STATE CHANGE TRACKING DEVICE, X-RAY IMAGING SYSTEM, METHOD FOR TRACKING STATE CHANGE OF INSPECTION OBJECT, AND METHOD FOR ESTIMATING LIFE OF INSPECTION OBJECT

Abstract

To shorten a test time for life estimation and quantify an index of life estimation.SOLUTION: A state change tracking device 20 comprises a state change tracking unit 213 that tracks a change in the state of an object to be inspected in a non-destructive manner by using a plurality of reconfiguration images obtained by sequentially photographing the object to be inspected placed in a specific environment with an X-ray Talbot photographing device 1. The reconfiguration image is any one of an absorption image, a differential phase image, and a small angle scattering image, and is a Talbot image created by a Talbot effect.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a state change tracking device, an X-ray imaging system, a state change tracking method for an inspection object, and a lifetime estimation method for an inspection object. [Background technology]

[0002] Conventionally, a method for evaluating remaining life has been proposed in which ultrasonic waves are applied to a welded portion of stainless steel and the reflected signals reflected from minute defects are analyzed to derive an estimated life of the welded portion (see, for example, Patent Document 1).

[0003] Specifically, claim 1 of Patent Document 1 describes a "remaining life assessment method for assessing the remaining life of a welded portion formed of high chromium steel based on micro-defects that occur in the welded portion, the method comprising: an analytic signal acquisition step of acquiring an analytic signal by analyzing a reflected signal reflected from micro-defects that occur in the welded portion to which ultrasonic waves are irradiated; a micro-defect number density estimation step of deriving an estimated number density of the micro-defects from the acquired analytic signal based on first correlation data that indicates a correlation between the analytic signal and the number density of the micro-defects; and a remaining life estimation step of deriving an estimated remaining life of the welded portion from the estimated number density based on second correlation data that indicates a correlation between the number density of the micro-defects and the remaining life of the welded portion." [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2013-11521 A Summary of the Invention [Problem to be solved by the invention]

[0005] Generally, when estimating the lifespan of a sample that is an object to be inspected, knowledge regarding the lifespan is obtained by placing the sample in an accelerated test environment or the like and conducting tests until the sample actually reaches its limit state. In this case, since the accelerated test is conducted until the object to be inspected reaches its limit state, it takes a considerable amount of time until the test is completed.

[0006] In addition, in general lifespan estimation methods, the test object is evaluated mainly by sensory evaluation using human senses (sight, touch, etc.). Therefore, the subjective judgment of the evaluator is likely to cause variation and reduce accuracy. In addition, human sensory evaluation is qualitative, and there is also the problem that it is not possible to know the progress of the test object until it reaches its limit.

[0007] In view of the above circumstances, the present invention aims to shorten the test time for life estimation and to quantify an index for life estimation in a condition change tracking device, an X-ray imaging system, a method for tracking condition changes in an inspection object, and a method for estimating life of an inspection object. [Means for solving the problem]

[0008] The above object of the present invention can be achieved by the following means. (1) A state change tracking unit that nondestructively tracks state changes of an object to be inspected by using a plurality of reconstructed images of the object to be inspected placed in a specific environment taken over time by an X-ray Talbot imaging device. 、 The state change tracking unit is extracting a feature amount of the reconstructed image that continuously changes until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and deriving a threshold value of the feature amount corresponding to the life of the inspection object; Status change tracker.

[0010] (2) The state change tracking unit creating a calibration curve by plotting the feature amount against the elapsed time that the test object is placed in the specific environment; A state change tracking device as described in (1).

[0011] (3) A lifetime estimation unit is further provided that estimates a lifetime of the inspection object based on a reconstructed image of the inspection object captured by the X-ray Talbot imaging device, The life estimation unit is extracting features from the reconstructed image of the new inspection object, and extrapolating the features to the calibration curve generated by the state change tracking unit to estimate a lifetime of the new inspection object; A state change tracking device as described in (2).

[0012] (4) further comprising a registration unit that registers the plurality of reconstructed images of the object to be inspected captured over time; A state change tracking device according to any one of (1) to (3).

[0013] (5) A correction unit is further provided that acquires a shape and / or a subject of the inspection object in the multiple captured reconstructed images, and corrects a tilt, a position, and a size of the reconstructed images based on the acquired shape and / or the acquired subject. A state change tracking device according to any one of (1) to (4).

[0014] (6) The specific environment is an environment exposed to a specific chemical substance. A state change tracking device according to any one of (1) to (5).

[0015] (7) The specific environment is an environment under stress. A state change tracking device according to any one of (1) to (5).

[0016] (8) The specific environment is a heated or cooled environment. A state change tracking device according to any one of (1) to (5).

[0017] (9) The object to be inspected contains resin as a main component. A state change tracking device according to any one of (1) to (8).

[0018] (10) The reconstructed image includes an absorption image, a differential phase image, and a small-angle scattering image, and is a Talbot image generated by the Talbot effect. A state change tracking device according to any one of (1) to (9).

[0019] (11) A state change tracking unit that nondestructively tracks state changes of an object to be inspected by a plurality of reconstructed images of the object to be inspected placed in a specific environment taken over time by an X-ray Talbot imaging device, The state change tracking unit is extracting a feature amount of the reconstructed image that changes continuously until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and deriving a threshold value of the feature amount corresponding to the life of the inspection object; X-ray imaging system.

[0020] (12) generating a plurality of reconstructed images of the object of inspection taken over time by the X-ray Talbot imaging device; a state change tracking unit non-destructively tracking a state change of the inspection object based on the plurality of reconstructed images; the state change tracking unit extracts feature amounts of the reconstructed images that continuously change until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and derives a threshold value of the feature amount corresponding to the life of the inspection object. A method for tracking changes in the condition of an inspected object.

[0021] (13) generating a plurality of reconstructed images of the object to be inspected captured by the X-ray Talbot imaging device; a state change tracking unit non-destructively tracking a state change of the inspection object based on the plurality of reconstructed images; the state change tracking unit extracts, using the plurality of reconstructed images captured over time, feature amounts of the reconstructed images that continuously change until the end of the inspection object's life, and derives a threshold value of the feature amount corresponding to the life of the inspection object; a step of the state change tracking unit plotting the feature amount against the elapsed time during which the inspection object is placed in a specific environment to create a calibration curve; A lifetime estimation unit estimating a lifetime of the inspection object based on the reconstructed image; the lifetime estimation unit extracting a feature amount from the reconstructed image of the new inspection object, and extrapolating the feature amount to the calibration curve generated by the state change tracking unit to estimate a lifetime of the new inspection object, A method for estimating the lifespan of an inspected object. Effect of the Invention

[0022] According to the present invention, it is possible to reduce the test time for life estimation and to quantify the index of life estimation. [Brief description of the drawings]

[0023] [Figure 1] 1 is a block diagram showing a configuration of an X-ray imaging system according to an embodiment of the present invention. [Diagram 2] 1 is a schematic diagram showing the overall configuration of an X-ray Talbot imaging device. [Diagram 3] FIG. 2 is an explanatory diagram showing the principle of a Talbot interferometer in the X-ray imaging system according to the present embodiment. [Figure 4] FIG. 2 is an explanatory diagram showing a first grating and a second grating of the X-ray Talbot imaging device. [Diagram 5] 11 is a flowchart showing a process for generating a database of feature amount data in the state change tracking device. [Figure 6] 1 is an explanatory diagram showing a concept in which a state change tracking unit of a CPU of a state change tracking device extracts a feature amount correlated with elapsed time. [Figure 7] 1 is an explanatory diagram showing a graph of a calibration curve used by a state change tracking unit of a CPU of a state change tracking device to estimate a threshold value of a feature amount corresponding to the life of an object to be inspected. FIG. [Figure 8] 13 is a flowchart showing a process in which a life estimation unit of a CPU of the state change tracking device estimates the life of an object to be inspected. [Figure 9] 13 is an explanatory diagram showing a graph of a calibration curve in which the lifetime estimation unit of the CPU of the condition change tracking device estimates the lifetime of a new test object. FIG. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0024] Hereinafter, embodiments of the present invention will be described with reference to the attached drawings. In the description of the drawings, the same elements are denoted by the same reference numerals, and redundant descriptions will be omitted as appropriate.

[0025] [Overall Configuration] FIG. 1 is a block diagram showing the configuration of an X-ray imaging system 100 according to the present embodiment. As shown in FIG. 1, the X-ray imaging system 100 according to the present embodiment includes an X-ray talbo imaging device 1, a controller 19, an image processing device 2, and a state change tracking device 20. The X-ray talbo imaging device 1 is communicably connected to the image processing device 2 and the state change tracking device 20 via a bus to the controller 19.

[0026] Note that in the present embodiment, the X-ray imaging system 100 does not necessarily include the X-ray talbo imaging device 1 as long as the state change tracking device 20 can acquire a talbo image (reconstructed image) taken by the X-ray talbo imaging device 1 described later and extract the signal intensity or signal distribution (feature amount of the reconstructed image) of the talbo image.

[0027] [Regarding the X-ray Talbo Imaging Device] FIG. 2 is a schematic diagram showing the overall configuration of the X-ray talbo imaging device 1. The X-ray talbo imaging device 1 includes an X-ray generator 11, a source grating 12, a subject table 13, a first grating 14, a second grating 15, an X-ray detector 16, a support column 17, and a base portion 18.

[0028] The X-ray talbo imaging device 1 of the present embodiment employs a configuration using a talbo-Lau interferometer including a source grating 12. The source grating 12 includes a multi-grating, a multi-slit, and a G0 grating. Note that the X-ray talbo imaging device 1 can also employ a configuration using a talbo interferometer including only the first grating (also referred to as a G1 grating) 14 and the second grating (also referred to as a G2 grating) 15 without the source grating 12, for example.

[0029] The X-ray Talbot imaging device 1 captures a moire image Mo (see FIG. 3) of a subject H at a predetermined position on a subject table 13 by a method based on the principle of the fringe scanning method. The image processing device 2 then analyzes the captured moire image Mo by the Fourier transform method to reconstruct at least three types of images (two-dimensional images).

[0030] Here, the fringe scanning method is a method for obtaining a high-resolution reconstructed image by moving one of multiple gratings in the slit period direction by 1 / M (M is a positive integer; M>2 for absorption images, M>3 for differential phase images and small-angle scattering images) of the grating slit period and then reconstructing the image using the moiré image Mo captured M times.

[0031] The Fourier transform method is a method in which the image processing device 2 performs a Fourier transform on the moire image Mo and reconstructs and generates an image such as a differential phase image.

[0032] First, the principle common to the Talbot interferometer and the Talbot-Lau interferometer will be described with reference to FIG.

[0033] Fig. 3 is an explanatory diagram showing the principle of the Talbot interferometer of the X-ray imaging system 100 according to this embodiment. Note that, although Fig. 3 shows the case of a Talbot interferometer, the same explanation can be basically given for the case of a Talbot-Lau interferometer.

[0034] 2. The z direction in FIG. 3 corresponds to the vertical direction in X-ray Talbot imaging device 1 in FIG. 2, and the x and y directions in FIG. 3 correspond to the horizontal directions (front-back and left-right directions) in X-ray Talbot imaging device 1 in FIG.

[0035] FIG. 4 is an explanatory diagram showing the source grating 12, the first grating 14, and the second grating 15 of the X-ray Talbot imaging device 1 of this embodiment.

[0036] 4, the source grating 12, the first grating 14, and the second grating 15 have a plurality of slits S arranged at a predetermined period d in the x direction perpendicular to the z direction, which is the irradiation direction of the X-rays. Such an arrangement of the slits S is called a one-dimensional grating, and an arrangement of the slits S in both the x and y directions is called a two-dimensional grating.

[0037] In the case of a Talbot-Lau interferometer, a source grating 12 (see FIG. 2) is formed with a plurality of slits S arranged at a predetermined period d in the x direction perpendicular to the z direction, which is the irradiation direction of X-rays.

[0038] In FIG. 4, one-dimensional gratings are used as the source grating 12, the first grating 14, and the second grating 15 of this embodiment as an example, but two-dimensional gratings may also be used.

[0039] 3, when X-rays emitted from the X-ray source 11a (not shown) of the X-ray generating device 11 pass through the first grating 14, the transmitted X-rays form images at regular intervals in the z direction. These images are called self-images (also called grating images, etc.), and the phenomenon in which self-images are formed at regular intervals in the z direction is called the Talbot effect.

[0040] In other words, the Talbot effect is a phenomenon in which, when coherent light passes through a first grating 14 having slits S at a constant period d as shown in Figure 4, the light forms self-images at constant intervals in the direction of light propagation.

[0041] In the case of a Talbot-Lau interferometer, X-rays irradiated from an X-ray source 11a (not shown) of an X-ray generating device 11 are converted into multiple light sources by a source grating 12 (see FIG. 2) and transmitted through a first grating 14.

[0042] In this embodiment, an image generated by the Talbot effect is called a Talbot image. As described above, an absorption image, a differential phase image, and a small-angle scattering image are reconstructed images obtained by reconstructing a moire image Mo, and are also Talbot images generated by the above-mentioned Talbot effect. Note that the term Talbot effect is used to include not only the Talbot effect caused by a Talbot interferometer, but also the combined effect of the Talbot effect and the Law effect (obtained due to a G0 grating) caused by a Talbot-Law interferometer.

[0043] 3, a second grating 15 having slits S similar to the first grating 14 is placed at a position where the self-image of the first grating 14 forms an image. At that time, if the second grating 15 is placed so that the extension direction of the slits S of the second grating 15 (i.e., the x-axis direction in FIG. 3) is approximately parallel to the extension direction of the slits S of the first grating 14, a moiré image Mo is obtained on the second grating 15.

[0044] 3, if the moire image Mo is drawn on the second grating 15, the moire fringes and the slits S will be mixed together, making it difficult to understand visually, so for the sake of convenience, the moire image Mo is drawn away from the second grating 15. However, in reality, the moire image Mo is formed on the second grating 15 and on its downstream side. This moire image Mo is captured by the X-ray detector 16 arranged directly below the second grating 15.

[0045] 2 and 3, if a subject H is present between the X-ray source 11a (not shown in FIG. 3) of the X-ray generating device 11 and the first grating 14, the phase of the X-rays is shifted by the subject H, and the moire fringes of the moire image Mo are disturbed at the boundary of the edge of the subject H. On the other hand, although not shown, if the subject H is not present between the X-ray source 11a of the X-ray generating device 11 and the first grating 14, a moire image Mo consisting only of moire fringes will appear.

[0046] In this way, the Talbot interferometer and the Talbot-Lau interferometer generate a Talbot image by utilizing the principle that the moire fringes of the moire image Mo are distorted at the edge of the subject H due to a phase shift of X-rays.

[0047] Based on this principle, in the X-ray Talbot imaging device 1 of this embodiment, as shown in Fig. 2, the second grating 15 is disposed in the second cover unit 130 at a position where the self-image of the first grating 14 forms an image. As described above, when the second grating 15 and the X-ray detector 16 (see Fig. 2) are separated from each other, the moire image Mo becomes blurred (see Fig. 3), so in this embodiment, the X-ray detector 16 is disposed directly below the second grating 15. In this embodiment, the second grating 15 may be made of a luminescent material such as a scintillator or amorphous selenium, and the second grating 15 and the X-ray detector 16 may be integrated together.

[0048] The second cover unit 130 is provided to prevent people and objects from colliding with or touching the first grid 14, the second grid 15, or the X-ray detector 16, and to protect the X-ray detector 16.

[0049] Here, the X-ray detector 16 is configured such that conversion elements that generate electric signals in response to irradiated X-rays are arranged two-dimensionally (in a matrix), and the electric signals generated by the conversion elements are read as image signals. In this embodiment, the X-ray detector 16 captures the above-mentioned moire image Mo, which is an image of X-rays formed on the second grating 15, as an image signal for each conversion element. The pixel size of the X-ray detector 16 is, for example, 10 to 300 (μm), and more preferably 50 to 200 (μm).

[0050] A flat panel detector (FPD) can be used as the X-ray detector 16. There are two types of FPD: an indirect conversion type that converts detected X-rays into an electric signal via a photoelectric conversion element, and a direct conversion type that directly converts detected X-rays into an electric signal. Either conversion type may be used.

[0051] In the indirect conversion type, photoelectric conversion elements are arranged two-dimensionally together with TFTs (thin film transistors) under a scintillator plate such as CsI or Gd2O2S to form each pixel. When X-rays incident on the X-ray detector 16 are absorbed by the scintillator plate, the scintillator plate emits light. This emitted light causes charges to accumulate in each photoelectric conversion element, and the accumulated charges are read out as an image signal.

[0052] In the direct conversion type, an amorphous selenium film with a thickness of 100 to 1000 (μm) is formed on glass by thermal evaporation of amorphous selenium, and the amorphous selenium film and electrodes are evaporated onto an array of TFTs arranged in a two-dimensional shape. When the amorphous selenium film absorbs X-rays, a voltage is liberated within the material in the form of electron-hole pairs, and the voltage signal between the electrodes is read by the TFT. The X-ray detector 16 may be a CCD (Charge Coupled Device) or an imaging means such as an X-ray camera.

[0053] The X-ray Talbot imaging device 1 is also configured to capture multiple moire images Mo using a fringe scanning method. That is, the X-ray Talbot imaging device 1 captures multiple moire images Mo while shifting the relative positions of the first grating 14 and the second grating 15 from the positions shown in FIG. 2 in the x-axis direction in FIG. 3 (i.e., a direction perpendicular to the extension direction (y-axis direction) of the slit S). Then, the X-ray Talbot imaging device 1 transmits image signals of the captured multiple moire images Mo to the image processing device 2.

[0054] In this way, the X-ray Talbot imaging device 1 moves the first grating 14 in the x-axis direction by a predetermined amount in order to capture multiple moire images Mo by the fringe scanning method. Note that the X-ray Talbot imaging device 1 may move the second grating 15 instead of moving the first grating 14, or may move both the first grating 14 and the second grating 15.

[0055] Alternatively, the X-ray Talbot imaging device 1 may capture only one moire image Mo while keeping the relative positions of the first grating 14 and the second grating 15 fixed, and the image processing device 2 may analyze the captured moire image Mo using a Fourier transform method to reconstruct an absorption image, a differential phase image, and a small-angle scattering image. When the X-ray Talbot imaging device 1 captures one moire image Mo, it transmits an image signal of the single moire image Mo to the image processing device 2.

[0056] Next, a description will be given of the configuration of other parts in the X-ray Talbot imaging device 1. The X-ray Talbot imaging device 1 of this embodiment is a so-called vertical type, in which the X-ray generator 11, the source grating 12, the subject table 13, the first grating 14, the second grating 15, and the X-ray detector 16 are arranged in this order in the z direction, which is the direction of gravity. That is, in this embodiment, the z direction is the irradiation direction of X-rays from the X-ray generator 11.

[0057] The X-ray generator 11 (see FIG. 2) includes, as the X-ray source 11a, for example, a Coolidge X-ray source or a rotating anode X-ray source that are widely used in medical settings. Other X-ray sources can also be used. The X-ray generator 11 irradiates X-rays in a cone beam shape from a focal point. That is, as shown in FIG. 2, the X-rays are irradiated so that they spread out as they move away from the X-ray generator 11, with the X-ray irradiation axis Ca coinciding with the z direction as the central axis. The range irradiated by this X-ray generator 11 is called the X-ray irradiation range.

[0058] In this embodiment, a radiation source grating 12 is provided below the X-ray generating device 11. In this embodiment, the radiation source grating 12 is attached to a fixed member 12a of a base unit 18 so that vibrations of the X-ray generating device 11 caused by rotation of the anode of the X-ray source 11a are not transmitted to the radiation source grating 12.

[0059] In this embodiment, in order to prevent vibrations of the X-ray generator 11 from propagating to other parts of the X-ray Talbot imaging device 1 such as the support 17, a buffer member 17a is provided between the X-ray generator 11 and the support 17. This prevents vibrations of the X-ray generator 11 from propagating to the support 17.

[0060] In this embodiment, in addition to the radiation source grating 12, the fixed member 12a is equipped with a filtering filter (also called an additional filter) 112 for changing the radiation quality of the X-rays transmitted through the radiation source grating 12, an irradiation field aperture 113 for narrowing the irradiation field of the irradiated X-rays, and an irradiation field lamp 114 for irradiating the subject with visible light instead of X-rays for alignment before irradiating the X-rays.

[0061] The source grating 12, the filter 112, and the irradiation field aperture 113 do not necessarily have to be provided in this order. In this embodiment, a first cover unit 120 is disposed around the source grating 12 to protect them.

[0062] The subject table 13 is a table on which the subject H is placed. The subject table 13 functions as a rotation stage that rotates the subject H around the z-axis. When capturing multiple moiré images Mo using the above-mentioned stripe scanning method, the X-ray Talbot imaging device 1 captures multiple moiré images Mo while rotating the subject table 13 at different angles.

[0063] <About the subject> 2 and 3, the subject H in this embodiment is not particularly limited, but includes, for example, a single or composite material such as resin, metal, ceramics, etc. A composite material refers to a material in which two or more different materials are integrally combined, and at least two materials exist as phases.

[0064] Known examples of such composite materials include CFRP (Carbon-Fiber-Reinforced Plastics), which use carbon fiber or glass fiber as reinforcing fibers, CFRTP (Carbon Fiber Reinforced Thermo Plastics), FRP (Fiber-Reinforced Plastics), represented by GFRP (Glass-Fiber-Reinforced Plastics), and CMC (Ceramic Matrix Composites), which use ceramic fibers as a reinforcing material.

[0065] Composite materials are used as components in a wide variety of products, including aerospace and aircraft related products, automobiles, ships, fishing rods, as well as electrical, electronic and home appliance parts, parabolic antennas, bathtubs, flooring materials, roofing materials, and more.

[0066] In a broader sense, the term also includes composite materials made of multiple types of wood, such as plywood, as well as composite materials that do not contain fibers, such as MMC (Metal Matrix Composites) concrete and reinforced concrete.

[0067] Resins used in composite materials include, but are not limited to, general-purpose plastics, engineering plastics, and super engineering plastics. For example, in order to add specific properties such as strength, fillers having micro- or nano-sized structures are added to resins to form resin composite materials, and compositions processed by plastic molding are also included. Fillers include organic materials, inorganic materials, magnetic materials, and metal materials.

[0068] For example, when strength and rigidity are required for a plastic molded product, PPS (polyphenylene sulfide), POM (polyacetal), PA (polyamide), etc. are used as the resin, and composite materials with GF (fiberglass), aramid fiber, mica, etc. are used as the filler. Also, when the plastic molded product is thin, liquid crystal polymers are used, and composite materials with GF added are sometimes used. Also, when the plastic molded product is plastic-magnet, nylon is used as the resin, and composite materials with strontium ferrite, samarium cobalt, etc. are used as the filler.

[0069] In this manner, the inspection target object, which is the subject H, may contain resin as a main component.

[0070] <About the controller> In this embodiment, the controller 19 shown in FIG. 1 is configured as a general-purpose computer having a central processing unit (CPU) (not shown), a read only memory (ROM) (not shown), a random access memory (RAM) (not shown), an input / output interface (not shown), and the like connected to a bus. The controller 19 may be configured as a dedicated control device instead of a general-purpose computer as in this embodiment. The controller 19 is provided with appropriate means and devices such as an input means (not shown) including an operation unit, an output means (not shown), a storage means (not shown), and a communication means (not shown). The output means includes a display unit (not shown) that displays information required for performing various operations of the X-ray Talbot imaging device 1 and / or a generated reconstructed image.

[0071] The controller 19 performs overall control over the X-ray Talbot imaging device 1. That is, the controller 19 is connected to the X-ray generating device 11, and sets the tube voltage, tube current, irradiation time, etc. of the X-ray source 11a. The controller 19 can also be configured to relay transmission and reception of signals and data between the X-ray detector 16 and an external image processing device 2, etc.

[0072] That is, the controller 19 functions as a control unit that causes a series of photographing operations to be performed in order to obtain one or more moiré images Mo necessary for generating a reconstructed image of the subject H.

[0073] <About image processing device> The image processing device 2 shown in FIG. 1 receives image signals of one or more moire images Mo transmitted from the X-ray Talbot imaging device 1, and reconstructs (i.e., performs image reconstruction) an absorption image, a differential phase image, and a small-angle scattering image based on the received moire images Mo.

[0074] As image processing, the image processing device 2 reconstructs at least three types of images (two-dimensional images) by analyzing the moire image Mo using a Fourier transform method. That is, the image processing device 2 generates three types of reconstructed images: an absorption image (which is the same as a normal X-ray absorption image) that visualizes the average component of the moire fringes in the moire image Mo, a differential phase image that visualizes the phase information of the moire fringes, and a small-angle scattering image that visualizes the visibility of the moire fringes. Note that these three types of reconstructed images can also be further recombined to generate many types of reconstructed images.

[0075] The image processing device 2 reconstructs one or more moire images Mo transmitted from the X-ray Talbot imaging device 1, and then transmits the reconstructed image to the condition change tracking device 20.

[0076] <About the state change tracking device> 1 is configured, for example, by a general-purpose computer (control PC). Note that the state change tracking device 20 is not limited to this, and some of the functions of the state change tracking device 20 may be provided on a network (not shown) so that each process can be executed by sending and receiving data via communication. In this embodiment, the functions of the state change tracking device 20 described below may be provided in the image processing device 2 or the controller 19.

[0077] As shown in FIG. 1, a state change tracking device 20 according to this embodiment includes a CPU 21, a RAM 22, a storage unit 23, an input unit 24, an external data input unit 25, a display unit 26, and a communication unit 27.

[0078] The CPU 21 reads out various programs such as system programs and processing programs stored in the storage unit 23, expands them in the RAM 22, and executes the expanded programs to embody each functional unit. Specifically, the CPU 21 executes the programs to embody an image acquisition unit 211, a lifespan estimation unit 212, a state change tracking unit 213, a correction unit 214, and an alignment unit 215.

[0079] The image acquisition unit 211 acquires a reconstructed image of the inspection object photographed by the X-ray Talbot imaging device 1. The reconstructed image includes an absorption image, a differential phase image, and a small-angle scattering image, and is a Talbot image generated by the Talbot effect. Hereinafter, the reconstructed image refers to a Talbot image. The condition change tracking device 20 can read the change in the internal structure of the inspection object placed in a specific environment by the Talbot image, and estimates the lifespan by analyzing the information.

[0080] The life estimation unit 212 acquires a reconstructed image of the inspection object photographed by the X-ray Talbot imaging device 1 using the image acquisition unit 211, and estimates the life of the inspection object based on this reconstructed image. In this case, the life estimation unit 212 extracts a feature amount from the reconstructed image of the inspection object newly photographed by the X-ray Talbot imaging device 1, and extrapolates the feature amount to the calibration curve generated by the state change tracking unit 213 to estimate the life of the new inspection object.

[0081] The state change tracking unit 213 non-destructively tracks state changes of the inspection object, which is placed in a specific environment, using a plurality of reconstructed images captured over time by the X-ray Talbot imaging device 1. Furthermore, the state change tracking unit 213 uses the plurality of reconstructed images captured over time to extract feature amounts of the reconstructed images that continuously change until the inspection object reaches the end of its life, and derives a threshold value for the feature amount corresponding to the life of the inspection object.

[0082] Here, the state change of the inspection object corresponds to, for example, the occurrence or growth of defects such as cracks and voids, deformations such as sink marks, distortions, and warping, changes in resin flow, fiber orientation, etc. More specifically, for example, for cracks, the state change tracking unit 213 tracks changes in length, width, depth, number, etc. as the state change of the inspection object. Also, for voids, the state change tracking unit 213 tracks changes in size, number, etc. as the state change of the inspection object. Note that state changes such as cracks and voids are merely examples and are not limited to these.

[0083] Moreover, the state change tracking unit 213 creates a calibration curve by plotting the feature amount against the elapsed time that the inspection object is placed in the specific environment. Note that the feature amount of the reconstructed image corresponds to, for example, the signal intensity and the signal intensity distribution of the Talbot image, which will be described later.

[0084] Here, examples of the specific environment include an environment exposed to a specific chemical substance, an environment subjected to stress, an environment subjected to heating or cooling, and the like.

[0085] The stress environment includes, for example, an environment where the test object is subjected to external stress such as tensile, compressive, or shear stress, an environment where the test object is subjected to internal stress such as residual stress, and an environment where the stress is relieved by a process such as annealing.

[0086] The correction unit 214 acquires the shape and / or subject of the inspection object in the multiple captured reconstructed images, and corrects the inclination, position, and size of the reconstructed images based on the acquired shape and / or subject.

[0087] The alignment unit 215 aligns a plurality of reconstructed images of the object being inspected taken over time.

[0088] The RAM 22 functions as a work area for temporarily storing various programs, input or output data, parameters, etc., which are read from the storage unit 23 and can be executed by the CPU 21 during various processes executed and controlled by the CPU 21.

[0089] The storage unit 23 includes databases 23a and 23b. The storage unit 23 is configured with, for example, a hard disk drive (HDD) or a semiconductor non-volatile memory. The storage unit 23 stores various programs and various data.

[0090] The database 23a is a database that stores actual measurement values ​​(referred to as feature amount data) in which the feature amount at each position extracted from the reconstructed image by the state change tracking unit 213 is associated with the elapsed time or the number of elapsed days, and a calibration curve that approximates the actual measurement value to a straight line. As a result, when a crack occurs in the inspection object, the state change tracking unit 213 can refer to this database 23a, extract the feature amount correlated with the elapsed time, and derive a threshold value corresponding to the inspection object's lifespan. The threshold value corresponding to the inspection object's lifespan is derived by extrapolating the calibration curve related to the extracted feature amount up to the elapsed time at which the crack occurred. The derivation of the threshold value of the feature amount will be described later with reference to FIG. 7. The database 23a also stores the position of the reconstructed image related to the feature amount correlated with the elapsed time, and the slope of the calibration curve related to this feature amount.

[0091] The database 23b is a database that stores data (called calibration curve data) that generates a calibration curve for a new inspection object based on the feature amount at the corresponding position of the new inspection object. This allows the lifespan estimation unit 212 to estimate the elapsed time or number of days until the end of the lifespan of the new inspection object by extrapolating the calibration curve of the feature amount at a predetermined position of the new inspection object until it reaches a threshold value. The estimation of the lifespan will be described later with reference to FIG. 9.

[0092] The input unit 24 is configured with a keyboard equipped with cursor keys, numeric input keys, various function keys, etc., and a pointing device such as a mouse. The input unit 24 outputs a press signal of a key pressed on the keyboard or an operation signal by a mouse as an input signal to the CPU 21. The CPU 21 executes various processes based on the operation signal from the input unit 24.

[0093] The external data input unit 25 is for inputting data acquired from an external device (including the controller 19) to the state change tracking device 20. The external data input unit 25 can be, for example, a Universal Serial Bus (registered trademark) port that enables wired or wireless data transmission and reception with an external device, Bluetooth (registered trademark), a drive that reads data from a recording medium equivalent to an external device, or the like.

[0094] The display unit 26 is configured to include a monitor such as a CRT (Cathode Ray Tube) or LCD (Liquid Crystal Display). The display unit 26 displays various screens according to the instructions of a display signal input from the CPU 21. For example, the display unit 26 displays a reconstructed image received from the image processing device 2. In addition, when a touch panel is adopted as the display unit 26, the display unit 26 also functions as the input unit 24.

[0095] The communication unit 27 includes a communication interface and communicates with an external device on the network, such as the image processing device 2. The communication unit 27 may be shared with the external data input unit 25 described above.

[0096] [Generating a database of feature data] Next, the process of generating the database 23a of feature amount data in the state change tracking device 20 configured as above will be described using the flowchart of FIG. 5 and with reference to FIG.

[0097] 5 is a flowchart showing a process for generating the database 23a of feature amount data in the state change tracking device 20. In this embodiment, the inspection target (subject H) is placed in a specific environment such as an environment where it is exposed to a specific chemical substance, an environment where it is subjected to stress, or an environment where it is heated or cooled.

[0098] First, the image acquisition unit 211 of the CPU 21 of the condition change tracking device 20 acquires a reconstructed image of the inspection object (subject H) periodically photographed by the X-ray Talbot imaging device 1 from the image processing device 2 via the communication unit 27, and further acquires the elapsed time (step S001). The elapsed time refers to the time that has elapsed since the inspection object was placed in a specific environment until the X-ray Talbot imaging device 1 photographed the inspection object. The image acquisition unit 211 acquires a plurality of reconstructed images of the inspection object periodically photographed one by one.

[0099] Next, the alignment unit 215 of the CPU 21 aligns the reconstructed image of the inspection object photographed periodically (step S003). Note that the image acquisition unit 211 does not need to perform alignment for the first reconstructed image. The image acquisition unit 211 aligns the second and subsequent reconstructed images, for example, with the first reconstructed image as a reference.

[0100] Correction unit 214 of CPU 21 acquires the shape and / or subject of the inspection object in the captured reconstructed image, and corrects the inclination, position, and size of the second and subsequent reconstructed images based on the shape and / or subject acquired in the first image (step S005). Note that correction unit 214 does not need to perform correction on the first reconstructed image. Correction unit 214 corrects the shape and / or subject of the second and subsequent reconstructed images, for example, based on the shape and / or subject of the first reconstructed image. This allows each position of the inspection object to be aligned with each position of the reconstructed images.

[0101] Next, the state change tracking unit 213 of the CPU 21 nondestructively tracks state changes of the inspection object based on a plurality of reconstructed images periodically taken of the inspection object under a specific environment and the elapsed time. The state change tracking unit 213 extracts feature amounts at each position of the reconstructed images using the plurality of reconstructed images taken over time and the elapsed time (step S007).

[0102] First, state change tracking section 213 extracts feature amounts at each position of the first reconstructed image. State change tracking section 213 stores the feature amounts at each position of the first reconstructed image in database 23a. State change tracking section 213 sequentially stores the feature amounts at each position of the second and subsequent reconstructed images in database 23a.

[0103] Here, the feature amount at each position of the reconstructed image includes, for example, the signal intensity and signal intensity distribution at each position of the Talbot image. The signal intensity at each position of the Talbot image means the magnitude of the signal value at each pixel of the reconstructed image (small-angle scattering image or differential phase image). Furthermore, the signal intensity distribution of the Talbot image means the degree of variation in signal intensity in a certain region, and can be represented by a statistical quantity such as the standard deviation. Note that the signal intensity and signal intensity distribution at each position of the Talbot image are examples of feature amounts, and the feature amounts are not limited to these.

[0104] Furthermore, the state change tracking unit 213 plots the signal intensity or signal distribution of the Talbot image, which indicates the feature amount at each position of the extracted reconstructed image, on the vertical axis of a graph, and the elapsed time from the time of capturing the reconstructed image on the horizontal axis, and creates a calibration curve using the least squares method or the like (step S009). That is, the state change tracking unit 213 plots the signal intensity or signal distribution of the Talbot image, which indicates the feature amount at each position of the reconstructed image, against the elapsed time since the inspection object was placed in the specific environment, and creates a graph that approximates this to a straight line using the least squares method or the like.

[0105] The state change tracking unit 213 judges whether the inspection object has reached its limit due to the occurrence of a crack in the inspection object before the next image of the inspection object is taken. If a crack has occurred in the inspection object (Yes in step S011), the state change tracking unit 213 proceeds to step S013. On the other hand, if a crack has not occurred in the inspection object (No in step S011), the state change tracking unit 213 returns to step S001. Then, the image acquisition unit 211 of the CPU 21 acquires the next reconstructed image and the elapsed time, and repeats the processes from step S003 to step S011 for the second and subsequent reconstructed images.

[0106] That is, the state change tracking unit 213 extracts the signal intensity or signal distribution of the Talbot image from the next acquired reconstructed image, plots the signal intensity or signal distribution of the Talbot image on the vertical axis of a graph and the elapsed time on the horizontal axis of the graph, and creates a calibration curve up to just before a crack occurs in the object to be inspected by approximating the signal intensity or signal distribution to a straight line using the least squares method or the like.

[0107] In step S013, the state change tracking unit 213 extracts a feature quantity that correlates with the elapsed time from the time elapsed since the crack occurred and the calibration curve of each feature quantity. When a crack occurs in a resin part, a change in signal intensity or a change in signal distribution that correlates with the elapsed time occurs in the area of ​​the Talbot image that corresponds to the crack occurrence position. Therefore, the state change tracking unit 213 identifies the position where the change in the feature quantity occurs and extracts the feature quantity related to this position.

[0108] 6 is an explanatory diagram showing a concept of the state change tracking unit 213 of the CPU 21 of the state change tracking device 20 extracting a feature amount correlated with elapsed time. In step S013, the state change tracking unit 213 extracts the signal intensity (an example of a feature amount) of the Talbot image, for example, in 24-hour (equivalent to one day) increments from time t0, sequentially from the time the device is placed in a specific environment until elapsed times t1, t2, . . . , t6. Note that in FIG. 6, it is assumed that a crack occurs at elapsed time t7 (not shown).

[0109] The appearance shown in Fig. 6 shows an image (normal X-ray absorption image) of the appearance of a certain resin part, and the Talbot image shows the corresponding differential phase image or small angle scattering image of the same resin part. As shown in Fig. 6, for example, the image (normal X-ray absorption image) of the appearance of the resin part does not show any change even after the elapse of time t1, t2, ..., t6.

[0110] In contrast, the Talbot image at point P1 shows no change even as time elapses from t1 to t6, but at point P2, a change in signal intensity that correlates with the elapsed time occurs as time elapses from t2 to t6.

[0111] That is, at point P2 in the Talbot image, a change in signal intensity occurs at elapsed time t2, and further at elapsed time t6, a change in signal intensity immediately before the occurrence of a crack is shown.

[0112] In this way, when a crack occurs in a resin part, a change in signal intensity or a change in signal distribution that correlates with elapsed time occurs in an area of ​​the Talbot image that corresponds to the crack occurrence position. Therefore, the state change tracking unit 213 identifies the position where the change occurs in the feature amount of the Talbot image (for example, point P2 of the Talbot image) and extracts the feature amount related to this position.

[0113] Returning to FIG. 5, in step S015, the state change tracking unit 213 calculates a calibration curve of the features extracted in step S13 up to the time elapsed until the crack occurs, extrapolates this calibration curve, derives a feature corresponding to the life of the object to be inspected, and determines it as a threshold value, and ends the process of generating the database 23a.

[0114] FIG. 7 is an explanatory diagram showing a graph of a calibration curve for state change tracking section 213 of CPU 21 of state change tracking device 20 to estimate a threshold value of a feature amount corresponding to the life of an object to be inspected.

[0115] In the graph of the calibration curve shown in FIG. 7, the horizontal axis of the graph indicates the elapsed time, and the vertical axis of the graph indicates the feature amount at a predetermined position of the Talbot image (for example, the signal intensity at a predetermined position of the Talbot image (point P2 in FIG. 6)). In FIG. 7, the state change tracking unit 213 of the CPU 21 extracts and plots the signal intensity (one example of the feature amount) of the Talbot image with a circle for each 24-hour (equivalent to one day) interval from the time t0, from the time the Talbot image is placed in a specific environment until elapsed time t1, t2, . . . , t6, and further enters the elapsed time t7 of the life when a crack occurs. The state change tracking unit 213 creates this graph for the feature amount at each position of the Talbot image to derive a calibration curve, and extracts the feature amount that is highly correlated with the elapsed time based on the slope of this calibration curve.

[0116] Here, at the elapsed time t7 after being placed in the specific environment, a crack occurs at point P2 (FIG. 6) in the Talbot image. The signal intensity in the vicinity of the crack occurrence position in the Talbot image often changes in correlation with the elapsed time. Therefore, the vicinity of the crack occurrence position in the Talbot image becomes the predetermined position (for example, point P2 in FIG. 6).

[0117] The state change tracking unit 213 extrapolates the calibration curve of the feature amount at this predetermined position, estimates the signal intensity (feature amount of the reconstructed image) at that predetermined position of the Talbot image at the time when a crack occurs at elapsed time t7, and sets it as the threshold value Th.

[0118] Thereby, when the signal intensity (feature amount of the reconstructed image) of the Talbot image of the subsequent inspection object at that position reaches this threshold value Th, it can be estimated that the inspection object has reached the end of its life.

[0119] In this way, the state change tracking unit 213 uses a plurality of reconstructed images captured periodically to extract feature amounts at each position of the reconstructed images that continuously change until the inspection object reaches the end of its life.

[0120] This enables the state change tracking unit 213 to generate a database 23a for deriving threshold values ​​of feature quantities corresponding to the life span of the inspection object.

[0121] It is assumed that the characteristics of the reconstructed image differ for each inspection object, and also differ depending on the difference in the specific environment, specifically, the environment where it is exposed to a specific chemical substance, the environment where it is subjected to stress, the environment where it is heated or cooled, etc. Therefore, it is desirable that the state change tracking unit 213 creates a calibration curve for each inspection object and also creates a calibration curve for each specific environment.

[0122] [Lifespan estimation process for inspection objects] Next, the process of estimating the lifetime of an object to be inspected (subject H) by the lifetime estimation unit 212 configured as above will be described using the flowchart of FIG. 8 with reference to FIG.

[0123] 8 is a flowchart showing a process of estimating the lifetime of an inspection object (subject H) by the lifetime estimation unit 212. In this embodiment, the inspection object is assumed to be placed in a specific environment, such as an environment exposed to a specific chemical substance, an environment subjected to stress, or an environment where the object is heated or cooled.

[0124] First, the image acquisition unit 211 of the CPU 21 of the condition change tracking device 20 acquires a reconstructed image of a new inspection object captured by the X-ray Talbot imaging device 1 from the image processing device 2 via the communication unit 27 (step S101).

[0125] Next, the alignment unit 215 of the CPU 21 aligns the multiple reconstructed images of the object to be inspected captured over time using the first reconstructed image during the process of generating the feature amount data shown in FIG. 5 as a reference (step S103).

[0126] In the process of estimating the lifetime of the inspection object, the number of reconstructed images taken is at least one to estimate the lifetime, and preferably multiple images. Also, the multiple reconstructed images taken over time do not need to be taken periodically, and may be taken at any time.

[0127] The correction unit 214 of the CPU 21 acquires the shape and / or subject of the inspection object in the multiple captured reconstructed images, and corrects the inclination, position, and size of the reconstructed image for the life estimation process based on the shape and / or subject acquired in the first reconstructed image during the feature data generation process (step S105).

[0128] The life estimation unit 212 of the CPU 21 extracts a feature amount of a predetermined position from the reconstructed image of the new inspection object. This predetermined position is extracted by the generation process of the feature amount data shown in Fig. 5, and is a position where a crack is likely to occur in this inspection object (for example, point P2 of the Talbot image in Fig. 6).

[0129] The lifetime estimation unit 212 applies the slope of the calibration curve stored in the database 23a to the feature amount at this specified position, extrapolates the calibration curve, and estimates the lifetime of the new test object from the time it takes for the calibration curve to reach a threshold value (step S107).

[0130] This allows the life estimation unit 212 to predict the period from when the product is placed in a specific environment until it reaches a limit (e.g., crack occurrence) at an early stage. In addition, since the life is estimated based on the change in the feature amount of the Talbot image, the index of life estimation can be quantified.

[0131] For example, when signal intensity is extracted from one Talbot image (reconstructed image) of a new object to be inspected, the lifetime estimation unit 212 refers to the database 23a and creates a new calibration curve (calibration curve data) of the feature amount at a specified position of the new object to be inspected.

[0132] In this way, the life estimation unit 212 creates a new calibration curve relating to the feature amount at a predetermined position from the signal intensity at the predetermined position of the Talbot image of the new inspection target, and extrapolates this calibration curve to estimate the elapsed time or number of days until the feature amount at the predetermined position reaches the threshold value as the life. Then, the life estimation unit 212 stores the created new calibration curve data in the database 23b.

[0133] In step S107, the lifespan estimation unit 212 estimates the elapsed time or number of days that is the lifespan of the new inspection object, and then ends the lifespan estimation process.

[0134] FIG. 9 is an explanatory diagram showing a graph of a calibration curve in which the lifetime estimation unit 212 of the CPU 21 of the state change tracking device 20 estimates the lifetime of a new test object.

[0135] In the calibration curve graph shown in Fig. 9, the horizontal axis indicates elapsed time, and the vertical axis indicates the signal intensity of the Talbot image (feature amount of the Talbot image). In Fig. 9, for example, when the signal intensity of the Talbot image of a new inspection object is one, the lifetime estimation unit 212 refers to the database 23a and creates a new calibration curve from the signal intensity F1 of the Talbot image to the threshold value Th of the feature amount of the new inspection object.

[0136] In this way, the lifetime estimation unit 212 calculates, from the signal intensity F1 of the Talbot image of the new inspection object, the elapsed time t from when the new inspection object is placed in the specific environment until the feature amount reaches the threshold value Th. x , i.e., the life of a new test object can be derived. This makes it possible to shorten the test time for life estimation.

[0137] Furthermore, for example, when a Talbot image of this new object to be inspected is captured again after a predetermined time (a predetermined number of days), the lifetime estimation unit 212 creates a new calibration curve up to the threshold value Th of the feature of the new object to be inspected based on the changes in the signal intensities F1, F2 of the Talbot images and the database 23a.

[0138] In this way, the lifetime estimation unit 212 calculates, from the signal intensity F2 of the Talbot image of the new inspection object, the elapsed time t from when the new inspection object is placed in the specific environment until the feature amount threshold Th is reached. x , that is, the life span of a new test object can be derived with higher accuracy.

[0139] [effect] As described above, according to this embodiment, the CPU 21 of the state change tracking device 20 of the X-ray imaging system 100 of this embodiment is configured to include a lifetime estimation unit 212 that estimates the lifetime of the object to be inspected based on a reconstructed image of the object to be inspected photographed by the X-ray Talbot imaging device.

[0140] The lifetime estimation unit 212 can extract the signal intensity or signal distribution (feature of the reconstructed image) at a specific position of the Talbot image from the reconstructed image of the object to be inspected, and create a calibration curve corresponding to the signal intensity or signal distribution at this specific position, thereby making it possible to estimate the lifetime of the object to be inspected in a short period of time.

[0141] In particular, the life estimation unit 212 of the condition change tracking device 20 according to this embodiment can create a calibration curve for a new test object if there is at least one reconstructed image of the test object, and can therefore predict the period until the limit (e.g., crack occurrence) is reached at an early stage after being placed in a specific environment, thereby shortening the test time for life estimation.

[0142] Furthermore, when there are two or more reconstructed images taken at different times, a more accurate calibration curve can be created based on the change in signal intensity or signal distribution (feature of the reconstructed image) of the Talbot image and the database 23a, thereby enabling the lifetime to be estimated with higher accuracy.

[0143] Furthermore, since the lifetime is estimated based on quantified indicators such as the signal intensity or signal distribution of the reconstructed image, the lifetime of the object being inspected (subject H) can be estimated objectively and with higher accuracy than human sensory evaluation (qualitative evaluation).

[0144] Furthermore, the life estimation unit 212 of the condition change tracking device 20 estimates the life of the inspection object from the feature amount of each inspection object (for example, the signal intensity or signal distribution of the Talbot image). Since the Talbot image captures the change in the internal structure of the inspection object, it is possible to clearly show the progress of the inspection object until it reaches its limit.

[0145] The life estimation unit 212 of the CPU 21 of the state change tracking device 20 according to this embodiment can be applied to predict the lifespan of a wide range of objects to be inspected, including not only cracks but also voids, welds, microcracks, fiber orientation, etc.

[0146] In addition, the condition change tracking device 20 of this embodiment is configured in the CPU 21 with an image acquisition unit 211, a life estimation unit 212, a condition change tracking unit 213, a correction unit 214, and an alignment unit 215, and executes each process, but the execution of each process is not limited to this.

[0147] For example, the image processing device 2 may be configured to include the functions of the image acquisition unit 211, the life estimation unit 212, the correction unit 214, and the position alignment unit 215, and the state change tracking device 20 may be configured to include only the function of the state change tracking unit 213. In this case, the state change tracking unit 213 may, for example, manually extract feature amounts (signal intensity or signal distribution of the Talbot image) from the reconstructed image and manually plot the feature amounts. [Explanation of symbols]

[0148] 1 X-ray Talbot Imaging Device 2. Image Processing Device 19 Controller 20 Status change tracking device 21 CPU 22 RAM 23 Memory section 23a,23b Database 24 Input section 25 External data input section 26 Display section 27 Communications Department 100 X-ray system 211 Image acquisition unit 212 Life Estimation Section 213 State Change Tracking Unit 214 Correction section 215 Alignment section

Claims

1. A state change tracking unit that non-destructively tracks state changes of an object to be inspected by a plurality of reconstructed images of the object to be inspected placed under a specific environment taken over time by an X-ray Talbot imaging device, The state change tracking unit is extracting a feature amount of the reconstructed image that continuously changes until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and deriving a threshold value of the feature amount corresponding to the life of the inspection object; Status change tracker.

2. The state change tracking unit is creating a calibration curve by plotting the feature amount against the elapsed time that the test object is placed in the specific environment; 2. The state change tracking device according to claim 1.

3. a lifetime estimation unit that estimates a lifetime of the inspection object based on a reconstructed image of the inspection object captured by the X-ray Talbot imaging device, The life estimation unit is extracting features from the reconstructed image of the new inspection object, and extrapolating the features to the calibration curve generated by the state change tracking unit to estimate a lifetime of the new inspection object; 3. The state change tracking device according to claim 2.

4. The method further includes a registration unit that registers the plurality of reconstructed images of the object to be inspected captured over time. The state change tracking device according to any one of claims 1 to 3.

5. A correction unit is further provided which acquires a shape and / or a subject of the inspection object in the multiple captured reconstructed images, and corrects a tilt, a position, and a size of the reconstructed images based on the acquired shape and / or the acquired subject. The state change tracking device according to any one of claims 1 to 4.

6. The specific environment is an environment exposed to a specific chemical substance. The state change tracking device according to any one of claims 1 to 5.

7. The specific environment is a stressed environment. The state change tracking device according to any one of claims 1 to 5.

8. The specific environment is a heated or cooled environment. The state change tracking device according to any one of claims 1 to 5.

9. The object to be inspected contains resin as a main component. A state change tracking device according to any one of claims 1 to 8.

10. The reconstructed image includes an absorption image, a differential phase image, and a small angle scattering image, and is a Talbot image generated by the Talbot effect. A state change tracking device according to any one of claims 1 to 9.

11. A state change tracking unit that non-destructively tracks state changes of an object to be inspected by a plurality of reconstructed images of the object to be inspected placed under a specific environment taken over time by an X-ray Talbot imaging device, The state change tracking unit is extracting a feature amount of the reconstructed image that continuously changes until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and deriving a threshold value of the feature amount corresponding to the life of the inspection object; X-ray imaging system.

12. generating a plurality of reconstructed images of an object imaged over time by an X-ray Talbot imaging device; a state change tracking unit non-destructively tracking a state change of the inspection object based on the plurality of reconstructed images; the state change tracking unit extracts feature amounts of the reconstructed images that continuously change until the end of the life of the inspection object using the plurality of reconstructed images captured over time, and derives a threshold value of the feature amount corresponding to the life of the inspection object. A method for tracking changes in the condition of an inspected object.

13. generating a plurality of reconstructed images of an object imaged by an X-ray Talbot imaging device; a state change tracking unit non-destructively tracking a state change of the inspection object based on the plurality of reconstructed images; the state change tracking unit extracts, using the plurality of reconstructed images captured over time, feature amounts of the reconstructed images that continuously change until the end of the inspection object's life, and derives a threshold value of the feature amount corresponding to the life of the inspection object; a step of the state change tracking unit plotting the feature amount against the elapsed time during which the inspection object is placed in a specific environment to create a calibration curve; A lifetime estimation unit estimates a lifetime of the inspection object based on the plurality of reconstructed images; the lifetime estimation unit extracting a feature amount from the reconstructed image of the new inspection object, and extrapolating the feature amount to the calibration curve generated by the state change tracking unit to estimate a lifetime of the new inspection object, A method for estimating the lifespan of an inspected object.

Images