Encapsulated product test structure
By designing a test structure for packaged products and utilizing a base, positioning fixture, and driving mechanism, the problem of unstable resistance values in small package resistor testing was solved, achieving more stable resistance value testing and higher testing accuracy.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- SHENZHEN YEZHAN ELECTRONICS
- Filing Date
- 2025-06-03
- Publication Date
- 2026-07-24
Smart Images

Figure CN224553409U_ABST
Abstract
Description
Technical Field
[0001] This utility model relates to the field of electronic device testing technology, and specifically to a test structure for packaged products. Background Technology
[0002] With the accelerating trend of intelligentization in the electronics industry, electronic components are rapidly developing towards smaller size and lighter weight, and the demand for small-package surface mount resistors such as 0805, 0603, 0402 and 0201 is also increasing.
[0003] However, testing small-package products using the conventional four-wire testing method (either on the top and bottom or on one side) resulted in significant resistance fluctuations, making it impossible to determine the exact value. Analysis of the testing process revealed that the small-package resistor generated considerable heat during testing, causing resistance drift (although alloy resistors have low TCR, drastic temperature changes still have an impact). This is because the small-package resistor is small, and the probe carrying the test current is thin. When current flows, the probe generates significant heat, which is conducted to the resistor, causing it to heat up and affecting test accuracy. Utility Model Content
[0004] The technical problem to be solved by this utility model is to provide a packaging product testing structure that can perform performance testing while positioning the packaged product, ensure stable resistance testing, improve resistance testing stability, reduce heat conduction to the packaged product, and prevent the packaged product from generating heat.
[0005] To solve the above-mentioned technical problems, the technical solution adopted by this utility model is as follows:
[0006] A test structure for packaged products, comprising:
[0007] The base, on which positioning stations are provided;
[0008] A positioning fixture is provided on the positioning station. The positioning fixture has detection openings on both sides, which are used to expose the test surfaces located on both sides of the packaged product.
[0009] The testing mechanism is arranged opposite to the positioning fixture. The testing structure includes two testing components, which are respectively arranged on both sides of the positioning fixture. The testing components are arranged opposite to the testing surface located on the side of the packaged product. The testing components are used to perform performance testing on the packaged product.
[0010] A driving mechanism is disposed on the base. The driving mechanism is connected to the two test components and is used to synchronously drive the two test components to connect with the test surface of the packaged product for performance testing.
[0011] In one embodiment of this utility model, the test component includes a test block, two test plates are provided on the test block, test wires are provided on the test plates, the test wires and test plates are fixedly connected to the test block by test bolts, a sliding groove is provided on the base, the test block slides on the sliding groove, and the test block is drivenly connected to a drive mechanism.
[0012] In one embodiment of this utility model, the test block includes two sliders, which are slidably disposed in a groove. Two test plates are respectively disposed on the two sliders. The sliders are provided with mounting holes, and test springs are disposed in the mounting holes. The free end of the test springs abuts against the first side wall of the groove.
[0013] In one embodiment of this utility model, the test plate includes a fixing plate and a connecting plate. The connecting plate is disposed on the fixing plate. The fixing plate is provided with test holes that match the test bolts. The test block is provided with a fixing groove that matches the fixing plate. The fixing plate is disposed in the fixing groove.
[0014] In one embodiment of this utility model, a limiting plate is provided on the base, and the limiting plate is disposed on the slide groove, so that the test block cannot be detached from the base. The two ends of the limiting plate are connected to the screw holes on the base by screws.
[0015] In one embodiment of this utility model, the test board is a sheet structure, and a beryllium copper gold-plated layer is provided on the surface of the test board. The free end of the test board has a planar or strip-shaped protrusion.
[0016] In one embodiment of this utility model, the driving mechanism includes a driving rod, a guide opening is provided on the base, the driving rod passes through the guide opening, a plurality of driving blocks are provided on both sides of the driving rod, a first inclined surface is provided on the driving block, and a second inclined surface matching the first inclined surface is provided on the slider. The second inclined surface abuts against the first inclined surface under the elastic force of the test spring. Pushing the driving rod causes the first inclined surface on the driving block to move along the second inclined surface on the slider, thereby pushing the slider towards the first side wall, so that the test plate on each slider moves away from the positioning fixture synchronously.
[0017] In one embodiment of this utility model, a first baffle and a second baffle are respectively provided on both sides of the guide opening. A through hole is provided on the first baffle, and the button on the drive rod passes through the through hole. A guide hole is provided on the drive rod, and a drive spring is provided on the guide hole. The free end of the drive spring abuts against the second baffle.
[0018] In one embodiment of this utility model, the positioning fixture includes two positioning blocks, and a positioning groove for positioning the packaged product is formed between the two positioning blocks. Guide grooves are provided on both sides of the positioning fixture, and the guide grooves are arranged opposite to the test surface of the packaged product. The test component is slidably mounted on the guide grooves.
[0019] In one embodiment of this utility model, the base is provided with fixed ends on both sides, and fixed ends are provided with fixed countersunk holes, and fixed bolts are provided on the fixed countersunk holes.
[0020] The beneficial effects of this utility model are:
[0021] This invention places the packaged product on a positioning fixture, with the test surfaces on both sides of the packaged product exposed through the test openings. The drive mechanism synchronously moves two test components to position and connect with the test surfaces of the packaged product, allowing the test components to perform performance testing while positioning the packaged product, ensuring stable resistance testing. Using test components to perform side testing on the packaged product increases the contact area with the packaged product, resulting in more uniform current loading and improved resistance testing stability. The test surfaces on both sides of the packaged product are positioned opposite to the test components, which increases the volume of the test components, enhances their heat dissipation capacity, reduces heat conduction to the packaged product, and prevents the packaged product from overheating. Attached Figure Description
[0022] Figure 1 This is a schematic diagram of a test structure for a packaged product according to this utility model.
[0023] Figure 2 This is a schematic diagram of the positioning fixture of this utility model.
[0024] Figure 3 This is a schematic diagram of the testing mechanism of this utility model.
[0025] Figure 4 This is a schematic diagram of the drive mechanism of this utility model.
[0026] The following are the labeling instructions in the diagram: 1. Base; 11. Fixed end; 12. Fixed countersunk hole; 13. Positioning station; 14. Slide groove; 15. Limiting plate; 16. Screw; 2. Positioning fixture; 21. Positioning block; 22. Packaged product; 23. Connecting plate; 24. Free end; 25. Guide groove; 26. Fixed groove; 27. Fixed plate; 28. Beryllium copper gold plating layer; 29. Test hole; 3. Test assembly; 31. Test block; 32. Test plate; 33. Test wire; 34. Test bolt; 35. Slider; 36. Test spring; 4. Guide opening; 41. Button; 42. First baffle; 43. Second baffle; 44. Drive rod; 45. Drive spring; 46. Drive block; 47. First inclined plane; 48. Second inclined plane. Detailed Implementation
[0027] The present invention will be further described below with reference to the accompanying drawings and specific embodiments, so that those skilled in the art can better understand and implement the present invention. However, the embodiments are not intended to limit the present invention.
[0028] Reference Figures 1-4 As shown, a test structure for packaged products includes:
[0029] Base 1, on which a positioning station 13 is provided;
[0030] Positioning fixture 2 is set on the positioning station 13. The positioning fixture 2 has detection openings on both sides, which are used to expose the test surfaces located on both sides of the packaged product 22.
[0031] The testing mechanism is arranged opposite to the positioning fixture 2. The testing structure includes two testing components 3, which are respectively arranged on both sides of the positioning fixture 2. The testing components 3 are arranged opposite to the testing surface located on the side of the packaged product 22. The testing components 3 are used to perform performance testing on the packaged product 22.
[0032] A driving mechanism is disposed on the base 1. The driving mechanism is connected to the two test components 3. The driving mechanism is used to synchronously drive the two test components 3 to connect with the test surface of the packaged product 22 for performance testing.
[0033] This invention places the packaged product 22 on the positioning fixture 2, with the test surfaces on both sides of the packaged product 22 exposed through the test openings. The drive mechanism synchronously drives the two test components 3 to be positioned and connected to the test surfaces of the packaged product 22, so that the test components 3 can perform performance testing while positioning the packaged product 22, ensuring stable resistance testing. Using the test components 3 to perform side testing on the packaged product 22 can increase the contact area with the packaged product 22, making the current loading more uniform and improving the stability of resistance testing. The test surfaces on both sides of the packaged product 22 are set opposite to the test components 3, which can increase the volume of the test components 3, enhance its heat dissipation capacity, reduce heat conduction to the packaged product 22, and prevent the packaged product 22 from overheating.
[0034] In one embodiment of the present invention, the test component 3 includes a test block 31, on which two test plates 32 are disposed, and on which test leads 33 are disposed, and the test leads 33 and the test plates 32 are fixedly connected to the test block 31 by test bolts 34. The base 1 is provided with a sliding groove 14, on which the test block 31 slides and is drivenly connected to the drive mechanism.
[0035] Specifically, the test lead 33 is connected to the test equipment, and the test block 31 is slidably mounted on the slide groove 14 to guide the test plate 32 on it, thereby improving the relative position of the test plate 32 and the resistor. At the same time, the test block 31 is driven by the drive mechanism, and the consistency of the four test plates 32 is good, thereby improving the stability of the resistance test.
[0036] In one embodiment of the present invention, the test block 31 includes two sliders 35, which are slidably disposed in the slide groove 14. Two test plates 32 are respectively disposed on the two sliders 35. The sliders 35 are provided with mounting holes, and test springs 36 are disposed in the mounting holes. The free end 24 of the test springs 36 abuts against the first side wall of the slide groove 14.
[0037] Specifically, the first sidewall is the inner wall of the groove 14 in the direction away from the positioning fixture 2. Under the elastic force of the test spring 36, the slider 35 is pressed tightly against the inner wall of the groove 14 in the direction close to the positioning fixture 2. The free end 24 of the test spring 36 abuts against the first sidewall of the groove 14. Under the force of the test spring 36, the connecting plate 23 is always pressed against the side of the resistor, thereby ensuring the stability of the resistance test. At the same time, a single test plate 32 is installed on each slider 35, which can avoid the problem that only a single test plate 32 is in contact with the resistor due to errors such as assembly accuracy of a test block 31, avoid mutual interference, and improve the stability of the test.
[0038] In one embodiment of the present invention, the test plate 32 includes a fixing plate 27 and a connecting plate 23. The connecting plate 23 is disposed on the fixing plate 27. The fixing plate 27 is provided with a test hole 29 that matches the test bolt 34. The test block 31 is provided with a fixing groove 26 that matches the fixing plate 27. The fixing plate 27 is disposed in the fixing groove 26.
[0039] Specifically, the fixing plate 27 is set in the fixing groove 26, which can quickly assemble the test plate 32 onto the slider 35, making maintenance convenient. At the same time, it can quickly position the replacement test plate 32, ensuring the consistency of the test plate 32 and improving the detection accuracy.
[0040] In one embodiment of the present invention, a limiting plate 15 is provided on the base 1. The limiting plate 15 is disposed on the slide groove 14, so that the test block 31 cannot be detached from the base 1. The two ends of the limiting plate 15 are connected to the screw holes on the base 1 by screws 16.
[0041] Specifically, the limiting plate 15 is set on the slide groove 14, so that the test block 31 cannot be detached from the base 1. It can drive the slider 35 to block it, so that the slider 35 slides stably in the slide groove 14 and moves in conjunction with the guide groove 25, thereby improving the movement accuracy of the test plate 32 and ensuring the stability of the resistance test.
[0042] In one embodiment of the present invention, the test plate 32 is a sheet structure, and a beryllium copper gold-plated layer 28 is provided on the surface of the test plate 32. The free end 24 of the test plate 32 has a planar or strip-shaped protrusion.
[0043] Specifically, the test board 32 has a sheet-like structure, which increases the size of the test probe, enhances the heat dissipation capacity of the probe, reduces heat conduction to the resistor, and prevents the resistor from heating up, thereby ensuring the stability of the resistance test. The free end 24 of the test board 32 has a planar or strip-shaped protrusion, which increases the contact area between the probe and the resistor (line or surface contact), makes the current loading more uniform, and improves the stability of the resistance test.
[0044] In one embodiment of this utility model, the driving mechanism includes a driving rod 44, a guide opening 4 is provided on the base 1, the driving rod 44 passes through the guide opening 4, a plurality of driving blocks 46 are provided on both sides of the driving rod 44, a first inclined surface 47 is provided on the driving block 46, and a second inclined surface 48 matching the first inclined surface 47 is provided on the slider 35. The second inclined surface 48 abuts against the first inclined surface 47 under the elastic force of the test spring 36, pushing the driving rod 44 so that the first inclined surface 47 on the driving block 46 moves along the second inclined surface 48 on the slider 35, thereby pushing the slider 35 towards the first side wall, so that the test plate 32 on each slider 35 moves away from the positioning fixture 2 simultaneously.
[0045] Specifically, pushing the drive rod 44 causes the first inclined surface 47 on the drive block 46 to move along the second inclined surface 48 on the slider 35, thereby pushing the slider 35 toward the first side wall, so that the test plate 32 on each slider 35 moves away from the positioning fixture 2 synchronously.
[0046] Release the button 41 on the drive rod 44. Under the reaction force of the drive spring 45, the drive rod 44 moves toward the first baffle 42. At the same time, under the reaction force of the test spring 36, the second inclined plane 48 of the slider 35 moves along the drive block 46 from high to low, so that it moves toward the positioning fixture 2. This makes the test plate 32 on each slider 35 move synchronously toward the positioning fixture 2. In this way, the positioning of the connecting plate 23 on the four sliders 35 on both sides of the resistor can be controlled synchronously.
[0047] In one embodiment of the present invention, a first baffle 42 and a second baffle 43 are respectively provided on both sides of the guide opening 4. A through hole is provided on the first baffle 42, and a button 41 on the drive rod 44 passes through the through hole. A guide hole is provided on the drive rod 44, and a drive spring 45 is provided on the guide hole. The free end 24 of the drive spring 45 abuts against the second baffle 43.
[0048] Specifically, pressing button 41 on drive rod 44 causes drive rod 44 to move towards the second baffle 43, compressing drive spring 45 and placing the resistor into the positioning groove formed between the two positioning blocks 21. Releasing button 41 causes drive rod 44 to move towards the first baffle 42 under the reaction force of drive spring 45, causing the test plate 32 on each slider 35 to move synchronously towards positioning fixture 2. The four independent test plates 32 simultaneously clamp the test surfaces on both sides of the resistor, achieving rapid clamping of the resistor. The consistency of the four test plates 32 is good, improving the stability of resistance testing.
[0049] In one embodiment of the present invention, the positioning fixture 2 includes two positioning blocks 21, and a positioning groove for positioning the packaged product 22 is formed between the two positioning blocks 21. Guide grooves 25 are provided on both sides of the positioning fixture 2, and the guide grooves 25 are arranged opposite to the test surface of the packaged product 22. The test component 3 is slidably mounted on the guide grooves 25.
[0050] Specifically, the vacuum pen picks up the resistor (packaged product 22), releases the vacuum pen, and places the resistor into the positioning groove formed between the two positioning blocks 21. The positioning groove can quickly limit the small-volume resistor, ensuring the positioning efficiency of the resistor. The detection openings on both sides expose the test surfaces located on both sides of the packaged product 22. Since the guide groove 25 is set opposite to the test surface of the packaged product 22, the connecting plate 23 slides in the guide groove 25, which can guide the connecting plate 23 while also separating the connecting plate 23, ensuring the stability and accuracy of the test.
[0051] In one embodiment of the present invention, the base 1 is provided with fixed ends 11 on both sides, and fixed countersunk holes 12 are provided on the fixed ends 11, and fixed bolts are provided on the fixed countersunk holes 12.
[0052] Specifically, the fixing bolts are inserted into the fixing countersunk holes 12, which allows the base 1 to be easily fixed in various processing environments, making it practical and easy to install.
[0053] Usage process
[0054] The first sidewall is the inner wall of the groove 14 away from the positioning fixture 2. The slider 35, under the elastic force of the test spring 36, is pressed tightly against the inner wall of the groove 14 near the positioning fixture 2. The drive rod 44, under the elastic force of the drive spring 45, is always in contact with the first baffle 42. At this time, the second inclined surface 48 abuts against the first inclined surface 47 on the drive block 46. Pressing the button 41 on the drive rod 44 causes the drive rod 44 to move towards the second baffle 43, causing the drive rod 44 to engage with the drive spring 45. Compression occurs, and simultaneously, the movement of the drive rod 44 causes the first inclined surface 47 on the drive block 46 to move along the second inclined surface 48 on the slider 35. Because the drive block 46 has a first inclined surface 47 that makes one end of the body higher than the other, the second inclined surface 48 moves along the drive block 46 from the lower end to the higher end, thus pushing the slider 35 towards the first side wall and compressing the test spring 36 on the slider 35. This causes the test plates 32 on each slider 35 to synchronously move away from the positioning fixture 2. At this time, the four test plates 32 are away from the positioning fixture. 2. Loosen the positioning fixture 2, and use the vacuum pen to pick up the resistor (packaged product 22). Release the vacuum pen and place the resistor into the positioning groove formed between the two positioning blocks 21. The detection openings on both sides expose the test surfaces located on both sides of the packaged product 22. Release the button 41 on the drive rod 44. Under the reaction force of the drive spring 45, the drive rod 44 moves towards the first baffle 42. At the same time, under the reaction force of the test spring 36, the second inclined surface 48 of the slider 35 moves along the drive block 46 from high to low, causing it to move towards the positioning fixture 2. This causes the test plates 32 on each slider 35 to move synchronously towards the positioning fixture 2. Since the guide groove 25 is set opposite to the test surface of the packaged product 22, and the connecting plate 23 slides in the guide groove 25, the four independent test plates 32 simultaneously clamp the test surfaces on both sides of the resistor, allowing for testing. Using the side of the packaged product 22 for testing increases the contact area between the probe and the resistor (line or surface contact), making the current loading more uniform and improving the stability of the resistance test.
[0055] The above-described embodiments are merely preferred embodiments provided to fully illustrate the present invention, and the scope of protection of the present invention is not limited thereto. Equivalent substitutions or modifications made by those skilled in the art based on the present invention are all within the scope of protection of the present invention. The scope of protection of the present invention is defined by the claims.
Claims
1. A test structure for packaged products, characterized in that, include: The base, on which positioning stations are provided; A positioning fixture is provided on the positioning station. The positioning fixture has detection openings on both sides, which are used to expose the test surfaces located on both sides of the packaged product. The testing mechanism is arranged opposite to the positioning fixture. The testing structure includes two testing components, which are respectively arranged on both sides of the positioning fixture. The testing components are arranged opposite to the testing surface located on the side of the packaged product. The testing components are used to perform performance testing on the packaged product. A driving mechanism is disposed on the base. The driving mechanism is connected to the two test components and is used to synchronously drive the two test components to connect with the test surface of the packaged product for performance testing.
2. The packaging product testing structure as described in claim 1, characterized in that, The test assembly includes a test block with two test plates on it. Test leads are provided on the test plates. The test leads and test plates are fixedly connected to the test block by test bolts. A sliding groove is provided on the base, and the test block slides on the sliding groove. The test block is driven by a drive mechanism.
3. The packaging product testing structure as described in claim 2, characterized in that, The test block includes two sliders that slide in a groove. Two test plates are respectively mounted on the two sliders. Each slider has a mounting hole and a test spring is installed in the mounting hole. The free end of the test spring abuts against the first side wall of the groove.
4. The packaging product testing structure as described in claim 2, characterized in that, The test plate includes a fixing plate and a connecting plate. The connecting plate is disposed on the fixing plate. The fixing plate is provided with test holes that match the test bolts. The test block is provided with a fixing groove that matches the fixing plate. The fixing plate is disposed in the fixing groove.
5. The packaging product testing structure as described in claim 2, characterized in that, A limiting plate is provided on the base and is disposed on the slide groove, so that the test block cannot be detached from the base. The two ends of the limiting plate are connected to the screw holes on the base by screws.
6. The packaging product testing structure as described in claim 2, characterized in that, The test board has a sheet-like structure, and a beryllium copper gold-plated layer is provided on the surface of the test board. The free end of the test board has a planar or strip-shaped protrusion.
7. The packaging product testing structure as described in claim 3, characterized in that, The driving mechanism includes a driving rod, and a guide opening is provided on the base. The driving rod passes through the guide opening. Multiple driving blocks are provided on both sides of the driving rod. A first inclined surface is provided on the driving block. A second inclined surface matching the first inclined surface is provided on the slider. The second inclined surface abuts against the first inclined surface under the elastic force of the test spring. Pushing the driving rod causes the first inclined surface on the driving block to move along the second inclined surface on the slider, thereby pushing the slider towards the first side wall, so that the test plate on each slider moves away from the positioning fixture synchronously.
8. The test structure for packaged products as described in claim 7, characterized in that, A first baffle and a second baffle are respectively provided on both sides of the guide opening. A through hole is provided on the first baffle, and the button on the drive rod passes through the through hole. A guide hole is provided on the drive rod, and a drive spring is provided on the guide hole. The free end of the drive spring abuts against the second baffle.
9. The test structure for packaged products as described in claim 1, characterized in that, The positioning fixture includes two positioning blocks, with a positioning groove formed between the two positioning blocks for positioning the packaged product. Guide grooves are provided on both sides of the positioning fixture, and the guide grooves are positioned opposite to the test surface of the packaged product. The test component is slidably mounted on the guide grooves.
10. The test structure for packaged products as described in claim 1, characterized in that, The base has fixed ends on both sides, and fixed ends have countersunk holes, with fixing bolts installed in the countersunk holes.