Materials Testing System with Data Import Workflow Progression

Abstract

Described herein are examples of materials testing systems that allow an operator to use a data import device to automatically import data into input fields of a graphical user interface (GUI) associated with a materials testing workflow. Such automatic import helps avoid potential errors in manual entry. Additionally, the materials testing system allows the operator to advance the materials testing workflow (and / or GUI) from one state to another, thereby reducing the need (and / or the time required) for the operator to switch back and forth between the data import device(s) and another input device.

Description

[Technical Field]

[0001] [CROSS-REFERENCE TO RELATED APPLICATIONS] This application claims priority to and the benefit of U.S. Provisional Patent Application No. 63 / 433,606, filed December 28, 2022, entitled "Material Testing Systems with Data Importation Workflow Progression," the entire contents of which are incorporated herein by reference.

[0002] FIELD OF THE DISCLOSURE The present disclosure relates generally to materials testing systems, and more particularly to materials testing systems with data import workflow progression. [Background technology]

[0003] Materials testing machines are used to test various material specimens for attributes (e.g., tensile strength / compressive strength). The specific testing method (also known as test method) can vary for each material specimen. A computing device in communication with the materials testing machine can guide a user through the workflow for setting up each test method, running each test method, and analyzing the results of each test method.

[0004] By comparing such a system with the present disclosure set forth in the remainder of this application with reference to the drawings, the limitations and disadvantages of the conventional and traditional approaches will become apparent to one skilled in the art. Summary of the Invention

[0005] The present disclosure relates to a materials testing system with data import workflow progression substantially as illustrated and / or described in connection with at least one of the drawings and more fully set forth in the claims.

[0006] These and other advantages, aspects, and novel features of the present disclosure, as well as details of illustrated examples of the present disclosure, will be more fully understood from the following description and drawings. [Brief explanation of the drawings]

[0007] [Figure 1] FIG. 1 illustrates an exemplary materials testing system according to aspects of the present disclosure.

[0008] [Figure 2] FIG. 2 is a block diagram of the materials testing system of FIG. 1 according to an embodiment of the present disclosure.

[0009] [Figure 3] FIG. 1 is a flow diagram illustrating an exemplary state progression of a materials testing workflow, according to aspects of the present disclosure.

[0010] [Figure 4] 10 is a flowchart illustrating an example operation of a workflow progression process, according to an aspect of the present disclosure.

[0011] [Figure 5a] 4A-4D illustrate example different states of a graphical user interface associated with the materials testing workflow of FIG. 3, according to an embodiment of the present disclosure. [Figure 5b] 4A-4D illustrate example different states of a graphical user interface associated with the materials testing workflow of FIG. 3, according to an embodiment of the present disclosure. [Figure 5c] 4A-4D illustrate example different states of a graphical user interface associated with the materials testing workflow of FIG. 3, according to an embodiment of the present disclosure. DETAILED DESCRIPTION OF THE INVENTION

[0012] The figures are not necessarily to scale. Where appropriate, the same or similar reference numbers are used in the figures to refer to similar or identical components. For example, a reference number utilizing a letter (e.g., gripper 124a, gripper 124b) refers to the same reference number without the letter (e.g., gripper 124).

[0013] Materials testing workflows sometimes require an operator to input information to set up a test method run, analyze test method results, and / or report test method results. However, manual entry of test method-related information carries the risk of both data entry errors and delays. While some systems automatically import information, it can be inconvenient for an operator to switch between a data import device (e.g., a tag reader) and another input device (e.g., a touchscreen) to select the correct input field, move information to the correct input field, and / or select to advance the workflow.

[0014] The disclosed exemplary materials testing system uses a data import device to both automatically import data and advance (or progress) the state of a materials testing workflow. The automatic import of data helps reduce data entry errors that can occur during manual data entry. The workflow progression reduces the need (and / or the time required) for an operator to switch back and forth between the data import device and another input device to advance the workflow.

[0015] Some examples of the present disclosure include a materials testing machine including a data import device, the data import device comprising a camera, tag reader, or measurement device, a test sensor, a test actuator, and a test controller configured to control the test actuator; a display screen; and a computing device configured to communicate with the display screen, the materials testing machine, and the data import device, wherein the computing device includes: initiating a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of the materials testing machine; and displaying a first graphical user interface (GUI) associated with a first state of the materials testing workflow. and displaying a first GUI (GUI) on a display screen, the first GUI comprising one or more input fields; and in response to receiving final field input data from the data import device while a final (last) input field of the one or more input fields has input focus, populating the final input field using the final field input data and advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data from the data import device after the one or more input fields have been populated on the display screen and the input focus has been advanced away from the one or more input fields, advancing the materials testing workflow from a first state to a second state and displaying a second GUI on the display screen associated with the second state of the materials testing workflow.

[0016] In some examples, the processing circuitry of the computing device is further configured to control the controller of the materials testing machine to execute the test method using the final field input data. In some examples, the tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high frequency tag reader. In some examples, the measurement device includes a digital caliper.

[0017] In some examples, the first GUI further includes guidance on how to obtain the final field input data or subsequent input data using the data import device. In some examples, the processing circuitry is further configured to verify that the final field input data meets the input criteria and prevent input into the final input field, advancement of input focus, or execution of the test method if the final field input data does not meet the test criteria. In some examples, verifying that the final field input data meets the input criteria includes verifying that the final field input data represents an identifier of a fixture that is compatible with the test configuration of the test method.

[0018] Some examples of the present disclosure include initiating, via processing circuitry of a computing device, a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of a materials testing machine in communication with the computing device, the materials testing machine including a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying, on a display screen in communication with the computing device, a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI including one or more input fields; and receiving, at the computing device, last field input data from a data import device while a last field input field of the one or more input fields has input focus, the data import device. the apparatus includes a camera, a tag reader, or a measurement device; and in response to receiving final field input data at the computing device from the data import device while a final input field of the one or more input fields has input focus, populating the final input field using the final field input data and advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data at the computing device from the data import device after the one or more input fields have been populated on the display screen and the input focus has been advanced away from the one or more input fields, advancing a materials testing workflow from a first state to a second state and displaying a second GUI on the display screen associated with the second state of the materials testing workflow.

[0019] In some examples, the method further includes controlling a processing circuitry of the computing device to execute the test method using the final field input data. In some examples, the tag reader includes a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high frequency tag reader. In some examples, the measurement device includes a digital caliper.

[0020] In some examples, the first GUI further includes guidance on how to obtain the final field input data or subsequent input data using the data import device. In some examples, the method further includes processing circuitry verifying that the final field input data meets the input criteria and preventing input into the final input field, advancement of input focus, or execution of the test method if the final field input data does not meet the test criteria. In some examples, verifying that the final field input data meets the input criteria includes verifying that the final field input data represents an identifier of a fixture that is compatible with a test configuration of the test method.

[0021] Some examples of the present disclosure include a non-transitory computer-readable medium including machine-readable instructions that, when executed by a processor, initiate a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of a materials testing machine, the materials testing machine comprising a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying on a display screen a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI comprising one or more input fields; and receiving last field input data from a data import device while a last field input field of the one or more input fields has input focus, the data import device relates to a non-transitory computer-readable medium including a camera, tag reader, or measurement device, that causes a processor to: populate a final input field using the final field input data in response to receiving final field input data from a data import device while a final input field of the one or more input fields has input focus; advance the input focus away from the one or more input fields; and advance a materials testing workflow from a first state to a second state in response to receiving subsequent input data at the computing device from the data import device after the one or more input fields have been populated on the display screen and the input focus has been advanced away from the one or more input fields; and display a second GUI on the display screen associated with the second state of the materials testing workflow.

[0022] In some examples, the non-transitory computer-readable medium further includes machine-readable instructions that, when executed by the processor, cause the processor to control a controller of the materials testing machine to perform the test method using the final field input data. In some examples, the tag reader includes a barcode reader, a near-field communications (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high frequency tag reader, and the measurement device includes a digital caliper. In some examples, the first GUI further includes guidance on how to obtain the final field input data or subsequent input data using the data import device.

[0023] In some examples, the non-transitory computer-readable medium further includes machine-readable instructions that, when executed by the processor, cause the processor to verify that the final field input data meets the input criteria and prevent the final input field from being entered, the input focus from being advanced, or the test method from being executed if the final field input data does not meet the test criteria. In some examples, verifying that the final field input data meets the input criteria includes verifying that the final field input data represents an identifier of a fixture that is compatible with a test configuration of the test method.

[0024] 1 illustrates an example materials testing system 100. As illustrated, the materials testing system 100 includes a materials testing machine 102 (also known as a universal testing machine), a computing system 104 connected to the materials testing machine 102 through a cable 106, and one or more data import devices 108 connected to the computing system 104 through a cord 110. Although shown as being physically connected, in some examples, the connections between the computing system 104, the materials testing machine 102, and / or the data import devices 108 may be wireless rather than wired.

[0025] 1, the materials testing machine 102 includes a frame 112. In some examples, the frame 112 provides rigid structural support to other components of the materials testing machine 102. As shown, the frame 112 includes a top (upper) plate 114 and a bottom base 116 connected by two support posts 118. In some examples, the support posts 118 of the frame 112 may house guide rails and / or a drive shaft 212 of the materials testing machine 102 (see, for example, FIG. 2).

[0026] 1, a movable crosshead 120 extends between the columns 118. In some examples, the movable crosshead 120 may be connected to guide rails and / or drive shafts 212 housed in the columns 118 and / or may be configured to move toward and / or away from the base 116 through actuation (e.g., motorized) of the drive shaft(s) 212. Although one movable crosshead 120 is shown in the example of FIG. 1, in some examples, the materials testing machine 102 may have multiple movable crossheads 120 and / or other moving members.

[0027] 1, fixtures 122 are attached to the bottom base 116 of the frame 112 and to the movable crosshead 120. As shown, the lower fixture 122a includes a gripper 124a, and the upper fixture 122b includes both a test sensor 126 and a gripper 124b. While one test sensor 126 and two grippers 124 are shown in the example of FIG. 1, in some examples, the test machine 102 may include more or fewer test sensors 126 and / or grippers 124.

[0028] In the example of FIG. 1 , grippers 124 hold test specimen 128. Test specimen 128 is shown as a rope (e.g., made of steel), but in some examples may be some other type of material and / or component. While grippers 124a and / or 124b are illustrated as rope holders, in some examples they may alternatively or additionally be configured as bolt holders, wedge-type grippers, side-acting grippers, manual grippers, roller grippers, capstan grippers, and / or syringe holders. In some examples, one or both of grippers 124 may be replaced by a compression platen configured to compress test specimen 128.

[0029] 1, the test sensor 126 is connected to the gripper 124 so as to measure the force acting on the gripper 124 (and / or the specimen 128, the crosshead 120, etc.). In some examples, the test sensor may be a load cell. In some examples, the test sensor 126 may be some other type of sensor.

[0030] In some examples, the materials testing machine 102 may be configured for static mechanical testing. For example, the materials testing machine 102 may be configured for compressive strength testing, tensile strength testing, shear strength testing, flexural strength testing, flexural strength testing, tear strength testing, peel strength testing (e.g., adhesive bond strength), torsional strength testing, and / or any other compressive and / or tensile testing. Additionally or alternatively, the materials testing machine 102 may be configured to perform dynamic testing.

[0031] In some examples, the materials testing machine 102 is configured to interface with a computing system 104 to perform a test method. In some examples, the computing system 104 can perform the test method and / or analyze the results of the test method using data imported from a data import device(s) 108. Figure 1 shows some examples of data import devices 108 that can be used to import data used to perform the test method.

[0032] 1 , each data importing device 108 is a device configured to transmit (and / or import) data to the computing system 104. For example, a data importing device 108 may be a digital caliper 130 (e.g., configured to measure dimensions of an object 128, a component of the materials testing machine 102, etc.). As another example, a data importing device 108 may be a camera 132 (e.g., configured to capture images of an object 128, a component of the materials testing machine 102, etc.). In some examples, a data importing device 108 may be a tag reader 134 configured to read data from a tag 136.

[0033] In some examples, the tag 136 may be attached to the specimen 128, the packaging of the specimen 128, the crosshead 120, the fixture 122 (see, e.g., FIG. 2), and / or some other component of the materials testing machine 102. In some examples, the tag 136 may store information about the item to which the tag 136 is attached. In some examples, the tag 136 may be detached and / or may store information other than information about the item to which the tag 136 is attached.

[0034] In some examples, tag 136 may be a one-dimensional barcode tag 136a, a two-dimensional barcode 136b (e.g., a quick response code), a Bluetooth® tag 136c (e.g., a tag 136 configured to use short-range, ultra-high frequency radio frequencies in the 2.4 GHz Industrial, Scientific, and Medical (ISM) frequency band between 2.402 GHz and 2.480 GHz), a near-field communication (NFC) tag 136d, a radio frequency identification (RFID) tag 136e, and / or some other type of tag 136. In some examples, camera 132 may be configured to read and / or scan one-dimensional barcode tag 136a and / or two-dimensional barcode tag 136b. In some examples, camera 132 may be incorporated into tag reader 134.

[0035] In some examples, the data importing device 108 may capture data in response to user activation of a trigger, button, or other capture input 209 (see, e.g., FIG. 2 ) of the data importing device 108. In some examples, the data may be transmitted (and / or imported) to the computing system 104 in response to user activation of the capture input 209 of the data importing device 108 (e.g., after capture). In examples where the captured data is encoded (e.g., in the tag 136), the data importing device 108 may decode the encoded data before transmitting it to the computing system 104, or the computing system 104 may decode the encoded data after receiving it.

[0036] Figure 2 is a block diagram of a materials testing system 100. Similar to Figure 1, the example in Figure 2 shows a computing system 104 connected to a materials testing machine 102 through a cable 106 and a data import device 108 connected to the computing system 104 through a cord 108. Figure 2 also shows further details of the materials testing machine 102 and the computing system 104.

[0037] 2 , the computing system 104 includes a computing device 202 and a user interface (UI) 204 interconnected to each other. As shown, the UI 204 can include one or more input devices 206 configured to receive input from a user and one or more output devices 208 configured to provide output to the user. In some examples, the one or more input devices 206 can include one or more touchscreens, mice, keyboards, buttons, switches, slides, knobs, microphones, dials, and / or other input devices 206. In some examples, the one or more output devices 208 can include one or more displays / touchscreens, speakers, lights, tactile devices, and / or other output devices 208. In some examples, the output device(s) 208 (e.g., a display screen) of the UI 204 can output one or more representations of a materials testing workflow 300 configured to guide a user through the setup, execution, and / or analysis of a test method performed by the materials testing machine 102.

[0038] The exemplary materials testing machine 102 includes one or more actuators 210 connected to one or more drive shafts 212. In some examples, the actuators 210 may be used to provide force to and / or induce movement of the drive shafts 212. In some examples, the actuators 210 may include electric motors, pneumatic actuators, hydraulic actuators, piezoelectric actuators, relays, and / or switches.

[0039] The drive shaft 212 is further shown connected to the movable crosshead 120 such that movement of the drive shaft(s) 212 via the actuator(s) 210 results in movement of the movable crosshead 120. Although the term drive shaft 212 is used in the example of Figure 2, in some examples the drive shaft 212 may be some other mechanical means for moving the movable crosshead 120 despite guidance from the actuator(s) 210.

[0040] The exemplary materials testing machine 102 further includes a controller 214 in electrical communication with the actuator(s) 210. In some examples, the controller 214 may include processing circuitry and / or memory circuitry. In some examples, the controller 214 may be configured to control the materials testing machine 102 based on one or more commands, control inputs, and / or test parameters. In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from the computing system 104) into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210, thereby controlling the operation of the materials testing machine 102 (e.g., via the actuator(s) 210). For example, the controller 214 may provide one or more signals instructing the actuator(s) 210 to provide more or less power, thereby increasing or decreasing the applied force.

[0041] In the example of FIG. 2 , controller 214 is also in electrical communication with fixture 122 (e.g., gripper 124 and test sensor(s) 126). In some examples, controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from computing system 104) into appropriate (e.g., electrical) signals that can be delivered to gripper 124 to thereby control the operation of gripper 124 (e.g., gripping or releasing). In some examples, controller 214 may be configured to convert commands, control inputs, and / or test parameters (e.g., received from computing system 104) into appropriate (e.g., electrical) signals that can be delivered to sensor(s) 126 to thereby control the operation of sensor(s) 126. In some examples, controller 214 may be configured to convert measurement data received from sensor(s) 126 and / or transmit measurement data to computing system 104.

[0042] The example controller 214 is also in electrical communication with a control panel 216 of the materials testing machine 102. In some examples, the control panel 216 may include one or more input devices (e.g., buttons, switches, slides, knobs, microphones, dials, and / or other electromechanical input devices). In some examples, the control panel 216 may be used by an operator to directly control the materials testing machine 102. In some examples, the controller 214 may be configured to convert commands, control inputs, and / or test parameters received via the control panel 216 into appropriate (e.g., electrical) signals that can be delivered to the actuator(s) 210 and / or gripper(s) 124 to control the materials testing machine 102.

[0043] The controller 214 is also shown in electronic communication with a network interface 218b of the materials testing machine 102. In some examples, the network interface 218b includes hardware, firmware, and / or software for connecting the materials testing machine to the computing device 104 (e.g., wirelessly and / or via cable 106). In some examples, the controller 214 may receive information (e.g., commands) from the computing device 202 through the network interface 218b and / or send information (e.g., measurement data from the sensor(s) 126) to the computing device 202 through the network interface 218b.

[0044] The exemplary computing device 202 includes a network interface 218a. As shown, one network interface 218a communicates with a network interface 218b of a materials testing machine 102 via a cable 106. As shown, the computing device 102 also includes a network interface 218a that communicates with a network 220 (e.g., the Internet). In some examples, the computing device 202 may communicate with other computing systems 104 and / or materials testing machines 102 via the network interface(s) 218a. As shown, the network interface 218b is electrically connected to a common electrical bus 220 of the computing device 202.

[0045] The computing device 202 also includes one or more input / output (IO) interfaces 222 connected to the common electrical bus 220. In some examples, the one or more I / O interfaces 222 may comprise one or more Universal Serial Bus (USB) ports, Thunderbolt ports, FireWire (IEEE 1394) ports, and / or any other type of serial and / or parallel data ports. In some examples, the one or more I / O interfaces 222 may be configured for wireless (as opposed to wired) connections. As shown, the I / O interface(s) 222 are connected to the data import device(s) 108 via cords 110.

[0046] The computing device 202 further includes processing circuitry 224 connected to the common electrical bus 220. In some examples, the processing circuitry 224 may include one or more processors. In some examples, the processing circuitry 224 is configured to process information received from the UI 204, the data import device(s) 108, and / or the materials testing machine 102. In some examples, the processing circuitry 224 is configured to send commands and / or test parameters to the materials testing machine 102 (e.g., via the network interface(s) 218a). In some examples, the processing circuitry 224 is configured to output information to an operator through the UI 204. In some examples, the computing device 202 is configured to execute machine-readable instructions stored in the memory circuitry 226.

[0047] The example computing device 202 further includes memory circuitry 226 connected to the common electrical bus 220. As shown, the memory circuitry 226 includes a materials testing workflow 300 and a workflow progression process 400. While the materials testing workflow 300 and / or the workflow progression process 400 are shown as part of the memory circuitry 226 in the example of FIG. 2, in some examples they may be implemented using discrete circuitry (e.g., discrete circuitry of the processing circuitry 224).

[0048] In some examples, materials testing workflow 300 and / or workflow progression process 400 are implemented using non-transitory machine-readable instructions stored in memory circuitry 226. In some examples, processing circuitry 224 is configured to execute the machine-readable instructions of materials testing workflow 300 to guide a user in the setup, execution, and analysis of a test method of materials testing machine 102. In some examples, computing device 202 is configured to interface with controller 214 of materials testing machine 102 to execute the test method during materials testing workflow 300.

[0049] In some examples, the UI 204 is configured to display (and / or otherwise output) one or more display states of a graphical user interface (GUI) 500 (e.g., see FIGS. 5a-5c) during execution of the materials testing workflow 300. In some examples, the data import device(s) 108 may collect (and / or import) data during (and / or used by) the materials testing workflow 300, thereby reducing the possibility of data entry errors. In some examples, the processing circuitry 224 is configured to execute machine-readable instructions of the workflow progression process 400 based on input from the data import device(s) 108 to progress through the states of the materials testing workflow 300 (and / or associated display states of the associated GUI 500), thereby reducing the need for (and / or the time required for) an operator to switch back and forth between the data import device(s) 108 and another input device 206 of the UI 204.

[0050] 3 is a flow diagram illustrating exemplary workflow states of a materials testing workflow 300. While a particular sequence of workflow states is illustrated, in some instances, materials testing workflow 300 may be customizable such that additional and / or fewer workflow states may be implemented during operation. In addition, many alternative progressions through workflow 300 may be possible.

[0051] In some examples, the materials testing workflow 300 progresses through workflow states to guide a user in the setup, execution, and analysis of a test method on the materials testing machine 102. In some examples, a particular workflow state may be associated with an output of the UI 204 (e.g., a display state of the GUI 500 showing one or more input fields 506, visual guidance 514, sensor measurements, test results, etc.). Although the materials testing workflow 300 may be described below for purposes of understanding as performing certain operations, it should be understood that one or more of the above-described components of the materials testing system 100 (e.g., processing circuitry 224, UI 204, etc.) may undertake these operations on behalf of (and / or at the direction of) the materials testing workflow 300.

[0052] 3, the first workflow state is the sample setup state 302 (and / or multiple sample setup states 302). Figures 5A-5C are example display states of the GUI 500 that may be presented via the UI 204 during the sample setup state 302. During the example sample setup state(s) 302, the materials testing workflow 300 prompts the operator for information regarding a set of sample specimens 128 and a set of test methods to be used to test the sample specimens 128.

[0053] The information prompted for (and / or collected) during the sample setup state(s) 302 may be information applicable to all specimens 128 and test methods, such as, for example, the date(s) the test(s) are to be performed, the date the specimen(s) 128 were manufactured / shipped / packaged, the operator's identification (e.g., number, name, etc.), the fixture(s)' identification (e.g., number(s), name(s), etc.), and / or other information relevant to all tests on all specimens 128. In some examples, the information prompted for (and / or collected) during the sample setup state(s) 302 may be imported, for example, by reading (and / or capturing an image of) a tag 136 attached to a packaged specimen 128, the materials testing machine 102, and / or a component of the materials testing machine 102 (e.g., the fixture 122, the crosshead 120, etc.). As another example, the computing device 202 may load information based on images captured by the data import device(s) 108 (e.g., images of a packaged sample of the subject 128, the materials testing machine 102, and / or components of the materials testing machine 102) from the memory circuitry 226 or download it over the network 220.

[0054] 3, the sample setup state 302 is followed by one or more test specimen and / or test method setup states 304. Figures 5A-5C show example display states of the GUI 500 that may be presented via the UI 204 during the test specimen and / or test method setup state(s) 304.

[0055] During the test specimen and / or test method setup state(s) 304, the materials testing workflow 300 prompts the operator for (and / or collects) information regarding the particular specimen 128 of the sample and / or the particular test method to be used to test the particular specimen 128. For example, information prompted for (and / or collected) during the test specimen and / or test method setup state(s) 304 may include the date the test is to be performed, the date the specimen 128 was manufactured / shipped / packaged, the identification of the specimen 128 (e.g., number, name, description, etc.), the identification of the test (e.g., number, name, description, etc.), the pre-test characteristics of the specimen 128 (e.g., measurements, material type, weight, color, shape, etc.), the target parameters of the test (e.g., start / end positions of the gripper(s) 124 / crosshead 120, distance traveled by the crosshead 120, speed of travel of the crosshead 120, the expected result(s) of the test (e.g., location / type of failure, distance traveled before failure, force applied before failure, post-test characteristics of the specimen, etc.), the time(s) at which the sensor(s) 126 should take the measurement(s), etc.), and / or other information related to the particular test method and / or particular specimen.

[0056] In some examples, information prompted for (and / or collected) during the test specimen and / or test method setup state(s) 304 may be imported. For example, the data import device(s) 108 may import information read from tags 136 attached to the specimen 128 (and / or associated packaging), the materials testing machine 102, and / or components of the materials testing machine 102 (e.g., fixture 122, crosshead 120, etc.). As another example, the data import device(s) 108 may import information about the specimen 128 measured by the digital caliper 130. As another example, the computing device 202 may load information about the specimen 128 based on images captured by the data import device(s) 108 from the memory circuitry 226 or download it over the network 220.

[0057] 3 , the test object and / or test method setup state 304 is followed by a test method execution state 306 (and / or multiple test method execution states 306). During the test method execution state(s) 306, the computing device 202 communicates with the materials testing machine 102 (e.g., via the network interface 218) and executes a test method on the test object 128 using the materials testing machine 102 according to information received during the test object and / or test method setup state(s) 304 and / or the specimen setup state(s) 302. For example, the processing circuitry 224 of the computing device 202 may determine and / or send one or more parameters and / or commands to the materials testing machine 102, and the controller 214 of the materials testing machine 102 may control the actuator(s) 210 of the materials testing machine 102 to execute the test method according to the command(s) and / or parameter(s).

[0058] 3, the run test method state 306 is followed by one or more post-test analysis setup states 308. During the post-test analysis setup state(s) 308, the materials testing workflow 300 prompts the operator for (and / or collects) information related to the analysis of the test method that was run during the run test method state 306.

[0059] For example, the information prompted for (and / or collected) during the post-test analyte analysis setup state(s) 308 may include post-test characteristics of the analyte 128, actual parameters of the test, actual results of the test, and / or other information related to the test method and / or analysis of the test sample. Although the post-test analyte analysis setup state(s) 308 are shown as separate states in Figure 3, in some examples they may be integrated into the test analyte and / or test method setup state(s) 304.

[0060] 3 , one or more post-test analyte analysis setup states 308 are followed by one or more post-test analyte analysis calculation states 310 of the materials testing workflow 300. During the post-test analyte analysis calculation state(s) 310, the processing circuitry 224 of the computing device 202 can perform one or more calculations based on information collected during the previous post-test analyte analysis setup state(s) 308. For example, the processing circuitry 224 may estimate the strength, reliability, quality, grade, resilience, and / or other properties of the analyte 128. As another example, the processing circuitry 224 may make assumptions about the structure and / or composition of the analyte 128. As another example, the processing circuitry may make assumptions about the future performance of the analyte 128.

[0061] 3, materials testing workflow 300 cycles through states 304-310 for all test methods and / or test specimens for the test sample (set up in state 302). As shown, after state 310, materials testing workflow 300 cycles through to the next test method and / or test specimen (if there is another test method or test specimen) in state 314 and then returns to state 304. Once states 304-310 have been completed for all test methods and / or test specimens for the test sample, materials testing workflow 300 transitions to one or more reporting states 316, where materials testing workflow 300 can provide reports on the results of the test sample as specified by the operator.

[0062] 4 is a flow diagram illustrating an exemplary operation of a workflow progression process 400 of the computing device 202. In some examples, the workflow progression process 400 may enable an operator to automatically import information using the data import device(s) 108 (reducing data entry errors). The workflow progression process 400 may additionally enable an operator to progress from one state of the materials testing workflow 300 to another state using the same data import device(s) 108, thereby reducing the inconvenience of (and / or the time required to) switch back and forth between the data import device(s) 108 and the UI 204 of the computing system 104. While the workflow progression process 400 may be described below as performing certain actions for purposes of understanding, it should be understood that one or more of the above-mentioned components of the materials testing system 100 (e.g., processing circuitry 224, UI 204, etc.) may undertake actions on behalf of (and / or at the command of) the workflow progression process 400.

[0063] 4, the workflow progression process 400 begins at block 402. At block 402, a materials testing workflow 300 is loaded from the memory circuitry 226 of the computing device 202 (e.g., via the processing circuitry 224). In some examples, an operator may use the UI 204 of the computing system 104 to select the appropriate materials testing workflow 300 to be loaded. In some examples, the materials testing workflow 300 may be loaded from an external device and / or over the network 220.

[0064] 4, after block 402, the workflow progression process 400 proceeds to block 403, where the workflow progression process 400 advances the materials testing workflow 300 to its first state (e.g., the specimen setup state 302 shown in FIG. 3). Thereafter, in block 404, the workflow progression process 400 outputs (e.g., via the UI 204) one or more prompts 504 and / or input fields 506 associated with the first state of the materials testing workflow 300. For example, the one or more prompts 504 and / or input fields 506 can be output as part of a display screen and / or GUI (e.g., one of the GUIs 500 shown in FIGS. 5A-5C).

[0065] In some examples, the one or more prompts 504 output in block 404 prompt the user to enter certain information related to the current state of the materials testing workflow 300 into input field(s) 506. In some examples, the workflow progression process 400 further focuses on a particular input field 506 of the one or more input fields 506. In some examples, the input field 506 having input focus is an input field 506 into which data is entered in response to an operator entering data through the UI 204 and / or importing data through the data import device 108. In some examples, guidance 514 may additionally be output instructing the operator on how to enter data using the data import device 108 (see, e.g., FIG. 5c).

[0066] 5a is an example of a GUI 500 that may be presented (e.g., via a display screen of the UI 204) during the specimen setup state 302 of the materials testing workflow 300 (e.g., at block 404). As shown, the GUI 500 includes a state identifier 502 that identifies the state of the materials testing workflow 300 to which the GUI 500 corresponds. The GUI 500 also includes an input prompt 504a that prompts a user to enter information about the test specimen into an input field 506a. Although the input field 506a is shown filled with dots as a placeholder until input is received, in some examples, the input field 506a may instead be blank and / or empty until input is received. As shown, the input field 506a is surrounded by a focus highlight 508 to emphasize that the input field 506a has input focus.

[0067] 4, after block 404, the workflow advancement process 400 proceeds to block 406, where the workflow advancement process 400 checks whether input data has been received from the data import device(s) 108. As previously discussed, the data import device(s) 108 can transmit (or import) data to the computing device 202 in response to activation of the capture input 209 of the data import device(s) 108. As shown, if data is not received from the data import device 108, the workflow advancement process 400 returns to block 404.

[0068] 4 , if data is received from the data import device 108, after block 406, the workflow progression process 400 proceeds to block 408. In block 408, the workflow progression process 400 determines whether the received data conforms to one or more input criteria associated with the input field 506. In some examples, the one or more input criteria may be associated with the input field 506 during setup and / or customization of the materials testing workflow 300. In some examples, the one or more criteria may define certain conditions that the input data must meet in order for the input data to be acceptable for input into the input field 506.

[0069] For example, the input field criteria may specify that any received data intended for the input field 506 be in a particular format (e.g., a date, a number, an alphanumeric string, a single character, a Boolean value, etc.). As another example, the input field criteria may specify that any received data intended for the input field 506 be associated with a particular type of fixture 122, sample, or subject 128. For example, the memory circuitry 226 may store (and / or the computing device 202 may access via the network 220) a data structure that associates certain identifying information with a particular type (e.g., classification, category, make, model, brand, etc.) of fixture 122, sample, and / or subject 128, and the workflow progression process 400 determines whether the fixture 122, sample, and / or subject 128 associated with the received data is of a type that meets the input field criteria. As part of the determination at block 408, the workflow progression process 400 may convert and / or decode the data received from the data import device(s) 108, as necessary.

[0070] 4 , if the received data does not meet one or more input criteria associated with input field 506, then after block 408, workflow progression process 400 proceeds to block 410. At block 410, one or more error notifications (e.g., similar to success notification 512, described below) are output (e.g., via UI 204). In some examples, the error notification(s) may inform the operator that the received input did not meet one or more input criteria and / or may provide an explanation as to why the input was defective and / or how the defect can be remedied. As shown, after block 410, workflow progression process 400 returns to block 404.

[0071] 4 , after block 408, if the received data meets one or more input criteria associated with the input field 506, the workflow progression process 400 proceeds to block 412. At block 410, the received data is used to populate the input field 506. The workflow progression process 400 then determines (block 414) whether there is another input field 506 (e.g., one that has not yet been populated) associated with the current state of the materials testing workflow 300. If there is another input field 506, the workflow progression process 400 moves the input focus (and / or focus highlight 508) to the next input field at block 416 before returning to block 404.

[0072] 4 , after block 414, when all input fields have been entered, the workflow progression process 400 proceeds to block 418. In block 418, the workflow progression process 400 determines whether the input field data for the input field(s) 506 (e.g., all) meets one or more state criteria associated with the current state of the materials testing workflow 300. Similar to the input criteria of block 408, in some examples, the state criteria may be associated with the current state of the materials testing workflow 300 during setup and / or customization of the materials testing workflow 300. In some examples, the state criteria may define certain conditions that the input data must meet in order for the input data to be eligible for collection during the current state of the materials testing workflow 300.

[0073] For example, the condition criteria may specify that the fixture 122 (e.g., identified during the current state) is appropriate for use with the identified materials testing machine 102 and / or specimen 128 (e.g., also identified during the current state). As another example, the condition criteria may specify that the specimen 128 to be tested using the identified fixture 122 and / or materials testing machine 102 is within certain size and / or weight limits and / or is of an appropriate type. In some examples, a data structure may be used to make a determination (e.g., similar to that described above with respect to block 408). As shown, if it is determined that the data does not conform to one or more condition criteria associated with the current state of the materials testing workflow 300, the workflow progression process 400 proceeds to block 410 after block 418.

[0074] In the example of FIG. 4 , if it is determined that the data meets one or more state criteria associated with the current state of the materials testing workflow 300, then after block 418, the workflow progression process 400 proceeds to block 420. At block 420, the input focus (and / or focus highlight 508) is moved away from the input field(s) 506 associated with the current state of the materials testing workflow 300. In some examples, the input focus (and / or focus highlight 508) is moved to a selectable button, icon, or other element (e.g., in the GUI 500). For example, the input focus (and / or focus highlight 508) may be moved to an arrow element 510 (e.g., see FIGS. 5 a-5 c). In some examples, the input focus (and / or focus highlight 508) may be completely removed, such that a field, element, or other item (e.g., in the GUI 500) no longer has the input focus (and / or focus highlight 508). In some examples, a success notification 512 may additionally be output to notify the operator that the condition criteria check at block 418 was successful (see, eg, FIG. 5b).

[0075] 4, after block 420, the workflow advancement process 400 proceeds to block 422, where the workflow advancement process 400 again checks whether input data has been received from the data import device(s) 108 (e.g., similar to block 406). In some examples, guidance 514 instructing the operator on how to use the data import device(s) 108 may be output in blocks 420-422 (and / or blocks 406-408).

[0076] 4 , after block 422, when input data is received from the data import device(s) 108, the workflow progression process 400 proceeds to block 424. In some examples, the actual data received from the data import device(s) 108 at block 422 may be irrelevant and / or may be discarded. As long as some data (e.g., indicating activation of capture input 209) is received, the workflow progression process 400 proceeds to block 424. In some examples, data collected during the current state of the materials testing workflow 300 (e.g., at block 412) may be saved in the memory circuitry 226 after (or before) proceeding to block 424.

[0077] 4, the workflow progression process 400 checks whether there are any additional (yet unexecuted) states in the materials testing workflow 300 in block 424. If there are not, the workflow progression process 400 ends. If there are, the workflow progression process 400 checks (in block 426) whether the next state is an execution state or a calculation state (e.g., the test method execution state 306 or the post-test analyte analysis calculation state 310).

[0078] If the next state is a run state or a calculate state, the workflow progression process 400 proceeds to block 428, where the materials testing workflow 300 proceeds to the run state or the calculate state (and / or performs the run state or the calculate state). In some examples, data collected during the previous state of the materials testing workflow 300 may be used to perform the run and / or calculate the run / calculate state(s). If the next state is neither a run state nor a calculate state, the workflow progression process 400 proceeds to block 403 after block 426 (and also proceeds to block 403 after block 426). In block 403, the workflow progression process 400 iterates to the next state in the materials testing workflow 300, and then begins again at block 404.

[0079] 5a-5c illustrate an example GUI 500 (e.g., output by UI 204) that changes what is being displayed (e.g., its display state) as the associated materials testing workflow 300 progresses from one state to the next (e.g., in response to input from the data import device 108). In FIG. 5a, GUI 500 includes a state identifier 502 that identifies the state of materials testing workflow 300 (to which the display state of GUI 500 corresponds) as the sample setup state 302. As shown, GUI 500 includes a prompt 504 (e.g., such as may be shown during block 404 of workflow progression process 400) that instructs the operator to enter a sample ID into a sample ID input field 506a. The sample ID input field 506a is also surrounded by a focus highlight 508, indicating that the sample ID input field 506a has input focus.

[0080] FIG. 5b illustrates the GUI 500 after data has been entered into the sample ID input field 506a (e.g., via import from the data import device(s) 108 in block 412). As shown, the state identifier 502 in FIG. 5a is the same as in FIG. 5b, indicating that the display state of the GUI 500 (and / or the state of the materials testing workflow 300) has not changed. A success notification 512 is also shown, indicating that the data imported into the sample ID input field 506a (e.g., in blocks 408 and / or 418) successfully passed the input field criteria and / or state criteria check(s). Meanwhile, the focus highlight 508 is no longer shown, indicating that the input focus has been moved away from the input field(s) 506 (e.g., in block 420).

[0081] FIG. 5c illustrates the GUI 500 after additional input has been received (e.g., via import from the data import device(s) 108 in block 422), thereby progressing the materials testing workflow 300 (and / or the GUI 500) to a new state. As shown, the GUI 500 in FIG. 5c appears significantly different from the GUI 500 shown in FIG. 5b, appropriate for the different display state. In addition, different input fields 506 are shown in the GUI 500. As shown, the focus highlight 508 now surrounds the upper gripper input field 506b. The state identifier 502 in the GUI 500 in FIG. 5c also identifies a different state than the states identified in FIGS. 5a and 5b, indicating that the materials testing workflow 300 (and / or the GUI 500) has progressed to a new state (e.g., in response to the import of data from the data import device(s) 108 in block 422).

[0082] The disclosed materials testing system 100 allows an operator to use the data import device 108 to automatically import data into the input fields 506 of the GUI 500 associated with the materials testing workflow 300. Such automatic import helps avoid potential errors in manual entry. Additionally, the materials testing system 100 allows the operator to advance the materials testing workflow 300 (and / or GUI 500) from one state to another, thereby reducing the need (and / or the time required) for the operator to switch back and forth between the data import device(s) 108 and another input device of the UI 204.

[0083] The methods and / or systems can be implemented in hardware, software, and / or a combination of hardware and software. The methods and / or systems can be implemented centrally in at least one computing system, or in a distributed manner where different elements are distributed across several interconnected computing or cloud systems. Any kind of computing system or other device adapted to perform the methods described herein is suitable. A typical combination of hardware and software can be a general-purpose computing system with a program or other code that, when loaded and executed, controls the computing system to perform the methods described herein. Another typical embodiment can include an application-specific integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, optical disk, magnetic storage disk, etc.) that stores one or more lines of machine-executable code to cause the machine to perform a process as described herein.

[0084] While the present method and / or system has been described with reference to certain specific embodiments, those skilled in the art will recognize that various modifications can be made and equivalents can be substituted without departing from the scope of the present method and / or system. In addition, many modifications can be made to adapt a particular situation or material to the teachings of the disclosure without departing from the scope of the disclosure. Therefore, the present method and / or system is not limited to the particular embodiments disclosed, but it is intended that the present method and / or system include all embodiments falling within the scope of the appended claims.

[0085] As used herein, "and / or" means any one or more of the items in the list connected by "and / or." As an example, "x and / or y" means any element of the three-element set {(x), (y), (x,y)}. In other words, "x and / or y" means "one or both of x and y." As another example, "x, y and / or z" means any element of the seven-element set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y and / or z" means "one or more of x, y and z."

[0086] As used herein, the term "for example" introduces a list of one or more non-limiting examples, instances, or illustrations.

[0087] As used herein, the terms "coupled," "coupled to," and "coupled with" mean a structural and / or electrical connection, whether attached, attached, connected, joined, fastened, coupled, and / or otherwise secured. As used herein, the term "attach" means attached, coupled, connected, joined, fastened, coupled, and / or otherwise secured. As used herein, the term "connect" means attached, attached, coupled, connected, joined, fastened, coupled, and / or otherwise secured.

[0088] As used herein, the terms "circuitry" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can comprise, be executed by, and / or be otherwise associated with hardware. As used herein, for example, a particular processor and memory can comprise a first "circuit" when executing a first one or more lines of code, and can comprise a second "circuit" when executing a second one or more lines of code. As used herein, whenever circuitry includes the hardware and code (if either is necessary) necessary to perform a function, the circuitry is "operable" and / or "configured" to perform that function, regardless of whether performance of that function is disabled or enabled (e.g., by a user-configurable setting, factory trim, etc.).

[0089] As used herein, control circuitry can include digital and / or analog circuitry, discrete and / or integrated circuitry, microprocessors, DSPs, etc., software, hardware, and / or firmware located on one or more boards that form part or all of a controller and / or are used to control the welding process and / or equipment such as a power supply or wire feeder.

[0090] As used herein, the term "processor" refers to processing devices, apparatus, programs, circuits, components, systems, and subsystems, whether implemented in hardware, tangibly embodied software, or both, and whether programmable or not. As used herein, the term "processor" includes, but is not limited to, one or more computing devices, hardwired circuits, signal modifying devices and systems, system control devices and machines, central processing units, programmable devices and systems, field programmable gate arrays, application specific integrated circuits, systems-on-chips, systems comprising discrete elements and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the above. A processor may be, for example, any type of general-purpose microprocessor or microcontroller, a digital signal processing (DSP) processor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor with an advanced RISC machine (ARM) core, etc. A processor may be coupled to and / or integrated into a memory device.

[0091] As used herein, the terms "memory" and / or "memory device" refer to computer hardware or circuitry that stores information for use by a processor and / or other digital devices. The memory and / or memory device can be any suitable type of computer memory or any other type of electronic storage medium, such as read-only memory (ROM), random access memory (RAM), cache memory, compact disc read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable medium, etc. Memory may include, for example, non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM®), first-in-first-out (FIFO) memory, last-in-first-out (LIFO) memory, stacked memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash card, CompactFlash® card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash storage, subscriber identity module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. Memory may be configured to store code, instructions, applications, software, firmware, and / or data and may be external, internal, or both to the processor.

Claims

1. 1. A system for testing materials, comprising: a data import device comprising a camera, tag reader, or measurement device; a materials testing machine comprising a test sensor, a test actuator, and a test controller configured to control the test actuator; A display screen; a computing device configured to communicate with the display screen, the materials testing machine, and the data import device, the computing device comprising processing circuitry, the processing circuitry comprising: initiating a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of the materials testing machine; displaying on the display screen a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI comprising one or more input fields; in response to receiving last field input data from the data import device while a last input field of the one or more input fields has input focus, populating the last input field using the last field input data and advancing the input focus away from the one or more input fields; in response to receiving subsequent input data from the data import device after the one or more input fields have been entered on the display screen and the input focus has been advanced away from the one or more input fields, advancing the materials testing workflow from the first state to a second state and displaying a second GUI on the display screen associated with the second state of the materials testing workflow; a computing device configured to: A system comprising:

2. 10. The system of claim 1, wherein the processing circuitry of the computing device is further configured to control the controller of the materials testing machine to execute the test method using the final field input data.

3. The system of claim 1 , wherein the tag reader comprises a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high radio frequency tag reader.

4. The system of claim 1 , wherein the measurement device comprises a digital caliper.

5. The system of claim 1 , wherein the first GUI further includes guidance on how to use the data import device to obtain the final field input data or the subsequent input data.

6. The processing circuit unit verifying that the final field input data meets input criteria; preventing input into the final input field, advancement of the input focus, or execution of the test method if the final field input data does not meet the test criteria; The system of claim 1 , further configured to:

7. 7. The system of claim 6, wherein verifying that the final field input data meets the input criteria includes verifying that the final field input data represents an identifier of a fixture that is compatible with a test configuration of the test method.

8. 1. A method comprising: initiating, via processing circuitry of a computing device, a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of a materials testing machine in communication with the computing device, the materials testing machine including a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying, on a display screen in communication with the computing device, a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI comprising one or more input fields; receiving, at the computing device, final field input data from a data import device while a final field input field of the one or more input fields has input focus, the data import device including a camera, a tag reader, or a measurement device; in response to receiving the final field input data at the computing device from the data import device while the final input field of the one or more input fields has the input focus, populating the final input field using the final field input data; advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data at the computing device from the data import device after the one or more input fields have been entered on the display screen and the input focus has been advanced away from the one or more input fields; advancing the materials testing workflow from the first state to a second state; displaying on the display screen a second GUI associated with the second state of the materials testing workflow; and A method comprising:

9. 9. The method of claim 8, further comprising: the processing circuitry of the computing device controlling the controller of the materials testing machine to perform the test method using the final field input data.

10. The method of claim 8 , wherein the tag reader comprises a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high radio frequency tag reader.

11. The method of claim 8 , wherein the measurement device comprises a digital caliper.

12. The method of claim 8 , wherein the first GUI further includes guidance on how to use the data import device to obtain the final field input data or the subsequent input data.

13. The method comprises: the processing circuitry verifying that the final field input data meets input criteria; preventing input into the final input field, advancement of the input focus, or execution of the test method if the final field input data does not meet the test criteria; The method of claim 8 further comprising:

14. 14. The method of claim 13, wherein validating the final field input data meets the input criteria includes validating the final field input data represents identifiers of fixtures that are compatible with a test configuration of the test method.

15. A non-transitory computer-readable medium containing machine-readable instructions that, when executed by a processor, Initiating a materials testing workflow configured to guide a user in setting up, executing, or analyzing a test method of a materials testing machine, the materials testing machine comprising a test sensor, a test actuator, and a test controller configured to control the test actuator; displaying on a display screen a first graphical user interface (GUI) associated with a first state of the materials testing workflow, the first GUI comprising one or more input fields; receiving final field input data from a data import device while a final field input field of the one or more input fields has input focus, the data import device including a camera, a tag reader, or a measurement device; in response to receiving the final field input data from the data import device while the final input field of the one or more input fields has the input focus, populating the final input field using the final field input data; advancing the input focus away from the one or more input fields; and in response to receiving subsequent input data at the computing device from the data import device after the one or more input fields have been entered on the display screen and the input focus has been advanced away from the one or more input fields; advancing the materials testing workflow from the first state to a second state; displaying on the display screen a second GUI associated with the second state of the materials testing workflow; and a non-transitory computer-readable medium that causes the processor to perform the steps of:

16. 16. The non-transitory computer-readable medium of claim 15, further comprising machine-readable instructions that, when executed by a processor, cause the processor to control the controller of the materials testing machine to perform the test method using the final field input data.

17. 16. The non-transitory computer-readable medium of claim 15, wherein the tag reader comprises a barcode reader, a near field communication (NFC) tag reader, a radio frequency identification (RFID) tag reader, or a short-range ultra-high frequency radio frequency tag reader, and the measuring device comprises a digital caliper.

18. 16. The non-transitory computer-readable medium of claim 15, wherein the first GUI further includes guidance on how to use the data import device to obtain the final field input data or the subsequent input data.

19. machine-readable instructions that, when executed by a processor, verifying that the final field input data meets input criteria; preventing the final input field from being entered, the input focus from being advanced, or the test method from being executed if the final field input data does not meet the test criteria; 20. The non-transitory computer-readable medium of claim 15, further comprising machine-readable instructions that cause the processor to:

20. 20. The non-transitory computer-readable medium of claim 19, wherein validating the final field input data meets the input criteria comprises validating the final field input data represents identifiers of fixtures that are compatible with a test configuration of the test method.

Images