A high-speed centrifugal test clamping device for microelectronic devices

Abstract

The utility model discloses a kind of microelectronic device high-speed centrifugal test clamping devices, belong to microelectronic device technical field, the utility model includes bearing seat, the upper side of bearing seat is equipped with first support plate;First support plate is equipped with colloid clamping component on it, bearing plate is equipped on bearing seat, sliding clamp is equipped on bearing plate;First support plate is equipped with first fixed plate, first fixed plate is equipped with first threaded rod by screw thread connection in it;The end of first threaded rod is equipped with the limiting plate in contact with the sliding clamp, sliding clamp is moved, let sliding clamp gradually close to electronic device, until reach preset position clamping device, then rotate first threaded rod, let limiting plate follow movement, until limiting plate reaches preset position and is in contact with sliding clamp, to fix sliding clamp, colloid clamping component and sliding clamp cooperate, avoid the inconvenience of clamping operation.

Description

Technical Field

[0001] This utility model belongs to the field of microelectronic device technology, and in particular relates to a high-speed centrifugal test clamping device for microelectronic devices. Background Technology

[0002] Currently, accelerated centrifugation tests are conducted using the magnetic attachment method. Specifically, a magnetically generated disc is embedded within the main rotor of the high-acceleration centrifuge. Electronic components are then magnetically attached to this magnetically generated disc. Next, the safety device is activated, the appropriate conditions are set, and the high-acceleration centrifuge begins the test. During the test, the main rotor of the high-acceleration centrifuge drives the magnetically generated disc to rotate. After the equipment stops running, the sample is removed from the magnetically generated disc and placed in an anti-static aluminum tray. This completes the entire test.

[0003] In the process of centrifugation using the magnetic bonding method, metallic electronic devices can be directly adsorbed onto the turntable. However, for ceramic and glass electronic devices, it is necessary to first use tape to stick the electronic device onto the metal sheet, and then adsorb the metal sheet onto the turntable. This method of fixing ceramic and glass electronic devices by adhesive is not only extremely inconvenient to operate, but also faces the risk that the components may fall off during centrifugation due to insufficient adhesion. Utility Model Content

[0004] To solve the above-mentioned technical problems, this utility model provides: a high-speed centrifugal test clamping device for microelectronic devices, including a carrier base, and a first support plate is installed on the upper side of the carrier base;

[0005] A colloid clamping assembly is installed on the first support plate, a bearing plate is installed on the bearing seat, and a sliding clamping component is installed on the bearing plate;

[0006] A first fixing plate is mounted on the first support plate, and a first threaded rod is threadedly connected inside the first fixing plate.

[0007] One end of the first threaded rod is fitted with a limiting plate that contacts the sliding clamping member.

[0008] As a preferred embodiment of the present invention, the colloid clamping assembly includes a plurality of first slides formed on the first support plate;

[0009] Multiple symmetrical first and second sliders are slidably connected within the first slide rail, and multiple convex colloids are fixedly connected to both the first and second sliders.

[0010] As a preferred embodiment of this invention, the convex colloid is cylindrical and made of rubber.

[0011] As a preferred embodiment of this utility model, each of the first slide rails is rotatably connected with a bidirectional screw.

[0012] Both the first slider and the second slider are threadedly connected to the bidirectional screw, and a first drive disc is installed at both ends of the bidirectional screw.

[0013] As a preferred embodiment of the present invention, the sliding clamping member includes two guide rods fixedly connected to the first support plate;

[0014] The other end of the guide rod is fixedly connected to the bearing plate, and a clamping plate is slidably connected to the guide rod;

[0015] One side of the limiting plate can be attached to the clamping plate.

[0016] As a preferred embodiment of the present invention, a threaded sleeve is rotatably connected to the bearing plate;

[0017] The threaded sleeve has a second threaded rod connected by threads inside, and one end of the second threaded rod is fixedly connected to the back of the clamping plate.

[0018] As a preferred embodiment of this utility model, one end of the threaded sleeve is fixedly connected to a second drive disc, and one side of the clamping plate is provided with a rubber layer.

[0019] Compared with the prior art, the beneficial effects of this utility model are as follows:

[0020] When clamping ceramic or glass electronic devices, first move the clamping device to the designated position, then place the electronic device between the colloid clamping assembly and the sliding clamping member. Move the sliding clamping member so that it gradually approaches the electronic device until it reaches the preset position and clamps the device. Then rotate the first threaded rod to move the limiting plate until it reaches the preset position and presses against the sliding clamping member, thereby fixing the sliding clamping member. The colloid clamping assembly and the sliding clamping member work together to avoid the inconvenience of clamping operations. Attached Figure Description

[0021] Figure 1 This is a first-view three-dimensional structural diagram of the high-speed centrifugal test clamping device for microelectronic devices provided in this embodiment of the utility model;

[0022] Figure 2 This is a second-view perspective three-dimensional structural diagram of the high-speed centrifugal test clamping device for microelectronic devices provided in this embodiment of the utility model;

[0023] Figure 3 This is a three-dimensional structural diagram of the colloid clamping component of the high-speed centrifugal test clamping device for microelectronic devices provided in this embodiment of the utility model;

[0024] Figure 4 This is a three-dimensional structural diagram of the sliding clamping component of the high-speed centrifugal testing clamping device for microelectronic devices provided in this embodiment of the utility model.

[0025] In the figure: 1. Bearing seat; 2. First support plate; 3. Bearing plate; 4. First fixing plate; 5. First threaded rod; 6. Limiting plate; 7. First slide rail; 8. First slider; 9. Second slider; 10. Convex colloid; 11. Bidirectional screw; 12. First drive disk; 13. Guide rod; 14. Clamping plate; 15. Threaded sleeve; 16. Second threaded rod; 17. Second drive disk. Detailed Implementation

[0026] To further understand the invention content, features and effects of this utility model, the following embodiments are provided, and detailed descriptions are given in conjunction with the accompanying drawings.

[0027] The structure of this utility model will now be described in detail with reference to the accompanying drawings.

[0028] Please see Figures 1 to 4 This utility model provides a high-speed centrifugal testing clamping device for microelectronic devices, including a carrier base 1, a first support plate 2 mounted on the upper side of the carrier base 1; a colloid clamping assembly mounted on the first support plate 2; a carrier plate 3 mounted on the carrier base 1; a sliding clamping member mounted on the carrier plate 3; a first fixing plate 4 mounted on the first support plate 2; a first threaded rod 5 threadedly connected to the first fixing plate 4; and a limiting plate 6 that contacts the sliding clamping member mounted at one end of the first threaded rod 5.

[0029] The above solution works as follows: When using a device to clamp ceramic or glass electronic components, the clamping device is first positioned at the designated location. Then, the electronic component is placed between the colloid clamping assembly and the sliding clamping component. By moving the sliding clamping component, it moves towards one side of the colloid clamping component and gradually approaches the electronic component until it reaches the preset position, where it clamps the electronic component. Next, the first threaded rod 5 is rotated to move in the opposite direction, simultaneously driving the limiting plate 6 to move synchronously until the limiting plate 6 moves to the preset position and presses against the sliding clamping component, thereby fixing the sliding clamping component. In this way, the colloid clamping assembly and the sliding clamping component work together to avoid the problem of inconvenient clamping operation.

[0030] Furthermore, the colloid clamping assembly includes a plurality of first slides 7 formed on the first support plate 2; a plurality of symmetrical first sliders 8 and second sliders 9 are slidably connected in the first slides 7, and a plurality of convex colloids 10 are fixedly connected to the first sliders 8 and the second sliders 9.

[0031] Furthermore, the convex colloid 10 is cylindrical and made of rubber.

[0032] Furthermore, a bidirectional screw 11 is rotatably connected within the first slide rail 7; the first slider 8 and the second slider 9 are both threadedly connected to the bidirectional screw 11, and a first drive disc 12 is installed at both ends of the bidirectional screw 11.

[0033] Using the above scheme: When in use, the operator rotates the first drive disk 12 at both ends of the bidirectional screw 11, which causes the bidirectional screw 11 to rotate in the first slide rail 7. Since the first slider 8 and the second slider 9 are connected to the bidirectional screw 11 by threads, when the bidirectional screw 11 rotates, it will push the first slider 8 and the second slider 9 closer to each other in the first slide rail 7, thereby adjusting the density of the convex colloid 10 according to the size of the electronic device, and thus adapting to electronic devices of different sizes and shapes.

[0034] Furthermore, the sliding clamping member includes two guide rods 13 fixedly connected to the first support plate 2; the other end of the guide rod 13 is fixedly connected to the bearing plate 3, and a clamping plate 14 is slidably connected to the guide rod 13; one side of the limiting plate 6 can fit against the clamping plate 14.

[0035] Furthermore, a threaded sleeve 15 is rotatably connected to the bearing plate 3; a second threaded rod 16 is threadedly connected inside the threaded sleeve 15, and one end of the second threaded rod 16 is fixedly connected to the back of the clamping plate 14.

[0036] Furthermore, a second drive disc 17 is fixedly connected to one end of the threaded sleeve 15, and a rubber layer is provided on one side of the clamping plate 14.

[0037] Using the above solution: In use, the electronic device is placed between the convex colloid 10 and the clamping plate 14. Then, the operator rotates the second drive disk 17, which causes the threaded sleeve 15 to rotate accordingly. Since the second threaded rod 16 and the threaded sleeve 15 are connected by threads, when the threaded sleeve 15 rotates, it pushes the second threaded rod 16 to move. The movement of the second threaded rod 16 causes the clamping plate 14 to slide along the guide rod 13. When the clamping plate 14 moves to the preset position, it contacts the electronic device and clamps it together with the convex colloid 10, thereby enabling the clamping operation of ceramic or glass electronic devices.

[0038] It should be noted that: First, after the clamping plate 14 clamps the electronic device, the limiting plate 6 contacts the clamping plate 14, thereby fixing the clamping plate 14. Second, a threaded hole can be made at the contact position between the limiting plate 6 and the clamping plate 14, and a bolt can be inserted into the threaded hole to improve the stability of fixing the clamping plate 14.

[0039] The working principle of this utility model:

[0040] When clamping ceramic or glass electronic devices, the clamping device is first positioned in the designated location. The operator rotates the first drive discs 12 at both ends of the bidirectional screw 11, causing the bidirectional screw 11 to rotate within the first slide rail 7. Since the first slider 8 and the second slider 9 are connected to the bidirectional screw 11 via threads, when the bidirectional screw 11 rotates, it pushes the first slider 8 and the second slider 9 closer together within the first slide rail 7. This adjusts the density of the convex colloid 10 according to the size of the electronic device, thus accommodating electronic devices of different sizes and shapes. Next, the electronic device is placed between the convex colloid 10 and the clamping plate 14. Then, the operator rotates the second drive disc 17, which... The threaded sleeve 15 rotates accordingly. Since the second threaded rod 16 and the threaded sleeve 15 are connected by threads, when the threaded sleeve 15 rotates, it pushes the second threaded rod 16 to move. The movement of the second threaded rod 16 causes the clamping plate 14 to slide along the guide rod 13. When the clamping plate 14 moves to the preset position, it contacts the electronic device and clamps it together with the convex colloid 10, thereby clamping the ceramic or glass electronic device. Then, the first threaded rod 5 is rotated to move in the opposite direction, which drives the limiting plate 6 to move synchronously until the limiting plate 6 moves to the preset position and presses against the clamping plate 14, thereby fixing the clamping plate 14.

[0041] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0042] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A high-speed centrifugal testing clamping device for microelectronic devices, characterized in that: Includes a support base (1), and a first support plate (2) is installed on the upper side of the support base (1); A colloid clamping assembly is installed on the first support plate (2), a bearing plate (3) is installed on the bearing seat (1), and a sliding clamping member is installed on the bearing plate (3); A first fixing plate (4) is installed on the first support plate (2), and a first threaded rod (5) is connected to the first fixing plate (4) by a thread. One end of the first threaded rod (5) is fitted with a limiting plate (6) that contacts the sliding clamping member.

2. A microelectronic device high speed centrifuge test fixture as in claim 1, wherein: The colloid clamping assembly includes a plurality of first slides (7) formed on the first support plate (2); Multiple symmetrical first sliders (8) and second sliders (9) are slidably connected in the first slide (7), and multiple convex colloids (10) are fixedly connected to the first slider (8) and the second slider (9).

3. A microelectronic device high speed centrifuge test fixture as in claim 2, wherein: The convex colloid (10) is cylindrical and made of rubber.

4. A microelectronic device high speed centrifuge test fixture as in claim 3 wherein: Each of the first slide rails (7) is rotatably connected to a bidirectional screw (11); The first slider (8) and the second slider (9) are both connected to the bidirectional screw (11) by threads, and the two ends of the bidirectional screw (11) are each equipped with a first drive disk (12).

5. The high-speed centrifugal testing clamping device for microelectronic devices as described in claim 1, characterized in that: The sliding clamping component includes two guide rods (13) fixedly connected to the first support plate (2); The other end of the guide rod (13) is fixedly connected to the bearing plate (3), and a clamping plate (14) is slidably connected to the guide rod (13); One side of the limiting plate (6) can be attached to the clamping plate (14).

6. The high-speed centrifugal testing clamping device for microelectronic devices as described in claim 5, characterized in that: A threaded sleeve (15) is rotatably connected to the bearing plate (3); The threaded sleeve (15) is connected to a second threaded rod (16) by a thread, and one end of the second threaded rod (16) is fixedly connected to the back of the clamping plate (14).

7. A microelectronic device high speed centrifuge test fixture as in claim 6, wherein: the plurality of microelectronic devices are arranged in a plurality of rows and columns; and the plurality of microelectronic devices are arranged in a staggered pattern. One end of the threaded sleeve (15) is fixedly connected to the second drive disk (17), and one side of the clamping plate (14) is provided with a rubber layer.

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