Beam monitoring device
The beam monitoring device uses a beam splitter and wedge substrate to accurately measure high-power laser light shape and intensity, reducing sensor costs and enabling quick abnormality detection, addressing the challenges of existing systems.
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- MITSUBISHI HEAVY IND LTD
- Filing Date
- 2024-12-20
- Publication Date
- 2026-07-02
AI Technical Summary
Existing systems for monitoring high-power laser light struggle with accuracy and difficulty in measuring shape and light intensity, particularly when using sensors on the output side, and are unable to effectively handle high-power laser light.
A beam monitoring device employing a beam splitter that transmits and reflects laser light to separate components for shape and intensity measurement, utilizing a wedge substrate to ensure accurate measurement without the need for high-intensity sensors, and includes a control unit for abnormality detection.
Enables easy monitoring of high-power laser light shape and intensity with reduced sensor costs and miniaturization, allowing for timely detection of abnormalities and protection of the laser system.
Smart Images

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