Deembedding circuit for acquiring characteristic parameters of millimeter wave peripheral circuit
By designing deembedded circuits, using S parameter measurement equipment and matrix operations, the problem of millimeter wave chip circuits being affected by external circuits is solved, and the chip performance is achieved is quickly and accurately detected and cost-reduced.
CN222689873UActive Publication Date: 2025-03-28HEFEI MINGHONG MICROELECTRONICS TECH CO LTD
1 Cites 0 Cited by
Patent Information
- Application Number
- CN202421089703.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-05-16
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2034-05-16
AI Technical Summary
Technical Problem
The prior art cannot completely eliminate the influence of millimeter wave chip circuits by external circuits during use, resulting in signal attenuation and performance losses.
Method used
Design a deembedded circuit, including a PCB board, a millimeter wave test circuit and a mirrored setting, connect it to the test circuit through the S parameter measurement device, and use matrix operations to remove the characteristic parameters of the peripheral circuit to obtain the real response of the chip.
Benefits of technology
Effectively remove the impact of microstrip circuits and connectors in the millimeter-wave chip path, achieve fast and accurate detection of chip performance, and reduce production costs.
✦ Generated by Eureka AI based on patent content.
Abstract
The utility model discloses a de-embedding circuit used for obtaining millimeter wave peripheral circuit characteristic parameters. The de-embedding circuit comprises a PCB, a millimeter wave test circuit arranged on the PCB, and a de-embedding circuit which carries out mirror image setting with the millimeter wave test circuit on the PCB by taking a mirror image reference surface as a reference. The system further comprises S parameter measuring equipment; the S parameter measurement device is connected with the millimeter wave test circuit and the de-embedding circuit. According to the utility model, the influence of a microstrip circuit and a connector on a millimeter wave chip channel on a chip device can be eliminated.
Need to check novelty before this filing date? Find Prior Art