Flexible probe cushion for non-destructive testing

A flexible cushion with rib structures addresses lift-off issues in eddy current sensors, ensuring consistent contact and improved sensitivity on curved surfaces during non-destructive testing.

JP2026521550APending Publication Date: 2026-06-30EVIDENT CANADA INC

Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
EVIDENT CANADA INC
Filing Date
2024-06-13
Publication Date
2026-06-30

AI Technical Summary

Technical Problem

Non-destructive testing probes, particularly eddy current sensors, face challenges when inspecting curved surfaces due to lift-off issues, leading to reduced sensitivity and false defect indications.

Method used

A flexible cushion with internal rib structures is used to maintain contact between the probe and the test object, allowing the probe to conform to curved surfaces by resisting deformation in specific axes while facilitating translation.

Benefits of technology

The flexible cushion ensures consistent contact with the test object, enhancing sensitivity and accuracy of eddy current testing on irregular surfaces by preventing lift-off and rotation.

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Abstract

Non-destructive probe assemblies, such as eddy current array (ECA) sensor probe assemblies, may include a flexible cushion. The flexible cushion may contain or support each eddy current sensor, for example, to facilitate inspection of a workpiece having a curved surface. The flexible cushion may include one or more rib structures to allow deformation along a specified axis, and such rib structures may be arranged to restrict deformation along another axis. During inspection, the probe assembly may traverse the surface of the workpiece, including deforming a portion of the flexible cushion of the ECA sensor assembly to maintain contact between the active surface of the ECA sensor assembly and the workpiece. Such an approach can prevent or suppress lift-off of the ECA sensor, even when used to inspect a curved surface.
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Description

Technical Field

[0001] Claim of Priority This patent application claims the benefit of priority of U.S. Provisional Patent Application No. 63 / 508,183, entitled "FLEXIBLE PROBE CUSHION", filed on June 14, 2023 by Tessier et al. (Attorney Docket No. 6409.265PRV), the entire disclosure of which is hereby incorporated by reference.

[0002] This document generally relates to devices and techniques for non-destructive testing, such as facilitating eddy current testing, without limitation, and more particularly to devices and techniques comprising a sensor assembly having a flexible cushion at the interface between the sensor assembly and the test object.

Background Art

[0003] Non-destructive testing (NDT) can refer to the use of one or more different techniques for inspecting areas on or within an object, for example, to determine whether a defect or malfunction exists in the object being inspected, or otherwise to characterize the object being inspected. Certain types of NDT may include the use of eddy current testing approaches, which provide indication of the structure of the object, such that electromagnetic energy is applied to the object and the resulting induced current on or within the object is detected, and the value of the detected current (or associated impedance) indicates the presence of cracks, scratches, voids, porosity, or other heterogeneity (e.g., corrosion or pitting). Generally, an eddy current (EC) sensor includes one or more sensor elements, such as induction coils that can be excited using an alternating current (AC) source. Such coils (or other electromagnetic sensing elements such as Hall sensors) can be used to receive signals indicating induced eddy currents on or within the structure in response to such excitation, using the same coil (e.g., connected via a bridge circuit) for both excitation and pickup, or using one coil for transmission and another coil for pickup. In general, eddy current testing can be sensitive to variations in the distance between the EC sensor and the object being tested, such as when the EC sensor is lifted away from the surface of the object being tested, which can impair its sensitivity. [Overview of the project] [Means for solving the problem]

[0004] Non-destructive testing probe assemblies, such as eddy current array (ECA) sensor probe assemblies, may include a flexible cushion. The flexible cushion may contain or support each eddy current sensor, for example, to facilitate the inspection of a test object having a curved surface or otherwise a non-planar surface. The flexible cushion may include one or more rib structures to allow deformation along a specified axis, and such rib structures may be arranged to restrict deformation along or around another axis. During inspection, the probe assembly may traverse the surface of the test object, including deforming a portion of the flexible cushion of the ECA sensor assembly to maintain contact between the active surface of the ECA sensor assembly and the test object. Such an approach can prevent or suppress lift-off of the ECA sensor, even when used to inspect a curved surface.

[0005] In general, the apparatus and techniques described herein may include a flexible cushion to provide a mechanically flexible interface between a non-destructive testing probe sensor, such as an ECA sensor, and an object under test. The mechanically flexible interface may be configured to provide flexibility or cushioning (for example, by using materials or features such as one or more internal rib structures). The mechanically flexible interface may be configured to resist or even completely prevent bending or rotation along a specified axis. Features that adjust compliance, such as rib structures, may be included, such as within a flexible cushion supporting a sensor assembly. Such structures do not need to be uniform in configuration or spacing, and variations in such configuration can provide a variable amount of compliance over the length or area of ​​the probe assembly.

[0006] The cushion can help the probe assembly conform to the curved surface of the object under test without lift-off of the probe assembly, such as during translation or scanning of the probe assembly across the surface under test. The curved surface of the object under test may have a convex or concave profile, or a composite curvature including curvature of two or more axes. The flexible cushion configuration described herein can be manufactured using materials compatible with additive manufacturing processes, such as facilitating three-dimensional printing of complex internal configurations. Such materials may include, in exemplary examples, silicone or thermoplastic elastomer materials such as thermoplastic polyurethane (TPU) or thermoplastic polyamide (TPA) (e.g., abbreviated as "TPx" or "TPE").

[0007] In one embodiment, a non-destructive testing probe assembly may include a housing, a flexible cushion coupled to the housing, and a flexible sensor assembly locked to the flexible cushion. The flexible cushion may have a structure that resists deformation of the flexible cushion in a first degree of freedom with respect to a second orthogonal degree of freedom. For example, the flexible cushion may allow deformation in the Z direction orthogonal to a plane defining the active surface of the flexible cushion. In one embodiment, the deformation-resistant structure includes at least one rib structure extending between the surfaces facing the interior of the flexible cushion.

[0008] In one embodiment, a method for fabricating at least a portion of a non-destructive testing probe may include additionally fabricating a flexible cushion. This fabrication may include additionally fabricating (or otherwise formed) a feature portion for engaging the flexible cushion with a housing, and additionally fabricating (or otherwise formed) at least one rib structure to resist deformation of the flexible cushion in the first degree of freedom relative to a second orthogonal degree of freedom. The flexible sensor assembly can be placed in the area of ​​the flexible cushion so that the active surface of the flexible sensor is oriented outward from the surface of the flexible cushion.

[0009] In one embodiment, a flexible cushion can be provided for use with a non-destructive testing probe, comprising a flexible polymer material defining at least one rib structure that resists deformation of the flexible cushion in a first degree of freedom relative to a second orthogonal degree of freedom, and a region for mounting a flexible sensor assembly to orient the active surface of the flexible sensor outward from the surface of the flexible cushion. For example, at least one rib structure may extend between surfaces facing the interior of the flexible cushion.

[0010] This summary is intended to provide an overview of the subject matter of this patent application. It is not intended to provide an exclusive or exhaustive description of the invention. A more detailed description is included to provide further information relating to this patent application.

[0011] In drawings that are not necessarily drawn to an accurate scale, similar numbers may describe similar components in different views. Similar numbers with different letter suffixes may represent different instances of similar components. The drawings, while not limiting, generally illustrate the various embodiments considered in this document. [Brief explanation of the drawing]

[0012] [Figure 1] This specification illustrates examples that include non-destructive testing systems, which can be used to carry out at least one or more of the techniques shown and described herein. [Figure 2] This diagram illustrates an exploded view of a non-destructive testing probe assembly that includes various elements, including a flexible cushion and a flexible sensor assembly. [Figure 3A] Examples including flexible cushions will be illustrated in general terms. [Figure 3B] Let's illustrate this with a cross-sectional view of the flexible cushion shown in Figure 3A. [Figure 3C] Examples of each embodiment of the non-uniform compression of a flexible cushion are illustrated below. [Figure 3D]Examples of each embodiment of the non-uniform compression of a flexible cushion are illustrated below. [Figure 4A] This diagram illustrates an exploded view of a flexible cushion and flexible sensor assembly that can form part of a non-destructive testing probe assembly. [Figure 4B] Let's illustrate this with a cross-sectional view of the flexible cushion shown in Figure 4A. [Figure 4C] Figure 4A illustrates a side section view of a non-destructive testing probe assembly, which may include a flexible cushion and a flexible sensor assembly. [Figure 4D] An isometric section of a non-destructive testing probe assembly, which may include the flexible cushion and flexible sensor assembly shown in Figure 4A, is illustrated. [Figure 5A] Another embodiment is illustrated in general terms, including an isometric section of a flexible cushion that can have non-uniform compliance along at least one axis. [Figure 5B] Further embodiments are illustrated in general terms, including isometric views of a flexible cushion that can have non-uniform compliance along at least one axis. [Figure 6A] Another embodiment, comprising a flexible cushion with an inner rib arrangement and an outer rib arrangement, is illustrated with a different diagram. [Figure 6B] Another embodiment, comprising a flexible cushion with an inner rib arrangement and an outer rib arrangement, is illustrated with a different diagram. [Figure 6C] Another embodiment, comprising a flexible cushion with an inner rib arrangement and an outer rib arrangement, is illustrated with a different diagram. [Figure 7] This paper provides general examples of techniques, such as manufacturing methods, for providing flexible cushions that can be associated with inspection probe assemblies. [Modes for carrying out the invention]

[0013] Non-destructive testing can be performed using probe assemblies, such as handheld probes, which may include a housing, interconnects, electronic circuits, and sensors (or arrays of sensors). For example, for eddy current array (ECA) testing, a flexible printed circuit board may include each eddy current sensor element (e.g., planar induction coils). The inventors recognize that non-destructive testing can be performed by scanning or translating a probe assembly along a surface that is not perfectly flat, such as including either a convex or concave surface topology (or both). Irregular surfaces can lift the sensor assembly away from the surface of the object being tested, for example, by interfering with the inspection (e.g., causing lift-off errors or false defect indications). One approach is to use a solid foam pad on which the inspection probe sensor assembly is fixed. However, the use of foam materials can present various challenges, such as a lack of mechanical durability, snagging when the probe comes into contact with and translates the surface, or difficulties in replacement.

[0014] The inventors have recognized that flexible cushion structures can be used, among other things, to address one or more of the above-mentioned problems. Flexible cushion structures can be fabricated from flexible polymer materials and may include internal structures such as one or more ribs to provide structural integrity with specified compliance properties. As shown and described herein, various flexible cushion configurations can be used to prevent or limit rotation or compression in a particular direction while facilitating the conformation of the active surface of the probe assembly to the object under test. Compliance, or conversely, stiffness (e.g., the degree of resistance to deformation or compression), can be uniform or non-uniform along the axis or surface of the flexible cushion, according to various embodiments.

[0015] FIG. 1 generally illustrates an embodiment including a non-destructive testing system 100 that can be used to implement at least a portion of one or more of the techniques shown and described herein, or can use an apparatus as shown and described elsewhere in this document. The non-destructive testing system 100 can include a test instrument 140, such as a handheld or portable assembly. The test instrument 140 can be electrically coupled to a probe assembly 150, such as by using a multi-conductor interconnect 130. The probe assembly 150 can include one or more sensors, such as an eddy current coil array 154 (ECA). The EC coil is electromagnetically coupled to a target 158 (e.g., a test specimen or “test object”), and the system 100 can be used to detect a defect 160 by using one or more of the techniques shown and described in this document. The ECA 154 can be a four-coil planar cross-wound sensor (CWS) or an array of such sensors, or the ECA 154 can have another configuration, such as a one-dimensional array or a two-dimensional array configuration, as an exemplary embodiment. The ECA 154 can be flexible, or otherwise can follow a linear or curved profile, or can include an array of elements extending along multiple axes. The size and pitch of the elements can vary depending on the inspection application. As shown and described elsewhere in this document, a flexible cushion 156 can support the EC coil array 154, such as to assist in conforming the EC coil array 154 to the surface of the target 158.

[0016] A modular probe assembly 150 configuration can be used that allows the test instrument 140 to be used with a variety of different probe assemblies. The test instrument 140 can include digital and analog circuit configurations, such as a front-end circuit 122 that includes one or more of a transmission signal chain (forming a transmitter circuit), a reception signal chain (forming a receiver circuit), or a switching circuit configuration (e.g., a multiplexer circuit 123). The transmission signal chain can include an amplifier and filter circuit configuration to provide an alternating current (AC) excitation signal for delivery to the probe assembly 150 through the interconnect 130.

[0017] FIG. 1 shows a single probe assembly 150 and a single ECA 154, but other configurations can be used, such as a number of probe assemblies connected to a single test instrument 140, or a number of arrays 154 used with a single probe assembly 150. Similarly, the test protocol can be implemented using coordination between multiple test instruments 140, for example, in response to an overall test scheme established from each test instrument 140 or established by another remote system such as a computing facility 108 or a general-purpose computing device such as a laptop 132, tablet, smartphone, desktop computer. The test scheme can be established according to published standards or regulatory requirements and can be implemented, for example, at first production or repeatedly for continuous monitoring.

[0018] The front-end circuit 122 can be coupled to and controlled by one or more processor circuits, such as a processor circuit 102 included as part of the test instrument 140. The processor circuit can be coupled to a memory circuit 104, for example, to cause the test instrument 140 to execute instructions to perform one or more of EC acquisition, processing, or storage of data related to EC inspection. The test instrument 140 can be communicatively coupled to other parts of the system 100, such as by using a wired or wireless communication interface 120.

[0019] The performance of one or more techniques as shown and described herein can be achieved on the test apparatus 140 or using other processing or storage equipment, such as a computing device 108 or a laptop 132, tablet, smartphone, or desktop computer. For example, processing tasks that would be unnecessarily slow if performed on the test apparatus 140 or if performed beyond the capabilities of the test apparatus 140 can be performed remotely (for example, on a separate system, such as using physical or virtualized processing resources) in response to a request from the test apparatus 140. The test apparatus 140 may include a display 110 for presenting configuration information or results, and an input device 112, such as one or more of a keyboard, trackball, function keys or soft keys, mouse interface, touchscreen, or stylus, for receiving operator commands, configuration information, or responses to queries.

[0020] Figure 2 illustrates an exploded view of a non-destructive testing probe assembly 250, which includes various elements, including a flexible cushion 256 and a flexible sensor assembly 254. Generally, as described above, the flexible sensor assembly 254 comprises one or more eddy current sensor elements 255, such as a planar winding structure. The active surface 264 of the flexible sensor assembly 254 may be oriented to face outward from the flexible sensor assembly 254 so as to be positioned in close proximity to the object under test. For example, one or more cover layers, such as a polyolefin layer 257, may be placed on at least a portion of the surfaces of the flexible sensor assembly 254 and the flexible cushion 256. This can help to hold the flexible sensor assembly 254 against the flexible cushion 256 and help to avoid pinching or binding of the edges of the flexible sensor assembly 254 when the probe assembly 250 is translated or scanned across the surface of the object under test.

[0021] Abrasion plates containing polytetrafluoroethylene (PTFE) can be used to prevent wear on the polyolefin layer 257 or other elements such as the flexible sensor assembly 254 or the flexible cushion 256. As shown in Figure 2, the flexible cushion 256 may include or define a recessed area or channel 268 that accommodates the planar sensor area of ​​the flexible sensor assembly 254, such as by avoiding the protrusion of the flexible sensor assembly 254 outward from the bottom of the flexible cushion 256 together with the flexible sensor assembly present in the channel 268 (e.g., establishing a coplanar or nearly coplanar configuration).

[0022] The flexible cushion 256 may include other features such as protruding ridges or rails 262 that engage with corresponding portions of the housing 251 in order to at least partially engage the flexible cushion 256 with the housing 251. For example, a semicircular projection may engage with a corresponding semicircular cavity included as part of the housing 251. As shown and described in other embodiments, the flexible cushion 256 may include other features such as internal ribs or stops 274. The stops 274 can prevent compression of the flexible cushion 256 beyond a specified limit, for example, by mechanical interference of the stops 274 with the surface 266 of the flexible cushion 256. The non-destructive testing probe assembly 250 may include one or more user interface features such as inputs (e.g., buttons 212) and displays such as indicators 210. For example, when the probe assembly 250 is positioned to begin scanning, the input button 212 can be activated, and the indicator 210 can indicate status (e.g., by illuminating or changing colors).

[0023] Figure 3A illustrates a general embodiment comprising a flexible cushion 356, similar to the flexible cushion 256 in Figure 2. Figure 3B illustrates a cross-section of the flexible cushion 356 in Figure 3A. Referring to Figures 3A and 3B, the flexible cushion 356 can be conformable, for example, by including a flexible polymer material. For example, a conformable elastomer polymer can be used. When the surface 366 of the flexible cushion 356 is placed on the surface of the object to be tested, the flexible cushion 356 can be deformed to conform its surface 366 to the surface of the object to be tested. Such deformation or compliance can be controlled, for example, by allowing the flexible cushion 356 to compress in the "Z" axis perpendicular to a location along the centerline defined by the longitudinal axis "L", but by preventing rotation "R1" around the longitudinal axis L (e.g., in the "rotation" direction) or preventing rotation "R2" around the transverse axis "T" (e.g., in the "pitch" direction), or both. In this way, the flexible cushion resists deformation in one (or more) degrees of freedom, such as R1 or R2 or both, and allows deformation in another degree of freedom (e.g., in the Z direction). Such deformation does not need to be uniform. For example, the deformation may be greater or smaller in the Z direction at the location labeled Z1 compared to another location labeled Z2, depending on the shape of the surface being inspected, as shown and described below in relation to Figures 3C and 3D. The flexible cushion 356 may include or define recessed areas or channels 368, for example, to receive the planar sensor area of ​​a flexible sensor assembly.

[0024] Referring to Figures 3A and 3B, the deformation of the flexible cushion 356 in the Z direction can be facilitated by the first web region 372A and the second web region 372B. Such web regions can extend laterally outward when the flexible cushion 356 is compressed in the Z direction, or extend inward when the flexible cushion is elongated in the Z direction. The stop 374 can prevent compression in the Z direction beyond a specified displacement. The resistance to rotation in degrees of freedom R1 and R2 can be controlled by using a rib structure, for example. For example, as shown in Figure 3B, one or more ribs, such as rib 376, can be included, such as extending between the inward-facing surfaces 366 and 386. The ribs can be linear, including a single plane or curved surface, or they can include multiple segments. In general, a combination of the first web region 372A, the second web region 372B, and one or more rib structures can provide a structure that resists deformation of the flexible cushion 356 in the first degree of freedom with respect to the orthogonal second degree of freedom.

[0025] As shown in Figure 3B and other embodiments, the rib 376 comprises two planar segments 382A and 382B with intersecting edges to define a vertex 378, the vertex extending parallel to the transverse direction T. Thus, in the configurations shown in Figure 3B and elsewhere, the configuration of the rib 376 allows for Z-axis displacement by folding or extending, but such a structure resists translation of the upper surface 386 relative to the lower surface 366 in the transverse direction T, and, as an exemplary embodiment, the configuration of the rib 376 resists rotation R1 about the longitudinal axis L. The orientation and shape of the rib 376 shown in Figure 3B are exemplary, and other configurations may be used.

[0026] The deformation of the flexible cushion 356 does not need to be uniform in order to allow the active surface 366 of the flexible cushion 356 to conform to the surface of the object being inspected. For example, Figures 3C and 3D illustrate respective embodiments of side views of non-uniform compression of the flexible cushion 356 along its length to conform to the surface "S" of the object being inspected, angled relative to the surface 366 of the flexible cushion 356. For example, in Figure 3C, location Z1 is compressed until the stop 374 abuts the bottom wall of the flexible cushion 356, while location Z2 is less compressed or uncompressed. In contrast, in Figure 3D, location Z1 is less compressed or uncompressed than location Z2. As will be discussed below, the compliance (e.g., resistance to deformation) of the flexible cushion 356 does not need to be uniform along its length or across its area.

[0027] Figure 4A illustrates an exploded view of a flexible cushion 456 and a flexible sensor assembly 454 that can form part of a non-destructive testing probe assembly. The configuration of the flexible sensor assembly 454 shown in Figure 4A and elsewhere may include a flexible interconnect 430, such as a polyimide flex circuit having one or more metallized layers. The metallized layers may also be used to define one or more eddy current sensor elements included in the flexible sensor assembly 454. The flexible interconnect 430 may include a connector region 431, such as an edge connector formed using a flexible printed circuit board (PCB) assembly, or may terminate within the connector region 431. The flexible interconnect may include features such as bends, curves, or curves to allow the flexible sensor assembly 454 to translate or bend to conform to the surface of the object under test as the flexible cushion 456 deforms. The flexible cushion 456 may define one or more feature areas, such as an area 475, to allow deformation and displacement of the flexible interconnect 430 without mechanical interference to the flexible cushion 456, in response to the deformation of the flexible cushion. Figure 4B illustrates a cross section of the flexible cushion 456 of Figure 4A.

[0028] As will be described elsewhere, the deformability of the flexible cushion 456 can be controlled by including one or more rib structures. The ribs may include slots, apertures, or gaps to make the rib structure more flexible (e.g., less rigid). As shown in Figure 4B, the rib 476 may have an aperture 477 defined to better conform the flexible cushion 456 to the Z direction along the centerline (the centerline is defined as the cutting line for the section view in Figure 4B) compared to a solid rib, as shown in Figure 3B. Figures 4A and 4B also show a stop 474 that can prevent Z-axis deformation. The stop 474 may also include slots or apertures so that preventing deformation does not completely eliminate further deformation, but rather requires more force for such deformation. In this way, the active surface 466 housing the sensor assembly 454 can more easily maintain contact with the irregular surface of the object under test using a force slightly greater than the minimum force required to deform the flexible cushion 456. This behavior may be useful for providing force feedback to a user holding a probe assembly equipped with the flexible cushion 456, or for applications where an automated system, such as a robotic manipulator or other scanner, positions the probe assembly equipped with the flexible cushion 456 on an object under test.

[0029] Figure 4C illustrates a side section of a non-destructive testing probe assembly 450, which may include the flexible cushion 456 and flexible sensor assembly 454 shown in Figure 4A. Figure 4D illustrates an isometric section of the non-destructive testing probe assembly 450, which may include the flexible cushion 456 and flexible sensor assembly shown in Figure 4A. As described above in relation to Figure 4A, with reference to Figures 4C and 4D, the flexible sensor assembly 454 may be coupled to or include a flexible interconnect 430 so as to electrically couple the flexible sensor assembly 454 to the electronic circuit 422 located within the housing 451. The non-destructive testing probe assembly 450 may include a single-axis or multi-axis encoder, such as a single-axis encoder 433 with one or more wheels. For example, the non-destructive testing probe assembly 450 may be configured to perform scanning in the lateral direction as the wheels of the single-axis encoder 433 rotate. The plane of the wheel's bottom surface can be offset relative to the plane of the flexible cushion 456, so that the flexible cushion 456 is compressed before the wheel of the single-axis encoder 433 engages with the surface of the object to which the flexible sensor assembly 454 is applied. As described above, the non-destructive testing probe assembly 450 may include inputs (e.g., buttons 412) and other feature parts such as indicators 410 or other visual display elements.

[0030] Figure 5A illustrates another embodiment, including an isometric section of a flexible cushion 556A that can have non-uniform compliance along at least one axis. In contrast to the embodiments described above, each rib structure shown in the embodiment of Figure 5A can have different configurations from one another. For example, as shown, rib 576A can define a slot, aperture, or gap to establish a greater degree of centerline Z-axis compliance at location Z1 along surface 566A, while rib 576N can omit such a slot, aperture, or gap to establish a relatively smaller degree of centerline Z-axis compliance at location Z2 relative to location Z1. The configurations shown in Figure 5A are illustrative, and the orientations shown can be reversed or otherwise modified.

[0031] Figure 5B illustrates another embodiment in general terms, including an isometric view of a flexible cushion 556C that can have non-uniform compliance along at least one axis. In the embodiment of Figure 5B, the outer web 569 can allow Z-axis displacement of the surface 566C at location Z2, and the symmetrically arranged structure can allow Z-axis displacement of the surface 566C at location Z1. Reinforcement 571 can prevent displacement in the central region of the surface 566C so that the flexible cushion 556C can conform to the concave surface "S" being inspected, on which a sensor assembly positioned on the surface 566C is located.

[0032] Figures 6A, 6B, and 6C illustrate different diagrams of yet another embodiment comprising a flexible cushion 656 having an internal rib arrangement and an external rib arrangement. Figure 6A shows a cross-sectional view as shown in Figure 6B, Figure 6B shows a bottom view of the active surface 666 of the flexible cushion 656, and Figure 6C shows a side view of the flexible cushion 656. Embodiments of the flexible cushion 656 may include an externally curved rib, such as a rib 669, instead of or in addition to one or more internal rib structures, such as a rib 676. Such a configuration may use external ribs, internal ribs, or both to control the degree of compliance of the flexible cushion. Such a configuration may also use less material than other configurations that use a solid outer web.

[0033] The various flexible cushion configurations shown herein can be manufactured using a variety of different approaches. Simpler configurations can be formed by molding, stamping, or other methods. Profiles with internal structures such as ribs, as shown herein, can be manufactured using additive manufacturing approaches or other approaches. For example, elastomers such as silicone or thermoplastic elastomers can be used. Examples of thermoplastic elastomers include thermoplastic polyurethane (TPU) or thermoplastic polyamide (TPA) materials. Such materials can withstand transient exposure to contaminants such as hydrocarbon fluids or hydraulic fluids, for example, when the flexible cushion is used for ECA inspection in aerospace, maritime, chemical processes, petroleum or pipeline services, or other applications.

[0034] As an exemplary embodiment, Figure 7 illustrates generally an art 700, such as a method of fabrication, for providing a flexible cushion, such as one associated with an inspection probe assembly. For example, in 705, the flexible cushion can be fabricated (e.g., by printing it three-dimensionally using an additive manufacturing process). The flexible cushion may define one or more feature portions for engaging the flexible cushion with the housing of a nondestructive probe assembly. In 710, the fabrication may include forming at least one structure that resists deformation of the flexible cushion in a first degree of freedom with respect to a second orthogonal degree of freedom. For example, a web or rib structure, such as those shown and described herein, can be formed in 710, such as by using an additive manufacturing process.

[0035] In 715, a flexible sensor assembly, such as a flexible ECA sensor, can be installed in the area of ​​the flexible cushion. For example, a channel or other area of ​​the flexible cushion can support the flexible sensor assembly. The flexible sensor assembly can be secured to the flexible cushion using an adhesive layer, such as a pressure-sensitive adhesive, or the flexible sensor assembly can be held by a cover layer, such as one comprising a polyolefin material fixed to the flexible sensor assembly and at least a portion of the flexible cushion. In 720, a stop feature can be formed to prevent compression of the flexible cushion beyond a specified displacement. Other fabrication techniques may include, for example, the use of different materials for different parts of the flexible cushion, such as reinforcing materials, or entirely different approaches, such as single-shot or multi-shot molding, or insert molding. Therefore, the embodiment in Figure 7 and other embodiments described herein are for illustrative purposes only.

[0036] Various notes Each of the above non-limiting embodiments may stand alone or may be combined in various permutations or combinations with one or more of the other embodiments or subjects described herein.

[0037] The above detailed description includes references to the accompanying drawings, which form part of the detailed description. The drawings illustrate specific embodiments by which the present invention can be carried out. These embodiments are also generally referred to as “Examples.” Such embodiments may include elements in addition to those illustrated or described. However, the inventors also intend embodiments in which only the illustrated or described elements are provided. Furthermore, the inventors also intend examples using any combination or permutation of those illustrated or described elements (or one or more of their embodiments) with respect to a particular embodiment (or one or more of its embodiments) or with respect to other embodiments (or one or more of its embodiments) illustrated or described herein.

[0038] In the event of any conflict in usage between this document and any document incorporated by such reference, the usage described in this document shall prevail.

[0039] In this document, the terms “a” or “an” are used to include one or more, independently of any other instances or uses of “at least one” or “one or more,” as is common in patent literature. In this document, the term “or” is used to refer to a non-exclusive OR, such that “A or B” includes “A but not B,” “B but not A,” and “A and B.” In this document, the terms “including” and “in which” are used as plain English synonyms for the terms “comprising” and “wherein,” respectively. Furthermore, in the following claims, the terms “including” and “comprising” are not limited; that is, a system, device, article, composition, formulation, or process that includes elements in addition to those listed after such terms in a claim is still considered to be within the scope of that claim. Furthermore, in the following claims, terms such as “first,” “second,” and “third” are used merely as labels and are not intended to impose numerical requirements on their objects.

[0040] Embodiments of the methods described herein can be at least partially machine or computer implements. Some embodiments may include computer-readable or machine-readable media encoded with instructions that can be operated to configure an electronic device to implement the methods described in the above embodiments. Implementations of such methods may include code such as microcode, assembly language code, or higher-level language code. Such code may include computer-readable instructions for implementing various methods. The code may form part of a computer program product. Such instructions may be read and executed by one or more processors, for example, to enable the implementation of operations including the method. Instructions may be in any preferred form, but are not limited to source code, compiled code, interpreted code, executable code, static code, dynamic code, and so on. Furthermore, in one example, code may be tangibly stored in one or more volatile, non-temporary, or non-volatile tangible computer-readable media during execution or at other times. Examples of such tangible computer-readable media include, but are not limited to, hard disks, removable magnetic disks, removable optical disks (e.g., compact discs and digital video discs), magnetic cassettes, memory cards or sticks, random access memory (RAM), and read-only memory (ROM).

[0041] The above description is intended to be illustrative and not restrictive. For example, the embodiments (or one or more aspects thereof) described above may be used in combination with one another. Other embodiments may be used, for example, by those skilled in the art when reviewing the above description. The abstract is provided to enable the reader to quickly confirm the nature of the technical disclosure. The abstract is submitted with the understanding that it is not to be used to interpret or limit the scope or meaning of the claims. Also, in the above detailed description, various features may be grouped together to streamline the disclosure. This should not be interpreted as meaning that any disclosed features not claimed are essential to any claim. Rather, the subject matter of the invention may lie in fewer features than all the features of a particular disclosed embodiment. Accordingly, the following claims are incorporated into the detailed description as examples or embodiments, and each claim exists independently as a separate embodiment, and such embodiments are intended to be able to be combined with one another in various combinations or permutations. The scope of the invention should be determined by referring to the appended claims, together with the entire scope of equivalents to which such claims are entitled.

Claims

1. A non-destructive testing probe assembly, Housing and A flexible cushion coupled to the housing, The flexible sensor assembly is secured to the flexible cushion, A non-destructive testing probe assembly comprising a flexible cushion having a structure that resists deformation of the flexible cushion in the first degree of freedom with respect to a second orthogonal degree of freedom.

2. The non-destructive testing probe assembly according to claim 1, wherein the first degree of freedom includes rotation in the pitch direction about the lateral axis of the flexible cushion.

3. The non-destructive testing probe assembly according to claim 1, wherein the second degree of freedom includes rotation in the rolling direction about the longitudinal axis of the flexible cushion.

4. The non-destructive testing probe assembly according to any one of claims 1 to 3, wherein the flexible cushion allows deformation in the Z direction perpendicular to the plane defining the active surface of the flexible cushion.

5. The nondestructive testing probe assembly according to any one of claims 1 to 4, wherein the deformation-resistant structure comprises at least one rib structure extending between surfaces facing the interior of the flexible cushion.

6. The nondestructive testing probe assembly according to claim 5, wherein the at least one rib structure is defined by two planar segments that are angled and have intersecting edges to define a vertex.

7. The non-destructive testing probe assembly according to claim 6, wherein the intersection of the edges extends parallel to the lateral axis of the flexible cushion.

8. The nondestructive testing probe assembly according to any one of claims 5 to 7, wherein the surface of at least one rib structure defines a slot, aperture, or gap.

9. A non-destructive testing probe assembly according to any one of claims 1 to 8, comprising a stop feature that prevents compression of the flexible cushion beyond a specified displacement.

10. The non-destructive testing probe assembly according to any one of claims 1 to 9, wherein the flexible sensor assembly includes a flexible printed circuit board (PCB) assembly comprising a flexible interconnect between an active surface of the flexible sensor assembly, which is locked to the flexible cushion, and a circuit in the housing.

11. The nondestructive testing probe assembly according to claim 10, wherein the flexible cushion defines an area that allows deformation and displacement of the flexible interconnect in response to deformation of the flexible cushion without mechanical interference to the flexible cushion.

12. The nondestructive testing probe assembly according to claim 10 or 11, wherein the flexible cushion defines a channel that is present to prevent the flexible sensor assembly from protruding outward from the flexible cushion.

13. A non-destructive testing probe assembly according to any one of claims 1 to 12, comprising a cover layer applied to the active surface of the flexible sensor assembly and at least a portion of the surface of the flexible cushion.

14. The nondestructive testing probe assembly according to any one of claims 1 to 13, wherein the flexible sensor assembly comprises an eddy current array (ECA) sensor.

15. The nondestructive testing probe assembly according to any one of claims 1 to 14, wherein the flexible cushion comprises a flexible polymer.

16. The non-destructive testing probe assembly according to claim 15, wherein the flexible cushion is additionally manufactured.

17. A method for manufacturing a non-destructive testing probe, wherein the method is The process of additionally manufacturing a flexible cushion that defines a feature for engaging the flexible cushion with the housing, wherein the additional manufacturing of the flexible cushion includes forming at least one rib structure that resists deformation of the flexible cushion in the first degree of freedom with respect to a second orthogonal degree of freedom, A method comprising: placing a flexible sensor assembly in the region of the flexible cushion, thereby orienting the active surface of the flexible sensor assembly outward from the surface of the flexible cushion.

18. The method according to claim 17, wherein the at least one rib structure extends between the surfaces facing the interior of the flexible cushion.

19. The method according to claim 17 or 18, wherein the at least one rib structure is defined by two planar segments that are angled and have intersecting edges to define a vertex.

20. The method according to claim 19, wherein the intersection of the edges extends parallel to the lateral axis of the flexible cushion.

21. The method according to any one of claims 17 to 20, wherein the surface of at least one rib structure defines a slot, aperture, or gap.

22. The method according to any one of claims 17 to 21, wherein the additional manufacturing includes forming a stop feature that prevents compression of the flexible cushion beyond a specified displacement.

23. The method according to any one of claims 17 to 22, wherein the flexible cushion defines an area for allowing deformation and displacement of a flexible interconnection associated with the flexible sensor assembly in response to deformation of the flexible cushion, without mechanical interference to the flexible cushion.

24. The method according to any one of claims 17 to 23, wherein the installation includes positioning the flexible sensor assembly within a channel defined by the flexible cushion to prevent the active surface of the flexible sensor assembly from protruding outward from the flexible cushion.

25. The method according to any one of claims 17, comprising fixing a cover layer to at least a portion of the active surface of the flexible sensor assembly and the surface of the flexible cushion.

26. The method according to any one of claims 17 to 25, wherein the flexible sensor assembly comprises an eddy current array (ECA) sensor.

27. A flexible cushion for a non-destructive testing probe, wherein the flexible cushion is A rib structure that resists the deformation of the flexible cushion in the first degree of freedom with respect to a second orthogonal degree of freedom, A flexible cushion comprising a flexible polymer material that defines a region for mounting the flexible sensor assembly, such that the active surface of the flexible sensor assembly is oriented outward from the surface of the flexible cushion.

28. The flexible cushion according to claim 27, wherein the at least one rib structure extends between the surfaces facing the interior of the flexible cushion.

29. The flexible cushion comprises a plurality of rib structures extending between the surfaces facing the interior, The flexible cushion according to claim 28, wherein at least two of the plurality of rib structures have different configurations to provide different degrees of compliance with one another.

30. The flexible cushion according to claim 28 or 29, wherein the flexible polymer material is an additive manufacturing material.