In-line terahertz measuring apparatus and method for manufacturing dry electrode films

Abstract

The present invention provides a system and method for processing dry electrode films, comprising a roller system, a terahertz measuring device, and a dry electrode powder mixture dispenser. [Solution] The measuring device 150 may include a terahertz source and a terahertz sensor. Such a terahertz source may be emitted toward the upper and lower surfaces of the dry electrode film 120 and reflected toward the terahertz sensor to measure the physical properties of the dry electrode film.

Description

Technical Field

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[0001] [Cross - Reference to Related Applications] This application claims the benefit of priority of U.S. Patent Application No. 18 / 937,956, filed on November 5, 2024, entitled "INLINE TERAHERTZ MEASUREMENT DEVICE FOR DRY ELECTRODE FILM MANUFACTURING, AND METHODS THEREOF (Dry electrode film manufacturing inline terahertz measurement device and method thereof)", which is hereby incorporated by reference in its entirety for all purposes.

[0002] This disclosure relates to a system for manufacturing a dry electrode film and a method of processing the same. In particular, the method relates to processing and calibrating a system for processing a dry electrode film using a terahertz source and a sensor.

Background Art

[0003] [[ID=I7]] Dry electrode films for energy storage devices incorporate a binder material combined with an active electrode material. Dry electrode films are manufactured by calendaring a powder mixture without using a solvent, resulting in unique manufacturing processes and potential assembly challenges. For example, the properties of wet solvent - formed electrode films can be controlled by the slurry deposition process, but dry electrode films are formed on a calender roll before being deposited on a current collector to form an electrode. Therefore, other methods and systems specifically targeted at controlling the properties of dry electrode films may be useful.

Summary of the Invention

[0004] For the purpose of summarizing the advantages achieved by the present invention and the prior art, specific purposes and advantages of the present invention are described herein. Not all such purposes or advantages can be achieved in any particular embodiment of the present invention. Therefore, for example, those skilled in the art will recognize that the present invention may be embodied or implemented to achieve or optimize one or a group of advantages taught herein, without necessarily achieving other purposes or advantages that may be taught or suggested herein.

[0005] In some embodiments, a system for processing a dry electrode film is described. The system for processing a dry electrode film comprises a roller system having a calender roller; a measuring device disposed on the calender roller and comprising a terahertz source and a terahertz sensor, wherein the terahertz source is configured to emit terahertz radiation pulses and the terahertz sensor is configured to detect the terahertz reflection of the terahertz radiation pulses; and a dry electrode powder mixture dispenser, wherein the dry electrode powder mixture dispenser is configured to distribute the dry electrode material onto the calender roller, and the terahertz source is located in line with the terahertz sensor.

[0006] In some embodiments, the system further comprises an additional calendar roller and an additional measuring device, the additional measuring device being positioned on the additional calendar roller. In some embodiments, the terahertz radiation pulse includes spot size, peak width, frequency, or any combination thereof. In some embodiments, the spot size includes a diameter of about 0.05 to 0.5 mm. In some embodiments, the frequency is about 0.05 to 5.0 THz. In some embodiments, the peak width is about 1 to 5 ps. In some embodiments, the terahertz sensor is configured to measure physical properties selected from the group consisting of mass density, load (loading), uniformity, thickness, basis weight, and combinations thereof. In some embodiments, the terahertz sensor is configured to measure the time of flight of the terahertz radiation pulse, the intensity of the terahertz radiation pulse, the intensity of the terahertz reflection, or any combination thereof. In some embodiments, the terahertz sensor is configured to measure the intensity of the terahertz reflection. In some embodiments, the system further comprises a current collector dispenser.

[0007] In some embodiments, a method for calibrating the system is described. The method involves placing a dry electrode film on a calendar roller, wherein the dry electrode film includes a marker and a film region downstream of the marker, the film region including a first main surface and a second main surface opposite to the first main surface; emitting a terahertz radiation pulse from a terahertz source to the marker to form a marker reflection; detecting the marker reflection using a terahertz sensor; emitting a terahertz radiation pulse from a terahertz source to the film region at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; detecting the first terahertz reflection at a second time point using a terahertz sensor; detecting the second terahertz reflection at a third time point using a terahertz sensor; and sampling the film region.

[0008] In some embodiments, a method for processing a dry electrode film is described. The method includes placing a dry electrode film on a calendar roller, wherein the dry electrode film includes a first main surface and a second main surface opposite to the first main surface; rotating the calendar roller to form a moving dry electrode film; emitting a terahertz radiation pulse onto the moving dry electrode film at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; detecting the first terahertz reflection at a second time point with a terahertz sensor; and detecting the second terahertz reflection at a third time point with a terahertz sensor.

[0009] In some embodiments, the method further includes determining the flight time of a first principal plane by quantifying the difference between a first time point and a second time point, and determining the flight time of a second principal plane by quantifying the difference between a first time point and a third time point. In some embodiments, the method further includes determining the intensity of a terahertz radiation pulse at a first time point, determining the intensity of a first terahertz reflection at a second time point, and determining the intensity of a second terahertz reflection at a third time point. In some embodiments, emitting a terahertz radiation pulse includes projecting a spot size, peak width, frequency, or any combination thereof. In some embodiments, the spot size includes a diameter of about 0.05 to 0.5 mm. In some embodiments, the frequency is at least 0.05 terahertz to 5.0 terahertz or less. In some embodiments, the peak width is at least 1.0 picosecond to 5 picoseconds or less. In some embodiments, detection involves determining physical properties selected from the group consisting of mass density, load, uniformity, thickness, basis weight, and combinations thereof. In some embodiments, the method further includes placing a current collector on a dry electrode film. In some embodiments, the method further includes distributing a dry electrode material onto a calender roller, the dry electrode material comprising a dry powder. [Brief explanation of the drawing]

[0010] [Figure 1] This is a cross-sectional view of a measuring device, according to several embodiments, that is positioned on a dry electrode material placed on a calendar roller.

[0011] [Figure 2] This is a cross-sectional view of a system for processing a dry electrode film, including a measuring device, according to several embodiments.

[0012] [Figure 3] This is a cross-sectional view of a system for processing a dry electrode film in operation, according to several embodiments.

[0013] [Figure 4A] This is a cross-sectional view of a calibration system for processing dry electrode films according to several embodiments.

[0014] [Figure 4B] This is a front view of a calibration system for processing dry electrode films according to several embodiments.

[0015] [Figure 5] This flowchart shows a method for calibrating a system for processing dry electrode films according to several embodiments.

[0016] [Figure 6] This flowchart shows a method for processing a dry electrode film according to several embodiments. Detailed description of the invention

[0017] While certain preferred embodiments and examples are disclosed below, the subject matter of the present invention extends beyond the specifically disclosed embodiments to other alternative embodiments and / or uses, as well as their modifications and equivalents. Therefore, the appended claims are not limited by any of the specific embodiments described below. For example, in any method or process disclosed herein, the action or operation of the method or process may be performed in any suitable order, and is not necessarily limited to any specific disclosed order. Various operations may be described as a number of separate operations in a manner that may be helpful in understanding a particular embodiment; however, the order of description should not be interpreted as meaning that these operations are order-dependent. Furthermore, the structures, systems, and / or apparatus described herein may be embodied as integrated components or as separate components. For the purpose of comparing various embodiments, specific aspects and advantages of these embodiments are described. Not all such aspects or advantages are necessarily achieved by a particular embodiment. Therefore, for example, various embodiments may be performed to achieve or optimize one or a group of advantages taught herein without necessarily achieving other aspects or advantages that may be taught or suggested herein.

[0018] This paper describes a system and method for processing dry electrode films using a roller system and a terahertz source and sensor. Generally, there is no rapid feedback for controlling the uniformity of electrode basis weight and thickness during the manufacturing process. Conventionally, X-ray and beta-ray systems have been used to measure electrode basis weight, but these systems have safety concerns, are slow, lack the desired accuracy for desired tolerances, and use ionization sources that cannot report independent measurements from both sides of the electrode. Thus, terahertz pulses are emitted toward the dry electrode film, and their reflections are detected from the front and back surfaces of the dry electrode film. The thickness and basis weight values ​​of the dry electrode film are measured by comparing the time difference with the reflection intensity. The measurements are used as feedback for controlling the roller shear ratio, linear pressure, and gap offset. Variation in the measurements is used to monitor the non-uniformity of the manufactured film.

[0019] Furthermore, a method for calibrating a system for processing dry electrode films is described. Generally, there is a lack of methods for monitoring and calibrating a system for processing dry electrode films while the film is being processed. An automated process has been developed to optimize and improve the calibration of in-line loading and thickness measurement in cell manufacturing using gauges with small spot sizes. A method for calibrating such a system makes it possible to minimize residual errors in the target value caused by errors in offline punch placement and sizing. The signal collected for the measuring gauge is evaluated and calibrated against the offline measurement, and the sample on the roller is transported and scanned by the measuring gauge. The collected terahertz radiated signal is processed using the calibration method to ensure the uniformity of the dry electrode film while it is being processed.

[0020] As a result of processing dry electrode films using terahertz radiation, the physical properties of the dry electrode films are monitored in situ and during the manufacturing process, helping to reduce manufacturing time, improve the accuracy of desired tolerances for the desired quality of the dry electrode films, and provide independent measurements from both sides of the dry electrode film. For example, in-situ monitoring of the physical properties of dry electrode films facilitates scaling up production, reduces the cost and complexity of assembly equipment and / or increases the reliability of the cells. System for processing dry electrode films

[0021] A system for processing dry electrode films, including a roller system and a measuring device, is described. Figure 1 is a diagram of a system 100 for processing dry electrode films, including a measuring device 150 positioned on a dry electrode film 120 placed on a calendar roller 110. The measuring device 150 includes a terahertz source configured to emit terahertz radiation pulses 130 and a terahertz sensor configured to detect a first terahertz reflection 140A and a second terahertz reflection 140B of the terahertz radiation pulses 130. As shown in Figure 1, the terahertz radiation pulse 130 is emitted toward the dry electrode film 120, a portion of which is reflected toward the measuring device 150 as a first terahertz reflection 140A from the first main surface 120A of the dry electrode film 120 facing the measuring device 150, and another portion of which is reflected toward the measuring device 150 as a second terahertz reflection 140B from the second main surface 120B of the dry electrode film 120 facing the calendar roller 110. The measuring device 150 is positioned above the calendar roller 110 at an angle of 0° with respect to the central axis of the calendar roller 110. As shown in Figure 1, the measuring device 150 includes both a terahertz source and a terahertz sensor such that the terahertz source and the terahertz sensor are in line with each other.

[0022] In some embodiments, the dry electrode film can contain a dry active material. For example, the dry electrode film may be dried from a dry powder. In some embodiments, the dry electrode film can include a first major surface and a second major surface. For example, the first major surface may include the surface that is in direct contact with the calendar roller, and the second major surface may include the upper surface that is not in direct contact with the calendar roller.

[0023] [[ID=P4]]In some embodiments, the measuring device may be disposed above the calendar such that the terahertz radiation pulse includes a direction that is substantially perpendicular to the circumference of the calendar roller. For example, the measuring device can include a position above the calendar roller such that the terahertz radiation pulse includes a direction that is vertically downward toward the calendar roller. In some embodiments, the measuring device can include a position above, below, or any position in between along the circumference of the calendar roller. In some embodiments, the measuring device can include a terahertz sensor and an in-line terahertz source. In some embodiments, the measuring device can have a position that is at an angle of 0°, 45°, 90°, 135°, 180°, 225°, 270°, 315°, 360°, or any angle range in between with respect to the circumference of the calendar roller. In some embodiments, the measuring device may be disposed above the dry electrode film disposed on the calendar roller. In some embodiments, the terahertz radiation pulse includes a direction that is substantially perpendicular to the surface of the dry electrode film. For example, the measuring device can include a position above the dry electrode film such that the terahertz radiation pulse includes a direction that is vertically downward toward the dry electrode film. In some embodiments, the measuring device is configured to measure physical properties selected, for example, from mass density, loading, uniformity, thickness, basis weight, and combinations thereof.

[0024] In some embodiments, the terahertz radiation pulse can include a direction towards a dry electrode film disposed on a calendar roller, and the first terahertz reflection and the second terahertz reflection can include a direction away from the dry electrode film. In some embodiments, the measuring device can be configured to detect the first terahertz reflection, the second terahertz reflection, or both. For example, the measuring device can include a terahertz sensor configured to detect the first terahertz reflection, the second terahertz reflection, or both.

[0025] In some embodiments, the terahertz radiation pulse can include a spot size, a peak width, a frequency, or any combination thereof. In some embodiments, the radiation pulse may be reflected by the first major surface, the second major surface, and / or both. In some embodiments, the radiation pulse can be reflected by the first major surface, resulting in a first terahertz reflection. In some embodiments, the radiation pulse can be reflected by the second major surface, resulting in a second terahertz reflection. In some embodiments, the time between the emission of the terahertz radiation pulse and the detection of the first and / or second terahertz reflections can be measured. For example, the terahertz radiation pulse can be emitted at a first time point, the first terahertz reflection can be detected at a second time point, and the second terahertz reflection can be detected at a third time point. In some further embodiments, the intensity of the radiation pulse can be detected at a first time point during radiation from the terahertz source, and the intensity of the first and / or second terahertz reflections can be detected at the time of detection by the terahertz sensor. For example, the terahertz radiation pulse can include a first intensity, the first terahertz reflection can include a second intensity, and the second terahertz reflection can include a third intensity.

[0026] A system for processing dry electrode films includes at least a roller system, a measuring device, and a dry electrode powder mixture dispenser. Figure 2 is a diagram of a system 200 for processing dry electrode films 220. As shown in Figure 2, the roller system includes calender rollers 210A, 210B, 210C, 210D, 210E, 210F, 210G, 210H, 210I, and 210J, each calender roller (e.g., 210H) configured to form dry electrode films from the electrode powder mixture and / or to move the dry electrode films 220A and B across the system 200. It should be understood that each calendar roller 210A, 210B, 210C, 210D, 210E, 210F, 210G, 210H, 210I, and 210J can be configured to operate independently of other calendar rollers, or to operate synchronously and / or in coordination with one or more of the other calendar rollers 210. As shown in Figure 2, the two calendar roller systems (i.e., the system including 210A, 210B, 210C, 210D, and 210E, and the system including 210F, 210G, 210H, 210I, and 210J) are configured to be mirror images of each other. Calendar rollers 210A, 210B, 210C, 210D, and 210E are configured to move the first dry electrode film 220A across the system 200 in a first direction, and calendar rollers 210F, 210G, 210H, 210I, and 210J are configured to move the second dry electrode film 220B across the system 200 in a second direction, the second direction being opposite to the first direction. The first dry electrode film 220A and the second dry electrode film 220B are moved across the system 200 so that they are joined at the central axis of the system 200. As shown in Figure 2, the first dry electrode film 220A is configured to be joined with the second dry electrode film 220B after being positioned on the calendar rollers 210E and 210F, respectively.As further shown in Figure 2, a first dry electrode film 220A and a second dry electrode film 220B are joined together, and a current collector 260 positioned between the first dry electrode film 220A and the second dry electrode film 220B forms a dry double-sided electrode 270. It should be understood that the system may include a single dry electrode film if there is no second electrode film to join. Furthermore, even if a second dry electrode film is absent, a current collector can be joined to a single dry electrode film.

[0027] System 200 also includes measuring devices 250A, 250B, 250C, 250D, 250E, and 250F. Each of the measuring devices 250A, 250B, 250C, 250D, 250E, and 250F includes a terahertz source and a terahertz sensor configured in line with each other (or arranged on the same line). Furthermore, each of the measuring devices 250A, 250B, 250C, 250D, 250E, and 250F is positioned either above (e.g., 250A) or below (e.g., 250B) one of the calendar rollers (e.g., 250A is above 210C). Each of the measuring devices 250A, 250B, 250C, 250D, 250E, and 250F is configured to emit a terahertz pulse 130 toward the dry electrode film 220 and to detect a first terahertz reflection and a second terahertz reflection. It should be understood that each of the measuring devices 250A, 250B, 250C, 250D, 250E, and 250F does not need to be configured to emit the same terahertz radiation pulse and / or measure the same characteristics of the terahertz reflection. Alternatively, some measuring devices may be able to detect the terahertz reflection and measure its intensity, while others may be able to detect the terahertz reflection and record its detection time.

[0028] As shown in Figure 2, the system 200 includes dry electrode powder mixture dispensers 240A and 250B. The dry electrode powder mixture dispensers 240A and 250B are positioned at the starting position of each roller system and are configured to contain and distribute the dry electrode materials 230A and 250B into the system 200. The dry electrode materials 230A and 250B are distributed onto calender rollers, shown here as 210A and 210J, from which they are processed into a dry electrode film 220.

[0029] Figure 3 is a cross-sectional view of system 300 for processing dry electrode film, with some added details compared to the roller system of Figure 2 in operation. As shown in Figure 3, the roller system includes calendar rollers 310A, 310B, 310C, 310D, and 310E. As shown in Figure 3, system 300 includes a measuring device 350 which includes a terahertz source 351 configured to emit terahertz radiation pulses 360 and a terahertz sensor 352 configured to detect terahertz signals such as a first terahertz reflection 370A and a second terahertz reflection 370B of the terahertz radiation pulses 360. The terahertz radiation pulse 360 ​​is emitted toward the dry electrode film 320, and a portion of the terahertz radiation pulse 360 ​​is reflected toward the terahertz sensor 352 from the first main surface 320A of the dry electrode film 320 facing the measuring device 350 as a first terahertz reflection 370A, and another portion of the terahertz radiation pulse 360 ​​is reflected toward the measuring device 350 from the second main surface 320B of the dry electrode film 320 facing the calendar roller 310C as a second terahertz reflection 370B. The system 300 includes a dry electrode powder mixture dispenser 340. The dry electrode powder mixture dispenser 340 is positioned at the starting position of each roller system and is configured to contain and distribute the dry electrode material 330 into the system 300. The dry electrode material 330 is distributed between the nip formed between the calender rollers 310A and 310B, from which the dry electrode film 320 is formed, and is further processed by the calender rollers 310C, 310D, and 310E.

[0030] In some embodiments, the roller system may include one or more calendar rollers and / or one or more measuring devices. In some embodiments, one or more measuring devices may be positioned at 0°, 45°, 90°, 135°, 180°, 225°, 270°, 315°, 360°, or any angle range in between, relative to the circumference of each of the one or more calendar rollers. In some embodiments, each calendar roller includes two or more measuring devices positioned on it. In some embodiments, at least one of the one or more calendar rollers does not include any measuring devices positioned on it.

[0031] In some embodiments, the dry electrode powder mixture dispenser can be configured to store and dispense dry electrode material into the system. For example, the dry electrode powder mixture dispenser can be configured to store dry powder and distribute the dry powder to at least one of one or more calender rollers.

[0032] In some embodiments, one or more calender rollers may be configured to move a dry electrode film. In some further embodiments, one or more calender rollers may be configured to move a dry electrode film across a system for processing. In some embodiments, one or more measuring devices may be configured to emit terahertz radiation pulses as the dry electrode film moves across the system. In some embodiments, one or more measuring devices may be configured to detect a first terahertz reflection, a second terahertz reflection, or both as the dry electrode film moves across the system.

[0033] In some embodiments, one or more measuring devices may be configured to measure physical properties such as mass density, load, uniformity, thickness, basis weight, or a combination thereof, as the dry electrode film moves across the system. In some embodiments, each of the one or more measuring devices may be configured to measure different physical properties. For example, one measuring device may be configured to measure the loading of the dry electrode film, while the other measuring device may be configured to measure the uniformity of the dry electrode film.

[0034] In some further embodiments, the system may include a current collector dispenser configured to distribute current collectors. For example, the current collector dispenser may be located on one or more calendar rollers and configured to distribute current collectors. In some embodiments, the current collectors may be located on a dry electrode film. In some embodiments, the current collectors may be combined with a dry electrode film. For example, the current collectors may be located between a first dry electrode film and a second dry electrode film. In some embodiments, the current collectors may be combined with a single dry electrode film. Calibration system and method for processing dry electrode films

[0035] Figures 4A and 4B are cross-sectional and front views 400 and 401, respectively, of a calibration system for processing a dry electrode film 420. A terahertz source 430 is positioned on the dry electrode film 420, which is positioned on a calendar roller 410. The dry electrode film 420 includes a marker 450, and the terahertz source 430 is configured to emit terahertz radiation pulses of the marker, which is configured to detect the marker 450. The marker 450 is configured to distinguish film regions 440, which include one or more film region samples 440A, 440B, and 440C. The first film region sample 440A, the second film region sample 440B, and the third film region sample 440C are evaluated for physical properties, e.g., mass density, load, uniformity, thickness, basis weight, and / or combinations thereof.

[0036] In some embodiments, a calibration system for processing dry electrode films may include one or more samples. For example, a sampling area may include one or more samples configured to be excised for further evaluation. As a further example, a sample may be excised and analyzed for physical properties including, but not limited to, mass density, load, uniformity, thickness, basis weight, and / or combinations thereof. In some embodiments, the physical properties of a sample are compared with measurements detected by a measuring device. For example, terahertz reflection detected by a measuring device may correspond to a measurement of physical properties, and these physical properties are compared with physical properties measured in the sample to calibrate and / or determine the accuracy of the measuring device.

[0037] Figure 5 is a flowchart of a method 500 for calibrating a system for processing a dry electrode film. The calibration method 500 begins by placing the dry electrode film on a calendar roller 510. The dry electrode film includes a marker and a film region downstream of the marker. Furthermore, the dry electrode film has a first principal surface and a second principal surface. The next step 520 includes emitting a marker terahertz radiation pulse from a terahertz source positioned inline with a terahertz sensor such that the terahertz radiation pulse from the marker contacts the dry electrode film and is reflected back toward the terahertz sensor. The terahertz sensor then detects the marker reflection 530. Step 540 includes emitting a terahertz radiation pulse from the terahertz source toward the film region at a first time point to form a first terahertz reflection from the first principal surface and a second terahertz reflection from the second principal surface. The next step 550 includes detecting a first terahertz reflection at a second time point using a terahertz sensor, and detecting a second terahertz reflection at a third time point using a terahertz sensor. Subsequently, in step 560, the film region is sampled.

[0038] In some embodiments, the calibration method begins by placing a dry electrode film on a calendar roller. For example, the dry electrode film may include a marker and a film region downstream of the marker. In a further example, the film region may include a first principal surface and a second principal surface opposite the first principal surface. In some embodiments, the method may include emitting a terahertz radiation pulse from a terahertz source to the marker to form a marker reflection. In some embodiments, the first and second marker reflections can be detected from the first and second marker principal surfaces, respectively. For example, detecting the marker reflection can alert the terahertz sensor that the film region is beneath it. In some embodiments, the method may include detecting the marker reflection using a terahertz sensor. In some embodiments, the method may include emitting a terahertz radiation pulse from a terahertz source to the film region at a first time point to form a first terahertz reflection from the first principal surface and a second terahertz reflection from the second principal surface. In some embodiments, the method may include detecting a first terahertz reflection at a second time point using a terahertz sensor and detecting a second terahertz reflection at a third time point using a terahertz sensor. In some embodiments, the method may include sampling a film region. For example, sampling a film region may include physically removing one or more samples from the film region. Processing method for dry electrode film

[0039] Figure 6 is a flowchart of a method for processing a dry electrode film 600. The method for processing a dry electrode film begins by placing the dry electrode film on a calendar roller 610, the dry electrode film having a first main surface and a second main surface opposite the first main surface. Method 600 includes a step 620 of rotating the calendar roller to form a moving dry electrode film. Next, Method 600 includes a step 630 of radiating a terahertz radiation pulse onto the moving dry electrode film at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface. Subsequently, Method 600 includes a step 640 of detecting the first terahertz reflection at a second time point and detecting the second terahertz reflection at a third time point.

[0040] In some embodiments, a method for processing a dry electrode film may include evaluating its physical properties using a terahertz sensor. For example, the physical properties may include mass density, load, uniformity, thickness, basis weight, and combinations thereof. In some embodiments, the method may further include combining a current collector on the dry electrode film. For example, arranging may include bonding a current collector between two dry electrode films. As a further example, bonding a current collector between two dry electrode films may include embedding a current collector between two dry electrode films. In some embodiments, the method includes determining the time of flight of a first principal plane by quantifying the difference between a first time point and a second time point, and determining the time of flight of a second principal plane by quantifying the difference between a first time point and a third time point. In some embodiments, the method further includes determining the intensity of a terahertz radiation pulse at the first time point. In some embodiments, the method includes determining the intensity of a first terahertz reflection at a second time point and / or determining the intensity of a second terahertz reflection at a third time point. In some embodiments, the method includes emitting a terahertz radiation pulse, which includes projecting a spot size, peak width, frequency, or any combination thereof. In some embodiments, the spot size diameter of the terahertz radiation pulse is approximately, at least, or at least approximately, 0.05 mm, 0.1 mm, 0.15 mm, 0.2 mm, 0.25 mm, 0.3 mm, 0.35 mm, 0.4 mm, 0.45 mm, 0.5 mm, 0.55 mm, 0.6 mm, 0.65 mm, 0.7 mm, 0.75 mm, 0.8 mm, 0.85 mm, 0.9 mm 0.95mm, 1mm, 1.05mm, 1.10mm, 1.15mm, 1.2mm, 1.25mm, 1.3mm, 1.35mm, 1.4mm, 1.45mm, 1.5mm, 1.55mm, 1.6mm, 1.65mm, 1.7mm, 1.75mm, 1.8mm, 1.85mm, 1.9mm, 1.95mm, or 2mm, or any range of values ​​between these.In some embodiments, the frequency of the terahertz radiation pulse is approximately, at least, or at least about, 0.05 terahertz, 0.1 terahertz, 0.2 terahertz, 0.3 terahertz, 0.4 terahertz, 0.5 terahertz, 0.6 terahertz, 0.7 terahertz, 0.8 terahertz, 0.9 terahertz, 1.0 terahertz, 1.1 terahertz, 1.2 terahertz, 1.3 terahertz, 1.4 terahertz, 1.5 terahertz, 1.6 terahertz, 1.7 terahertz, 1.8 terahertz, 1.9 terahertz, 2.0 terahertz, 2.1 terahertz, 2.2 terahertz, 2.3 terahertz, 2.4 terahertz, 2.5 terahertz, 2.6 terahertz, 2.7 terahertz, 2.8 terahertz, 2.9 terahertz, 3.0 terahertz, 3.1 terahertz, 3.2 terahertz, 3.3 terahertz, 3.4 terahertz, 3.5 terahertz, 3.6 terahertz, 3.7 terahertz, 3.8 terahertz, 3.9 terahertz, 4.0 terahertz, 4.1 terahertz, 4.2 terahertz, 4.3 terahertz, 4.4 terahertz, 4.5 terahertz, 4.6 terahertz, 4.7 terahertz, 4.8 terahertz, 4.9 terahertz, 5.0 terahertz, or any range of values ​​between these. In some embodiments, the peak width of the terahertz radiation pulse is approximately, at most, or at most about 1 picosecond, 1.5 picoseconds, 2 picoseconds, 2.5 picoseconds, 3 picoseconds, 3.5 picoseconds, 4 picoseconds, 4.5 picoseconds, 5 picoseconds, or any range of values ​​in between. In some embodiments, emitting includes transmitting a terahertz radiation pulse from a terahertz sensor. In some embodiments, detecting includes determining physical properties such as, for example, mass density, load, uniformity, thickness, basis weight, and combinations thereof. In some embodiments, emitting a terahertz radiation pulse includes emitting a laser pulse. In some embodiments, detecting includes detection by a terahertz sensor. In some embodiments, the method further includes positioning the terahertz sensor perpendicular to the circumference of the calendr roller. In some embodiments, the method may further include forming a dry electrode film by adding a dry electrode material to the calendr roller.In some embodiments, the method may include storing the dry electrode material in a dry electrode powder mixture dispenser and distributing the dry electrode material onto a calender roller. Electrode film material and electrode film

[0041] Electrode film mixtures and electrode films formed using the apparatus and systems described herein. In some embodiments, one or more electrode film mixtures described herein can be combined with one or more other electrode film components and subsequently calendered to form an electrode film. Using the electrode films described herein, anodes and / or cathodes of energy storage devices, such as batteries, capacitors, capacitor-battery hybrids, fuel cells, and combinations thereof, can be formed. The energy storage devices can operate with or without lithium. For example, the electrode films can be bonded to a current collector of the anode or cathode to form electrodes, such as by using a lamination process. In some embodiments, the electrode films may be laminated on the current collector. In some embodiments, lamination is carried out at high temperatures (e.g., 50-100°C). In some embodiments, the electrode films can be used to manufacture batteries, such as lithium-ion batteries or other metal-ion batteries. In some embodiments, the electrode films can be used to manufacture ultracapacitors, such as electric double-layer capacitors (EDLCs). In some embodiments, the electrode films can be used to manufacture lithium-ion capacitors. The electrode films may be self-supporting electrode films.

[0042] In some embodiments, the electrode film may be a wet-processed electrode film. In some embodiments, the electrode film is prepared by a wet or slurry-based electrode manufacturing process. In some embodiments, the electrode film of the Disclosure may be a dry-processed electrode film. In some embodiments, the electrode film is prepared by a dry electrode manufacturing process. As used herein, a dry electrode manufacturing process may refer to a process that forms a dry electrode film without using or substantially without using a solvent. For example, the components of an active layer or electrode film comprising a carbon material and a binder may include, consist of, or essentially consist of dry particles. By combining dry particles to form an active layer or electrode film, a dry particle active layer mixture can be obtained.

[0043] In some embodiments, the active layer or electrode film formed from the electrode film mixture using a dry process may be free from or substantially free from any processing additives, such as solvents and resulting solvent residues. In some embodiments, the grinding process may be a dry process that is free from or substantially free from any processing additives, such as solvents and resulting solvent residues.

[0044] In some embodiments, the resulting active layer or electrode film is a self-supporting film formed using a dry process. In some embodiments, the resulting active layer or electrode film is a freestanding film formed using a dry process from an electrode film mixture. The process for forming the active layer or electrode film may include fibrillating a fibrillable binder component so that the film can contain a fibrillating binder. In further embodiments, the freestanding active layer or electrode film can be formed in the absence of a current collector. In even further embodiments, the active layer or electrode film may include a fibrillated polymer matrix so that the film is self-supporting. A matrix, grid, or web of fibrils can be formed to give the electrode film a mechanical structure.

[0045] In some embodiments, the electrode film includes a cathode active material. The cathode active material can form a dry electrode material (e.g., powder) as discussed herein. In some embodiments, the cathode active material may include, for example, a metal oxide, a metal sulfide, or a lithium metal oxide. The lithium metal oxide may be, for example, lithium nickel manganese cobalt oxide (NMC), lithium manganese oxide (LMO), lithium ferrous phosphate (LFP), lithium cobalt oxide (LCO), lithium titanate (LTO), and / or lithium nickel cobalt aluminum oxide (NCA). In some embodiments, the cathode active material may include, for example, layered transition metal oxides (LiCoO2 (LCO), Li(NiMnCo)O2 (NMC), and / or LiNi0.8Co0.15Al0.05O2 (NCA), etc.), spinel-type manganese oxides (LiMn2O4 (LMO), and / or LiMn1.5Ni0.5O4 (LMNO), etc.), olivine (LiFePO4, etc.), silicon, silicon oxide (SiOx), aluminum, tin, tin oxide (SnOx), manganese oxide (MnOx), molybdenum oxide (MoO2), molybdenum disulfide (MoS2), nickel oxide (NiOx), or copper oxide (CuOx). The cathode active material may also include sulfur, or materials containing sulfur such as lithium sulfide (Li2S), or other sulfur-based materials, or mixtures thereof.

[0046] In some embodiments, the electrode film includes an anode active material. The anode active material can form a dry electrode material (e.g., powder) as discussed herein. In some embodiments, the anode active material may include, for example, an insertion material (such as carbon, graphite, and / or graphene), an alloying / dealloying material (such as silicon, silicon oxide, tin, and / or tin oxide), a metal alloy or compound (such as Si-Al and / or Si-Sn), and / or a conversion material (such as manganese oxide, molybdenum oxide, nickel oxide, and / or copper oxide). The anode active material can be used alone or mixed together to form a multiphase material (such as Si-C, Sn-C, SiOx-C, SnOx-C, Si-Sn, Si-SiOx, Sn-SnOx, Si-SiOx-C, Sn-SnOx-C, Si-Sn-C, SiOx-SnOx-C, Si-SiOx-Sn, Sn-SiOx-SnOx, etc.). Examples of anode active materials include common natural graphite, synthetic or artificial graphite, surface-modified graphite, spheroidal graphite, flake graphite, and blends or combinations of these types of graphite, metal elements and their compounds, and metal-carbon composites for anodes.

[0047] In some embodiments, the electrode film mixture and / or electrode film comprises a carbon material configured to reversibly intercalate lithium ions. The carbon material can form part of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the electrode film comprises the carbon material in a total amount of about, at most, or at most about 20 wt%, 15 wt%, 10 wt%, 9 wt%, 8 wt%, 7 wt%, 6 wt%, 5 wt%, 4 wt%, 3 wt%, 2 wt%, 1 wt%, or any range of values ​​in between. In some embodiments, the lithium-intercalated carbon is selected from graphitic carbon, graphite, hard carbon, soft carbon, and combinations thereof. For example, the electrode film of an electrode may include a binder material and one or more of graphitic carbon, graphite, graphene-containing carbon, hard carbon, and soft carbon, and a conductivity-enhancing material. In some embodiments, the electrode is mixed with lithium metal and / or lithium ions.

[0048] In some embodiments, the electrode film mixture and / or electrode film comprises a conductive additive. The conductive additive material can form part of the dry electrode material (e.g., powder) discussed herein. In some embodiments, the conductive additive may include a conductive carbon additive. In some embodiments, the conductive carbon additive may be carbon black, carbon nanotubes, e.g., single-walled carbon nanotubes (SWCNTs) and multi-walled carbon nanotubes (MWCNTs). In some embodiments, the electrode film comprises the conductive additive in a total amount of about, at most, or at most about 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, 0.5% by weight, 0.25% by weight, 0.1% by weight, or any range of values ​​in between. In some embodiments, each electrode film is in an amount of approximately, at most, or at most about 10% by weight, 9% by weight, 8% by weight, 7% by weight, 6% by weight, 5% by weight, 4% by weight, 3% by weight, 2% by weight, 1% by weight, 0.5% by weight, 0.25% by weight, 0.1% by weight, or any range of values ​​in between. In some embodiments, the conductive additive is carbon black.

[0049] In some embodiments, the electrode film mixture may contain a binder (e.g., air-milled binder, air-milled fibrillable binder, air-milled fibrillable binder) in about 1% by weight, about 1.5% by weight, about 2% by weight, about 2.5% by weight, about 3% by weight, about 3.5% by weight, about 4% by weight, about 4.5% by weight, about 5% by weight, about 5.5% by weight, about 6% by weight, about 6.5% by weight, about 7% by weight, about 7.5% by weight, about 8% by weight, about 8.5% by weight, about 8.5% by weight, about 9% by weight, about 9.5% by weight, or about 10% by weight, or any range of values ​​in between, for example, about 1% by weight to about 10% by weight, where the weight percentage is based on the weight of the electrode film mixture.

[0050] In some embodiments, the binder (e.g., air-milled binder, air-milled fibrillable binder, air-milled fibrillated binder) may include a polymer binder. In some embodiments, the binder may include polytetrafluoroethylene (PTFE), polyolefins, polyalkylenes, polyethers, styrene-butadiene, polysiloxane and polysiloxane copolymers, branched polyethers, polyvinyl ethers, copolymers thereof, and / or mixtures thereof. The binder may also include cellulose, such as carboxymethylcellulose (CMC). In some embodiments, the polyolefin may include polyethylene (PE), polypropylene (PP), polyvinylidene fluoride (PVDF), copolymers thereof, and / or mixtures thereof. For example, the binder may include polyvinyl chloride, poly(phenylene oxide) (PPO), polyethylene-block-poly(ethylene glycol), poly(ethylene oxide) (PEO), poly(phenylene oxide) (PPO), polyethylene-block-poly(ethylene glycol), polydimethylsiloxane (PDMS), polydimethylsiloxane-coalkylmethylsiloxane, copolymers thereof, and / or mixtures thereof. In some embodiments, the binder may be a thermoplastic. In some embodiments, the binder may include a fibrillable polymer. Electrodes and energy storage devices

[0051] An energy storage system or device includes a positive electrode (i.e., a cathode), a negative electrode (i.e., an anode), a separator placed between them, and an electrolyte placed within a housing. Each electrode includes an electrode film placed on a current collector. In some embodiments, the current collector is foil. In some embodiments, the current collector is aluminum foil, copper foil, or a combination thereof. In some embodiments, the current collector may include a metallic material such as aluminum, nickel, copper, or a combination thereof. In some embodiments, the current collector includes a pure metal. In some embodiments, the current collector includes a metallized polymer film or a metal-coated polymer film. In some embodiments, the polymer includes polyethylene terephthalate (PET), biaxially oriented polypropylene (BOPP), or a combination thereof. In some embodiments, the metal coating includes aluminum. In some embodiments, coating the final electrode film mixture includes forming a uniform electrode film mixture coating. In some embodiments, the current collector has a thickness of approximately, or at most approximately, 200 μm, 100 μm, 50 μm, 40 μm, 30 μm, 20 μm, 15 μm, 10 μm, 5 μm, or any range of values ​​in between. In some embodiments, an active layer is disposed on both sides of the current collector. In some embodiments, the electrode is a double-sided electrode comprising two electrode films disposed on both sides of the current collector. In some embodiments, the double-sided electrode may include a current collector, an upper electrode film, and a lower electrode film. In some embodiments, each of the two electrode films may have any suitable shape, size, and thickness.

[0052] In some embodiments, the energy storage device includes an anode electrode positioned between two cathode electrodes. In some embodiments, the energy storage device is selected from the group consisting of cylindrical energy storage devices, stacked prismatic energy storage devices, and helically wound prismatic energy storage devices. In some embodiments, the energy storage device is a battery. In some embodiments, the energy storage device is a lithium-ion battery. In some embodiments, the energy storage device may be a battery, a capacitor, a capacitor-battery hybrid, a fuel cell, or a combination thereof.

[0053] In some embodiments, the energy storage device is charged with a suitable lithium-containing electrolyte. For example, the energy storage device may contain a lithium salt and a solvent such as a non-aqueous solvent or an organic solvent. Generally, the lithium salt contains a redox-stable anion. In some embodiments, the anion may be monovalent. In some embodiments, the lithium salt can be selected from lithium hexafluoride phosphate (LiPF6), lithium bis(trifluoromethanesulfonyl)imide (LiFSI), lithium tetrafluoroborate (LiBF4), lithium perchlorate (LiClO4), lithium bis(trifluoromethanesulfonyl)imide (LiN(SO2CF3)2), lithium trifluoromethanesulfonate (LiSO3CF3), lithium bis(oxalate)borate (LiB(C2O4)2), lithium bis(fluorosulfonyl)imide (LiN(SO2F)2), lithium difluoro(oxalate)borate (LiC2BF2O4), and combinations thereof. In some embodiments, the electrolyte may include a quaternary ammonium cation and an anion selected from the group consisting of hexafluorophosphate, tetrafluoroborate, and iodide. In some embodiments, the salt concentration may be about 0.1 mol / L(M) to about 5 M, about 0.2 M to about 3 M, or about 0.3 M to about 2 M. In further embodiments, the salt concentration of the electrolyte may be about 0.7 M to about 2 M. In certain embodiments, the salt concentration of the electrolyte may be about 0.2 M, about 0.3 M, about 0.4 M, about 0.5 M, about 0.6 M, about 0.7 M, about 0.8 M, about 0.9 M, about 1 M, about 1.1 M, about 1.2 M, 1.3 M, 1.4 M, 1.5 M, or values ​​in between these.

[0054] In some embodiments, the energy storage device may include a liquid solvent. The solvent does not need to dissolve all components of the electrolyte, nor does it need to completely dissolve any component. In further embodiments, the solvent may be an organic solvent. In some embodiments, the solvent may include one or more functional groups selected from dioxathiolane (e.g., 1,3,2-dioxathiolane-2,2-dioxide (i.e., "DTD")), carbonates, ethers and / or esters. In some embodiments, the solvent may include a carbonate. In further embodiments, the carbonate may be selected from cyclic carbonates, e.g., ethylene carbonate (EC), propylene carbonate (PC), vinylethylene carbonate (VEC), vinylene carbonate (VC), fluoroethylene carbonate (FEC) and combinations thereof, or acyclic carbonates, e.g., dimethyl carbonate (DMC), diethyl carbonate (DEC), ethyl methyl carbonate (EMC) and combinations thereof. In some embodiments, one or more solvents can be used in concentrations of about, at least, or at least about 30% by weight, 35% by weight, 40% by weight, 45% by weight, 50% by weight, 55% by weight, 60% by weight, 65% by weight, 70% by weight, 75% by weight, 80% by weight, 85% by weight, or 90% by weight, or any range of values ​​in between. In some embodiments, the solvent is used as an additive in the electrolyte system and can be used in concentrations of approximately, or at most, 0.1% by weight, 0.2% by weight, 0.3% by weight, 0.4% by weight, 0.5% by weight, 0.6% by weight, 0.7% by weight, 0.8% by weight, 0.9% by weight, 1% by weight, 1.1% by weight, 1.2% by weight, 1.3% by weight, 1.4% by weight, 1.5% by weight, 1.6% by weight, 1.7% by weight, 1.8% by weight, 1.9% by weight, 2% by weight, 2.1% by weight, 2.2% by weight, 2.3% by weight, 2.4% by weight, 2.5% by weight, 2.6% by weight, 2.7% by weight, 2.8% by weight, 2.9% by weight, 3% by weight, 4% by weight, 5% by weight, 6% by weight, 7% by weight, 8% by weight, 9% by weight, or 10% by weight, or any range of values ​​in between.For example, in some embodiments, the amount of additive in the electrolyte is one of the following ranges, or near thereto: 0.1 to 10% by weight, 1 to 6% by weight, 2 to 5% by weight, 0.1 to 6% by weight, 2 to 8% by weight, 2 to 3% by weight, or 1 to 4% by weight.

[0055] While specific embodiments of the present invention have been described, these embodiments are presented as examples only and are not intended to limit the scope of this disclosure. In fact, the novel methods and systems described herein can be embodied in a variety of other forms. Furthermore, various omissions, substitutions, and modifications of systems and methods can be made without departing from the spirit of this disclosure. The appended claims and their equivalents are intended to encompass forms or modifications that fall within the scope and spirit of this disclosure. Accordingly, the scope of the present invention is defined solely by reference to the appended claims.

[0056] Features, materials, properties, or groups described in relation to a particular aspect, embodiment, or example should be understood to be applicable to any other aspect, embodiment, or example described in this section or elsewhere in this specification, unless otherwise compatible. All features disclosed herein (including the appended claims, abstract, and drawings) and / or all steps of any method or process so so disclosed may be combined in any combination, except for any combination in which at least some of such features and / or steps are mutually exclusive. Protection is not limited to the details of any of the aforementioned embodiments. Protection extends to any novel features or any novel combination of features disclosed herein (including the appended claims, abstract, and drawings), or any novel steps or any novel combination of steps of any method or process so so disclosed.

[0057] Furthermore, certain features described in this disclosure in the context of separate embodiments may also be implemented in combination in a single embodiment. Conversely, various features described in the context of a single embodiment may also be implemented separately in multiple embodiments or in any suitable combination of components. Furthermore, features may be described above as acting in a particular combination, but one or more features from a claimed combination may, in some cases, be removed from the combination, and the combination may be claimed as components of the combination or a variation of components of the combination.

[0058] Furthermore, while operations may be shown in the drawings or described herein in a specific order, such operations do not need to be performed in the specific order shown or in a sequential order, or not all operations need to be performed, in order to achieve the desired result. Other operations not shown or described may be incorporated into exemplary methods and processes. For example, one or more additional operations may be performed before, after, simultaneously with, or in between any of the described operations. Furthermore, operations may be rearranged or reordered in other embodiments. It will be understood by those skilled in the art that in some embodiments, the actual steps performed in the illustrated and / or disclosed processes may differ from those shown in the drawings. Depending on the embodiment, certain steps among the steps described above may be omitted, or other steps may be added. Furthermore, the features and attributes of the particular embodiments disclosed above may be combined in different ways to form additional embodiments, all of which fall within the scope of this disclosure. Also, the separation of various system components in the above embodiments should not be understood as requiring such separation in all embodiments, and it should be understood that the described components and systems can generally be integrated into a single product or packaged into multiple products. For example, any of the components of the energy storage system described herein may be provided separately or as an integrated unit (e.g., packaged together or mounted together) to form the energy storage system.

[0059] For the purposes of this disclosure, certain aspects, advantages, and novel features are described herein. Not all such advantages can necessarily be achieved according to any particular embodiment. Therefore, for example, a person skilled in the art will recognize that this disclosure can be embodied or implemented to achieve one or a group of advantages as taught herein, without necessarily achieving other advantages that can be taught or suggested herein.

[0060] Conditional statements such as "can," "could," "might," or "may," unless otherwise specified or interpreted in the context in which they are used, are generally intended to convey that a particular embodiment includes certain features, elements, and / or processes, but other embodiments do not. Therefore, such conditional statements do not generally imply that features, elements, and / or processes are required in any way in one or more embodiments, or that one or more embodiments necessarily include logic for determining whether these features, elements, and / or processes should be included in or performed in any particular embodiment, with or without user input or prompting.

[0061] Connecting phrases such as "at least one of X, Y, and Z" are generally understood in contexts where they indicate that an item, term, etc., may be any of X, Y, or Z, unless otherwise specified. Therefore, such connecting language does not generally imply that a particular embodiment requires the presence of at least one of X, at least one of Y, and at least one of Z.

[0062] As used herein, terms such as “approximately,” “about,” “generally,” and “substantially” refer to values, quantities, or characteristics close to the stated values, quantities, or characteristics that still perform the desired function or achieve the desired result. For example, the terms “approximately,” “about,” “generally,” and “substantially” may refer to quantities less than 10%, less than 5%, less than 1%, less than 0.1%, and less than 0.01% of the stated quantity, depending on the desired function or desired result.

[0063] The scope of this disclosure is not intended to be limited by any specific disclosure of preferred embodiments in this section or elsewhere in this specification, but may be defined by the claims, as presented in this section or elsewhere in this specification, or as presented in the future. The language of the claims should be interpreted broadly based on the language used in the claims, and should not be limited to the examples described herein or any examples described during examination of the application, and these examples should be interpreted non-exclusively.

Claims

1. A system for processing dry electrode films, A roller system equipped with a calendar roller, A measuring device positioned above the calendar roller and comprising a terahertz source and a terahertz sensor, wherein the terahertz source is configured to emit terahertz radiation pulses, and the terahertz sensor is configured to detect the terahertz reflection of the terahertz radiation pulses, A dry electrode powder mixture dispenser, wherein the dry electrode powder mixture dispenser is configured to distribute dry electrode material onto a calendar roller, and the terahertz source is arranged in line with the terahertz sensor. A system equipped with these features.

2. The system according to claim 1, further comprising an additional calendar roller and an additional measuring device, wherein the additional measuring device is positioned above the additional calendar roller.

3. The system according to claim 1 or 2, wherein the terahertz radiation pulse includes a spot size, peak width, frequency, or any combination thereof.

4. The system according to claim 3, wherein the spot size includes a diameter of 0.05 to 0.5 mm.

5. The system according to claim 3, wherein the frequency is 0.05 to 5.0 THz.

6. The system according to claim 3, wherein the peak width is 1 to 5 ps.

7. The system according to claim 1 or 2, wherein the terahertz sensor is configured to measure physical properties selected from the group consisting of mass density, load, uniformity, thickness, basis weight, and combinations thereof.

8. The system according to claim 1 or 2, wherein the terahertz sensor is configured to measure the time of flight of the terahertz radiation pulse, the intensity of the terahertz radiation pulse, the intensity of the terahertz reflection, or any combination thereof.

9. The system according to claim 1 or 2, wherein the terahertz sensor is configured to measure the intensity of the terahertz reflection.

10. The system according to claim 1 or 2, further comprising a current collector dispenser.

11. A step of placing a dry electrode film on the calendar roller, wherein the dry electrode film includes a marker and a film region downstream of the marker, and the film region includes a first main surface and a second main surface opposite to the first main surface. The steps include: emitting terahertz radiation pulses from a terahertz source to a marker to form a marker reflection; The steps include detecting the marker reflection using the terahertz sensor, Steps include: first, emitting the terahertz radiation pulse from the terahertz source to the film region to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; The steps include detecting the first terahertz reflection at the second time point using the terahertz sensor, and detecting the second terahertz reflection at the third time point using the terahertz sensor, The steps include sampling the aforementioned film region, A method for calibrating the system according to claim 1, including the method described in claim 1.

12. A method for processing a dry electrode film, A step of placing a dry electrode film on a calendar roller, wherein the dry electrode film includes a first main surface and a second main surface opposite to the first main surface, The steps include rotating the calender roller to form a moving dry electrode film, Steps include: emitting a terahertz radiation pulse to the moving dry electrode film at a first time point to form a first terahertz reflection from the first main surface and a second terahertz reflection from the second main surface; The steps include detecting the first terahertz reflection at a second time point using a terahertz sensor, and detecting the second terahertz reflection at a third time point using a terahertz sensor, Methods that include...

13. The method according to claim 12, further comprising the steps of: determining the flight time of a first main surface by quantitatively determining the difference between the first time point and the second time point; and determining the flight time of a second main surface by quantitatively determining the difference between the first time point and the third time point.

14. The method according to claim 12 or 13, further comprising the steps of determining the intensity of the terahertz radiation pulse at the first time point, determining the intensity of the first terahertz reflection at the second time point, and determining the intensity of the second terahertz reflection at the third time point.

15. The method according to claim 12 or 13, wherein emitting the terahertz radiation pulse includes projecting a spot size, peak width, frequency, or any combination thereof.

16. The method according to claim 15, wherein the spot size includes a diameter of 0.05 to 0.5 mm.

17. The method according to claim 16, wherein the frequency is at least 0.05 terahertz to 5.0 terahertz.

18. The method according to claim 16, wherein the peak width is at least 1.0 picosecond to 5 picoseconds.

19. The method according to claim 12 or 13, wherein detection includes determining a physical property selected from the group consisting of mass density, load, uniformity, thickness, basis weight, and combinations thereof.

20. The method according to claim 12 or 13, further comprising the step of placing a current collector on the dry electrode film.

21. The method according to claim 12 or 13, further comprising the step of distributing a dry electrode material onto the calender roller, wherein the dry electrode material comprises a dry powder.

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