Docking plate apparatus and test handler

Abstract

The utility model provides a kind of docking plate device, docking plate device includes base, top plate and sealing assembly, base is equipped with slot;Top plate covers part slot bottom and forms an opening with slot communication, to supply test chip from opening into slot or from slot take out;Sealing assembly includes driving device and sealing plate;Driving device is used to drive sealing plate relative top plate to move, so that sealing plate seals in opening or opens opening.In addition, the utility model further provides a kind of test sorting machine.The utility model is by being provided with the base with slot, top plate and the sealing assembly formed by driving device and sealing plate, forms controllable sealing cavity, to realize pre-warming, heat preservation to middle test device in sealing cavity when low temperature test, reduce the dry gas consumed for making test device reach preset dew point, to reduce low temperature test cost.

Description

Technical Field

[0001] This utility model relates to the field of sorting machine technology, and in particular to a docking plate device and a testing sorting machine. Background Technology

[0002] Existing test sorting machines use test devices to test the performance of chips, such as temperature performance. However, these machines do not isolate the test devices from the external environment, making them susceptible to external influences during low-temperature testing. This makes it difficult to achieve stable pre-temperature and insulation of the test devices, and the excessive amount of drying gas required to bring the test devices to the preset dew point during low-temperature testing results in high costs. Utility Model Content

[0003] In view of this, it is necessary to propose a docking plate device and a testing and sorting machine.

[0004] In a first aspect, this utility model provides a docking plate device, which includes a base, a top plate, and a sealing assembly. The base has a slot; the top plate covers part of the bottom of the slot and forms an opening communicating with the slot, so that a test chip can be inserted into the slot or removed from the slot through the opening; the sealing assembly includes a driving device and a sealing plate; the driving device is used to drive the sealing plate to move relative to the top plate, so that the sealing plate seals the opening or opens the opening.

[0005] Furthermore, the top plate is made of heat-insulating material.

[0006] Furthermore, the sealing plate includes a first sealing plate and a second sealing plate, which are respectively connected to the driving device and driven by the driving device to move relative to each other to close, so as to cover the opening; or driven by the driving device to move in opposite directions to open, so as to open the opening.

[0007] Furthermore, the first sealing plate, the second sealing plate, and the driving device are all located on the side of the top plate facing the base, and the first sealing plate and the second sealing plate are respectively disposed on opposite sides of the opening, and the driving device is disposed between the opposite sides of the opening.

[0008] Furthermore, the slot is provided with an injection port, which allows an external gas supply device to inject dry gas into the slot so that the test device reaches a preset dew point.

[0009] Furthermore, a test assembly is installed between the top plate and the base; when the test chip is placed into the slot, the test assembly is used to place the test chip.

[0010] Furthermore, the test assembly includes a connecting plate and a test device disposed on the connecting plate, the connecting plate being mounted on the side of the top plate facing the base.

[0011] Furthermore, the connecting plate and the test device are aligned and installed using locating pins.

[0012] Secondly, this utility model provides a test sorting machine, which includes a test arm and the aforementioned docking plate device. The test arm is used to pick up test chips.

[0013] Furthermore, the test sorting machine is equipped with a distance detector; when the distance detector detects that the test arm has moved to a distance of a preset distance from the docking plate device, the driving device drives the sealing plate to move relative to the top plate, so that the sealing plate opens the opening.

[0014] The aforementioned docking plate device and test sorting machine form a controllable sealed cavity by setting a slotted base, a top plate, and a sealing assembly consisting of a drive component and a sealing plate. This allows for pre-warming and heat preservation of the test devices in the test assembly within the sealed cavity during low-temperature testing, reducing the amount of dry gas required to bring the test devices to the preset dew point and thus lowering the cost of low-temperature testing. Attached Figure Description

[0015] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on the structures shown in these drawings without creative effort.

[0016] Figure 1 An exploded view of the docking plate device provided in an embodiment of the utility model.

[0017] Figure 2 A perspective view of the docking plate device provided in an embodiment of the utility model.

[0018] Figure 3 A first partial structural schematic diagram of the docking plate device provided in an embodiment of the utility model.

[0019] Figure 4 A second partial structural schematic diagram of the docking plate device provided in an embodiment of the utility model.

[0020] Figure 5 A first structural schematic diagram of a test sorting machine provided for an embodiment of the utility model.

[0021] Figure 6A schematic diagram of the second structure of the test sorting machine provided in an embodiment of the utility model.

[0022] Component designations

[0023]

[0024]

[0025] The realization of the purpose, functional features and advantages of this utility model will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0026] In the description of this utility model, it should be understood that the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this utility model and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this utility model.

[0027] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this utility model, "a plurality of" means two or more, unless otherwise explicitly specified.

[0028] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0029] To provide a clearer and more accurate understanding of the present invention, a detailed description will now be provided in conjunction with the accompanying drawings. The accompanying drawings illustrate examples of embodiments of the present invention, wherein the same reference numerals denote the same elements. It is to be understood that the scale shown in the accompanying drawings is not the actual scale of the present invention, and is for illustrative purposes only, and is not a drawing based on the original dimensions.

[0030] Please refer to Figure 5This application provides a test sorting machine 1000. The test sorting machine 1000 includes a test arm 200 and a docking plate device 100. The test arm 200 is used to pick up test chips (not shown). The docking plate device 100 is provided with test components. By docking with the test arm 200, the docking plate device 100 allows the test chips to be picked up and placed into the test components to complete chip testing. In this application, the test sorting machine 1000 can be a translational test sorting machine. Chip testing includes, but is not limited to, temperature testing, pressure testing, etc. The docking plate device 100 is a device installed inside the test sorting machine 1000. The test components are isolated from the outside world within the test sorting machine 1000 during chip testing through the docking plate device 100, reducing the influence of the outside world on the chip testing of the test components, especially temperature testing. The structural features of the docking plate device 100 will be described in detail below.

[0031] Please refer to Figure 1 This application provides a docking plate device 100. The docking plate device 100 is applied to the aforementioned test sorting machine 1000. The docking plate device 100 includes a base 1, a top plate 2, a sealing assembly 3, and a test assembly 4. The base 1 has a slot 11. In this application, the slot 11 is located below the base 1. The top plate 2 and the sealing assembly 3 are respectively located above the base 1. The test assembly 4 is located within the slot 11. The structural features of each component within the docking plate device 100 will be described in detail below.

[0032] In this embodiment, the base 1 is a closed frame with an inner frame communicating with the slot 11. The slot 11 is installed on one side of the base 1 and covers the inner frame. Specifically, the closed frame has several fixing holes. The slot 11 is a cover with one open side and the rest closed. The slot 11 is installed on one side of the base 1 by several fasteners corresponding to the fixing holes, so that the slot 11 faces the inner frame and communicates with it. The shape of the closed frame in this application can be customized according to the needs of chip testing within the docking plate device 100. For example, if several test chips are to be arranged in an array within the docking plate device 100, the shape of the closed frame can be set according to the geometry corresponding to the array, including but not limited to rectangles, circles, rounded rectangles, etc. Accordingly, to ensure that the slot 11 covers the inner frame, the shape and size of the slot 11 can be customized to match the shape of the closed frame. The installation methods of the slot 11 in this application include but are not limited to threaded connections, snap-fit ​​connections, etc. Correspondingly, the fixing hole can be a threaded hole, a plug hole, etc., and the fixing part can be a threaded part, a snap-fit ​​part, etc.

[0033] The top plate 2 is made of heat-insulating material to provide a heat-insulating environment for the docking plate device 100. The top plate 2 covers part of the bottom of the slot 11 and forms an opening 21 communicating with the slot 11, allowing the test chip to be inserted into or removed from the slot 11 through the opening 21. That is, the top plate 2 is located on the side of the base 1 away from the slot 11. In this application, the top plate 2 includes a top plate frame and an opening 21 formed by the top plate frame, that is, the top plate 2 is also a closed frame and also has several fixing holes. The top plate 2 is installed on the side of the base 1 away from the slot 11 by several fasteners corresponding to the fixing holes. The fasteners used between the slot 11 and the top plate 2 can be the same or different, and correspondingly, the way the slot 11 and the top plate 2 are installed on the base 1 can be the same or different.

[0034] Furthermore, a test assembly 4 is installed between the top plate 2 and the base 1. The test assembly 4 is used to place the test chip when it is inserted into the slot 11. Figure 4 As shown, the test assembly 4 includes a connecting plate 41 and a test device 42. The connecting plate 41 is mounted on the side of the top plate 2 facing the base 1, and the test device 42 is disposed on the connecting plate 41. The connecting plate 41 and the test device 42 are aligned and installed using several positioning pins 40. In this application, the test assembly 4 is also located within a slot 11. The connecting plate 41 also has the same connection opening as the slot 11, meaning the connecting plate 41 is also a closed frame and has several fixing holes. The connecting plate 41 is mounted on the side of the top plate 2 facing the base 1 using several fasteners corresponding to the fixing holes, and is aligned and installed using positioning pins 40 and the test device 42. The fasteners used in the slot 11, top plate 2, and connecting plate 41 can be the same or different; correspondingly, the way the slot 11, top plate 2, and connecting plate 41 are mounted on the base 1 can be the same or different. Along the axis Z perpendicular to the slot 11, the geometric centers of the top plate 2, connecting plate 41, and base 1 are aligned sequentially.

[0035] The sealing assembly 3 is located on the side of the top plate 2 opposite to the base 1. The sealing assembly 3 includes a driving component 31 and a sealing plate 32. The driving component 31 drives the sealing plate 32 to move relative to the top plate 2, causing the sealing plate 32 to seal against or open the opening 21. Figure 3 As shown, the sealing plate 32 includes a first sealing plate 321 and a second sealing plate 322. The first sealing plate 321 and the second sealing plate 322 are respectively connected to the driving device 31 and are driven by the driving device 31 to move relative to each other to close, so as to cover the opening 21; or they are driven by the driving device 31 to move in opposite directions to open, so as to open the opening 21. Specifically, the driving device 31 has connecting portions 30 at both ends, and the first sealing plate 321 and the second sealing plate 322 are respectively connected to the driving device 31 through different connecting portions 30.

[0036] In this application, the first sealing plate 321, the second sealing plate 322, and the driving component 31 are all located on the side of the top plate 2 facing the base 1. Specifically, the first sealing plate 321 and the second sealing plate 322 are respectively disposed on opposite sides of the opening 21, and the driving component 31 is disposed between the opposite sides of the opening 21. The driving component 31 is used to drive the first sealing plate 321 and the second sealing plate 322 to move along a first direction X1 or a second direction X2. The first direction X1 and the second direction X2 are opposite to each other. In this application, the driving component 31 drives one of the first sealing plate 321 and the second sealing plate 322 to move along the first direction X1 and the other along the second direction X2. The driving component 31 can simultaneously drive the first sealing plate 321 and the second sealing plate 322 to move relative to each other or opposite to each other, or drive the first sealing plate 321 and the second sealing plate 322 to move independently along the first direction X1 or the second direction X2. The connection between the first sealing plate 321 and the second sealing plate 322 and the corresponding connecting part 30 can be a welded connection.

[0037] When the driving device 31 drives the first sealing plate 321 and the second sealing plate 322 to move in opposite directions to open and open the opening 21, the test assembly 4 is exposed to the docking plate device 100, so that the test arm 200 can pick up the test chip and place it into the test assembly 4. When the driving device 31 drives the first sealing plate 321 and the second sealing plate 322 to move relative to each other to close and cover the opening 21, the first sealing plate 321 and the second sealing plate 322 cooperate to cover the opening 21 with the sealing plate 3232, so that the slot 11 cooperates with the sealing plate 3232 to form a sealed cavity, thereby sealing the test assembly 4 in the sealed cavity. It can be understood that the sealing plate has an initial state, and in the initial state, it can achieve sealing of the test assembly 4. That is, the initial state of the first sealing plate 321 and the second sealing plate 322 can be to cover the opening 21, so that the test device 41 is initially blocked from the outside world, which facilitates the preheating and heat preservation of the test device 41.

[0038] Furthermore, the slot 11 is provided with an injection port 10. When the first sealing plate 321 and the second sealing plate 322 cover the opening 21, the injection port 10 allows an external gas supply device to inject dry gas into the slot 11 so that the test component 4 reaches the preset dew point, thereby meeting the requirements of temperature testing.

[0039] In some feasible embodiments, in order to enable the docking plate device 100 to keep the test component 4 warm, the slot 11 and the sealing plate 32 may also be made of heat-insulating material.

[0040] In this embodiment, the test sorting machine 1000 is equipped with a distance detector (not shown). For example... Figure 6As shown, the first sealing plate 321 and the second sealing plate 322 are initially positioned to cover the opening 21, thus initially isolating the test device 41 from the outside environment. When the distance detector detects that the test arm 200 has moved to a preset distance from the docking plate device 100, it indicates that the test chip is about to be tested. At this time, the driving device 31 drives the sealing plate 32 to move relative to the top plate 2, that is, the driving device 31 drives the first sealing plate 321 and the second sealing plate 322 to move back to back until the opening 21 is opened, exposing the test component 4 to the docking plate device 100, so that the test arm 200 can pick up the test chip and place it into the test component 4. After the test chip is tested, the test arm 200 picks up the test chip from the test component 4 and removes it from the docking plate device 100 through the opening 21. At this time, the driving device 31 drives the first sealing plate 321 and the second sealing plate 322 to move relative to each other until the opening 21 is closed, sealing the test component 4 in the docking plate device 100, which facilitates the preheating and heat preservation of the test device 41. When other test chips also need to be tested, the test arm 200 is controllably moved back to a preset distance from the docking plate device 100 and the above steps are repeated to complete the testing of multiple test chips.

[0041] In some feasible embodiments, after the test arm 200 picks up the test chip into the test assembly 4, the test arm 200 can be controlled to move out of the docking plate device 100 from the opening 21, and the first sealing plate 321 and the second sealing plate 322 can be driven by the driving device 31 to cover the opening 21. After the test chip is tested, the test arm is controlled to move to a preset distance from the docking plate device 100, and the first sealing plate 321 and the second sealing plate 322 can be driven by the driving device 31 to open the opening 21, so that the test arm 200 can pick up the test chip from the test assembly 4 and move it out of the docking plate device 100 from the opening 21.

[0042] In other feasible embodiments, when the test sorter 1000 experiences a fault not induced by the test device 42, during the maintenance of the test sorter 1000 by maintenance personnel, the docking plate device 100 can also isolate the test component 4 from the outside world through the sealing plate 3232. Even if the first sealing plate 321 and the second sealing plate 322 remain closed to protect the test component 4, after the maintenance is completed, the first sealing plate 321 and the second sealing plate 322 are driven to move in opposite directions to open and restore the test component 4 to be exposed to the docking plate device 100.

[0043] In the above embodiments, by setting a slotted base, a top plate, and a sealing assembly consisting of a driving device and a sealing plate, a controllable sealed cavity is formed. This allows for pre-warming and heat preservation of the test device in the test assembly within the sealed cavity during low-temperature testing, reducing the amount of dry gas required to bring the test device to a preset dew point and thus lowering the cost of low-temperature testing.

[0044] Obviously, those skilled in the art can make various modifications and variations to this utility model without departing from the spirit and scope of this application. Therefore, if these modifications and variations of this utility model fall within the scope of the claims of this utility model and their equivalents, this utility model is also intended to include these modifications and variations.

[0045] The above-listed embodiments are merely preferred embodiments of the present utility model and should not be construed as limiting the scope of the present utility model. Therefore, any equivalent variations made in accordance with the claims of the present utility model shall still fall within the scope of the present utility model.

Claims

1. A docking plate device, characterized in that, The docking plate device includes: The base has a slot. A top plate, covering part of the slot bottom and forming an opening communicating with the slot, allows the test chip to be inserted into or removed from the slot through the opening; and A sealing assembly includes a driving mechanism and a sealing plate; the driving mechanism is used to drive the sealing plate to move relative to the top plate, so that the sealing plate seals the opening or opens the opening.

2. The docking plate device as described in claim 1, characterized in that, The top plate is made of heat-insulating material.

3. The docking plate device as described in claim 2, characterized in that, The sealing plate includes a first sealing plate and a second sealing plate, which are respectively connected to the driving device and driven by the driving device to move relative to each other to close, so as to cover the opening; Alternatively, the driving device can drive the opposite sides to move to open, thereby opening the opening.

4. The docking plate device as described in claim 3, characterized in that, The first sealing plate, the second sealing plate, and the driving device are all located on the side of the top plate facing the base, and the first sealing plate and the second sealing plate are respectively disposed on opposite sides of the opening, and the driving device is disposed between the opposite sides of the opening.

5. The docking plate device as described in claim 1, characterized in that, The slot is provided with an injection port, which allows an external gas supply device to inject dry gas into the slot so that the test device reaches a preset dew point.

6. The docking plate device as described in claim 1, characterized in that, A test assembly is installed between the top plate and the base; when the test chip is placed in the slot, the test assembly is used to place the test chip.

7. The docking plate device as described in claim 6, characterized in that, The test assembly includes a connecting plate and test devices disposed on the connecting plate, the connecting plate being mounted on the side of the top plate facing the base.

8. The docking plate device as described in claim 7, characterized in that, The connecting plate and the test device are aligned and installed using locating pins.

9. A testing and sorting machine, characterized in that, The test sorting machine includes: The test arm is used to pick up the test chip; and The docking plate device as described in any one of claims 1-8.

10. The test sorting machine as described in claim 9, characterized in that, The test sorting machine is equipped with a distance detector; when the distance detector detects that the test arm has moved to a distance of a preset distance from the docking plate device, the driving device drives the sealing plate to move relative to the top plate, so that the sealing plate opens the opening.

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