Bit error rate testing jig for solid state disk
By using the design of foldable movable bracket and LED status display light in the SSD bit error rate test tool, the problems of unstable connection of the adapter card and insufficient real-time feedback are solved, and higher test accuracy and environmental stability are achieved , reducing labor costs and testing cycles.
Patent Information
- Application Number
- CN202420936253.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-30
- Publication Date
- 2024-12-17
- Estimated Expiration
- 2034-04-30
AI Technical Summary
During the existing SSD error test, the unreasonable design of the forwarding card leads to unstable connection, deviation of test results, and lack of real-time connection status feedback, which increases the test cycle and labor costs.
A solid-state drive error rate tester is designed, using a foldable movable bracket and LED status display light, providing a fixed support gripper bracket and a fixed card slot that can move up and down to ensure vertical connection of the cable, reducing physical losses, and Timely feedback on the connection status.
Improves the accuracy and environmental stability of the test, extends the life of the test equipment, shortens the test time and reduces labor costs.
Smart Images
Figure CN222190287U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of servers, and in particular relates to a bit error rate test tool for a solid state hard disk. Background Art
[0002] With the development of the times, the demand for signal rate of products is getting faster and faster, and the attention to signal integrity in the research and development process is also increasing. As one of the means to test the quality of PCIe high-speed signals, the accuracy of bit error testing is of great significance to the entire product life cycle. In the process of high-speed signal testing, in order to ensure the transmission quality of the signal, the cables of general test instruments are relatively heavy. If a supporting platform is not provided for the cables when setting up the environment, physical loss will be caused to the connectors on the test fixture. In addition, during the test, the cables may be suspended in the air for a long time, resulting in loose connections and deviations in the test results.
[0003] The existing SSD bit error test process has the following main problems:
[0004] (1) When performing Rx performance testing on SSDs with U.2 interfaces, an adapter card needs to be added for connection. Some SSD adapter cards on the market do not have fixed slots. The test process will be affected by gravity, causing the test disk to be offset, affecting the tight connection state of the connector. Under the influence of gravity for a long time, the gold finger slots of the fixture board will also be physically damaged. Some adapter cards have fixed card slots. This type of adapter board cannot be used for some debug test tasks. For example, when verifying the power supply impact with an external power supply, the board power supply needs to be led out for testing to rule out whether it is affected by the power supply design. In this case, the card slot will affect the lead-out of the external power line. If a high-speed signal debug is performed on an adapter board without a card slot, new variables will be introduced due to different connectors, increasing the difficulty of debug.
[0005] (2) During the test process, it takes about 20 minutes to run a test program. If a connection becomes loose during the test, the current fixture cannot promptly alert the tester, which will cause abnormal test data. The problem can only be discovered after the test program is run once and the test results are seen. Then, it is necessary to check whether it is an environmental problem. This process increases the test cycle and labor costs.
[0006] (3) As mentioned above, during the test process, if the tester does not arrange the environment properly, or ignores the fact that the adapter will be subjected to excessive tension from the cable, and does not choose objects of appropriate height to place under the cable to share its gravity, it will cause physical wear on the adapter of the test fixture board, reducing the service life of the test fixture and adversely affecting the accuracy of the test results. Utility Model Content
[0007] In view of the above-mentioned deficiencies in the prior art, the utility model provides a bit error rate test tool for a solid state hard disk to solve the above-mentioned technical problems.
[0008] The utility model provides a bit error rate test tool for a solid state hard disk, comprising:
[0009] A test board, one side of which is connected to a plurality of cable fixing brackets, and the other end of which is provided with a plurality of test interfaces;
[0010] The middle area of the test board is connected to the fixed card slot through a movable bracket, and the fixed card slot is detachably connected to the solid state drive to be tested; the movable bracket includes a plurality of folding rods, one end of the plurality of folding rods is movably connected to the test board, and the other end of the plurality of folding rods is movably connected to the fixed card slot;
[0011] The plurality of test interfaces are evenly arranged, and a status display light is correspondingly arranged above each test interface; the test interface is connected in parallel with the corresponding status display light.
[0012] In an optional embodiment, the cable fixing bracket includes a first telescopic rod, a second telescopic rod and a grab clamp, one end of the first telescopic rod is connected to the test board, the other end of the first telescopic rod is connected to one end of the second telescopic rod through a first rotating shaft; the other end of the second telescopic rod is connected to the grab clamp through a second rotating shaft.
[0013] In an optional embodiment, the test board includes a plurality of accommodating cavities, and one end of the first telescopic rod is connected to the bottom of the accommodating cavity.
[0014] In an optional embodiment, the rotation contact surfaces of the first rotating shaft and the second rotating shaft both include limiting teeth.
[0015] In an optional implementation, the test interface is a gold finger or a connector.
[0016] In an optional embodiment, the folding rod includes a one-section rod and a two-section rod, one end of the one-section rod is movably connected to the test plate, the other end of the one-section rod is movably connected to one end of the two-section rod, and the other end of the two-section rod is movably connected to the fixed slot.
[0017] In an optional embodiment, one end of the one-section rod is connected to the test plate via a first movable axis, and the other end of the one-section rod is connected to one end of a two-section rod via a second movable axis; the other end of the two-section rod is connected to a fixed slot via a third movable axis.
[0018] In an optional embodiment, the axial contact surfaces of the first movable shaft, the second movable shaft and the third movable shaft are provided with a resistance layer, and the resistance layer is a silicone layer.
[0019] In an optional implementation, the status display light is an LED light.
[0020] In an optional embodiment, the size of the fixed card slot matches the size of the solid state drive, and a plurality of buckles are provided on the fixed card slot.
[0021] The beneficial effect of the utility model lies in that the bit error rate test jig for the solid-state hard disk provided by the utility model solves the problem of excessive cable tension on the adapter due to unreasonable test environment layout by providing a fixed support gripper bracket, reduces the physical loss of the MMPX adapter of the test fixture board, increases the service life of the test fixture, and increases the accuracy of the test; through the fixed card slot that can be moved up and down, not only the problem of unstable fixation during SSD testing is solved, but also the applicable scenarios of the same adapter board are expanded, the variables of the test environment are reduced, the stability of the test environment and the accuracy of the test results are increased; through the LED light that can timely feedback the connection status of the test environment, if a connection abnormality occurs during the test, timely feedback is given to the tester, which reduces the links of later troubleshooting the causes of the test abnormality, improves the test efficiency, shortens the test time, and reduces the labor cost.
[0022] In addition, the utility model has a reliable design principle, a simple structure and a very broad application prospect. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] In order to more clearly illustrate the technical solutions in the embodiments of the utility model or the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.
[0024] Figure 1 It is a schematic diagram of a bit error rate test jig for a solid state hard disk according to an embodiment of the utility model.
[0025] Figure 2 It is another schematic diagram of a bit error rate test jig for a solid state hard disk according to an embodiment of the utility model.
[0026] 1. Test board; 2. Cable fixing bracket; 3. Fixed card slot; 4. Movable bracket; 5. Test interface; 6. LED light. DETAILED DESCRIPTION
[0027] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.
[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention.
[0029] Specifically, Figure 1 As shown in the figure, the bit error rate test fixture of the solid state drive includes:
[0030] A test board 1, one side of the test board 1 is connected to a plurality of cable fixing brackets 2, and the other end of the test board 1 is provided with a test interface 5; the middle area of the test board 1 is connected to a fixing slot 3 through a movable bracket 4, and the fixing slot 3 is detachably connected to the solid state drive to be tested. The movable bracket 4 includes a plurality of folding rods, one end of the plurality of folding rods is movably connected to the test board 1, and the other end of the plurality of folding rods is movably connected to the fixing slot 3;
[0031] A plurality of test interfaces are evenly arranged, and a status display light is correspondingly arranged above each test interface; the test interface is connected in parallel with the corresponding status display light.
[0032] Specifically, the test board 1 is a rectangular plate, the upper part of which is provided with a cable fixing bracket 2 for fixing the test line, and the middle part is a movable fixing slot 3 for fixing the solid state drive to be tested. The fixing slot 3 can move up and down.
[0033] During the test, the cable led out from the bit error meter could not be fixed, causing the MMPX adapter on the test adapter board to be subject to greater traction. At the same time, the different testing habits of each tester would also cause physical wear and tear on the adapter on the test adapter board, causing it to loosen. After long-term measurement, environmental variables would be introduced, increasing the difficulty of high-speed signal debugging and causing a lot of unnecessary repetitive work for the testers.
[0034] In this embodiment, the function of the foldable, retractable and rotatable gripper bracket is to fix the test cable and ensure that the cable is vertically connected to the connector on the test fixture. As long as the vertical connection between the cable and the adapter is ensured, the influence of different test environments built by different personnel can be minimized, and the physical loss of the test fixture caused by the cable can be avoided. Because the horizontal traction force of the cable will affect whether the connection of the MMPX adapter on the test board 1 is firm, long-term testing may cause the connection part to loosen. The fixture provides a cable support gripper fixing structure, which can decompose the non-vertical force of the mmpx connector, reduce the probability of loosening of the mmpx adapter, and increase the accuracy of the test;
[0035] The fixed card slot 3 can be moved up and down and forward and backward. Its main function is to fix the SSD to be tested to prevent the SSD from shaking during the test. And when special verification tests are required, the card slot can be moved upward to make more space for the test interface 5, which is convenient for Debug tests such as external power supply, ensuring the consistency of the test environment and increasing the accuracy of the test;
[0036] Among them, the cable fixing bracket 2 includes a first telescopic rod, a second telescopic rod and a grabbing clamp, one end of the first telescopic rod is connected to the test board 1, and the other end of the first telescopic rod is connected to one end of the second telescopic rod through the first rotating shaft; the other end of the second telescopic rod is connected to the grabbing clamp through the second rotating shaft. The rotating contact surfaces of the first rotating shaft and the second rotating shaft both include limiting teeth, and the rotating shaft can only be rotated when manually adjusted, otherwise the bite force of the limiting teeth can prevent the rotating shaft from rotating due to the gravity of the cable or accidental contact. In other embodiments, the cable fixing bracket 2 may also include a multi-section rod, and is not limited to two telescopic rods. Position adjustment is achieved by a multi-section rotatable telescopic rod, and the cable can be better fixed by fixing it with a grabbing clamp.
[0037] In addition, if Figure 2 As shown, the test board 1 includes a plurality of accommodating chambers, one end of the first telescopic rod is connected to the bottom of the accommodating chamber. The idle cable fixing bracket 2 can be retracted into the accommodating chamber.
[0038] The test interface 5 distributed at the other end of the test board 1 includes multiple gold fingers and multiple connectors, which mainly provide switching between the SSD and the test board 1. Each gold finger or connector corresponds to a status display light. The gold finger or connector is connected in parallel with the corresponding status display light, and the status display light is an LED light 6. When the plug of the test cable is inserted into the test interface 5 (any gold finger or connector), if the test interface 5 is normal, the test interface 5 is turned on to form a loop. If the test interface 5 has poor contact, the LED light 6 connected in parallel with the test interface 5 is lit. Therefore, the test personnel can be prompted in time to check the link connection status and locate the problems in the test environment in time, which reduces the cycle of troubleshooting after the test is completed, avoids abnormal test results caused by poor connection and repeated investment of manpower, and can greatly improve the test efficiency.
[0039] In one embodiment, the movable bracket 4 includes a plurality of folding rods, one end of the plurality of folding rods is movably connected to the test board 1, and the other end of the plurality of folding rods is movably connected to the fixed card slot 3. The folding rod includes a one-stage rod and a two-stage rod, one end of the one-stage rod is movably connected to the test board 1, the other end of the one-stage rod is movably connected to one end of the two-stage rod, and the other end of the two-stage rod is movably connected to the fixed card slot 3. One end of the one-stage rod is connected to the test board through a first movable shaft, and the other end of the one-stage rod is connected to one end of the two-stage rod through a second movable shaft; the other end of the two-stage rod is connected to the fixed card slot through a third movable shaft. The axial contact surfaces of the first movable shaft, the second movable shaft and the third movable shaft are provided with a resistance layer, and the resistance layer is a silicone layer. The silicone layer plays a role of limiting, preventing the movable bracket from automatically deforming when not adjusted. The size of the fixed card slot 3 matches the size of the solid state drive, and a plurality of buckles are provided on the fixed card slot 3. In actual application, the position of the fixed card slot 3 can be adjusted upward by folding the folding rod of the movable bracket 4. This movable bracket 4 has a simple structure and can realize flexible adjustment of the position of the fixed card slot 3.
[0040] Although the present invention is described in detail by referring to the accompanying drawings and in combination with the preferred embodiments, the present invention is not limited thereto. Without departing from the spirit and essence of the present invention, a person skilled in the art may make various equivalent modifications or substitutions to the embodiments of the present invention, and these modifications or substitutions shall be within the scope of the present invention. Any person skilled in the art who is familiar with the present technical field may easily think of changes or substitutions within the technical scope disclosed in the present invention, and these shall be within the scope of protection of the present invention.
Claims
1. A bit error rate test tool for a solid state hard disk, characterized in that: include: A test board, one side of which is connected to a plurality of cable fixing brackets, and the other end of which is provided with a plurality of test interfaces; The middle area of the test board is connected to the fixed card slot through a movable bracket, and the fixed card slot is detachably connected to the solid state drive to be tested; the movable bracket includes a plurality of folding rods, one end of the plurality of folding rods is movably connected to the test board, and the other end of the plurality of folding rods is movably connected to the fixed card slot; The plurality of test interfaces are evenly arranged, and a status display light is correspondingly arranged above each test interface; the test interface is connected in parallel with the corresponding status display light.
2. The bit error rate test jig for a solid state drive according to claim 1, characterized in that: The cable fixing bracket includes a first telescopic rod, a second telescopic rod and a grabbing clamp, one end of the first telescopic rod is connected to the test board, the other end of the first telescopic rod is connected to one end of the second telescopic rod through a first rotating shaft; the other end of the second telescopic rod is connected to the grabbing clamp through a second rotating shaft.
3. The bit error rate test tool for a solid state drive according to claim 2, characterized in that: The test board comprises a plurality of accommodating cavities, and one end of the first telescopic rod is connected to the bottom of the accommodating cavity.
4. The bit error rate test jig for a solid state drive according to claim 2, characterized in that: The rotation contact surfaces of the first rotating shaft and the second rotating shaft both include limiting teeth.
5. The bit error rate test jig for a solid state drive according to claim 1, characterized in that: The test interface is a gold finger or connector.
6. The bit error rate test jig for a solid state drive according to claim 1, characterized in that: The folding rod comprises a first rod and a second rod, one end of the first rod is movably connected to the test plate, the other end of the first rod is movably connected to one end of the second rod, and the other end of the second rod is movably connected to the fixed slot.
7. The bit error rate test jig for a solid state drive according to claim 6, characterized in that: One end of the one-stage rod is connected to the test plate via a first movable shaft, and the other end of the one-stage rod is connected to one end of the two-stage rod via a second movable shaft; the other end of the two-stage rod is connected to the fixed slot via a third movable shaft.
8. The bit error rate test jig for a solid state drive according to claim 7, characterized in that: The axial contact surfaces of the first movable shaft, the second movable shaft and the third movable shaft are provided with a resistance layer, and the resistance layer is a silicone layer.
9. The bit error rate test jig for a solid state drive according to claim 1, characterized in that: The status display light is an LED light.
10. The bit error rate test jig for a solid state drive according to claim 1, characterized in that: The size of the fixed card slot matches the size of the solid state hard disk, and a plurality of buckles are provided on the fixed card slot.