Semiconductor device and method for manufacturing the same
A delay circuit with selectable paths and a selection signal addresses timing clock defects and electromigration in semiconductor devices, enhancing precision and reducing rework in the manufacturing process.
Patent Information
- Application Number
- DE102025150327
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Priority Date
- 2024-12-11
- Filing Date
- 2025-12-03
- Publication Date
- 2026-06-11
AI Technical Summary
Existing semiconductor manufacturing processes face challenges in managing timing clock defects due to wiring delays, which are exacerbated by miniaturization and lower operating voltages, leading to increased rework and electromigration errors when manually correcting locally concentrated circuits.
The implementation of a delay circuit with multiple selectable delay paths and a selection signal allows for precise delay value adjustment, enabling automatic or manual correction of timing violations while reducing electromigration errors and minimizing rework.
This approach enables high-precision delay design with reduced labor hours and rework, effectively addressing timing violations and electromigration issues in semiconductor devices.