INSPECTION DURING THE MANUFACTURING OF MODULES OR MODULE PREPARATORS

Description

background

[0001] This document discloses an inspection process used in the manufacture of modules or module precursors. These modules or precursors can be, for example, layered arrangements containing layered material, arrangements for fuel or battery cells, or components for their manufacture. This inspection process is disclosed as a method and as an apparatus. Details are defined in the claims. The description also contains relevant information on the structure and function of the inspection process, as well as on apparatus and method variants. State of the art

[0002] WO 2021 171 946 A1 relates to a test device for checking the position of the electrode layer in a laminate in which a release liner and an electrode layer are bonded by an adhesive, from the release liner side. An infrared irradiation unit irradiates the laminate with infrared light from the release liner side. An infrared-sensitive camera records the infrared light transmitted through the release liner and reflected by the electrode layer. A detection unit determines the position of the electrode layer based on the image captured by the camera. Stacks of laminate consisting of release liners and electrode layers are stacked on a stacking table. A transport unit is used to transport the release liners and electrode layers and to place them on the stacking table. The test device checks the position of the electrode layer in the laminate stacks released by the transport unit.

[0003] In other known solutions, the finished battery cell, and in preliminary stages the electrode stacks, are tested for electrical short circuits. This procedure leads to a high proportion of unusable (intermediate and final) products, since even imprecisely manufactured electrode stacks are laminated and then processed into the final, inadequate battery cell.

[0004] Document EP 2 696 422 A1 discloses an inspection device for stacks of layers. For inspecting the stacks of layers, the device has four camera sensors positioned vertically above the stack of layers to be inspected.

[0005] Furthermore, documents KR 2021 0045 181 A and JP 2016 197 526 A each reveal inspection devices for layer stacks that use sensors positioned above the layer stacks to check the positioning of the stacked layers. Technical problem

[0006] Based on this, an arrangement and a procedure should be provided that allows modules or precursors of modules, for example fuel or battery cells containing layer material, to be manufactured with high precision at high processing speed, reducing their short-circuit risk and improving their efficiency. Technical solution

[0007] The invention is defined by the independent claims. Advantageous embodiments of the invention are defined by the dependent claims.

[0008] An example of an inspection procedure in the manufacture of modules or module precursors comprises, for example in the following sequence, the steps: providing a single anode and / or cathode layer at a receiving point; conveying a stacking device to the receiving point; receiving the anode / cathode layer from the receiving point by the stacking device; recording the position and / or orientation of the anode / cathode layer; transporting the anode / cathode layer to a stacking point by the stacking device; aligning the stacking device with the transported anode / cathode layer relative to the stacking point; and unstacking the transported anode / cathode layer at the stacking point.

[0009] In some variations of the inspection method, the position and / or orientation of the anode / cathode layer is recorded before the stacking device picks up the anode / cathode layer from the picking point and / or during transport of the anode / cathode layer by the stacking device to the stacking point. In other variations of the inspection method, the position and / or orientation of the anode / cathode layer is recorded during transport of the anode / cathode layer by the stacking device to the stacking point using a first camera, and / or before the stacking device picks up the anode / cathode layer from the picking point using a second camera.

[0010] To ensure accurate positioning, in one variant a preliminary position on the transport of the incoming anode / cathode layers is first checked using a matrix camera and a lighting device (white, adjustable 0-20°).

[0011] In variations of the inspection method, the first and / or second camera, positioned perpendicularly (± approximately 25°) to the anode / cathode layer, captures its position and / or orientation. In variations of the inspection method, a white light source assigned to the first and / or second camera illuminates the anode / cathode layer for image acquisition by the first or second camera, respectively. In variations of the inspection method, the first and / or second camera captures the entire anode / cathode layer with a single image acquisition to determine its position and / or orientation. In variations of the inspection method, the first and / or second camera captures an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least one section of an edge of the anode / cathode layer with a single image acquisition to determine its position and / or orientation.In variants of the inspection procedure, the first and / or second camera is designed as a line scan camera, which captures the position and / or orientation of the anode / cathode position before being picked up by the stacking device or upon its arrival at the picking point or on its way to the picking point.

[0012] In variants of the inspection method, at least one optically effective element is placed in front of the first and / or the second camera in order to detect the position and / or orientation of the anode / cathode position at one or more points or areas before being picked up by the stacking device or upon its arrival at the picking point or on its way to the picking point.

[0013] In some variations of the inspection procedure, correction values ​​are determined from the position and / or orientation of the anode / cathode layer before it is picked up by the stacking device, the position and / or orientation of the stacking device itself, and / or the position and / or orientation of the individual anode / cathode layer picked up during transport to the stacking point. In some variations of the inspection procedure, these correction values ​​are taken into account when aligning the stacking device with the transported anode / cathode layer relative to the stacking point. In other variations of the inspection procedure, these correction values ​​are taken into account when aligning the stacking device for picking up the anode / cathode layer, such that the anode / cathode layer is picked up by the stacking device in a centered, zero position and / or in alignment.

[0014] In one variant of the inspection procedure, the calculated correction values ​​can be used to position the stacking device relative to the anode / cathode position before / during pickup so that the anode / cathode is picked up by the stacking device in a zero position. This can be achieved by correcting the position and / or orientation of the stacking device relative to the anode / cathode at the pickup point.

[0015] Similarly, after the image has been picked up during transport, the stacking device can be positioned according to the correction values ​​from the image feeder so that the anode / cathode position is correctly placed on the electrode stack located there when the stacking device places the anode / cathode position at the stacking point with minimal or no further correction movement.

[0016] This process is very fast and can be carried out with high precision. For example, a device described below is suitable for carrying out this process.

[0017] An example of a device for conveying and inspecting modules or module precursors comprises: a stacking device, designed and configured to receive a single anode / cathode layer at a receiving point; a conveying device, designed and configured to convey the stacking device to and from the receiving point; a first camera, designed and configured to detect the position and / or orientation of the anode / cathode layer on its way from the receiving point to the stacking point; an actuating device, comprising at least one actuator, designed and configured to actuate the stacking device to receive the anode / cathode layer, and / or to align the stacking device with the anode / cathode layer relative to the stacking point during the transport of the anode / cathode layer to the stacking point, and / or to unstack the anode / cathode layer at the stacking point.

[0018] In some versions of the device, a first camera is designed and configured to capture the position and / or orientation of the anode / cathode layer during transport by the stacking device to the stacking point. In other versions of the device, a second camera is designed and configured to capture the position and / or orientation of the anode / cathode layer before it is picked up from the stacking point by the stacking device.

[0019] In various versions of the device, the first and / or the second camera is designed and configured to capture the position and / or orientation of the anode / cathode from a perpendicular, ± approximately 25°, top view. In other versions of the device, a white light source associated with the first and / or the second camera is designed and configured to illuminate the anode / cathode for image acquisition by the first or second camera, respectively. In other versions of the device, the first and / or the second camera is designed and configured to capture the entire anode / cathode with a single image acquisition in order to determine its position and / or orientation.In variants of the device, the first and / or the second camera is designed and configured to capture, with a single image acquisition, an area, at least one corner area, two diagonal corner areas, and / or at least one corner area and at least one section of an edge of the anode / cathode layer in order to determine the position and / or orientation of the anode / cathode layer. In variants of the device, the first and / or the second camera is designed as a line scan camera, which is designed and configured to capture the position and / or orientation of the anode / cathode layer before it is picked up by the stacking device, or upon its arrival at the pickup point or on its way to the pickup point.

[0020] In various versions of the device, at least one optically effective element is positioned upstream of the first and / or second camera, designed and configured to detect the position and / or orientation of the anode / cathode configuration at one or more locations or areas before the stacking device takes the sample, or upon its arrival at the sampling point or on its way to the sampling point. In these versions of the device, the at least one optically effective element may be a lens or lens arrangement, a mirror or mirror arrangement, a prism or prism arrangement, a surface light, a coaxial ring light, a dark-field light, or combinations thereof.

[0021] In some versions of the device, a control unit is designed and configured to determine correction values ​​from the image capture and / or data from the scanning device and / or the first and / or second camera. These correction values ​​are based on the position and / or orientation of the anode / cathode layer before it is picked up by a stacking device, the position and / or orientation of the stacking device, and / or the position and / or orientation of the individual anode / cathode layer picked up relative to the stacking device during transport of the anode / cathode layer to the stacking point. In other versions of the device, the control unit is designed and configured to incorporate these correction values ​​into control commands for the positioning device, the conveying device, and / or the stacking device when aligning the stacking device with the transported anode / cathode layer relative to the stacking point.In variants of the device, a control unit is designed and configured to take these correction values ​​into account in setting commands to the positioning device, the conveying device and / or the stacking device when taking up the anode / cathode position, such that the stacking device takes up the respective anode / cathode position in a central zero position and / or aligned with the electrode stack located at the stacking point.

[0022] By checking the position of the incoming anode / cathode layer before or at the receiving point, the orientation and location of the stacking device can be precisely determined before or during the picking-up of the anode / cathode layer. This allows for a precisely determined and corrected picking-up of the anode / cathode layer by the stacking device. In one variant, during the conveying of the stacking device to the stacking point, a further check of the orientation and location of the lifted individual anode / cathode layer takes place, which further increases the precision of the placement of the individual anode / cathode layer on the electrode stack at the stacking point.

[0023] Another inspection procedure in the manufacture of modules or module precursors comprises, for example in the following sequence, the steps: providing a single anode / cathode layer; transporting the anode / cathode layer to a stacking point by means of a stacking device; unstacking the transported anode / cathode layer at the stacking point; capturing an electrode stack that has grown around the unstacking anode / cathode layer at the stacking point in at least one side view and / or a vertical view of the electrode stack at the stacking point; and checking the orientation and / or position of the or each unstacking anode / cathode layer relative to the rest of the electrode stack that has grown at the stacking point.

[0024] This procedure allows for precise determination of the position of the top layer relative to the other layers of the electrode stack. This check becomes increasingly important with increasing height of the electrode stack, as an incorrectly positioned placement of the top layer will, without further correction, lead to the rejection of the entire electrode stack. However, the inspection also becomes more accurate with increasing height of the electrode stack, as the geometric areas to be measured (corners or edges of the electrode stack) can be captured and evaluated more easily and precisely.

[0025] In one variation of the method, this also allows for the calculation of more precise correction values ​​when placing the next layer on the electrode stack. Overall, this approach, with its precise positional verification, significantly reduces the risk of short circuits, for example, in fuel cells or battery cells.

[0026] This is also evident from the fact that previous solutions only deposit the layers with an accuracy of ± 0.5 mm, while the solution presented here allows for an accuracy of ± 0.1 mm and more when depositing the anode / cathode layers on the electrode stack, thus reducing rejects and improving efficiency.

[0027] After the anode / cathode layers are placed on the electrode stack, the position / offset of the individual layers relative to each other is checked, and consequently, whether and with what deviation in the longitudinal or transverse direction the individual layers of the entire electrode stack are aligned with each other. In one variant, an offset of the individual layers relative to each other is detected by a (single) image acquisition from at least one third camera of at least one (vertical and / or transverse) edge of the electrode stack (as it has grown up to the current image acquisition). By analyzing the resulting image acquisition using image processing methods (corner / edge detection, etc.), it can be checked whether one or more layers of the electrode stack are higher or lower than the other layers in the longitudinal or transverse direction, and whether a pre-specified accuracy was maintained when stacking the anode / cathode layers relative to each other.The alternating stacked anode and cathode layers of the electrode stack have different dimensions, resulting in a stepped (vertical) edge in the side view, which must be processed accordingly (image-wise). It may be relevant to determine the deviation of each individual layer (laterally) above or below the other anode or cathode layers. It may also be relevant that the different anode / cathode layers always form steps of the same height within the entire electrode stack. The latter is evidence that the individual anode / cathode layers were stacked without folds or creases.

[0028] In one variant of the method, alternating stacked anode and cathode layers of the electrode stack, exhibiting different dimensions and a stepped (vertical) edge in the z-direction when viewed from the side, are examined for their shape and / or dimensions. In another variant, the deviation of each individual layer (laterally) above or below the other anode and cathode layers of the electrode stack is investigated. Finally, a further variant examines the deviation in the z-direction (vertical axis) by which the various anode / cathode layers form steps within the electrode stack.

[0029] According to the invention, two third matrix cameras are used, which (viewed from above) are directed at diagonally opposite corners / (vertical) edges of the electrode stack at the placement point. The cameras are adjusted to the respective edge of the electrode stack. In one variant of the method, (white) spotlights are used to illuminate the respective edge of the electrode stack, thus illuminating the desired position.

[0030] In one variant of the method, four third-axis matrix cameras are used, which (viewed from above) are directed at all four corners / edges of the electrode stack at the placement point. In another variant, backlighting or darkfield illumination is achieved using respective light sources. This allows the relevant areas of the different anode / cathode layers to be clearly visualized in transmitted light. In a further variant of the method, mirrors or prisms are used to guide the beam path of the third-axis cameras to adapt to spatial conditions.

[0031] In one variant of the method, a third matrix camera is used with a top-down view of the electrode stack, capturing the entire stack in a single image. Alternatively, two third matrix cameras are used, each capturing one of two diagonal corners of the electrode stack from above. Up to four third matrix cameras are used, capturing all four corners of the electrode stack from above, all directed at the electrode stack at the placement point. In one variant, the camera beam path is guided to adapt to spatial conditions using appropriate arrangements of mirrors or prisms. For illumination, one variant uses a coaxial (red) light source and a (white) point light source for each of the third cameras.

[0032] This makes it possible to see very precisely that the anode / cathode layers are always placed in the correct position on the electrode stack.

[0033] In one variant of the method, the movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies are also taken into account. This is achieved by capturing the x, y positions of the workpiece carrier at various z-heights with the third cameras before the anode / cathode layers are laid down to form the electrode stack. This allows the third cameras to verify during the laying process whether the anode / cathode layers have been stacked at the correct x, y position, corresponding to the respective z-position of the workpiece carrier on the lifting device. The accuracy in the direction of rotation around the vertical axis (in theta) when picking up the anode / cathode layers with the stacking device can also be corrected in this way for subsequent precise stacking of the anode / cathode layers of the electrode stack.

[0034] A device for conveying and inspecting modules or module precursors is equipped with a receiving station for providing a single anode / cathode layer; a stacking device designed and configured for transporting the anode / cathode layer to a stacking station; for unstacking the transported anode / cathode layer at the stacking station; a camera designed and configured for capturing an image of an electrode stack that has grown around the unstacking anode / cathode layer at the stacking station in at least one side view and / or including a vertical view in the z-direction of the electrode stack at the stacking station; and a control unit designed and configured to determine from the image of the second camera the orientation and / or position of each unstacking anode / cathode layer relative to the rest of the electrode stack that has grown at the stacking station.

[0035] In one variant of the device, the control unit is designed and configured to determine the position of a stacked anode / cathode layer relative to the other layers of the electrode stack by checking the position, rotation, or offset of each anode / cathode layer relative to the others after the anode / cathode layers have been placed on the electrode stack, and / or the control unit is designed and configured to determine an offset of each anode / cathode layer relative to the others by means of an image acquisition by at least one third camera of at least one (vertical and / or transverse) edge of the electrode stack.In one variant of the device, the control unit is designed and configured to check a received image capture by corner / edge search to determine whether one or more of the anode / cathode layers of the electrode stack are above or below the other anode / cathode layers, and / or whether an accuracy was maintained when stacking the anode / cathode layers.

[0036] In one variant of the device, the control unit is designed and configured to determine, from the image inlet, the dimensions of the alternately stacked anode and cathode layers of the electrode stack, which have different dimensions and a stepped (vertical) edge in the z-direction when viewed from the side, and to examine the shape and / or dimensions of the stacked anode and cathode layers. In another variant of the device, the control unit is designed and configured to examine the stacked anode and cathode layers to determine the deviation of each individual layer above or below the other anode and cathode layers of the electrode stack. In yet another variant of the device, the control unit is designed and configured to examine an image inlet to determine the deviation in the z-direction (vertical axis) of the steps formed by the various anode / cathode layers in the electrode stack.

[0037] In the device according to the invention, the control unit is designed and configured to receive image images from at least two third cameras, which contain diagonally opposite corners and / or their edges in the vertical axis (z-axis) of the electrode stack ES at the placement point, viewed from the side, in order to examine the stacked anode and cathode layers with what deviation in the x or y direction (transverse, longitudinal) each individual layer is above / below the other anode and / or cathode layers of the electrode stack in the longitudinal and / or transverse direction; and / or to examine with what deviation in the z-direction (vertical axis) the different anode / cathode layers form steps in the electrode stack.In one variant of the device, at least two third cameras are aligned to a (vertical) edge of the electrode stack, and / or (white) spotlights are used to illuminate the desired position on the electrode stack to illuminate the respective edge of the electrode stack.

[0038] In one variant of the device, the control unit is designed and configured to receive image feeds from at least four third cameras, which contain the four corners of the electrode stack seen from above at the placement point, in order to determine a position of the uppermost stacked anode / cathode layer in relation to at least one underlying layer of the electrode stack, by checking the position / rotation / offset of the individual anode / cathode layers relative to each other after the anode / cathode layers have been placed on the electrode stack, by means of an image feed from each of the four cameras.

[0039] In one variant of the device, the control unit is designed and configured to take into account movements of the lifting device with the respective workpiece carrier along the vertical axis (z-axis) and their inaccuracies. This is achieved by capturing the x, y positions of the workpiece carrier at various z-heights with the third cameras using image capture before the anode / cathode layers are deposited to form the electrode stack. The corresponding data is then stored in a data memory for comparison with the x, y positions of the workpiece carrier at different z-heights during the depositing of the anode / cathode layers. This allows verification that the anode / cathode layers have been stacked within the accuracy at the x, y position corresponding to the respective z-position of the workpiece carrier on the lifting device.and / or to correct the orientation in the direction of rotation around the z-axis (vertical axis) (in theta) when picking up the anode / cathode layers with the stacking device.

[0040] The procedures and devices described above allow for a significant reduction in the short-circuit risk of the module thus formed, which also leads to an increase in the overall quality and efficiency of the fuel or battery cell.

[0041] Overall, the device and method described above allow for an accuracy of ± 0.1 mm or more precise at high stacking throughput.

[0042] The above are procedural aspects in terms of devices and vice versa The following is shown. Both the procedural aspects and the device aspects serve to explain the arrangement and its operation. Brief description of the characters

[0043] Further features, properties, and advantages of the devices and procedures can be found in the following description in conjunction with the drawing. Possible modifications will become clear to a person skilled in the art from the following description, which refers to the accompanying drawings. The figures schematically show the devices discussed here and explain their operation. Specifically: Fig. 1 an assembly line with inspection during the manufacture of modules or module precursors in a schematic top view; Fig. 1a a second camera arrangement for inspecting the layers before they are picked up by the stacking device; Fig. 2 a process station of the assembly line designed as a stacking unit Fig. 1 in a schematic side view; Fig. 2aa first variant of a second camera arrangement for inspecting the layers during transport from the picking point to the stacking point using the stacking device; Fig. 2b a second variant of a second camera arrangement for inspecting the layers during transport from the picking point to the stacking point using the stacking device; Fig. 3 a variant of a third camera arrangement in a side view for inspecting the layers of an electrode stack after their destacking at the stacking point using the stacking device; and Fig. 3a the variant of the third camera arrangement from Fig. 3 in a top view. Detailed description of variants of the devices and procedures

[0044] Fig. 1Figure 1 schematically illustrates a section of an assembly line 100 for the production of modules or module precursors. Here, assembly line 100 is explained using the production of fuel cells or battery cells containing layer material and / or fluid as an example. A central transport line 110 conveys a large number of workpiece carriers 120 between several process stations. The central transport line 110 is equipped with drives (not shown) to convey the workpiece carriers 120 in groups within individual transport sections.

[0045] As feeder stations to assembly line 100, a first cutting or punching station (not shown) is set up to cut a first continuous layer material coming from a roll into uniform rectangular pieces and to discharge these pieces, as a sequence of individual anode layers AL, onto a carrier 82. A second cutting or punching station (not shown) is set up to cut a second continuous layer material coming from a roll into uniform rectangular pieces and to discharge these pieces, as a sequence of individual cathode layers KL, onto a carrier 92. A first depositing station 80 feeds the individual anode layers AL onto transportable adhesive trays 212 of a first transport line 210 in order to supply them to a stacking unit 138. A second storage station 90 feeds the individual cathode layers KL onto transportable adhesive trays 312 of a second transport line 310 in order to supply them to a stacking unit 138.During their transport to stacking unit 130, the anode and cathode layers AL and KL are passed through inspection stations 84 and 94, respectively, assigned to transport lines 210 and 310, to check their quality. In one variant, the cathode is a double-sided conductive-coated metal foil with a protruding current collector tab. In another variant, the anode is a double-sided conductive-coated metal foil laminated between two dielectric films (separators), with the current collector tab protruding laterally, i.e., on one of the short sides between the separators.

[0046] Such an assembly line 100 has a first transport section 116 with the receiving area 132, the stacking area 134, and the discharge area 136. In the stacking area 134, several, for example four, first lifting devices 135 are provided to lift workpiece carriers 120 from the carriage 140 in the Z-direction. The carriage 140 can be positioned in and against the direction of travel 112 along a first transport section 116. The carriage 140 is configured to position several empty workpiece carriers 120 in groups from the receiving area 132 to the stacking area 134 and / or several workpiece carriers, each carrying a stack created in the stacking area 134, from the stacking area 134 to the discharge area 136. Each lifting device 135 is configured to raise and lower the respective workpiece carrier 120 from the carriage 140 in a controlled manner for stacking.The carriage 140 has a length in the conveying direction (x-direction) of the workpiece carriers 120 that corresponds at least approximately to the extent of the receiving area 132 and the stacking area 134, or of the stacking area 134 and the discharge area 136 in the conveying direction of the workpiece carriers 120. The carriage 140 is longitudinally movable on two opposing linear guides and has 2xN receivers 142 on each longitudinal side for positioning N workpiece carriers 120. The lifting devices 135 extend between the linear guides and can thus lift the N workpiece carriers 120 in the z-direction while they remain in their respective x- and y-positions, and the carriage 140 is moved along the linear guides (in the x-direction). Similarly, a lifting device 150 is provided in the receiving area 132 and a lifting device is provided in the discharge area 136 for each of the N workpiece carriers 120.

[0047] In the receiving area 132, in the variant shown here, several workpiece carriers 120 – in this case, groups of four – are to be removed from the central transport track 110. In other variants, more or fewer than four workpiece carriers 120 are to be removed from the central transport track 110. For this purpose, the central transport track 110 has a lifting device 150 on the upstream side of the stacking unit 130 in receiving area 132. In one variant, this lifting device 150 can be part of the central transport track 110, here in the form of a scissor lift table. The lifting device 150 is configured to lift a group of four workpiece carriers 120 from the central transport track 110 in receiving area 132 and place them onto a carriage 140. In another variant, the carriage 140 can also be part of the central transport track 110.This carriage 140 at the stacking unit 130 is controlled in and against the conveying direction x of the workpiece carriers 120 by means of a drive not further illustrated in order to receive the group of workpiece carriers 120 in the receiving area 132, from the receiving area 132 to a stacking area 134, and from the stacking area 134 to a discharge area 136.

[0048] In the stacking area 134, individual anode layers AL and individual cathode layers KL are transported into the stacking area 134 by a number of stacking devices 138 (here four) corresponding to the number of workpiece carriers 120 in the group, from a first and second transport line 210, 310 located on both longitudinal sides of the central transport line 110, respectively, with vacuum or adhesive trays 212, 312, also called shuttles (see also Fig. 1In other words, each workpiece carrier 120 in the stacking area 134 is assigned two stacking devices 138. The arrangement of the stacking devices 138 is equipped with drives (not shown) to move each stacking device 138 individually vertically in the z-direction to raise and lower the individual anode and cathode layers KL. In the variant shown here, the transport sections 210, 310 are continuous transport sections and are configured to convey the vacuum or adhesive trays 212, 312 along a closed path in a horizontal conveying plane.

[0049] Further information below related to Fig. 2The illustrated drives 224 serve to move the stacking devices 138 individually horizontally in the y-direction, transversely to the central transport path 110, in order to transport the individual anode and cathode layers AL, KL from the trays of the first and second transport paths 210, 310 to the respective stacking position 133 on the workpiece carrier 120 in the stacking area 134. At the respective stacking positions 133 of the stacking unit 130, individual anode layers AL from one side of the workpiece carrier 120 and individual cathode layers KL from the other side of the workpiece carrier 120 are alternately brought to the respective workpiece carrier 120 from the central transport path 110 and stacked to form an electrode stack ES on the respective workpiece carrier 120. The assembly line 100 / the stacking unit 130 according to Fig. 1The stacking unit 130 includes, for example, 4 stacking positions 133. Furthermore, the stacking unit 130 has several first lifting devices 135 acting in the z-direction, one for each workpiece carrier 120, to lift the workpiece carriers 120 in the z-direction in a controlled manner from the slide 140 and thus separate them from the slide 140, and to lower these workpiece carriers 120 onto the slide 140 in a controlled manner in the z-direction. This allows the workpiece carriers 120 to be loaded with the layer material for forming the electrode stacks ES, while the slide 140 can be moved back and forth in the x-direction.

[0050] At each stacking point 133, a flat receptacle 137 with positioning pin 139 is provided, which receives an empty workpiece carrier 120 and holds it in position with precision (see Fig. 2 ).

[0051] In the Fig. 2A workpiece carrier 120 is shown in the stacking unit 130 on one of the first lifting devices 135. It has been lifted out of the carriage 140 (not shown) and is located at a stacking point 133. At this stacking point 133, the empty workpiece carrier 120 is filled as described below and then returned to the central transport line 110 for conveying to a subsequent process station. The first lifting device 135, as described above, serves to remove the at least one empty workpiece carrier 120 from the central transport line 110. At each stacking point 133, a stacking device 138 transports the individual anode layers AL (in Fig. 2 left) and a stacking device 138 the individual cathode layers KL (in Fig. 2(right) alternately approach the workpiece carrier 120 from both sides in and against the y-direction and stack the electrodes in the z-direction onto the workpiece carrier 120. In this way, the electrode stack ES grows to the desired number of layers. In one variant, the workpiece carrier 120 is lowered in the z-direction by the height / thickness of one anode layer AL or cathode layer after each anode layer AL or cathode layer.

[0052] Each of the stacking devices 138 is designed and configured to either pick up the individual anode layers AL / the individual cathode layers KL by means of controlled pneumatic vacuum and hold them above the workpiece carrier 120 during transport to the stacking point 133. Each stacking device 138 has a flat gripping tool that is pressurized with vacuum to hold and transport an anode / cathode layer AL, KL. In one variant, it is also provided that the individual anode layers AL and the individual cathode layers KL are released at the stacking point 133 by means of a short, controlled pneumatic overpressure pulse in order to stack the layers AL, KL on the workpiece carrier 120.

[0053] The device described here serves not only to convey the layers AL and KL, but also to inspect the layers AL and KL on their way from their respective transport routes 210 and 310 to the corresponding stacking station 133. For this purpose, receiving stations 221 and 321 are provided in the stacking area 134, to which the individual anode / cathode layers AL and KL are transported by means of vacuum-assisted or adhesive trays 212 and 312. Before the adhesive trays 212 and 312 with the anode / cathode layers arrive at the corresponding stacking station 133, the anode / cathode layers AL and KL are detected by means of a second camera 220. This second camera 220 serves to detect the position and / or orientation, here in x, y and theta, of the anode / cathode layer on its adhesive tray 212, 312 before the anode / cathode layers AL, KL are picked up from their adhesive tray 212, 312 by the stacking device 138. An inspection of an anode layer AL or KLInspection of a cathode layer KL with the second camera 220 can be carried out while the vacuum or adhesive tray 212, 312 transporting the anode / cathode layer AL, KL to be inspected is moved along the closed path of the transport track 210, 310.

[0054] Alternatively, an inspection of an anode layer AL or a cathode layer KL can be carried out with the second camera 220 while the vacuum or adhesive tray 212, 312 transporting the anode / cathode layer AL, KL to be inspected is stationary (briefly, a few milliseconds) and other vacuum or adhesive trays 212, 312 moving along the closed path of the transport route 210, 310, for example, one moving directly along the closed path before and / or after the vacuum or adhesive tray 212, 312 that is stationary (briefly) for inspection with the second camera 220, is moved along the closed path of the transport route 210, 310.

[0055] The second camera 220 is oriented such that, in a perpendicular top view from the anode / cathode layer, it can capture an image of its position and / or orientation (in x, y, and / or theta) during transport, shortly before the respective anode / cathode layer AL, KL arrives at its receiving point 221, 321. Fig. 2 Two of the first cameras 220 are illustrated for the anode layers AL and for the cathode layers KL. It should be understood that a second camera 220 can also be provided in front of each recording position 221, 321, or only in front of the first recording position 221, 321. A white light source 225 is provided for each first camera 220 (see Fig. 1a ), to illuminate the anode / cathode position for image acquisition by camera 220. Depending on the spatial conditions, the second camera 220 - as also in Fig. 1aIllustrated – the first camera is designed as a full-frame camera to completely capture the anode / cathode layer AL, KL with a single image acquisition, or the second camera is designed as a line scan camera to capture the position and / or orientation in x, y, and / or theta of the anode / cathode layer while it is being transported to the corresponding acquisition point 221, 321. The full-frame camera can, for example, have a 24-megapixel digital image acquisition chip 220a. Depending on the accuracy and resolution requirements and the spatial conditions, the second camera 220 can also – with appropriate optics, for example, a lens 226 and a 90° deflecting mirror 227 that is semi-transparent for white light – provide a full-frame image of the anode / cathode layer from above.

[0056] Each stacking device 138 is assigned a conveying device 224 for the back-and-forth conveying of the stacking device 138 between the respective receiving point 221, 321 and the stacking point 133. Thus, with a number of stacking devices 138 corresponding to the number of workpiece carriers 120 in the group (here four), individual anode layers AL and individual cathode layers KL are transported from a first and second transport line 210, 310 located on both longitudinal sides of the central transport line 110, using vacuum or adhesive trays 212, 312, also called shuttles, into the stacking area 134 (see also Fig. 1In other words, each workpiece carrier 120 in the stacking area 134 is assigned two stacking devices 138. The arrangement of the stacking devices 138 is equipped with respective actuators 138a to move the stacking devices 138 individually vertically in the z-direction to raise and lower the individual anode and cathode layers KL. Further actuators 224 serve to move the stacking devices 138 individually horizontally in the y-direction, perpendicular to the central transport track 110, in order to transport the individual anode and cathode layers AL, KL from the trays 211, 311 of the first and second transport tracks 210, 310 to the respective stacking position 133.

[0057] Each pair of stacking devices 138 is served by a shared horizontal linear guide and is arranged above a workpiece carrier positioned in the stacking area 134. The linear guide extends from a receiving point on the transport line 210 to a receiving point on the transport line 310 and spans the stacking area 134.

[0058] Sensors 230 serve as a detection device for recording the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138. These sensors 230, of which only the position of the stacking device 138 in the y-direction is illustrated here for clarity, supply corresponding data to a control unit ECU.

[0059] On its way from the pickup point 221, 321 to the stacking point 133, each stacking device 138 passes a first camera 260. This first camera 260 serves to detect the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer AL, KL adhering to the underside of the stacking device 138 relative to the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138 as it moves to the stacking point 133. This data is fed to the control unit ECU and processed there to control corresponding actuators, for example, the actuators 138a, 224, etc.These positioning devices also include pneumatic actuators (not illustrated in further detail) so that the stacking device 138 can pick up and place the anode / cathode layers AL, KL, and electrical or pneumatic actuators to align the stacking device 138 in x, y, z, and / or theta during the transport of the anode / cathode layer to the stacking point 133, so that the anode / cathode layer AL, KL is optimally positioned relative to the stacking point 133 and the electrode stack located there for unstacking, and for unstacking the anode / cathode layer at the stacking point 133.

[0060] The first camera 260 serves here to determine the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode position AL, KL relative to the stacking device 138 in front of the

[0061] The stacking of the anode / cathode layer AL, KL at stacking point 133 is recorded. This data is sent to the control unit ECU and processed there. The control unit ECU determines correction values ​​from the image acquisition and the data from the various acquisition devices. In particular, the correction values ​​are determined from the position and / or orientation (in x, y, z, and / or theta) of the anode / cathode layer AL, KL at the receiving point or on the way there before its receipt by a stacking device 138, the position and / or orientation (in x, y, z, and / or theta) of the stacking device 138 at the receiving point or on the way there, as well as the position and / or orientation (in x, y, z, and / or theta) of the received individual anode / cathode layer relative to the stacking device 138 during transport of the anode / cathode layer to the stacking point 133.These correction values ​​serve to align the stacking device 138 with the transported anode / cathode layer relative to the stacking point 133 in x, y, z, and / or theta, so that the transported anode / cathode layer is precisely placed at its target position relative to the electrode stack ES located at the stacking point 133. That is, these correction values ​​are converted into positioning commands for the positioning device, the conveying device 224, and / or the stacking device 138 during the correction of the alignment and position (in x, y, z, and / or theta) when picking up the anode / cathode layer, such that the anode / cathode layer is picked up by the stacking device 138, for example, in a central zero position or aligned with the electrode stack located at the stacking point 133.

[0062] The first camera 260 is aligned such that, during the transport of the anode / cathode layer, its position and / or orientation (in x, y, and / or theta) is captured in a vertical view from below using an image feed, shortly before the respective anode / cathode layer AL, KL arrives at its stacking position 133. In the Fig. 2 One of the second cameras 260 is illustrated for the anode layers AL and one for the cathode layers KL. Each second camera 260 is equipped with a light source 275, for example a white light source, to illuminate the anode / cathode layer for image acquisition by the first camera 260. Depending on the spatial conditions, the second camera 220 – as also shown in Fig. 1aIllustrated – the first camera 260 is designed as a full-frame camera to completely capture the anode / cathode layer AL, KL with a single image feed, or it is designed as a line scan camera to capture the position and / or orientation in x, y, and / or theta of the anode / cathode layer while it is being transported to the corresponding stacking location 133. The full-frame camera can, for example, have a 24-megapixel digital image acquisition chip 260a. Depending on the accuracy and resolution requirements and spatial conditions, the first camera 260 can also – with appropriate optics, for example, a lens 276 and a 90° deflecting mirror 277 that is semi-transparent to white light – provide a full-frame image feed from below onto the anode / cathode layer. The light source 275 can also be arranged in a swiveling position to provide optimal light incidence on the respective anode / cathode position AL, KL.For example, the first camera 260 can provide a field of view of the anode / cathode layer AL, KL of at least 720 x 400 mm at a resolution of 134 µm / pixel or higher.

[0063] In the beam path of the second camera 260, i.e., in the area of ​​the vertical section of the beam path, a ring light source is arranged. Light (approx. 600–780 nm) from the ring light source strikes the underside of the anode or cathode at a shallow angle, i.e., less than 45 degrees, to enhance the contrast of surface defects.

[0064] In Fig. 2a A variant of the arrangement of the second camera 260 is shown. Here, the first camera 260 is also aligned such that, during the transport of the anode / cathode layer, its position and / or orientation (in x, y, and / or theta) is captured in a vertical view from below with an image feed, shortly before the respective anode / cathode layer AL, KL arrives at its stacking position 133.

[0065] In contrast to the arrangement in Fig. 2 The white light source 275 is positioned between the horizontal section of the optical path of the camera 260 and the stacking device 138. For this purpose, a further semi-transparent 90° deflecting mirror 277a is provided between the camera 260 and the semi-transparent 90° deflecting mirror 277 to direct the white light into the beam path onto the underside of the stacking device 138, which contains the anode / cathode layer for image acquisition by the first camera 260. Otherwise, the arrangement of the camera corresponds to... Fig. 2a the one from the Fig. 2 .

[0066] Instead of a full-frame scan using a single camera, only selected areas, here corner / edge areas of the anode / cathode layer AL, KL, can be captured in a vertical view from below during their transport to their position and / or orientation (in x, y, and / or theta), shortly before the respective anode / cathode layer AL, KL arrives at its stacking position 133. For this purpose, as described in Fig. 2b As shown, two second cameras 260 capture the corner regions of the anode / cathode layer AL, KL vertically from below as the anode / cathode layer AL, KL is transported over it. In particular, an image is captured at each corner of layer KL, which adheres to the stacking device 138 by means of negative pressure, during transport ("on the fly"), i.e., while the anode / cathode layer AL, KL, held on the stacking device, is continuously moved to the stacking location 133.

[0067] In front of each stacking station are (on one side) one or two cameras 260 for the anode layer AL and (on the other side) one or two cameras 260 for the cathode layer KL. For clarity, only one camera 260 is shown in each figure. As the anode / cathode layers Al and KL, held by the stacking device, move past the cameras 260, an image of one corner at the front edge of layer AL or KL is first captured, or two images of the corners at the front edge of layer AL or KL are initially captured. Subsequently, an image of one (preferably diagonal) corner at the rear edge of layer AL or KL is captured, or the two other corners at the rear edge of layer AL or KL are captured with the two cameras 260. Any deviations between the positions of the corners on the front edge and the corners on the rear edge perpendicular to the transport direction of the respective position AL orKL determines the control unit ECU correction values ​​(in x, y, and / or theta) for the movement and orientation of the stacking device 138 relative to the location / corners of the electrode stack ES, so that the anode / cathode position AL, KL can be placed very quickly perpendicularly onto the electrode stack ES when reaching the stacking point 133 with minimal (ideally no) further correction required.

[0068] In one variant of the stacking devices 138, the holding surface of the gripping tool for picking up and holding an anode / cathode layer AL, KL can be smaller than the surface area of ​​the anode / cathode layer AL, KL itself. For example, the (four) corner areas of the gripping tool can be recessed. Consequently, during transport, the corner areas of an anode / cathode layer AL, KL can be illuminated from above, i.e., from the side, by the light source 275, which is positioned against the gripping tool. This allows the edges of the cathode layer KL to be detected with particularly high contrast against their surroundings.

[0069] In the Fig. 2bThe arrangement of each of the first cameras comprises a matrix camera 260 with a red coaxial ring illumination 266 and / or a blue dark-field illumination 268. The dark-field illumination provides light at a shallow angle (here at 45° to the optical axis), so that, for example, the edge areas reflect or scatter light towards the camera and then appear clearly contrasted and bright in the camera image.

[0070] With such an arrangement, it is possible to capture a square area of ​​approximately 21 x 21 mm at a resolution of 10.8 µm / pixel or better.

[0071] Due to the presence of several adjacent stacking units 130, the inspection of the anode / cathode layers AL, KL can be parallelized.

[0072] It may be provided that several anodes for a first group of non-adjacent electrode stacks or workpiece carriers 120 in the stack area 134, e.g., the first workpiece carrier and the third workpiece carrier, are inspected with the respective second camera 260 in a temporally overlapping manner and / or several cathodes for a second group of non-adjacent electrode stacks or workpiece carriers 120 in the stack area, different from the first, e.g., workpiece carriers 2 and 4, are inspected with the respective second camera 260 in a temporally overlapping manner.

[0073] Since directly adjacent stacking devices 138 move towards each other, i.e., perform opposite movements in the Y direction, vibrations can be balanced and efficient inspection can be achieved.

[0074] Alternatively, it can be provided that the anode layers and the cathode layers are supplied in groups at the multiple receiving points of the respective transport route 210, 310 by the vacuum or adhesive tray 212, 312.

[0075] In another variant, the camera 260 performs group inspections of the anode and cathode layers. In a variant not shown, a different resolution and field of view are possible, using four cameras 260 to inspect all four corners simultaneously, or a line scan camera.

[0076] All of the inspection variants described above serve to determine the exact position of the anode / cathode layer AL, KL at least once, and then to correct the orientation before placement. By optically detecting the position and orientation of characteristic areas (corners, edges) of layers AL, KL at the receiving point and / or during transport to the stacking point 133, and using the data thus obtained to correct the orientation of the stacking device 138 relative to the electrode stack ES at the stacking point 133 before and / or during transport of layers AL, KL to the stacking point 133, this placement is possible in a time-efficient and highly precise manner.

[0077] Based on the Fig. 2 and 3A further inspection method for use in the manufacture of modules or module precursors is described below. In a first step, a single anode / cathode layer AL, KL is placed on a vacuum or adhesive tray 212, 312. The single anode / cathode layer AL, KL is then transported by a stacking device 138 to a stacking station 133. There, the transported anode / cathode layer AL, KL is unstacked. At the stacking station 133, an electrode stack ES, which has grown to include the unstacked anode / cathode layer AL, KL at the stacking station 133, is detected in at least one side view and / or including one vertical edge of the electrode stack ES. In one variant of the method, this detection of the side view or one vertical edge of the electrode stack ES provides an image capture.Finally, the alignment and / or position of each stacked anode / cathode layer AL, KL relative to the rest of the electrode stack that has grown at the stacking point is checked.

[0078] The position of a stacked anode / cathode layer AL, KL relative to the other layers of the electrode stack ES is determined, for example, by checking the position, rotation, or offset of each individual anode / cathode layer AL, KL relative to the others after the anode / cathode layers AL, KL have been placed on the electrode stack ES. An offset of the individual anode / cathode layers (AL, KL) relative to each other can be determined, for example, by capturing an image from at least one (vertical and / or transverse) edge of the electrode stack ES using at least one third camera 320.For example, a captured image can be checked using computer-aided image processing methods by edge detection to determine whether one or more of the anode / cathode layers AL, KL of the electrode stack ES are laterally or longitudinally higher or lower than the other anode / cathode layers AL, KL, and / or whether a predefined accuracy was maintained when stacking the anode / cathode layers AL, KL. One variant of the edge detection method uses a Canny edge detector algorithm, which ideally produces an image containing only the edges of the original image.

[0079] The alternating anode layers AL and cathode layers KL of the electrode stack ES typically have different dimensions. This results in a stepped (vertical) edge in the z-direction when viewed from the side. This vertical edge, or the two vertical edges k1 and k2, are determined using the captured image indentations (see figure). Fig. 3 The stacked anode layers AL and cathode layers KL are examined for their shape and / or dimensions. In other variations, the stacked anode layers AL and cathode layers KL are examined to determine the deviation of each individual layer laterally or longitudinally above or below the other anode or cathode layers AL and KL of the electrode stack ES. These overhangs / underhangs (u1, u2 in) are then used to determine... Fig. 3 It is also possible to determine a rotation about the vertical axis (in theta), or with what deviation in the z-direction (vertical axis) the different anode / cathode positions (AL, KL) stages (s1, s2) are located. Fig. 3 ) in the electrode stack.

[0080] In Fig. 3, 3a is illustrated how two third cameras 320 from the side point at diagonally opposite corners e1, e2 and / or their edges k1, k2 when viewed from above (see Fig. 3) in the vertical axis (z-axis) of the electrode stack ES at the deposition point. In this way, the deviation u1, u2 (see) of the stacked anode layers (AL) and cathode layers KL is examined. Fig. 3 ) in the x or y direction (transverse, longitudinal) relative to the other anode and / or cathode layers AL, KL of the electrode stack ES, each individual layer is higher or lower in the longitudinal and / or transverse direction of the layers. This results in a deviation s1, s2 of the steps (see Fig. 3 ) in the z-direction (vertical axis) to investigate which the superimposed anode / cathode layers AL, KL form in the electrode stack.

[0081] The two third cameras 320 are directly aligned with a vertical edge of the electrode stack. Furthermore, a white spot light 330 can be used to illuminate the respective edge of the electrode stack ES at an angle of approximately 45° to the optical axis of the respective third camera 320, thus illuminating the desired position.

[0082] In a Fig. 3aIn the variant shown with dashed lines, four third cameras 320' are positioned vertically from above, with point source lights 330 (not shown), directed at the four corners e1, e2, e3, e4 of the electrode stack at the placement point, as seen from above. This allows the position of the uppermost stacked anode / cathode layer AL, KL to be determined relative to at least one underlying layer of the electrode stack ES. Using an image acquisition system from each of the four cameras 320', the position, rotation, or offset of each individual anode / cathode layer AL, KL relative to the others is checked after the anode / cathode layers AL, KL have been placed on the electrode stack ES.

[0083] With the cameras 320 directed laterally towards the vertical edge of the electrode stack ES (see Fig. 3The movements of the lifting device 135 with the respective workpiece carrier 120 along the vertical axis (z-axis) are to be determined by appropriate processing of the image acquisitions. Before the anode / cathode layers Al, KL are deposited to form the electrode stack ES, the x, y positions of the workpiece carrier at various z-heights are recorded by the third cameras 320 from the resulting image acquisitions. The corresponding data are stored for comparison with the x, y positions of the workpiece carrier at different z-heights during the depositing of the anode / cathode layers, in order to verify whether the anode / cathode layers have been stacked within a predefined accuracy at the x, y position corresponding to the respective z-position of the workpiece carrier on the lifting device 135.In one variant, the data obtained above are used to correct the orientation in the direction of rotation around the z-axis (vertical axis) (in theta) when picking up the anode / cathode layers with the stacking device 138.

[0084] In one variant, the processed data from the image acquisitions from the cameras, in particular at least one of the third cameras, also provides to use the stacking device 138 to pick up an incorrectly deposited layer from the electrode stack ES again and optionally place it correctly back onto the electrode stack, or to transport it to a position where it is discarded.

Claims

1. An inspection process in the manufacture of modules or precursors of modules comprises the steps: - providing a singled anode or cathode layer (AL, KL); - transporting the anode or cathode layer (AL, KL) in an x-direction to a stacking location (133) by a stacking apparatus (138), wherein the x-direction runs transversely to a y-direction; - stacking the transported anode or cathode layer (AL, KL) in a z-direction at the stacking point (133), the z-direction being transverse to the x-direction and transverse to the y-direction; - detecting an edge (k1, k2) in the z-direction of an electrode stack (ES) grown around the stacked anode or cathode layer (AL, KL) at the stacking location (133) with an image feed of a third camera (320); and - checking the alignment of the stacked anode or cathode layer (AL, KL) relative to the rest of the electrode stack (ES) grown at the stacking point (133); wherein the inspection method is characterised in that at least two third cameras (320) are directed from the side onto diagonally opposite edges (k1, k2) in the z-direction of the electrode stack (ES) at the deposit location, as viewed from above, in order to examine on the stacked anode layers (AL) and cathode layers (KL) with what deviation (u1, u2) in the x- or y-direction relative to the rest of the anode or cathode layers (AL, KL) of the electrode stack (ES) each individual layer projects above or below in the longitudinal or transverse direction of the layers, or to examine with what deviation in the z-direction the cathode layers (AL, KL) of the electrode stack (ES) in the longitudinal or transverse direction of the layers, or to investigate the deviation in the z-direction with which the various anode or cathode layers (AL, KL) form steps in the electrode stack.

2. The inspection method according to claim 1, in which - a position of a stacked anode or cathode layer (AL, KL) is determined in relation to the other layers of the electrode stack (ES) by checking an offset of the individual anode or cathode layers (AL, KL) relative to one another after the anodes or cathode layers (AL, KL) have been placed on the electrode stack (ES), and / or wherein - an offset of the individual anodes or cathode layers (AL, KL) of the electrode stack (ES) relative to one another is determined with the image capture of the third camera from at least one edge of the electrode stack (ES), and / or wherein - the image indentation is checked by corner or edge search to determine whether one or more of the anode or cathode layers (AL, KL) of the electrode stack (ES) are above or below the other anode or cathode layers (AL, KL).

3. The inspection method according to claim 1 or 2, in which - alternately stacked anode layers (AL) and cathode layers (KL) of the electrode stack (ES) have different dimensions with an edge stepped in the z-direction in the side view, wherein the stacked anode layers (AL) and cathode layers (KL) are inspected for their shape or dimensions; and / or wherein - the anode layers (AL) and cathode layers (KL) stacked on top of one another are analysed to determine the deviation with which each individual layer is above or below the other of the anode or cathode layers (AL, KL) of the electrode stack (ES); and / or wherein - the deviation in the z-direction with which the different anode or cathode layers (AL, KL) form steps in the electrode stack is analysed.

4. The inspection method according to claim 1, in which - spotlights (330) can be used to illuminate the respective edge of the electrode stack in order to illuminate the desired position.

5. The inspection method according to one of the preceding claims, in which - four third cameras are directed at the four corners of the electrode stack at the deposit location, as seen from above, in order to determine a position of the uppermost stacked anode or cathode layer (AL, KL) in relation to at least one layer of the electrode stack (ES) lying below it, by checking the position of each of the anode / cathode layers (AL, KL) relative to each other by means of an image feed from each of the four cameras after the anode or cathode layers (AL, KL) have been deposited on the electrode stack (ES).

6. The inspection method according to any one of claims 2 to 5, further comprising - movements of a lifting apparatus (135) with a respective workpiece carrier (120) along the z-direction and their inaccuracies are taken into account by detecting x-, y-positions of the workpiece carrier at different z-heights with the third cameras (320) before the deposition of the anode or cathode layers (Al, KL) to form the electrode stack (ES) starts, and the corresponding data are stored for comparison with x-, y-positions of the workpiece carrier at different z-heights during the depositing of the anode or cathode layers in order to check whether the anode or cathode layers have been stacked within the accuracy at the x-, y- position corresponding to the respective z-position of the workpiece carrier on the lifting apparatus, and / or for correcting the orientation in the direction of rotation about a z-axis when picking up the anode or cathode layers with the stacking apparatus.

7. The inspection method according to any of the preceding claims, wherein a plurality of singled anode layers (AL) and a plurality of singled cathode layers (KL) corresponding to the number of stacking units (130) in the stacking area (134) are provided in groups at pick-up locations (221, 321).

8. An apparatus for conveying and inspecting modules or precursors of modules with - a pick-up point (221, 321) for providing a single anode or cathode layer (AL, KL); - a stacking apparatus (138), intended and arranged for -- transporting the anode or cathode layer (AL, KL) in an x-direction to a stacking location (133), wherein the x-direction is transverse to a y-direction, and -- stacking the transported anode or cathode layer (AL, KL) in a z-direction at the stacking point (133), wherein the z-direction runs transverse to the x-direction and transverse to the y-direction; - at least two third cameras (320), intended and arranged for capturing an image indentation of an edge (k1, k2) in the z direction of an electrode stack (ES) grown around the stacked anode or cathode layer (AL, KL) at the stacking location (133); and - a control unit (ECU) which is intended and arranged to determine the orientation of the stacked anode or cathode layer (AL, KL) relative to the remaining electrode stack (ES) grown at the stacking location (133) from the image capture of the third camera; wherein the apparatus is characterised in that the control unit (ECU) is intended and arranged to receive from the at least two third cameras (320) image captures which contain diagonally opposite edges (k1, k2) in the z-direction of the electrode stack (ES) at the deposit location, as seen from above, in order to examine the anode layers (AL) and cathode layers (KL) stacked on top of one another, with what deviation (u1, u2) in the x- or y-direction relative to the other anode or cathode layers (AL, KL) of the electrode stack (ES) each individual layer is above or below in the longitudinal and transverse direction of the layers, or to investigate with what deviation in the z-direction the various anode or cathode layers (AL, KL) form steps in the electrode stack.

9. The apparatus according to claim 10, wherein - the control unit (ECU) is intended and arranged to determine a position of a stacked anode or cathode layer (AL, KL) in relation to the other layers of the electrode stack (ES) by checking an offset of the individual anode or cathode layers (AL, KL) with respect to one another after the anode or cathode layers (AL, KL) have been deposited on the electrode stack (ES); and / or wherein - the control unit (ECU) is intended and arranged to determine an offset of the individual anode or cathode layers (AL, KL) relative to one another with the image capture of the third camera from at least one edge of the electrode stack (ES); and / or wherein - the control unit (ECU) is intended and arranged to check the image indentation obtained by corner or edge search to determine whether one or more of the anode or cathode layers (AL, KL) of the electrode stack (ES) protrude or are inferior to the other anode or cathode layers (AL, KL).

10. The apparatus according to claim 8 or 9, wherein - the control unit (ECU) is intended and arranged to determine different dimensions with an edge stepped in the z-direction in the side view from the image indentation in alternation of anode layers (AL) and cathode layers (KL) stacked on top of one another of the electrode stack (ES), and to examine the shape or dimensions of the anode layers (AL) and cathode layers (KL) stacked on top of one another; and / or wherein - the control unit (ECU) is intended and arranged to examine the stacked anode layers (AL) and cathode layers (KL) to determine the deviation from the remaining anode or cathode layers (AL, KL) of the electrode stack (ES) with which each individual layer is above or below; and / or - the control unit (ECU) is intended and arranged to analyse the image feed to determine the deviation in the z-direction with which the various anode or cathode layers (AL, KL) form steps in the electrode stack.

11. The apparatus according to any one of the preceding apparatus claims, wherein - to illuminate the respective edge of the electrode stack, spotlights (330) illuminate the desired position on the electrode stack (ES).

12. The apparatus according to one of the preceding apparatus claims, wherein - the control unit (ECU) is intended and arranged to receive image feeds from at least four third cameras (320), which contain the four corners of the electrode stack at the deposit location, as viewed from above, in order to determine a position of the uppermost stacked anode or cathode layer (AL, KL) in relation to at least one underlying layer of the electrode stack (ES) by checking an offset of the individual anode / cathode layers (AL, KL) relative to one another after the anode or cathode layers (AL, KL) have been deposited on the electrode stack (ES), by means of an image capture from each of the four cameras.

13. The apparatus according to one of the preceding apparatus claims, wherein - the control unit (ECU) is intended and arranged to take into account movements of a lifting apparatus (135) with a respective workpiece carrier (120) along the z-direction and inaccuracies thereof, in that before the start of depositing the anode or cathode layers (Al, KL) for forming the electrode stack (ES), the x-, y- positions of the workpiece carrier at different z-heights are detected with the third cameras (320) by means of image feeds, the corresponding data are stored in a data memory for comparison with x-, y- positions of the workpiece carrier at different z-heights during the depositing of the anode or cathode layers in order to check whether the anode or cathode layers have been stacked within the accuracy at the x-, y- position which corresponds to the respective z-position of the workpiece carrier on the lifting apparatus, and / or for correcting the orientation in the direction of rotation about a z-axis when picking up the anode / cathode layers with the stacking apparatus.

14. The apparatus according to any one of the preceding apparatus claims, wherein - in each case a transport section (210, 310) with vacuum or adhesive trays (212, 312) is intended and arranged to provide a plurality of individual anode layers (AL) and a plurality of individual cathode layers (KL) corresponding to the number of stacking units (130) in the stacking area (134) at pick-up points (221, 321) in groups.