Test fixture for electronic components

Abstract

The utility model discloses a test fixture of electronic component, specifically related to electronic component test equipment technical field, including base, electrode block module and compression module, electrode block module includes with high voltage test equipment electricity connection's first electrode block and second electrode block, moving plate and locking device, and first electrode block is fixed on the base, and second electrode block is fixedly connected with moving plate, and moving plate is connected with the base slidingly, and locking device is used for making moving plate with base locking, compression module includes two pressing subassembly, and pressing subassembly includes fixed frame, telescopic device and pressing block, and the pressing block of pressing subassembly fixedly connected with base is located above first electrode block, and the pressing block of pressing subassembly fixedly connected with moving plate is located above second electrode block, the utility model discloses can carry out high voltage test work to various types electronic component, not only can guarantee test precision and test efficiency, can also effectively avoid the physical damage to product surface.

Description

Technical Field

[0001] This utility model relates to the field of electronic component testing equipment technology, and in particular to a testing fixture for electronic components. Background Technology

[0002] MLCCs and other electronic components are characterized by a wide variety of sizes and specifications, complex shapes and structures, and significant customization requirements. Especially for high-voltage or special-requirement products, due to safety regulations, manual clamping is not possible for measurement, and special fixtures must be used to fix the product under test.

[0003] Current mainstream clamping solutions on the market, such as probes, copper sheets, and alligator clips, generally have application limitations. Existing high-voltage testing fixtures for electronic components, such as probe-type fixtures, are usually only suitable for products with regular shapes, and copper sheet clamping devices are even more limited to specific sizes and specifications, making it difficult to adapt to diverse product needs; while alligator clip-type clamping fixtures are very likely to cause surface scratches or damage during the testing of fragile components such as surface-mount MLCCs, making non-destructive testing impossible. Utility Model Content

[0004] The purpose of this invention is to provide a test fixture for electronic components to solve the problems existing in the prior art. It can perform high-voltage testing on various types of electronic components, ensuring testing accuracy and efficiency while effectively avoiding physical damage to the product surface.

[0005] To achieve the above objectives, this utility model provides the following solution:

[0006] This utility model provides a test fixture for electronic components, including a base, an electrode block module, and a pressing module. The electrode block module includes a first electrode block, a second electrode block, a movable plate, and a locking device. The first electrode block and the second electrode block are respectively used for electrical connection with high-voltage testing equipment. The first electrode block is fixedly mounted on the base, and the second electrode block is fixedly connected to the movable plate. The movable plate is slidably connected to the base, and the locking device is used to lock the movable plate to the base. The pressing module includes two pressing assemblies. Each pressing assembly includes a fixing frame, a telescopic device, and a pressing block. The fixed end of the telescopic device is fixedly connected to the fixing frame, and the output end of the telescopic device is fixedly connected to the pressing block. The fixing frame of one pressing assembly is fixedly connected to the base, and the pressing block of this pressing assembly is located above the first electrode block. The fixing frame of the other pressing assembly is fixedly connected to the movable plate, and the pressing block of this pressing assembly is located above the second electrode block.

[0007] Preferably, the electrode block module further includes a slide rod and a spring. Slide rails are provided on both sides of the base. The movable plate is mounted on the slide rails and is slidably connected to the slide rod. The spring is sleeved on the slide rod, with one end of the spring abutting against the movable plate and the other end of the spring abutting against the base.

[0008] Preferably, the pressing block is made of a flexible material.

[0009] Preferably, the pressing block is made of silicone.

[0010] Preferably, the telescopic device is a telescopic cylinder, the cylinder barrel of the telescopic cylinder is fixedly connected to the fixed frame, and the piston rod of the telescopic cylinder is fixedly connected to the pressing block.

[0011] Preferably, the locking device includes a locking block and a locking screw. The locking block is fixedly connected to the movable plate. The locking block has a threaded hole, and the locking screw is threadedly connected to the threaded hole. The locking screw is used to lock the relative position of the movable plate and the base.

[0012] Preferably, the base has lead wire holes along the length of the slide rail, and the output wires of the high-voltage testing equipment are connected to the first electrode block and the second electrode block respectively through the lead wire holes.

[0013] Preferably, the first electrode block and the second electrode block are made of copper plated with gold.

[0014] The present invention achieves the following technical advantages over the prior art:

[0015] This invention provides a test fixture for electronic components. For exposed surface-mount electronic components, the fixture can clamp the exposed surface-mount electronic components between a first electrode block and a second electrode block, and perform high-voltage testing on the exposed surface-mount electronic components. For electronic components with leads, metal supports, or other electrodes extending from the outer side of the body, the leads or metal supports are pressed onto the electrode blocks by a pressing block to ensure good contact with the electrodes and realize the testing function. Moreover, by adjusting the pressing force of the pressing block through a telescopic device, the fixture can prevent lead-type and metal-support type electronic components, which are prone to deformation and scratches in conductive parts, from being subjected to bending stress during testing, preventing electrode bending, and avoiding scratches. The test fixture for electronic components can simultaneously meet the high-voltage testing needs of various types of electronic components, including surface-mount, metal-support, and lead-type components, saving testing time and improving testing efficiency. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 This is a schematic diagram of the structure of a test fixture for electronic components;

[0018] Figure 2 A schematic diagram of the mechanism of a test fixture for electronic components from another angle;

[0019] Figure 3 This is a front view of a test fixture for electronic components.

[0020] Figure 4 This is a rear view of the test fixture for electronic components.

[0021] Figure 5 This is a schematic diagram of the structure of a chip electronic component;

[0022] Figure 6 An enlarged view of a surface-mount electronic component being clamped and fixed in place;

[0023] Figure 7 This is a schematic diagram of the structure of a metal-supported electronic component;

[0024] Figure 8 An enlarged view showing electronic components clamped and fixed in place by a metal support.

[0025] Figure 9 This is a schematic diagram of an electronic component with leads.

[0026] Figure 10 for Figure 9 An enlarged view of an electronic component with leads being clamped and fixed in place;

[0027] Figure 11 This is a schematic diagram of another type of electronic component with leads;

[0028] Figure 12 for Figure 11 An enlarged view of an electronic component with leads being clamped and fixed in place.

[0029] In the diagram: 1-base; 2-first electrode block; 3-second electrode block; 4-moving plate; 5-locking block; 6-locking screw; 7-fixed frame; 8-telescopic device; 9-pressing block; 10-slide rod; 11-spring; 12-lead wire hole. Detailed Implementation

[0030] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0031] The purpose of this invention is to provide a test fixture for electronic components to solve the problems existing in the prior art. It can perform high-voltage testing on various types of electronic components, ensuring testing accuracy and efficiency while effectively avoiding physical damage to the product surface.

[0032] To make the above-mentioned objectives, features and advantages of this utility model more apparent and understandable, the utility model will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0033] This utility model provides a test fixture for electronic components, such as... Figures 1-4 As shown, the system includes a base 1, an electrode block module, and a pressing module. The electrode block module includes a first electrode block 2, a second electrode block 3, a movable plate 4, and a locking device. The first electrode block 2 and the second electrode block 3 are respectively used for electrical connection with high-voltage testing equipment. The first electrode block 2 is fixedly installed on the base 1, the second electrode block 3 is fixedly connected to the movable plate 4, and the movable plate 4 is slidably connected to the base 1. The locking device is used to lock the movable plate 4 to the base 1. The pressing module includes two pressing assemblies. Each pressing assembly includes a fixing frame 7, a telescopic device 8, and a pressing block 9. The fixed end of the telescopic device 8 is fixedly connected to the fixing frame 7, and the output end of the telescopic device 8 is fixedly connected to the pressing block 9. The fixing frame 7 of one pressing assembly is fixedly connected to the base 1, and the pressing block 9 of this pressing assembly is located above the first electrode block 2. The fixing frame 7 of the other pressing assembly is fixedly connected to the movable plate 4, and the pressing block 9 of this pressing assembly is located above the second electrode block 3. Figures 5-6 As shown, when performing high-voltage testing on exposed surface-mount electronic components, firstly, the second electrode block 3 is moved to adjust the distance between the first electrode block 2 and the second electrode block 3, so that the exposed surface-mount electronic component is placed between the first electrode block 2 and the second electrode block 3, ensuring that the two electrodes of the exposed surface-mount electronic component are respectively facing the first electrode block 2 and the second electrode block 3. Then, the moving plate 4 is locked to the base 1 by a locking device to ensure that the first electrode block 2 and the second electrode block 3 can stably clamp the exposed surface-mount electronic component. Then, the first electrode block 2 and the second electrode block 3 are connected to the electrodes of the high-voltage testing equipment, thereby performing high-voltage testing on the exposed surface-mount electronic component; as shown. Figures 7-8As shown, when performing high-voltage testing on a metal-supported electronic component, the distance between the first electrode block 2 and the second electrode block 3 is adjusted according to the size of the metal-supported electronic component. The two electrodes of the metal-supported electronic component are then placed on the first electrode block 2 and the second electrode block 3 respectively. The second electrode block 3 is then locked. The pressing block 9 is then moved downwards via the telescopic device 8, pressing the two electrodes of the metal-supported electronic component onto the first electrode block 2 and the second electrode block 3 respectively. This ensures good contact between the two electrodes of the metal-supported electronic component and the first electrode block 2 and the second electrode block 3, guaranteeing testing accuracy. Figures 9-12 As shown, when performing high-voltage testing on electronic components with leads, the distance between the first electrode block 2 and the second electrode block 3 is adjusted according to the distance between the two leads, so that the two leads overlap the first electrode block 2 and the second electrode block 3 respectively. Then, the second electrode block 3 is locked, and the two leads are pressed onto the first electrode block 2 and the second electrode block 3 respectively by the pressing block 9, ensuring good contact between the leads and the electrodes, thereby realizing the testing function. The pressing force of the pressing block 9 can be adjusted by the telescopic device 8, which can prevent the conductive parts of the leads and metal bracket type electronic components from being deformed and scratched during testing, thus avoiding bending stress, preventing electrode bending, and avoiding scratches. The test fixture for electronic components can simultaneously meet the high-voltage testing work of various types of electronic components, including chip type, metal bracket, and lead type. High-voltage testing of multiple types of components can be completed on the same test fixture without frequent fixture changes, which greatly saves testing time, improves testing efficiency, and reduces testing costs. Preferably, the top surface and opposite side surface of the first electrode block 2 and the second electrode block 3 are flat to ensure stable and reliable contact with the electronic components.

[0034] In a further preferred embodiment of this utility model, the electrode block module further includes a slide rod 10 and a spring 11. Slide rails are provided on both sides of the base 1, and a movable plate 4 is mounted on the slide rails. The movable plate 4 is slidably connected to the slide rod 10. The spring 11 is sleeved outside the slide rod 10, with one end of the spring 11 abutting against the movable plate 4 and the other end abutting against the base 1. When performing high-voltage testing on exposed surface-mount electronic components, the exposed surface-mount electronic components are placed between the first electrode block 2 and the second electrode block 3. The elastically deformed spring 11 applies a certain elastic force to the movable plate 4. This elastic force ensures that the exposed surface-mount electronic components are fixedly clamped by the first electrode block 2 and the second electrode block 3, thereby freeing the operator's hands and ensuring that the exposed surface-mount electronic components do not fall.

[0035] In a further preferred embodiment of this invention, the pressing block 9 is made of a flexible material, specifically silicone. The flexibility of the pressing block reduces damage to electronic components. It should be noted that if surface scratches on the component are not a concern, the pressing block material can also be a hard material such as metal or ceramic. Whether the pressing block material is conductive or insulating, it does not affect the voltage transmission from the square electrodes to both ends of the component under test. However, if a conductive material is used, the insulation design between the pressing block 9 and other parts must be considered.

[0036] In a further preferred embodiment of this utility model, the telescopic device 8 is a telescopic cylinder, with the cylinder barrel fixedly connected to the fixed frame 7 and the piston rod fixedly connected to the pressing block 9. The telescopic cylinder can drive the pressing block 9 to move smoothly up and down, and with adjustable stroke and pressure, it can accommodate electronic components of different sizes and prevent damage to the electronic components. It should be noted that the telescopic cylinder can be a non-adjustable cylinder type where the stroke, speed, thrust, and other parameters cannot be changed by an external adjustment mechanism after design and manufacturing, or it can be an adjustable cylinder type where the stroke, speed, thrust, and other parameters can be changed by an external adjustment mechanism after design and manufacturing. It should also be noted that the telescopic device 8 can be a spring, with one end connected to the fixed frame and the other end connected to the pressing block. Under the elastic force of the spring, the pressing block is always in contact with the top surface of the electrode block. When the pressing block needs to press and fix the electronic component, the pressing block is manually lifted, simultaneously compressing the spring. Under the elastic force of the spring, the electronic component is fixed in a suitable position. It should be noted that the telescopic device 8 can also be a servo motor and a lead screw assembly. The output shaft of the servo motor is connected to the lead screw. When the servo motor is working, the lead screw rotates accordingly, and the nut threadedly connected to the lead screw moves linearly along the lead screw, thereby driving the pressing block connected to the nut to rise or fall, realizing the lifting and pressing operation.

[0037] In a further preferred embodiment of this utility model, the locking device includes a locking block 5 and a locking screw 6. The locking block 5 is fixedly connected to the movable plate 4. The locking block 5 has a threaded hole, and the locking screw 6 is threadedly connected to the threaded hole. The locking screw 6 is used to lock the relative position of the movable plate 4 and the base 1.

[0038] In a further preferred embodiment of this utility model, the base 1 has a lead wire hole 12 along the length of the slide rail, and the output wire of the high voltage test equipment is connected to the first electrode block 2 and the second electrode block 3 respectively through the lead wire hole 12.

[0039] In a further preferred embodiment of this utility model, the first electrode block 2 and the second electrode block 3 are made of copper plated with gold. Copper plated with gold has good conductivity and is not easily corroded.

[0040] This utility model uses specific examples to illustrate its principles and implementation methods. The above description of the embodiments is only for the purpose of helping to understand the method and core idea of ​​this utility model. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the idea of ​​this utility model. In summary, the content of this specification should not be construed as a limitation of this utility model.

Claims

1. A test fixture for electronic components, characterized by: The device includes a base, an electrode block module, and a pressing module. The electrode block module includes a first electrode block, a second electrode block, a movable plate, and a locking device. The first and second electrode blocks are respectively used for electrical connection with high-voltage testing equipment. The first electrode block is fixedly mounted on the base, and the second electrode block is fixedly connected to the movable plate. The movable plate is slidably connected to the base, and the locking device is used to lock the movable plate to the base. The pressing module includes two pressing assemblies. Each pressing assembly includes a fixing frame, a telescopic device, and a pressing block. The fixed end of the telescopic device is fixedly connected to the fixing frame, and the output end of the telescopic device is fixedly connected to the pressing block. The fixing frame of one pressing assembly is fixedly connected to the base, and the pressing block of this pressing assembly is located above the first electrode block. The fixing frame of the other pressing assembly is fixedly connected to the movable plate, and the pressing block of this pressing assembly is located above the second electrode block.

2. The test fixture for electronic components of claim 1, wherein: The electrode block module also includes a slide rod and a spring. Slide rails are provided on both sides of the base. The movable plate is installed on the slide rails and is slidably connected to the slide rod. The spring is sleeved on the slide rod, with one end of the spring abutting against the movable plate and the other end of the spring abutting against the base.

3. The test fixture for electronic components of claim 1, wherein: The pressing block is made of flexible material.

4. The test fixture for electronic components according to claim 3, characterized in that: The pressing block is made of silicone.

5. The test fixture for electronic components according to claim 1, characterized in that: The telescopic device is a telescopic cylinder, the cylinder barrel of the telescopic cylinder is fixedly connected to the fixed frame, and the piston rod of the telescopic cylinder is fixedly connected to the pressing block.

6. The test fixture for electronic components according to claim 1, characterized in that: The locking device includes a locking block and a locking screw. The locking block is fixedly connected to the movable plate. The locking block has a threaded hole, and the locking screw is threadedly connected to the threaded hole. The locking screw is used to lock the relative position of the movable plate and the base.

7. The test fixture for electronic components according to claim 2, characterized in that: The base has lead wire holes along the length of the slide rail, and the output wires of the high voltage testing equipment are connected to the first electrode block and the second electrode block respectively through the lead wire holes.

8. The test fixture for electronic components according to claim 1, characterized in that: The first electrode block and the second electrode block are made of copper plated with gold.

Images