Multi-cavity circuit board aging test box

By designing a multi-cavity circuit board aging test chamber, the problem of single-condition testing in existing technologies is solved, enabling comprehensive testing of circuit boards under different conditions, obtaining more comprehensive data, and improving the accuracy and reliability of test results.

CN224553318UActive Publication Date: 2026-07-24DONGGUAN HANGWEI VIDEO TECH CO LTD
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Patent Information

Application Number
CN202521400694.8
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-07-04
Publication Date
2026-07-24
Estimated Expiration
2035-07-04

AI Technical Summary

Technical Problem

Existing circuit board aging test chambers can usually only perform tests under single conditions, making it difficult to meet the comparative testing needs under multiple factors and to comprehensively obtain performance change data of circuit boards under various conditions.

Method used

The multi-chamber circuit board aging test chamber is designed, which includes a main test chamber and several sets of test comparison chambers. It is equipped with a circuit board fixing mechanism, a temperature control heater, a temperature display screen and a geared motor. It can conduct comparative tests under different conditions and maintain temperature stability through an insulated outer shell to ensure the accuracy and reliability of test results.

Benefits of technology

This technology enables comprehensive testing of circuit boards under different conditions, obtains more comprehensive test data, improves the accuracy and reliability of test results, and enhances the versatility and ease of operation of the device.

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Abstract

The utility model relates to the technical field of test equipment, in particular to a multi-cavity circuit board aging test box, which comprises a test box seat, a test main box for testing a circuit board and a plurality of groups of test comparison boxes are mounted on the top surface of the test box seat, and circuit board fixing mechanisms for fixing the circuit board are mounted in the test main box and the plurality of groups of test comparison boxes. According to the utility model, through the test box seat, the test main box and the plurality of groups of test comparison boxes, comparison tests under different conditions can be carried out in the plurality of groups of test comparison boxes while normal circuit board aging tests are carried out in the test main box, so that more comprehensive test data can be conveniently obtained; the circuit board fixing mechanisms installed in the test main box and the plurality of groups of test comparison boxes can conveniently and rapidly fix the circuit board, and the arrangement of the movable columns and the reset springs enables the top seat to move relative to the supporting columns, thereby facilitating the adaptation to the circuit boards of different sizes, and improving the universality of the device.
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