Chip wire bond section avl appearance detection machine
The WireBond segment AVI appearance inspection machine for chips, which integrates a dual-station material preparation component, a material basket buffer component, and a product pick-and-place component, solves the problem of low efficiency in manual inspection, realizes automated and continuous visual inspection, and adapts to the needs of large-scale production.
Patent Information
- Application Number
- CN202521929787.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-09
- Publication Date
- 2026-09-18
- Estimated Expiration
- 2035-09-09
AI Technical Summary
In existing technologies, the detection of the WireBond segment of a chip relies on manual inspection, which cannot meet the cycle time requirements of large-scale production, resulting in low inspection efficiency.
Design a chip WireBond segment AVI appearance inspection machine, which adopts a dual-station material preparation component, a material basket buffer component and a product picking and placing component to work together, and integrates with a vision inspection component to realize the automatic transfer of the material basket between the material preparation position and the buffer position, and the automatic flow of products between the buffer position and the inspection position, reducing manual intervention.
It enables automated and continuous visual inspection of chip wire bonding products, improving inspection efficiency, reducing manual intervention, and adapting to the needs of large-scale production.