System for evaluating differences between devices
The specimen analysis system automates inter-device difference evaluations by using multiple measurement units and a computer system to reduce operator burden and ensure consistent measurement results across devices.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- SYSMEX CORP
- Filing Date
- 2025-11-18
- Publication Date
- 2026-07-01
AI Technical Summary
Existing inter-device difference evaluations in specimen measurement systems require significant operator involvement, leading to a heavy burden on operators.
A specimen analysis system comprising multiple measurement units, an identification information reading unit, and a computer with storage and processing capabilities to automate the inter-device difference evaluation process, including measurement result storage and analysis.
Reduces the operator burden by automating the inter-device difference evaluation process, ensuring accurate and compatible measurements across multiple measurement units.
Smart Images

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