Test method for input module, test method for output module, output module for testing, input module for testing, test system for input module, and test system for output module
By synchronizing communication cycles within a test system, the method addresses the limitations of conventional testing by enabling real-time, automated evaluation of input and output modules in plant control systems, enhancing efficiency and adaptability.
Patent Information
- Application Number
- JP2023149969
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- Filing Date
- 2023-09-15
- Publication Date
- 2025-03-28
AI Technical Summary
Conventional methods for testing input and output modules in plant control systems are not capable of real-time monitoring, leading to asynchronous communication cycles and manual evaluation by operators, which hinders automated and synchronized testing.
The proposed method involves a test system that synchronizes communication cycles between a test PC, signal generators, input/output modules, and control devices, allowing for real-time evaluation of input and output modules through automated comparison of test signals and results.
This approach enables real-time, automatic testing of control system modules, improving efficiency and reducing the need for manual intervention, while also allowing for standardized testing across different plant and control system configurations.
Smart Images

Figure 2025042819000001_ABST
Abstract
Description
[Technical field]
[0001] The present disclosure relates to a method for testing an input module, a method for testing an output module, an output module for testing, an input module for testing, a test system for an input module, and a test system for an output module. [Background technology]
[0002] The plant control system includes a control device, an input / output module, and a host device. The control device calculates and outputs control signals for controlling each device of the plant based on status signals indicating the state of the plant and control logic and command values specified by the host device. The input / output module includes an input module that converts analog signals indicating the state of the plant acquired from each device of the plant into digital signals and inputs them to the control device, and an output module that converts control signals calculated by the control device into analog signals and outputs them to each device of the plant. The host device includes, for example, a control PC that allows an operator (such as a plant manager) to change the control logic, and an operation PC that acquires status signals and control signals input and output to the control device and allows the operator to monitor the plant and change command values.
[0003] In order for a control device to control a plant with high accuracy, it is necessary for input / output modules to operate properly. For example, Patent Document 1 describes that tests are performed before shipment of an input module or at any time after shipment, and the setting values and gains of the input module are adjusted. [Prior art documents] [Patent documents]
[0004] [Patent Document 1] JP 2010-20603 A Summary of the Invention [Problem to be solved by the invention]
[0005] In conventional methods, for example, when testing an input module is automated, the operation PC uses an RPA (Robotic Process Automation) tool that stores the operation contents of an operator to output a test signal to the input module based on the operation contents stored in advance by the operator. The input module then outputs the test signal to the control device. The operation PC also acquires the signal output by the input module to the control device from the control device and displays it. The operator compares the test signal output to the input module with the signal output by the input module to the control device (test result) to evaluate whether the input module is operating properly.
[0006] Signals are sent and received between the input module and the control device in a very short cycle, for example, in units of X microseconds to X milliseconds. On the other hand, signals are sent and received between the operation PC and the control device in a longer cycle, such as every second. In other words, in the conventional test method using the operation PC, it is not possible to monitor the signal output by the input module to the control device in real time, that is, in synchronization with the communication cycle between the input module and the control device. In that case, the communication cycle of the test signal between the input module and the control device and the cycle in which the operation PC obtains the test signal (test result) from the control device do not match, so it is difficult for the operation PC to automatically associate the test signal with the test result, compare them, and evaluate them. For this reason, in the conventional method, it was necessary for an operator to visually check and evaluate the test signal and the test result.
[0007] In addition, the operation screen (GUI, etc.) of the operation PC may differ for each plant or control system. This makes it difficult to apply the conventional method of automating tests using RPA tools to different plants and control systems.
[0008] An object of the present disclosure is to provide an input module testing method, an output module testing method, an output module for testing, an input module for testing, an input module testing system, and an output module testing system that can automatically test a control system in real time. [Means for solving the problem]
[0009] According to one aspect of the present disclosure, a method for testing an input module is a method for testing an input module of a control system including a control device that controls a control object and an input module that outputs a signal of the control object to the control device, the method including the steps of: a test PC outputting a test signal to a signal generator; the signal generator outputting an analog input signal corresponding to the test signal output from the test PC to the input module; the input module outputting a status signal obtained by converting the analog input signal output from the signal generator into a digital signal to the control device; the control device outputting the status signal output from the input module as a control signal to a test output module connected to the control device; the test output module outputting the control signal output from the control device to the test PC; and the test PC comparing the control signal output from the test output module with the test signal to evaluate the soundness of the input module.
[0010] According to one aspect of the present disclosure, a method for testing an output module is a method for testing an output module of a control system including a control device that controls a control object and an output module that outputs a signal of the control device to the control object, the method including the steps of: a test PC outputting a test signal to a test input module connected to the control device; the test input module outputting the test signal to the control device; the control device outputting the test signal output from the test input module as a control signal to the output module; the output module converting the control signal output from the control device into an analog signal and outputting an analog output signal to a measuring instrument connected to the output module; the measuring instrument measuring the analog output signal output from the output module and outputting the measurement value of the analog output signal to the test PC; and the test PC comparing the measurement value of the analog output signal output from the measuring instrument with the test signal to evaluate the health of the output module.
[0011] According to one aspect of the present disclosure, a test output module is a test output module that is connected to a control device when testing an input module that outputs a signal to be controlled to the control device, and includes an upper communication unit that acquires from the control device a status signal that is a digital signal converted from an analog input signal input by the input module for testing, the status signal that the input module outputs to the control device, and a serial communication unit that transmits the acquired status signal to a test PC as a test result of the input module.
[0012] According to one aspect of the present disclosure, the test input module is a test input module that is connected to a control device when testing an output module that outputs a signal from the control device to a controlled object, and includes a serial communication unit that acquires a test signal and an upper communication unit that transmits the test signal to the control device.
[0013] According to one aspect of the present disclosure, a test system for an input module includes a test PC that outputs a test signal, a signal generator that outputs an analog input signal corresponding to the test signal output from the test PC, an input module that outputs a status signal obtained by converting the analog input signal output from the signal generator into a digital signal, a control device that outputs the status signal output from the input module as a control signal, and a test output module that outputs the control signal output from the control device to the test PC, and the test PC compares the control signal output from the test output module with the test signal to evaluate the health of the input module.
[0014] According to one aspect of the present disclosure, a test system for an output module includes a test PC that outputs a test signal, a test input module that outputs the test signal output from the test PC, a control device that outputs the test signal output from the test input module as a control signal, an output module that converts the control signal output from the control device into an analog output signal and outputs it, and a measuring instrument that measures the analog output signal output from the output module and outputs a measurement value of the measured analog output signal to the test PC, and the test PC compares the measurement value of the analog output signal output from the measuring instrument with the test signal to evaluate the health of the output module. Effect of the Invention
[0015] According to the above aspect, a control system can be automatically tested in real time. [Brief description of the drawings]
[0016] [Figure 1] 1 is a diagram showing an overall configuration of a control system and a test system for an input module according to a first embodiment. [Diagram 2] 1 is a diagram showing an overall configuration of a control system and a test system for an output module according to a first embodiment. [Diagram 3]FIG. 2 is a diagram illustrating a functional configuration of a test system for an input module according to the first embodiment. [Figure 4] FIG. 2 is a diagram showing a functional configuration of a test system for an output module according to the first embodiment. [Diagram 5] FIG. 4 is a diagram showing a processing sequence of the test system for the input module according to the first embodiment. [Figure 6] FIG. 4 is a diagram showing a processing sequence of a test system for an output module according to the first embodiment. [Figure 7] FIG. 2 illustrates an example of a hardware configuration. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0017] <First embodiment> Hereinafter, the embodiments will be described in detail with reference to the drawings.
[0018] (Overall configuration of the control system) Fig. 1 is a diagram showing an overall configuration of a control system and a test system for an input module according to a first embodiment. Fig. 2 is a diagram showing an overall configuration of a control system and a test system for an output module according to a first embodiment.
[0019] The control system 1 is a system for monitoring and controlling a plant 3 (a controlled object). As shown in Fig. 1 and Fig. 2, the plant 3 includes a plurality of plant-side devices 31. The plant-side devices 31 include sensors (e.g., thermocouples, etc.) that detect the state of the plant 3, and machines and devices (e.g., valves, etc.) that operate according to control instructions from the control system 1.
[0020] The control system 1 includes a control device 11, a plurality of input modules 12, a plurality of output modules 13, a control PC 14, and an operation PC 15.
[0021] The control device 11 calculates and outputs a control signal DO for controlling the plant 3 based on a status signal DI indicating the status of the plant 3 and control logic and command values instructed from higher-level devices (control PC 14, operation PC 15). As in the examples of Figures 1 and 2, the control system 1 may include a plurality of control devices 11.
[0022] The input module 12 acquires an analog input signal AI indicating the state of the plant from the plant-side device 31 of the plant 3 , converts it into a state signal DI, which is a digital signal, and outputs it to the control device 11 .
[0023] The output module 13 converts the control signal DO, which is a digital signal output from the control device 11, into an analog output signal AO, and outputs it to the plant-side device 31 of the plant 3.
[0024] The control PC 14 is an example of a higher-level device. The control PC 14 accepts an operation by an operator and changes the control logic of the control device 11. The operator is a manager of the plant 3, a maintenance person, or the like.
[0025] The operation PC 15 is an example of a higher-level device. The operation PC acquires signals (status signal DI and control signal DO) input and output to the control device 11. The acquired signals can be confirmed by an operator via a display device or the like. The operator monitors the state of the plant 3 via the operation PC 15. In addition, the operation PC 15 accepts operations by the operator as necessary and outputs command values and the like to the control device 11. As in the examples of FIGS. 1 and 2, the control system 1 may include multiple operation PCs 15.
[0026] The control device 11 is connected to the higher-level devices (control PC 14, operation PC 15) via a communication line N1. The control device 11 is also connected to the input / output modules 12 and 13 via a communication line N2. The communication line N2 is a communication line that allows faster communication than the communication line N1. The communication (input / output of signals) between the control device 11 and the input / output modules 12 and 13 is performed in a very short period, for example, in units of X microseconds to X milliseconds. On the other hand, the communication between the control device 11 and the operation PC 15 is performed in a period, for example, every second, which is longer than the period with the input / output modules 12 and 13. Therefore, as described above, for example, when the input module 12 is tested using the operation PC 15, the communication period in which the input module 12 outputs a test signal to the control device 11 and the communication period in which the operation PC 15 obtains the test result (the output signal of the input module 12) from the control device 11 are asynchronous. Then, in the operation PC 15, a time lag occurs between the output timing of the test signal and the acquisition timing of the test result according to the difference in the communication periods of the communication lines N1 and N2. In addition, due to this delay, the operation PC 15 may acquire multiple test results at once for each communication cycle of the communication line N1. This makes it difficult for the operation PC 15 to automatically match and compare the test signals with the test results. For this reason, in the conventional method, the operator must visually compare and evaluate the test results, or perform a slow, time-consuming evaluation in accordance with the communication cycle of the communication line N1 (the communication cycle between the control device 11 and the operation PC 15).
[0027] In view of this, in this embodiment, the input module 12 and the output module 13 are tested by the test systems 2A and 2B instead of the operation PC 15 so that the test signals transmitted and received between the control device 11 and the input / output modules 12 and 13 can be acquired in real time and the input / output modules 12 and 13 can be evaluated quickly and automatically. Acquiring and evaluating signals in real time means that the test systems 2A and 2B acquire and evaluate signals transmitted and received between these devices in synchronization with the communication cycle of the communication line N2 (i.e., the communication cycle of the actual signal between the control device 11 and the input / output modules 12 and 13). The test systems 2A and 2B will be described below with reference to Figs. 1 and 2.
[0028] (Overall configuration of the test system) When testing the input module 12 and the output module 13 of the control system 1, test systems 2A and 2B are added to the control system 1. Fig. 1 shows the configuration of the test system 2A that tests the input module 12, and Fig. 2 shows the configuration of the test system 2B that tests the output module 13.
[0029] As shown in FIG. 1, a test system 2A for the input module 12 includes a test PC 21, a signal generator 22, and an output module for test .
[0030] The test PC 21 is connected to a test output module 23 via a communication cable that complies with an interface standard for serial communication such as RS-232C. The test PC 21 is also connected to an input module 12 via a signal generator 22. The test PC 21 outputs a test signal T1 to the input module 12 via the signal generator 22, and acquires a signal that the input module 12 inputs to the control device 11 via the test output module 23, and evaluates whether the input module 12 inputs a signal to the control device 11 as instructed.
[0031] The signal generator 22 is connected to the input module 12 to be tested in place of the plant side device 31 (such as a thermocouple). The signal generator 22 outputs an analog input signal T2 corresponding to the test signal T1 output from the test PC 21 to the input module 12. Then, the input module 12 converts the analog input signal T2 into a status signal DI and inputs it to the control device 11.
[0032] The test output module 23 is connected to the control device 11 via a communication line N2. The test output module 23 functions as a substitute for the output module 13. When testing the input module 12, the test output module 23 may be connected to the control device 11 in place of the normal output module 13 as in the example of FIG. 1. In another embodiment, the test output module 23 may be connected to the control device 11 at the same time as the output module 13. The test output module 23 outputs a control signal DO output from the control device 11 to the test PC 21. This control signal DO is a signal representing the test result of the input module 12, and is a signal converted by the control device 11 so as to have the same value as the status signal DI input from the input module 12.
[0033] As shown in FIG. 2, the test system 2B of the output module 13 includes a test PC 21, a test input module 25, and a measuring instrument .
[0034] The test PC 21 is the same as the test system 2A of the input module 12. The test PC 21 is connected to the test input module 25 via a communication cable compatible with an interface standard for serial communication such as RS-232C. The test PC 21 is also connected to a measuring instrument 26. The test PC 21 outputs a test signal T3 to the test input module 25, and acquires a measurement value T4 of the analog output signal AO output by the output module 13 via the measuring instrument 26, to evaluate whether the output module 13 has output a signal as instructed.
[0035] The test input module 25 is connected to the control device 11 via the communication line N2. The test input module 25 functions as a substitute for the input module 12. When testing the output module 13, the test input module 25 may be connected to the control device 11 in place of the normal input module 12 as in the example of FIG. 2. In another embodiment, the test input module 25 may be connected to the control device 11 at the same time as the input module 12. The test input module 25 outputs the test signal T3 received from the test PC 21 to the control device 11 as a status signal DI. Then, the control device 11 outputs to the output module 13 a control signal DO converted so as to have the same value as the status signal DI (test signal T3) output from the test input module 25.
[0036] The measuring instrument 26 is connected to the output module 13 in place of the plant side device 31 (such as a valve). The measuring instrument 26 measures the analog output signal AO output from the output module 13. In this embodiment, the analog input signal AI and the analog output signal AO are currents, and the measuring instrument 26 is an ammeter.
[0037] (Test system functional configuration) 3 is a diagram showing the functional configuration of a test system for an input module according to the first embodiment. First, the functional configuration of a test system 2A for an input module 12 will be described with reference to FIG.
[0038] 3, the control device 11 according to this embodiment has a test processing unit 111. For example, the control device 11 may have two modes, a normal operation mode and a test mode, and when an operator switches to the test mode, the test processing unit 111 may operate instead of a conventional control processing unit that performs normal processing. In the test mode, the test processing unit 111 converts a status signal DI input from the input module 12 into a control signal DO without changing the value, and outputs the signal to the test output module 23.
[0039] The test PC 21 also includes a test signal output section 211 , a test result acquisition section 212 , and an evaluation section 213 .
[0040] The test signal output unit 211 generates a test signal T1, which is a signal for testing the input module 12, and outputs it to the signal generator 22. The test signal T1 specifies the current value [mA] of the analog input signal AI that the input module 12 should output to the control device 11, and is, for example, a digital signal that expresses this current value as a current command value (0 to 100%). The test signal output unit 211 may generate the test signal T1 according to an operation by an operator, or may automatically generate and output a plurality of test signals T1 based on a test data file set in advance by the operator. The test data file is, for example, a text file, and describes the values of a plurality of test signals T1 (current command value expressed as 0 to 100%) to be output at each step during a test.
[0041] The test result acquisition unit 212 acquires, as a test result, the control signal DO output from the test output module 23. The control signal DO is, for example, a digital signal that expresses a current value as a current command value (0 to 100%).
[0042] The evaluation unit 213 compares the test signal T1 with the control signal DO, which is the test result, to evaluate the soundness of the input module 12. As described above, the control signal DO output by the control device 11 is a signal having the same value as the status signal DI output by the input module 12 to the control device 11. Therefore, if the test signal T1 and the control signal DO have the same value, it can be evaluated that the input module 12 has operated properly (is sound). In addition, if the communication path consisting of the input module 12, the control device 11, and the test output module 23 is normal and the mode is switched to the normal operation mode to set the output destination of the control device 11 to the output module 13, it can also be evaluated that this communication path is capable of normal communication.
[0043] The test output module 23 is implemented on, for example, an FPGA (Field-Programmable Gate Array). The test output module 23 has a host communication unit 231, a serial communication unit 232, and a shared memory 233, and each unit is connected by a bus 234.
[0044] The upper communication unit 231 is a communication interface capable of high-speed communication such as LVDS (Low Voltage Differential Signaling), and transmits and receives signals to and from the control device 11. The upper communication unit 231 receives a control signal from the control device 11 for each calculation cycle of the control device 11. The received control signal is stored and accumulated in the common memory 233.
[0045] The serial communication unit 232 is an integrated circuit such as a UART, and transmits and receives signals to and from the test PC 21. The serial communication unit 232 of the test output module 23 reads out a control signal from the common memory 233 and transmits it to the test PC 21.
[0046] The common memory 233 is a memory for storing and accumulating signals input and output to and from the test output module 23. By accumulating signals in the common memory 233, signals can be appropriately input and output even if the write timing and read timing do not match.
[0047] The upper communication unit 231, the common memory 233, and the bus 234 of the test output module 23 may be the same as the existing configurations of the output module 13. In other words, the test output module 23 may be configured by adding a serial communication unit 232 to the output module 13.
[0048] 4 is a diagram showing the functional configuration of a test system for an output module according to the first embodiment. Next, the functional configuration of a test system 2B for an output module 13 will be described with reference to FIG.
[0049] The functional configuration of the control device 11 shown in Fig. 4 is the same as that in Fig. 3. That is, in the test mode, the test processing unit 111 of the control device 11 converts the status signal DI input from the test input module 25 into a control signal DO without changing the value, and outputs the control signal to the output module 13.
[0050] Moreover, the test signal output unit 211 of the test PC 21 generates a test signal T3, which is a signal for testing the output module 13, and outputs it to the test input module 25. The test signal T3 specifies the current value [mA] of the analog output signal AO to be output by the output module 13, and is, for example, a digital signal that expresses this current value as a current command value (0 to 100%). The test signal output unit 211 may generate the test signal T3 according to an operation by an operator, or may automatically generate and output a plurality of test signals T3 based on a test data file set in advance by the operator. The test data file is, for example, a text file, and describes the values of a plurality of test signals T3 (current command value expressed as 0 to 100%) to be output at each step during a test.
[0051] The test result acquiring unit 212 acquires as a test result the measurement value T4 of the measuring instrument 26, which is the measurement value of the analog output signal AO output from the output module 13. Note that this measurement value T4 is, for example, a value obtained by converting the current value [mA] of the analog output signal AO into a current command value (0 to 100%). This conversion may be performed by the measuring instrument 26 or by the test result acquiring unit 212.
[0052] The evaluation unit 213 compares the test signal T3 with the measurement value T4, which is the test result, to evaluate the soundness of the output module 13. If the current command value [%] indicated by the test signal T3 and the current command value [%] indicated by the measurement value T4 are the same value, it can be evaluated that the output module 13 has operated properly (is sound). In addition, when the communication path consisting of the test input module 25, the control device 11, and the output module 13 is normal and the control device 11 receives a signal from the input module 12 by switching to the normal operation mode, it can also be evaluated that this communication path is capable of normal communication.
[0053] The test input module 25 is implemented on, for example, an FPGA (Field-Programmable Gate Array). The test input module 25 has a host communication unit 251, a serial communication unit 252, and a shared memory 253, and each unit is connected by a bus 254.
[0054] The upper communication unit 251 is a communication interface capable of high-speed communication such as LVDS (Low Voltage Differential Signaling), and transmits and receives signals to and from the control device 11. The upper communication unit 251 reads out the test signal T3 stored in the common memory 233, and inputs it to the control device 11 as a status signal DI.
[0055] The serial communication unit 252 is an integrated circuit such as a UART, and transmits and receives signals to and from the test PC 21. The serial communication unit 252 of the test input module 25 records and accumulates the test signal T3 received from the test PC 21 in the common memory 253.
[0056] The common memory 253 is a memory for storing and accumulating signals input and output to and from the test input module 25. By accumulating signals in the common memory 253, signals can be appropriately input and output even if the write timing and read timing do not match.
[0057] The upper communication unit 251, the common memory 253, and the bus 254 of the test input module 25 may be the same as the existing configurations of the input module 12. In other words, the test input module 25 may be configured by adding a serial communication unit 252 to the input module 12.
[0058] (Processing sequence of the input module test system) 5 is a diagram showing a processing sequence of the test system for the input module according to the first embodiment. Here, the flow of processing of the test system 2A for the input module 12 will be described with reference to FIG.
[0059] First, the test signal output unit 211 of the test PC 21 generates a test signal T1 according to an operation instruction from an operator or a test data file input by the operator, and outputs the test signal T1 to the signal generator 22 (step S11). The test signal T1 is, for example, a current command value [%]. The test PC 21 also stores the test signal T1 output by the test signal output unit 211.
[0060] Next, the signal generator 22 generates an analog input signal T2 corresponding to the test signal T1 output by the test PC 21, and outputs it to the input module 12 (step S12). For example, when the current command value indicated by the test signal T1 is "0%", the signal generator 22 generates a current of "4 mA" corresponding to a current command value of 0% and outputs it to the input module 12. When the current command value indicated by the test signal T1 is "100%, " the signal generator 22 generates a current of "20 mA" corresponding to a current command value of 0% and outputs it to the input module 12. These numerical values are merely examples.
[0061] When the analog input signal T2 is input from the signal generator 22, the input module 12 converts it into a status signal DI, which is a digital signal, and outputs it to the control device 11 (step S13). For example, if a current of "4 mA" is input to the input module 12, a normally operating input module 12 should convert it into a status signal DI indicating "current command value=0%" and output it to the control device 11.
[0062] Next, the test processing unit 111 of the control device 11 converts the status signal DI output from the input module 12 into a control signal DO without changing its value, and outputs it to the test output module 23 (step S14). For example, when the status signal DI indicates "current command value=0%", the test processing unit 111 outputs a control signal DO indicating "current command value=0%". This allows the control device 11 to communicate to the test output module 23 what value of the signal (current command value) has been input from the input module 12.
[0063] Moreover, the test output module 23 transmits the control signal DO output from the control device 11 to the test PC 21 (step S15).
[0064] Then, the test result acquisition unit 212 of the test PC 21 acquires the control signal DO as the test result from the test output module 23. The evaluation unit 213 compares the test signal T1 output in step S11 with the value of the control signal DO acquired as the test result (step S16).
[0065] For example, if the test signal T1 is "current command value=0%" and the control signal DO acquired as the test result is "current command value=0%", the values of these signals match (step S16; YES). In this case, the evaluation unit 213 evaluates that the input module 12 is normal (healthy). The evaluation unit 213 also evaluates that the communication path consisting of the input module 12, the control device 11, and the test output module 23 is normal, and that signals are correctly input and output even when the normal operation mode is switched to and the output destination of the control device 11 is set to the output module 13.
[0066] On the other hand, for example, if the test signal T1 is "current command value=0%" and the control signal DO acquired as the test result is not "current command value=0%", the values of these signals do not match (step S16; NO). In this case, the evaluation unit 213 evaluates that the input module 12 is abnormal (not healthy). Based on the evaluation result of the test PC 21, the operator performs maintenance such as adjustment, repair, and replacement of the input module 12, and checks the connection status of each device (presence or absence of disconnection, etc.).
[0067] For example, the test signal output unit 211 of the test PC 21 may continuously output a plurality of different test signals T1 in accordance with the test data file (repeating steps S11 to S18 a plurality of times). The evaluation unit 213 of the test PC 21 may evaluate the input module 12 (steps S16 to S18) after receiving test results (control signals DO) corresponding to all test signals T1 (repeating steps S11 to S15 a plurality of times). The evaluation unit 213 may determine that the input module 12 is normal (step S17) when the matching rate between the plurality of test signals T1 and the test results (control signals DO) is equal to or greater than a predetermined threshold value.
[0068] (Processing sequence of the output module test system) 6 is a diagram showing a processing sequence of the test system of the output module according to the first embodiment. Here, the flow of processing of the test system 2B of the output module 13 will be described with reference to FIG.
[0069] First, the test signal output unit 211 of the test PC 21 generates a test signal T3 according to an operation instruction of an operator or a test data file input by the operator, and outputs the test signal T3 to the test input module 25 (step S21). The test signal T3 is, for example, a current command value [%]. The test PC 21 also stores the test signal T3 output by the test signal output unit 211.
[0070] The test input module 25 outputs the test signal T3 output by the test PC 21 to the control device 11 as a status signal DI (step S22).
[0071] Next, the test processing unit 111 of the control device 11 converts the status signal DI (test signal T3) input from the test input module 25 into a control signal DO without changing its value, and outputs it to the output module 13 (step S23). For example, when the status signal DI indicates "current command value=0%", the test processing unit 111 outputs the control signal DO indicating "current command value=0%".
[0072] When the control signal DO is input, the output module 13 generates a current that is an analog output signal AO and outputs it to the measuring instrument 26 (step S24). For example, if the control signal DO is "current command value=0%", then the output module 13 operating normally should output an analog output signal AO (current) of "4 mA" that corresponds to this command value.
[0073] Next, the measuring instrument 26 (ammeter) measures the analog output signal AO (current) output by the output module 13, and transmits the measured value T4 to the test PC 21 (step S25).
[0074] Then, the test result acquisition unit 212 of the test PC 21 acquires the measurement value T4 of the measuring instrument 26 as the test result. The evaluation unit 213 compares the test signal T3 output in step S21 with the measurement value T4 acquired as the test result (step S26).
[0075] For example, if the test signal T3 is "current command value=0%" and the measured value T4 acquired as the test result is "current command value=0%", the values of these signals match (step S26; YES). In this case, the evaluation unit 213 evaluates that the output module 13 is normal (healthy). The evaluation unit 213 also evaluates that the communication path consisting of the test input module 25, the control device 11, and the output module 13 is normal, and that signals are correctly input and output even when the normal operation mode is switched to so that the control device 11 receives a signal from the input module 12.
[0076] On the other hand, for example, if the test signal T3 is "current command value=0%" and the measurement value T4 acquired as the test result is not "current command value=0%", the values of these signals do not match (step S26; NO). In this case, the evaluation unit 213 evaluates that the output module 13 is abnormal (not healthy). Based on the evaluation result of the test PC 21, the operator performs maintenance such as adjustment, repair, and replacement of the output module 13, and checks the connection status of each device (presence or absence of disconnection, etc.).
[0077] For example, the test signal output section 211 of the test PC 21 may continuously output a plurality of different test signals T3 in accordance with the test data file (repeating steps S21 to S28 a plurality of times). The evaluation section 213 of the test PC 21 may evaluate the output module 13 (steps S26 to S28) after receiving the test results (measurement values T4) corresponding to all the test signals T3 (after repeating steps S11 to S15 a plurality of times). The evaluation section 213 may determine that the output module 13 is normal (step S27) when the coincidence rate between the plurality of test signals T3 and the test results is equal to or greater than a predetermined threshold value.
[0078] (Action, effect) As described above, the test system 2A for the input module 12 according to this embodiment includes the test PC 21 that outputs the test signal T1, the signal generator 22 that outputs the test analog input signal T2 corresponding to the test signal T1 output from the test PC 21, the input module 12 that outputs the status signal DI obtained by converting the analog input signal T2 output from the signal generator 22 into a digital signal, the control device 11 that outputs the status signal DI output from the input module 12 as a control signal DO, and the test output module 23 that outputs the control signal DO output from the control device 11 to the test PC 21. The test PC 21 compares the control signal DO output from the test output module 23 with the test signal T1 to evaluate the soundness of the input module 12.
[0079] In this way, the test system 2A can synchronize the communication cycle of the test signal T1 and the test result (control signal DO) in the test PC 21 with the communication cycle of the control device 11 and the input / output modules 12, 13. As a result, unlike the conventional test method using the operation PC 15, the test PC 21 of the test system 2A can acquire the test result corresponding to the test signal T1 in real time in accordance with the high-speed communication cycle of the communication line N2. In this way, the test PC 21 can regularly output the test signal T1 and acquire the test result at a fixed cycle, so that the test signal T1 and the test result can be automatically associated with each other and compared and evaluated.
[0080] Moreover, the test system 2B of the output module 13 according to this embodiment includes a test PC 21 that outputs a test signal T3, a test input module 25 that outputs the test signal T3 output from the test PC 21, a control device 11 that outputs the test signal T3 output from the test input module 25 as a control signal DO, an output module 13 that converts the control signal DO output from the control device 11 into an analog output signal AO and outputs it, and a measuring instrument 26 that measures the analog output signal AO output from the output module 13 and outputs a measurement value T4 of the analog output signal AO to the test PC 21. Moreover, the test PC 21 compares the measurement value T4 of the analog output signal AO output from the measuring instrument 26 with the test signal T3 to evaluate the soundness of the output module 13.
[0081] In this way, the test system 2B can synchronize the communication period of the test signal T3 and the test result (measurement value T4 of the analog output signal AO) in the test PC 21 with the communication period of the control device 11 and the input / output modules 12, 13. As a result, unlike the conventional test method using the operation PC 15, the test PC 21 of the test system 2B can obtain the test result corresponding to the test signal T3 in real time in accordance with the high-speed communication period of the communication line N2. In this way, the test PC 21 can regularly output the test signal T3 and obtain the test result at a fixed period, so that the test signal T3 and the test result can be automatically associated with each other and compared and evaluated.
[0082] Moreover, the test PC 21 automatically generates and outputs a plurality of test signals T1, T3 based on a preset test data file.
[0083] In this way, the input module 12 and the output module 13 can be automatically evaluated by a plurality of different test signals T1 and T3. In the conventional method, when automating the test, it was necessary to use an RPA tool on the operation PC to memorize the operation contents, but as described above, the operation screen of the operation PC may differ for each control system, and versatility was poor. In contrast, the test systems 2A and 2B according to this embodiment can use a general-purpose test data file such as a text file in which the values of the test signals T1 and T3 are written. Therefore, the test systems 2A and 2B can be applied to control systems 1 of different models and configurations.
[0084] <Other embodiments> Although one embodiment has been described in detail above with reference to the drawings, the specific configuration is not limited to the above, and various design changes are possible. That is, in other embodiments, the order of the above-mentioned processes may be changed as appropriate. Also, some of the processes may be executed in parallel.
[0085] <Hardware configuration> FIG. 6 is a diagram illustrating an example of a hardware configuration.
[0086] The computer 900 comprises a processor 901 , a main memory device 902 , an auxiliary memory device 903 , and an interface 904 .
[0087] The above-mentioned control system 1 and each device of the test systems 2A and 2B (control device 11, input module 12, output module 13, control PC 14, operation PC 15, test PC 21, test output module 23, test input module 25) are implemented in a computer 900. The operations of each of the above-mentioned processing units are stored in the auxiliary storage device 903 in the form of a program. The processor 901 reads out the program from the auxiliary storage device 903 and loads it in the main storage device 902, and executes the above-mentioned processing according to the program. The processor 901 also secures storage areas in the main storage device 902 corresponding to each of the above-mentioned storage units according to the program.
[0088] The program may be for realizing a part of the functions to be performed by the computer 900. For example, the program may be for realizing the functions by combining with other programs already stored in the auxiliary storage device 903 or by combining with other programs implemented in other devices. In another embodiment, the computer 900 may include a custom LSI (Large Scale Integrated Circuit) such as a PLD (Programmable Logic Device) in addition to or instead of the above configuration. Examples of PLDs include PAL (Programmable Array Logic), GAL (Generic Array Logic), CPLD (Complex Programmable Logic Device), and FPGA (Field Programmable Gate Array). In this case, some or all of the functions to be realized by the processor 901 may be realized by the integrated circuit.
[0089] Examples of the auxiliary storage device 903 include a hard disk drive (HDD), a solid state drive (SSD), a magnetic disk, a magneto-optical disk, a compact disc read only memory (CD-ROM), a digital versatile disc read only memory (DVD-ROM), and a semiconductor memory. The auxiliary storage device 903 may be an internal medium directly connected to the bus of the computer 900, or an external storage device 910 connected to the computer 900 via an interface 904 or a communication line. In addition, when the program is distributed to the computer 900 via a communication line, the computer 900 that receives the program may load the program into the main storage device 902 and execute the above-mentioned process. In at least one embodiment, the auxiliary storage device 903 is a non-transitory tangible storage medium.
[0090] The program may be for realizing part of the above-mentioned functions. Furthermore, the program may be a so-called differential file (differential program) that realizes the above-mentioned functions in combination with other programs already stored in the auxiliary storage device 903.
[0091] <Additional Notes> The input module testing method, output module testing method, test output module, test input module, input module testing system, and output module testing system described in the above embodiments can be understood, for example, as follows.
[0092] (1) According to a first aspect, a method for testing an input module 12 is a method for testing an input module 12 of a control system 1 including a control device 11 that controls a control object 3 and an input module 12 that outputs a signal of the control object 3 to the control device 11, the method including the steps of: a test PC outputting a test signal T1 to a signal generator 22; a step of the signal generator 22 outputting an analog input signal T2 corresponding to the test signal T1 to the input module 12; a step of the input module 12 outputting a status signal DI obtained by converting the analog input signal T2 output from the signal generator 22 into a digital signal to the control device 11; a step of the control device 11 outputting the status signal DI output from the input module 12 as a control signal DO to a test output module 23 connected to the control device 11; a step of the test output module 23 outputting the control signal DO output from the control device 11 to the test PC 21; and a step of the test PC 21 comparing the control signal DO output from the test output module 23 with the test signal T1 to evaluate the soundness of the input module 12.
[0093] In this way, the communication cycle of the test signal T1 and the test result (control signal DO) in the test PC 21 can be synchronized with the communication cycle of the control device 11 and the input / output modules 12, 13. As a result, unlike the conventional test method using the operation PC 15, in this test method, the test PC 21 can acquire the test result corresponding to the test signal T1 in real time in accordance with the high-speed communication cycle of the communication line N2. In this way, the test PC 21 can regularly output the test signal T1 and acquire the test result at a fixed cycle, so that the test signal T1 and the test result can be automatically associated with each other and compared and evaluated.
[0094] (2) According to the second aspect, in the method for testing the input module 12 according to the first aspect, the test PC 21 automatically generates and outputs a plurality of test signals T1 based on a preset test data file.
[0095] In this way, the input module 12 can be automatically evaluated using a plurality of different test signals T1. In the conventional method, when automating a test, it was necessary to use an RPA tool on an operation PC to memorize the operation contents, but as described above, the operation screen of the operation PC may differ for each control system, and versatility was poor. In contrast, the above-mentioned test method makes it possible to use a general-purpose test data file such as a text file in which the value of the test signal T1 is written. Therefore, the above-mentioned test method can be applied to control systems 1 of different models and configurations.
[0096] (3) According to a third aspect, a method for testing an output module 13 is a method for testing an output module 13 of a control system 1 including a control device 11 that controls a control target 3 and an output module 13 that outputs a signal of the control device 11 to the control target 3, the method including a step of a test PC 21 outputting a test signal T3 to a test input module 25 connected to the control device 11, a step of the test input module 25 outputting the test signal T3 to the control device 11, and a step of the control device 11 outputting the test signal T3 from the test input module 25 as a control signal DO to the output module 13. the control signal DO output from the control device 11 to the test PC 21; the output module 13 converting the control signal DO output from the control device 11 into an analog signal to output the analog output signal AO to a measuring instrument 26 connected to the output module 13; the measuring instrument 26 measuring the analog output signal AO output from the output module 13 and outputting a measurement value T4 of the analog output signal AO to the test PC 21; and the test PC 21 comparing the measurement value T4 of the analog output signal AO output from the measuring instrument 26 with the test signal T3 to evaluate the soundness of the output module 13.
[0097] In this way, the communication cycle of the test signal T3 and the test result (measurement value T4 of the analog output signal AO) in the test PC 21 can be synchronized with the communication cycle of the control device 11 and the input / output modules 12, 13. As a result, unlike the conventional test method using the operation PC 15, in this test method, the test PC 21 can obtain the test result corresponding to the test signal T3 in real time in accordance with the high-speed communication cycle of the communication line N2. In this way, the test PC 21 can regularly output the test signal T3 and obtain the test result at a fixed cycle, so that the test signal T3 and the test result can be automatically associated with each other and compared and evaluated.
[0098] (4) According to the fourth aspect, in the method for testing the output module 13 according to the third aspect, the test PC 21 automatically generates and outputs a plurality of test signals T3 based on a preset test data file.
[0099] In this way, the output module 13 can be automatically evaluated using a plurality of different test signals T3. In the conventional method, when automating the test, it was necessary to use an RPA tool on the operation PC to memorize the operation contents, but as described above, the operation screen of the operation PC may differ for each control system, and versatility was poor. In contrast, the above-mentioned test method makes it possible to use a general-purpose test data file such as a text file in which the value of the test signal T3 is written. Therefore, the above-mentioned test method can be applied to control systems 1 of different models and configurations.
[0100] (5) According to the fifth aspect, the test output module 23 is a test output module 23 connected to the control device 11 when testing the input module 12 that outputs a signal of the controlled object 3 to the control device 11, and includes an upper communication unit 231 that acquires from the control device 11 the status signal DI that the input module 12 outputs to the control device 11, the status signal DI being a digital signal converted from an analog input signal AI input by the input module 12 for testing, and a serial communication unit 232 that transmits the acquired status signal DI to the test PC 21 as a test result of the input module 12.
[0101] In this way, the test output module 23 can provide the test PC 21 with a status signal DI, which is the test result of the input module 12, in the same cycle as the communication cycle between the control device 11 and the input / output modules 12 and 13. This allows the test PC 21 to acquire the test result corresponding to the test signal T1 in real time in accordance with the high-speed communication cycle of the communication line N2, unlike the conventional test method using the operation PC 15. This allows the test PC 21 to regularly output the test signal T1 and acquire the test result in a fixed cycle, making it possible to automatically associate the test signal T1 with the test result, and compare and evaluate it.
[0102] (6) According to a sixth aspect, a test input module 25 is connected to the control device 11 when testing an output module 13 that outputs a signal from the control device 11 to a controlled object 3, and includes a serial communication unit 252 that acquires a test signal T3 from a test PC 21 and an upper communication unit 251 that transmits the test signal T3 to the control device 11.
[0103] In this way, the test input module 25 can output the test signal T3 of the output module 13 to the control device 11 in the same cycle as the communication cycle between the control device 11 and the input / output modules 12, 13. This allows the test PC 21 to output the test signal T3 and obtain the test results in real time in accordance with the high-speed communication cycle of the communication line N2, unlike the conventional test method using the operation PC 15. This allows the test PC 21 to regularly output the test signal T1 and obtain the test results in a fixed cycle, making it possible to automatically associate the test signal T1 with its test results and compare and evaluate them.
[0104] (7) According to the seventh aspect, a test system for an input module 12 includes a test PC 21 that outputs a test signal T1, a signal generator 22 that outputs an analog input signal T2 corresponding to the test signal T1 output from the test PC 21, an input module 12 that outputs a status signal DI obtained by converting the analog input signal T2 output from the signal generator 22 into a digital signal, a control device 11 that outputs the status signal DI output from the input module 12 as a control signal DO, and a test output module 23 that outputs the control signal DO output from the control device 11 to the test PC 21, and the test PC 21 compares the control signal DO output from the test output module 23 with the test signal T1 to evaluate the soundness of the input module 12.
[0105] (8) According to the eighth aspect, in the test system for the input module 12 according to the seventh aspect, the test PC 21 automatically generates and outputs a plurality of test signals T1 based on a preset test data file.
[0106] (9) According to a ninth aspect, there is provided a test PC21 which outputs a test signal T3, a test input module 25 which outputs the test signal T3 output from the test PC21 to the control device 11, the control device 11 which outputs the test signal T3 output from the test input module 25 as a control signal DO, an output module 13 which converts the control signal DO output from the control device 11 into an analog output signal AO and outputs it, and a measuring instrument 26 which measures the analog output signal AO output from the output module 13 and outputs a measurement value T4 of the analog output signal AO to the test PC21, and the test PC21 compares the measurement value T4 of the analog output signal AO output from the measuring instrument 26 with the test signal T3 to evaluate the soundness of the output module 13.
[0107] (10) According to the tenth aspect, in the test system for the output module 13 according to the ninth aspect, the test PC 21 automatically generates and outputs a plurality of test signals T3 based on a preset test data file. [Explanation of symbols]
[0108] 1. Control System 11 Control device 111 Test processing section 12 Input Module 13 Output Module 2A,2B Test System 21 Test PC 211 Test signal output section 212 Test Results Acquisition Department 213 Evaluation Department 22 Signal Generator 23 Test Output Module 231 Upper communication unit 232 Serial communication section 233 Common Memory 234 Bus 25 Test Input Module 251 Upper communication section 252 Serial communication section 253 Common Memory 254 Bus 26 Measuring Instruments 3 Plant (control object) 31 Plant side equipment
Claims
1. A method for testing an input module of a control system including a control device that controls a controlled object and an input module that outputs a signal of the controlled object to the control device, comprising: A test PC outputs a test signal to a signal generator; The signal generator outputs an analog input signal corresponding to the test signal output from the test PC to the input module; a step of the input module converting the analog input signal output from the signal generator into a digital signal, and outputting the digital signal to the control device; a step of the control device outputting the status signal output from the input module as a control signal to a test output module connected to the control device; a step of the test output module outputting the control signal output from the control device to the test PC; the test PC compares the control signal output from the test output module with the test signal to evaluate the soundness of the input module; A test method for an input module having
2. The test PC automatically generates and outputs a plurality of the test signals based on a preset test data file.
2. A method for testing an input module according to claim 1.
3. A method for testing an output module of a control system including a control device that controls a controlled object and an output module that outputs a signal of the control device to the controlled object, comprising the steps of: a test PC outputting a test signal to a test input module connected to the control device; the test input module outputting the test signal to the controller; The control device outputs the test signal output from the test input module to the output module as a control signal; a step in which the output module converts the control signal output from the control device into an analog output signal, and outputs the analog output signal to a measuring instrument connected to the output module; a step of the measuring instrument measuring the analog output signal output from the output module and outputting a measurement value of the analog output signal to the test PC; The test PC compares the measured value of the analog output signal output from the measuring instrument with the test signal to evaluate the health of the output module; A test method for an output module having the following construction:
4. The test PC automatically generates and outputs a plurality of the test signals based on a preset test data file.
4. A method for testing an output module according to claim 3.
5. A test output module connected to a control device when testing an input module that outputs a control target signal to the control device, a host communication unit that acquires, from the control device, a status signal that is a digital signal converted by the input module into an analog input signal that is input for testing, and that is output by the input module to the control device; a serial communication unit that transmits the acquired status signal to a test PC as a test result of the input module; 13. A test output module comprising:
6. A test input module connected to a control device when testing an output module that outputs a signal from the control device to a controlled object, A serial communication unit for acquiring a test signal from a test PC; A host communication unit that transmits the test signal to the control device; 1. A test input module comprising:
7. A test PC that outputs a test signal; a signal generator that outputs an analog input signal corresponding to the test signal output from the test PC; an input module that converts the analog input signal output from the signal generator into a digital signal and outputs a status signal; a control device that outputs the state signal output from the input module as a control signal; a test output module that outputs the control signal output from the control device to the test PC; Equipped with the test PC compares the control signal output from the test output module with the test signal to evaluate the soundness of the input module; Test system for input modules.
8. The test PC automatically generates and outputs a plurality of the test signals based on a preset test data file.
8. A test system for an input module according to claim 7.
9. A test PC that outputs a test signal; a test input module for outputting the test signal output from the test PC; a control device that outputs the test signal output from the test input module as a control signal; an output module that converts the control signal output from the control device into an analog output signal and outputs the analog output signal; a measuring instrument that measures the analog output signal output from the output module and outputs a measurement value of the analog output signal to the test PC; Equipped with the test PC compares the measured value of the analog output signal output from the measuring instrument with the test signal to evaluate the soundness of the output module; Test system for output modules.
10. The test PC automatically generates and outputs a plurality of the test signals based on a preset test data file.
10. A test system for an output module according to claim 9.
Citation Information
Patent Citations
Analog automatic adjustment test system for plant controller
JP2010020603A