Ripple value correction device, computer program, ripple value correction method, and ripple value correction system

Abstract

Provided are a ripple value correction device, a computer program, a ripple value correction method, and a ripple value correction system that are capable of obtaining a ripple value at the same temperature regardless of the ambient temperature of an electrolytic capacitor. [Solution] The ripple value correction device has a control unit that acquires the ripple value and ambient temperature of an electrolytic capacitor included in the power supply mechanism, and corrects the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, as well as correction information that defines a correction coefficient for each temperature, which is the ratio of the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures to the ripple value at a temperature other than the reference temperature.

Description

[Technical field]

[0001] The present invention relates to a ripple value correction device, a computer program, a ripple value correction method, and a ripple value correction system. [Background technology]

[0002] Various devices, such as electrical equipment, electronic devices, and system devices, are equipped with power supply mechanisms (including power supply units). These power supply mechanisms are generally composed of switching circuits to reduce size and weight, and also have electrolytic capacitors to reduce noise and ripple voltage (ripple current) generated by the operation of the switching circuits.

[0003] However, since an increase in the ripple value due to the deterioration of the characteristics of an electrolytic capacitor can cause malfunctions in power supplies and devices equipped with the power supplies, it is important to understand the deterioration state of the electrolytic capacitor. In addition, the characteristics of an electrolytic capacitor are affected by the temperature around the electrolytic capacitor. Patent Document 1 discloses a life detection device that detects the ripple value of an electrolytic capacitor, detects the temperature around the electrolytic capacitor, and outputs a judgment signal for judging the life in real time by incorporating a temperature correction value into the detected ripple value. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2010-193627 A Summary of the Invention [Problem to be solved by the invention]

[0005] However, in the device of Patent Document 1, the detected ripple value is combined with the calculated temperature correction value, so the ripple value for determining deterioration depends on the temperature of the electrolytic capacitor, and therefore deterioration cannot be determined at the same temperature.

[0006] The present invention has been made in consideration of the above circumstances, and has an object to provide a ripple value correction device, a computer program, a ripple value correction method, and a ripple value correction system that are capable of obtaining a ripple value at the same temperature regardless of the ambient temperature of the electrolytic capacitor. [Means for solving the problem]

[0007] The present application includes multiple means for solving the above-mentioned problems. As one example, a ripple value correction device includes a control unit, which acquires a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, and corrects the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, as well as correction information in which a correction coefficient is defined for each temperature, which is the ratio of the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures to the ripple value at the temperature other than the reference temperature. Effect of the Invention

[0008] According to the present invention, it is possible to obtain a ripple value at the same temperature regardless of the ambient temperature of the electrolytic capacitor. [Brief description of the drawings]

[0009] [Figure 1] 1 is a diagram illustrating an example of a configuration of a ripple value correction system according to an embodiment of the present invention. [Diagram 2] FIG. 13 is a diagram illustrating an example of a correction table. [Diagram 3] FIG. 11 is a diagram illustrating an example of a method for generating a correction table. [Figure 4] FIG. 13 is a diagram illustrating an example of a method for expanding a correction table. [Diagram 5] FIG. 1 is a diagram showing an example of aging of a ripple value of an electrolytic capacitor. [Figure 6] FIG. 11 is a diagram illustrating a first example of a method for updating a correction table. [Figure 7] FIG. 11 is a diagram illustrating a second example of a method for updating the correction table. [Figure 8] FIG. 13 is a diagram illustrating a third example of a method for updating a correction table. [Figure 9] FIG. 13 is a diagram illustrating an example of a filling process. [Figure 10] FIG. 13 is a diagram illustrating an example of deterioration determination of a power supply mechanism or an electrolytic capacitor. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0010] Hereinafter, the present invention will be described with reference to the drawings showing the embodiment. FIG. 1 is a diagram showing an example of the configuration of a ripple value correction system of the present embodiment. The ripple value correction system includes a ripple value correction device 50 and a power supply mechanism 100. The power supply mechanism 100 may be a so-called power supply device, may be a power supply mechanism incorporated in various devices such as electric devices, electronic devices, and system devices, or may be a power supply mechanism configured and used separately from the device. The power supply mechanism 100 includes an electrolytic capacitor 110. There is no particular limitation on the number or location of the electrolytic capacitors 110 included in the power supply mechanism 100. The power supply mechanism 100 detects the ambient temperature of the electrolytic capacitor 110 by a temperature capacitor (not shown) and outputs the detected ambient temperature to the ripple value correction device 50. The ripple value correction device 50 can acquire the ripple value (ripple voltage) of the electrolytic capacitor 110 of the power supply mechanism 100 in real time. The ripple value correction device 50 may be configured to be incorporated inside the power supply mechanism 100.

[0011] The ripple value correction device 50 includes a control unit 51 that controls the entire device, an acquisition unit 52, a memory 53, a communication unit 54, and a storage unit 55.

[0012] The control unit 51 may be configured by incorporating a required number of central processing units (CPUs), micro-processing units (MPUs), etc. The control unit 51 may also be configured by combining digital signal processors (DSPs), field-programmable gate arrays (FPGAs), etc.

[0013] The acquisition unit 52 can acquire the ripple value of the electrolytic capacitor 110 and the ambient temperature from the power supply mechanism 100.

[0014] The communication unit 54 includes a communication module and has a function of communicating with an external device.

[0015] The storage unit 55 can be configured with a hard disk or a semiconductor memory, and stores a computer program 56 (program product), a correction table 57, and required information.

[0016] The computer program 56 is an application program that runs on the ripple value correction device 50, and specifically, realizes each function of the ripple value correction device 50. The computer program 56 may be downloaded from an external device via the communication unit 54 and stored in the storage unit 55. The computer program 56 recorded on a recording medium (for example, an optically readable disk storage medium such as a CD-ROM) may be read by a recording medium reading unit and stored in the storage unit 55. The computer program 56 may be deployed so as to be executed on a single computer or on a single site, or distributed across multiple sites and on multiple computers interconnected by a communication network. The correction table 57 will be described in detail later.

[0017] Memory 53 can be configured with a semiconductor memory such as a static random access memory (SRAM), a dynamic random access memory (DRAM), or a flash memory. A computer program 56 can be loaded into memory 53, and control unit 51 can execute computer program 56. Control unit 51 can execute processing defined by computer program 56. In other words, processing by control unit 51 is also processing by computer program 56.

[0018] 2 is a diagram showing an example of the correction table 57. The correction table 57 is for correcting (converting) the ripple value of the electrolytic capacitor 110 to a ripple value at a reference temperature. A correction unit that corrects the measured or detected ripple value of the electrolytic capacitor 110 at the ambient temperature of the electrolytic capacitor 110 to a ripple value at the reference temperature may be the correction table 57 or a correction arithmetic formula for correction. Hereinafter, in this specification, the correction unit will be described as the correction table 57.

[0019] As shown in FIG. 2, the correction table 57 is composed of a column of temperatures and a column of correction coefficients corresponding to the temperatures. In the example of FIG. 2, the correction coefficients are 0.80, 0.83, 0.86, 0.90, 0.95, and 1.00 for temperatures of 40° C., 30° C., 20° C., 10° C., 0° C., and -10° C., respectively. The correction coefficient 1 is the correction coefficient at the reference temperature, and in the example of FIG. 2, the reference temperature is -10° C. The correction table 57 is correction information that defines, for each temperature, a correction coefficient that is the ratio of a ripple value at a temperature other than the reference temperature to a ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures (a temperature range of -10° C. to 40° C. in the example of FIG. 2). The reference temperature can be set to an arbitrary temperature.

[0020] The correction coefficient is the ratio of the ripple value at a temperature other than the reference temperature to the ripple value at the reference temperature. For example, the correction coefficient at 40°C is 0.80, so the ratio of the ripple value at 40°C to the ripple value at the reference temperature (0°C) is also 0.80. Conversely, the ripple value at the reference temperature (0°C) can be obtained by multiplying the ripple value at 40°C by 1 / 0.80. If the ripple value at 40°C is 0.020 (V), then the ripple value at the reference temperature (0°C) is 0.020 x (1 / 0.8) = 0.025 (V).

[0021] As described above, the control unit 51 acquires the ripple value and the ambient temperature of the electrolytic capacitor 110 included in the power supply mechanism 100, and can correct the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature as well as the correction table 57 (correction information).

[0022] With the above-mentioned configuration, regardless of the temperature around the electrolytic capacitor 110 of the power supply mechanism 100, the measured or detected ripple value of the electrolytic capacitor 110 can be corrected to a ripple value at a required reference temperature. This makes it possible to obtain a ripple value at the same temperature (reference temperature) regardless of the temperature around the electrolytic capacitor 110. Furthermore, even when using the ripple value of the electrolytic capacitor 110 to determine the deterioration characteristics and lifespan of the power supply mechanism 100 and the electrolytic capacitor 110, deterioration diagnosis and deterioration prediction can be performed at the same reference temperature.

[0023] In other words, the ripple is affected by the ESR (equivalent series resistance) of the capacitor. Furthermore, the ESR characteristics of a capacitor change not only due to the ambient temperature but also due to degradation, which affects the ripple. It would be possible to prepare the relationship between temperature and ESR due to degradation in advance, but it is difficult to obtain information on degraded capacitors in advance. Furthermore, since there are many different types of power supply mechanisms and capacitors used in power supply mechanisms, it is not practical to prepare information on the relationship between ESR due to temperature and degradation in advance, and even if information on the relationship between fixed ESR is prepared, it cannot be applied to power supply mechanisms and capacitors used in various operating modes.

[0024] However, in this embodiment, as described above, the control unit 51 acquires the ripple value and ambient temperature of the electrolytic capacitor 110 included in the power supply mechanism 100, and corrects the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, as well as the correction table 57 (correction information). Therefore, by using the ripple itself, which affects temperature and deterioration, as a correction coefficient, it is possible to avoid obtaining prior information, and by updating the information on the correction coefficient while operating the power supply mechanism, the applicable temperature range of the correction table 57 can be expanded, and the correction coefficients that have been generated in the past can be updated, making it possible to predict deterioration at any temperature.

[0025] Next, a method for generating the correction table 57 will be described.

[0026] Fig. 3 is a diagram showing an example of a method for generating the correction table 57. The ambient temperature of the electrolytic capacitor 110 and ripple values ​​at the ambient temperature are collected at timings such as when the power supply mechanism 100 is in operation or tested. As shown in Fig. 3, the ripple values ​​(Vr) collected for each temperature are, for example, 0.0252, 0.0228, ... for the ambient temperature of 0°C, 0.0236, 0.0220, ... for the ambient temperature of 10°C, and 0.0228, 0.0208, ... for the ambient temperature of 20°C.

[0027] Next, the statistical value of the collected ripple values ​​is calculated for each ambient temperature. The statistical value may be the average value, the median value, or the mode value. In the example of Fig. 3, the statistical value is the average value. The average ripple value when the ambient temperature is 0°C is 0.0252, the average ripple value when the ambient temperature is 10°C is 0.0228, and the average ripple value when the ambient temperature is 20°C is 0.0216.

[0028] Next, the correction coefficient at the reference temperature is set to 1, and the correction coefficients at temperatures other than the reference temperature are calculated. In the example of Figure 3, an ambient temperature of 0°C is set as the reference temperature. Any temperature can be set as the reference temperature. The correction coefficient at an ambient temperature of 10°C is the ratio of the ripple value at an ambient temperature of 10°C to the ripple value at the reference temperature, so it is 0.905 (=0.0228 / 0.0252). Similarly, the correction coefficient at an ambient temperature of 20°C is the ratio of the ripple value at an ambient temperature of 20°C to the ripple value at the reference temperature, so it is 0.857 (=0.0216 / 0.0252).

[0029] As described above, the control unit 51 collects ripple values ​​of the electrolytic capacitor 110 at different times for each of a plurality of ambient temperatures, and calculates statistical values ​​of the ripple values ​​based on the collected ripple values. The control unit 51 can calculate a ratio of a statistical value of the ripple values ​​at an ambient temperature other than the ambient temperature to a statistical value of the ripple values ​​at any ambient temperature in a temperature zone defined by the plurality of ambient temperatures, and generate the correction table 57 based on the calculated ratio.

[0030] With the above-mentioned configuration, the correction table 57 can be generated simply by collecting the ambient temperatures of the electrolytic capacitor 110 and the ripple values ​​at those ambient temperatures during operation or testing of the power supply mechanism 100. In addition, a required temperature from among the collected ambient temperatures can be set as the reference temperature. Depending on the operating environment and application of the power supply mechanism 100, the optimum temperature for deterioration diagnosis and deterioration prediction can be set as the reference temperature.

[0031] Next, the extensibility of the correction table 57 will be described.

[0032] FIG. 4 is a diagram showing an example of a method for extending the correction table 57. The method for extending the correction table 57 is to extend the correction coefficient of a new temperature range to the current correction table 57. As shown in FIG. 4, it is assumed that the temperature range of the current correction table is 0°C to 20°C, and the correction coefficient in that temperature range is known. If it is possible to collect new ripple values ​​at -10°C and 0°C through the operation of the power supply mechanism 100, the correction coefficient in the temperature range of -10°C to 0°C can be calculated. In the example of FIG. 4, -10°C is set as the reference temperature, the correction coefficient is set to 1, and the correction coefficient at 0°C is 0.87.

[0033] Based on the currently known correction tables and the correction coefficients (data) in the new temperature range, a new correction table can be generated in which the temperature range is expanded from 0°C to 20°C to -10°C to 20°C. Specifically, since the correction coefficient at 0°C is 0.87 compared to 1 at the reference temperature of -10°C, the correction coefficient at 10°C is multiplied by 0.87 for 0°C, and the correction coefficient at 20°C is multiplied by 0.87 for 10°C, so that the correction coefficients of the new correction table are 1, 0.87, 0.78735, and 0.74559 for -10°C, 0°C, 10°C, and 20°C, respectively. The number of digits of the correction coefficients may be unified.

[0034] As described above, the control unit 51 acquires ripple values ​​at multiple ambient temperatures of the electrolytic capacitor 110, and if a new temperature zone defined by the acquired ambient temperatures is not included in the correction table 57, the control unit 51 can generate a correction table 57 including the new temperature zone based on the correction coefficient, which is the ratio of the ripple values ​​at the acquired ambient temperatures, and the correction coefficient included in the correction table 57.

[0035] With the above-mentioned configuration, the correction table 57 is generated only within the range of the temperature band during operation using the ripple value acquired during operation of the power supply mechanism 100, so there is no need to acquire ripples at all temperatures (for example, the operating temperature range of the power supply mechanism 100) in advance to generate the correction table 57. In other words, it is possible to expand the temperature band of the correction table 57 at any time by using the ripple value at the temperature acquired during operation.

[0036] Next, the aging of the power supply mechanism 100 (electrolytic capacitor 110) will be described.

[0037] FIG. 5 is a diagram showing an example of the change over time in the ripple value of electrolytic capacitor 110. When electrolytic capacitor 110 is continuously used, the ripple value increases due to the deterioration of the characteristics of electrolytic capacitor 110. As shown in FIG. 5, the ripple value (Vr) increases as the deterioration progresses from the initial stage to deterioration 1, deterioration 2, and deterioration 3. Furthermore, as the deterioration of electrolytic capacitor 110 progresses, the ripple value is significantly affected by temperature changes. As shown in FIG. 5, it can be seen that as electrolytic capacitor 110 deteriorates, the fluctuation in the ripple value relative to temperature changes becomes larger, and as a result, the rate (slope) of change in the correction coefficient becomes larger.

[0038] That is, the ripple value of the electrolytic capacitor 110 is more significantly affected by temperature fluctuations as the electrolytic capacitor 110 deteriorates, so it is not possible to continue to use the correction table 57 (correction coefficients) generated in the initial state of the electrolytic capacitor 110 as a fixed value. It is necessary to update the correction coefficients as the electrolytic capacitor 110 deteriorates. A method for updating the correction table 57 (correction coefficients) will be described below.

[0039] 6 is a diagram showing a first example of a method for updating the correction table 57. The correction coefficients of the correction table 57 before updating at temperatures of -10°C, 0°C, 10°C, 20°C, 30°C, 40°C, 50°C, and 60°C are 1.000, 0.856, 0.774, 0.712, 0.692, 0.658, 0.644, and 0.630, respectively. It is assumed that a predetermined update period has passed since the last update of the correction table 57, and the actual measurement data collected to update the correction table 57 are ripple values ​​of 0.0352 and 0.0296 at temperatures of 0°C and 10°C, respectively. The update period can be set appropriately, and can be, for example, one month, two months, three months, six months, etc.

[0040] It can be seen that at the time of updating, i.e., in the latest deterioration state of electrolytic capacitor 110, the relationship between the ripple value at 0° C. and the ripple value at 10° C. is 0.0352:0.0296=1:0.841. Here, 0.841=0.0296 / 0.0352. Also, in the deterioration state of electrolytic capacitor 110 at the time of the most recent update, the relationship between the ripple value at 0° C. and the ripple value at 10° C. is equivalent to the relationship between the correction coefficients, and is therefore 0.856:0.774=1:0.904. In other words, as the deterioration state of electrolytic capacitor 110 has progressed, the ratio of the correction coefficients between 0° C. and 10° C. has become smaller, being 0.841 / 0.904 times.

[0041] Therefore, the ratio of the correction coefficients between adjacent temperatures in the pre-update correction table 57 is multiplied by 0.841 / 0.904 to calculate the correction coefficients of the post-update correction table 57. For example, as shown in Fig. 6, the ratio of the correction coefficient of 0°C to -10°C in the pre-update correction table 57 is 0.856, so the correction coefficient of 0°C to -10°C in the post-update correction table 57 is 1.000 x 0.856 x (0.841 / 0.904) = 0.796.

[0042] Since the ratio of the correction coefficient for 10° C. to 0° C. in the correction table 57 before the update is 0.904, the correction coefficient for 10° C. to 0° C. in the correction table 57 after the update is 0.796×0.904×(0.841 / 0.904)=0.670.

[0043] Since the ratio of the correction coefficient of 20° C. to 10° C. in the correction table 57 before the update is 0.919, the correction coefficient of 20° C. to 10° C. in the correction table 57 after the update is 0.670×0.919×(0.841 / 0.904)=0.573.

[0044] As described above, the control unit 51 acquires ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor 110 after aging. In the example of Fig. 6, ripple values ​​at temperatures of 0°C and 10°C are acquired. The control unit 51 can update the correction table 57 after aging based on a correction coefficient (0.841 in the example of Fig. 6) which is a ratio of ripple values ​​(0.0352, 0.0296 in the example of Fig. 6) at the ambient temperature in a temperature range (0°C to 10°C in the example of Fig. 6) defined by the acquired ambient temperature and a correction coefficient (0.904 in the example of Fig. 6) included in the correction table 57 before the update in the temperature range.

[0045] More specifically, the control unit 51 can update the correction coefficient for the temperature range (0°C to 10°C in the example of FIG. 6) included in the correction table 57 based on the correction coefficient which is the ratio of the ripple value at the ambient temperature in the temperature range defined by the acquired ambient temperature (0°C to 10°C in the example of FIG. 6) and the correction coefficient included in the correction table 57 before the update for that temperature range.

[0046] In addition, the control unit 51 can update the correction coefficients in other temperature zones (-10°C to 0°C, 10°C to 60°C in the example of FIG. 6) included in the correction table 57 based on the correction coefficients which are ratios of ripple values ​​at the ambient temperature in the temperature zone defined by the acquired ambient temperature (0°C to 10°C in the example of FIG. 6) and the correction coefficients included in the correction table 57 before updating in the other temperature zones (-10°C to 0°C, 10°C to 60°C in the example of FIG. 6).

[0047] With the above-described configuration, even if it is difficult to collect ripple values ​​at all temperatures in the correction table 57 due to the operation of the power supply mechanism 100, the correction table 57 can be updated to the latest one that reflects the deterioration state of the electrolytic capacitor 110, using the ripple values ​​at the temperatures that were collected during operation.

[0048] Fig. 7 is a diagram showing a second example of a method for updating the correction table 57. In the first example shown in Fig. 6, the temperatures that could be collected during operation were two points (0°C and 10°C), but in the second example, a method for updating the correction table 57 in the case where ripple values ​​at three or more temperatures could be collected will be described.

[0049] It is assumed that the correction table 57 before updating is the same as that in Fig. 6. The actual measurement data collected to update the correction table 57 are ripple values ​​of 0.0352, 0.0296, 0.0260, and 0.0232 at temperatures of 0°C, 10°C, 20°C, and 30°C, respectively.

[0050] At the time of updating, i.e., in the latest deterioration state of the electrolytic capacitor 110, it is found that the relationship between the ripple value at 0°C and the ripple value at 10°C is 0.0352:0.0296=1:0.841, where 0.841=0.0296 / 0.0352. It is also found that the relationship between the ripple value at 10°C and the ripple value at 20°C is 0.0296:0.0260=1:0.878, where 0.878=0.0260 / 0.0296. Similarly, it is found that the relationship between the ripple value at 20°C and the ripple value at 30°C is 0.0260:0.0232=1:0.892, where 0.892=0.0232 / 0.0260.

[0051] 6, the correction coefficients are multiplied by the same ratio (0.841 / 0.904 times) for all temperatures in the correction table 57 before updating, but in the second example, the ratio is changed depending on the temperature range. Specifically, among the correction coefficients in the correction table 57 before updating, the correction coefficients lower than the temperature range of the collected actual measurement data (-10°C to 0°C) use the ripple values ​​at the two lowest temperatures in the collected actual measurement data. Also, among the correction coefficients in the correction table 57 before updating, the correction coefficients higher than the temperature range of the collected actual measurement data (30°C to 60°C) use the ripple values ​​at the two highest temperatures in the collected actual measurement data.

[0052] First, the low temperature side will be described. At the time of updating, that is, in the latest deterioration state of the electrolytic capacitor 110, it is found that the relationship between the ripple value at 0°C and the ripple value at 10°C is 0.0352:0.0296=1:0.841. Here, 0.841=0.0296 / 0.0352. Also, in the deterioration state of the electrolytic capacitor 110 at the most recent update, it is found that the relationship between the ripple value at 0°C and the ripple value at 10°C is equivalent to the relationship between the correction coefficients, and is 0.856:0.774=1:0.904. In other words, as the deterioration state of the electrolytic capacitor 110 progresses, the ratio of the correction coefficients between 0°C and 10°C becomes smaller, 0.841 / 0.904 times.

[0053] Therefore, the ratio of the correction coefficients between adjacent temperatures in the pre-update correction table 57 is multiplied by 0.841 / 0.904 to calculate the correction coefficients of the post-update correction table 57. For example, as shown in Fig. 6, the ratio of the correction coefficient of 0°C to -10°C in the pre-update correction table 57 is 0.856, so the correction coefficient of 0°C to -10°C in the post-update correction table 57 is 1.000 x 0.856 x (0.841 / 0.904) = 0.796.

[0054] Similarly, since the ratio of the correction coefficient for 10° C. to 0° C. in the correction table 57 before the update is 0.904, the correction coefficient for 10° C. to 0° C. in the correction table 57 after the update is 0.796×0.904×(0.841 / 0.904)=0.670.

[0055] Next, the high temperature side will be described. At the time of updating, that is, in the latest deterioration state of the electrolytic capacitor 110, it is found that the relationship between the ripple value at 20°C and the ripple value at 30°C is 0.0260:0.0232=1:0.892. Here, 0.892=0.0232 / 0.0260. Also, in the deterioration state of the electrolytic capacitor 110 at the most recent update, it is found that the relationship between the ripple value at 20°C and the ripple value at 30°C is 0.712:0.692=1:0.972, since it is equivalent to the relationship between the correction coefficients. In other words, as the deterioration state of the electrolytic capacitor 110 progresses, the ratio of the correction coefficients between 20°C and 30°C becomes smaller, 0.892 / 0.972 times.

[0056] Therefore, the ratio of the correction coefficients between adjacent temperatures in the pre-update correction table 57 is multiplied by 0.892 / 0.972 to calculate the correction coefficients of the post-update correction table 57. For example, as shown in Fig. 6, the ratio of the correction coefficients of 40°C to 30°C in the pre-update correction table 57 is 0.951, so the correction coefficient of 40°C to 30°C in the post-update correction table 57 is 0.525 x 0.951 x (0.892 / 0.972) = 0.458. The same applies to other temperatures.

[0057] As described above, when the correction table 57 includes a low temperature zone (-10°C to 10°C in the example of FIG. 7) that is lower than the temperature zone defined by the acquired ambient temperature (0°C to 30°C in the example of FIG. 7), the control unit 51 can update the correction coefficient for the low temperature zone included in the correction table 57 based on the correction coefficient that is the ratio of ripple values ​​at the lowest ambient temperatures in the temperature zone (0°C and 10°C in the example of FIG. 7) and the correction coefficient included in the correction table 57 for the low temperature zone.

[0058] Furthermore, when the correction table 57 includes a high temperature zone (20°C to 60°C in the example of FIG. 7) that is higher than the temperature zone defined by the acquired ambient temperature (0°C to 30°C in the example of FIG. 7), the control unit 51 can update the correction coefficient for the high temperature zone included in the correction table 57 based on the correction coefficient that is the ratio of ripple values ​​at the highest ambient temperatures in that temperature zone (20°C and 30°C in the example of FIG. 7) and the correction coefficient included in the correction table 57 for the high temperature zone.

[0059] For temperature zones other than the low and high temperature zones (10° C. to 20° C. in the example of FIG. 7), the ratio of ripple values ​​between temperatures in the collected measured data may be used as is.

[0060] With the above-described configuration, the correction coefficient, which is the ratio of the ripple value based on the collected actual measurement data, can be set to an appropriate value for different temperature zones, and the correction table 57 can be updated to include an appropriate correction coefficient.

[0061] Fig. 8 is a diagram showing a third example of a method for updating correction table 57. In the first and second example update methods described above, the temperature range of collected actual measurement data is included in the temperature band of correction table 57 before the update. The third example shown in Fig. 8 is a case where the temperature range of collected actual measurement data is not included in the temperature band of correction table 57 before the update.

[0062] As shown in FIG. 8, the temperature range included in the past correction table 57 is 0° C. to 30° C. The temperatures of the collected actual measurement data are 30° C. and 40° C. In such a case, the ratio of the ripple value at 40° C. to the ripple value at 30° C. of the collected actual measurement data is used to multiply the correction coefficient 0.90 at 30° C. of the past correction table by the ratio of the ripple value to calculate the correction coefficient at 40° C. in the past correction table. The correction table 57 after update may be calculated using the correction coefficient of the past correction table 57 and the ratio of the ripple value in the collected actual measurement data in the same manner as the method described in FIG. 6.

[0063] As described above, when the temperature zone defined by the acquired ambient temperature is not included in the correction table 57, the control unit 51 can update the correction coefficient included in the correction table 57 so as to include the temperature zone, based on the correction coefficient included in the correction table 57 and the correction coefficient which is the ratio of the ripple value at the ambient temperature.

[0064] With the above-described configuration, by collecting ripple values ​​in new temperature zones not included in the correction table 57 before the update, the correction table 57 can be updated while expanding the temperature zone of the correction table 57.

[0065] If the actual measurement data used to update the correction table 57 contains an error, the correction coefficient cannot be calculated correctly, and the ripple value cannot be corrected correctly. Therefore, the ripple values ​​as the actual measurement data are collected for a required period, and the statistical value of the collected ripple values ​​is used to reduce the influence of temporary or transitional inappropriate ripple values. The statistical value may be an average value, a median value, or a mode value. The frequency of updating the correction table 57 may be, for example, once a month, twice a month, three months, or six months, but it is preferable to update the table once a month.

[0066] Since the ambient temperature of the electrolytic capacitor 110 changes continuously while the power supply mechanism 100 is in operation, it is considered that if ripple values ​​and ambient temperatures are constantly collected during the operation of the power supply mechanism 100, it is possible to collect ripple values ​​at temperatures included in the pre-update correction table 57. However, if ripple values ​​are collected at temperatures not included in the pre-update correction table 57, it may not be possible to update the correction coefficients, and compensation processing will be required.

[0067] FIG. 9 is a diagram showing an example of the compensation process. As shown in FIG. 9, the temperatures in the compensation table before updating are 10° C., 20° C., 30° C., 40° C., 50° C., and 60° C. The collected actual measurement data only has ripple values ​​at −10° C. and 0° C. The temperatures of the collected actual measurement data are not included in the temperatures in the compensation table 57 before updating. In such a case, the temperature of the actual measurement data closest to the temperature in the compensation table 57 before updating is used. Specifically, the compensation table 57 can be updated using the ripple value at 10° C. in the most recent compensation table 57 before updating and the ripple value at 0° C. in the actual measurement data.

[0068] FIG. 10 is a diagram showing an example of the deterioration judgment of the power supply mechanism 100 or the electrolytic capacitor 110. In FIG. 10, the horizontal axis indicates time, and the vertical axis indicates ripple voltage (ripple value). The control unit 51 can judge the deterioration of the electrolytic capacitor 110 or the power supply mechanism 100 based on the corrected ripple value. As shown in FIG. 10, the end of the life is reached when the ripple voltage becomes equal to or greater than the threshold value. In general, the lower the temperature, the larger the ripple voltage, and the higher the temperature, the smaller the ripple voltage. For this reason, when the ripple voltage is compared with the threshold value under a condition where the ambient temperature is relatively low, it may be judged that the end of the life has been reached even though the original life has not been reached. Conversely, when the ripple voltage is compared with the threshold value under a condition where the ambient temperature is relatively high, it may be judged that the end of the life has not been reached even though the original life has been reached.

[0069] According to this embodiment, since the ripple value is corrected to the value at the reference temperature, it is possible to always perform deterioration diagnosis and deterioration prediction at the same temperature.

[0070] (Additional Note 1) The ripple value correction device includes a control unit, which acquires a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, and corrects the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value and ambient temperature, as well as correction information in which a correction coefficient is defined for each temperature, the correction coefficient being the ratio of the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures to the ripple value at the temperature other than the reference temperature.

[0071] (Supplementary Note 2) In the ripple value correction device of Supplementary Note 1, the control unit collects ripple values ​​of the electrolytic capacitor at different times for each of a plurality of ambient temperatures, calculates a statistical value of the ripple values ​​based on the collected ripple values, calculates a ratio of a statistical value of the ripple values ​​at any ambient temperature in a temperature zone defined by the plurality of ambient temperatures to a statistical value of the ripple values ​​at any ambient temperature other than the ambient temperature, and generates the correction information based on the calculated ratio.

[0072] (Supplementary Note 3) In the ripple value correction device of Supplementary Note 1 or Supplementary Note 2, the control unit acquires ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor, and if a temperature zone defined by the acquired ambient temperatures is not included in the correction information, generates correction information including the temperature zone based on a correction coefficient which is a ratio of the ripple values ​​at the acquired ambient temperatures and the correction coefficient included in the correction information.

[0073] (Supplementary Note 4) In the ripple value correction device of any one of Supplementary Note 1 to Supplementary Note 3, the control unit acquires ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor after aging, and updates the correction information after the aging based on a correction coefficient that is a ratio of ripple values ​​at the ambient temperatures in a temperature zone defined by the acquired ambient temperatures and a correction coefficient included in the correction information for the temperature zone.

[0074] (Supplementary Note 5) In the ripple value correction device of any one of Supplementary Note 1 to Supplementary Note 4, the control unit updates the correction coefficient for the temperature zone defined by the acquired ambient temperature, the correction coefficient being a ratio of ripple values ​​at the ambient temperature in the temperature zone defined by the acquired ambient temperature, and the correction coefficient included in the correction information for the temperature zone, based on the correction coefficient.

[0075] (Supplementary Note 6) In the ripple value correction device of any one of Supplementary Note 1 to Supplementary Note 5, the control unit updates the correction coefficient for another temperature zone, included in the correction information, based on a correction coefficient which is a ratio of the ripple value at an ambient temperature in a temperature zone defined by the acquired ambient temperature and a correction coefficient for the other temperature zone other than the acquired temperature zone, included in the correction information.

[0076] (Supplementary Note 7) In the ripple value correction device of any one of Supplementary Note 1 to Supplementary Note 6, when the correction information includes a low temperature zone lower than a temperature zone defined by the acquired ambient temperature, the control unit updates the correction coefficient for the low temperature zone included in the correction information based on a correction coefficient which is a ratio of ripple values ​​at a plurality of lowest ambient temperatures in the temperature zone and the correction coefficient included in the correction information for the low temperature zone.

[0077] (Supplementary Note 8) In the ripple value correction device of any one of Supplements 1 to 7, when the correction information includes a high temperature zone higher than a temperature zone defined by the acquired ambient temperature, the control unit updates the correction coefficient for the high temperature zone included in the correction information based on a correction coefficient which is a ratio of ripple values ​​at a plurality of highest ambient temperatures in the temperature zone and the correction coefficient included in the correction information for the high temperature zone.

[0078] (Supplementary Note 9) In the ripple value correction device of any one of Supplements 1 to 8, when a temperature zone defined by an acquired ambient temperature is not included in the correction information, the control unit updates the correction coefficient included in the correction information so as to include the temperature zone based on the correction coefficient included in the correction information and a correction coefficient that is a ratio of the ripple value at the ambient temperature.

[0079] (Supplementary Note 10) In the ripple value correction device according to any one of Supplementary Note 1 to Supplementary Note 9, the control unit determines deterioration of the electrolytic capacitor or the power supply mechanism based on a corrected ripple value.

[0080] (Supplementary Note 11) The computer program causes a computer to execute a process of acquiring a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, and correcting the ripple value at the ambient temperature to the ripple value at a reference temperature based on the acquired ripple value and ambient temperature, as well as correction information that defines a correction coefficient for each temperature, which is the ratio of the ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures to the ripple value at the temperature other than the reference temperature.

[0081] (Supplementary Note 12) A ripple value correction method acquires a ripple value and an ambient temperature of an electrolytic capacitor included in a power supply mechanism, and corrects the ripple value at the ambient temperature to the ripple value at a reference temperature based on the acquired ripple value and ambient temperature, as well as correction information in which a correction coefficient is defined for each temperature, the correction coefficient being the ratio of the ripple value at a temperature other than an arbitrary reference temperature in a temperature range defined by a plurality of temperatures.

[0082] (Supplementary Note 13) A ripple value correction system includes the above-described ripple value correction device and a power supply mechanism including an electrolytic capacitor.

[0083] The matters described in each embodiment can be combined with each other. In addition, the independent claims and dependent claims described in the claims can be combined with each other in any and all combinations regardless of the citation format. Furthermore, the claims use a format in which a claim cites two or more other claims (multiple claim format), but this is not limited to this. A multiple claim (multi-multi claim) that cites at least one multiple claim may also be used. [Explanation of symbols]

[0084] 50 Ripple value correction device 51 Control section 52 Acquisition Department 53 Memory 54 Communications Department 55 Storage section 56 Computer Programs 57 Correction Table 100 Power Supply 110 Electrolytic capacitor

Claims

1. A control unit is provided, The control unit is Obtain the ripple value of the electrolytic capacitor included in the power supply mechanism and the ambient temperature. correcting the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value, the ambient temperature, and correction information in which a correction coefficient, which is a ratio of a ripple value at a temperature other than the reference temperature to a ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures, is defined for each temperature; Obtaining ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor after aging; updating the correction information after the aging change based on a correction coefficient that is a ratio of a ripple value at an ambient temperature in a temperature zone defined by the acquired ambient temperature and a correction coefficient included in the correction information for the temperature zone; Ripple value correction device.

2. The control unit is Collect ripple values ​​of electrolytic capacitors at different points in time for multiple ambient temperatures. Calculating statistics of the ripple values ​​based on the collected ripple values; Calculating a ratio of a statistical value of ripple values ​​at any one ambient temperature in a temperature zone defined by a plurality of ambient temperatures to a statistical value of ripple values ​​at other ambient temperatures other than the one ambient temperature; generating the correction information based on the calculated ratio; The ripple value correction device according to claim 1 .

3. The control unit is Obtaining ripple values ​​of the electrolytic capacitor at a plurality of ambient temperatures; When a temperature zone defined by the acquired ambient temperature is not included in the correction information, correction information including the temperature zone is generated based on a correction coefficient that is a ratio of a ripple value at the acquired ambient temperature and a correction coefficient included in the correction information. The ripple value correction device according to claim 1 .

4. The control unit is updating the correction coefficient for the temperature zone included in the correction information based on a correction coefficient that is a ratio of a ripple value at the ambient temperature in a temperature zone defined by the acquired ambient temperature and the correction coefficient included in the correction information for the temperature zone; The ripple value correction device according to claim 1 .

5. The control unit is updating the correction coefficient for the other temperature zone included in the correction information based on a correction coefficient that is a ratio of a ripple value at the ambient temperature in a temperature zone defined by the acquired ambient temperature and a correction coefficient included in the correction information for the other temperature zone other than the temperature zone; The ripple value correction device according to claim 1 .

6. The control unit is When the correction information includes a low temperature zone that is lower than a temperature zone defined by the acquired ambient temperature, the correction coefficient for the low temperature zone included in the correction information is updated based on a correction coefficient that is a ratio of ripple values ​​at a plurality of ambient temperatures that are the lowest in the temperature zone and a correction coefficient included in the correction information for the low temperature zone. The ripple value correction device according to claim 1 .

7. The control unit is When the correction information includes a high temperature zone higher than a temperature zone defined by the acquired ambient temperature, the correction coefficient for the high temperature zone included in the correction information is updated based on a correction coefficient that is a ratio of ripple values ​​at a plurality of highest ambient temperatures in the temperature zone and the correction coefficient included in the correction information for the high temperature zone. The ripple value correction device according to claim 1 .

8. The control unit is When a temperature zone defined by the acquired ambient temperature is not included in the correction information, the correction coefficient included in the correction information is updated so as to include the temperature zone based on the correction coefficient included in the correction information and a correction coefficient that is a ratio of a ripple value at the ambient temperature. The ripple value correction device according to claim 1 .

9. The control unit is determining deterioration of the electrolytic capacitor or the power supply mechanism based on the corrected ripple value; The ripple value correction device according to any one of claims 1 to 3.

10. Obtain the ripple value of the electrolytic capacitor included in the power supply mechanism and the ambient temperature. correcting the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value, the ambient temperature, and correction information in which a correction coefficient, which is a ratio of a ripple value at a temperature other than the reference temperature to a ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures, is defined for each temperature; Obtaining ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor after aging; updating the correction information after the aging change based on a correction coefficient that is a ratio of a ripple value at an ambient temperature in a temperature zone defined by the acquired ambient temperature and a correction coefficient included in the correction information for the temperature zone; A computer program that causes a computer to carry out processing.

11. Obtain the ripple value of the electrolytic capacitor included in the power supply mechanism and the ambient temperature. correcting the ripple value at the ambient temperature to the ripple value at the reference temperature based on the acquired ripple value, the ambient temperature, and correction information in which a correction coefficient, which is a ratio of a ripple value at a temperature other than the reference temperature to a ripple value at an arbitrary reference temperature in a temperature range defined by a plurality of temperatures, is defined for each temperature; Obtaining ripple values ​​at a plurality of ambient temperatures of the electrolytic capacitor after aging; updating the correction information after the aging change based on a correction coefficient that is a ratio of a ripple value at an ambient temperature in a temperature zone defined by the acquired ambient temperature and a correction coefficient included in the correction information for the temperature zone; Ripple value correction method.

12. A ripple value correction device according to any one of claims 1 to 3, A power supply mechanism including an electrolytic capacitor Equipped with Ripple value compensation system.

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