Automatic sampling machine for graphite electrode

Abstract

The embodiment of the utility model provides a graphite electrode automatic sampling machine which comprises a rack used for supporting the whole equipment; the cutting tool is mounted on the rack; the cutting protective cover covers the outer side of the cutting tool, the cutting protective cover is of a polygonal bent structure so as to guide the airflow direction, the surface of the inner wall of the cutting protective cover is covered with a high-density dustproof material layer, and the cutting protective cover is provided with a baffle structure; the movable guide rail is arranged on the rack, is connected with the cutting tool and is used for driving the cutting tool to move along a preset track; the sample collecting tank is positioned below the chip protective cover; the fastening clamp is arranged on the workbench of the rack; the baffle structure is installed on the top of the chip protective cover through an elastic connecting piece. Through the scheme of the embodiment of the invention, the blocking effect on splashing chippings can be enhanced.

Description

Technical Field

[0001] This application relates to the field of graphite electrode production and processing technology, specifically to an automatic graphite electrode sampling machine. Background Technology

[0002] The automatic graphite electrode sampler is a device specifically designed for sampling and analysis during the production of graphite electrodes. It aims to improve sampling efficiency and accuracy while reducing reliance on and risks associated with manual operation. However, in actual operation, this equipment faces a challenge: during sampling, due to high-speed operation or material handling, debris splashing is significant, potentially impacting the working environment and equipment stability. Therefore, enhancing the effective prevention of debris splashing is a key area for technical optimization. Summary of the Invention

[0003] In view of this, the present disclosure provides an automatic sampling machine for graphite electrodes, which at least partially solves the problems existing in the prior art.

[0004] This application discloses an automatic sampling machine for graphite electrodes, comprising:

[0005] The frame is used to support the entire device;

[0006] The cutting tool is mounted on the frame;

[0007] A chip protection cover is provided on the outside of the cutting tool. The chip protection cover has a polygonal curved structure to guide the airflow direction. The inner wall surface of the chip protection cover is covered with a high-density dustproof material layer. The chip protection cover is provided with a baffle structure.

[0008] A movable guide rail is mounted on the frame and connected to the cutting tool to drive the cutting tool to move along a predetermined trajectory.

[0009] The sample collection slot is located below the chip protection cover;

[0010] A fastening clamp is provided on the worktable of the machine frame; wherein...

[0011] The baffle structure is installed on the top of the chip protection cover via an elastic connector.

[0012] In one specific embodiment, each bending angle of the polygonal curved structure of the chip protection shield is an obtuse angle, forming a tapered airflow channel.

[0013] In one specific embodiment, the high-density dustproof material layer has a multi-layer composite material structure, including an outer impact-resistant fiber layer and an inner adhesive dust-absorbing coating.

[0014] In one specific embodiment, the bottom of the chip protection cover is provided with a removable collection bag.

[0015] In one specific embodiment, the inner wall of the chip protection cover is provided with multiple flow guide plates, which cooperate with the polygonal curved structure to make the airflow direction uniformly distributed.

[0016] In one specific embodiment, an observation window is provided on the side of the chip protection cover, and a protective net is provided outside the observation window.

[0017] In one specific embodiment, the rotation axis direction of the cutting tool maintains a certain angle (α) with the direction of the tapered airflow channel of the chip guard.

[0018] In one specific embodiment, the sample collection tank is equipped with a sieving device, and the moving guide rail is equipped with a buffer pad.

[0019] This disclosure provides an automatic graphite electrode sampling machine, comprising: a frame for supporting the entire device; a cutting blade mounted on the frame; a chip protection cover covering the outside of the cutting blade, wherein the chip protection cover has a polygonal curved structure to guide airflow, the inner wall surface of the chip protection cover is covered with a high-density dustproof material layer, and the chip protection cover has a baffle structure; a movable guide rail disposed on the frame and connected to the cutting blade for driving the cutting blade to move along a predetermined trajectory; a sample collection slot located below the chip protection cover; and a fastening clamp disposed on the worktable of the frame; wherein the baffle structure is mounted on the top of the chip protection cover via an elastic connector. The solution of this disclosure addresses how to enhance the blocking effect against flying debris. Attached Figure Description

[0020] In the accompanying drawings, unless otherwise specified, the same reference numerals throughout the various drawings denote the same or similar parts or elements. These drawings are not necessarily drawn to scale. It should be understood that these drawings depict only some embodiments disclosed in this application and should not be construed as limiting the scope of this application.

[0021] Figure 1 This is a schematic diagram of the overall structure of the present invention;

[0022] Figure 2 This is a schematic diagram of the internal structure of the cutting guard of the present invention;

[0023] Figure 3 This is a schematic diagram of the cutting protective cover and flow divider plate structure of the present invention;

[0024] Figure 4 This is a schematic diagram of the cross-sectional structure of the cutting protective cover of the present invention;

[0025] Figure 5 This is a schematic diagram of the overall partial structure of the present invention;

[0026] Figure 6 This is a side view of the screening device of the present invention.

[0027] In the diagram: 1. Frame; 2. Cutting blade; 3. Chip guard; 4. Moving guide rail; 5. Sample collection trough; 6. Fastening clamp; 7. Impact-resistant fiber layer; 8. Adhesive dust-absorbing coating; 9. Elastic connector; 10. Removable collection bag; 11. Diverting guide plate; 12. Observation window; 13. Protective net; 14. Sieving device; 31. Polygonal curved structure; 32. High-density dustproof material layer; 33. Baffle structure. Detailed Implementation

[0028] The embodiments of this disclosure will now be described in detail with reference to the accompanying drawings.

[0029] The following specific examples illustrate the implementation of this disclosure. Those skilled in the art can easily understand other advantages and effects of this disclosure from the content disclosed in this specification. Obviously, the described embodiments are only a part of the embodiments of this disclosure, and not all of them. This disclosure can also be implemented or applied through other different specific embodiments, and the details in this specification can also be modified or changed based on different viewpoints and applications without departing from the spirit of this disclosure. It should be noted that, in the absence of conflict, the following embodiments and features in the embodiments can be combined with each other. Based on the embodiments in this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0030] like Figures 1-6 As shown, an automatic graphite electrode sampling machine according to this application includes a frame 1, a cutting tool 2, a chip protection cover 3, a moving guide rail 4, a sample collection tank 5, and a fastening fixture 6. All components are designed to work together to ensure that the equipment can efficiently and safely cut and sample graphite electrodes, and effectively prevent the impact of flying debris on the operating environment and personnel.

[0031] The core component of this sampling machine is a robust and stable frame 1. Frame 1 is mainly used to support the entire equipment structure and fix all other components. The assembly of various components is achieved through techniques such as welding or bolting to ensure the overall strength and reliability of the equipment. At the same time, multiple mounting seats or holes can be set inside the frame 1 as needed to accommodate the positioning requirements of components of different sizes and specifications.

[0032] The cutting tool 2 is the main component that enables the actual cutting function during the sampling process. It is mounted on the frame 1 and fixed to a specific height and tilt angle position through a connecting mechanism. From a technical perspective, the cutting tool 2 is made of a high-hardness, high-toughness alloy material to meet the requirements of high-speed and precise cutting of hard graphite electrodes. In addition, a quick-change structure can be added to its exterior to adapt to the cutting edge requirements under different cutting tasks.

[0033] The chip shield 3 covers the outer portion of the cutting tool 2, effectively preventing chips generated during cutting from splashing outwards during operation. It features a special design to further enhance functionality. Specifically, the shield has a polygonal curved structure 31, a shape that helps guide airflow downwards, reducing the likelihood of dust and fine debris entering the air. The inner wall surface is covered with a coating of high-density dust-proof material (e.g., high-performance polyurethane) to physically absorb and retain particles that may remain inside the shield. Simultaneously, a baffle structure 33 is provided at the top of the shield to intercept larger, high-speed splashing chips, preventing them from escaping the shield's control range.

[0034] The movable guide rail 4 is positioned in a corresponding area on the frame 1 and is directly connected to the cutting tool 2. The function of the movable guide rail 4 is to precisely control the stable movement of the cutting tool 2 along a preset path. In practice, this can be achieved using a ball screw drive combined with a precision linear slider structure, which reduces frictional resistance while ensuring consistent cutting trajectory. Furthermore, limit switches must be installed on both sides of the guide rail to prevent accidental damage caused by exceeding the travel range.

[0035] The sample collection tank 5 is located directly below the chip protection cover 3 and is used to collect graphite samples that fall off during the cutting process, facilitating subsequent collection, processing, and analysis. In a specific implementation, it can be designed with an inclined or tiltable tank structure, utilizing gravity to help the accumulated material flow naturally to a predetermined outlet. Furthermore, the tank bottom material should preferably be made of an antistatic material to prevent electrostatic adsorption from causing blockages in the cleaning process.

[0036] Finally, there is the fastening clamp 6, which is located on the work platform of the frame 1. It is responsible for firmly gripping the target graphite electrode piece that is about to undergo the cutting process. The stable clamping is achieved through a hydraulic gripper mechanism or a mechanical spring-loaded design, so that the fixed workpiece will not shift due to the impact of the high-speed rotating blade.

[0037] like Figure 2 and Figure 3As shown, in one embodiment, the chip protection shield 3 of an automatic graphite electrode sampler of this application has a special polygonal curved structure 31. This structure forms a tapered airflow channel through a series of obtuse-angle bends. Specifically, this structure is located in the outer region of the cutting tool 2 and completely covers the chip splash area during the cutting process. It is composed of several planar sheets, with an obtuse angle design between each two adjacent planes to effectively converge the high-speed airflow, making the splashed chips easier to control and guide. In addition, to ensure effective chip absorption, the entire inner wall of the chip protection shield 3 is covered with a layer of high-density dustproof material 32, thereby further reducing the risk of chip damage to internal components.

[0038] For example, the aforementioned polygonal curved structure 31 can be fixed to a preset position on the frame 1 by welding or mechanical connection, ensuring structural stability while maintaining a certain gap with the cutting tool 2. To ensure the function of the tapered airflow channel, the angle accuracy of each curved section can be adjusted, and an additional mounting bracket can be used to assemble the protective cover onto the frame 1 as a whole, working in conjunction with the moving guide rail 4 to achieve dynamic cooperation.

[0039] like Figure 4 As shown, in one embodiment, the inner wall of the chip protection cover 3 of the automatic graphite electrode sampling machine of this application adopts a special high-density dustproof material layer 32 design. This material layer is composed of a multi-layer composite structure. The outer layer is an impact-resistant fiber layer 7, which has strong toughness and durability and can resist the impact of high-speed chip impact during cutting. The inner layer adopts an adhesive dust-absorbing coating 8, which is mainly used to adsorb and fix graphite chips, preventing them from being further scattered or diffused. Through this combination design, an efficient dust control system can be formed inside the protective cover. In addition, this layered design can also facilitate subsequent cleaning and maintenance, because the outer layer has certain durability characteristics, while the inner layer can be reused by simple wiping.

[0040] For example, during installation, the high-density dustproof material layer 32 made of composite material can be firmly adhered to the inner wall surface of the chip protection cover 3, ensuring a tight fit without gaps. Specifically, the impact-resistant fiber layer 7 is in direct contact with the inner wall of the cover and is fixed with a high-strength adhesive, while the adhesive dust-absorbing coating 8 is evenly applied to the surface of the fiber layer. In this way, the entire chip protection cover 3 not only covers the cutting tool 2 area to block flying chips, but also achieves more comprehensive protection through its multi-layer structure.

[0041] like Figure 2 and Figure 4As shown, in one embodiment, the baffle structure 33 of the automatic graphite electrode sampler of this application is installed on the top of the chip protection cover 3, and is installed to the chip protection cover 3 through an elastic connector 9. This design allows the baffle structure 33 to undergo a small displacement within a certain range when impacted by high-speed flying chips, and achieves rapid reset with the help of the elastic connector 9. Specifically, this design gives the baffle structure 33 a certain degree of flexible deformation capability when subjected to external impact, while maintaining an effective chip blocking function. The position of the baffle structure 33 is precisely in the direction in which chips may escape with maximum initial velocity, effectively improving the overall safety of the chip protection cover 3.

[0042] The elastic connector 9 is made of a material or component capable of controlled deformation and is fixedly installed by connecting the baffle structure 33 and the chip guard 3 at both ends. This installation method allows the baffle structure 33 to flexibly cope with the impact of flying chips while maintaining its original position. For example, springs, rubber parts, or other similar materials can be used as connectors, combined with fastening bolts, to firmly assemble the baffle structure 33 onto the top of the chip guard 3, forming a stable yet flexible overall structure. Technically, this connection relationship can ensure that the actual performance meets design requirements by selecting elastic components with appropriate stiffness and precisely setting their initial preload.

[0043] like Figure 5 As shown, in one embodiment, a detachable collection bag 10 is added to the bottom of the chip protection cover 3 of the automatic graphite electrode sampling machine of this application to collect the chips that were not completely absorbed or processed during the cutting process. This device is tightly fitted to the chip protection cover 3 through a special structural design and can be easily removed for cleaning or replacement. From the installation position, this collection device is fixed to the outer end of the bottom of the chip protection cover 3, ensuring that its opening communicates with the space inside the chip protection cover 3. This component is made of a flexible material, ensuring airtightness while also allowing chips to fall naturally into it.

[0044] Specifically, this collection device employs a detachable design, typically secured to the chip guard 3 via quick-connect fittings (such as clips, Velcro, or elastic bands). Furthermore, it may contain an anti-static lining material to prevent graphite debris from re-adhering to the equipment surface due to triboelectric charging. For ease of maintenance in practical applications, the collection device can also be designed as a pocket-like structure with a slight inclination, allowing debris to slide smoothly into the bottom of the bag and reducing the possibility of retention. For example, in practical implementations, the debris flow direction can be further optimized by adjusting the position of the fixing points or adding guide channels, ensuring efficient operation and cleanliness of the entire system.

[0045] like Figure 3As shown, in one embodiment, the inner wall of the chip protection cover 3 of the automatic graphite electrode sampling machine of this application is provided with several flow diversion guide plates 11. These flow diversion guide plates 11 are closely matched with the polygonal curved structure 31 of the chip protection cover 3 according to a specific distribution pattern. Specifically, the flow diversion guide plates 11 are installed on the inner wall of the chip protection cover 3 and are arranged in an orderly manner along the airflow direction to ensure that the airflow direction can be further refined and adjusted through physical guidance. The polygonal curved structure 31 not only provides a basic path for the airflow, but also serves as the supporting foundation for the flow diversion guide plates 11, and the two together optimize the aerodynamic characteristics. The flow diversion guide plates 11 and the polygonal curved structure 31 are assembled together by a fixed connection to ensure the overall structural stability.

[0046] For example, the flow divider 11 can be fabricated by machining and fixed to a designated area of ​​the chip protection cover 3. Specific implementation methods include using a high-strength adhesive to bond the flow divider 11 to the inner wall surface or using screws to fasten the flow divider 11 to the polygonal curved structure 31 of the chip protection cover 3. This installation method ensures component stability while maintaining relative adjustability, facilitating adjustments to the position and angle distribution of the flow divider 11 according to different operating conditions.

[0047] like Figure 5 As shown, in one embodiment, the chip protection cover 3 of the automatic graphite electrode sampling machine of this application is equipped with an observation window 12 on its side for real-time monitoring of the internal working status. The observation window 12 is made of a transparent and impact-resistant material and is embedded in a specific area on the side of the chip protection cover 3. To avoid the risk of chip leakage from the observation window 12, an additional protective net 13 is installed on its exterior. This protective net 13 covers the entire outline of the observation window 12 to form a double-layer protective structure. This design allows the operator to observe the status changes of the internal cutting process while ensuring safety. Simultaneously, the protective net 13 and the chip protection cover 3 are securely connected to ensure that they will not detach or shift under high-intensity use conditions.

[0048] Specifically, a high-strength transparent material, such as polycarbonate, is selected as the base material for the observation window 12, and it is embedded into a pre-set opening on the side of the chip protection cover 3 using threaded fixing or other fastening processes. Subsequently, a protective net 13, made of materials such as metal woven mesh, is assembled to the corresponding position on the outside of the chip protection cover 3 by welding or snap-fitting, ensuring a tight connection between the protective net 13 and the chip protection cover 3. For example, in actual production, suitable openings and fixing interfaces can be pre-reserved during the manufacturing of the chip protection cover 3 to ensure the modularity and maintainability of the entire structure.

[0049] like Figure 3As shown, in one embodiment, the rotation axis of the cutting tool 2 of the automatic graphite electrode sampling machine of this application maintains a certain angle with the direction of the gradually narrowing airflow channel inside the chip protection cover 3 on its outer side. This structural design ensures that the flying chips generated during the cutting process can effectively change their propagation direction under the guidance of gas. Specifically, by adjusting the relative relationship between the installation position of the cutting tool 2 and the curved part of the chip protection cover 3, a specific angle setting in their directions can be achieved. Since the chip protection cover 3 adopts a polygonal curved structure 31 as its basis, and a gradually narrowing airflow channel is formed inside it, the flow trajectory of the chips can be further optimized.

[0050] For example, in one specific embodiment, the cutting tool 2 can be positioned at a slight angle on the frame 1, and the aforementioned design requirements can be fulfilled by cooperating with the pre-defined polygonal curved portion in the chip protection shield 3. To achieve this goal, the cutting tool 2 can be fixed by adding an additional connecting component and its angular position can be finely adjusted so that it ultimately forms a predetermined angle with the gradually narrowing airflow path inside the shield when it rotates. In this way, the requirements of the aforementioned features can be met from both a mechanical connection and technical implementation perspective.

[0051] like Figure 6 As shown, in one embodiment, the sample collection tank 5 of the automatic graphite electrode sampling machine of this application is equipped with a sieving device 14. The sieving device 14 is installed at a lower position inside the sample collection tank 5 to achieve preliminary screening and classification of the samples generated during cutting. By distinguishing samples of different particle sizes, it is ensured that each batch of samples can meet the requirements for further testing. In addition, to reduce instability factors during equipment operation, a buffer pad is added to the moving guide rail 4 and directly mounted on the surface of the guide rail. Specifically, this buffer pad is made of a material with good elastic recovery properties, which can effectively reduce abnormal splashing of debris caused by vibration or friction during guide rail movement, thereby improving the overall operational reliability of the sampling machine.

[0052] For example, a multi-layer filter stacking method can be adopted in the design of the screening device 14, with each layer of filter corresponding to a specific particle size, and fixed to the inner wall of the sample collection tank 5 to maintain stable installation. At the same time, the buffer pad can be bonded to the outer part of the moving guide rail 4 in a strip or dot matrix manner, and the tight fit ensures the precise and smooth movement of the cutting blade 2 driven by the moving guide rail 4.

[0053] In actual operation, when this device is used, the graphite electrode to be cut can be placed on the worktable and fixed with the fastening clamp 6 to ensure its stability during sampling. Then, the cutting tool 2 is started, and under the action of the moving guide rail 4, it moves along a predetermined trajectory to cut and sample the graphite electrode. The debris and airflow generated during the cutting process are effectively guided and controlled by the chip protection cover 3. The high-density dustproof material layer 32 absorbs the splashing debris, while the baffle structure 33 further prevents high-speed debris from overflowing. The cut sample eventually falls into the sample collection tank 5 for subsequent processing and testing. The entire process achieves automated graphite electrode sampling, ensuring both safety and efficiency.

[0054] This document describes several embodiments of the present invention; however, for the sake of brevity, the descriptions of the embodiments are not exhaustive, and identical or similar features or parts between the embodiments may be omitted. In this document, "one embodiment," "some embodiments," "example," "specific example," or "some examples" refers to embodiments applicable to at least one, but not all, of the present invention. The above terms do not necessarily refer to the same embodiments or examples. Without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described herein, as well as the features of the different embodiments or examples.

[0055] The exemplary systems and methods of the present invention have been specifically shown and described with reference to the above embodiments, which are merely examples of the best mode for implementing the systems and methods. Those skilled in the art will understand that various changes can be made to the embodiments of the systems and methods described herein without departing from the spirit and scope of the invention as defined in the appended claims when implementing the systems and / or methods.

Claims

1. A graphite electrode automatic sampling machine characterized by comprising: include: A frame (1) is used to support the entire equipment; A cutting tool (2) is mounted on the frame (1); A chip protection cover (3) covers the outside of the cutting tool (2), wherein the chip protection cover (3) has a polygonal curved structure (31) to guide the airflow direction, the inner wall surface of the chip protection cover (3) is covered with a high-density dustproof material layer (32), and the chip protection cover (3) is provided with a baffle structure (33). A movable guide rail (4) is mounted on the frame (1) and connected to the cutting tool (2) to drive the cutting tool (2) to move along a predetermined trajectory; The sample collection slot (5) is located below the chip protection cover (3); A fastening clamp (6) is provided on the worktable of the frame (1); wherein, The baffle structure (33) is installed on the top of the chip protection cover (3) via an elastic connector (9).

2. The automatic graphite electrode sampler according to claim 1, characterized in that: The polygonal curved structure (31) of the chip protection shield (3) has an obtuse angle at each bend, forming a gradually narrowing airflow channel.

3. The automatic graphite electrode sampler according to claim 1, characterized in that: The high-density dustproof material layer (32) has a multi-layer composite material structure, including an outer impact-resistant fiber layer (7) and an inner adhesive dust-absorbing coating (8).

4. The automatic graphite electrode sampler according to claim 1, characterized in that: The chip protection cover (3) is provided with a detachable collection bag (10) at the bottom.

5. The automatic graphite electrode sampler according to claim 1, characterized in that: The inner wall of the chip protection cover (3) is provided with multiple flow guide plates (11), which cooperate with the polygonal curved structure (31) to make the airflow direction uniformly distributed.

6. The automatic graphite electrode sampler according to claim 1, characterized in that: The chip protection cover (3) has an observation window (12) on its side, and a protective net (13) is provided outside the observation window (12).

7. The automatic graphite electrode sampler according to claim 1, characterized in that: The rotation axis of the cutting tool (2) maintains a certain angle (α) with the direction of the gradually narrowing airflow channel of the chip protection cover (3).

8. The automatic graphite electrode sampler according to claim 1, characterized in that: The sample collection tank (5) is equipped with a sieving device (14), and the moving guide rail (4) is equipped with a buffer pad.

Images