Aging test equipment supporting signal and power independent control

Abstract

The utility model discloses a kind of aging test equipment of supporting signal, power independent control, comprising: main control chip, power control module, backlight control module, signal test module, storage module, display module, screen test interface;The signal test module includes: FPGA, SSD2828 / SSD2832 bridging chip respectively with the main control chip electricity is connected, the FPGA with the SSD2828 / SSD2832 bridging chip electricity is connected, the SSD2828 / SSD2832 bridging chip with the screen test interface electricity is connected.The utility model constructs complete independent signal control channel and power control channel for each piece of measured screen, and realizes the fine, decoupling management and collaborative scheduling of both by central controller.

Description

Technical Field

[0001] This utility model relates to the field of screen testing technology, and in particular to an aging test device that supports independent control of signals and power supply. Background Technology

[0002] Screen display technology is advancing rapidly, with new processes constantly emerging to make screens thinner, more vibrant, and brighter. The core human-computer interaction hardware of smart devices is the screen, specifically a touch-enabled screen. Today, almost every smart device has a touch-enabled integrated screen. Because of the huge potential market for integrated screens in smart devices, the government is strongly supporting the development of screen manufacturing companies. This huge screen market has also created a demand for screen testing products. Excellent screen manufacturers require rigorous testing of every screen before it reaches the market, ensuring customers have the best human-computer interaction experience. This requires not only screen manufacturers but also a large number of screen testing instruments. Screen-related companies also need testing instruments to test the quality of screens for incoming and outgoing inspections. Therefore, the demand for screen testing instruments in the screen industry is also enormous.

[0003] In the display panel manufacturing process, aging testing is a crucial step in ensuring product quality and screening for early failures. This test simulates the screen's long-term operation to expose potential component defects (such as capacitor failure and LED chip degradation), poor soldering (cold solder joints, poor welds), driver circuit failures, and material aging.

[0004] Currently, the screen aging test solutions commonly used in the industry (such as aging cabinets and aging racks) typically employ the following working modes: 1. Integrated Control: The test unit provides video signals (such as LVDS, eDP, MIPI, etc.) and operating power (such as +12V, +5V, +3.3V, etc.) to the screen under test simultaneously through a single control unit or interface board. The screen's opening and closing are typically achieved by simultaneously connecting / disconnecting the signal and power.

[0005] 2. Inefficient Management: Power control typically only performs simple "on / off" operations or limited overall current / voltage monitoring, lacking the ability to fine-grainedly and independently adjust the power supply status of each screen. The switching or shutdown of signal sources is also often strongly correlated with the power supply status.

[0006] However, this signal-power coupled control method has significant limitations and is difficult to meet increasingly complex testing requirements and the depth of reliability verification: 1. Unable to simulate real-world fault scenarios: In practical use, screens may encounter complex operating conditions such as abnormal signals but normal power supply (e.g., the host computer crashes, resulting in no output signal, but the screen backlight is still on) or abnormal power supply but present signal (e.g., power supply voltage fluctuations or undervoltage, but the signal source outputs normally). Traditional coupling control methods cannot independently reproduce these scenarios, resulting in some potential defects (e.g., driver IC lock-up under specific power fluctuations, abnormal backlight power consumption or flickering when there is no signal input) not being effectively activated and detected before leaving the factory.

[0007] 2. Low testing efficiency and flexibility: When specific tests require applying power only to the screen (such as individual aging of the backlight module or standby power consumption testing) or applying signals only to verify the functionality of the logic board, traditional systems lack convenient independent control methods. Operators often need to physically plug and unplug cables or perform complex hardware / software configurations, which is time-consuming and labor-intensive, severely impacting testing efficiency and production line flexibility.

[0008] 3. Inaccurate power consumption testing makes it impossible to locate the problematic screen: When aging multiple screens in parallel, traditional systems typically only monitor the total current or a rough group current. Once an abnormal power consumption of a certain group is detected, because it is impossible to independently disconnect the signal or power supply of a specific screen for isolation diagnosis, it is necessary to manually check each problematic screen one by one. This results in extremely low fault location efficiency and increases maintenance costs and time.

[0009] 4. Inability to execute advanced testing strategies, lack of independent control, and difficulty in achieving, for example: ① Timing-based testing: For example, powering on before signaling (simulating cold start), signaling before powering on, or periodically alternating switching of signals / power supply, etc., to verify the stability and compatibility of the screen driver circuit and power management unit under various power-on / power-off sequences.

[0010] ② Voltage stress test: Independently adjust the power supply voltage of a screen (e.g., ±5% fluctuation) while maintaining signal input, and observe its working status and failure mode under non-standard voltage.

[0011] ③ Signal integrity test: Under stable power supply, independently control the switching, switching, or injection of specific interference modes of the control signal to test the robustness of the screen signal receiving circuit.

[0012] 5. Increases unnecessary energy consumption and equipment stress: When only signal-related functions need to be verified, the power cannot be turned off independently; conversely, the power cannot be turned off when other functions need to be verified. This results in unnecessary energy consumption (such as backlight power consumption) and equipment overheating during testing, shortening the lifespan of the test equipment's components and failing to meet the requirements of green manufacturing.

[0013] Therefore, existing technologies have shortcomings and need to be improved. Utility Model Content

[0014] The technical problem to be solved by this utility model is to provide an aging test device that supports independent control of signals and power supply, thereby solving the problems of limited test scenarios, low efficiency, and difficulty in fault location caused by the coupling control of signals and power supply in traditional aging tests.

[0015] The technical solution of this utility model is as follows: An aging test device supporting independent control of signals and power supply is provided, comprising: a main control chip, a power control module, a backlight control module, a signal test module, a storage module, a display module, and a screen test interface; the signal test module includes: an FPGA and an SSD2828 / SSD2832 bridge chip electrically connected to the main control chip, the FPGA being electrically connected to the SSD2828 / SSD2832 bridge chip, and the SSD2828 / SSD2832 bridge chip being electrically connected to the screen test interface; the power control module includes: a power control chip electrically connected to the main control chip, and a positive power supply and a negative power supply electrically connected to the power control chip; the backlight control module includes: a backlight control chip electrically connected to the main control chip, and a backlight driving power supply and a constant current source electrically connected to the backlight control chip; the positive power supply, negative power supply, backlight driving circuit, and constant current source are all electrically connected to the screen test interface; the display module and the storage module are each electrically connected to the main control chip.

[0016] Furthermore, the display module includes: an RJ45 interface electrically connected to the main control chip, and a computer electrically connected to the RJ45 interface.

[0017] Furthermore, the storage module includes: a TF card file system electrically connected to the main control chip, and LUA script and LOG storage electrically connected to the TF card file system respectively.

[0018] Furthermore, the aging test equipment that supports independent control of signals and power also includes: several SWD control interfaces, and the main control chip is electrically connected to the power control chip and the backlight control chip through the SWD control interfaces.

[0019] Furthermore, the aging test equipment that supports independent control of signals and power also includes: interactive buttons and an ESP8266 communication interface that are electrically connected to the main control chip.

[0020] Furthermore, the aging test equipment that supports independent control of signals and power supply also includes: several debug interfaces, wherein the main control chip, power control chip, and backlight control chip are each electrically connected to one debug interface.

[0021] Furthermore, the aging test equipment supporting independent control of signals and power supplies also includes: several ADC sampling circuits; the positive power supply and negative power supply are electrically connected to the power control chip through the ADC sampling circuits; the backlight drive power supply and constant current source are electrically connected to the backlight control chip through the ADC sampling circuits.

[0022] This utility model has the following technical effects: Structural innovation leads to functional breakthroughs: The core advantage lies in the physical separation and independent controllability of the "signal channel" and "power channel" at the hardware level. This structural innovation is fundamental to solving traditional coupled control problems, rather than relying solely on software strategies. It makes independent control an inherent and reliable capability of the system.

[0023] 2. Addressing key industry pain points: Directly addressing recognized pain points in current screen aging testing such as "incomplete test scenario coverage," "efficiency bottlenecks," "difficulty in fault location," and "difficulty in implementing advanced testing," it provides system-level solutions with strong practicality and urgent market demand.

[0024] 3. Significant practicality and economic benefits: ① Improve quality: More comprehensive defect screening reduces after-sales costs and enhances brand reputation.

[0025] ② Improve efficiency: Shorten testing time, increase production capacity, and reduce manual intervention costs.

[0026] 4. Building Technological Barriers: "Independent signal and power control" is not a simple addition of functions, but involves the reconstruction of hardware architecture (independent channel design, high-speed switching matrix, high-precision single-channel monitoring) and innovation in collaborative control logic. This integrated innovation is difficult to circumvent or replace, making it easy to build technological barriers.

[0027] 5. High scalability: This architecture can easily adapt to screens of different sizes. The core independent control concept can be extended to more types of screen testing equipment, demonstrating good technological foresight.

[0028] 6. Meets the core of utility model protection: The advantage of this patent comes directly from the improvement of the product structure (independent hardware design of signal / power channels and their connection relationship), and has produced significant practical effects (efficiency, quality, and cost improvement), perfectly meeting the protection purpose of utility model patent.

[0029] In summary, the core value of this utility model patent lies in its unique "independent signal and power control" hardware architecture, which breaks through the functional limitations of traditional aging test systems and achieves a qualitative leap in test coverage, efficiency, flexibility, and diagnostic capabilities. It provides screen manufacturers with a more powerful, economical, and intelligent quality assurance tool, demonstrating significant technological advancement and broad market application prospects.

[0030] By adopting the above solution, this utility model provides an aging test device that supports independent control of signal and power supply, breaking through the constraints of traditional signal and power supply coupled control, and realizing refined and independent management and control of the power supply and signal input of each screen under test, thereby more comprehensively stimulating potential defects, improving test efficiency, enhancing fault diagnosis capabilities, and supporting more advanced reliability verification strategies. Attached Figure Description

[0031] Figure 1 This is a functional module diagram of the present invention; Figure 2 Functional block diagram of power control module and backlight control module; Figure 3 This is a functional block diagram of the signal testing module; Figure 4 Circuit schematic for a single positive power supply; Figure 5 Circuit schematic diagram for a negative power supply (single channel); Figure 6 The circuit schematic for a single-channel backlight driver power supply; Figure 7 The circuit schematic for a constant current source (single channel); Figure 8 This is the circuit schematic of a single-channel ADC sampling circuit. Detailed Implementation

[0032] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0033] Please see Figures 1-8This embodiment provides an aging test device that supports independent control of signal and power, including: a main control chip 10, a power control module, a backlight control module, a signal test module, a storage module, a display module, and a screen test interface 11; the signal test module includes: an FPGA 12 and an SSD2828 / SSD2832 bridge chip 13, both electrically connected to the main control chip 10. The FPGA 12 is electrically connected to the SSD2828 / SSD2832 bridge chip 13, and the SSD2828 / SSD2832 bridge chip 13 is electrically connected to the screen test interface 11. Interface 11 is electrically connected; the power control module includes: a power control chip 14 electrically connected to the main control chip 10, and a positive power supply and a negative power supply electrically connected to the power control chip 14 respectively; the backlight control module includes: a backlight control chip 15 electrically connected to the main control chip 10, and a backlight driver power supply (LEDA) and a constant current source (LEDK) electrically connected to the backlight control chip 15 respectively; the positive power supply, negative power supply, backlight driver circuit, and constant current source are electrically connected to the screen test interface 11 respectively; the display module and the storage module are electrically connected to the main control chip 10 respectively.

[0034] The main control chip 10 uses an STM32F407ZETx and serves as the core control unit of this device. The main control chip 10 is responsible for the control and scheduling of the entire system, including receiving and executing instructions from the host computer, executing preset or custom aging test procedures, coordinating the work of various modules, reading back monitoring data, and generating and storing test logs. Furthermore, this part can independently manage the signal enable / disable commands for each screen under test.

[0035] The power control chip 14 and the backlight control chip 15 both use STM32F103VETx.

[0036] The power control module and backlight control module can independently generate or manage power on / off / voltage adjustment commands for each screen under test, and there is no forced correlation logic between the channels.

[0037] In this embodiment, the display module includes: an RJ45 interface 16 electrically connected to the main control chip 10, and a computer 17 electrically connected to the RJ45 interface 16. The display module is used to display various data.

[0038] In this embodiment, the storage module includes: a TF card file system 18 electrically connected to the main control chip 10, and a LUA script 19 and a LOG storage 20 electrically connected to the TF card file system 18.

[0039] In this embodiment, the aging test equipment that supports independent control of signals and power supply further includes: a plurality of SWD control interfaces 21, and the main control chip 10 is electrically connected to the power control chip 14 and the backlight control chip 15 through the SWD control interfaces 21.

[0040] In this embodiment, the aging test equipment that supports independent control of signals and power supply further includes: interactive buttons 22 and ESP8266 communication interface 23, which are electrically connected to the main control chip 10.

[0041] In this embodiment, the aging test equipment that supports independent control of signals and power supply further includes: several debug interfaces 24, and the main control chip 10, power control chip 14, and backlight control chip 15 are each electrically connected to one debug interface 24.

[0042] In this embodiment, the aging test equipment that supports independent control of signals and power supplies further includes: a plurality of ADC sampling circuits 25; the positive power supply and the negative power supply are electrically connected to the power control chip 14 through the ADC sampling circuits 25; the backlight drive power supply and the constant current source are electrically connected to the backlight control chip 15 through the ADC sampling circuits 25.

[0043] This utility model has the following technical effects: Structural innovation leads to functional breakthroughs: The core advantage lies in the physical separation and independent controllability of the "signal channel" and "power channel" at the hardware level. This structural innovation is fundamental to solving traditional coupled control problems, rather than relying solely on software strategies. It makes independent control an inherent and reliable capability of the system.

[0044] 2. Addressing key industry pain points: Directly addressing recognized pain points in current screen aging testing such as "incomplete test scenario coverage," "efficiency bottlenecks," "difficulty in fault location," and "difficulty in implementing advanced testing," it provides system-level solutions with strong practicality and urgent market demand.

[0045] 3. Significant practicality and economic benefits: ① Improve quality: More comprehensive defect screening, reduced after-sales costs, and enhanced brand reputation.

[0046] ② Improve efficiency: shorten testing time, increase production capacity, and reduce manual intervention costs.

[0047] 4. Building Technological Barriers: "Independent signal and power control" is not simply a matter of adding functions together, but involves the reconstruction of hardware architecture (independent channel design, high-speed switching matrix, high-precision single-channel monitoring) and innovation in collaborative control logic. This kind of integrated innovation is difficult to avoid or replace, making it easy to build technological barriers.

[0048] 5. High scalability: This architecture can easily adapt to screens of different sizes. The core independent control concept can be extended to more types of screen testing equipment, demonstrating good technological foresight.

[0049] 6. Meets the core of utility model protection: The advantage of this patent comes directly from the improvement of the product structure (independent hardware design of signal / power channels and their connection relationship), and has produced significant practical effects (efficiency, quality, and cost improvement), perfectly meeting the protection purpose of utility model patent.

[0050] In summary, the core value of this utility model patent lies in its unique "independent signal and power control" hardware architecture, which breaks through the functional limitations of traditional aging test systems and achieves a qualitative leap in test coverage, efficiency, flexibility, and diagnostic capabilities. It provides screen manufacturers with a more powerful, economical, and intelligent quality assurance tool, demonstrating significant technological advancement and broad market application prospects.

[0051] In summary, this utility model provides an aging test device that supports independent control of signals and power supply, breaking through the constraints of traditional signal and power supply coupled control. It enables refined and independent management and control of the power supply and signal input of each screen under test, thereby more comprehensively stimulating potential defects, improving test efficiency, enhancing fault diagnosis capabilities, and supporting more advanced reliability verification strategies.

[0052] The above are merely preferred embodiments of the present utility model and are not intended to limit the present utility model. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present utility model should be included within the protection scope of the present utility model.

Claims

1. An aging test device supporting independent control of signal and power supply, characterized in that, include: Main control chip, power control module, backlight control module, signal testing module, storage module, display module, screen testing interface; The signal testing module includes: an FPGA and an SSD2828 / SSD2832 bridge chip electrically connected to the main control chip, respectively. The FPGA is electrically connected to the SSD2828 / SSD2832 bridge chip, and the SSD2828 / SSD2832 bridge chip is electrically connected to the screen testing interface. The power control module includes: a power control chip electrically connected to the main control chip, and a positive power supply and a negative power supply electrically connected to the power control chip. The backlight control module includes: a backlight control chip electrically connected to the main control chip, and a backlight driving power supply and a constant current source electrically connected to the backlight control chip. The positive power supply, negative power supply, backlight driving circuit, and constant current source are all electrically connected to the screen testing interface. The display module and storage module are all electrically connected to the main control chip.

2. The aging test equipment supporting independent control of signal and power supply according to claim 1, characterized in that, The display module includes: an RJ45 interface electrically connected to the main control chip, and a computer electrically connected to the RJ45 interface.

3. The aging test equipment supporting independent control of signal and power supply according to claim 1, characterized in that, The storage module includes: a TF card file system electrically connected to the main control chip, and LUA script and LOG storage electrically connected to the TF card file system.

4. The aging test equipment supporting independent control of signal and power supply according to claim 1, characterized in that, Also includes: Several SWD control interfaces are provided, and the main control chip is electrically connected to the power control chip and the backlight control chip through the SWD control interfaces.

5. An aging test device supporting independent control of signal and power supply according to claim 1, characterized in that, Also includes: Interactive buttons and an ESP8266 communication interface are electrically connected to the main control chip, respectively.

6. The aging test equipment supporting independent control of signal and power supply according to claim 1, characterized in that, Also includes: Several debug interfaces are provided, and the main control chip, power control chip, and backlight control chip are each electrically connected to one debug interface.

7. The aging test equipment supporting independent control of signal and power supply according to claim 1, characterized in that, Also includes: Several ADC sampling circuits; the positive and negative power supplies are electrically connected to the power control chip through the ADC sampling circuits. The backlight driving power supply and constant current source are electrically connected to the backlight control chip through an ADC sampling circuit.

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