Test condition determination device

Abstract

To provide a test condition determination device capable of avoiding pattern setting errors when setting signal patterns for data items.SOLUTION: In a test device 10 which is a test condition determining device, a CPU 11 acquires tag information from a chiller 30, and determines a signal pattern for a loop test from the acquired tag information and a database that associates the tag information with test signal patterns. Therefore, the setting operation of the signal pattern for the loop test by a service person is simplified, reducing the number of man-hours and setting errors.SELECTED DRAWING: Figure 6

Description

[Technical field]

[0001] The present invention relates to a test condition determination device that determines test conditions for facility equipment. [Background technology]

[0002] One of the tests used to verify the integrity of communications between equipment such as air conditioners and equipment that monitors them, such as building management systems, is the loop test.

[0003] Conventionally, when performing loop testing, test personnel have had to output test signals on the equipment side using different tools for each model and in a way that is specific to each piece of equipment.

[0004] In order to simplify the work related to the loop test, for example, the device disclosed in Patent Document 1 (JP Patent Publication 2017-191386 A) is equipped with a setting operation unit and an execution operation unit. The setting operation unit makes it possible to set a test pattern that changes the output signal output by the device over time. The execution operation unit causes the device to output an output signal based on the set test pattern.

[0005] This reduces the labor required from test operators to "set up each piece of equipment in a way that is specific to that equipment" and to "set signal patterns for the data items that each piece of equipment has." Summary of the Invention [Problem to be solved by the invention]

[0006] However, the "effort of setting signal patterns (or selecting from existing signal patterns) for each data item" remains, and since the setting is done by hand, there is a risk of mistakes in setting the pattern.

[0007] Therefore, there is an issue to be addressed in providing a test condition determining device that can avoid setting errors in patterns when setting signal patterns for data items. [Means for solving the problem]

[0008] A test condition determination device according to a first aspect is a test condition determination device that determines test conditions for facility equipment, and the facility equipment is assigned tag information for each data item. The test condition determination device includes a control unit and a storage unit. The storage unit stores a database that associates the tag information with the test conditions. The control unit acquires the tag information from the facility equipment, and determines the test conditions from the acquired tag information and the database.

[0009] This test condition determination device simplifies the test condition setting work performed by the operator, thereby reducing the number of work steps and the occurrence of setting errors.

[0010] A test condition determination device according to a second aspect is the test condition determination device according to the first aspect, wherein the test conditions include the passage of time and a signal pattern output by an equipment.

[0011] A test condition determination device of a third aspect is a test condition determination device of the first or second aspect, in which, when there is no match for the tag information in the database, the control unit determines the test conditions associated with those that have a high similarity to the tag information.

[0012] In this test condition determination device, since it is assumed that the tag information attached to the data items differs depending on the equipment, in such a case, the test conditions associated with the tag information having a high similarity are set, which results in the versatility of the test condition determination device being increased.

[0013] A test condition determination device of a fourth aspect is a test condition determination device of any one of the first aspect to the third aspect, in which the control unit updates the database so that the determined test conditions or test conditions arbitrarily set by the user are associated with tag information assigned to an item of data.

[0014] In this test condition determination device, the database is updated so that the set test conditions are associated with tag information attached to data items, thereby further increasing the versatility of the test condition determination device.

[0015] A test condition determination device according to a fifth aspect is the test condition determination device according to any one of the first aspect to the fourth aspect, in which the control unit causes the facility device to carry out a test based on the test conditions.

[0016] In this test condition determination device, the series of operations from obtaining tag information → determining test conditions → setting → execution is carried out by the test condition determination device, so that the number of work steps required by the operator is reduced.

[0017] A sixth aspect of the test condition determination device is the test condition determination device according to any one of the first to fifth aspects, in which a plurality of selectable test conditions are associated with the tag information in the database, and the control unit accepts one test condition selected from the plurality of test conditions.

[0018] A test condition determination device of a seventh aspect is a test condition determination device of any one of the first aspect to the sixth aspect, wherein the tag information is information composed of one or more tags that are assigned to each item of data measured and stored during operation of the equipment and that express the meaning of the data.

[0019] In this test condition determination device, for example, the temperature data measured by an air conditioner alone has many items such as the set temperature, air intake temperature, and refrigerant evaporation temperature, so one or more tags can be combined to identify the items while expressing the meaning of the data.

[0020] A test condition determination device according to an eighth aspect is the test condition determination device according to any one of the first to seventh aspects, further comprising a display unit. The display unit displays the tag information acquired by the control unit, the similarity between the tag information and tag information in the database, and the test conditions determined by the control unit.

[0021] In this test condition determining device, since the operator works on the equipment side, the operator can perform the work more smoothly by displaying information obtained from the equipment.

[0022] A test condition determination device of a ninth aspect is a test condition determination device of any one of the first aspect to the eighth aspect, in which, when there are no selectable test conditions, the control unit provides a button via the display unit for setting new test conditions.

[0023] In this test condition determination device, since it is possible that a situation may occur in which there are no selectable test conditions, by providing a means for dealing with the situation on the spot, unnecessary work is eliminated and it is also useful for updating the database of newly set test conditions.

[0024] A test condition determination device of a tenth aspect is a test condition determination device of any one of the first aspect to the ninth aspect, wherein the test conditions are conditions for evaluating the soundness of communication content between an equipment device and a monitoring device that monitors the equipment device. [Brief description of the drawings]

[0025] [Figure 1] FIG. 1 is a schematic diagram of a monitoring and control system for a refrigeration device. [Diagram 2] FIG. 2 is a block diagram showing the schematic configurations of a test device, a monitoring control device, and a chiller. [Diagram 3] 11 is a table showing data items and test signal patterns transmitted by the chiller to the monitoring control device. [Figure 4] 11 is a flowchart for determining a test signal pattern. [Diagram 5] 11 is a table showing an example of tag information assigned to data items. [Figure 6] FIG. 2 is a conceptual diagram of a database of tag information and test signal patterns associated with that tag information. [Figure 7] 1 is a table showing candidate test signal patterns that are displayed on a display of a test device. [Figure 8]11 is a table showing possible test signal patterns that may be displayed on a display of a test device after allowing similar tag information to be searched for in a database. [Figure 9] 4 is a table after the test signal pattern shown on the display has been selected. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0026] (1) Outline of the configuration of the refrigeration device monitoring and control system 1 Fig. 1 is a schematic diagram of a refrigeration equipment monitoring and control system 1. In Fig. 1, the refrigeration equipment monitoring and control system 1 includes a test device 10, a monitoring and control device 20, and a chiller 30 as a refrigeration equipment. Information is transmitted and received between the test device 10, the monitoring and control device 20, and the chiller 30 via communication.

[0027] Fig. 2 is a block diagram showing the schematic configuration of the test device 10, the monitoring and control device 20, and the chiller 30. Fig. 2 mainly shows parts related to the functions of the monitoring and control system 1 of the present invention, and does not show other detailed parts.

[0028] In FIG. 2, the test device 10 includes a CPU 11 , a memory 12 , a communication unit 13 , and a display 17 .

[0029] The CPU 11 processes information and the like obtained through communication with the chiller 30. The memory 12 stores information processed by the CPU 11 and information obtained.

[0030] The communication unit 13 transmits and receives necessary information between the monitoring and control device 20 and the chiller 30. The display 17 is a screen or the like that outputs read information and information input by the user.

[0031] The monitoring and controlling device 20 includes a CPU 21 , a memory 22 , a communication unit 23 , and a display 27 .

[0032] The CPU 21 processes information and the like obtained through communication with the test device 10 and the chiller 30. The memory 22 stores information processed by the CPU 21 and information obtained.

[0033] The display 27 is a screen or the like that outputs read information and information input by the user. On the display 27, buttons 24 (see FIG. 1) that allow the user to set and input predetermined information are displayed.

[0034] The chiller 30 has a CPU 31, a memory 32, and a communication unit 33. The CPU 31 processes information acquired via the communication unit 33 and information stored in the memory 32.

[0035] The memory 32 stores, as setting information, information processed by the CPU 31 and information acquired by the CPU 31. The setting information includes all information necessary for the operation of the chiller 30.

[0036] The communication section 33 transmits and receives necessary information to and from the communication section 13 of the test device 10 .

[0037] (2) Test Equipment 10 The test device 10 performs a loop test to verify the soundness of the communication content between the chiller 30 and the monitoring and control device 20 which monitors and controls the chiller 30. In the loop test, the test device 10 generates a test signal in the equipment to verify the soundness of the communication content.

[0038] 3 is a table showing the items of data and test signal patterns transmitted by chiller 30 to monitoring control device 20. In FIG. 3, operating capacity, outlet water temperature, outlet water pressure, and inlet water temperature are data actually measured by chiller 30.

[0039] In general facility devices, a test signal pattern is determined in advance for each data item in order to confirm that the measured data is properly sent to the monitoring control device 20 .

[0040] As shown in FIG. 3, in the chiller 30 of this embodiment, in the case of "operating capacity", the test signal pattern is a pattern that sequentially outputs signals indicating 0%, 25%, 50%, 25%, and 0% of the total capacity.

[0041] In the case of "outlet water temperature," the test signal pattern is a pattern that outputs signals indicating 7°C, 8°C, 9°C, 8°C, and 7°C in sequence.

[0042] In the case of "outlet water pressure," the test signal pattern is a pattern that outputs signals indicating 50 kPa, 60 kPa, 70 kPa, 60 kPa, and 50 kPa in sequence.

[0043] In the case of "inlet water temperature," the test signal pattern is a pattern in which signals indicating 4°C, 5°C, 6°C, 5°C, and 4°C are output in sequence.

[0044] The reason why even one item of data does not have a constant signal is that, for example, in the case of driving ability, there may be a situation where 25% of the signals are transmitted normally, but 50% of the signals are not transmitted normally.

[0045] The service person may directly operate the chiller 30 and send a test signal to the monitoring and controlling device 20 according to the method set in the chiller 30. However, this laborious work significantly reduces work efficiency.

[0046] Therefore, the service person connects the test device 10 to the tiller 30 so that they can communicate with each other, automatically sets the required test signal pattern, and causes the tiller 30 to transmit the test signal to the monitoring and control device 20.

[0047] (2-1) How to determine the test signal pattern Identification tag information is assigned to each required data item of facility equipment, not just the chiller 30. In this embodiment, determination of the test signal pattern begins with the test device 10 acquiring tag information from the chiller 30.

[0048] The "tag information" referred to in this application is set separately from the name of the data, and tags related to substances such as water (#water) and air (#air), physical quantities such as temperature (#temperature) and pressure (#pressure), measurement locations such as exit (#leaving) and entrance (#entering), and equipment status information such as operating capacity (#capacity) are pre-defined. By combining and assigning these tags, information about the meaning of the data (what and where the data measured) is obtained.

[0049] In addition, while the meaning of the data can be inferred to some extent from the data name, data names are specified for each device (manufacturer), which makes it complicated to determine the similarity of data names between different types of devices and makes it difficult to reuse signal patterns.

[0050] On the other hand, in the case of the "tag information" described in this application, the necessary tag from predetermined tags is assigned to each piece of device data, so even if there are some differences between devices, it is easy to determine the similarity of the tag information, making it easy to reuse signal patterns.

[0051] 4 is a flowchart showing how the test signal pattern is determined. Hereinafter, the operation of the test device 10 to determine the test signal pattern will be described with reference to FIG.

[0052] (Step S1) The CPU 11 communicates with the tiller 30 via the communication unit 13 to obtain tag information that is assigned to each item of data held by the tiller 30.

[0053] Fig. 5 is a table showing an example of tag information attached to data items. For example, the tags #capacity, #leaving #water #temperature, #leaving #water #pressure, and #entering #water #temperature are attached to the data items "driving capacity", "outlet water temperature", "outlet water pressure", and "inlet water temperature", respectively.

[0054] (Step S2) The CPU 11 retrieves the matching tag information and the test signal pattern associated with that tag information from a database stored in the memory 12 .

[0055] Fig. 6 is a conceptual diagram of a database of tag information and test signal patterns associated with that tag information. In Fig. 6, the tag information #capacity, #leaving #water #temperature, #water #pressure, and #entering #water #temperature are assigned to the data items "driving capacity", "outlet water temperature", "outlet water pressure", and "inlet water temperature" stored in memory 12, respectively.

[0056] The test signal patterns associated with each tag information are three patterns, A1 to A3, for driving ability. A1 is a pattern that outputs signals indicating 0%, 25%, 50%, 25%, and 0% of total ability in sequence. A2 is a pattern that outputs signals indicating 100%, 75%, 50%, 25%, and 0% of total ability in sequence. A3 is a pattern that outputs signals indicating 0%, 25%, 50%, 75%, and 100% of total ability in sequence.

[0057] In the case of the outlet water temperature, there are three test signal patterns, B1 to B3. B1 is a pattern that outputs signals indicating 7°C, 8°C, 9°C, 8°C, and 7°C in sequence. B2 is a pattern that outputs signals indicating 10°C, 9°C, 8°C, 7°C, and 6°C in sequence. B3 is a pattern that outputs signals indicating 7°C, 8°C, 9°C, 10°C, and 11°C in sequence.

[0058] For the outlet water pressure, there are three test signal patterns, C1 to C3. C1 is a pattern that outputs signals indicating 50kPa, 60kPa, 70kPa, 60kPa, and 50kPa in sequence. C2 is a pattern that outputs signals indicating 70kPa, 60kPa, 50kPa, 40kPa, and 30kPa in sequence. C3 is a pattern that outputs signals indicating 50kPa, 60kPa, 70kPa, 80kPa, and 90kPa in sequence.

[0059] For the inlet water temperature, there are three test signal patterns, D1 to D3. D1 is a pattern that outputs signals indicating 4°C, 5°C, 6°C, 5°C, and 4°C in sequence. D2 is a pattern that outputs signals indicating 8°C, 7°C, 6°C, 5°C, and 4°C in sequence. D3 is a pattern that outputs signals indicating 4°C, 5°C, 6°C, 7°C, and 8°C in sequence.

[0060] 5 and 6, it can be seen that the tag information for "outlet water pressure" given to the chiller 30 does not match the tag information for "outlet water pressure" held by the testing device 10.

[0061] (Step S3) The CPU 11 determines the test signal pattern to actually be adopted based on the tag information acquired from the tiller 30 and the test signal pattern associated with the tag information held in the database.

[0062] Fig. 7 shows candidate test signal patterns displayed on the display 17 of the test device 10. In Fig. 7, the tag information #leaving #water #pressure for "outlet water pressure" assigned to the chiller 30 did not match the tag information #water #pressure for "outlet water pressure" held by the test device 10, so the candidate test signal patterns for "outlet water pressure" are not displayed.

[0063] Therefore, the test pattern signal for "outlet water pressure" for which there is no candidate is set by the service person. The service person presses the first button 14 (see FIG. 1) on the display 17 to allow searching the database for tag information similar to #leaving #water #pressure.

[0064] Figure 8 is a table showing test signal pattern candidates that are displayed on the display 17 of the test device 10 after allowing similar tag information to be searched for in the database. In Figure 8, for the test pattern signal "outlet water pressure", for which no candidates were displayed in Figure 7, test signal pattern candidates associated with the tag information #water #pressure held in the database of the test device 10 are displayed.

[0065] The tag information #leaving #water #pressure for "outlet water pressure" assigned to the chiller 30 matches the tag information #water #pressure for "outlet water pressure" held by the testing device 10, so the similarity is (2 / 3)×100=66.7%. In this embodiment, a similarity of 60% or more is determined to be similar.

[0066] The service person selects a desired pattern from the candidates of test signal patterns displayed for each data item. The same table as that shown in Fig. 8 is shown on the display 17, so the service person can select the desired candidate by touching it.

[0067] Figure 9 shows the table after a test signal pattern has been selected and is displayed on the display 17. In Figure 9, the selected test signal pattern is highlighted.

[0068] When the service person presses second button 15 (see FIG. 1) on display 17, the selected test signal pattern is set on the tiller 30 side, and a loop test is started.

[0069] The service person can arbitrarily set the number of repetitions of the test signal pattern from the chiller 30 to the monitoring control device 20 via the display 17. Moreover, instead of the number of repetitions of the test signal pattern, the elapsed time of the test signal pattern can also be arbitrarily set.

[0070] (Step S4) The CPU 11 updates the database in the memory 12 so that the determined test signal pattern is associated with the tag information attached to the data item. Specifically, when the service person presses the third button 16 (see FIG. 1) on the display 17, the database in the memory 12 is updated and the updated data is stored as data to be utilized at a later date.

[0071] As described above, the test device 10 automatically determines the signal pattern for the loop test based on the test signal pattern associated with the tag information, so that the man-hours required for setting the test signal pattern are reduced.

[0072] (3) Features (3-1) In test device 10, CPU 11 acquires tag information from tiller 30 and determines a loop test signal pattern from the acquired tag information and a database that associates the tag information with test signal patterns. This simplifies the task of setting the loop test signal pattern by a service person, reducing the number of work steps and the occurrence of setting errors.

[0073] (3-2) In the test device 10, it is possible to set not only the test signal pattern that the tiller 30 outputs, but also the number of times the test signal pattern is repeated or the elapsed time.

[0074] (3-3) When there is no match with the tag information in the database, the test device 10 determines a test signal pattern that is associated with the tag information that has a high similarity to the tag information. This increases the versatility of the test device 10.

[0075] (3-4) In the test apparatus 10, the database is updated so that the determined test signal patterns are associated with the tag information attached to the items of data, thereby making the test apparatus 10 even more versatile.

[0076] (3-5) In the test device 10, a series of operations from obtaining tag information → determining a test signal pattern → setting → execution proceeds in a set procedure, so that the number of worker operations is reduced.

[0077] (3-6) In the test device 10, the CPU 11 receives one pattern selected from a plurality of test signal patterns.

[0078] (3-7) The tag information is information that is assigned to each item of data that is measured and stored during operation of equipment such as the chiller 30, and is made up of one or more tags that express the meaning of the data.

[0079] (3-8) In the test device 10, the display 17 displays the tag information acquired by the CPU 11, the similarity between the tag information and the tag information in the database, and the test signal pattern determined by the CPU 11. This allows the service person to perform the work more smoothly.

[0080] (3-9) In the test device 10, when there are no selectable candidates for the test signal pattern, a first button 14 is provided for setting a new test signal pattern associated with similar tag information via the display unit. This provides a means for a service person to handle the situation on-site, thereby eliminating unnecessary work and helping to update the database with the newly set test signal pattern.

[0081] (3-10) The test signal pattern is a condition for evaluating the soundness of the communication content between the chiller 30 and the monitoring control device 20 that monitors the chiller 30.

[0082] (4) Variations In the testing device 10 of the above embodiment, if the tag information attached to the chiller 30 does not match the tag information held by the testing device 10, it is possible to search the database for similar tag information with a similarity of 60% or more.

[0083] However, there may be cases where there is no similar tag information. In such a case, the service person can lower the similarity from "60% or more" to "30% or more" and expand the allowable range of similarity to search the database. The similarity can be changed via the display 17.

[0084] Only when similar tag information is not found and no candidate test signal pattern appears even if the degree of similarity is lowered, the service person himself / herself arbitrarily determines a test signal pattern.

[0085] The service person can associate the mismatched tag information with a test signal pattern that he or she has determined arbitrarily, and press the third button 16 on the display 17 to update the database so that the test signal pattern determined arbitrarily by the service person is associated with the tag information. This further increases the versatility of the test device 10.

[0086] (5)Other In the above embodiment and modified examples, it has been described that the loop test is performed at the time of construction (when the building monitoring system is built) to check the soundness of the communication content between the equipment and the monitoring system.

[0087] However, loop tests are not limited to being performed only during the above construction, but are also performed during operation. For example, if the number of facilities in the network is increased or decreased after operation has begun, the network communication status will change, so in order to check whether this has affected existing equipment, loop tests are performed to check for changes in communication and response time. In this case, loop tests are performed using the signal pattern determined at the time of construction.

[0088] Although the embodiments of the present disclosure have been described above, it will be understood that various changes in form and details can be made without departing from the spirit and scope of the present disclosure described in the claims. [Industrial Applicability]

[0089] In this disclosure, a chiller has been described as an application example, but this disclosure is not limited to chillers and can be applied to any facility equipment to which tag information is attached. [Explanation of symbols]

[0090] 10 Test equipment (test condition determination equipment) 11 CPU (control unit) 12 Memory (storage section) 14 1st button (button) 17 Display (Display unit) [Prior art documents] [Patent documents]

[0091] [Patent Document 1] JP 2017-191386 A

Claims

1. A test condition determination device for determining test conditions for equipment, the equipment being provided with tag information for each data item, A control unit (11); A memory unit (12) for storing a database in which the tag information and the test conditions are associated with each other; Equipped with A selectable plurality of test conditions are associated with the tag information in the database; The control unit (11) Acquire the tag information from the facility equipment; when determining the test condition from the acquired tag information and the database, accepting one of the plurality of test conditions; A test condition determination device (10).

2. The test conditions include a time lapse and a signal pattern output by the facility device. The test condition determining device (10) according to claim 1.

3. When there is no tag information matching the tag information in the database, the control unit (11) determines the test conditions associated with the tag information having a high similarity to the tag information. A test condition determining device (10) according to claim 1 or 2.

4. the control unit (11) updates the database so that the determined test conditions or the test conditions arbitrarily set by the user are associated with the tag information assigned to the items. A test condition determining device (10) according to any one of claims 1 to 3.

5. The control unit (11) causes the facility equipment to perform a test based on the test conditions. The test condition determining device according to any one of claims 1 to 4.

6. The tag information is information composed of one or more tags that are assigned to each of the items of the data measured and stored during operation of the facility equipment and that express the meaning of the data. A test condition determining device (10) according to any one of claims 1 to 5.

7. Further comprising a display unit (17), The display unit (17) displays the tag information acquired by the control unit (11), the similarity between the tag information and the tag information in the database, and the test conditions determined by the control unit (11). A test condition determining device (10) according to any one of claims 1 to 6.

8. When there are no selectable test conditions, the control unit (11) provides a button for setting new test conditions via the display unit (17). A test condition determination device (10) according to claim 7.

9. The test conditions are conditions for evaluating the soundness of communication content between the facility equipment and a monitoring device that monitors the facility equipment. The test condition determining device according to any one of claims 1 to 8.

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