Temperature control methods, apparatus, electronic equipment, and storage media
The method addresses PID algorithm inefficiencies by determining rule relationships and adjusting control parameters to achieve precise temperature control across varying conditions, enhancing system stability and operator convenience.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- BEIJING JINGYI AUTOMATION EQUIP CO LTD
- Filing Date
- 2025-05-23
- Publication Date
- 2026-06-29
AI Technical Summary
Existing PID algorithms face challenges in balancing overshoot and speed when set temperatures or flow rates change significantly, leading to inefficiencies in high-precision temperature control systems.
A method involving testing and calculating test control parameters, determining rule relationships, and adjusting target control parameters using a PID algorithm to achieve precise temperature control across varying conditions.
The method enables faster and more accurate temperature control over a wide range by balancing speed and overshoot, improving system stability and reducing operator complexity through automated parameter adjustments.
Smart Images
Figure 2026106366000001_ABST
Abstract
Description
Technical Field
[0001] This application relates to the technical field of temperature control, and specifically to a method, apparatus, electronic device, and storage medium for temperature control.
Background Art
[0002] The PID algorithm is simple, effective, and has a wide range of applications, so it is widely applied in various industrial control systems such as temperature control, speed control, and position control. For example, in temperature control, the PID algorithm can adjust the power of the heating or cooling device through proportional, integral, and differential operations according to the error between the temperature value fed back from the temperature sensor and the predetermined temperature value in order to achieve accurate temperature control.
[0003] In a process that requires high-precision control, high-precision control is achieved by adjusting the control parameters of the PID model. However, when the set temperature changes greatly, it is usually difficult to balance overshoot and speed. That is, in the case of the same set of PID parameters, under the same flow rate, when the set temperature is in the high-temperature range, the system shows temperature fluctuations, and when it is in the low-temperature range, the system shows that the adjustment speed is too slow. Similarly, under the same set temperature, when the flow rate is large, the system shows that the adjustment speed is too slow, and when the flow rate is small, the system shows temperature fluctuations. In addition, introducing more sensor variables is often subject to the limitations of the operating conditions at the use site, and there is also a risk of increasing the uncertainty of the system.
Summary of the Invention
[0004] In view of the above, an object of this application is to provide a method, apparatus, electronic device, and storage medium for temperature control to overcome the problems in the prior art.
[0005] In a first aspect, an embodiment of this application provides a temperature control method applied to a target temperature control system that realizes temperature control by means of the PID algorithm. The temperature control method includes the following steps.
[0006] Tests and calculations are performed on the test temperature control system to obtain test control parameters based on different test temperature control data.
[0007] By analyzing the test temperature control data and the test control parameters, a first rule relationship between the test temperature control data and the test control parameters is determined.
[0008] Based on the first rule relationship and the target temperature control data that the target temperature control system should achieve, the target control parameters corresponding to the target temperature control data are determined.
[0009] In order to adjust the target temperature control system based on the target control signal, the target control signal is calculated according to the target control parameters.
[0010] In some of the technical applications of this application, the target temperature control system includes a pump and a compressor, and the test temperature control data includes test temperature data and test flow rate data.
[0011] The step of determining a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters includes the step of determining a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data by analyzing the test temperature data, the test flow velocity data and the test control parameters.
[0012] In some of the technical proposals of this application, the step of determining a first rule relationship in which the test control parameters change according to the test temperature data and the test velocity data by analyzing the test temperature data, the test velocity data and the test control parameters includes the step of analyzing a second rule relationship in which the test control parameters change according to the test temperature data under the same conditions of the test velocity data, and the step of obtaining the first rule relationship from the second rule relationship for each of the test velocity data.
[0013] In some of the technical proposals of this application, the target temperature control data includes target temperature data and target flow velocity data.
[0014] The step of determining target control parameters corresponding to target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve includes the steps of selecting a third rule relationship corresponding to the target flow velocity data from the second rule relationship and substituting the target temperature data into the third rule relationship to determine target control parameters corresponding to the target temperature data.
[0015] In some of the technical proposals of this application, the step of testing and calculating a test temperature control system to obtain test control parameters using different test temperature control data includes the step of acquiring a sampling temperature curve of the test temperature control system in a preset operating mode, and the step of calculating test control parameters using different test temperature control data based on a preset calculation method and the sampling temperature curve.
[0016] In some of the technical proposals of this application, the target control parameters include a target proportional parameter, a target integral parameter, and a target differential parameter.
[0017] The step of calculating the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal includes the step of calculating the target control signal based on the target proportional parameter and error, the target integral parameter and error integral, and the rate of change of the target differential parameter and error in order to adjust the target temperature control system based on the target control signal.
[0018] In some of the technical proposals of this application, the temperature control method is obtained by fine-tuning the error integral as follows.
[0019] Based on the fine-tuning items obtained from the aforementioned error and adjustment coefficient, the error integral is adjusted to obtain the adjusted error integral.
[0020] In the second aspect, embodiments of this application provide a temperature control device applicable to a target temperature control system that implements temperature control using a PID algorithm, the temperature control device including the following modules.
[0021] The test module performs tests and calculations on the test temperature control system and obtains test control parameters based on different test temperature control data.
[0022] The analysis module determines a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters.
[0023] The decision module determines the target control parameters corresponding to the target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve.
[0024] The calculation module calculates the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal.
[0025] In the third scenario, an embodiment of the present application provides an electronic device, which includes a processor and a memory storing a computer program executable by the processor. The processor executes the computer program to implement the steps of the temperature control method described above.
[0026] In the fourth scenario, an embodiment of the present application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the temperature control method described above.
[0027] The technical solution according to the embodiments of the present application may include the following beneficial effects.
[0028] The temperature control method according to the present application includes steps of testing and calculating a test temperature control system to obtain test control parameters based on different test temperature control data, determining a first regular relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters, determining target control parameters corresponding to the target temperature control data based on the first regular relationship and the target temperature control data to be achieved by the target temperature control system, and calculating the target control signal according to the target control parameters to adjust the target temperature control system based on the target control signal. The present application is applicable to temperature control within a wide temperature range, balances the temperature control speed and temperature overshoot, and can achieve the control target faster while accurately controlling the temperature.
[0029] To make the above objects, features, and advantages of the present application clearer, the following will be described in detail with reference to the drawings in preferred embodiments.
[0030] To more clearly explain the technical concepts of the embodiments in this application, the drawings necessary for describing the embodiments are briefly described below. The drawings described are only a selection of embodiments of this application and do not limit the scope. A person skilled in the art can obtain other relevant drawings based on these drawings without employing inventive ability. [Brief explanation of the drawing]
[0031] [Figure 1] This flowchart shows the temperature control method according to the embodiment of this application. [Figure 2] This is a schematic diagram showing the temperature curve according to an embodiment of the present application. [Figure 3] This is a schematic diagram showing a temperature control device according to an embodiment of this application. [Figure 4] This is a schematic diagram of the electronic device according to the embodiment of this application. [Modes for carrying out the invention]
[0032] To clarify the purpose, technical proposal, and advantages of the embodiments of this application, the technical proposal of the embodiments of this application will be described clearly and completely below with reference to the drawings of the embodiments of this application. The drawings of this application are for illustrative purposes only and do not limit the scope of protection of this application. Furthermore, the schematic drawings are not drawn according to the scale of the objects. The flowcharts used in this application illustrate operations realized by several embodiments relating to this application. The operations in the flowcharts can be realized in any order. Steps that are not logically related may be reversed in order or performed simultaneously. A person skilled in the art may add one or more other operations to the flowcharts or remove one or more operations from the flowcharts in accordance with the content of this application.
[0033] Furthermore, the embodiments described herein represent only a portion of the embodiments of this application, not all of them. Typically, the components of the embodiments of this application described and shown herein using the drawings can be arranged and designed in any combination. For this reason, the following detailed description of the embodiments of this application shown in the drawings is merely to illustrate selected embodiments of this application and does not limit the scope of the application to be protected. All other embodiments obtained by a person skilled in the art without using their inventive ability based on the embodiments of this application are all within the scope of protection of this application.
[0034] In the embodiments of this application, the term "includes" is used to indicate the presence of a feature, but does not preclude the addition of other features.
[0035] Because PID algorithms are simple, effective, and have a wide range of applications, they are widely used in various industrial control systems such as temperature control, speed control, and position control. For example, in temperature control, PID algorithms can adjust the power of a heating or cooling device through proportional, integral, and differential operations according to the error between the temperature value fed back from a temperature sensor and a predetermined temperature value, in order to achieve the objective of precise temperature control.
[0036] In processes requiring high-precision control, this is achieved by adjusting the control parameters of a PID model. However, when the set temperature changes significantly, balancing overshoot and speed is usually difficult. In other words, with the same set of PID parameters, under the same flow rate, if the set temperature is in the high-temperature range, the system will show temperature fluctuations, and if it is in the low-temperature range, the system will show that the adjustment speed is too slow. Similarly, under the same set temperature, if the flow rate is high, the system will show that the adjustment speed is too slow, and if the flow rate is low, the system will show temperature fluctuations. Furthermore, introducing more sensor variables can often be subject to limitations of the operating conditions at the site of use and may increase the uncertainty of the system.
[0037] Based on the above, embodiments of this application provide a method, apparatus, electronic device, and storage medium for temperature control, which will be explained by the following embodiments.
[0038] Figure 1 is a flowchart showing a temperature control method according to an embodiment of this application, which is applied to a target temperature control system that implements temperature control using a PID algorithm, and includes steps S101 to S104.
[0039] Step S101: Test and calculate the test temperature control system to obtain test control parameters based on different test temperature control data.
[0040] Step S102: A first rule relationship between the test temperature control data and the test control parameters is determined by analyzing the test temperature control data and the test control parameters.
[0041] Step S103: Based on the first rule relationship and the target temperature control data that the target temperature control system should achieve, a target control parameter corresponding to the target temperature control data is determined.
[0042] Step S104: To adjust the target temperature control system based on the target control signal, the target control signal is calculated according to the target control parameters.
[0043] This application is applicable to temperature control over a wide temperature range, balancing temperature control speed and temperature overshoot, and enabling faster control of the temperature while maintaining accuracy.
[0044] Several embodiments of this application are described in detail below. To the extent that they do not contradict each other, the embodiments and features described below can be combined.
[0045] The temperature control method according to the embodiments of this application is applied to a target temperature control system. The target temperature control system may be a liquid cooling system, a heating system, etc. An actual target temperature control system generally includes a pump and a compressor to regulate the temperature. Temperature control is achieved by controlling the liquid flow rate with the pump and controlling the liquid temperature with the compressor based on a PID algorithm. In order to perform temperature control on the target temperature control system, the embodiments of this application require testing and calculations on a test temperature control system. The test temperature control system is determined by the target temperature control system. That is, the test temperature control system includes pumps and compressors of the same model numbers as those in the target temperature control system; in other words, the test temperature control system includes at least the same model numbers as those in the target temperature control system. By testing the test temperature control system, a first rule relationship is determined between the test temperature control data and the test control parameters in the test temperature control system, and the target control parameters of the target temperature control system are determined based on the first rule relationship.
[0046] For example, if the first rule relationship includes only the regularity of test control parameter a1, then the target control parameter a'1 can directly utilize the first rule relationship. If the first rule relationship includes the regularity of test control parameter a1, the regularity of test control parameter a2, and the regularity of test control parameter a3, then when using the first rule relationship, the target control parameter a'1 must first select the corresponding regularity of test control parameter a1 before using it.
[0047] When testing a test temperature control system, since the test temperature control system includes a pump and a compressor, in the embodiment of this application, when testing the test temperature control data, the test temperature control data is further divided into test temperature data and test flow velocity data.
[0048] Furthermore, the first rule relationship between the test temperature control data and the test control parameters in the above method is a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data. Specifically, in the embodiment of this application, in determining the first rule relationship, first, a second rule relationship in which the test control parameters change according to the test temperature data under the same conditions of the test flow velocity data is analyzed, and then the first rule relationship is obtained from the second rule relationship based on each of the test flow velocity data.
[0049] When actually implementing the invention, the test temperature data and test flow rate data obtained by the embodiment of this application are shown in Tables 1 and 2.
[0050] [Table 1]
[0051] [Table 2] Here, Table 1 shows the test control parameters at different temperatures when the flow rate is 5 L / min, and Table 2 shows the test control parameters at different temperatures when the flow rate is 30 L / min. The test control parameters include the test proportional parameter (P), the test integral parameter (I), and the test differential parameter (D).
[0052] Furthermore, in the embodiments of this application, the test control parameters at each temperature are determined continuously, meaning that the data from -20 to -10 in the table above are also determined. In the embodiments of this application, the continuous data was divided in order to determine a clearer rule relationship. Specifically, it was divided based on the magnitude of the difference in test control parameters between different temperatures and a preset difference threshold. In the embodiments of this application, the continuous temperature was divided into 10°C intervals by comparison. The first rule relationship was then identified as a linear change relationship.
[0053] After the first rule relationship is determined, the target control parameters corresponding to the target temperature control data are determined based on the first rule relationship and the target temperature control data that the target temperature control system should achieve.
[0054] In the embodiment of this application, the target temperature control data includes target temperature data and target flow velocity data. Therefore, the determination of the target control parameters is performed by selecting a third rule relationship corresponding to the target flow velocity data from the second rule relationship, substituting the target temperature data into the third rule relationship, and determining the target control parameters corresponding to the target temperature data.
[0055] For example, using the data in Tables 1 and 2 above, calculate the target control parameters when the target temperature data is -20°C and the target flow velocity data is 30 L / min.
[0056] The P-parameter is calculated as follows:
number
[0057] The I-parameter is calculated as follows:
number
[0058] The D parameter is calculated as follows:
number
[0059] Once the target control parameters are obtained, the target control signal is calculated. The target control signal is calculated based on the target proportional parameter and error, the target integral parameter and error integral, and the rate of change of the target differential parameter and error.
[0060] Eventually, the error will
number
number
[0061] Specifically, once the PID parameters are calculated, the PID operation is performed using the following discretization formula.
number
[0062] In calculating the error integral, variable integral is used to implement an anti-windup function. That is, the error integral is adjusted based on a fine-tuning item obtained based on the error and the adjustment coefficient, and the adjusted error integral is obtained.
[0063] Specifically, the following applies:
number
[0064] In any embodiment, in order to improve processing efficiency when determining test control parameters, the test of the test temperature control system is performed in a preset operating mode to obtain a sampling temperature curve of the test temperature control system, and test control parameters based on different test temperature control data are calculated based on a preset calculation method and the sampling temperature curve.
[0065] Set the output of the test temperature control system to switching mode, that is, a mode that outputs only 0% and 100%. If the sampling value is lower than the set value, the cooling system outputs 0%, and the system sampling temperature rises. If the sampling temperature exceeds the set value, the cooling system outputs 100%, and the system sampling temperature falls. By repeating this several times, a sampling temperature curve like the one shown in Figure 2 can be obtained.
[0066] From the temperature curve, the oscillation period T u The oscillation waveform amplitude A and output amplitude d can be determined using the following formula: The limiting gain K c It is possible to find this.
number
[0067] The PID parameters are determined according to the Ziegle-Nichols algorithm.
[0068] The method of the embodiment of this application improves the accuracy of temperature control. Specifically, by checking a table and calculating the corresponding PID parameters from the set temperature and set flow rate, it is possible to quickly determine appropriate PID parameters that can adapt well to large temperature range changes and large flow rate changes. Furthermore, the stability of the system is improved. Specifically, the anti-windup function using variable integration reduces the overshoot of the system output in the case of large temperature changes, and the stabilization time can be shortened. Furthermore, the convenience of parameter adjustment is improved. Specifically, the parameter auto-tuning function provides great convenience to operators, and since the system can automatically calculate appropriate PID parameters, operators only need to make fine adjustments without requiring much work experience.
[0069] Figure 3 is a schematic diagram showing a temperature control device according to an embodiment of this application. This temperature control device utilizes a target temperature control system that implements temperature control using a PID algorithm and includes the following modules.
[0070] The test module performs tests and calculations on the test temperature control system and obtains test control parameters based on different test temperature control data.
[0071] The analysis module determines a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters.
[0072] The decision module determines the target control parameters corresponding to the target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve.
[0073] The calculation module calculates the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal.
[0074] The target temperature control system includes a pump and a compressor, and the test temperature control data includes test temperature data and test flow rate data.
[0075] The step of determining a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters includes the step of determining a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data by analyzing the test temperature data, the test flow velocity data and the test control parameters.
[0076] The step of determining a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data by analyzing the test temperature data, the test velocity data and the test control parameters includes the step of analyzing a second rule relationship in which the test control parameters change according to the test temperature data under the same conditions of the test velocity data, and the step of obtaining the first rule relationship from the second rule relationship based on each of the test velocity data.
[0077] The aforementioned target temperature control data includes target temperature data and target flow velocity data.
[0078] The step of determining target control parameters corresponding to target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve includes the steps of selecting a third rule relationship corresponding to the target flow velocity data from the second rule relationship and substituting the target temperature data into the third rule relationship to determine target control parameters corresponding to the target temperature data.
[0079] The steps of performing tests and calculations on a test temperature control system and obtaining test control parameters based on different test temperature control data include the steps of obtaining a sampling temperature curve of the test temperature control system in a preset operating mode, and calculating test control parameters based on different test temperature control data based on a preset calculation method and the sampling temperature curve.
[0080] The aforementioned target control parameters include a target proportional parameter, a target integral parameter, and a target differential parameter.
[0081] The step of calculating the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal includes the step of calculating the target control signal based on the target proportional parameter and error, the target integral parameter and error integral, and the rate of change of the target differential parameter and error in order to adjust the target temperature control system based on the target control signal.
[0082] The aforementioned error integral is obtained by fine-tuning as follows.
[0083] Based on the fine-tuning items obtained from the aforementioned error and adjustment coefficient, the error integral is adjusted to obtain the adjusted error integral.
[0084] As shown in Figure 4, an embodiment of the present application provides an electronic device for performing the temperature control method according to the present application. This electronic device includes a processor, a memory storing a computer program that can be executed by the processor, and a bus, wherein the processor executes the computer program to perform the steps of the temperature control method described above.
[0085] Specifically, the memory and processor described above may be general-purpose memory and processor, and are not particularly limited in this specification. The above-described temperature control method can be realized by executing a computer program stored in memory using the processor.
[0086] Depending on the temperature control method according to this application, embodiments of this application further provide a computer-readable storage medium. This computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the above-described temperature control method.
[0087] Specifically, this storage medium may be a general-purpose storage medium such as a portable magnetic disk or hard disk, and when executed, it stores a computer program that can implement the temperature control method described above.
[0088] In the embodiments of this application, the systems and methods described can be implemented in other ways. The embodiments of the apparatus described above are illustrative only. For example, the unit divisions are merely logical functional divisions and may be different in actual implementation. For example, multiple units or components may be combined or integrated into another system, or some features may be omitted or not implemented. Furthermore, the mutual coupling, direct coupling or communication connection shown or discussed may be an indirect coupling or communication connection via several interfaces, systems or units, and may be an electrical, mechanical or other type of connection.
[0089] The units described above as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in the same location or distributed across multiple network units. To achieve the objectives of this embodiment, it is possible to select some or all of the units according to actual requirements.
[0090] Furthermore, each functional unit in the embodiments of this application may be integrated into a single processing unit, function as an independent physical entity, or two or more units may be integrated into a single unit.
[0091] The aforementioned functions can be implemented in the form of a software function unit, which, when sold or used as an independent product, can be stored on a computer-readable storage medium. From this understanding, the technical proposal of this application, or any part thereof that contributes to the prior art, or any part thereof, can be implemented in the form of a software product. This computer software product is stored on a storage medium and includes a plurality of commands for a computer device (such as a personal computer, server, or network device) to perform all or part of the steps of the above method in each embodiment of this application. The storage medium includes various media capable of storing program code, such as USB disks, portable hard disks, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.
[0092] Furthermore, similar symbols indicate the same thing in the drawings; therefore, if a symbol is defined in one drawing, it is unnecessary to define or interpret it further in other drawings. Also, terms such as "first," "second," and "third" should be understood as being for explanatory purposes only and not as to explicitly or implicitly indicate relative importance.
[0093] Finally, it is important to note that the above embodiments are merely specific embodiments for illustrating the technical proposal of this application and do not limit this application; therefore, the scope of protection of this application is not limited thereto. Although this application has been explained in detail using the above embodiments, it goes without saying that a person skilled in the art can propose improvements or modifications to the technical proposal described in the above embodiments within the scope of the technical scope disclosed in this application, or can make equivalent substitutions to some of the technical features therein. The essence of the technical proposals to which these improvements, modifications, or substitutions apply does not deviate from the spirit and scope of the technical proposal as exemplified by the embodiments of this application, and all of them fall within the scope of protection of this application. For this reason, the scope of protection of this application should be in accordance with the claims.
Claims
1. A temperature control method applicable to a target temperature control system that implements temperature control using a PID algorithm, The steps include: performing tests and calculations on the test temperature control system to obtain test control parameters based on different test temperature control data; The steps include determining a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters, A step of determining a target control parameter corresponding to the target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve, The step of calculating the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal, is included. A method for controlling temperature characterized by the following:
2. The target temperature control system includes a pump and a compressor, and the test temperature control data includes test temperature data and test flow rate data. The step of determining a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters is: The step includes determining a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data by analyzing the test temperature data, the test flow velocity data and the test control parameters. The temperature control method according to feature 1.
3. The step of determining a first rule relationship in which the test control parameters change according to the test temperature data and the test flow velocity data by analyzing the test temperature data, the test flow velocity data and the test control parameters is: Under the same conditions as the aforementioned test flow velocity data, the step of analyzing a second rule relationship in which the test control parameters change according to the test temperature data, The step of obtaining the first rule relationship from the second rule relationship based on each of the test flow velocity data, The temperature control method according to feature 2.
4. The aforementioned target temperature control data includes target temperature data and target flow velocity data. The step of determining the target control parameters corresponding to the target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve is: A step of selecting a third rule relationship corresponding to the target flow velocity data from the second rule relationship, The step includes substituting the target temperature data into the third rule relationship and determining the target control parameter corresponding to the target temperature data. The temperature control method according to feature 3.
5. The steps of performing tests and calculations on a test temperature control system and obtaining test control parameters using different test temperature control data are as follows: The steps include: acquiring a sampling temperature curve of the test temperature control system in a pre-set operating mode; The step includes calculating test control parameters based on different test temperature control data, based on a preset calculation method and the sampling temperature curve. The temperature control method according to feature 1.
6. The aforementioned target control parameters include a target proportional parameter, a target integral parameter, and a target differential parameter. The step of calculating the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal is: The process includes the step of calculating the target control signal based on the target proportional parameter and error, the target integral parameter and error integral, and the rate of change of the target differential parameter and error, in order to adjust the target temperature control system based on the target control signal. The temperature control method according to feature 1.
7. Based on the fine-tuning items obtained from the aforementioned error and adjustment coefficient, the error integral is adjusted to obtain the adjusted error integral. The temperature control method according to feature 6.
8. A temperature control device applied to a target temperature control system that implements temperature control using a PID algorithm, A test module that performs tests and calculations on a test temperature control system and obtains test control parameters based on different test temperature control data, An analysis module that determines a first rule relationship between the test temperature control data and the test control parameters by analyzing the test temperature control data and the test control parameters, A decision module that determines target control parameters corresponding to the target temperature control data based on the first rule relationship and the target temperature control data that the target temperature control system should achieve, Includes a calculation module that calculates the target control signal according to the target control parameters in order to adjust the target temperature control system based on the target control signal. A temperature control device characterized by the following.
9. Electronic devices, The electronic device includes a processor, a memory storing machine-readable commands that can be executed by the processor, and a bus, wherein when the electronic device is in operation, the processor communicates with the memory via the bus and executes the machine-readable commands to implement a step of the temperature control method according to any one of claims 1 to 7. An electronic device characterized by the following features.
10. The processor stores a computer program that, when executed, implements the steps of the temperature control method described in any one of claims 1 to 7. A computer-readable storage medium characterized by the following features.