Dual-purpose testing jig for testing chip

Abstract

The utility model relates to the technical field of chip testing frames, in particular to a dual-purpose testing frame for testing chips, which comprises a testing base capable of being matched with testing equipment for use, a testing table is mounted on the testing base, and a positioning structure is arranged on the testing table. The positioning structure comprises a positioning plate and a positioning groove, the positioning plate is provided with a gland for positioning the chip in the positioning groove, a dismounting structure is arranged between the positioning plate and the gland, and the gland is detachably connected with the gland; when the dual-purpose test frame is used as an independent test platform, a chip to be tested can be placed in the positioning groove, then the chip is positioned in the positioning groove of the positioning plate through the gland, and the chip is tested; in addition, the dual-purpose test frame can also serve as a test assembly to be placed in test equipment, a chip needing to be tested can be placed in the positioning groove, the chip is exposed when the gland is opened, contact test of a test structure of the test equipment is facilitated, another test mode is achieved, and the dual-purpose requirement of the test frame is met.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing racks, in particular to a dual-purpose testing rack for testing chips. Background Art

[0002] There are many fixtures produced because of business needs, because there are many types of fixtures are customized, some are to improve productivity, repeat specific actions, or make work more precise, and are specially used for testing and experimenting the function, power calibration, life, performance, etc. of the chip. Because it is mainly used for testing various indicators of the chip on the production line, especially when producing and processing mobile phone motherboards, in order to ensure the reasonable rate of the chip, a special fixture is needed for testing. However, when testing motherboards of different sizes, it is impossible to stably fix them, which makes the test difficult to carry out and it is impossible to calculate accurate values. Therefore, an adjustment component of a mobile phone motherboard test stand is proposed. When the test stand is used, it can be adjusted and fixed at any time according to the size of the motherboard, which is convenient for the staff to operate and use.

[0003] In this regard, the utility model with application number CN202223262910.6 discloses an adjustment component of a mobile phone motherboard test stand, including a base, a bracket, a placement plate, a clamping mechanism, a limit block and a positioning block, the top of the base is fixedly connected to the bottom of the bracket, the top of the base is fixedly connected to the bottom of the placement plate, the top of the placement plate is fixedly connected to the bottom of the clamping mechanism, the top of the placement plate is fixedly connected to the bottom of the limit block, and the opposite sides of the two limit blocks are fixedly connected to the opposite sides of the two positioning blocks. The utility model achieves the effect of being unable to stably fix when testing motherboards of different sizes, making the test difficult to carry out and unable to calculate accurate values, thereby proposing an adjustment component of a mobile phone motherboard test stand, which can be adjusted and fixed at any time according to the size of the motherboard when the test stand is used, so as to facilitate the operation and use of the staff.

[0004] The current existing test racks only meet the algorithm testing of DRAM memory chips, that is, they can only be used in conjunction with test equipment, and cannot meet multiple testing methods. In terms of fault coverage, they cannot cover some chips with potential failure risks. Utility Model Content

[0005] The utility model aims to provide a dual-purpose test stand for testing chips in view of the deficiencies in the prior art.

[0006] To achieve the above purpose, the technical solution of the utility model is as follows:

[0007] A dual-purpose test stand for testing chips, comprising a test base that can be used in conjunction with a test device, wherein the test base is installed with a test table, and the test table is provided with a positioning structure for installing the chip; the positioning structure comprises a positioning plate and a positioning groove provided on the positioning plate, the positioning plate is installed with a pressure cover for positioning the chip in the positioning groove, a disassembly structure is provided between the positioning plate and the pressure cover, and the pressure cover is detachably connected to the pressure cover.

[0008] Further: the disassembly structure includes a positioning rod installed on the positioning plate, and the pressure cover is installed with a swingable connecting block, and the connecting block is formed with a barb block that hooks the positioning rod.

[0009] Furthermore: the test bench is also formed with a movable bottom groove for the barb block to move, and the positioning rod is located above the movable bottom groove.

[0010] Furthermore: the connecting block is also formed with a toggle block and a rotating block, the pressure cover is installed with a rotating shaft, the rotating block is rotatably connected with the rotating shaft, and the connecting block can swing around the rotating shaft through the rotating block.

[0011] Further: the gland is formed with a rotation groove, the rotation shaft is installed in the rotation groove, and the rotation groove is also equipped with a compression spring that drives the barb block to elastically hook the positioning rod.

[0012] Further: the positioning plate is provided with a mounting groove, and the positioning rod is installed in the mounting groove.

[0013] Furthermore: there are two positioning grooves, which are arranged vertically, and edge grooves are formed on the edges of the positioning grooves to lift the chip.

[0014] Furthermore: a pressing block matching with the positioning groove is formed at the bottom of the pressure cover.

[0015] Further: the positioning plate is formed with a connecting seat, the connecting seat is formed with a bottom hinge groove, the bottom hinge groove is installed with a hinge shaft, the pressure cover is formed with a top hinge groove matching with the connecting seat, and the top hinge groove is formed with a mounting hole for inserting the hinge shaft.

[0016] The beneficial effects of the utility model are as follows: when the dual-purpose test frame is used as an independent test platform, the chip to be tested can be placed in the positioning groove, and then the chip is positioned in the positioning groove of the positioning plate through the pressure cover to test the chip; the dual-purpose test frame can also be used as a test component and placed in the test equipment. The chip to be tested can be placed in the positioning groove, and the chip is exposed when the pressure cover is opened, which is convenient for the test structure of the test equipment to contact the test, thereby realizing another test method and meeting the dual-purpose requirements of the test frame. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a structural schematic diagram of a dual-purpose test stand.

[0018] Figure 2This is a structural schematic diagram of the dual-purpose test frame from another perspective.

[0019] Figure 3 It is a structural diagram of the positioning structure.

[0020] Figure 4 It is a front view of the positioning structure.

[0021] Figure 5 A side view of the positioning structure.

[0022] Reference numerals include:

[0023] 1-Test base,

[0024] 11-test bench, 12-positioning structure, 13-positioning plate, 14-positioning groove, 15-pressure cover, 16-pressing block, 17-edge groove,

[0025] 2- Disassembly structure,

[0026] 21-connecting block, 22-hook block, 23-sliding block, 24-rotating block, 25-positioning rod,

[0027] 26-movable bottom slot, 27-rotation slot, 28-compression spring, 29-installation slot,

[0028] 3-Connection seat,

[0029] 31 - bottom hinge slot, 32 - hinge shaft, 33 - top hinge slot, 34 - mounting hole, 35 - rotation shaft. DETAILED DESCRIPTION

[0030] The utility model is described in detail below with reference to the accompanying drawings.

[0031] like Figure 1-5 As shown, a dual-purpose test stand for testing chips includes a test base 1 that can be used in conjunction with a test device, the test base 1 is installed with a test table 11, and the test table 11 is provided with a positioning structure 12 for installing the chip; the positioning structure 12 includes a positioning plate 13 and a positioning groove 14 opened on the positioning plate 13, the positioning plate 13 is installed with a pressure cover 15 for positioning the chip in the positioning groove 14, a disassembly structure 2 is provided between the positioning plate 13 and the pressure cover 15, and the pressure cover 15 is detachably connected to the pressure cover 15.

[0032] When the dual-purpose test frame is used as an independent test platform, the chip to be tested can be placed in the positioning groove 14, and then the chip can be positioned in the positioning groove 14 of the positioning plate 13 through the pressure cover 15 to test the chip; the dual-purpose test frame can also be used as a test component and placed in the test equipment. The chip to be tested can be placed in the positioning groove 14, and the chip is exposed when the pressure cover 15 is opened, which is convenient for the test structure of the test equipment to contact the test, thereby realizing another test method and meeting the dual-use requirements of the test frame.

[0033] That is, the test rack can be used independently or on a quadruple test rack, achieving precise temperature control during temperature testing of DRAM memory chips. It can also meet OS and algorithm testing requirements. During algorithm testing, the serial port on the quadruple test rack can be used to print logs, eliminating the limitations of the external serial port.

[0034] Further improve the fault coverage rate during testing and reduce the risk of failed chips flowing out. The structure adopts a detachable quick-release design to facilitate application in different scenarios.

[0035] The disassembly structure 2 includes a positioning rod 25 installed on the positioning plate 13, and the pressure cover 15 is installed with a swingable connecting block 21, and the connecting block 21 is formed with a hook block 22 for hooking the positioning rod 25; in this embodiment, when the pressure cover 15 is connected to the positioning plate 13, the connecting block 21 is swung so that the hook block 22 hooks the positioning rod 25 of the positioning plate 13. At this time, the pressure cover 15 cannot bounce upward, thereby maintaining the connection stability between the pressure cover 15 and the positioning plate 13.

[0036] Furthermore, the test bench 11 is also formed with a movable bottom groove 26 for the barb block 22 to move, and the positioning rod 25 is located above the movable bottom groove 26. Since the barb block 22 is formed at the bottom of the connecting block 21, when the barb block 22 is connected to the positioning rod 25, the barb block 22 can be embedded in the movable bottom groove 26, which facilitates the movement of the barb block 22.

[0037] Furthermore, the connecting block 21 is also formed with a toggle block 23 and a rotating block 24, the pressure cover 15 is installed with a rotating shaft 35, the rotating block 24 is rotatably connected to the rotating shaft 35, the connecting block 21 can swing around the rotating shaft 35 through the rotating block 24, and the connecting block 21 can swing through the rotational cooperation between the rotating block 24 and the rotating shaft 35, and the hook block 22 can move away from or close to the positioning rod 25, thereby realizing the connection or separation of the pressure cover 15 and the positioning plate 13.

[0038] Furthermore, the pressure cover 15 is formed with a rotating groove 27, and the rotating shaft 35 is installed in the rotating groove 27. The rotating groove 27 is also installed with a compression spring 28 that drives the hook block 22 to elastically hook the positioning rod 25; when the hook block 22 is not connected to the positioning rod 25, the pressure cover 15 will be driven by the compression spring 28 and the pressure cover 15 will pop outward to keep the cover open.

[0039] Furthermore, the positioning plate 13 is provided with a mounting groove 29 , and the positioning rod 25 is installed in the mounting groove 29 .

[0040] Preferably, there are two positioning grooves 14, which are arranged vertically. The edge of the positioning groove 14 is formed with an edge groove 17 that can lift the chip. When the chip is placed in the positioning groove 14 and needs to be taken out after inspection, the chip can be lifted through the edge groove 17 and quickly detached from the positioning groove 14.

[0041] A pressing block 16 that cooperates with the positioning groove 14 is formed at the bottom of the pressure cover 15. When the dual-purpose test frame is used as an independent test platform, the chip to be tested can be placed in the positioning groove 14, and then the chip is positioned in the positioning groove 14 of the positioning plate 13 through the pressure cover 15. The pressing block 16 of the pressure cover 15 can prevent the chip from bouncing up from the positioning groove 14, ensure that the contact point between the chip and the positioning groove 14 is in close contact, and improve the stability of the test.

[0042] The positioning plate 13 is formed with a connecting seat 3, the connecting seat 3 is formed with a bottom hinge groove 31, the bottom hinge groove 31 is installed with a hinge shaft 32, the pressure cover 15 is formed with a top hinge groove 33 that cooperates with the connecting seat 3, and the top hinge groove 33 is formed with a mounting hole 34 for inserting the hinge shaft 32; with the above structure, the positioning plate 13 and the pressure cover 15 can be hinged, and the pressure cover 15 swings around the hinge shaft 32 to realize opening or closing the cover.

[0043] In summary, it can be seen that the present invention has the above-mentioned excellent characteristics, which can enhance the performance unprecedented in the prior art and become a chip with great practical value.

[0044] The above contents are only preferred embodiments of the present invention. For ordinary technicians in this field, according to the concept of the present invention, there will be changes in the specific implementation methods and application scopes. The contents of this specification should not be understood as limiting the present invention.

Claims

1. A dual-purpose test stand for testing chips, characterized in that: It includes a test base that can be used in conjunction with the test equipment, the test base is equipped with a test table, and the test table is provided with a positioning structure for installing the chip; The positioning structure includes a positioning plate and a positioning groove provided in the positioning plate. The positioning plate is provided with a pressure cover for positioning the chip in the positioning groove. A disassembly structure is provided between the positioning plate and the pressure cover, and the pressure cover is detachably connected to the pressure cover.

2. A dual-purpose test stand for testing chips according to claim 1, characterized in that: The disassembly structure comprises a positioning rod installed on the positioning plate, and the pressure cover is provided with a swingable connecting block, and the connecting block is formed with a barb block for hooking the positioning rod.

3. A dual-purpose test stand for testing chips according to claim 2, characterized in that: The test bench is also formed with a movable bottom groove for the barb block to move, and the positioning rod is located above the movable bottom groove.

4. A dual-purpose test stand for testing chips according to claim 3, characterized in that: The connecting block is further formed with a toggle block and a rotating block, the pressure cover is provided with a rotating shaft, the rotating block is rotatably connected with the rotating shaft, and the connecting block can swing around the rotating shaft through the rotating block.

5. A dual-purpose test stand for testing chips according to claim 4, characterized in that: The gland is formed with a rotation groove, the rotation shaft is installed in the rotation groove, and the rotation groove is also equipped with a compression spring that drives the barb block to elastically hook the positioning rod.

6. A dual-purpose test stand for testing chips according to claim 2, characterized in that: The positioning plate is provided with a mounting groove, and the positioning rod is mounted in the mounting groove.

7. A dual-purpose test stand for testing chips according to claim 1, characterized in that: There are two positioning grooves, which are arranged vertically. The edges of the positioning grooves are formed with edge grooves that can lift the chip.

8. The dual-purpose test stand for testing chips according to claim 7, characterized in that: A pressing block matched with the positioning groove is formed at the bottom of the pressing cover.

9. The dual-purpose test stand for testing chips according to claim 1, characterized in that: The positioning plate is formed with a connecting seat, the connecting seat is formed with a bottom hinge groove, the bottom hinge groove is installed with a hinge shaft, the pressure cover is formed with a top hinge groove matched with the connecting seat, and the top hinge groove is formed with a mounting hole for inserting the hinge shaft.

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