System for evaluating differences between devices

The specimen analysis system automates inter-device difference evaluations by using multiple measurement units and a computer system to reduce operator burden and ensure consistent measurement results across devices.

JP2026109557APending Publication Date: 2026-07-01SYSMEX CORP

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
SYSMEX CORP
Filing Date
2025-11-18
Publication Date
2026-07-01

AI Technical Summary

Technical Problem

Existing inter-device difference evaluations in specimen measurement systems require significant operator involvement, leading to a heavy burden on operators.

Method used

A specimen analysis system comprising multiple measurement units, an identification information reading unit, and a computer with storage and processing capabilities to automate the inter-device difference evaluation process, including measurement result storage and analysis.

Benefits of technology

Reduces the operator burden by automating the inter-device difference evaluation process, ensuring accurate and compatible measurements across multiple measurement units.

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Abstract

To reduce the burden on operators when performing inter-device difference evaluations. [Solution] An example of a sample analysis system comprises a plurality of measurement units, an identification information reading unit, and a computer. The measurement results of a sample are obtained from at least one of the plurality of measurement units and stored in the computer's storage device in association with the identification information of the measured sample. The computer is configured to perform processing for inter-device difference evaluation, which includes identifying a set of multiple measurement results obtained from a plurality of target measurement units that meet the conditions for use in inter-device difference evaluation, and generating evaluation information for inter-device difference evaluation based on the set of multiple measurement results.
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