Spectrum-based method for separating and modeling N-UI jitter
The spectrum analysis-based method in test measurement devices allows for accurate separation and determination of N-UI jitter components by directly deriving the N-UI spectrum from TIE, enhancing measurement precision and efficiency.
JP2026518589APending Publication Date: 2026-06-09TEKTRONIX INC
Patent Information
- Authority / Receiving Office
- JP · JP
- Patent Type
- Applications
- Current Assignee / Owner
- TEKTRONIX INC
- Filing Date
- 2024-05-03
- Publication Date
- 2026-06-09
Smart Images
Figure 2026518589000001_ABST
Abstract
A method and system for separating and determining the total jitter component of a signal under test includes a process for obtaining the time interval error (TIE) spectrum of the signal under test. The TIE spectrum contains multiple frequency bins. This method identifies the frequency bins in the TIE spectrum that contain deterministic jitter. This method includes a process for determining the total jitter component of the signal based on the frequency bins in the N-UI spectrum of the signal under test that correspond to the identified frequency bins in the TIE spectrum.
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