A line flaw detection apparatus
By integrating high-definition cameras, infrared scanners, and power-on probes for simultaneous detection and automated transport, the problem of missed detection caused by the independent optical inspection and power-on testing in existing equipment has been solved, achieving efficient and accurate detection of line defects.
Patent Information
- Application Number
- CN202521728760.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-08-14
- Publication Date
- 2026-08-18
- Estimated Expiration
- 2035-08-14
AI Technical Summary
In existing circuit defect detection equipment, optical inspection and power-on testing are performed independently, resulting in asynchronous data, easy omissions, reduced efficiency, and potential quality risks, which cannot meet the comprehensive inspection needs of high-precision circuits.
An integrated board is used to integrate a high-definition camera, an infrared scanner, and an energized probe. The height of the detection components is adjusted by a telescopic rod and a spring damper to achieve simultaneous optical detection and energized testing. A geared motor drives a threaded screw to move a sliding block for automated conveying. Combined with anti-static and lighting components, the synchronization and accuracy of the detection are ensured.
It achieves the linkage between optical inspection and power-on testing, improves inspection efficiency and accuracy, meets the requirements of high-precision comprehensive inspection, enhances the degree of automation and conveying stability, and avoids the problem of missed inspection caused by process separation.