Electric energy meter EEPROM testing device
By designing an EEPROM testing device that includes a power supply module, a resistance adjustable module, and an analysis module, the problem of lack of EEPROM circuit design testing in the existing technology has been solved, and the comprehensive evaluation of the performance and power consumption of EEPROM has been achieved. Measurement performance.
Patent Information
- Application Number
- CN202420590870.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-25
- Publication Date
- 2025-01-28
- Estimated Expiration
- 2034-03-25
AI Technical Summary
In the prior art, only the internal software of EEPROM is tested, and the EEPROM circuit design is lacking, and its impact on performance and power consumption cannot be fully evaluated.
The EEPROM test device is designed, including the power supply module, the resistance module and the analysis module. The resistance module of the resistance can simulate the pull -up resistance of different resistance values and replace the pull -up resistance of the fixed resistance value in EEPROM, thereby evaluating the effects of different resistance values on EEPROM's performance and power consumption.
Through this testing device, the impact of the EEPROM circuit design on performance and power consumption can be fully evaluated to help improve the measurement performance of the power meter.
Smart Images
Figure CN222420519U_ABST
Abstract
Description
Technical Field
[0001] The utility model belongs to the technical field of EEPROM testing, and in particular relates to an EEPROM testing device for an electric energy meter. Background Art
[0002] EEPROM is a non-volatile memory that can be erased and programmed electronically. In electric energy meters, EEPROM is often used to store important data and parameters of electric energy meters, which is conducive to setting parameters, power, time, etc. of electric energy meters. The advantage of using EEPROM is that a large amount of data can be stored without using external memory, and it can be read and written at any time, making data update and maintenance more convenient. At the same time, EEPROM has a long data retention time, and data will not be lost even in the case of power failure, which can ensure the reliability and accuracy of data.
[0003] However, EEPROM also has some disadvantages. For example, its write cycle is limited to about 1 million times, exceeding this limit requires a new batch of tasks. In addition, the write speed of EEPROM is slow, and it may take several milliseconds to complete the write operation. Therefore, when selecting EEPROM, its performance and power consumption need to be considered to ensure the accuracy and efficiency of data storage and processing of the energy meter.
[0004] In terms of power consumption and performance testing, the commonly used testing method is to test the internal software of the EEPROM, including testing the read and write algorithms and storage technology of the EEPROM, in order to evaluate the power consumption and performance of the EEPROM. However, testing only the software is undoubtedly incomplete. Factors that affect the performance and function of the EEPROM also include hardware. The EEPROM circuit design itself also has a great impact on the performance and power consumption of the EEPROM. Therefore, it is necessary to design a test device to test the EEPROM circuit design itself to analyze its impact on performance and power consumption. Utility Model Content
[0005] The utility model aims to provide an electric energy meter EEPROM test device, which is used to solve the problem that the prior art only tests the internal software of the EEPROM and lacks the test of the EEPROM circuit design.
[0006] In order to solve the above technical problems, the utility model provides an electric energy meter EEPROM test device, comprising a power supply module, an adjustable resistance module and an analysis module, wherein the adjustable resistance module comprises one or two adjustable resistance units with adjustable resistance values for simulating pull-up resistors with different resistance values; if the adjustable resistance module comprises one adjustable resistance unit, one end of the adjustable resistance unit is connected to the positive output end of the power supply module, and the other end is used to connect to the SCL or SDA interface of the EEPROM to be tested; if the adjustable resistance module comprises two adjustable resistance units, one end of the two adjustable resistance units are both connected to the positive output end of the power supply module, and the other ends of the two adjustable resistance units are respectively used to connect to the SCL and SDA interfaces of the EEPROM to be tested; the analysis module is used to evaluate the influence of pull-up resistors with different resistance values on the EEPROM to be tested.
[0007] Furthermore, the adjustable resistance unit includes a potentiometer.
[0008] Furthermore, the adjustable resistance unit includes a plurality of resistance branches connected in parallel, and each resistance branch is provided with a controllable switch and a resistor in series.
[0009] Furthermore, the resistance values of the resistors connected in series on the resistance branches are different.
[0010] Furthermore, the power supply module includes two power supply units and a switching switch, wherein the voltage output by one of the power supply units is the maximum operating voltage required by the EEPROM, and the voltage output by the other power supply unit is less than the maximum operating voltage required by the EEPROM and greater than or equal to the minimum operating voltage required by the EEPROM; one end of the switching switch is the positive output end of the power supply module, and the other end of the switching switch is switched to connect the positive output ends of the two power supply units; the analysis module is also used to evaluate the impact of different voltages output by the power supply module on the EEPROM under test.
[0011] Furthermore, the voltage output by the other power supply unit is adjustable.
[0012] Furthermore, the other power supply unit includes a first transformer, a first rectifier module and an adjustable output three-terminal regulator, the AC end of the first rectifier module is used to connect to an AC power source through the first transformer, and the DC end of the first rectifier module is output through the adjustable output three-terminal regulator.
[0013] Furthermore, one of the power supply units includes a second transformer, a second rectifier module and a fixed output three-terminal regulator, the AC end of the second rectifier module is used to connect to the AC power supply through the second transformer, and the DC end of the second rectifier module is output through the fixed output three-terminal regulator.
[0014] Furthermore, the switching switch is a single-pole double-throw switch.
[0015] Furthermore, the first rectifier module is a rectifier bridge.
[0016] The beneficial effects of the utility model are as follows: the utility model belongs to an improved invention creation, the test device designs a resistance adjustable module starting from the pull-up resistor in the EEPROM circuit, the resistance adjustable module includes one or two resistance adjustable units for simulating pull-up resistors with different resistance values, and when specifically testing the tested EEPROM, the resistance adjustable unit is arranged between the positive output end of the power supply module and the SCL of the tested EEPROM, or between the positive output end of the power supply module and the SDA interface of the tested EEPROM, so that the resistance adjustable unit replaces the pull-up resistor with a fixed resistance value originally in the tested EEPROM, so that by changing the resistance value of the resistance adjustable unit, the analysis module is used to analyze and evaluate the influence of different pull-up resistor resistance values on the performance and power consumption of the EEPROM, so as to improve the metering performance of the electric energy meter according to the analysis and evaluation results. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 It is a schematic diagram of the overall structural layout of the electric energy meter EEPROM test device of the utility model;
[0018] Figure 2 This is a diagram of the resistor array bottom plate of the electric energy meter EEPROM test device of the utility model;
[0019] Figure 3 This is a potentiometer bottom plate diagram of the electric energy meter EEPROM test device of the utility model;
[0020] Figure 4 It is a circuit diagram of a level conversion test in an electric energy meter EEPROM test device of the utility model;
[0021] Figure 5 It is a circuit diagram of a pull-up resistor test in an electric energy meter EEPROM test device of the utility model;
[0022] Figure 6-1 and Figure 6-2 They are circuit diagrams of two adjustable resistance units in the electric energy meter EEPROM test device of the utility model;
[0023] Figure 7 The utility model discloses a circuit diagram of a pull-up resistor potentiometer in an electric energy meter EEPROM test device.
[0024] Among them, 1-base, 2-fixing screw, 3-EEPROM base, 4-GND interface, 5-VCC interface, 6-SCL / SDA interface, 7-junction box, 81-potentiometer board fixing screw, 82-potentiometer board switch fixing screw, 83-potentiometer board measuring hole, 84-potentiometer pad row, 85-potentiometer board interface, 86-potentiometer board, 91-resistance row fixing screw, 92-resistance row switch fixing screw, 93-resistance row measuring hole, 94-resistance row electric pad row, 95-resistance row interface, 96-resistance row board. DETAILED DESCRIPTION
[0025] The focus of the utility model is to find that the pull-up resistor of the EEPROM has an influence on the power consumption and performance of the EEPROM. Therefore, the test device of the utility model is provided with a power supply module, an adjustable resistance module and an analysis module. The adjustable resistance module includes an adjustable resistance unit with an adjustable resistance value, which can be specifically provided between the positive output end of the power supply module and the SCL of the tested EEPROM, or between the positive output end of the power supply module and the SDA interface of the tested EEPROM, so as to realize that the adjustable resistance unit replaces the pull-up resistor with a fixed resistance value in the original tested EEPROM, so as to understand the influence of different pull-up resistance values on the performance and power consumption of the EEPROM without changing the resistance value of the adjustable resistance unit. The utility model is further described in detail below in conjunction with the accompanying drawings.
[0026] The electric energy meter EEPROM test device of the present embodiment comprises a power supply module, an adjustable resistance module and an analysis module. The power supply module mainly provides different power supply voltages to the EEPROM under test to understand the influence of different power supply voltages on the EEPROM; the adjustable resistance module mainly provides the influence of pull-up resistors with different resistance values on the EEPROM under test; the analysis module is mainly used to analyze and evaluate the influence on the EEPROM.
[0027] When providing different supply voltages to the EEPROM under test to implement level conversion testing of the EEPROM, the key is to use the power supply module. The test circuit is as follows Figure 4 As shown, Figure 4 J1 is the EEPROM under test. The pull-up resistor R1 between its SCL interface (serial clock input interface) and VCC, and the pull-up resistor R2 between the SDA interface (serial address and data input / output) and VCC are all set to a fixed 10K. The SCL interface and SDA interface are also connected to the signal generator / microcontroller to facilitate read and write tests. The power supply module includes two power supply units and a switch ( Figure 4 Specifically, it is a single-pole double-throw switch S3), where the voltage output by one power supply unit is the maximum operating voltage VCCmax required by the EEPROM. Figure 4The voltage output by the other power supply unit is less than the maximum operating voltage VCCmax required by the EEPROM and is greater than or equal to the minimum operating voltage VCCmin required by the EEPROM. Figure 4 The voltage in the middle is 3V DC, which is called the first power supply unit. One end of the single-pole double-throw switch S3 is connected to the VCC end of the EEPROM, and the other end of the single-pole double-throw switch S3 is switched to connect the positive output ends of the two power supply units.
[0028] Specifically, the first power supply unit includes a first transformer T1, a first rectifier module and an adjustable output three-terminal regulator WY1. The first rectifier module specifically selects a rectifier bridge and is called a first rectifier bridge ZL1. The AC end of the first rectifier bridge ZL1 is connected to the AC power interface JK through the first transformer T1 to access the AC power supply, and a first switch S1 is also connected in series between the first transformer T1 and the AC power interface JK. The DC end of the first rectifier bridge ZL1 is output through the adjustable output three-terminal regulator WY1. The adjustable output three-terminal regulator here specifically selects LM317, and one of the pins of LM317 is connected to a potentiometer Rw, and the output of LM317 can be adjusted by adjusting the resistance value of the potentiometer Rw. The power supply unit whose output voltage is the normal working voltage required by the EEPROM includes a second transformer T2, a second rectifier module and a fixed output three-terminal regulator WY2. The second rectifier module specifically selects a rectifier bridge, and is called the second rectifier bridge ZL2. The AC end of the second rectifier bridge ZL2 is connected to the mains interface JK through the second transformer T2 to access the AC mains, and a second switch S2 is also connected in series between the second transformer T2 and the mains interface JK. The DC end of the second rectifier bridge ZL2 is output through a fixed output three-terminal regulator WY2. The fixed output three-terminal regulator WY2 here specifically selects 7805. Moreover, it should be noted that there is basically no excessive circuit connection between the first power supply unit and the second power supply unit, and there will be no influence between them.
[0029] When providing pull-up resistors of different resistance values to the EEPROM under test to implement the pull-up resistor test on the EEPROM, the key is to use the adjustable resistance module. Figure 5 As shown, at this time, the single-pole double-throw switch S3 in the power module is in a state of being connected to the second power unit. The adjustable resistance module includes two adjustable resistance units R3 and R4, which are connected in series between the SCL interface and VCC of the EEPROM under test, and between the SDA interface and VCC of the EEPROM under test. The circuit of the adjustable resistance unit R3 can be as follows: Figure 6-1 As shown, it includes multiple parallel resistance branches, each resistance branch is provided with a controllable switch and a resistor in series, and the resistors are R31~R35 respectively. At this time, by selecting to close different controllable switches, the resistor on the resistance branch where the closed controllable switch is located can be selected to be connected to the test system. Figure 6-1The resistance values of R31~R35 are different, namely 8.2K, 9.1K, 10K, 12K, and 15K. The circuit of the adjustable resistance unit R4 can be as follows: Figure 6-2 As shown, the principle is the same as Figure 6-1 The same, no further description is given here. The resistor array bottom plate corresponding to the circuit adjustable module is shown in the figure below: Figure 2 As shown, 96 is a resistor row plate, and the resistor row plate 96 is provided with a resistor row fixing screw 91, a resistor row switch fixing screw 92, a resistor row measuring hole 93, a resistor row electric pad row 94 and a resistor row interface 95. Of course, the adjustable resistor units R3 and R4 can also be selected as follows Figure 7 The circuit shown includes a potentiometer R51. The potentiometer base plate corresponding to the circuit adjustable module is shown in FIG. Figure 3 As shown, 86 is a potentiometer board, and the potentiometer board 86 is provided with a potentiometer board fixing screw 81, a potentiometer board switch fixing screw 82, a potentiometer board measuring hole 83, a potentiometer pad row 84 and a potentiometer board interface 85. One of these two methods is a discrete adjustment method, and the other is a continuous adjustment method, which can be selected according to demand. It should be noted that the adjustable resistance module here includes two adjustable resistance units R3 and R4, which are respectively connected in series between the SCL interface and VCC of the tested EEPROM, and between the SDA interface and VCC of the tested EEPROM. If the adjustable resistance module only includes one adjustable resistance unit, then the adjustable resistance unit can be connected in series between the SCL interface and VCC of the tested EEPROM, or between the SDA interface and VCC of the tested EEPROM.
[0030] The analysis module is mainly used to evaluate the influence of pull-up resistors with different resistance values on the EEPROM under test and the influence of different voltages output by the power supply module on the EEPROM under test. The analysis module is not drawn in the attached figure. The analysis module is mainly aimed at the electrical performance measurement and function detection of the EEPROM. Among them, the programmer / eraser is used to modify the EEPROM data, including writing\clearing data to a specific address of the EEPROM. Specifically, when performing a level conversion test, the analysis module may include an oscilloscope, a logic analyzer, and a multimeter, and their functions are: checking the integrity and conversion timing of the signal waveform during the level conversion process, analyzing the logic level and timing relationship of the digital signal, and verifying whether the power supply voltage after the level conversion is correct and whether the components are connected; when performing a pull-up resistor test, the analysis module may include an oscilloscope, a logic analyzer, and a curve tracer, and their functions are: checking the influence of the pull-up resistor change on the signal quality, analyzing the communication protocol of the EEPROM if there is an influence, and analyzing and verifying the current and voltage characteristics. If necessary, a chip test system can also be used to verify the influence of level conversion and pull-up resistor test on the reliability of stored data and chip durability. The analysis module itself, and the functions and effects of the analysis module when applied to the test device of the utility model are all prior art and will not be described in detail here.
[0031] The overall structural layout diagram of the test device formed by the above circuit is as follows Figure 1 In addition to the above-mentioned components, the base 1 is also provided with fixing screws 2 and an EEPROM base 3, wherein 4 is a GND interface, 5 is a VCC interface, 6 is an SCL / SDA interface, and 7 is a junction box.
[0032] Based on the test device introduced above, the following tests can be implemented:
[0033] Test 1: Test the effect of low voltage on EEPROM read and write data. The test circuit of this test is as follows Figure 4 As shown, for the supply voltage of EEPROM, the signal generator or the control level interface of the microcontroller performs a read and write test on the EEPROM to verify the quality screening of a certain model of EEPROM. The process is as follows:
[0034] 1) Determine the critical value range of the supply voltage of the EEPROM within the specification, such as the minimum value VCCmin and the maximum value VCCmax, to determine its performance under different voltages. In this embodiment, VCCmax is 5V and VCCmin is 3V.
[0035] 2) Read and write performance test: Perform read and write performance tests on the EEPROM at two voltage values, VCCmin and VCCmax, to evaluate its performance under different voltages.
[0036] 3) Data retention time test: The data retention time of EEPROM is tested at two voltage values, VCCmin and VCCmax, to evaluate its data retention capability at different voltages.
[0037] 4) Erase cycle test: The EEPROM is tested for erase cycles at two voltage values, VCCmin and VCCmax, to evaluate its erase capability at different voltages.
[0038] 5) Reliability evaluation: Perform reliability evaluation on EEPROM at two voltage values, VCCmin and VCCmax, including long-term read, write, erase and other operations to evaluate its reliability performance at different voltages.
[0039] It should be noted that the above-mentioned read-write performance test, data retention time test, erase cycle test, and reliability evaluation process are all prior art, and will not be described in detail in this embodiment. The focus is on changing the power supply voltage. Moreover, the test of EEPROM here only tests its influence on the read and write data of EEPROM under two voltage values of VCCmin and VCCmax. Of course, the voltage required for the test can also be selected between VCCmin and VCCmax as the power supply voltage of EEPROM to test EEPROM. At this time, Rw needs to be adjusted to achieve different voltages output by LM317.
[0040] Test 2: Test the effect of pull-up resistor on EEPROM power consumption. The test circuit for this test is as follows: Figure 5 As shown, the process is as follows:
[0041] 1) Prepare a resistor adjustable module. One way is to use a resistor bank to dynamically change the pull-up resistor value, such as Figure 6-1 and 6-2 As shown, another way is to use a potentiometer resistor to fine-tune the pull-up resistor value, such as Figure 7 shown.
[0042] 2) Connect a resistor array or potentiometer board between the SCL pin of the EEPROM and the power supply, or between the SDA pin of the EEPROM and the power supply, or connect a resistor array or potentiometer board between the SCL pin and the power supply and between the SDA pin of the EEPROM and the power supply to form a complete circuit.
[0043] 3) With the help of the adjustable resistance module, measure the power consumption of the EEPROM in different working modes (write, read, standby, etc.).
[0044] 4) Record and analyze the data to understand the effect of pull-up resistors of different resistance values on the power consumption of the EEPROM.
[0045] Test 3: Test the effect of pull-up resistor on EEPROM performance. The test circuit for this test is as follows: Figure 5 As shown, the process is as follows:
[0046] 1) Prepare a resistor adjustable module. One way is to use a resistor bank to dynamically change the pull-up resistor value, such as Figure 6-1 and 6-2 As shown, another way is to use a potentiometer resistor to fine-tune the pull-up resistor value, such as Figure 7 shown.
[0047] 2) Connect a resistor array or potentiometer board between the SCL pin of the EEPROM and the power supply, or between the SDA pin of the EEPROM and the power supply, or connect a resistor array or potentiometer board between the SCL pin and the power supply and between the SDA pin of the EEPROM and the power supply to form a complete circuit.
[0048] 3) Use performance testing tools (such as logic analyzer, oscilloscope, etc.) to measure and record the signal quality and timing of the EEPROM during write and read operations.
[0049] 4) Analyze the test data to understand the impact of pull-up resistors of different resistance values on EEPROM performance.
[0050] It should be noted that the tools (i.e., analysis modules) mentioned above for measuring power consumption and testing signal quality and timing are all existing technologies, and the existing functions of these tools are also used. The focus of this embodiment is to change the pull-up resistor.
Claims
1. An electric energy meter EEPROM test device, characterized in that: The invention comprises a power supply module, an adjustable resistance module and an analysis module. The adjustable resistance module comprises one or two adjustable resistance units with adjustable resistance values for simulating pull-up resistors with different resistance values. If the adjustable resistance module comprises one adjustable resistance unit, one end of the adjustable resistance unit is connected to the positive output end of the power supply module, and the other end is used to connect to the SCL or SDA interface of the EEPROM to be tested. If the adjustable resistance module comprises two adjustable resistance units, one end of the two adjustable resistance units is connected to the positive output end of the power supply module, and the other ends of the two adjustable resistance units are respectively used to connect to the SCL and SDA interfaces of the EEPROM to be tested. The analysis module is used to evaluate the influence of pull-up resistors with different resistance values on the EEPROM to be tested.
2. The electric energy meter EEPROM test device according to claim 1, characterized in that: The adjustable resistance unit includes a potentiometer.
3. The electric energy meter EEPROM test device according to claim 1, characterized in that: The adjustable resistance unit comprises a plurality of parallel resistance branches, each of which is provided with a controllable switch and a resistor in series.
4. The electric energy meter EEPROM test device according to claim 3, characterized in that: The resistance values of the resistors connected in series on each resistance branch are different.
5. The electric energy meter EEPROM test device according to claim 1, characterized in that: The power supply module includes two power supply units and a switching switch, wherein the voltage output by one of the power supply units is the maximum operating voltage required by the EEPROM, and the voltage output by the other power supply unit is less than the maximum operating voltage required by the EEPROM and greater than or equal to the minimum operating voltage required by the EEPROM; one end of the switching switch is the positive output end of the power supply module, and the other end of the switching switch is switched to connect the positive output ends of the two power supply units; the analysis module is also used to evaluate the impact of different voltages output by the power supply module on the EEPROM under test.
6. The electric energy meter EEPROM test device according to claim 5, characterized in that: The voltage output by the other power supply unit is adjustable.
7. The electric energy meter EEPROM test device according to claim 6, characterized in that: The other power supply unit includes a first transformer, a first rectifier module and an adjustable output three-terminal regulator. The AC end of the first rectifier module is used to connect to an AC power source through the first transformer, and the DC end of the first rectifier module is output through the adjustable output three-terminal regulator.
8. The electric energy meter EEPROM test device according to claim 5, characterized in that: One of the power supply units includes a second transformer, a second rectifier module and a fixed output three-terminal regulator. The AC end of the second rectifier module is used to connect to the AC power supply through the second transformer, and the DC end of the second rectifier module is output through the fixed output three-terminal regulator.
9. The electric energy meter EEPROM test device according to claim 5, characterized in that: The switch is a single-pole double-throw switch.
10. The electric energy meter EEPROM test device according to claim 7, characterized in that: The first rectifier module is a rectifier bridge.