Single-wave 100 Gbps rate error code testing device

CN224626660UActive Publication Date: 2026-08-11SHENZHEN GOLIGHT TECH
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-09-22
Publication Date
2026-08-11

AI Technical Summary

Technical Problem

[0003]当前常用的误码测试装置只能测试低于100Gbps速率的光模块,或者使用多条单一高速射频线与光模块测试板连接,连接耗时费力,占用空间而且容易接错,同时现有的误码测试装置没有异常检测功能

Benefits of technology

[0019]1、本实用新型采用2*8防呆高速射频线,如果光模块测试板出现老化或者损坏的情况,可以快速的完成接线,避免繁琐的接线工作,而且不会出现接错线的情况,极大的提高了生产效率;

✦ Generated by Eureka AI based on patent content.

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Abstract

This utility model relates to the field of optical module technology and discloses a single-wavelength 100Gbps bit error rate testing device, comprising: a pattern generator; a pattern receiver; an optical module test board; a control and detection unit; and a power module. The pattern generator and the optical module test board, as well as the pattern receiver and the optical module test board, are connected via foolproof high-speed RF cables. The pattern generator, pattern receiver, and optical module test board are all electrically connected to the control and detection unit. Using 2*8 foolproof high-speed RF cables allows for quick wiring if the optical module test board ages or is damaged, avoiding tedious wiring work and preventing incorrect wiring, thus greatly improving production efficiency. Through the design of the control and detection unit, when the bit error rate testing device malfunctions, the test can be shut down promptly and a warning can be issued, effectively preventing damage to the bit error rate testing device or the optical module.
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Description

Technical Field

[0001] This utility model relates to the field of optical module technology, and in particular to the field of optical module bit error rate testing, specifically a single-wavelength 100Gbps bit error rate testing device. Background Technology

[0002] With the rise of big data, cloud computing, artificial intelligence, and 5G, data traffic has grown rapidly, placing increasingly higher demands on the communication speed of optical modules. Various manufacturers have launched 100Gbps high-speed optical modules to meet market demand. The main technical indicator of high-speed optical modules is maintaining zero or very low bit error rates when transmitting high-speed signals, usually expressed as the bit error rate (BER). To test the BER of an optical module, a corresponding bit error rate testing device is required.

[0003] Currently used bit error rate testing devices can only test optical modules with speeds below 100Gbps, or they use multiple single high-speed RF cables to connect to the optical module test board. This connection is time-consuming, labor-intensive, space-consuming, and prone to errors. In addition, existing bit error rate testing devices do not have anomaly detection functions.

[0004] Therefore, we need to propose a single-wavelength 100Gbps bit error rate testing device that can quickly complete the wiring without misconnection, thus improving testing efficiency. Utility Model Content

[0005] The purpose of this invention is to provide a single-wavelength 100Gbps bit error rate testing device, which uses 2*8 foolproof high-speed RF cables. If the optical module test board is aged or damaged, the wiring can be completed quickly, avoiding tedious wiring work and preventing incorrect wiring. This greatly improves production efficiency and solves the problems mentioned in the background art.

[0006] To achieve the above objectives, this utility model provides the following technical solution: a single-wavelength 100Gbps bit error rate testing device, comprising:

[0007] A code generation device for generating multiple 100Gbps high-speed PRBS signals;

[0008] A code pattern receiving device that verifies the received PRBS signal;

[0009] Optical module test board for driving optical modules;

[0010] A control and detection unit used to set PRBS code patterns, calculate bit error rates, and detect abnormal states of the code pattern generator and optical modules;

[0011] A power supply module that supplies power to the code pattern generator, code pattern receiver, optical module test board, and control and detection unit;

[0012] The code pattern generator and the optical module test board, as well as the code pattern receiver and the optical module test board, are all connected via foolproof high-speed radio frequency cables. The code pattern generator, the code pattern receiver, and the optical module test board are all electrically connected to the control and detection unit.

[0013] Preferably, the power supply module includes a DC / DC regulator for powering the code generation device and the code receiving device, and a DC / DC converter for powering the optical module test board; the DC / DC regulator supports an input voltage of 4~14V, an output voltage of 0.6~5.5V, and a maximum current of 4A, and the DC / DC converter supports an input voltage of 9~53V, an output voltage of 3.3~15V, and a maximum current of 20A.

[0014] Preferably, the code generation device includes a clock source for generating a low-frequency square wave signal, a phase-locked loop for amplifying the frequency of the square wave signal, and a code generator for converting the square wave signal into a PRBS signal and outputting it, wherein the clock source, the phase-locked loop, and the code generator are connected in sequence.

[0015] Preferably, the pattern receiving device includes a pattern detection module for calculating the bit error rate and a LOS alarm module for indicating whether a PRBS signal has been received. Both the pattern detection module and the LOS alarm module are electrically connected to the pattern generator.

[0016] Preferably, the optical module test board is connected to the optical module via gold fingers, and the optical module is connected to a self-looping fiber optic patch cord.

[0017] Preferably, the control and detection unit includes a microcontroller (MCU) for reading the status and parameters of each pin of the optical module. The MCU is electrically connected to the code receiving device, the power supply module, the optical module test board, and the optical module.

[0018] Compared with the prior art, the beneficial effects of this utility model are:

[0019] 1. This utility model uses 2*8 foolproof high-speed RF cables. If the optical module test board is aged or damaged, the wiring can be completed quickly, avoiding tedious wiring work and preventing incorrect wiring, which greatly improves production efficiency.

[0020] 2. Through the design of the control detection unit, this utility model can promptly shut down the test and issue a warning when the bit error rate test device malfunctions, which can effectively prevent damage to the bit error rate test device or optical module. Attached Figure Description

[0021] Figure 1 This is a system block diagram of the present invention;

[0022] Figure 2 This is a schematic diagram of the power module of this utility model;

[0023] Figure 3 This is a system block diagram of the code generation device of this utility model;

[0024] Figure 4 This is a system block diagram of the code receiving device of this utility model;

[0025] Figure 5 This is a schematic diagram showing the connection between the optical module test board, the code generator, the code receiver, and the optical module of this utility model.

[0026] Figure 6 This is a schematic diagram of the control principle of the control and detection unit of this utility model. Detailed Implementation

[0027] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0028] Please see Figure 1-6 This utility model provides a technical solution: a single-wavelength 100Gbps bit error rate testing device, comprising:

[0029] A code generation device for generating multiple 100Gbps high-speed PRBS signals;

[0030] A code pattern receiving device that verifies the received PRBS signal;

[0031] Optical module test board for driving optical modules;

[0032] A control and detection unit used to set PRBS code patterns, calculate bit error rates, and detect abnormal states of the code pattern generator and optical modules;

[0033] A power supply module that supplies power to the code pattern generator, code pattern receiver, optical module test board, and control and detection unit;

[0034] The code pattern generator and the optical module test board, as well as the code pattern receiver and the optical module test board, are all connected via foolproof high-speed radio frequency cables. The code pattern generator, the code pattern receiver, and the optical module test board are all electrically connected to the control and detection unit.

[0035] The power supply module includes a DC / DC regulator that powers the code pattern generator and the code pattern receiver, and a DC / DC converter that powers the optical module test board; a first filter capacitor bank is connected to the DC / DC regulator, and a second filter capacitor bank is connected to the DC / DC converter;

[0036] The first filter capacitor group includes capacitors C1, C2, C3, and C4 connected in parallel, and the second filter capacitor group includes capacitors C5, C6, C7, and C8 connected in parallel.

[0037] The DC / DC regulator supports an input voltage of 4~14V, an output voltage of 0.6~5.5V, and a maximum current of 4A. The DC / DC converter supports an input voltage of 9~53V, an output voltage of 3.3~15V, and a maximum current of 20A. Furthermore, the DC / DC regulator has a conversion efficiency greater than 90%, and the DC / DC converter has a conversion efficiency greater than 97%.

[0038] The code generation device includes a clock source for generating a low-frequency square wave signal, a phase-locked loop for amplifying the frequency of the square wave signal, and a code generator for converting the square wave signal into a PRBS signal and outputting it. The clock source, phase-locked loop, and code generator are connected in sequence.

[0039] The clock source generates a low-frequency square wave signal, which is multiplied by a phase-locked loop and then input to the code generator. The code generator has a built-in digital processing chip that can convert the square wave signal into a PRBS signal output, generating 8 channels of 100Gbps high-speed PRBS signals.

[0040] The pattern receiving device includes a pattern detection module for calculating the bit error rate and a LOS alarm module for indicating whether a PRBS signal has been received. Both the pattern detection module and the LOS alarm module are electrically connected to the pattern generator.

[0041] The code pattern detection module has a built-in digital processing chip that verifies the received PRBS signal. If an error code is found, it is set to 1. Subsequent error codes are accumulated (i.e., if two error codes are found, it is set to 2). The total number of error codes divided by the total number of codes is the bit error rate.

[0042] The LOS alarm module is responsible for indicating whether a PRBS signal has been received. When the pattern receiver receives the PRBS signal, it outputs a low level to indicate normal operation. When the pattern receiver does not receive the PRBS signal, it outputs a high level to indicate an abnormality.

[0043] The optical module test board is connected to the optical module via gold fingers, and the optical module is connected to a self-looping fiber optic patch cord.

[0044] When the pattern generator is connected to the optical module test board via a 2x8 foolproof high-speed RF cable, the pattern generator outputs a PRBS signal to perform high-speed modulation on the optical module, and the output light is the modulated light.

[0045] After the optical module's optical path loops, the optical module outputs a modulated electrical signal. This electrical signal is then connected to a code pattern receiver via a 2x8 foolproof high-speed RF cable, which can then calculate the bit error rate.

[0046] The control and detection unit includes a microcontroller (MCU) for reading the status and parameters of each pin of the optical module. The MCU is electrically connected to the code receiving device, the power supply module, the optical module test board, and the optical module.

[0047] When the control and detection unit detects that the optical module is connected to the optical module test board, the control and detection unit controls the code generator to output the code pattern, controls the code receiver to receive the code pattern, and calculates the bit error rate. At the same time, it can detect the abnormal state of the code generator and the optical module. If the temperature is abnormal or other abnormalities occur, the code pattern output will be shut down immediately, and the optical module will be controlled to work in a low-power mode.

[0048] This device uses 2*8 foolproof high-speed RF cables. If the optical module test board is aged or damaged, the wiring can be completed quickly, avoiding tedious wiring work and preventing incorrect wiring, which greatly improves production efficiency.

[0049] By controlling the configuration of the detection unit, when the bit error rate test device malfunctions, the test can be shut down in time and a warning can be issued, which can effectively prevent damage to the bit error rate test device or optical module.

[0050] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A single-wavelength 100Gbps bit error rate testing device, characterized in that, include: A code generation device for generating multiple 100Gbps high-speed PRBS signals; A code pattern receiving device that verifies the received PRBS signal; Optical module test board for driving optical modules; A control and detection unit used to set PRBS code patterns, calculate bit error rates, and detect abnormal states of the code pattern generator and optical modules; A power supply module that supplies power to the code pattern generator, code pattern receiver, optical module test board, and control and detection unit; The code pattern generator and the optical module test board, as well as the code pattern receiver and the optical module test board, are all connected via foolproof high-speed radio frequency cables. The code pattern generator, the code pattern receiver, and the optical module test board are all electrically connected to the control and detection unit.

2. The single-wavelength 100Gbps bit error rate testing device according to claim 1, characterized in that: The power supply module includes a DC / DC regulator that powers the code pattern generator and the code pattern receiver, and a DC / DC converter that powers the optical module test board. The DC / DC regulator supports an input voltage of 4~14V, an output voltage of 0.6~5.5V, and a maximum current of 4A. The DC / DC converter supports an input voltage of 9~53V, an output voltage of 3.3~15V, and a maximum current of 20A.

3. The single-wavelength 100Gbps bit error rate testing device according to claim 1, characterized in that: The code generation device includes a clock source for generating a low-frequency square wave signal, a phase-locked loop for amplifying the frequency of the square wave signal, and a code generator for converting the square wave signal into a PRBS signal and outputting it. The clock source, phase-locked loop, and code generator are connected in sequence.

4. The single-wavelength 100Gbps bit error rate testing device according to claim 1, characterized in that: The pattern receiving device includes a pattern detection module for calculating the bit error rate and a LOS alarm module for indicating whether a PRBS signal has been received. Both the pattern detection module and the LOS alarm module are electrically connected to the pattern generator.

5. The single-wavelength 100Gbps bit error rate testing device according to claim 1, characterized in that: The optical module test board is connected to the optical module via gold fingers, and the optical module is connected to a self-looping fiber optic patch cord.

6. The single-wavelength 100Gbps bit error rate testing device according to claim 1, characterized in that: The control and detection unit includes a microcontroller (MCU) for reading the status and parameters of each pin of the optical module. The MCU is electrically connected to the code receiving device, the power supply module, the optical module test board, and the optical module.