Reflection device

Abstract

To provide a reflector device capable of retro-reflecting light incident from a wide range.SOLUTION: A reflector device for retro-reflecting irradiated light is provided, comprising a retroreflective unit consisting of an array of retroreflectors that enable retroreflection, the retroreflective unit having multiple reflective areas having different retroreflection directions set therefor.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a reflecting device, and more particularly to a reflecting device capable of retroreflecting light incident from a wide range. [Background technology]

[0002] Conventionally, reflecting devices have been used in vehicles, road signs, surveying, etc. For example, in geodetic surveying, civil engineering surveying, and architectural surveying, targets such as highly reflective reflective sheets or triangular prisms are placed at the target position of the survey object, and light reflected from the target is automatically captured by a surveying instrument with an automatic collimation function. The intensity of the reflected light depends on the angle between the collimation line for the target and the reflecting surface or prism surface of the reflective sheet. For example, the limit of the angle at which automatic collimation is possible is approximately ±20° for reflective sheets and approximately ±20° for triangular prisms. For this reason, target devices based on triangular prisms that can be automatically collimated in all directions at an angle of 360°, as disclosed in Patent Document 1, have been developed in recent years. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] JP 2020-98175 A Summary of the Invention [Problem to be solved by the invention]

[0004] However, target devices based on triangular prisms that can be automatically aimed are very expensive and have a structure that is easily damaged, so they must be handled with care. In addition, as mentioned above, the range in which reflective sheets and triangular prisms can be automatically aimed is limited, so in order to make the most of the automatic aiming function, it is necessary to change the position of the surveying instrument every time. Every time the position of the surveying instrument is changed, work such as transporting, assembling, and leveling the instrument is required, which hinders the continuous capture of the survey target. Furthermore, reflectors used on vehicles and road signs are also limited in the angle of incidence of light that allows recognition, so it is preferable that they be capable of being recognized from a wider range of angles. An object of the present invention is to provide a reflecting device capable of retroreflecting light incident from a wide range. [Means for solving the problem]

[0005] The configuration of a reflecting device for solving the above problems is a reflecting device that is installed on an object to be surveyed and retroreflects light irradiated from a surveying instrument, and is equipped with a retroreflective section having a support layer on one side which is flat and on the other side which is configured with an arrangement of retroreflectors that enable retroreflection, and the retroreflective section has a plurality of reflective areas which are set in different directions of retroreflection, and among the plurality of reflective areas, when the device is attached to the object to be surveyed, reflective areas which have the same direction of retroreflection are arranged in symmetrical positions, and the reflection axis which retroreflects most brightly when light is incident on the retroreflector in each reflective area is inclined, including an elevation angle, with respect to the time when light is irradiated from the normal direction of one of the flat surfaces of the support layer. This configuration allows the retroreflection of light incident from a wide range. It also enables the continuous capture of survey objects using the automatic collimation function of the survey instrument, improving the efficiency of survey work. Furthermore, since the retroreflector is made up of microprisms, it becomes easier to obtain retroreflected light having a light flux required for, for example, visual recognition, surveying, and the like. Furthermore, since the retroreflective portion is provided on the base and an air layer is provided between the base and the retroreflective portion, the reflecting device can be manufactured inexpensively and easily. Furthermore, by configuring the base to include a fixing means for fixing the reflecting device, the work of installing the reflecting device can be facilitated. [Brief description of the drawings]

[0006] [Figure 1] FIG. 1 is a plan view of a target 1 according to the present embodiment. [Diagram 2]FIG. 2 is an exploded view of the target 1 according to the present embodiment. [Diagram 3] FIG. 2 is a cross-sectional view of the target 1. [Figure 4] FIG. 1 is a diagram showing a retroreflector. [Diagram 5] FIG. 2 is a plan view showing the orientation and arrangement of retroreflectors in each of the reflective regions R1 to R5. [Figure 6] FIG. 2 is a plan view showing the orientation and arrangement of retroreflectors in each of the reflective regions R1 to R5. [Figure 7] FIG. 13 is a diagram showing the action of a target. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0007] The present invention will be described in detail below through embodiments of the invention. However, the following embodiments do not limit the invention according to the claims, and not all of the combinations of features described in the embodiments are essential to the solution of the invention, and include configurations that are selectively adopted.

[0008] The reflecting device according to the present invention can be used, for example, as a surveying target 1. In the following explanation, the reflecting device will be explained using the surveying target 1. The target 1 according to this embodiment is attached to an object to be surveyed and is used to measure the position, orientation, etc. of the object to be surveyed by irradiating distance measuring light from the surveying instrument, and is configured to facilitate attachment to the object to be surveyed when it is attached to multiple locations on one object to be surveyed or multiple targets to be surveyed, and to enable surveying of multiple measurement positions from one location, for example, when the surveying instrument has an automatic collimation function. In the following explanation, the surveying instrument 4 is described as having an automatic collimation function.

[0009] Fig. 1 is a plan view showing an example of a target 1 according to the present embodiment. Fig. 2 is an exploded perspective view showing the configuration of the target 1 according to the present embodiment. FIG. 3 is a cross-sectional view showing the relationship between the base member 10 and the reflecting member 20 when the target 1 is constructed by integrating the base member 10 and the reflecting member 20. As shown in FIG. The target 1 has an up-down direction that specifies the orientation for mounting it on a survey object. In the following explanation, we will assume that the target 1 is mounted on a pillar or the like, and specify the directions as up-down, left-right, and front-back, as shown by the arrows in the figure.

[0010] The target 1 is formed in a square shape in a plan view (see FIG. 1(a)) and in a flat plate shape in a side view (see FIG. 1(b)), and is configured to include, for example, a base member 10 and a reflecting member 20. The base member 10 forms one surface of the target 1, and the reflecting member 20 forms the other surface of the target 1.

[0011] 1 and 2, the base member 10 is formed in a box shape with an opening on one side (front) and includes a square-shaped substrate 10A and a frame 10B rising up to surround the outer periphery of the substrate 10A. The substrate 10A is formed, for example, in the shape of a flat plate with a constant thickness. The frame 10B is formed, for example, in the shape of a plate with a constant thickness that rises up at a uniform height toward one side of the substrate 10A.

[0012] The base member 10 can be made of, for example, a resin material, a polyethylene material, or the like, and can be colored, for example, in white or black, and configured so as not to allow light to pass through.

[0013] The reflective member 20 is made of a material such as a light-transmitting resin. As shown in Fig. 3, the reflective member 20 is configured by arranging a plurality of retroreflectors 50, which enable retroreflection of light, on a support layer 22. In the following description, a collection of a plurality of arranged retroreflectors 50 may be referred to as a reflective structure 20A. The support layer 22 and the retroreflectors 50 are integrally formed as the reflective member 20.

[0014] The support layer 22 is formed, for example, in a square plate shape that matches the outer circumferential dimensions (outer shape) of the frame 10B of the base member 10 in a plan view so that it can be superimposed on the base member 10. The multiple retroreflectors 50 are aligned on one surface so that they are included within the inner circumferential dimensions of the frame 10B when the support layer 22 is superimposed on the base member 10.

[0015] That is, the reflective member 20 has a reflective structure 20A with one surface being flat and the other surface from which a plurality of retroreflectors 50 protrude. The reflective structure 20A is formed on the support layer 22, for example, in a range that can be accommodated within the frame 10B of the base member 10 and arranged to describe a square that follows the inner shape of the frame 10B of the base member 10.

[0016] The target 1 is constructed by integrating the base member 10 and the reflective member 20, for example, so that when the support layer 22 of the reflective member 20 is brought into contact with and superimposed on the frame 10B of the base member 10, an air layer 30 is formed between the reflective structure 20A protruding from the support layer 22 of the reflective member 20 and the substrate 10A of the base member 10.

[0017] The space between the reflecting structure 20A protruding from the support layer 22 of the reflecting member 20 and the substrate 10A of the base member 10 is not limited to the air layer 30. For example, instead of the air layer 30, a substance having a smaller refractive index than the reflecting member 20 may be filled, and the base member 10 may be formed so that the substrate 10A of the base member 10 matches the reflecting structure 20A of the reflecting member 20.

[0018] The base member 10 and the reflective member 20 can be integrated together by using a fixing means such as an adhesive or fitting.

[0019] In the target 1 in which the base member 10 and the reflecting member 20 are integrated, the flat surface 20a of the reflecting member 20 functions as the irradiation surface 1a on which the collimation light and distance measurement light irradiated from the surveying instrument are incident, and the flat surface 10a of the base member 10 functions as the attachment surface 1b for attaching the target 1 to the survey object. The irradiation surface 1a and the attachment surface 1b are parallel to each other. The target 1 may also be configured by fixing a member in which the reflecting member 20 and the base member 10, which are divided into n equal parts, are integrated, to a base.

[0020] The mounting surface 1b may be provided with, for example, a fixing means (not shown) for easily attaching the target 1 to a survey object. The fixing means may be, for example, a double-sided tape, a magnet, or an adhesive. This makes it easier to install the target 1 when, for example, surveying the erection accuracy of a steel frame or the like. Note that the use of the target 1 according to this embodiment is not limited to this.

[0021] FIG. 4 is a diagram showing a retroreflector 50 according to this embodiment. In this embodiment, the retroreflector 50 is described as a corner cube type microprism as shown in Fig. 4, but other microprisms such as glass beads may be used as long as they enable retroreflection. By using a microprism for the retroreflector 50, it becomes easier to obtain the light flux required for the automatic collimation function.

[0022] As shown in FIG. 4, corner cube retroreflector 50 has a shape in which one of the vertices forming a cube is vertex 51A of a triangular pyramid, and the cube is cut out along a plane passing through three vertices 51B, 51C, and 51D adjacent to this vertex.

[0023] That is, as shown in FIG. 4, the triangular pyramid that constitutes the retroreflector 50 is formed such that the side surfaces 52a, 52b, and 52c intersect at right angles with each other and have the same length. As shown in Figure 3, the retroreflector 50 is arranged such that the base surfaces 52d of triangular pyramids cut out from a cube as corner cubes face the support layer 22, and is formed integrally with the support layer 22 to form a reflective structure (retroreflector) 20A.

[0024] Each of the retroreflectors 50 (arranged) that make up the reflective structure 20A functions as a (retroreflective) prism, which reflects light (incident light) that passes through the support layer 22 and enters from the bottom surface 52d once specularly from each of the three side surfaces (the inner surfaces of which) 52a, 52b, and 52c, and then reflects the light again in the direction of incidence from the bottom surface 52d. As described above, the retroreflector 50 is formed integrally with the support layer 22, and therefore the bottom surface 52d shown in FIGS. 3 to 6 is an imaginary surface shown for the sake of convenience.

[0025] The reflecting member 20 according to this embodiment is configured to be capable of retroreflecting light toward a surveying instrument even when the incident angle of collimation light irradiated from the surveying instrument is large. Specifically, the reflecting structure 20A is configured to have a plurality of reflecting areas formed so that the retroreflecting directions are different. In this embodiment, the reflecting structure 20A is configured to have five types of reflecting areas R1, R2, R3, R4, and R5 (see FIG. 1).

[0026] The direction of retroreflection in each of the reflection regions R1, R2, R3, R4, and R5 is achieved by tilting the retroreflectors 50 that constitute the reflection regions R1, R2, R3, R4, and R5. The tilted arrangement is based on the case where the retroreflectors 50 are arranged so that the reflection axis J is the normal N of the irradiation surface 1a as shown in Fig. 3. The reflection axis J refers to the direction in which light is most brightly retroreflected when it is incident on the retroreflector 50, and in this embodiment, it is defined by a line that is perpendicular to the bottom surface 52d of the retroreflector 50 and passes through the vertex 51A of the retroreflector 50. The retroreflection by each of the reflective regions R1, R2, R3, R4, and R5 is not limited to the direction of the reflection axis J, but allows the incidence of light from a certain range (angle) (for example, ±20°).

[0027] That is, the reflective regions R1, R2, R3, R4, and R5 are arranged such that the inclination of the reflective axis J of the retroreflector 50 is the same within the same region. Moreover, the retroreflectors 50 constituting the different reflective regions R1, R2, R3, R4, and R5 are formed on the reflective member 20 such that the angles at which the reflective axis J is inclined are different.

[0028] In the embodiment, for example, as shown in Fig. 1(a), the reflecting structure 20A is divided into 25 regions at equal intervals in the vertical and horizontal directions in a plan view, and each region is square. Reflecting regions R1, R2, R3, R4, and R5 are formed in the region divided into square shapes.

[0029] The reflective region R1 is disposed in the center of the reflective structure 20A, the reflective regions R2 and R3 are disposed so as to surround the reflective region R1, and the reflective regions R4 and R5 are disposed so as to surround the reflective regions R2 and R3. In detail, the reflection area R1 is disposed so that the center of the square defined as the reflection area R1 coincides with the center O of the target 1. The reflection area R2 is disposed above, below, left, and right of the reflection area R1 so as to be in contact with the four sides of the reflection area R1, and the reflection area R3 is disposed at four diagonal positions of the reflection area R1 so as to be adjacent to the vertices of the reflection area R1. The reflection area R4 is disposed outside the reflection areas R2 and R3 surrounding the reflection area R1, at the above, below, left, right, and diagonal positions of the reflection area R1, and the reflection area R5 is disposed between the reflection areas R4 provided outside the reflection areas R2 and R3 surrounding the reflection area R1.

[0030] That is, the target 1 is arranged such that the regions with the same inclination of the reflection axis J are symmetrical about the center O of the reflection structure 20A. By arranging the reflection regions R1 to R5 with the same inclination of the reflection axis J symmetrical about the center O of the reflection structure 20A in this manner, the position of the center O of the target 1 can be detected from the light reflected from each of the reflection regions R1 to R5, and the accuracy of the surveying can be maintained.

[0031] Figures 5 and 6 are plan views showing the arrangement of retroreflectors 50 in each of the reflection regions R1 to R5. In detail, Figure 5 shows the arrangement of retroreflectors 50 in each of the reflection regions R1 to R5 when the target 1 is viewed from above, and Figure 6 shows the arrangement of retroreflectors 50 in each of the reflection regions R1 to R5 when the target 1 is viewed from the side. Note that Figures 5 and 6 do not show everything as seen from the side or above, but only show a portion of the retroreflectors 50 lined up in a row.

[0032] The reflective region R1 is arranged by tilting the retroreflector 50 so that the reflective axis J is inclined 0° in the left-right direction (see Figure 5(a)) and 15° downward in the up-down direction (see Figure 6(a)) with respect to the normal N of the irradiation surface 1a.

[0033] The reflective region R2 is positioned by tilting the retroreflector 50 so that the reflective axis J is tilted 15° to the left in the left-right direction (see Figure 5(b)) and 15° downward in the up-down direction (see Figure 6(b)) with respect to the normal N of the irradiation surface 1a.

[0034] The reflective region R3 is positioned by tilting the retroreflector 50 so that the reflective axis J is inclined 15° to the right in the left-right direction (see Figure 5(c)) and 15° downward in the up-down direction (see Figure 6(c)) with respect to the normal N of the irradiation surface 1a.

[0035] The reflective region R4 is positioned by tilting the retroreflector 50 so that the reflective axis J is inclined 30° to the left in the left-right direction (see Figure 5(d)) and 30° downward in the up-down direction (see Figure 6(d)) with respect to the normal N of the irradiation surface 1a.

[0036] The reflective region R5 is positioned by tilting the retroreflector 50 so that the reflective axis J is inclined 30° to the right in the left-right direction (see Figure 5(e)) and 30° downward in the up-down direction (see Figure 6(e)) with respect to the normal N of the irradiation surface 1a.

[0037] In other words, when the target 1 is attached to the surface of a surveying object, such as a pillar extending vertically, the reflection area R1 is configured to reflect most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 0° and a dip angle of 15°. The reflection area R2 is configured so as to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 15° to the left and a dip angle of 15°. The reflection area R3 is configured so as to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 15° to the right and a dip angle of 15°. The reflection area R4 is configured so as to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 30° to the left and a dip angle of 30°. The reflection area R5 is configured so as to reflect the most brightly when the collimated light emitted from the surveying instrument is incident on the irradiation surface 1a at a direction angle of 30° to the right and a dip angle of 30°.

[0038] Fig. 7 is a diagram showing the action of the target 1. As described above, the target 1 according to this embodiment is configured to include reflection regions R1 to R5 having different orientations of the reflection axis J, and therefore can accommodate arrangements in the ranges shown in Fig. 7, for example.

[0039] 7, 1(a) indicates a target arranged at a direction angle of 0° and an elevation angle of 15° as viewed from the surveying instrument 4, 1(b) indicates a target arranged at a direction angle of 15° to the left and an elevation angle of 15° as viewed from the surveying instrument 4, 1(c) indicates a target arranged at a direction angle of 15° to the right and an elevation angle of 15° as viewed from the surveying instrument 4, 1(d) indicates a target arranged at a direction angle of 30° to the left and an elevation angle of 30° as viewed from the surveying instrument 4, and 1(e) indicates a target arranged at a direction angle of 30° to the right and an elevation angle of 30° as viewed from the surveying instrument 4. Note that targets 1(a) to 1(e) are the same.

[0040] In other words, when the collimation light is emitted by the collimation function of the surveying instrument 4 toward a direction angle of 0° and an elevation angle of 15°, the collimation light is reflected most brightly toward the surveying instrument 4 from the reflection area R1 on the target 1(a), where the reflection axis J is at a direction angle of 0° and a depression angle of 15°. In addition, when the collimation light is emitted by the collimation function of the surveying instrument 4 toward a direction angle of 15° to the right and an elevation angle of 15°, the collimation light is reflected most brightly toward the surveying instrument 4 from the four reflection areas R2 on the target 1(b) whose reflection axis J is at a direction angle of 15° to the right and a depression angle of 15°. In addition, when the collimation light is emitted by the collimation function of the surveying instrument 4 at a direction angle of 15° to the left and an elevation angle of 15°, the collimation light is reflected most brightly toward the surveying instrument 4 from the four reflection areas R3 on the target 1(c) whose reflection axis J is at a direction angle of 15° to the left and an elevation angle of 15°. In addition, when the collimation light is emitted by the collimation function of the surveying instrument 4 toward a direction angle of 30° to the right and an elevation angle of 30°, the collimation light is reflected most brightly toward the surveying instrument 4 from the eight reflection areas R4 on the target 1(d) whose reflection axis J is at a direction angle of 30° to the right and an elevation angle of 30°. In addition, when the collimation light is emitted by the collimation function of the surveying instrument 4 toward a direction angle of 30° to the left and an elevation angle of 30°, the collimation light is reflected most brightly toward the surveying instrument 4 from the eight reflection areas R5 on the target 1(e) whose reflection axis J is at a direction angle of 30° to the left and an elevation angle of 30°.

[0041] In this way, by configuring the target 1 to have multiple reflection axes J, one type of target can be commonly used as shown in Figure 7, which makes it easier to install the target 1 and allows the targets 1 installed in multiple locations to be continuously sighted and surveyed without moving the position of the surveying instrument 4.

[0042] 7, for convenience of explanation, the surveying instrument 4 is positioned on the reflection axis J set on the target 1, but the target 1 does not necessarily need to be positioned so that the collimation light irradiated from the surveying instrument 4 coincides with the reflection axis J. The retroreflectors 50 constituting each of the reflective regions R1 to R5 allow the retroreflection of light that is shifted from the reflection axis J, centered on the reflection axis J, making automatic collimation possible over a wider range.

[0043] The orientation of the reflection axis J set in each of the reflection regions R1 to R5 described above is not limited to the angle in the above embodiment, and may be changed as appropriate. For example, when the target 1 is configured to be suitable for a survey with a low elevation angle and a wide direction angle, the reflection regions may be set so that the reflection axis J changes more with respect to the direction angle than with respect to the elevation angle, and when the target 1 is configured to be suitable for a survey with a high elevation angle and a narrow direction angle, the target 1 may be configured by setting the reflection regions so that the reflection axis J changes more with respect to the elevation angle than with respect to the direction angle.

[0044] In the above embodiment, the shape of the target 1 has been described as a square, but is not limited thereto. The shape of the target 1 may be, for example, a rectangle or a polygon other than a rectangle, or a circle or an ellipse. The shape of the target 1 here refers to the planar shape of the target 1 or the planar shape of the reflecting structure portion 20A in the target 1.

[0045] What is essential in forming the target 1 is that the reflection structure 20A should be provided with multiple (two or more) types of reflection regions R with different inclinations of the reflection axis J. In addition, the reflection regions R with the same inclination of the reflection axis J should be provided at least symmetrically with respect to the up-down direction set on the target 1.

[0046] In addition, in the above embodiment, the target 1 has been described as having multiple reflective areas formed in a single reflective member 20, but it may also be configured such that a reflective member is formed separately for each reflective area having a different inclination of the reflective axis J, and the multiple individually formed reflective members are integrated by the base member 10.

[0047] Although the reflecting device according to the present invention has been described using the target 1 for surveying, the target is not limited thereto. For example, it may be used for vehicles or road signs. In this case, unlike the target 1 for surveying, it is not necessary to arrange a plurality of reflective areas with different retroreflection directions at symmetrical positions, and it is sufficient to set the retroreflection direction in each reflective area so that light incident from a wide range can be retroreflected.

[0048] In addition, the direction of retroreflection set between each reflective area may be within the range of retroreflection in a single reflective area, but by setting it outside the range of retroreflection in a single reflective area, it is possible to retroreflect light incident from a wider range. [Explanation of symbols]

[0049] 1 (surveying) target, 1a irradiation surface, 4 surveying instrument, 10 base member, 20 Reflective member, 20A Reflective structure (retroreflective portion), 22 Support layer, 30 Air layer, 50 Retroreflector, J reflection axis, R1,R2,R3,R4,R5 reflection area.

Claims

1. A reflecting device that is provided on a surveying object and retroreflects light irradiated from a surveying instrument, A retroreflective section is provided having a support layer on one side which is flat and on the other side which is configured by arranging the retroreflective bodies that enable the retroreflection, The retroreflective portion is The retroreflective film has a plurality of reflective areas each having a different retroreflective direction. Among the plurality of reflective areas, reflective areas having the same retroreflective direction when attached to the survey object are provided at symmetrical positions; A reflection device characterized in that the reflection axis that reflects most brightly when light is incident on the retroreflector of each reflection area is inclined, including an elevation angle, based on the light being irradiated from the normal direction of one of the planes of the support layer.

2. 2. The reflector according to claim 1, wherein the retroreflector is a microprism. Device.

3. 3. The reflection device according to claim 1, wherein the retroreflecting portion is provided on a base, and an air layer is provided between the base and the retroreflecting portion.

4. 4. The method according to claim 3, wherein the base is provided with a fixing means for fixing a reflecting device. The reflector device described herein.

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