Spring pipe integrated test probe

By designing an integrated reed probe, the problems of short probe life and complex manufacturing under high current were solved, achieving a probe structure with high current carrying capacity and low cost.

CN224383327UActive Publication Date: 2026-06-19SHENZHEN MERRY PRECISE ELECTRONIC CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHENZHEN MERRY PRECISE ELECTRONIC CO LTD
Filing Date
2025-07-11
Publication Date
2026-06-19

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Abstract

This utility model relates to an integrated reed tube test probe, comprising a needle tube body, both ends of which have narrowed sections with reduced outer diameters. One narrowed section has multiple contact tips arranged circumferentially at its end, and the other narrowed section has a first converging portion at its end. An integrated spring section is located on the needle tube body between the two narrowed sections. This utility model has a simple overall structure. Compared with the traditional probe assembly method that uses a built-in separate spring and sliding needle, the integrated design can withstand higher current values. The overall structure has no contact resistance, resulting in a longer service life, easier processing, and lower cost.
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Description

Technical Field

[0001] This utility model relates to the field of test probe technology, and in particular to a reed tube integrated test probe. Background Technology

[0002] Probes are a crucial component in electronic product connectors. Existing probes typically employ a sliding pin combined with a helical spring. In practical use, current easily concentrates in a tiny area around the helical spring and the contact area between the spring and the probe tube. With existing probes, if the current is small, the flow through this tiny path does not affect the probe's lifespan. However, when the probe needs to carry a large current, the current concentration through the helical spring and the tiny contact area can easily deteriorate, causing material melting or changes in thermal properties, thus affecting the probe's lifespan. Furthermore, because the spring is built into the tube, the overall probe structure is more complex, increasing manufacturing difficulty and cost. Therefore, it is necessary to design a new test probe to meet production needs. Utility Model Content

[0003] The purpose of this invention is to address the shortcomings of existing technologies by providing an integrated reed switch test probe, which can effectively solve the aforementioned problems.

[0004] To achieve the above requirements, the technical solution adopted by this utility model to solve its technical problem is as follows:

[0005] A reed-tube integrated test probe is provided, comprising a needle tube body, both ends of which have narrowed sections with reduced outer diameters. One of the narrowed sections has a plurality of contact tips arranged circumferentially at its end, and the other narrowed section has a first converging portion at its end. An integral spring section is located on the needle tube body between the two narrowed sections.

[0006] The reed tube integrated test probe of this utility model, wherein, of the two narrowing sections, the narrowing section with the contact tip is the test end, and the narrowing section with the first closing part is the wiring end.

[0007] The reed tube integrated test probe of this utility model has a second converging portion at the end of the narrowing section corresponding to the test end. The sidewall of the second converging portion is circumferentially distributed with multiple notches and grooves, and the contact tip portion is formed at the part of the second converging portion between two adjacent notches and grooves.

[0008] The integrated test probe of the reed tube of this utility model has a notch that is a V-shaped groove with its smaller end facing the spring segment.

[0009] The reed tube integrated test probe of this utility model has an inner diameter of 0.27 mm for the annular structure formed by the plurality of contact tips, an axial length of 0.25 mm for the second converging part, and an axial length of 0.2 mm for the first converging part.

[0010] The reed switch integrated test probe of this utility model has a narrow section with a length of 1.0 mm corresponding to the terminal and a narrow section with a length of 1.1 mm corresponding to the test end, and both narrow sections have a diameter of 0.53 mm.

[0011] The reed tube integrated test probe of this utility model has a first converging portion that is tapered.

[0012] The reed tube integrated test probe of this utility model has a transition section on the needle tube body between the narrowing section and the spring section, and the end of the transition section facing the spring section has an arc-shaped transition section corresponding to the end of the spring section.

[0013] The reed tube integrated test probe of this utility model is wherein the needle tube body is a beryllium copper tube and its outer wall has a gold-plated layer.

[0014] The reed tube integrated test probe of this utility model has a spring segment diameter of 0.65mm, a spring segment wire diameter of 0.1mm, and a pitch of 0.15mm.

[0015] The beneficial effects of this utility model are as follows:

[0016] This utility model has a simple overall structure. Compared with the traditional probe assembly method that uses a built-in split spring and sliding needle, the integrated design can withstand a higher current value. The overall structure has no contact resistance, has a longer service life, is easier to process, and has a lower cost. Attached Figure Description

[0017] To more clearly illustrate the technical solutions in the embodiments of this utility model or the prior art, the utility model will be further described below in conjunction with the accompanying drawings and embodiments. The drawings described below are only some embodiments of this utility model. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0018] Figure 1 This is an overall structural diagram of the present invention. Detailed Implementation

[0019] The terms "first," "second," "third," and "fourth," etc., used in the specification, claims, and accompanying drawings of this utility model are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "comprising" and "having," and any variations thereof, are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or apparatus that includes a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products, or apparatuses.

[0020] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0021] "Multiple" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0022] Furthermore, the terms indicating orientation, such as "up," "down," "left," "right," "upper end," "lower end," and "longitudinal," are all based on the posture and position of the device or equipment described in this solution during normal use.

[0023] To make the objectives, technical solutions, and advantages of the embodiments of this utility model clearer, a clear and complete description will be provided below in conjunction with the technical solutions in the embodiments of this utility model. Obviously, the described embodiments are some, but not all, embodiments of this utility model. Based on the embodiments of this utility model, all other embodiments obtained by those skilled in the art without creative effort are within the protection scope of this utility model.

[0024] The preferred embodiment of this utility model is a reed-tube integrated test probe, such as... Figure 1As shown, the probe includes a needle body 10, with narrowed sections 20 at both ends having reduced outer diameters. One narrowed section 20 has multiple contact tips 30 arranged circumferentially at its end, and the other narrowed section 20 has a first converging portion 40 at its end. An integrated spring section 50 is located on the needle body 10 between the two narrowed sections 20. The integrated spring tube test probe of this solution has a simple overall structure, low processing difficulty and low cost. Compared with the traditional probe that uses a built-in separate spring and sliding needle, the integrated design can withstand higher current values. The overall structure has no contact resistance, has a longer service life, is easier to process, and has a lower cost.

[0025] In this embodiment, among the two narrowing sections 20, one narrowing section 20 with a contact tip 30 is a test end 60, and the other narrowing section 20 with a first gathering portion 40 is a wiring end 70. The multiple contact tips 30 of the test end 60 are used for contacting the test board. Specifically, the end of the narrowing section 20 corresponding to the test end 60 has a second gathering portion 80. The sidewall of the second gathering portion 80 has multiple notches 90 distributed circumferentially. The part of the second gathering portion 80 located between two adjacent notches 90 forms the contact tip 30. The notches 90 are V-shaped grooves with their smaller ends facing the spring section 50, thereby making the end diameter of the contact tip 30 small enough to test products with higher accuracy requirements.

[0026] In this embodiment, the inner diameter of the annular structure formed by the multiple contact tips 30 is 0.27 mm, the axial length of the second gathering part 80 is 0.25 mm, and the axial length of the first gathering part 40 is 0.2 mm.

[0027] In this embodiment, the length of the narrowing segment 20 corresponding to the terminal 70 is 1.0 mm, the length of the narrowing segment 20 corresponding to the test terminal is 1.1 mm, and the diameter of both narrowing segments 20 is 0.53 mm.

[0028] In this embodiment, the first retractable portion 40 is tapered to facilitate assembly with the wiring device.

[0029] In this embodiment, the needle body 10 has a transition section 10 located between the narrowing section 20 and the spring section 50. The end of the transition section 100 facing the spring section 50 has an arc-shaped transition section 110 corresponding to the end of the spring section 50. The arc-shaped transition section 110 is semi-circular and its diameter is the same as the wire diameter of the spring section 50. Together, they serve to disperse stress and ensure the long-term stability of the end of the spring section 50.

[0030] In this embodiment, the needle body 10 is a beryllium copper tube with a gold-plated layer on its outer wall to ensure conductivity.

[0031] In this embodiment, the diameter of the spring segment 50 is 0.65mm, the wire diameter of the spring segment 50 is 0.1mm, and the pitch is 0.15mm.

[0032] It should be understood that those skilled in the art can make improvements or modifications based on the above description, and all such improvements and modifications should fall within the protection scope of the appended claims.

Claims

1. A reed-integrated test probe characterized by comprising: The device includes a needle body, both ends of which have narrowed sections with reduced outer diameters. One of the narrowed sections has multiple contact tips arranged circumferentially at its end, and the other narrowed section has a first converging portion at its end. An integral spring section is located on the needle body between the two narrowed sections.

2. The reed switch integrated test probe according to claim 1, characterized in that, Of the two narrowing sections, the narrowing section with the contact tip is the test end, and the narrowing section with the first gathering part is the wiring end.

3. The reed switch integrated test probe according to claim 2, characterized in that, The end of the narrowed section corresponding to the test end has a second converging portion. The sidewall of the second converging portion has a plurality of notches and grooves distributed circumferentially. The part of the second converging portion located between two adjacent notches and grooves forms the contact tip.

4. The integrated reed switch test probe according to claim 3, characterized in that, The notch is a V-shaped groove with its smaller end facing the spring segment.

5. The reed switch integrated test probe according to claim 3 or 4, characterized in that, The inner diameter of the annular structure formed by the multiple contact tips is 0.27 mm, the axial length of the second gathering part is 0.25 mm, and the axial length of the first gathering part is 0.2 mm.

6. The reed switch integrated test probe according to claim 5, characterized in that, The length of the narrowed section corresponding to the terminal is 1.0 mm, the length of the narrowed section corresponding to the test terminal is 1.1 mm, and the diameter of both narrowed sections is 0.53 mm.

7. The reed switch integrated test probe according to claim 2, characterized in that, The first gathering part is conical.

8. The reed switch integrated test probe according to claim 1, characterized in that, The needle body has a transition section between the narrowing section and the spring section, and the end of the transition section facing the spring section has an arc-shaped transition section corresponding to the end of the spring section.

9. The reed switch integrated test probe according to claim 1, characterized in that, The needle body is a beryllium copper tube with a gold-plated layer on its outer wall.

10. The reed switch integrated test probe according to claim 1, characterized in that, The diameter of the spring segment is 0.65 mm, the wire diameter of the spring segment is 0.1 mm, and the pitch is 0.15 mm.