Solder joint element, semiconductor device, solder joint process and method for manufacturing a semiconductor device
A soldering connection element with a multi-phase structure using SN, AG, CU, and BI addresses thermal contraction issues in semiconductor devices, enhancing reliability and strength by evenly distributing thermal stresses and preventing cracks.
Patent Information
- Application Number
- DE112022007400
- Authority / Receiving Office
- DE · DE
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2022-06-20
- Publication Date
- 2025-04-03
AI Technical Summary
Existing soldering connections between semiconductor elements and circuit boards are prone to defects due to thermal contraction and oxidation, leading to electrical property changes and potential damage, as conventional lead-free soldering agents with added elements like Bi form uneven phases with different melting points, causing gaps and cracks.
A soldering connection element composed of SN, AG, CU, and BI with specific mass percentages, forming a multi-phase structure with melting points ranging from 135°C to 220°C, including an SN-BI alloy phase with a low melting point, an SN-BI-SB alloy phase with a medium melting point, and a main phase with a high melting point, to mitigate thermal contraction stresses.
The multi-phase structure reduces defects by evenly distributing thermal stresses, maintaining high reliability and strength in the connection, preventing cracks and ensuring stable electrical properties.