Clamp device and chip testing device
By designing a fixture device for chip testing, the cooperation between the first positioning member and the second positioning member is solved, and the reliability and applicability of the test are improved.
CN222689778UActive Publication Date: 2025-03-28SHENZHEN JINGWEIFENG PHOTOELECTRIC TECH CO LTD
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Patent Information
- Application Number
- CN202420710545.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-03
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2034-04-03
AI Technical Summary
Technical Problem
During the chip test, the driver chip is prone to deviation, which causes the needle card to fail to accurately contact the electrode to be tested, affecting the reliability of the test.
Method used
A clamp device is designed, including a base, a first positioning member and a second positioning member. Through the cooperation of the first positioning member and the second positioning member, the accurate positioning and limiting of the chip to be tested on the test platform is ensured, thereby avoiding offset.
Benefits of technology
Improves the reliability of chip testing and ensures that the probe on the needle card can accurately contact the electrode to be tested, and is suitable for chips of different sizes.
✦ Generated by Eureka AI based on patent content.
Abstract
The utility model relates to a clamp device and a chip testing device. The clamp device is applied to a chip test, and comprises a base which comprises a bearing surface; the first positioning piece is arranged on the bearing surface of the base, the first positioning piece comprises a first positioning part and a second positioning part, and the first positioning part and the second positioning part are respectively used for abutting against the adjacent side edges of the chip to be tested; the second positioning piece is detachably connected to the bearing surface of the base and can press the to-be-tested chip on the bearing surface; and the first test contact is arranged in a positioning cavity which is jointly defined by the second positioning piece, the first positioning piece and the bearing surface and is used for accommodating a chip to be tested, and the first test contact can be electrically contacted with a first electrode to be tested of the chip to be tested in the positioning cavity. The clamp device and the chip testing device provided by the utility model are relatively accurate in positioning of the chip to be tested, and relatively high in chip testing reliability.
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