An optical module testing apparatus

By integrating optical module testing equipment, the problems of complex equipment interconnection and large space occupation in high-speed optical module testing are solved, realizing automated testing and efficient fault diagnosis of multiple optical modules, and reducing costs.

CN224555619UActive Publication Date: 2026-07-24SHANGHAI BOPU SEMICON TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
SHANGHAI BOPU SEMICON TECH CO LTD
Filing Date
2025-06-27
Publication Date
2026-07-24

AI Technical Summary

Technical Problem

The research, development, production and testing of high-speed optical modules require multiple separate testing devices, which leads to complex interconnection, difficult troubleshooting and large space occupation.

Method used

Design an integrated optical module test device, including a first electrical test interface, an optical test interface, optical test devices, a control chip, and a signal transceiver chip, to realize automated testing of optical modules, support simultaneous testing of multiple optical modules, and optimize signal transmission through optical switches and optical attenuators.

Benefits of technology

It simplifies the space occupied by testing equipment, reduces the difficulty of troubleshooting, improves testing efficiency and accuracy, and reduces costs.

✦ Generated by Eureka AI based on patent content.

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    Figure CN224555619U_ABST
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Abstract

The utility model discloses a kind of optical module test equipment, it is related to optical communication technical field.Optical module test equipment in:first electric test interface is electrically connected with signal transceiver chip;Control chip is electrically connected with optical test device and optical test interface by light testing device;Control chip and signal transceiver chip are electrically connected;Control chip sends first test control signal to signal transceiver chip, and sends second test control signal to optical test device;Optical test device will be converted into second optical signal by first optical signal received through optical test interface, and second optical signal is sent to second to-be-tested optical module by optical test interface;Signal transceiver chip sends test electric signal to first to-be-tested optical module group by first electric test interface;And target electric signal sent by second to-be-tested optical module group is received by first electric test interface.The optical module test equipment provided by the utility model occupies smaller space and area, and failure is easy to troubleshoot, and cost is lower.
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