Method and device for calibrating a manufacturing apparatus, and system

EP4758006A1Pending Publication Date: 2026-06-17NIKON SLM SOLUTIONS AG

Patent Information

Authority / Receiving Office
EP · EP
Patent Type
Applications
Current Assignee / Owner
NIKON SLM SOLUTIONS AG
Filing Date
2024-08-08
Publication Date
2026-06-17

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Abstract

The invention relates to a method for calibrating a manufacturing apparatus. The manufacturing apparatus is configured for the additive manufacture of three-dimensional workpieces by layer-by-layer solidification of raw material by means of location-selective irradiation. The method comprises using a multiplicity of measurement results of optical measurements carried out with a time offset to estimate at least one property of an irradiation point or / and irradiation pattern to be provided, with each measurement result specifying at least one property of an irradiation point or / and irradiation pattern at the respective measurement time. The method also comprises a calibration of the manufacturing apparatus on the basis of the estimated at least one property. The invention also relates to a device and a system.
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