receives and processes the output signal to perform imaging display and status judgment.

9. The method for automatically acquiring aging output by increasing the number of rework stations according to claim 8, characterized in that, During the aging process, the host computer outputs different address control signals to the channel expansion circuit in a preset timing sequence, and selects the output channels of each aging station in a round-robin manner to realize real-time, cyclic automatic monitoring and acquisition of the output status of each station of the multi-output device.

10. The method for automatically acquiring aging output by increasing the number of rework stations according to claim 8, characterized in that, The output signal of the aging station is output to the adapter board via the gold finger interface of the aging board. After being selected by the channel expansion circuit, it is transmitted by the adapter board to the aging driver board. After being acquired by the signal acquisition module on the aging driver board, it is uploaded to the host computer. The host computer compares the output signal with a preset threshold. If the output signal exceeds the preset threshold range, it determines that the aging state of the corresponding device is abnormal.

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